JP5022381B2 - 電子部品試験装置及び電子部品の試験方法 - Google Patents

電子部品試験装置及び電子部品の試験方法 Download PDF

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Publication number
JP5022381B2
JP5022381B2 JP2008550028A JP2008550028A JP5022381B2 JP 5022381 B2 JP5022381 B2 JP 5022381B2 JP 2008550028 A JP2008550028 A JP 2008550028A JP 2008550028 A JP2008550028 A JP 2008550028A JP 5022381 B2 JP5022381 B2 JP 5022381B2
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JP
Japan
Prior art keywords
tray
test
electronic component
unit
chamber
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Expired - Fee Related
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JP2008550028A
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English (en)
Japanese (ja)
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JPWO2008075439A1 (ja
Inventor
裕史 金子
和之 山下
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Advantest Corp
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Advantest Corp
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Publication of JPWO2008075439A1 publication Critical patent/JPWO2008075439A1/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • H10P74/00—

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP2008550028A 2006-12-21 2006-12-21 電子部品試験装置及び電子部品の試験方法 Expired - Fee Related JP5022381B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2006/325542 WO2008075439A1 (ja) 2006-12-21 2006-12-21 電子部品試験装置及び電子部品の試験方法

Publications (2)

Publication Number Publication Date
JPWO2008075439A1 JPWO2008075439A1 (ja) 2010-04-08
JP5022381B2 true JP5022381B2 (ja) 2012-09-12

Family

ID=39536078

Family Applications (1)

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JP2008550028A Expired - Fee Related JP5022381B2 (ja) 2006-12-21 2006-12-21 電子部品試験装置及び電子部品の試験方法

Country Status (5)

Country Link
JP (1) JP5022381B2 (esLanguage)
KR (1) KR101158064B1 (esLanguage)
CN (1) CN101563620A (esLanguage)
TW (1) TW200827726A (esLanguage)
WO (1) WO2008075439A1 (esLanguage)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102772944B1 (ko) * 2022-05-31 2025-02-27 미래산업 주식회사 전자부품 테스트 핸들러

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5840403B2 (ja) * 2011-07-11 2016-01-06 オリオン機械株式会社 環境試験装置
JP2013053991A (ja) * 2011-09-06 2013-03-21 Seiko Epson Corp ハンドラー及び部品検査装置
KR101644481B1 (ko) * 2011-12-08 2016-08-02 (주)테크윙 테스트핸들러
JP2013137284A (ja) * 2011-12-28 2013-07-11 Advantest Corp 電子部品移載装置、電子部品ハンドリング装置、及び電子部品試験装置
CN103852710B (zh) * 2012-11-29 2017-08-15 鸿劲科技股份有限公司 对置式电子组件作业设备
KR102254494B1 (ko) * 2015-04-30 2021-05-24 (주)테크윙 반도체소자 테스트용 핸들러
KR102252638B1 (ko) * 2015-05-04 2021-05-17 (주)테크윙 테스트핸들러용 인서트
CN105548787B (zh) * 2015-11-30 2018-12-28 东莞市冠佳电子设备有限公司 电源自动测试系统
KR102461321B1 (ko) * 2017-08-18 2022-11-02 (주)테크윙 전자부품 테스트용 핸들러
KR102663462B1 (ko) * 2018-11-07 2024-05-09 (주)테크윙 핸들러
JP7561534B2 (ja) * 2020-07-21 2024-10-04 株式会社アドバンテスト 電子部品ハンドリング装置及び電子部品試験装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1138083A (ja) * 1997-07-14 1999-02-12 Advantest Corp Ｉｃテストハンドラ
JP2000206186A (ja) * 1999-01-11 2000-07-28 Advantest Corp トレイ移送装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH079825U (ja) * 1993-06-16 1995-02-10 村田機械株式会社 リトライ機能付きコンベア装置
SG102563A1 (en) * 1999-01-11 2004-03-26 Advantest Corp Testing apparatus for electronic device board

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1138083A (ja) * 1997-07-14 1999-02-12 Advantest Corp Ｉｃテストハンドラ
JP2000206186A (ja) * 1999-01-11 2000-07-28 Advantest Corp トレイ移送装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102772944B1 (ko) * 2022-05-31 2025-02-27 미래산업 주식회사 전자부품 테스트 핸들러

Also Published As

Publication number Publication date
TWI359273B (esLanguage) 2012-03-01
KR101158064B1 (ko) 2012-06-18
TW200827726A (en) 2008-07-01
WO2008075439A1 (ja) 2008-06-26
CN101563620A (zh) 2009-10-21
KR20090095617A (ko) 2009-09-09
JPWO2008075439A1 (ja) 2010-04-08

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