JP5106166B2 - フラットパネルディスプレイの検査方法及び検査装置 - Google Patents
フラットパネルディスプレイの検査方法及び検査装置 Download PDFInfo
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- JP5106166B2 JP5106166B2 JP2008032513A JP2008032513A JP5106166B2 JP 5106166 B2 JP5106166 B2 JP 5106166B2 JP 2008032513 A JP2008032513 A JP 2008032513A JP 2008032513 A JP2008032513 A JP 2008032513A JP 5106166 B2 JP5106166 B2 JP 5106166B2
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- 238000007689 inspection Methods 0.000 title claims description 71
- 238000000034 method Methods 0.000 title claims description 61
- 230000005291 magnetic effect Effects 0.000 claims description 151
- 230000008859 change Effects 0.000 claims description 17
- 230000002950 deficient Effects 0.000 claims description 14
- 230000001939 inductive effect Effects 0.000 claims description 7
- 230000001965 increasing effect Effects 0.000 claims description 6
- 230000005641 tunneling Effects 0.000 claims description 3
- 239000010410 layer Substances 0.000 description 65
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- 230000005415 magnetization Effects 0.000 description 29
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- 239000004973 liquid crystal related substance Substances 0.000 description 22
- 230000007547 defect Effects 0.000 description 21
- 238000012360 testing method Methods 0.000 description 15
- 239000004983 Polymer Dispersed Liquid Crystal Substances 0.000 description 10
- 230000005684 electric field Effects 0.000 description 7
- 238000001514 detection method Methods 0.000 description 5
- 238000002347 injection Methods 0.000 description 5
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- 238000000059 patterning Methods 0.000 description 5
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- 230000008878 coupling Effects 0.000 description 3
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- 229910001030 Iron–nickel alloy Inorganic materials 0.000 description 1
- 230000005290 antiferromagnetic effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000009125 cardiac resynchronization therapy Methods 0.000 description 1
- 210000002858 crystal cell Anatomy 0.000 description 1
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- 125000006850 spacer group Chemical group 0.000 description 1
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- 230000000007 visual effect Effects 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/315—Contactless testing by inductive methods
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2300/00—Aspects of the constitution of display devices
- G09G2300/04—Structural and physical details of display devices
- G09G2300/0421—Structural details of the set of electrodes
- G09G2300/0426—Layout of electrodes and connections
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
- G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
- G09G3/3611—Control of matrices with row and column drivers
- G09G3/3648—Control of matrices with row and column drivers using an active matrix
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Nonlinear Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Optics & Photonics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Liquid Crystal (AREA)
- Measuring Magnetic Variables (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Description
2:GMRセンサーの固定層
3:GMRセンサーの硬磁性層
4:GMRセンサーの非磁成層
5:GMRセンサーの軟磁性層
7:硬磁性層のヒステリシス
8:軟磁性層のヒステリシス
10:モジュレーター(Modulator)
11:検査対象の基板
12:モジュレーターの上部透明基板
13:共通電極
14:高分子分散液晶(PDLC)
15:モジュレーターの下部透明基板
16:反射シート
19:薄膜トランジスタ(TFT)
41:硬磁性層の磁化方向
42:軟磁性層の磁化方向
51a、51b:GMRセンサーの電極
52、172:抵抗検出器
93a、93b、134、136:検査パッド
94a、94b、135,137:ショーティング配線
95、139:短絡点
97:絶縁層
98:検査用データ共通パッド
99:ESD素子
100:ESDショーティングライン
156、111:平板表示素子の基板
157:絶縁層
171:センサーアレイ
200:GMRセンサー
20、PIX(1,1)乃至PIX(2,3)、175:画素電極
921乃至92n、1321乃至132n、1331乃至133m:信号パッド
17,18,31a、31b、32a、32b、32c、901乃至90n、1301乃至130n、1311乃至131m、173、174:信号配線
Claims (7)
- 複数の磁気センサーを含む磁気センサーアレイを利用して電極パターンとその電極パターンと分離した信号配線を同時にスキャンする段階と、
前記磁気センサーそれぞれに流れる電流の変化で前記磁気センサーそれぞれの抵抗を検出する段階と、
前記磁気センサーそれぞれの抵抗が変わる位置を前記電極パターン及び前記信号配線の不良位置と判定する段階を含み、
前記磁気センサーアレイで、第1及び第n(nは5以上の整数)磁気センサーはスキャン信号配線の前記判定に利用され、第1乃至第n磁気センサーはデータ信号配線の前記判定に利用され、第3乃至第n−2磁気センサーは前記電極パターンの前記判定に利用され、
前記磁気センサーそれぞれの抵抗が変わる位置を前記電極パターン及び前記信号配線の不良位置と判定する段階は、前記信号配線上でスキャニングされる磁気センサーの抵抗が小さくなる位置を前記信号配線の不良位置と判定する段階と、前記電極パターン上でスキャニングされる磁気センサーの抵抗が高くなる位置を前記電極パターンの不良位置と判定する段階を含むことを特徴とするフラットパネルディスプレイの検査方法。 - 前記磁気センサーそれぞれの抵抗が変わる位置を前記電極パターン及び前記信号配線の不良位置と判定する段階は、前記信号配線上でスキャニングされる第1磁気センサーの抵抗が小さくなる位置を前記信号配線の不良位置と判定する段階と、前記電極パターン上でスキャニングされる第2磁気センサーの抵抗が高くなる位置を前記電極パターンの不良位置と判定する段階を含むことを特徴とする請求項1記載のフラットパネルディスプレイの検査方法。
- 前記電極パターンと前記信号配線に電流を供給する段階をさらに含むことを特徴とする請求項1記載のフラットパネルディスプレイの検査方法。
- 前記電極パターンは画素電極であることを特徴とする請求項1記載のフラットパネルディスプレイの検査方法。
- 複数の磁気センサーを含み、電極パターンとその電極パターンと分離した信号配線を同時にスキャンする磁気センサーアレイと、
前記磁気センサーそれぞれに流れる電流の変化で前記磁気センサーそれぞれの抵抗を検出して前記磁気センサーそれぞれの抵抗が変わる位置を前記電極パターン及び前記信号配線の不良位置で感知する感知回路を具備し、
前記磁気センサーアレイで、第1及び第n(nは5以上の整数)磁気センサーはスキャン信号配線の前記感知に利用され、第1乃至第n磁気センサーはデータ信号配線の前記感知に利用され、第3乃至第n−2磁気センサーは前記電極パターンの前記感知に利用され、
前記感知回路は、前記信号配線上でスキャニングされる磁気センサーの抵抗が小さくなる位置を前記信号配線の不良位置と判定する手段と、前記電極パターン上でスキャニングされる磁気センサーの抵抗が高くなる位置を前記電極パターンの不良位置と判定する手段を含むことを特徴とするフラットパネルディスプレイの検査装置。 - 前記磁気センサーそれぞれは、GMRセンサー(Giant Magnetoreseistance sensor)、MRセンサー(Magnetoreseistance sensor)、TMRセンサー(Tunneling Magnetoreseistance sensor)、フラックスゲートセンサー(Fluxgate sensor)、インダックティブセンサー(Inductive sensor)の中からいずれか一つであることを特徴とする請求項5記載のフラットパネルディスプレイの検査装置。
- 前記電極パターンと前記信号配線に電流を供給する電源をさらに具備することを特徴とする請求項5記載のフラットパネルディスプレイの検査装置。
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KR2003-028643 | 2003-05-06 | ||
KR10-2003-0028643A KR100528696B1 (ko) | 2003-05-06 | 2003-05-06 | 평판표시장치의 검사방법 및 장치 |
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JP2003375517A Division JP2004333469A (ja) | 2003-05-06 | 2003-11-05 | フラットパネルディスプレイの検査方法及び検査装置 |
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JP2008145445A JP2008145445A (ja) | 2008-06-26 |
JP5106166B2 true JP5106166B2 (ja) | 2012-12-26 |
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JP2003375517A Pending JP2004333469A (ja) | 2003-05-06 | 2003-11-05 | フラットパネルディスプレイの検査方法及び検査装置 |
JP2008032513A Expired - Lifetime JP5106166B2 (ja) | 2003-05-06 | 2008-02-14 | フラットパネルディスプレイの検査方法及び検査装置 |
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Country Status (5)
Country | Link |
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US (1) | US7301360B2 (ja) |
JP (2) | JP2004333469A (ja) |
KR (1) | KR100528696B1 (ja) |
CN (1) | CN1325923C (ja) |
TW (1) | TWI240081B (ja) |
Families Citing this family (20)
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KR100528695B1 (ko) * | 2003-05-06 | 2005-11-16 | 엘지.필립스 엘시디 주식회사 | 평판표시장치의 검사방법 및 장치 |
KR100673749B1 (ko) * | 2005-06-29 | 2007-01-24 | 삼성에스디아이 주식회사 | 원장단위 검사가 가능한 유기 발광표시장치의 어레이 기판및 그 검사 방법 |
JP5276774B2 (ja) * | 2005-11-29 | 2013-08-28 | 株式会社日本マイクロニクス | 検査方法及び装置 |
EP1804229B1 (en) * | 2005-12-28 | 2016-08-17 | Semiconductor Energy Laboratory Co., Ltd. | Display device and method for inspecting the same |
KR100844537B1 (ko) * | 2006-01-26 | 2008-07-08 | 엘지전자 주식회사 | 평판표시소자용 전극 라인의 결함검출용 장치 및 방법 |
KR100812023B1 (ko) * | 2006-08-23 | 2008-03-10 | 삼성에스디아이 주식회사 | 유기전계발광 표시장치 및 그 모기판 |
KR100833755B1 (ko) * | 2007-01-15 | 2008-05-29 | 삼성에스디아이 주식회사 | 원장검사 장치 및 방법 |
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JP2017181574A (ja) * | 2016-03-28 | 2017-10-05 | 株式会社ジャパンディスプレイ | 表示装置 |
TWI730591B (zh) * | 2020-01-15 | 2021-06-11 | 興城科技股份有限公司 | 玻璃基板檢測設備及其方法 |
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-
2003
- 2003-05-06 KR KR10-2003-0028643A patent/KR100528696B1/ko active IP Right Grant
- 2003-09-25 US US10/669,348 patent/US7301360B2/en not_active Expired - Lifetime
- 2003-11-03 TW TW092130698A patent/TWI240081B/zh not_active IP Right Cessation
- 2003-11-05 JP JP2003375517A patent/JP2004333469A/ja active Pending
- 2003-11-06 CN CNB2003101042910A patent/CN1325923C/zh not_active Expired - Lifetime
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2008
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Also Published As
Publication number | Publication date |
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CN1325923C (zh) | 2007-07-11 |
TWI240081B (en) | 2005-09-21 |
JP2004333469A (ja) | 2004-11-25 |
KR20040095046A (ko) | 2004-11-12 |
US20040222814A1 (en) | 2004-11-11 |
TW200424536A (en) | 2004-11-16 |
KR100528696B1 (ko) | 2005-11-16 |
CN1548973A (zh) | 2004-11-24 |
US7301360B2 (en) | 2007-11-27 |
JP2008145445A (ja) | 2008-06-26 |
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