JP5792472B2 - 放射線画像取得装置 - Google Patents

放射線画像取得装置 Download PDF

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Publication number
JP5792472B2
JP5792472B2 JP2011013195A JP2011013195A JP5792472B2 JP 5792472 B2 JP5792472 B2 JP 5792472B2 JP 2011013195 A JP2011013195 A JP 2011013195A JP 2011013195 A JP2011013195 A JP 2011013195A JP 5792472 B2 JP5792472 B2 JP 5792472B2
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JP
Japan
Prior art keywords
image
imaging unit
imaging
radiation
image acquisition
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JP2011013195A
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Japanese (ja)
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JP2012154734A5 (enExample
JP2012154734A (ja
Inventor
元胤 杉山
元胤 杉山
須山　敏康
敏康 須山
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Hamamatsu Photonics KK
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Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Priority to JP2011013195A priority Critical patent/JP5792472B2/ja
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Priority to EP11856980.5A priority patent/EP2669664A4/en
Priority to US13/981,372 priority patent/US9255996B2/en
Priority to PCT/JP2011/074330 priority patent/WO2012101880A1/ja
Priority to CN201190001003.7U priority patent/CN203396723U/zh
Priority to DE202011110809.4U priority patent/DE202011110809U1/de
Publication of JP2012154734A publication Critical patent/JP2012154734A/ja
Publication of JP2012154734A5 publication Critical patent/JP2012154734A5/ja
Application granted granted Critical
Publication of JP5792472B2 publication Critical patent/JP5792472B2/ja
Priority to US14/974,975 priority patent/US10101469B2/en
Priority to US16/101,967 priority patent/US10746884B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2002—Optical details, e.g. reflecting or diffusing layers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2006—Measuring radiation intensity with scintillation detectors using a combination of a scintillator and photodetector which measures the means radiation intensity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/611—Specific applications or type of materials patterned objects; electronic devices

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2011013195A 2011-01-25 2011-01-25 放射線画像取得装置 Active JP5792472B2 (ja)

Priority Applications (8)

Application Number Priority Date Filing Date Title
JP2011013195A JP5792472B2 (ja) 2011-01-25 2011-01-25 放射線画像取得装置
US13/981,372 US9255996B2 (en) 2011-01-25 2011-10-21 Radiation image acquisition device
PCT/JP2011/074330 WO2012101880A1 (ja) 2011-01-25 2011-10-21 放射線画像取得装置
CN201190001003.7U CN203396723U (zh) 2011-01-25 2011-10-21 放射线图像取得装置
EP11856980.5A EP2669664A4 (en) 2011-01-25 2011-10-21 Radiation image acquisition device
DE202011110809.4U DE202011110809U1 (de) 2011-01-25 2011-10-21 Strahlungsbilderfassungsvorrichtung
US14/974,975 US10101469B2 (en) 2011-01-25 2015-12-18 Radiation image acquisition device
US16/101,967 US10746884B2 (en) 2011-01-25 2018-08-13 Radiation image acquisition device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011013195A JP5792472B2 (ja) 2011-01-25 2011-01-25 放射線画像取得装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2015156065A Division JP5973040B2 (ja) 2015-08-06 2015-08-06 放射線画像取得装置

Publications (3)

Publication Number Publication Date
JP2012154734A JP2012154734A (ja) 2012-08-16
JP2012154734A5 JP2012154734A5 (enExample) 2014-03-06
JP5792472B2 true JP5792472B2 (ja) 2015-10-14

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JP2011013195A Active JP5792472B2 (ja) 2011-01-25 2011-01-25 放射線画像取得装置

Country Status (6)

Country Link
US (3) US9255996B2 (enExample)
EP (1) EP2669664A4 (enExample)
JP (1) JP5792472B2 (enExample)
CN (1) CN203396723U (enExample)
DE (1) DE202011110809U1 (enExample)
WO (1) WO2012101880A1 (enExample)

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JP5792472B2 (ja) 2011-01-25 2015-10-14 浜松ホトニクス株式会社 放射線画像取得装置
JP5944254B2 (ja) * 2012-07-20 2016-07-05 浜松ホトニクス株式会社 放射線画像取得装置
WO2016124345A1 (en) * 2015-02-04 2016-08-11 Asml Netherlands B.V. Metrology method, metrology apparatus and device manufacturing method
WO2016179329A1 (en) 2015-05-04 2016-11-10 The Regents Of The University Of Colorado, A Body Corporate Wireless power transfer
FI3358375T3 (fi) 2015-09-30 2023-11-21 Hamamatsu Photonics Kk Röntgenkuvan hankintajärjestelmä ja röntgenkuvan hankintamenetelmä
KR102592905B1 (ko) * 2016-12-21 2023-10-23 삼성전자주식회사 엑스선 영상 촬영 장치 및 제어방법
JP6738363B2 (ja) 2018-03-09 2020-08-12 浜松ホトニクス株式会社 画像取得システムおよび画像取得方法
JP7319790B2 (ja) * 2019-02-27 2023-08-02 浜松ホトニクス株式会社 放射線撮像ユニットにおけるシンチレータの取付構造
JP6719004B1 (ja) 2019-02-27 2020-07-08 浜松ホトニクス株式会社 撮像ユニットおよび放射線画像取得システム
JP7250891B2 (ja) * 2020-07-17 2023-04-03 浜松ホトニクス株式会社 画像取得システムおよび画像取得方法
JP6985557B2 (ja) * 2020-07-17 2021-12-22 浜松ホトニクス株式会社 画像取得システムおよび画像取得方法
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Also Published As

Publication number Publication date
DE202011110809U1 (de) 2016-07-14
US10101469B2 (en) 2018-10-16
EP2669664A4 (en) 2017-07-12
CN203396723U (zh) 2014-01-15
JP2012154734A (ja) 2012-08-16
WO2012101880A1 (ja) 2012-08-02
US20160103231A1 (en) 2016-04-14
US10746884B2 (en) 2020-08-18
US20190086558A1 (en) 2019-03-21
US9255996B2 (en) 2016-02-09
US20140016752A1 (en) 2014-01-16
EP2669664A1 (en) 2013-12-04

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