TW540709U - Component testing device for printed circuit board - Google Patents

Component testing device for printed circuit board

Info

Publication number
TW540709U
TW540709U TW90221960U TW90221960U TW540709U TW 540709 U TW540709 U TW 540709U TW 90221960 U TW90221960 U TW 90221960U TW 90221960 U TW90221960 U TW 90221960U TW 540709 U TW540709 U TW 540709U
Authority
TW
Taiwan
Prior art keywords
circuit board
printed circuit
testing device
component testing
component
Prior art date
Application number
TW90221960U
Other languages
Chinese (zh)
Inventor
Te-Chang Chou
Original Assignee
Adsys Technologies Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Adsys Technologies Co Ltd filed Critical Adsys Technologies Co Ltd
Priority to TW90221960U priority Critical patent/TW540709U/en
Publication of TW540709U publication Critical patent/TW540709U/en

Links

TW90221960U 2001-12-14 2001-12-14 Component testing device for printed circuit board TW540709U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW90221960U TW540709U (en) 2001-12-14 2001-12-14 Component testing device for printed circuit board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW90221960U TW540709U (en) 2001-12-14 2001-12-14 Component testing device for printed circuit board

Publications (1)

Publication Number Publication Date
TW540709U true TW540709U (en) 2003-07-01

Family

ID=29580598

Family Applications (1)

Application Number Title Priority Date Filing Date
TW90221960U TW540709U (en) 2001-12-14 2001-12-14 Component testing device for printed circuit board

Country Status (1)

Country Link
TW (1) TW540709U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7612568B2 (en) 2007-03-08 2009-11-03 Test Research, Inc. Open-circuit testing system and method
US9506974B2 (en) 2014-01-24 2016-11-29 Sitronix Technology Corp. Active probe card

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7612568B2 (en) 2007-03-08 2009-11-03 Test Research, Inc. Open-circuit testing system and method
US9506974B2 (en) 2014-01-24 2016-11-29 Sitronix Technology Corp. Active probe card

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Legal Events

Date Code Title Description
GD4K Issue of patent certificate for granted utility model filed before june 30, 2004
MK4K Expiration of patent term of a granted utility model