JP5029927B2 - 基板上に金属含有層を形成するための蒸着法 - Google Patents
基板上に金属含有層を形成するための蒸着法 Download PDFInfo
- Publication number
- JP5029927B2 JP5029927B2 JP2009549656A JP2009549656A JP5029927B2 JP 5029927 B2 JP5029927 B2 JP 5029927B2 JP 2009549656 A JP2009549656 A JP 2009549656A JP 2009549656 A JP2009549656 A JP 2009549656A JP 5029927 B2 JP5029927 B2 JP 5029927B2
- Authority
- JP
- Japan
- Prior art keywords
- atomic layer
- strontium
- layer deposition
- titanium
- titanium oxide
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
- C23C16/405—Oxides of refractory metals or yttrium
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
- C23C16/409—Oxides of the type ABO3 with A representing alkali, alkaline earth metal or lead and B representing a refractory metal, nickel, scandium or a lanthanide
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45527—Atomic layer deposition [ALD] characterized by the ALD cycle, e.g. different flows or temperatures during half-reactions, unusual pulsing sequence, use of precursor mixtures or auxiliary reactants or activations
- C23C16/45529—Atomic layer deposition [ALD] characterized by the ALD cycle, e.g. different flows or temperatures during half-reactions, unusual pulsing sequence, use of precursor mixtures or auxiliary reactants or activations specially adapted for making a layer stack of alternating different compositions or gradient compositions
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45527—Atomic layer deposition [ALD] characterized by the ALD cycle, e.g. different flows or temperatures during half-reactions, unusual pulsing sequence, use of precursor mixtures or auxiliary reactants or activations
- C23C16/45531—Atomic layer deposition [ALD] characterized by the ALD cycle, e.g. different flows or temperatures during half-reactions, unusual pulsing sequence, use of precursor mixtures or auxiliary reactants or activations specially adapted for making ternary or higher compositions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/018—Dielectrics
- H01G4/06—Solid dielectrics
- H01G4/08—Inorganic dielectrics
- H01G4/085—Vapour deposited
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/018—Dielectrics
- H01G4/06—Solid dielectrics
- H01G4/08—Inorganic dielectrics
- H01G4/12—Ceramic dielectrics
- H01G4/1209—Ceramic dielectrics characterised by the ceramic dielectric material
- H01G4/1218—Ceramic dielectrics characterised by the ceramic dielectric material based on titanium oxides or titanates
- H01G4/1227—Ceramic dielectrics characterised by the ceramic dielectric material based on titanium oxides or titanates based on alkaline earth titanates
-
- H10P14/6334—
-
- H10P14/69398—
-
- H10P14/6339—
-
- H10P14/662—
-
- H10P14/69394—
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Power Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Inorganic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Ceramic Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Chemical Vapour Deposition (AREA)
- Formation Of Insulating Films (AREA)
- Semiconductor Memories (AREA)
- Physical Vapour Deposition (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/705,992 US7892964B2 (en) | 2007-02-14 | 2007-02-14 | Vapor deposition methods for forming a metal-containing layer on a substrate |
| US11/705,992 | 2007-02-14 | ||
| PCT/US2008/052035 WO2008100691A2 (en) | 2007-02-14 | 2008-01-25 | Vapor deposition methods for forming a metal- containing layer on a substrate |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2010518645A JP2010518645A (ja) | 2010-05-27 |
| JP2010518645A5 JP2010518645A5 (enExample) | 2011-03-10 |
| JP5029927B2 true JP5029927B2 (ja) | 2012-09-19 |
Family
ID=39619320
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009549656A Active JP5029927B2 (ja) | 2007-02-14 | 2008-01-25 | 基板上に金属含有層を形成するための蒸着法 |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US7892964B2 (enExample) |
| JP (1) | JP5029927B2 (enExample) |
| KR (1) | KR101179774B1 (enExample) |
| CN (1) | CN101595244B (enExample) |
| TW (1) | TWI410519B (enExample) |
| WO (1) | WO2008100691A2 (enExample) |
Families Citing this family (260)
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| KR20160027244A (ko) | 2006-03-10 | 2016-03-09 | 인티그리스, 인코포레이티드 | 티타네이트, 란타네이트 및 탄탈레이트 유전막의 원자층 증착 및 화학 증기 증착용 전구체 조성물 |
| US7892964B2 (en) | 2007-02-14 | 2011-02-22 | Micron Technology, Inc. | Vapor deposition methods for forming a metal-containing layer on a substrate |
| WO2009086263A1 (en) * | 2007-12-28 | 2009-07-09 | Sigma-Aldrich Co. | Methods for preparing thin films using substituted pyrrolyl-metal precursors |
| JP5616591B2 (ja) * | 2008-06-20 | 2014-10-29 | 株式会社日立国際電気 | 半導体装置の製造方法及び基板処理装置 |
| US20100072531A1 (en) * | 2008-09-22 | 2010-03-25 | Imec | Method for Forming a Memory Cell Comprising a Capacitor Having a Strontium Titaniumoxide Based Dielectric Layer and Devices Obtained Thereof |
| US20120001143A1 (en) * | 2009-03-27 | 2012-01-05 | Dmitri Borisovich Strukov | Switchable Junction with Intrinsic Diode |
| US8697486B2 (en) * | 2009-04-15 | 2014-04-15 | Micro Technology, Inc. | Methods of forming phase change materials and methods of forming phase change memory circuitry |
| US8592058B2 (en) * | 2009-06-03 | 2013-11-26 | Intermolecular, Inc. | Methods of forming strontium titanate films |
| US20110020547A1 (en) * | 2009-07-21 | 2011-01-27 | Julien Gatineau | High dielectric constant films deposited at high temperature by atomic layer deposition |
| US8048755B2 (en) | 2010-02-08 | 2011-11-01 | Micron Technology, Inc. | Resistive memory and methods of processing resistive memory |
| US9343298B2 (en) * | 2010-09-28 | 2016-05-17 | Imec | Metal-insulator-metal capacitor and method for manufacturing thereof |
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| US9790238B2 (en) | 2012-05-04 | 2017-10-17 | Korea Research Institute Of Chemical Technology | Strontium precursor, method for preparing same, and method for forming thin film by using same |
| US8637365B2 (en) * | 2012-06-06 | 2014-01-28 | International Business Machines Corporation | Spacer isolation in deep trench |
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| RU2554819C1 (ru) * | 2014-04-16 | 2015-06-27 | Общество с ограниченной ответственностью "КОНМЕТ" | Способ получения биоактивного покрытия на имплантируемом в костную ткань человека титановом имплантате |
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- 2008-01-25 CN CN2008800031411A patent/CN101595244B/zh active Active
- 2008-01-25 WO PCT/US2008/052035 patent/WO2008100691A2/en not_active Ceased
- 2008-02-05 TW TW097104733A patent/TWI410519B/zh active
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2010
- 2010-09-29 US US12/893,807 patent/US8557697B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| JP2010518645A (ja) | 2010-05-27 |
| TWI410519B (zh) | 2013-10-01 |
| WO2008100691A2 (en) | 2008-08-21 |
| TW200844254A (en) | 2008-11-16 |
| US7892964B2 (en) | 2011-02-22 |
| KR20090115145A (ko) | 2009-11-04 |
| US20110021001A1 (en) | 2011-01-27 |
| CN101595244A (zh) | 2009-12-02 |
| CN101595244B (zh) | 2012-12-26 |
| WO2008100691A3 (en) | 2009-02-12 |
| KR101179774B1 (ko) | 2012-09-04 |
| US20080194088A1 (en) | 2008-08-14 |
| US8557697B2 (en) | 2013-10-15 |
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