JP7527817B2 - 反応器マニホールド - Google Patents

反応器マニホールド Download PDF

Info

Publication number
JP7527817B2
JP7527817B2 JP2020045389A JP2020045389A JP7527817B2 JP 7527817 B2 JP7527817 B2 JP 7527817B2 JP 2020045389 A JP2020045389 A JP 2020045389A JP 2020045389 A JP2020045389 A JP 2020045389A JP 7527817 B2 JP7527817 B2 JP 7527817B2
Authority
JP
Japan
Prior art keywords
block
manifold
semiconductor processing
outlet
hole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2020045389A
Other languages
English (en)
Japanese (ja)
Other versions
JP2020155776A5 (enExample
JP2020155776A (ja
Inventor
ディンカー ナンドワナ
ジェレルド リー ウィンクラー
エリック ジェームズ シェロ
トッド ロバート ダン
カール ルイス ホワイト
Original Assignee
エーエスエム・アイピー・ホールディング・ベー・フェー
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by エーエスエム・アイピー・ホールディング・ベー・フェー filed Critical エーエスエム・アイピー・ホールディング・ベー・フェー
Publication of JP2020155776A publication Critical patent/JP2020155776A/ja
Publication of JP2020155776A5 publication Critical patent/JP2020155776A5/ja
Application granted granted Critical
Publication of JP7527817B2 publication Critical patent/JP7527817B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/4401Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
    • C23C16/4409Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber characterised by sealing means
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/4401Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
    • C23C16/4408Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber by purging residual gases from the reaction chamber or gas lines
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45512Premixing before introduction in the reaction chamber
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45523Pulsed gas flow or change of composition over time
    • C23C16/45525Atomic layer deposition [ALD]
    • C23C16/45527Atomic layer deposition [ALD] characterized by the ALD cycle, e.g. different flows or temperatures during half-reactions, unusual pulsing sequence, use of precursor mixtures or auxiliary reactants or activations
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45523Pulsed gas flow or change of composition over time
    • C23C16/45525Atomic layer deposition [ALD]
    • C23C16/45544Atomic layer deposition [ALD] characterized by the apparatus
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45523Pulsed gas flow or change of composition over time
    • C23C16/45525Atomic layer deposition [ALD]
    • C23C16/45544Atomic layer deposition [ALD] characterized by the apparatus
    • C23C16/45548Atomic layer deposition [ALD] characterized by the apparatus having arrangements for gas injection at different locations of the reactor for each ALD half-reaction
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45561Gas plumbing upstream of the reaction chamber
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45563Gas nozzles
    • C23C16/45565Shower nozzles
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45563Gas nozzles
    • C23C16/45574Nozzles for more than one gas
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/54Apparatus specially adapted for continuous coating
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0402Apparatus for fluid treatment

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Chemical Vapour Deposition (AREA)
JP2020045389A 2019-03-19 2020-03-16 反応器マニホールド Active JP7527817B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201962820711P 2019-03-19 2019-03-19
US62/820,711 2019-03-19

Publications (3)

Publication Number Publication Date
JP2020155776A JP2020155776A (ja) 2020-09-24
JP2020155776A5 JP2020155776A5 (enExample) 2023-03-09
JP7527817B2 true JP7527817B2 (ja) 2024-08-05

Family

ID=72515447

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2020045389A Active JP7527817B2 (ja) 2019-03-19 2020-03-16 反応器マニホールド

Country Status (5)

Country Link
US (1) US11492701B2 (enExample)
JP (1) JP7527817B2 (enExample)
KR (1) KR102830785B1 (enExample)
CN (1) CN111719138A (enExample)
TW (1) TWI879761B (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10662527B2 (en) 2016-06-01 2020-05-26 Asm Ip Holding B.V. Manifolds for uniform vapor deposition
US11492701B2 (en) * 2019-03-19 2022-11-08 Asm Ip Holding B.V. Reactor manifolds
US12516414B2 (en) 2019-03-19 2026-01-06 Asm Ip Holding B.V. Reactor manifolds
KR20210048408A (ko) 2019-10-22 2021-05-03 에이에스엠 아이피 홀딩 비.브이. 반도체 증착 반응기 매니폴드
TW202517824A (zh) * 2023-06-29 2025-05-01 荷蘭商Asm Ip私人控股有限公司 半導體裝置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002057114A (ja) 2000-04-28 2002-02-22 Applied Materials Inc 遠隔プラズマ発生器の半導体処理チャンバとの統合化
JP2009111359A (ja) 2007-09-28 2009-05-21 Applied Materials Inc 原子層堆積チャンバ及び構成部品
JP2013522463A (ja) 2010-03-12 2013-06-13 アプライド マテリアルズ インコーポレイテッド 複式噴射を伴う原子層堆積チャンバ

Family Cites Families (242)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1523156A (en) 1923-07-05 1925-01-13 Leslie M Adams Electrically-energized faucet heater
US1853045A (en) 1931-01-09 1932-04-12 Air Conditioning & Eng Fluid mixing means
US3429903A (en) 1968-03-12 1969-02-25 American Metal Climax Inc Method of preparing molybdenum (iii) acetylacetonate
US3784631A (en) 1972-03-09 1974-01-08 Goodyear Tire & Rubber Dimerization or codimerization of alpha-olefins
US3882934A (en) 1972-06-02 1975-05-13 Aga Ab Heat exchanger
DE7242602U (enExample) 1972-11-20 1976-04-29 Hoogovens Ijmuiden B.V., Ijmuiden (Niederlande)
US4222671A (en) 1978-09-05 1980-09-16 Gilmore Oscar Patrick Static mixer
US4401052A (en) 1979-05-29 1983-08-30 The University Of Delaware Apparatus for continuous deposition by vacuum evaporation
US4422773A (en) 1980-08-04 1983-12-27 Technicon Instruments Corporation Apparatus and method for the non-invasive mixing of a flowing fluid stream
US4410281A (en) 1981-03-02 1983-10-18 Ralph B. Carter Company Mixing method and apparatus utilizing pipe elbows
US4649859A (en) 1985-02-19 1987-03-17 The United States Of America As Represented By The United States Department Of Energy Reactor design for uniform chemical vapor deposition-grown films without substrate rotation
GB8526566D0 (en) 1985-10-29 1985-12-04 Plessey Co Plc Manifold assembly
US4747367A (en) 1986-06-12 1988-05-31 Crystal Specialties, Inc. Method and apparatus for producing a constant flow, constant pressure chemical vapor deposition
US4951601A (en) 1986-12-19 1990-08-28 Applied Materials, Inc. Multi-chamber integrated process system
US5080549A (en) 1987-05-11 1992-01-14 Epsilon Technology, Inc. Wafer handling system with Bernoulli pick-up
DE3715644A1 (de) 1987-05-11 1988-12-01 Fraunhofer Ges Forschung Molekularstrahlepitaxieanlage
US5221556A (en) 1987-06-24 1993-06-22 Epsilon Technology, Inc. Gas injectors for reaction chambers in CVD systems
US4828224A (en) 1987-10-15 1989-05-09 Epsilon Technology, Inc. Chemical vapor deposition system
JPS6411320A (en) 1987-07-06 1989-01-13 Toshiba Corp Photo-cvd device
US5166092A (en) 1988-01-28 1992-11-24 Fujitsu Limited Method of growing compound semiconductor epitaxial layer by atomic layer epitaxy
US5071460A (en) 1988-03-04 1991-12-10 Nippon Telegraph And Telephone Corporation Process for the preparation of fluoride glass and process for the preparation of optical fiber preform using the fluoride glass
US4949783A (en) 1988-05-18 1990-08-21 Veeco Instruments, Inc. Substrate transport and cooling apparatus and method for same
ES2163388T3 (es) 1988-05-24 2002-02-01 Unaxis Balzers Ag Instalacion de vacio.
US4889609A (en) 1988-09-06 1989-12-26 Ovonic Imaging Systems, Inc. Continuous dry etching system
US4907534A (en) 1988-12-09 1990-03-13 Siemens Aktiengesellschaft Gas distributor for OMVPE Growth
WO1990010092A1 (en) 1989-02-24 1990-09-07 Massachusetts Institute Of Technology A modified stagnation flow apparatus for chemical vapor deposition providing excellent control of the deposition
US5186718A (en) 1989-05-19 1993-02-16 Applied Materials, Inc. Staged-vacuum wafer processing system and method
KR0155158B1 (ko) 1989-07-25 1998-12-01 카자마 젠쥬 종형 처리 장치 및 처리방법
US5106453A (en) 1990-01-29 1992-04-21 At&T Bell Laboratories MOCVD method and apparatus
US5004374A (en) 1990-02-28 1991-04-02 Bettie Grey Method of laying out a pathway for piping
DE4006489A1 (de) 1990-03-02 1991-09-05 Hoechst Ag Vorrichtung zum herstellen duenner schichten aus metallmischoxiden aus organischen metallverbindungen auf einem substrat
US5028724A (en) 1990-03-30 1991-07-02 Air Products And Chemicals, Inc. Synthesis of volatile fluorinated and non-fluorinated metal-beta-ketonate and metal-beta-ketoiminato complexes
CA2016970A1 (en) 1990-05-16 1991-11-16 Prasad N. Gadgil Inverted diffusion stagnation point flow reactor for vapor deposition of thin films
US5840897A (en) 1990-07-06 1998-11-24 Advanced Technology Materials, Inc. Metal complex source reagents for chemical vapor deposition
US7323581B1 (en) 1990-07-06 2008-01-29 Advanced Technology Materials, Inc. Source reagent compositions and method for forming metal films on a substrate by chemical vapor deposition
US6110529A (en) 1990-07-06 2000-08-29 Advanced Tech Materials Method of forming metal films on a substrate by chemical vapor deposition
US5131627A (en) 1990-10-17 1992-07-21 Nupro Company Diaphragm valve
US5286296A (en) 1991-01-10 1994-02-15 Sony Corporation Multi-chamber wafer process equipment having plural, physically communicating transfer means
JPH04308090A (ja) 1991-04-05 1992-10-30 M B K Maikurotetsuku:Kk 気相化学反応生成装置のロードロック機構
US5199483A (en) 1991-05-15 1993-04-06 Applied Materials, Inc. Method and apparatus for cooling wafers
US5192371A (en) 1991-05-21 1993-03-09 Asm Japan K.K. Substrate supporting apparatus for a CVD apparatus
US5223001A (en) 1991-11-21 1993-06-29 Tokyo Electron Kabushiki Kaisha Vacuum processing apparatus
US5248253A (en) 1992-01-28 1993-09-28 Digital Equipment Corporation Thermal processing furnace with improved plug flow
JPH05218176A (ja) 1992-02-07 1993-08-27 Tokyo Electron Tohoku Kk 熱処理方法及び被処理体の移載方法
JPH0811718B2 (ja) 1992-02-27 1996-02-07 大同ほくさん株式会社 ガスソース分子線エピタキシー装置
US5229615A (en) 1992-03-05 1993-07-20 Eaton Corporation End station for a parallel beam ion implanter
GB2264957B (en) 1992-03-12 1995-09-20 Bell Communications Res Deflected flow in a chemical vapor deposition cell
JP3183575B2 (ja) 1992-09-03 2001-07-09 東京エレクトロン株式会社 処理装置および処理方法
JP3405466B2 (ja) 1992-09-17 2003-05-12 富士通株式会社 流体切替弁および半導体装置の製造装置
JP3186262B2 (ja) 1992-10-14 2001-07-11 ソニー株式会社 半導体装置の製造方法
KR100302012B1 (ko) 1992-11-06 2001-11-30 조셉 제이. 스위니 미소-환경 콘테이너 연결방법 및 미소-환경 로드 로크
JP2548062B2 (ja) 1992-11-13 1996-10-30 日本エー・エス・エム株式会社 縦型熱処理装置用ロードロックチャンバー
US5516732A (en) 1992-12-04 1996-05-14 Sony Corporation Wafer processing machine vacuum front end method and apparatus
JP3292540B2 (ja) 1993-03-03 2002-06-17 東京エレクトロン株式会社 熱処理装置
JP3218488B2 (ja) 1993-03-16 2001-10-15 東京エレクトロン株式会社 処理装置
JP2875458B2 (ja) 1993-07-16 1999-03-31 大日本スクリーン製造株式会社 基板の熱処理装置
JPH07122500A (ja) 1993-10-28 1995-05-12 Fujitsu Ltd ガス機器及びこれを利用したガス供給装置
US5538390A (en) 1993-10-29 1996-07-23 Applied Materials, Inc. Enclosure for load lock interface
JP3042335B2 (ja) 1994-10-25 2000-05-15 信越半導体株式会社 気相成長方法及びその装置
US5586585A (en) 1995-02-27 1996-12-24 Asyst Technologies, Inc. Direct loadlock interface
JP3380091B2 (ja) 1995-06-09 2003-02-24 株式会社荏原製作所 反応ガス噴射ヘッド及び薄膜気相成長装置
US5609459A (en) 1995-07-06 1997-03-11 Brooks Automation, Inc. Door drive mechanisms for substrate carrier and load lock
TW283250B (en) 1995-07-10 1996-08-11 Watkins Johnson Co Plasma enhanced chemical processing reactor and method
TW356554B (en) 1995-10-23 1999-04-21 Watkins Johnson Co Gas injection system for semiconductor processing
JP3258885B2 (ja) 1995-12-27 2002-02-18 東京エレクトロン株式会社 成膜処理装置
TW322602B (enExample) 1996-04-05 1997-12-11 Ehara Seisakusho Kk
US6534133B1 (en) 1996-06-14 2003-03-18 Research Foundation Of State University Of New York Methodology for in-situ doping of aluminum coatings
US5885358A (en) 1996-07-09 1999-03-23 Applied Materials, Inc. Gas injection slit nozzle for a plasma process reactor
US5661093A (en) 1996-09-12 1997-08-26 Applied Materials, Inc. Method for the stabilization of halogen-doped films through the use of multiple sealing layers
US5951771A (en) 1996-09-30 1999-09-14 Celestech, Inc. Plasma jet system
US5789027A (en) 1996-11-12 1998-08-04 University Of Massachusetts Method of chemically depositing material onto a substrate
US5980983A (en) 1997-04-17 1999-11-09 The President And Fellows Of Harvard University Liquid precursors for formation of metal oxides
US5937323A (en) 1997-06-03 1999-08-10 Applied Materials, Inc. Sequencing of the recipe steps for the optimal low-k HDP-CVD processing
US5846330A (en) 1997-06-26 1998-12-08 Celestech, Inc. Gas injection disc assembly for CVD applications
CN1272804A (zh) 1997-07-24 2000-11-08 阿克西瓦有限公司 连续无序的对流混合器、热交换器和反应器
US6432479B2 (en) 1997-12-02 2002-08-13 Applied Materials, Inc. Method for in-situ, post deposition surface passivation of a chemical vapor deposited film
WO1999037377A1 (en) 1998-01-26 1999-07-29 Kazuji Fukunaga Coagulating/condensing device and method
WO1999045302A1 (en) 1998-03-05 1999-09-10 The Swagelok Company Modular surface mount manifold
US6079353A (en) 1998-03-28 2000-06-27 Quester Technology, Inc. Chamber for reducing contamination during chemical vapor deposition
US5893641A (en) 1998-05-26 1999-04-13 Garcia; Paul Differential injector
US20030101938A1 (en) 1998-10-27 2003-06-05 Applied Materials, Inc. Apparatus for the deposition of high dielectric constant films
JP2000172343A (ja) 1998-12-02 2000-06-23 Hitachi Ltd ガス供給装置と成膜装置
JP4726369B2 (ja) 1999-06-19 2011-07-20 エー・エス・エムジニテックコリア株式会社 化学蒸着反応炉及びこれを利用した薄膜形成方法
AU1218401A (en) 1999-10-20 2001-04-30 Cvd Systems, Inc. Fluid processing system
DE10060002B4 (de) 1999-12-07 2016-01-28 Komatsu Ltd. Vorrichtung zur Oberflächenbehandlung
AU2001242363A1 (en) 2000-02-04 2001-08-14 Aixtron Ag Device and method for depositing one or more layers onto a substrate
TW576873B (en) 2000-04-14 2004-02-21 Asm Int Method of growing a thin film onto a substrate
US6303501B1 (en) 2000-04-17 2001-10-16 Applied Materials, Inc. Gas mixing apparatus and method
TW508658B (en) 2000-05-15 2002-11-01 Asm Microchemistry Oy Process for producing integrated circuits
US6878628B2 (en) 2000-05-15 2005-04-12 Asm International Nv In situ reduction of copper oxide prior to silicon carbide deposition
US7494927B2 (en) 2000-05-15 2009-02-24 Asm International N.V. Method of growing electrical conductors
US20040224504A1 (en) 2000-06-23 2004-11-11 Gadgil Prasad N. Apparatus and method for plasma enhanced monolayer processing
FI20001694A0 (fi) 2000-07-20 2000-07-20 Asm Microchemistry Oy Menetelmä ohutkalvon kasvattamiseksi substraatille
US6299692B1 (en) 2000-07-21 2001-10-09 Applied Materials, Inc. Head for vaporizing and flowing various precursor materials onto semiconductor wafers during chemical vapor deposition
KR100444149B1 (ko) 2000-07-22 2004-08-09 주식회사 아이피에스 Ald 박막증착설비용 클리닝방법
US6302965B1 (en) 2000-08-15 2001-10-16 Applied Materials, Inc. Dispersion plate for flowing vaporizes compounds used in chemical vapor deposition of films onto semiconductor surfaces
AU2001285235A1 (en) 2000-08-28 2002-03-13 Advanced Technology Materials, Inc. Source reagent compositions and method for forming metal films on a substrate bychemical vapor deposition
AU2001294588A1 (en) 2000-09-13 2002-03-26 Applied Materials, Inc. Processing chamber with multi-layer brazed lid
DE10064944A1 (de) 2000-09-22 2002-04-11 Aixtron Ag Verfahren zum Abscheiden von insbesondere kristallinen Schichten, Gaseinlassorgan sowie Vorrichtung zur Durchführung des Verfahrens
US6527855B2 (en) 2000-10-10 2003-03-04 Rensselaer Polytechnic Institute Atomic layer deposition of cobalt from cobalt metallorganic compounds
US6660660B2 (en) 2000-10-10 2003-12-09 Asm International, Nv. Methods for making a dielectric stack in an integrated circuit
US6428847B1 (en) 2000-10-16 2002-08-06 Primaxx, Inc. Vortex based CVD reactor
EP1340269B1 (en) 2000-11-30 2009-02-25 Asm International N.V. Thin films for magnetic devices
US6905547B1 (en) 2000-12-21 2005-06-14 Genus, Inc. Method and apparatus for flexible atomic layer deposition
KR100881681B1 (ko) 2001-01-18 2009-02-06 가부시키가이샤 와타나베 쇼코 기화기 및 이를 이용한 각종 장치와 기화 방법
US7591957B2 (en) 2001-01-30 2009-09-22 Rapt Industries, Inc. Method for atmospheric pressure reactive atom plasma processing for surface modification
KR100781820B1 (ko) 2001-02-21 2007-12-03 시부야 코교 가부시키가이샤 기체액체 혼합류의 분사장치
US6878206B2 (en) 2001-07-16 2005-04-12 Applied Materials, Inc. Lid assembly for a processing system to facilitate sequential deposition techniques
BR0101433B1 (pt) 2001-04-10 2011-02-22 método e dispositivo de entrada multi-funcional para reator tubular de fluxo descendente.
US20030019428A1 (en) 2001-04-28 2003-01-30 Applied Materials, Inc. Chemical vapor deposition chamber
US6626997B2 (en) 2001-05-17 2003-09-30 Nathan P. Shapiro Continuous processing chamber
KR100421219B1 (ko) 2001-06-14 2004-03-02 삼성전자주식회사 β-디케톤 리간드를 갖는 유기 금속 착물을 이용한 원자층증착방법
US20030070620A1 (en) 2001-10-15 2003-04-17 Cooperberg David J. Tunable multi-zone gas injection system
US7780785B2 (en) 2001-10-26 2010-08-24 Applied Materials, Inc. Gas delivery apparatus for atomic layer deposition
US6916398B2 (en) 2001-10-26 2005-07-12 Applied Materials, Inc. Gas delivery apparatus and method for atomic layer deposition
US20080102208A1 (en) 2001-10-26 2008-05-01 Dien-Yeh Wu Vortex chamber lids for atomic layer deposition
US20080102203A1 (en) 2001-10-26 2008-05-01 Dien-Yeh Wu Vortex chamber lids for atomic layer deposition
US7204886B2 (en) 2002-11-14 2007-04-17 Applied Materials, Inc. Apparatus and method for hybrid chemical processing
US7780789B2 (en) 2001-10-26 2010-08-24 Applied Materials, Inc. Vortex chamber lids for atomic layer deposition
US6660177B2 (en) 2001-11-07 2003-12-09 Rapt Industries Inc. Apparatus and method for reactive atom plasma processing for material deposition
WO2003065424A2 (en) 2002-01-25 2003-08-07 Applied Materials, Inc. Apparatus for cyclical deposition of thin films
US7163587B2 (en) 2002-02-08 2007-01-16 Axcelis Technologies, Inc. Reactor assembly and processing method
US6899507B2 (en) 2002-02-08 2005-05-31 Asm Japan K.K. Semiconductor processing apparatus comprising chamber partitioned into reaction and transfer sections
US6846516B2 (en) 2002-04-08 2005-01-25 Applied Materials, Inc. Multiple precursor cyclical deposition system
US6684719B2 (en) 2002-05-03 2004-02-03 Caterpillar Inc Method and apparatus for mixing gases
CN1464401B (zh) 2002-06-28 2010-05-26 国际商业机器公司 使用影子对象进行核准控制的面向对象系统和方法
US6921062B2 (en) * 2002-07-23 2005-07-26 Advanced Technology Materials, Inc. Vaporizer delivery ampoule
US6884296B2 (en) 2002-08-23 2005-04-26 Micron Technology, Inc. Reactors having gas distributors and methods for depositing materials onto micro-device workpieces
FR2846733B1 (fr) 2002-10-31 2006-09-15 Valeo Thermique Moteur Sa Condenseur, notamment pour un circuit de cimatisation de vehicule automobile, et circuit comprenant ce condenseur
JP3889698B2 (ja) 2002-11-22 2007-03-07 本田技研工業株式会社 蓄熱装置
US7045060B1 (en) 2002-12-05 2006-05-16 Inflowsion, L.L.C. Apparatus and method for treating a liquid
US7296532B2 (en) 2002-12-18 2007-11-20 Taiwan Semiconductor Manufacturing Co., Ltd. Bypass gas feed system and method to improve reactant gas flow and film deposition
KR100500246B1 (ko) 2003-04-09 2005-07-11 삼성전자주식회사 가스공급장치
US7914847B2 (en) 2003-05-09 2011-03-29 Asm America, Inc. Reactor surface passivation through chemical deactivation
EP1623454A2 (en) 2003-05-09 2006-02-08 ASM America, Inc. Reactor surface passivation through chemical deactivation
US20050000428A1 (en) 2003-05-16 2005-01-06 Shero Eric J. Method and apparatus for vaporizing and delivering reactant
WO2004113585A2 (en) 2003-06-18 2004-12-29 Applied Materials, Inc. Atomic layer deposition of barrier materials
US7304263B2 (en) 2003-08-14 2007-12-04 Rapt Industries, Inc. Systems and methods utilizing an aperture with a reactive atom plasma torch
US7297892B2 (en) 2003-08-14 2007-11-20 Rapt Industries, Inc. Systems and methods for laser-assisted plasma processing
US8152922B2 (en) 2003-08-29 2012-04-10 Asm America, Inc. Gas mixer and manifold assembly for ALD reactor
JP2005101454A (ja) 2003-09-26 2005-04-14 Watanabe Shoko:Kk 気化器
US7408225B2 (en) 2003-10-09 2008-08-05 Asm Japan K.K. Apparatus and method for forming thin film using upstream and downstream exhaust mechanisms
TWI373583B (en) 2003-10-17 2012-10-01 Sundew Technologies Llc Fail safe pneumatically actuated valve with fast time response and adjustable conductance
US7020981B2 (en) 2003-10-29 2006-04-04 Asm America, Inc Reaction system for growing a thin film
WO2009105668A1 (en) 2008-02-20 2009-08-27 President And Fellows Of Harvard College Bicyclic guanidines, metal complexes thereof and their use in vapor deposition
DE102004007456A1 (de) 2004-02-13 2005-09-01 Degussa Ag Hochgefüllte Polyolefin-Compounds
NL1026873C2 (nl) 2004-02-25 2005-08-26 Ferro Techniek Holding Bv Inrichting en werkwijze voor het verwarmen van vloeistoffen, en basisstructuur.
US20050252449A1 (en) 2004-05-12 2005-11-17 Nguyen Son T Control of gas flow and delivery to suppress the formation of particles in an MOCVD/ALD system
KR101318495B1 (ko) 2004-11-09 2013-10-16 스미토모 베이클리트 컴퍼니 리미티드 분해 반응 장치, 재생수지 조성물 원료 제조 시스템,재생수지 조성물 원료 제조방법, 재생수지 조성물 원료 및성형체
KR100782369B1 (ko) 2004-11-11 2007-12-07 삼성전자주식회사 반도체 제조장치
US7846499B2 (en) 2004-12-30 2010-12-07 Asm International N.V. Method of pulsing vapor precursors in an ALD reactor
US8211230B2 (en) 2005-01-18 2012-07-03 Asm America, Inc. Reaction system for growing a thin film
US8298336B2 (en) 2005-04-01 2012-10-30 Lam Research Corporation High strip rate downstream chamber
US7416994B2 (en) 2005-06-28 2008-08-26 Micron Technology, Inc. Atomic layer deposition systems and methods including metal beta-diketiminate compounds
WO2007035074A1 (en) 2005-09-26 2007-03-29 Lg Chem, Ltd. Stack type reactor
US20070119371A1 (en) 2005-11-04 2007-05-31 Paul Ma Apparatus and process for plasma-enhanced atomic layer deposition
US7918938B2 (en) 2006-01-19 2011-04-05 Asm America, Inc. High temperature ALD inlet manifold
US20070194470A1 (en) 2006-02-17 2007-08-23 Aviza Technology, Inc. Direct liquid injector device
JP2009539237A (ja) 2006-06-02 2009-11-12 レール・リキード−ソシエテ・アノニム・プール・レテュード・エ・レクスプロワタシオン・デ・プロセデ・ジョルジュ・クロード 新規なチタン、ジルコニウムおよびハフニウム前駆体をベースとするhigh−k誘電体フィルムを形成する方法および半導体製造におけるそれらの使用
US7638645B2 (en) 2006-06-28 2009-12-29 President And Fellows Of Harvard University Metal (IV) tetra-amidinate compounds and their use in vapor deposition
EP2032529B1 (en) 2006-06-28 2012-10-17 President and Fellows of Harvard College Metal(iv) tetra-amidinate compounds and their use in vapor deposition
CN101117308A (zh) 2006-08-04 2008-02-06 浙江医药股份有限公司新昌制药厂 乙酰丙酮酸钼的制备方法
KR100791073B1 (ko) 2006-08-16 2008-01-02 삼성전자주식회사 난류 날개들을 갖는 배기 배관 및 배기 시스템
CN101506561B (zh) 2006-08-23 2012-04-18 株式会社堀场Stec 组合式气体分配盘装置
US20080241805A1 (en) * 2006-08-31 2008-10-02 Q-Track Corporation System and method for simulated dosimetry using a real time locating system
US8137462B2 (en) 2006-10-10 2012-03-20 Asm America, Inc. Precursor delivery system
CN101191612A (zh) 2006-11-20 2008-06-04 游图明 用于家用电器的蒸汽形成方法及装置
US20080241387A1 (en) 2007-03-29 2008-10-02 Asm International N.V. Atomic layer deposition reactor
US20080254218A1 (en) 2007-04-16 2008-10-16 Air Products And Chemicals, Inc. Metal Precursor Solutions For Chemical Vapor Deposition
JP2008264640A (ja) 2007-04-18 2008-11-06 Shimadzu Corp 混合器
US8142847B2 (en) 2007-07-13 2012-03-27 Rohm And Haas Electronic Materials Llc Precursor compositions and methods
US20090095222A1 (en) 2007-10-16 2009-04-16 Alexander Tam Multi-gas spiral channel showerhead
US8137463B2 (en) 2007-12-19 2012-03-20 Applied Materials, Inc. Dual zone gas injection nozzle
KR100880773B1 (ko) 2008-01-23 2009-02-02 (주) 씨엠테크 유체 가열장치
CN101772833B (zh) 2008-02-20 2012-04-18 东京毅力科创株式会社 气体供给装置
JP2009239082A (ja) 2008-03-27 2009-10-15 Tokyo Electron Ltd ガス供給装置、処理装置及び処理方法
US8463117B2 (en) 2008-06-24 2013-06-11 Advanced Materials Enterprises Company Limited Water heating apparatus
US8291857B2 (en) 2008-07-03 2012-10-23 Applied Materials, Inc. Apparatuses and methods for atomic layer deposition
KR20100015213A (ko) 2008-08-04 2010-02-12 삼성전기주식회사 Cvd용 샤워 헤드 및 이를 구비하는 화학 기상 증착 장치
US8666238B2 (en) 2008-08-06 2014-03-04 Nexthermal Corporation Fluid preheater
CN102112215B (zh) 2008-08-07 2014-08-13 旭有机材工业株式会社 流体混合器及使用流体混合器的装置
US8187381B2 (en) 2008-08-22 2012-05-29 Applied Materials, Inc. Process gas delivery for semiconductor process chamber
WO2010047168A1 (ja) 2008-10-20 2010-04-29 旭有機材工業株式会社 渦巻き式流体混合器及び渦巻き式流体混合器を用いた装置
WO2010047167A1 (ja) 2008-10-20 2010-04-29 旭有機材工業株式会社 螺旋式流体混合器及び螺旋式流体混合器を用いた装置
US8702017B2 (en) 2008-12-16 2014-04-22 Asm Assembly Automation Ltd Nozzle device employing high frequency wave energy
US7927942B2 (en) 2008-12-19 2011-04-19 Asm International N.V. Selective silicide process
JP5658463B2 (ja) 2009-02-27 2015-01-28 株式会社日立国際電気 基板処理装置及び半導体装置の製造方法
WO2010114386A1 (en) 2009-03-30 2010-10-07 Universitetet I Oslo Thin films containing molybdenum oxide
US9394608B2 (en) 2009-04-06 2016-07-19 Asm America, Inc. Semiconductor processing reactor and components thereof
WO2010123877A2 (en) 2009-04-21 2010-10-28 Applied Materials, Inc. Cvd apparatus for improved film thickness non-uniformity and particle performance
US20100266765A1 (en) 2009-04-21 2010-10-21 White Carl L Method and apparatus for growing a thin film onto a substrate
US8628618B2 (en) 2009-09-29 2014-01-14 Novellus Systems Inc. Precursor vapor generation and delivery system with filters and filter monitoring system
JP5484008B2 (ja) 2009-11-13 2014-05-07 旭有機材工業株式会社 静止型流体混合器及び静止型流体混合器を用いた装置
JP2011104483A (ja) 2009-11-13 2011-06-02 Asahi Organic Chemicals Industry Co Ltd 静的流体混合器及び静的流体混合器を用いた装置
JP5441746B2 (ja) 2010-02-05 2014-03-12 旭有機材工業株式会社 流体混合器および流体混合器を用いた装置
JP5839830B2 (ja) 2010-04-28 2016-01-06 昭和電工株式会社 有機金属錯体化合物、有機金属錯体化合物の製造方法および有機金属錯体化合物を含む光硬化性組成物
DE112011102020B4 (de) 2010-06-16 2019-07-11 Hitachi High-Technologies Corporation Flüssigkeitsmischvorrichtung und Flüssigkeitschromatograph
SG187920A1 (en) 2010-08-27 2013-03-28 Sigma Aldrich Co Llc Molybdenum (iv) amide precursors and use thereof in atomic layer deposition
JP2012099594A (ja) 2010-11-01 2012-05-24 Hitachi Kokusai Electric Inc 基板処理装置
US8746284B2 (en) 2011-05-11 2014-06-10 Intermolecular, Inc. Apparatus and method for multiple symmetrical divisional gas distribution
US8809170B2 (en) 2011-05-19 2014-08-19 Asm America Inc. High throughput cyclical epitaxial deposition and etch process
JP5730670B2 (ja) 2011-05-27 2015-06-10 株式会社Adeka 酸化モリブデンを含有する薄膜の製造方法、及び酸化モリブデンを含有する薄膜の形成用原料
US8636958B2 (en) 2011-09-07 2014-01-28 Marathon Oil Canada Corporation Nozzle reactor and method of use
US8485230B2 (en) 2011-09-08 2013-07-16 Laor Consulting Llc Gas delivery system
JP2013075281A (ja) 2011-09-30 2013-04-25 Asahi Organic Chemicals Industry Co Ltd 流体混合器および流体混合器を用いた装置
US9574268B1 (en) 2011-10-28 2017-02-21 Asm America, Inc. Pulsed valve manifold for atomic layer deposition
US9388492B2 (en) 2011-12-27 2016-07-12 Asm America, Inc. Vapor flow control apparatus for atomic layer deposition
JP5848140B2 (ja) 2012-01-20 2016-01-27 東京エレクトロン株式会社 プラズマ処理装置
JPWO2013111789A1 (ja) 2012-01-23 2015-05-11 旭有機材工業株式会社 スタティックミキサーおよびスタティックミキサーを用いた装置
ITTO20120451A1 (it) 2012-05-24 2013-11-25 Lavazza Luigi Spa Dispositivo riscaldatore elettrico per la produzione di acqua calda e/o vapore.
US9279185B2 (en) 2012-06-14 2016-03-08 Asm Technology Singapore Pte Ltd Feed-through apparatus for a chemical vapour deposition device
US8985152B2 (en) * 2012-06-15 2015-03-24 Novellus Systems, Inc. Point of use valve manifold for semiconductor fabrication equipment
CN102974255B (zh) 2012-10-31 2015-07-01 中国科学院过程工程研究所 一种被动式螺旋微结构混合装置及应用
CN104798446B (zh) 2013-03-12 2017-09-08 应用材料公司 具有方位角与径向分布控制的多区域气体注入组件
US10480077B2 (en) 2013-03-13 2019-11-19 Applied Materials, Inc. PEALD apparatus to enable rapid cycling
US9327252B2 (en) * 2013-03-15 2016-05-03 Applied Materials, Inc. Compact device for enhancing the mixing of gaseous species
US20140284404A1 (en) 2013-03-20 2014-09-25 Asm Technology Singapore Pte Ltd. Chemical vapour deposition injector
KR101464173B1 (ko) 2013-07-23 2014-11-21 영남대학교 산학협력단 전이금속 칼코겐화합물 박막 형성 방법
US10716199B2 (en) * 2013-07-25 2020-07-14 Hypertherm, Inc. Devices for gas cooling plasma arc torches and related systems and methods
KR101621470B1 (ko) 2013-07-31 2016-05-16 건국대학교 산학협력단 MoS2 박막 및 이의 제조방법
US9353440B2 (en) 2013-12-20 2016-05-31 Applied Materials, Inc. Dual-direction chemical delivery system for ALD/CVD chambers
FR3016889B1 (fr) 2014-01-24 2016-01-22 Commissariat Energie Atomique Procede de reaslisation par ald d'une couche mince de formule myx
US10099948B2 (en) 2014-02-20 2018-10-16 King Abdullah University Of Science And Technology Spiral-shaped disinfection reactors
US10683571B2 (en) 2014-02-25 2020-06-16 Asm Ip Holding B.V. Gas supply manifold and method of supplying gases to chamber using same
US10107490B2 (en) 2014-06-30 2018-10-23 Lam Research Corporation Configurable liquid precursor vaporizer
KR102267923B1 (ko) 2014-08-26 2021-06-22 에이에스엠 아이피 홀딩 비.브이. 증착 장치
EP3207980A4 (en) 2014-10-14 2018-07-04 Alps Electric Co., Ltd. Fluid mixing device
US10557197B2 (en) * 2014-10-17 2020-02-11 Lam Research Corporation Monolithic gas distribution manifold and various construction techniques and use cases therefor
KR101535573B1 (ko) 2014-11-04 2015-07-13 연세대학교 산학협력단 전이금속 칼코겐 화합물 합성 방법
CN104561937B (zh) 2015-01-05 2017-08-15 上海纳米技术及应用国家工程研究中心有限公司 原子层沉积制备具有固体润滑作用的ws2薄膜方法
US9982341B2 (en) 2015-01-30 2018-05-29 Lam Research Corporation Modular vaporizer
US20160256889A1 (en) * 2015-03-06 2016-09-08 Nordson Corporation Variable output dispensing applicator and associated methods of dispensing
KR102314722B1 (ko) 2015-05-27 2021-10-20 에이에스엠 아이피 홀딩 비.브이. 몰리브덴 또는 텅스텐 함유 박막의 ald용 전구체의 합성 및 사용
US10662527B2 (en) 2016-06-01 2020-05-26 Asm Ip Holding B.V. Manifolds for uniform vapor deposition
JP6694618B2 (ja) * 2016-06-21 2020-05-20 株式会社フジキン 流体制御装置
US10358407B2 (en) 2016-10-12 2019-07-23 Asm Ip Holding B.V. Synthesis and use of precursors for vapor deposition of tungsten containing thin films
CN109891138B (zh) * 2016-10-24 2020-07-07 株式会社富士金 流体控制装置和使用该流体控制装置的制品制造方法
US11104993B2 (en) * 2017-07-28 2021-08-31 Entegris, Inc. Modular tray ampoule
US10147597B1 (en) 2017-09-14 2018-12-04 Lam Research Corporation Turbulent flow spiral multi-zone precursor vaporizer
CN111417809A (zh) * 2017-11-30 2020-07-14 株式会社富士金 阀装置、使用该阀装置的流体控制装置以及半导体制造装置
US11492701B2 (en) * 2019-03-19 2022-11-08 Asm Ip Holding B.V. Reactor manifolds
KR20210048408A (ko) * 2019-10-22 2021-05-03 에이에스엠 아이피 홀딩 비.브이. 반도체 증착 반응기 매니폴드

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002057114A (ja) 2000-04-28 2002-02-22 Applied Materials Inc 遠隔プラズマ発生器の半導体処理チャンバとの統合化
JP2009111359A (ja) 2007-09-28 2009-05-21 Applied Materials Inc 原子層堆積チャンバ及び構成部品
JP2013522463A (ja) 2010-03-12 2013-06-13 アプライド マテリアルズ インコーポレイテッド 複式噴射を伴う原子層堆積チャンバ

Also Published As

Publication number Publication date
TWI879761B (zh) 2025-04-11
TW202104649A (zh) 2021-02-01
CN111719138A (zh) 2020-09-29
US20200299836A1 (en) 2020-09-24
KR20200112698A (ko) 2020-10-05
JP2020155776A (ja) 2020-09-24
US11492701B2 (en) 2022-11-08
KR102830785B1 (ko) 2025-07-04

Similar Documents

Publication Publication Date Title
US12416081B2 (en) Manifolds for uniform vapor deposition
KR102830785B1 (ko) 반응기 매니폴드
US11830731B2 (en) Semiconductor deposition reactor manifolds
US10370761B2 (en) Pulsed valve manifold for atomic layer deposition
US20120225192A1 (en) Apparatus And Process For Atomic Layer Deposition
US11208722B2 (en) Vapor flow control apparatus for atomic layer deposition
US20150368798A1 (en) Apparatus And Process Containment For Spatially Separated Atomic Layer Deposition
US20260085416A1 (en) Reactor manifolds
CN221720921U (zh) 半导体处理设备

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20230301

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20230301

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20240227

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20240229

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20240520

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20240716

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20240724

R150 Certificate of patent or registration of utility model

Ref document number: 7527817

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150