JPS56154678A - Inspection method for conductor pattern - Google Patents
Inspection method for conductor patternInfo
- Publication number
- JPS56154678A JPS56154678A JP5889380A JP5889380A JPS56154678A JP S56154678 A JPS56154678 A JP S56154678A JP 5889380 A JP5889380 A JP 5889380A JP 5889380 A JP5889380 A JP 5889380A JP S56154678 A JPS56154678 A JP S56154678A
- Authority
- JP
- Japan
- Prior art keywords
- short
- conductor pattern
- speaker
- confirmed
- supply source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
PURPOSE:To detect the existence of short-circuit and disconnection in a conductor pattern by a method wherein a voltage is applied to a conductor pattern, and said pattern surface is scanned by means of a magnetic head to draw out signals. CONSTITUTION:A plurality of thin-line electrodes 2 are arranged on a glass substrate 1 at equal intervals and alternately divided into two electrode groups, which are connected with connecting wires 4 and 5 respectively. The connecting wires 4 and 5 are connected with an AC, DC or pulse supply source 3 (in the present example, an AC supply source having an audio frequency of several hundred- several thousand Hz). A magnetic head 6 moves in the direction of an arrow S1 to draw out outputs. The outputs of the head 6 are amplified in an amplifier 7 to drive a speaker 8. If there is a short-circuit P1 between adjacent electrodes 2a and 2b, an AC current flows, and a magnetic field is generated. Consequently, the magnetic field at the point P1 is detected and outputted as a sound from the speaker. Thereby, the short-circuited portion can be confirmed. In addition, reversing the constitution permits the disconnection portion to be confirmed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5889380A JPS56154678A (en) | 1980-04-30 | 1980-04-30 | Inspection method for conductor pattern |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5889380A JPS56154678A (en) | 1980-04-30 | 1980-04-30 | Inspection method for conductor pattern |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS56154678A true JPS56154678A (en) | 1981-11-30 |
Family
ID=13097460
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5889380A Pending JPS56154678A (en) | 1980-04-30 | 1980-04-30 | Inspection method for conductor pattern |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56154678A (en) |
Cited By (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6281068U (en) * | 1985-11-08 | 1987-05-23 | ||
JPH0262975A (en) * | 1988-08-30 | 1990-03-02 | Seikosha Co Ltd | Method and device for inspecting printed board |
US5073754A (en) * | 1990-07-24 | 1991-12-17 | Photon Dynamics, Inc. | Method and apparatus for testing LCD panel array using a magnetic field sensor |
US5175504A (en) * | 1991-06-17 | 1992-12-29 | Photon Dynamics, Inc. | Method and apparatus for automatically inspecting and repairing a simple matrix circuit panel |
US5235272A (en) * | 1991-06-17 | 1993-08-10 | Photon Dynamics, Inc. | Method and apparatus for automatically inspecting and repairing an active matrix LCD panel |
US5432461A (en) * | 1991-06-28 | 1995-07-11 | Photon Dynamics, Inc. | Method of testing active matrix liquid crystal display substrates |
US5543729A (en) * | 1991-09-10 | 1996-08-06 | Photon Dynamics, Inc. | Testing apparatus and connector for liquid crystal display substrates |
EP1004027A1 (en) * | 1997-07-30 | 2000-05-31 | Candescent Technologies Corporation | Magnetic current sensing and short circuit detection in plate structure |
US6307382B1 (en) | 1997-07-30 | 2001-10-23 | Candescent Technologies Corporation | Device and method for magnetically sensing current in plate structure |
US6323653B1 (en) | 1997-07-30 | 2001-11-27 | Candescent Technologies Corporation | Magnetic detection of short circuit defects in plate structure |
JP2006105795A (en) * | 2004-10-06 | 2006-04-20 | Hioki Ee Corp | Insulation inspection method and insulation inspection device |
JP2007285937A (en) * | 2006-04-18 | 2007-11-01 | Chugoku Electric Power Co Inc:The | Device for determining performance of test plug |
US7301360B2 (en) | 2003-05-06 | 2007-11-27 | Lg.Philips Lcd Co., Ltd. | Method and apparatus for inspecting flat panel display |
CN104730403A (en) * | 2013-06-25 | 2015-06-24 | 李国胜 | Underground cable electric leakage detection device |
-
1980
- 1980-04-30 JP JP5889380A patent/JPS56154678A/en active Pending
Cited By (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6281068U (en) * | 1985-11-08 | 1987-05-23 | ||
JPH0262975A (en) * | 1988-08-30 | 1990-03-02 | Seikosha Co Ltd | Method and device for inspecting printed board |
US5073754A (en) * | 1990-07-24 | 1991-12-17 | Photon Dynamics, Inc. | Method and apparatus for testing LCD panel array using a magnetic field sensor |
US5175504A (en) * | 1991-06-17 | 1992-12-29 | Photon Dynamics, Inc. | Method and apparatus for automatically inspecting and repairing a simple matrix circuit panel |
US5235272A (en) * | 1991-06-17 | 1993-08-10 | Photon Dynamics, Inc. | Method and apparatus for automatically inspecting and repairing an active matrix LCD panel |
US5459410A (en) * | 1991-06-17 | 1995-10-17 | Photon Dynamics, Inc. | Method and apparatus for automatically inspecting and repairing an active matrix LCD panel |
US5432461A (en) * | 1991-06-28 | 1995-07-11 | Photon Dynamics, Inc. | Method of testing active matrix liquid crystal display substrates |
US5543729A (en) * | 1991-09-10 | 1996-08-06 | Photon Dynamics, Inc. | Testing apparatus and connector for liquid crystal display substrates |
EP1004027A1 (en) * | 1997-07-30 | 2000-05-31 | Candescent Technologies Corporation | Magnetic current sensing and short circuit detection in plate structure |
EP1004027A4 (en) * | 1997-07-30 | 2001-05-09 | Candescent Tech Corp | Magnetic current sensing and short circuit detection in plate structure |
US6307382B1 (en) | 1997-07-30 | 2001-10-23 | Candescent Technologies Corporation | Device and method for magnetically sensing current in plate structure |
US6323653B1 (en) | 1997-07-30 | 2001-11-27 | Candescent Technologies Corporation | Magnetic detection of short circuit defects in plate structure |
US7301360B2 (en) | 2003-05-06 | 2007-11-27 | Lg.Philips Lcd Co., Ltd. | Method and apparatus for inspecting flat panel display |
JP2006105795A (en) * | 2004-10-06 | 2006-04-20 | Hioki Ee Corp | Insulation inspection method and insulation inspection device |
JP2007285937A (en) * | 2006-04-18 | 2007-11-01 | Chugoku Electric Power Co Inc:The | Device for determining performance of test plug |
CN104730403A (en) * | 2013-06-25 | 2015-06-24 | 李国胜 | Underground cable electric leakage detection device |
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