KR0134659B1 - 고속화한 시험패턴 발생기 - Google Patents
고속화한 시험패턴 발생기Info
- Publication number
- KR0134659B1 KR0134659B1 KR1019940036197A KR19940036197A KR0134659B1 KR 0134659 B1 KR0134659 B1 KR 0134659B1 KR 1019940036197 A KR1019940036197 A KR 1019940036197A KR 19940036197 A KR19940036197 A KR 19940036197A KR 0134659 B1 KR0134659 B1 KR 0134659B1
- Authority
- KR
- South Korea
- Prior art keywords
- output
- instruction
- command
- circuit
- input
- Prior art date
Links
- 238000010586 diagram Methods 0.000 description 9
- 238000006467 substitution reaction Methods 0.000 description 9
- 230000001186 cumulative effect Effects 0.000 description 8
- 238000009825 accumulation Methods 0.000 description 3
- 230000006870 function Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31919—Storing and outputting test patterns
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/31813—Test pattern generators
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Advance Control (AREA)
Abstract
Description
Claims (3)
- 병렬로 연결된 n개의 명령(i0, i1, i2, i3)을 각기 2개씩 종속적으로 연산하는 (n-1)개의 명령 연산기(101,102,103)를 설치하고, 각 명령연산기의 스텝마다 각 n개의 레지스터를 설치하고, 상기 구성의 명령연산부(100)의 출력(i0c, i1c, i2c, i3c)을 각 1입력단자에 접속하는 연산회로(201,202,203,204)를 설치하고, 상기 연산회로의 출력에 최소한 하나의 레지스터(205)를 설치하여 접속하고, 상기 레지스터(205)의 출력을 상기 각 연산회로(201,202,203,204)의 다른 입력단자에 접속하고, 상기 연산회로(201,202,203,204)의 각 출력(X0, X1, X2, X3)을 멀티플렉서(502)에 의해 멀티플렉스로서 꺼내는 다중화회로(5)를 설치한 것을 특징으로 하는 고속화한 시험패턴 발생기.
- 명령연산기(101)로서, 연산회로(303)의 1입력단자에 앤드게이트(304)를 설치하여 접속하고, 상기 앤드게이트(304)의 1입력단자에는 입력명령0을 인가하며, 입력명령0에서 부호와 대입명령을 검출하는 명령디코더(301)를설치하고, 상기 대입명령신호를 오어게이트(305)를 설치하여 접속하고, 입력명령1에서 부호와 대입명령을 검출하는 명령디코더(302)를 설치하며, 상기 대입명령신호를 상기 오어게이트(305)의 다른 입력단자에 접속하고, 상기 명령디코더(302)의 대입명령신호의 반전신호를 상기 앤드게이트(304)의 다른 입력단자에 접속하며, 상기 오어게이트(305)의 출력과 상기 연산회로(303)의 출력을 연산결과1로서 다음단에 출력하는 것을 특징으로 하는 명령연산기(101)를 갖는 고속화한 시험패턴 발생기.
- 제1항에 있어서, 명령연산기(101,102,103)의 구성은 상기 청구항2의 명령연산기로 이루어진 고속화한 시험패턴 발생기.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP35014593A JP3323312B2 (ja) | 1993-12-28 | 1993-12-28 | 高速化した試験パターン発生器 |
JP93-350145 | 1993-12-28 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR950019757A KR950019757A (ko) | 1995-07-24 |
KR0134659B1 true KR0134659B1 (ko) | 1998-04-25 |
Family
ID=18408531
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019940036197A KR0134659B1 (ko) | 1993-12-28 | 1994-12-23 | 고속화한 시험패턴 발생기 |
Country Status (4)
Country | Link |
---|---|
US (1) | US5629946A (ko) |
JP (1) | JP3323312B2 (ko) |
KR (1) | KR0134659B1 (ko) |
DE (1) | DE4446988B4 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101988864B1 (ko) | 2019-01-04 | 2019-06-13 | 조성국 | 포장용지의 사전 급지장치 |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5696772A (en) * | 1994-05-06 | 1997-12-09 | Credence Systems Corporation | Test vector compression/decompression system for parallel processing integrated circuit tester |
DE19680782C2 (de) * | 1995-07-26 | 2002-11-21 | Advantest Corp | Hochgeschwindigkeits- Mustergenerierungsverfahren und unter Verwendung dieses Verfahrens arbeitender Hochgeschwindigkeits-Mustergenerator |
DE19638165C1 (de) * | 1996-09-18 | 1998-04-23 | Siemens Nixdorf Inf Syst | Verfahren zum Erzeugen von Eingabesignalfolgen und Vorrichtung zum Durchführen des Verfahrens |
JP3552184B2 (ja) * | 1996-10-18 | 2004-08-11 | 株式会社アドバンテスト | 半導体メモリ試験装置 |
US5790560A (en) * | 1996-12-13 | 1998-08-04 | International Business Machines Corporation | Apparatus and method for timing self-timed circuitry |
DE10034897B4 (de) * | 2000-07-18 | 2004-08-05 | Infineon Technologies Ag | Adresszähler zur Adressierung von synchronen hochfrequenten Digitalschaltungen, insbesondere Speicherbauelementen |
DE10111440C2 (de) * | 2001-03-09 | 2003-02-20 | Infineon Technologies Ag | Adressengenerator zur Erzeugung von Adressen zum Testen einer Schaltung |
US7240266B2 (en) * | 2005-02-18 | 2007-07-03 | International Business Machines Corporation | Clock control circuit for test that facilitates an at speed structural test |
TWI442497B (zh) * | 2011-03-11 | 2014-06-21 | Piecemakers Technology Inc | 高速測試電路與方法 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4293950A (en) * | 1978-04-03 | 1981-10-06 | Nippon Telegraph And Telephone Public Corporation | Test pattern generating apparatus |
JPS6030973B2 (ja) * | 1980-01-18 | 1985-07-19 | 日本電気株式会社 | 高速パタ−ン発生器 |
JPS5994086A (ja) * | 1982-11-19 | 1984-05-30 | Advantest Corp | 論理回路試験装置 |
DE3752280T2 (de) * | 1986-07-30 | 2000-02-03 | Hitachi, Ltd. | Mustergenerator |
JPS63256877A (ja) * | 1987-04-14 | 1988-10-24 | Mitsubishi Electric Corp | テスト回路 |
JP2964644B2 (ja) * | 1990-12-10 | 1999-10-18 | 安藤電気株式会社 | 高速パターン発生器 |
JP2602997B2 (ja) * | 1991-01-18 | 1997-04-23 | 株式会社東芝 | パターン発生器 |
JP2807170B2 (ja) * | 1993-06-01 | 1998-10-08 | 松下電器産業株式会社 | 演算装置 |
-
1993
- 1993-12-28 JP JP35014593A patent/JP3323312B2/ja not_active Expired - Fee Related
-
1994
- 1994-12-22 US US08/362,796 patent/US5629946A/en not_active Expired - Fee Related
- 1994-12-23 KR KR1019940036197A patent/KR0134659B1/ko not_active IP Right Cessation
- 1994-12-28 DE DE4446988A patent/DE4446988B4/de not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101988864B1 (ko) | 2019-01-04 | 2019-06-13 | 조성국 | 포장용지의 사전 급지장치 |
Also Published As
Publication number | Publication date |
---|---|
JP3323312B2 (ja) | 2002-09-09 |
JPH07198799A (ja) | 1995-08-01 |
DE4446988B4 (de) | 2005-06-09 |
KR950019757A (ko) | 1995-07-24 |
DE4446988A1 (de) | 1995-07-27 |
US5629946A (en) | 1997-05-13 |
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