JPS56154678A - Inspection method for conductor pattern - Google Patents

Inspection method for conductor pattern

Info

Publication number
JPS56154678A
JPS56154678A JP5889380A JP5889380A JPS56154678A JP S56154678 A JPS56154678 A JP S56154678A JP 5889380 A JP5889380 A JP 5889380A JP 5889380 A JP5889380 A JP 5889380A JP S56154678 A JPS56154678 A JP S56154678A
Authority
JP
Japan
Prior art keywords
short
conductor pattern
speaker
confirmed
supply source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5889380A
Other languages
Japanese (ja)
Inventor
Toshinori Urade
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP5889380A priority Critical patent/JPS56154678A/en
Publication of JPS56154678A publication Critical patent/JPS56154678A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

PURPOSE:To detect the existence of short-circuit and disconnection in a conductor pattern by a method wherein a voltage is applied to a conductor pattern, and said pattern surface is scanned by means of a magnetic head to draw out signals. CONSTITUTION:A plurality of thin-line electrodes 2 are arranged on a glass substrate 1 at equal intervals and alternately divided into two electrode groups, which are connected with connecting wires 4 and 5 respectively. The connecting wires 4 and 5 are connected with an AC, DC or pulse supply source 3 (in the present example, an AC supply source having an audio frequency of several hundred- several thousand Hz). A magnetic head 6 moves in the direction of an arrow S1 to draw out outputs. The outputs of the head 6 are amplified in an amplifier 7 to drive a speaker 8. If there is a short-circuit P1 between adjacent electrodes 2a and 2b, an AC current flows, and a magnetic field is generated. Consequently, the magnetic field at the point P1 is detected and outputted as a sound from the speaker. Thereby, the short-circuited portion can be confirmed. In addition, reversing the constitution permits the disconnection portion to be confirmed.
JP5889380A 1980-04-30 1980-04-30 Inspection method for conductor pattern Pending JPS56154678A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5889380A JPS56154678A (en) 1980-04-30 1980-04-30 Inspection method for conductor pattern

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5889380A JPS56154678A (en) 1980-04-30 1980-04-30 Inspection method for conductor pattern

Publications (1)

Publication Number Publication Date
JPS56154678A true JPS56154678A (en) 1981-11-30

Family

ID=13097460

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5889380A Pending JPS56154678A (en) 1980-04-30 1980-04-30 Inspection method for conductor pattern

Country Status (1)

Country Link
JP (1) JPS56154678A (en)

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6281068U (en) * 1985-11-08 1987-05-23
JPH0262975A (en) * 1988-08-30 1990-03-02 Seikosha Co Ltd Method and device for inspecting printed board
US5073754A (en) * 1990-07-24 1991-12-17 Photon Dynamics, Inc. Method and apparatus for testing LCD panel array using a magnetic field sensor
US5175504A (en) * 1991-06-17 1992-12-29 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing a simple matrix circuit panel
US5235272A (en) * 1991-06-17 1993-08-10 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing an active matrix LCD panel
US5432461A (en) * 1991-06-28 1995-07-11 Photon Dynamics, Inc. Method of testing active matrix liquid crystal display substrates
US5543729A (en) * 1991-09-10 1996-08-06 Photon Dynamics, Inc. Testing apparatus and connector for liquid crystal display substrates
EP1004027A1 (en) * 1997-07-30 2000-05-31 Candescent Technologies Corporation Magnetic current sensing and short circuit detection in plate structure
US6307382B1 (en) 1997-07-30 2001-10-23 Candescent Technologies Corporation Device and method for magnetically sensing current in plate structure
US6323653B1 (en) 1997-07-30 2001-11-27 Candescent Technologies Corporation Magnetic detection of short circuit defects in plate structure
JP2006105795A (en) * 2004-10-06 2006-04-20 Hioki Ee Corp Insulation inspection method and insulation inspection device
JP2007285937A (en) * 2006-04-18 2007-11-01 Chugoku Electric Power Co Inc:The Device for determining performance of test plug
US7301360B2 (en) 2003-05-06 2007-11-27 Lg.Philips Lcd Co., Ltd. Method and apparatus for inspecting flat panel display
CN104730403A (en) * 2013-06-25 2015-06-24 李国胜 Underground cable electric leakage detection device

Cited By (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6281068U (en) * 1985-11-08 1987-05-23
JPH0262975A (en) * 1988-08-30 1990-03-02 Seikosha Co Ltd Method and device for inspecting printed board
US5073754A (en) * 1990-07-24 1991-12-17 Photon Dynamics, Inc. Method and apparatus for testing LCD panel array using a magnetic field sensor
US5175504A (en) * 1991-06-17 1992-12-29 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing a simple matrix circuit panel
US5235272A (en) * 1991-06-17 1993-08-10 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing an active matrix LCD panel
US5459410A (en) * 1991-06-17 1995-10-17 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing an active matrix LCD panel
US5432461A (en) * 1991-06-28 1995-07-11 Photon Dynamics, Inc. Method of testing active matrix liquid crystal display substrates
US5543729A (en) * 1991-09-10 1996-08-06 Photon Dynamics, Inc. Testing apparatus and connector for liquid crystal display substrates
EP1004027A1 (en) * 1997-07-30 2000-05-31 Candescent Technologies Corporation Magnetic current sensing and short circuit detection in plate structure
EP1004027A4 (en) * 1997-07-30 2001-05-09 Candescent Tech Corp Magnetic current sensing and short circuit detection in plate structure
US6307382B1 (en) 1997-07-30 2001-10-23 Candescent Technologies Corporation Device and method for magnetically sensing current in plate structure
US6323653B1 (en) 1997-07-30 2001-11-27 Candescent Technologies Corporation Magnetic detection of short circuit defects in plate structure
US7301360B2 (en) 2003-05-06 2007-11-27 Lg.Philips Lcd Co., Ltd. Method and apparatus for inspecting flat panel display
JP2006105795A (en) * 2004-10-06 2006-04-20 Hioki Ee Corp Insulation inspection method and insulation inspection device
JP2007285937A (en) * 2006-04-18 2007-11-01 Chugoku Electric Power Co Inc:The Device for determining performance of test plug
CN104730403A (en) * 2013-06-25 2015-06-24 李国胜 Underground cable electric leakage detection device

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