SG102563A1 - Testing apparatus for electronic device board - Google Patents

Testing apparatus for electronic device board

Info

Publication number
SG102563A1
SG102563A1 SG200000083A SG200000083A SG102563A1 SG 102563 A1 SG102563 A1 SG 102563A1 SG 200000083 A SG200000083 A SG 200000083A SG 200000083 A SG200000083 A SG 200000083A SG 102563 A1 SG102563 A1 SG 102563A1
Authority
SG
Singapore
Prior art keywords
electronic device
testing apparatus
device board
board
testing
Prior art date
Application number
SG200000083A
Inventor
Kiyokawa Toshiyuki
Masuo Yoshiyuki
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP11003792A external-priority patent/JP2000206194A/en
Priority claimed from JP00427799A external-priority patent/JP4164182B2/en
Priority claimed from JP11004276A external-priority patent/JP2000206191A/en
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of SG102563A1 publication Critical patent/SG102563A1/en

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08—Monitoring manufacture of assemblages
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/04—Mounting of components, e.g. of leadless components
    • H05K13/046—Surface mounting

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Operations Research (AREA)
  • Environmental & Geological Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
SG200000083A 1999-01-11 2000-01-06 Testing apparatus for electronic device board SG102563A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP11003792A JP2000206194A (en) 1999-01-11 1999-01-11 Tray for electronic component board test and test device of electronic component board
JP00427799A JP4164182B2 (en) 1999-01-11 1999-01-11 Tray transfer device
JP11004276A JP2000206191A (en) 1999-01-11 1999-01-11 Test device of electronic component board

Publications (1)

Publication Number Publication Date
SG102563A1 true SG102563A1 (en) 2004-03-26

Family

ID=27275971

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200000083A SG102563A1 (en) 1999-01-11 2000-01-06 Testing apparatus for electronic device board

Country Status (3)

Country Link
KR (2) KR20000053458A (en)
SG (1) SG102563A1 (en)
TW (1) TW533317B (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100826467B1 (en) * 2005-12-15 2008-04-30 (주)테크윙 Test handler and shutter test handler
KR100787857B1 (en) * 2006-06-02 2007-12-24 송욱일 bonding apparatus of camera module and F-PCB by pulse heating
CN101563620A (en) * 2006-12-21 2009-10-21 株式会社爱德万测试 Electronic component testing equipment and method of testing electronic component
KR101308050B1 (en) * 2008-04-01 2013-09-12 (주)테크윙 Loading method of apparatus in order to support testing an electric device
JP2013137284A (en) 2011-12-28 2013-07-11 Advantest Corp Electronic component transfer device, electronic component handling device and electronic component testing device
JP2013137286A (en) * 2011-12-28 2013-07-11 Advantest Corp Electronic component testing device
KR102072390B1 (en) * 2013-06-18 2020-02-04 (주)테크윙 Test handler
KR102674152B1 (en) * 2019-03-07 2024-06-12 (주)테크윙 Handler for testing electronic devices

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5290134A (en) * 1991-12-03 1994-03-01 Advantest Corporation Pick and place for automatic test handler
US5805472A (en) * 1996-02-27 1998-09-08 Kabushiki Kaisha Toshiba Test handler for semiconductor devices
US5807066A (en) * 1994-07-18 1998-09-15 Aetrium Incorporated IC tray handling apparatus and method

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5290134A (en) * 1991-12-03 1994-03-01 Advantest Corporation Pick and place for automatic test handler
US5807066A (en) * 1994-07-18 1998-09-15 Aetrium Incorporated IC tray handling apparatus and method
US5805472A (en) * 1996-02-27 1998-09-08 Kabushiki Kaisha Toshiba Test handler for semiconductor devices

Also Published As

Publication number Publication date
TW533317B (en) 2003-05-21
KR20020021150A (en) 2002-03-18
KR20000053458A (en) 2000-08-25

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