ES2163388T3 - Instalacion de vacio. - Google Patents
Instalacion de vacio.Info
- Publication number
- ES2163388T3 ES2163388T3 ES89109054T ES89109054T ES2163388T3 ES 2163388 T3 ES2163388 T3 ES 2163388T3 ES 89109054 T ES89109054 T ES 89109054T ES 89109054 T ES89109054 T ES 89109054T ES 2163388 T3 ES2163388 T3 ES 2163388T3
- Authority
- ES
- Spain
- Prior art keywords
- chamber
- workpieces
- chambers
- transfer mechanism
- distributor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
- H01L21/67167—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers surrounding a central transfer chamber
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/6719—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the processing chambers, e.g. modular processing chambers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68707—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a robot blade, or gripped by a gripper for conveyance
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S414/00—Material or article handling
- Y10S414/135—Associated with semiconductor wafer handling
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S414/00—Material or article handling
- Y10S414/135—Associated with semiconductor wafer handling
- Y10S414/137—Associated with semiconductor wafer handling including means for charging or discharging wafer cassette
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S414/00—Material or article handling
- Y10S414/135—Associated with semiconductor wafer handling
- Y10S414/139—Associated with semiconductor wafer handling including wafer charging or discharging means for vacuum chamber
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Robotics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Coating Apparatus (AREA)
- Physical Vapour Deposition (AREA)
- Drying Of Semiconductors (AREA)
- Applications Or Details Of Rotary Compressors (AREA)
- Manipulator (AREA)
- Fluid-Driven Valves (AREA)
- Electron Tubes For Measurement (AREA)
Abstract
LA INSTALACION DE VACIO PARA TRATAMIENTO DE PIEZAS DE TRABAJO EN FORMA DE DISCO MUESTRA UNA CAMARA DE DISTRIBUCION CENTRAL (7), EN LA QUE SE INTRODUCEN LAS PIEZAS DE TRABAJO DESDE UNA ESCLUSA POR UNA ABERTURA DE CONEXION QUE SE CIERRA MEDIANTE UN ELEMENTO DE CIERRE (8) CON AYUDA DE UN MECANISMO DE TRANSPORTE (10, 11, 12) COLOCADO EN LA CAMARA DE DISTRIBUCION, PRINCIPALAMENTE EN FORMA DE UN BRAZIO DE ROBOT. EN LA CAMARA DE DISTRIBUCION (7) SE ENCIERRAN ADEMAS POR EL PERIMETRO DE LA MISMA CAMARA INTERMEDIA DISTRIBUIDA (15) COMO MODULO INTERCAMBIABLE, CON LO QUE LA CONEXION ENTRE ESTOS SE PUEDE CERRAR CADA POSICION DE CIERRE POR UN ELEMENTO DE CIERRE (4). UNA CAMARA INTERMEDIA (15) ESTA EN CONEXION CON AL MENOS UNA CAMARA DE PROCESO (24, 25) POR UNA ABERTURA DE CONEXION (22, 23), QUE CON OBJETO DE LA SEPARACION DE LA CAMARA DEPROCESO DE LA CAMARA INTERMEDIA SE CIERRA. EN LA CAMARA INTERMEDIA (15) ESTA COLOCADO OTRO MECANISMO DE TRANSPORTE (20, 21) CON OBJETO DE SOBRETOMA DE LAS PIEZAS DE TRABAJO DEL PRIMER MECANISMO DE TRANSPORTE (10, 11, 12), QUE SITUA LAS PIEZAS DE TRABAJO EN UNA MESA ELEVADORA (26, 27) COLOCADA EN LA PARTE INFERIOR DE UNA CAMARA DE PROCESO (24, 25). ESTA LLEVA LA PIEZA DE TRABAJO EN LA CAMARA DE PROCESO CORRESPONDIENTE Y SEPARA SIMULTANEAMENTE ESTA DE LA CAMARA INTERMEDIA VARIAS CAMARAS DE PROCESO (24, 25). LOS ELEMENTOS DE CIERRA (8, 14, 26, 27) EN LAS ABERTURAS DE CONEXION ENTRE LAS CAMARAS (7, 15, 24, 25) SE GOBIERNAN AL LLEVAR A CABO EL PROCESO DE TAL MODO QUE NO PUEDE TENER LUGAR NINGUN EXCESO NO DESEADO DE GASES O PARTICULAS DE UNAS CAMARA DE PROCESO EN LAS OTRAS.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CH195188 | 1988-05-24 | ||
CH272288 | 1988-07-15 |
Publications (1)
Publication Number | Publication Date |
---|---|
ES2163388T3 true ES2163388T3 (es) | 2002-02-01 |
Family
ID=25689081
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES89109054T Expired - Lifetime ES2163388T3 (es) | 1988-05-24 | 1989-05-19 | Instalacion de vacio. |
Country Status (6)
Country | Link |
---|---|
US (2) | US4990047A (es) |
EP (1) | EP0343530B1 (es) |
JP (4) | JP3121602B2 (es) |
AT (1) | ATE208961T1 (es) |
DE (1) | DE58909880D1 (es) |
ES (1) | ES2163388T3 (es) |
Families Citing this family (101)
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CN112391608A (zh) * | 2020-11-13 | 2021-02-23 | 宁波沁圆科技有限公司 | Cvd处理系统及处理方法 |
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JPH0669027B2 (ja) * | 1983-02-21 | 1994-08-31 | 株式会社日立製作所 | 半導体ウエハの薄膜形成方法 |
JPS6074531A (ja) * | 1983-09-30 | 1985-04-26 | Hitachi Ltd | 真空処理装置 |
JPH06105742B2 (ja) * | 1983-11-28 | 1994-12-21 | 株式会社日立製作所 | 真空処理方法及び装置 |
GB8332394D0 (en) * | 1983-12-05 | 1984-01-11 | Pilkington Brothers Plc | Coating apparatus |
JPS60125371A (ja) * | 1983-12-09 | 1985-07-04 | Hitachi Ltd | 真空内基板加熱装置 |
US4553069A (en) * | 1984-01-05 | 1985-11-12 | General Ionex Corporation | Wafer holding apparatus for ion implantation |
US4603466A (en) * | 1984-02-17 | 1986-08-05 | Gca Corporation | Wafer chuck |
JPS60238134A (ja) * | 1984-04-16 | 1985-11-27 | Tokuda Seisakusho Ltd | 真空処理装置 |
JPS611017A (ja) * | 1984-06-13 | 1986-01-07 | Kokusai Electric Co Ltd | 半導体基板の熱処理装置 |
US4534816A (en) * | 1984-06-22 | 1985-08-13 | International Business Machines Corporation | Single wafer plasma etch reactor |
JPS6130030A (ja) * | 1984-07-12 | 1986-02-12 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | 多元素半導体のアニ−ル方法 |
JPS61107720A (ja) * | 1984-10-31 | 1986-05-26 | Hitachi Ltd | 分子線エピタキシ装置 |
JPS61112312A (ja) * | 1984-11-07 | 1986-05-30 | Hitachi Ltd | 真空連続処理装置 |
US4693777A (en) * | 1984-11-30 | 1987-09-15 | Kabushiki Kaisha Toshiba | Apparatus for producing semiconductor devices |
US4874312A (en) * | 1985-03-11 | 1989-10-17 | Hailey Robert W | Heating and handling system for objects |
EP0198501B1 (en) * | 1985-04-17 | 1992-07-01 | Hitachi, Ltd. | Gripping device |
JPH07105345B2 (ja) * | 1985-08-08 | 1995-11-13 | 日電アネルバ株式会社 | 基体処理装置 |
JPS6251170U (es) * | 1985-09-19 | 1987-03-30 | ||
JP2540524B2 (ja) * | 1985-10-24 | 1996-10-02 | テキサス インスツルメンツ インコ−ポレイテツド | ウエ−ハ支持体 |
US4796562A (en) * | 1985-12-03 | 1989-01-10 | Varian Associates, Inc. | Rapid thermal cvd apparatus |
US4709655A (en) * | 1985-12-03 | 1987-12-01 | Varian Associates, Inc. | Chemical vapor deposition apparatus |
US4909695A (en) * | 1986-04-04 | 1990-03-20 | Materials Research Corporation | Method and apparatus for handling and processing wafer-like materials |
US4705951A (en) * | 1986-04-17 | 1987-11-10 | Varian Associates, Inc. | Wafer processing system |
EP0246453A3 (en) * | 1986-04-18 | 1989-09-06 | General Signal Corporation | Novel multiple-processing and contamination-free plasma etching system |
US4715921A (en) * | 1986-10-24 | 1987-12-29 | General Signal Corporation | Quad processor |
GB8709064D0 (en) * | 1986-04-28 | 1987-05-20 | Varian Associates | Wafer handling arm |
ATE84276T1 (de) * | 1986-04-28 | 1993-01-15 | Varian Associates | Modulare foerder- und beabeitungsanlage fuer halbleiterwafer. |
US4917556A (en) * | 1986-04-28 | 1990-04-17 | Varian Associates, Inc. | Modular wafer transport and processing system |
JPS62277234A (ja) * | 1986-05-23 | 1987-12-02 | Canon Inc | 静電チヤツク装置 |
DE3633386A1 (de) * | 1986-10-01 | 1988-04-14 | Leybold Ag | Verfahren und vorrichtung zum behandeln von substraten im vakuum |
US4874273A (en) * | 1987-03-16 | 1989-10-17 | Hitachi, Ltd. | Apparatus for holding and/or conveying articles by fluid |
US4828224A (en) * | 1987-10-15 | 1989-05-09 | Epsilon Technology, Inc. | Chemical vapor deposition system |
ATE96576T1 (de) * | 1987-12-03 | 1993-11-15 | Balzers Hochvakuum | Verfahren und vorrichtung zur uebertragung thermischer energie auf bzw. von einem plattenfoermigen substrat. |
-
1989
- 1989-05-19 DE DE58909880T patent/DE58909880D1/de not_active Expired - Lifetime
- 1989-05-19 EP EP89109054A patent/EP0343530B1/de not_active Expired - Lifetime
- 1989-05-19 AT AT89109054T patent/ATE208961T1/de not_active IP Right Cessation
- 1989-05-19 ES ES89109054T patent/ES2163388T3/es not_active Expired - Lifetime
- 1989-05-24 JP JP12901389A patent/JP3121602B2/ja not_active Expired - Lifetime
- 1989-05-24 US US07/356,872 patent/US4990047A/en not_active Expired - Lifetime
-
1990
- 1990-09-04 US US07/577,462 patent/US5090900A/en not_active Expired - Lifetime
-
1998
- 1998-09-16 JP JP10261550A patent/JPH11145252A/ja not_active Withdrawn
-
1999
- 1999-04-16 JP JP10972699A patent/JP3455468B2/ja not_active Expired - Lifetime
-
2005
- 2005-01-12 JP JP2005005068A patent/JP4012941B2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US5090900A (en) | 1992-02-25 |
US4990047A (en) | 1991-02-05 |
DE58909880D1 (de) | 2001-12-20 |
JPH11145252A (ja) | 1999-05-28 |
EP0343530A2 (de) | 1989-11-29 |
JP3121602B2 (ja) | 2001-01-09 |
EP0343530B1 (de) | 2001-11-14 |
JPH0297035A (ja) | 1990-04-09 |
JP2005167270A (ja) | 2005-06-23 |
JP4012941B2 (ja) | 2007-11-28 |
EP0343530A3 (de) | 1990-12-27 |
ATE208961T1 (de) | 2001-11-15 |
JPH11345860A (ja) | 1999-12-14 |
JP3455468B2 (ja) | 2003-10-14 |
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