SG81269A1 - Ic testing apparatus - Google Patents

Ic testing apparatus

Info

Publication number
SG81269A1
SG81269A1 SG9901610A SG1999001610A SG81269A1 SG 81269 A1 SG81269 A1 SG 81269A1 SG 9901610 A SG9901610 A SG 9901610A SG 1999001610 A SG1999001610 A SG 1999001610A SG 81269 A1 SG81269 A1 SG 81269A1
Authority
SG
Singapore
Prior art keywords
testing apparatus
testing
Prior art date
Application number
SG9901610A
Inventor
Hiroto Nakamura
Shin Nemoto
Kazuyuki Yamashita
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of SG81269A1 publication Critical patent/SG81269A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Discharge Of Articles From Conveyors (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
SG9901610A 1998-04-02 1999-03-31 Ic testing apparatus SG81269A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10106913A JPH11287843A (en) 1998-04-02 1998-04-02 Ic-tester

Publications (1)

Publication Number Publication Date
SG81269A1 true SG81269A1 (en) 2001-06-19

Family

ID=14445680

Family Applications (1)

Application Number Title Priority Date Filing Date
SG9901610A SG81269A1 (en) 1998-04-02 1999-03-31 Ic testing apparatus

Country Status (7)

Country Link
JP (1) JPH11287843A (en)
KR (1) KR100722644B1 (en)
CN (1) CN1232184A (en)
DE (1) DE19914776A1 (en)
MY (1) MY125628A (en)
SG (1) SG81269A1 (en)
TW (1) TW429315B (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4566482B2 (en) * 2001-09-07 2010-10-20 ヤマハ発動機株式会社 Parts testing equipment
KR100440780B1 (en) * 2002-01-23 2004-07-19 삼성테크윈 주식회사 Apparatus placing electronic part on tray
KR100679155B1 (en) * 2005-01-25 2007-02-05 (주)테크윙 Test handler
KR100714106B1 (en) 2005-12-15 2007-05-02 (주)테크윙 Test handler and operation method of test handler
CN101339204B (en) * 2007-07-05 2010-10-27 京元电子股份有限公司 Disc conveyer device
WO2009057203A1 (en) 2007-10-31 2009-05-07 Advantest Corporation Abnormality detecting device for detecting abnormality of contact section of contact arm
JP6069831B2 (en) * 2011-12-16 2017-02-01 富士電機株式会社 Semiconductor test equipment
KR101428655B1 (en) * 2013-02-08 2014-08-13 바이옵트로 주식회사 Apparatus for testing
CN109911541B (en) * 2019-01-29 2021-06-25 迈克医疗电子有限公司 Assembly line system

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1988010224A1 (en) * 1987-06-24 1988-12-29 Reid-Ashman Manufacturing, Inc. Handler for ic packages
US5307011A (en) * 1991-12-04 1994-04-26 Advantest Corporation Loader and unloader for test handler
JPH09113581A (en) * 1995-10-20 1997-05-02 Advantest Corp Ic testing device
US5807066A (en) * 1994-07-18 1998-09-15 Aetrium Incorporated IC tray handling apparatus and method

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR960007507B1 (en) * 1990-10-08 1996-06-05 가부시끼가이샤 아드반테스트 Ic test equipment
JP3316075B2 (en) * 1994-02-03 2002-08-19 株式会社アドバンテスト Auto handler for IC test equipment
JPH08170976A (en) * 1994-09-06 1996-07-02 Advantest Corp Handler mechanism for semiconductor tester
JP3412114B2 (en) * 1995-07-26 2003-06-03 株式会社アドバンテスト IC test equipment

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1988010224A1 (en) * 1987-06-24 1988-12-29 Reid-Ashman Manufacturing, Inc. Handler for ic packages
US5307011A (en) * 1991-12-04 1994-04-26 Advantest Corporation Loader and unloader for test handler
US5807066A (en) * 1994-07-18 1998-09-15 Aetrium Incorporated IC tray handling apparatus and method
JPH09113581A (en) * 1995-10-20 1997-05-02 Advantest Corp Ic testing device

Also Published As

Publication number Publication date
MY125628A (en) 2006-08-30
JPH11287843A (en) 1999-10-19
KR100722644B1 (en) 2007-05-28
KR19990082894A (en) 1999-11-25
CN1232184A (en) 1999-10-20
TW429315B (en) 2001-04-11
DE19914776A1 (en) 1999-11-25

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