SG102563A1 - Testing apparatus for electronic device board - Google Patents
Testing apparatus for electronic device boardInfo
- Publication number
- SG102563A1 SG102563A1 SG200000083A SG200000083A SG102563A1 SG 102563 A1 SG102563 A1 SG 102563A1 SG 200000083 A SG200000083 A SG 200000083A SG 200000083 A SG200000083 A SG 200000083A SG 102563 A1 SG102563 A1 SG 102563A1
- Authority
- SG
- Singapore
- Prior art keywords
- electronic device
- testing apparatus
- device board
- board
- testing
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/04—Mounting of components, e.g. of leadless components
- H05K13/046—Surface mounting
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Operations Research (AREA)
- Environmental & Geological Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11004276A JP2000206191A (en) | 1999-01-11 | 1999-01-11 | Test device of electronic component board |
JP00427799A JP4164182B2 (en) | 1999-01-11 | 1999-01-11 | Tray transfer device |
JP11003792A JP2000206194A (en) | 1999-01-11 | 1999-01-11 | Tray for electronic component board test and test device of electronic component board |
Publications (1)
Publication Number | Publication Date |
---|---|
SG102563A1 true SG102563A1 (en) | 2004-03-26 |
Family
ID=27275971
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200000083A SG102563A1 (en) | 1999-01-11 | 2000-01-06 | Testing apparatus for electronic device board |
Country Status (3)
Country | Link |
---|---|
KR (2) | KR20000053458A (en) |
SG (1) | SG102563A1 (en) |
TW (1) | TW533317B (en) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100826467B1 (en) * | 2005-12-15 | 2008-04-30 | (주)테크윙 | Test handler and shutter test handler |
KR100787857B1 (en) * | 2006-06-02 | 2007-12-24 | 송욱일 | bonding apparatus of camera module and F-PCB by pulse heating |
WO2008075439A1 (en) * | 2006-12-21 | 2008-06-26 | Advantest Corporation | Electronic component testing equipment and method of testing electronic component |
KR101308050B1 (en) * | 2008-04-01 | 2013-09-12 | (주)테크윙 | Loading method of apparatus in order to support testing an electric device |
JP2013137286A (en) * | 2011-12-28 | 2013-07-11 | Advantest Corp | Electronic component testing device |
JP2013137284A (en) | 2011-12-28 | 2013-07-11 | Advantest Corp | Electronic component transfer device, electronic component handling device and electronic component testing device |
KR102072390B1 (en) * | 2013-06-18 | 2020-02-04 | (주)테크윙 | Test handler |
KR102674152B1 (en) * | 2019-03-07 | 2024-06-12 | (주)테크윙 | Handler for testing electronic devices |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5290134A (en) * | 1991-12-03 | 1994-03-01 | Advantest Corporation | Pick and place for automatic test handler |
US5805472A (en) * | 1996-02-27 | 1998-09-08 | Kabushiki Kaisha Toshiba | Test handler for semiconductor devices |
US5807066A (en) * | 1994-07-18 | 1998-09-15 | Aetrium Incorporated | IC tray handling apparatus and method |
-
2000
- 2000-01-06 TW TW089100140A patent/TW533317B/en not_active IP Right Cessation
- 2000-01-06 SG SG200000083A patent/SG102563A1/en unknown
- 2000-01-11 KR KR1020000001176A patent/KR20000053458A/en not_active Application Discontinuation
-
2002
- 2002-01-18 KR KR1020020003009A patent/KR20020021150A/en not_active Application Discontinuation
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5290134A (en) * | 1991-12-03 | 1994-03-01 | Advantest Corporation | Pick and place for automatic test handler |
US5807066A (en) * | 1994-07-18 | 1998-09-15 | Aetrium Incorporated | IC tray handling apparatus and method |
US5805472A (en) * | 1996-02-27 | 1998-09-08 | Kabushiki Kaisha Toshiba | Test handler for semiconductor devices |
Also Published As
Publication number | Publication date |
---|---|
TW533317B (en) | 2003-05-21 |
KR20020021150A (en) | 2002-03-18 |
KR20000053458A (en) | 2000-08-25 |
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