JP4305918B2 - Floating substrate transfer processing equipment - Google Patents

Floating substrate transfer processing equipment Download PDF

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JP4305918B2
JP4305918B2 JP2004218156A JP2004218156A JP4305918B2 JP 4305918 B2 JP4305918 B2 JP 4305918B2 JP 2004218156 A JP2004218156 A JP 2004218156A JP 2004218156 A JP2004218156 A JP 2004218156A JP 4305918 B2 JP4305918 B2 JP 4305918B2
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substrate
processed
slider
moving
levitation
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JP2005244155A (en
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一仁 宮崎
清久 立山
剛 山崎
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Tokyo Electron Ltd
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    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1303Apparatus specially adapted to the manufacture of LCDs
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65GTRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G49/00Conveying systems characterised by their application for specified purposes not otherwise provided for
    • B65G49/05Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
    • B65G49/06Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for fragile sheets, e.g. glass
    • B65G49/063Transporting devices for sheet glass
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67784Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations using air tracks

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  • Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • Manufacturing & Machinery (AREA)
  • General Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Coating Apparatus (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Description

この発明は、例えばLCD用ガラス基板等の被処理基板に処理液例えばレジスト液を供給して処理を施す浮上式基板搬送処理装置に関するものである。   The present invention relates to a floating substrate transfer processing apparatus for supplying a processing liquid such as a resist solution to a substrate to be processed such as a glass substrate for LCD.

一般に、半導体デバイスの製造工程においては、被処理基板としてのLCD用ガラス基板等(以下に基板という)にレジスト液を塗布してレジスト膜を形成し、フォトリソグラフィ技術を用いて回路パターンを縮小してレジスト膜に転写し、これを現像処理し、その後、基板からレジスト膜を除去する一連の処理が施されている。   In general, in a semiconductor device manufacturing process, a resist film is formed by applying a resist solution to a glass substrate for LCD (hereinafter referred to as a substrate) as a substrate to be processed, and a circuit pattern is reduced using photolithography technology. The resist film is transferred to the resist film, developed, and then subjected to a series of processes for removing the resist film from the substrate.

例えば、レジスト膜の形成方法として、溶剤に感光性樹脂を溶解してなるレジスト液を帯状に吐出するレジスト供給ノズルと、矩形状の基板とを、レジストの吐出方向と直交する方向に相対的に平行移動させて塗布処理する方法が知られている(例えば、特許文献1参照)。   For example, as a method for forming a resist film, a resist supply nozzle that discharges a resist solution obtained by dissolving a photosensitive resin in a solvent in a strip shape and a rectangular substrate are relatively arranged in a direction perpendicular to the resist discharge direction. A method of performing a coating process by translating is known (see, for example, Patent Document 1).

この方法によれば、基板の一辺から他辺に渡ってレジスト液を帯状に吐出(供給)するため、矩形状の基板の全面に平均してレジスト膜を形成することができる。
特開平10−156255号公報(特許請求の範囲、図1)
According to this method, since the resist solution is discharged (supplied) from one side of the substrate to the other side in a strip shape, a resist film can be formed on the entire surface of the rectangular substrate on average.
Japanese Patent Laid-Open No. 10-156255 (Claims, FIG. 1)

しかしながら、上記特開平10−156255号公報に記載の技術においては、基板の上方に架設配置されるレジスト供給ノズル又は基板を水平姿勢に保持するステージの少なくとも一方を移動する構造であるため、装置が大型かつ複雑になると共に、重量の嵩むレジスト供給ノズルやステージの移動に多大なエネルギを要するという問題があった。また、重量の嵩むレジスト供給ノズルやステージを処理後に元の位置に復帰移動し、再び移動して処理を施すため、処理効率の低下を招くという問題もあった。   However, in the technique described in the above Japanese Patent Laid-Open No. 10-156255, the apparatus is configured to move at least one of a resist supply nozzle installed above the substrate or a stage that holds the substrate in a horizontal posture. There is a problem in that it is large and complicated, and enormous energy is required to move the resist supply nozzle and the stage which are heavy. In addition, since the resist supply nozzle and the stage, which are heavy in weight, are moved back to their original positions after processing and moved again to perform processing, there is a problem in that processing efficiency is lowered.

この発明は、上記事情に鑑みてなされたもので、装置の小型化及び簡略化を図り、かつ、処理効率の向上を図れるようにした浮上式基板搬送処理装置を提供することを目的とするものである。   SUMMARY OF THE INVENTION The present invention has been made in view of the above circumstances, and an object thereof is to provide a floating substrate transfer processing apparatus that can reduce the size and simplify the apparatus and can improve the processing efficiency. It is.

上記課題を解決するために、この発明は、表面から気体を噴射又は噴射及び吸引して被処理基板を任意の高さに浮上させることができる浮上ステージと、 上記浮上ステージの上方に配置され、上記被処理基板の表面に処理液を帯状に供給する処理液供給手段と、 上記被処理基板の両側端をそれぞれ着脱可能に吸引保持する複数の基板保持部材と、 上記浮上ステージの両側に互いに平行に配置されるガイドレールに沿ってスライダを移動する移動機構と、 上記基板保持部材とスライダとを連結すると共に、上記被処理基板の浮上高さに追従して変位可能な連結手段と、を具備することを前提とし、請求項1記載の発明は、 上記連結手段は板ばね部材によって形成され、 上記板ばね部材が、被処理基板の移動方向に連続して複数の基板保持部材を保持する保持部と、切欠きを介して互いに間隔をおいて列設されて、上記保持部とスライダとを連結する可撓性を有する連結部とを具備する、ことを特徴とする。   In order to solve the above-mentioned problem, the present invention is arranged above the levitation stage, a levitation stage that can inject or inject and suck gas from the surface to float the substrate to be processed to an arbitrary height, A processing liquid supply means for supplying a processing liquid to the surface of the substrate to be processed in a strip shape, a plurality of substrate holding members that detachably hold both side ends of the substrate to be processed, and parallel to both sides of the floating stage. A moving mechanism for moving the slider along a guide rail disposed on the substrate, and a connecting means for connecting the substrate holding member and the slider, and displaceable following the flying height of the substrate to be processed. In the first aspect of the present invention, the connecting means is formed by a leaf spring member, and the leaf spring member is continuously provided in a moving direction of the substrate to be processed. A holding portion for holding a member, are column set at intervals through the notch, comprises a connecting portion having flexibility for connecting the said holding part and the slider, characterized in that.

請求項2記載の発明は、上記連結手段が、中間部がスライダに揺動自在に枢着される揺動部材における基板保持部側と反対側にバランスウェイトを具備し、 上記揺動部材の端部に、バランスウェイトを進退可能にねじ結合してなる、ことを特徴とする。   According to a second aspect of the present invention, the connecting means includes a balance weight on the side opposite to the substrate holding part side of the swinging member pivotally attached to the slider at the intermediate portion, and the end of the swinging member It is characterized in that a balance weight is screwed to the part so as to be able to advance and retreat.

請求項3記載の発明は、上記連結手段が、スライダに揺動自在に枢着される略ベルクランク状のリンク部材によって形成されると共に、このリンク部材の垂直片と上記スライダの対向面に、励磁によって基板保持部材の吸着保持力より小さい反発力を生ずる電磁石を具備してなる、ことを特徴とする。   According to a third aspect of the present invention, the connecting means is formed by a substantially bell crank-shaped link member pivotably attached to the slider, and a vertical piece of the link member and an opposing surface of the slider, An electromagnet that generates a repulsive force smaller than the adsorption holding force of the substrate holding member by excitation is provided.

請求項4記載の発明は、請求項1ないしのいずれかに記載の浮上式基板搬送処理装置において、 上記スライダに連結され、上記被処理基板の移動方向の前後端縁に係脱すべく垂直移動可能なガイドピンと、上記ガイドピンを垂直方向に移動する垂直移動手段と、上記ガイドピン及び垂直移動手段を水平方向に移動する位置決め用水平移動手段とを更に具備する、ことを特徴とする。この場合、上記ガイドピンの中空部に基板を支持する支持ピンを突設することにより、ガイドピンに基板を受け渡す昇降可能なリフトピンの機能をもたせることができる(請求項5)。 According to a fourth aspect of the present invention, there is provided the floating substrate transfer processing apparatus according to any one of the first to third aspects, wherein the vertical movement is coupled to the slider and is engaged with and disengaged from the front and rear edges in the movement direction of the substrate to be processed. It further comprises a possible guide pin, vertical movement means for moving the guide pin in the vertical direction, and positioning horizontal movement means for moving the guide pin and vertical movement means in the horizontal direction. In this case, the guide by projecting the support pin for supporting a substrate in the hollow portion of the pin, it is possible to have the function of vertically movable lift pins to pass the substrate to the guide pin (claim 5).

(1)請求項1〜3記載の発明によれば、浮上ステージ上に浮上される被処理基板の両側端を基板保持部材によって吸着保持し、連結手段が被処理基板の浮上高さに追従した状態で処理液供給手段の下方に移動しつつ処理液供給手段から処理液を帯状に供給して処理を施すことができる。したがって、被処理基板の浮上高さとスライダ間の高さが変動しても被処理基板と処理液供給手段との間隔を所定の間隔に維持した状態で搬送して処理を施すことができる。また、浮上した基板を搬送するので、装置の小型化かつ簡略化が図れると共に、処理効率の向上が図れる。 (1) According to the first to third aspects of the present invention, both side ends of the substrate to be processed that are levitated on the levitation stage are sucked and held by the substrate holding member, and the connecting means follows the flying height of the substrate to be processed. In this state, the processing liquid can be supplied from the processing liquid supply means in the form of a strip while moving below the processing liquid supply means. Therefore, even if the flying height of the substrate to be processed and the height between the sliders vary, the substrate can be transported and processed while maintaining the interval between the substrate to be processed and the processing liquid supply means at a predetermined interval. Further, since the floating substrate is transported, the apparatus can be reduced in size and simplified, and the processing efficiency can be improved.

(2)請求項4記載の発明によれば、上記(1)に加えて、更に被処理基板の移動方向の前後端縁に係脱すべく垂直移動可能なガイドピンを具備することで、被処理基板の搬送始動・停止時の加速度による被処理基板の不用意な移動を防止することができる。したがって、加速度のパラメータに余裕ができると共に、処理精度の維持が図れる。また、基板保持部材の数を削減することができると共に、基板保持力を低減することができるので、構成部材の削減及び装置の小型化が図れる。 (2) According to the invention described in claim 4 , in addition to the above (1), a guide pin that is vertically movable to be engaged with and disengaged from the front and rear edges in the moving direction of the substrate to be processed is provided. It is possible to prevent inadvertent movement of the substrate to be processed due to acceleration at the start / stop of the conveyance of the substrate. Therefore, the acceleration parameter can be afforded and the processing accuracy can be maintained. In addition, since the number of substrate holding members can be reduced and the substrate holding force can be reduced, the number of constituent members and the size of the apparatus can be reduced.

(3)請求項1記載の発明によれば、連結手段を構成する板ばね部材が、被処理基板の移動方向に連続して複数の基板保持部材を保持する保持部と、互いに間隔をおいて列設されて、保持部とスライダとを連結する可撓性を有する連結部とを具備するので、連結手段における搬送方向の剛性を確保することができ、被処理基板を更に確実に搬送することができる。 (3) According to the invention described in claim 1, the leaf spring member constituting the connecting means is spaced apart from the holding portion that holds the plurality of substrate holding members continuously in the moving direction of the substrate to be processed. Since it is provided with a flexible connecting portion that is arranged and connects the holding portion and the slider, the rigidity of the connecting means in the transport direction can be secured, and the substrate to be processed can be transported more reliably. Can do.

(4)請求項4記載の発明によれば、ガイドピンを垂直方向に移動する垂直移動手段と、これらガイドピン及び垂直移動手段を水平方向に移動する位置決め用水平移動手段とを更に具備することにより、上記(2)に加えて、更に被処理基板の位置決めを行うことができるので、処理精度の向上を図ることができる。 (4) According to the invention described in claim 4, the apparatus further comprises a vertical moving means for moving the guide pin in the vertical direction, and a positioning horizontal moving means for moving the guide pin and the vertical moving means in the horizontal direction. Thus, in addition to the above (2), the substrate to be processed can be further positioned, so that the processing accuracy can be improved.

以下に、この発明の最良の実施形態を添付図面に基づいて詳細に説明する。ここでは、この発明に係る浮上式基板搬送処理装置をLCD用ガラス基板のレジスト塗布現像処理装置におけるレジスト塗布処理装置に適用した場合について説明する。   DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, the best embodiment of the present invention will be described in detail with reference to the accompanying drawings. Here, a case will be described in which the floating substrate transfer processing apparatus according to the present invention is applied to a resist coating processing apparatus in a resist coating and developing processing apparatus for an LCD glass substrate.

上記レジスト塗布現像処理装置は、図1に示すように、複数の被処理基板であるLCD用ガラス基板G(以下に基板Gという)を収容するカセットCを載置する搬入出部1と、基板Gにレジスト塗布及び現像を含む一連の処理を施すための複数の処理ユニットを備えた処理部2と、露光装置4との間で基板Gの受け渡しを行うためのインターフェイス部3とを具備しており、処理部2の両端にそれぞれ搬入出部1及びインターフェイス部3が配置されている。なお、図1において、レジスト塗布現像処理装置の長手方向をX方向、平面視においてX方向と直交する方向をY方向とする。   As shown in FIG. 1, the resist coating and developing apparatus includes a loading / unloading unit 1 for placing a cassette C that houses a plurality of glass substrates G for LCD (hereinafter referred to as substrates G), and a substrate. A processing unit 2 having a plurality of processing units for performing a series of processes including resist coating and development on G, and an interface unit 3 for transferring the substrate G to and from the exposure apparatus 4; The loading / unloading unit 1 and the interface unit 3 are disposed at both ends of the processing unit 2, respectively. In FIG. 1, the longitudinal direction of the resist coating and developing apparatus is the X direction, and the direction orthogonal to the X direction in plan view is the Y direction.

上記搬入出部1は、カセットCと処理部2との間で基板Gの搬入出を行うための搬送機構5を備えており、この搬入出部1において外部に対するカセットCの搬入出が行われる。また、搬送機構5は搬送アーム5aを有し、カセットCの配列方向であるY方向に沿って設けられた搬送路6上を移動可能であり、搬送アーム5aによりカセットCと処理部2との間で基板Gの搬入出が行われるように構成されている。   The loading / unloading unit 1 includes a transport mechanism 5 for loading / unloading the substrate G between the cassette C and the processing unit 2, and the loading / unloading unit 1 loads / unloads the cassette C to / from the outside. . The transport mechanism 5 has a transport arm 5a and can move on a transport path 6 provided along the Y direction, which is the arrangement direction of the cassettes C. The transport arm 5a allows the cassette C and the processing unit 2 to move. The substrate G is loaded and unloaded between the two.

上記処理部2は、基本的にX方向に伸びる基板G搬送用の平行な2列の搬送ラインA、Bを有しており、搬送ラインAに沿って搬入出部1側からインターフェイス部3に向けてスクラブ洗浄処理ユニット(SCR)11、第1の熱的処理ユニットセクション16、レジスト処理ユニット13及び第2の熱的処理ユニットセクション17が配列されている。また、搬送ラインBに沿ってインターフェイス部3側から搬入出部1に向けて第2の熱的処理ユニットセクション17、現像処理ユニット(DEV)14、i線UV照射ユニット(i−UV)15及び第3の熱的処理ユニット18が配列されている。なお、スクラブ洗浄処理ユニット(SCR)11の上の一部にはエキシマUV照射ユニット(e−UV)12が設けられている。この場合、エキシマUV照射ユニット(e−UV)12はスクラバ洗浄に先立って基板Gの有機物を除去するために設けられている。また、i線UV照射ユニット(i−UV)15は現像の脱色処理を行うために設けられる。   The processing unit 2 basically has two parallel rows of transport lines A and B for transporting the substrate G extending in the X direction. From the loading / unloading unit 1 side to the interface unit 3 along the transport line A. A scrub cleaning processing unit (SCR) 11, a first thermal processing unit section 16, a resist processing unit 13, and a second thermal processing unit section 17 are arranged. Further, a second thermal processing unit section 17, a development processing unit (DEV) 14, an i-ray UV irradiation unit (i-UV) 15, and the like from the interface unit 3 side toward the carry-in / out unit 1 along the transport line B A third thermal processing unit 18 is arranged. An excimer UV irradiation unit (e-UV) 12 is provided on a part of the scrub cleaning unit (SCR) 11. In this case, an excimer UV irradiation unit (e-UV) 12 is provided to remove organic substances on the substrate G prior to scrubber cleaning. An i-ray UV irradiation unit (i-UV) 15 is provided for performing a decoloring process for development.

なお、第1の熱的処理ユニットセクション16は、基板Gに熱的処理を施す熱的処理ユニットが積層して構成された2つの熱的処理ユニットブロック(TB)31,32を有しており、熱的処理ユニットブロック(TB)31はスクラブ洗浄処理ユニット(SCR)11側に設けられ、熱的処理ユニットブロック(TB)32はレジスト処理ユニット13側に設けられている。これら2つの熱的処理ユニットブロック(TB)31,32の間に第1の搬送機構33が設けられている。   The first thermal processing unit section 16 has two thermal processing unit blocks (TB) 31 and 32 configured by stacking thermal processing units that perform thermal processing on the substrate G. The thermal processing unit block (TB) 31 is provided on the scrub cleaning processing unit (SCR) 11 side, and the thermal processing unit block (TB) 32 is provided on the resist processing unit 13 side. A first transport mechanism 33 is provided between the two thermal processing unit blocks (TB) 31 and 32.

また、第2の熱的処理ユニットセクション17は、基板Gに熱的処理を施す熱的処理ユニットが積層して構成された2つの熱的処理ユニットブロック(TB)34,35を有しており、熱的処理ユニットブロック(TB)34はレジスト処理ユニット13側に設けられ、熱的処理ユニットブロック(TB)35は現像処理ユニット14側に設けられている。これら2つの熱的処理ユニットブロック(TB)34,35の間に第2の搬送機構36が設けられている。   The second thermal processing unit section 17 has two thermal processing unit blocks (TB) 34 and 35 formed by stacking thermal processing units for performing thermal processing on the substrate G. The thermal processing unit block (TB) 34 is provided on the resist processing unit 13 side, and the thermal processing unit block (TB) 35 is provided on the development processing unit 14 side. A second transport mechanism 36 is provided between the two thermal processing unit blocks (TB) 34 and 35.

また、第3の熱的処理ユニットセクション18は、基板Gに熱的処理を施す熱的処理ユニットが積層して構成された2つの熱的処理ユニットブロック(TB)37,38を有しており、熱的処理ユニットブロック(TB)37は現像処理ユニット(DEV)14側に設けられ、熱的処理ユニットブロック(TB)38はカセットステーション1側に設けられている。そして、これら2つの熱的処理ユニットブロック(TB)37,38の間に第3の搬送機構39が設けられている。   The third thermal processing unit section 18 includes two thermal processing unit blocks (TB) 37 and 38 configured by stacking thermal processing units that perform thermal processing on the substrate G. The thermal processing unit block (TB) 37 is provided on the development processing unit (DEV) 14 side, and the thermal processing unit block (TB) 38 is provided on the cassette station 1 side. A third transport mechanism 39 is provided between the two thermal processing unit blocks (TB) 37 and 38.

なお、インターフェイス部3には、エクステンション・クーリングステージ(EXT・COL)41と、周辺露光装置(EE)とタイトラ(TITLER)を積層して設けた外部装置ブロック42と、バッファーステージ(BUF)43及び第4の搬送機構44が配設されている。   The interface unit 3 includes an extension / cooling stage (EXT / COL) 41, an external device block 42 in which a peripheral exposure device (EE) and a TITRA are stacked, a buffer stage (BUF) 43, A fourth transport mechanism 44 is provided.

このように構成されるインターフェイス部3において、第2の搬送機構36によって搬送される基板Gは、エクステンション・クーリングステージ(EXT・COL)41へ搬送され、第4の搬送機構44によって外部装置ブロック42の周辺露光装置(EE)に搬送されて、周辺レジスト除去のための露光が行われ、次いで、第4の搬送機構44により露光装置4に搬送されて、基板G上のレジスト膜が露光されて所定のパターンが形成される。場合によっては、バッファーステージ(BUF)43に基板Gを収容してから露光装置4に搬送される。そして、露光終了後、基板Gは第4の搬送機構44により外部装置ブロック42のタイトラ(TITLER)に搬入されて、基板Gに所定の情報が記された後、エクステンション・クーリングステージ(EXT・COL)41に載置され、再び処理部2に搬送されるように構成されている。   In the interface unit 3 configured as described above, the substrate G transported by the second transport mechanism 36 is transported to the extension / cooling stage (EXT / COL) 41, and the external device block 42 is transported by the fourth transport mechanism 44. To the peripheral exposure apparatus (EE), exposure for removing the peripheral resist is performed, and then the fourth transport mechanism 44 transports the exposure apparatus 4 to expose the resist film on the substrate G. A predetermined pattern is formed. In some cases, the substrate G is accommodated in the buffer stage (BUF) 43 and then transferred to the exposure apparatus 4. After the exposure is finished, the substrate G is carried into the TITRA of the external device block 42 by the fourth transport mechanism 44, and predetermined information is written on the substrate G, and then the extension / cooling stage (EXT / COL). ) 41 and transported to the processing unit 2 again.

上記レジスト処理ユニット13は、この発明に係る浮上式基板搬送処理装置を適用したレジスト塗布処理装置20と、このレジスト塗布処理装置20によって基板G上に形成されたレジスト膜を減圧容器(図示せず)内で減圧乾燥する減圧乾燥装置(VD)21とを具備している。   The resist processing unit 13 includes a resist coating processing apparatus 20 to which the floating substrate transfer processing apparatus according to the present invention is applied, and a resist film formed on the substrate G by the resist coating processing apparatus 20 in a decompression container (not shown). ) And a reduced pressure drying apparatus (VD) 21 for drying under reduced pressure.

次に、この発明に係る浮上式基板搬送処理装置を適用したレジスト塗布処理装置20について説明する。   Next, a resist coating processing apparatus 20 to which the floating substrate transfer processing apparatus according to the present invention is applied will be described.

図2は、上記レジスト塗布処理装置20の第1実施形態の要部を示す概略斜視図、図3は、レジスト塗布処理装置20により基板Gにレジスト液を供給(吐出)する状態を示す基板Gの移動方向に沿う概略断面図、図4は、基板Gの移動方向と直交する方向に沿う概略断面図である。   FIG. 2 is a schematic perspective view showing a main part of the first embodiment of the resist coating apparatus 20, and FIG. 3 is a substrate G showing a state in which a resist solution is supplied (discharged) to the substrate G by the resist coating apparatus 20. FIG. 4 is a schematic cross-sectional view along a direction orthogonal to the movement direction of the substrate G.

上記レジスト塗布処理装置20は、表面から気体を噴射又は噴射及び吸引して基板Gを異なる高さに浮上する浮上ステージ22と、この浮上ステージ22の上方に配置され、基板Gの表面に処理液であるレジスト液Rを帯状に供給する処理液供給手段であるレジスト供給ノズル23と、基板Gの両側端をそれぞれ着脱可能に吸引保持する複数の基板保持部材24と、浮上ステージ22の両側に互いに平行に配置されるガイドレール25に沿ってスライダ26を移動する移動機構27と、基板保持部材24とスライダ26とを連結すると共に、基板Gの浮上高さに追従して変位可能な連結手段50とで主に構成されている。   The resist coating processing apparatus 20 is disposed above the levitation stage 22 so that the substrate G floats at different heights by jetting or jetting and sucking gas from the surface, and a processing liquid is placed on the surface of the substrate G. A resist supply nozzle 23 which is a processing solution supply means for supplying the resist solution R in a strip shape, a plurality of substrate holding members 24 for detachably sucking and holding both side ends of the substrate G, and both sides of the floating stage 22. A moving mechanism 27 that moves the slider 26 along the guide rails 25 arranged in parallel, the substrate holding member 24, and the slider 26 are coupled, and a coupling means 50 that can be displaced following the flying height of the substrate G. And is mainly composed.

この場合、浮上ステージ22は、図2及び図3に示すように、図示しない搬送アームによって搬送される基板Gを受け取る昇降可能な複数例えば4本のリフトピン28aを具備する搬入領域22aと、レジスト供給ノズル23と基板Gとの隙間を一定の距離例えば100〜150μmに維持する塗布領域22bと、基板Gを受け渡す昇降可能な複数例えば4本のリフトピン28bを具備する搬出領域22cとが設けられている。搬入領域22aと搬出領域22cにおいては、浮上ステージ22の表面に設けられた多数の噴射孔29aから気体例えば空気が噴射されて基板Gが約100〜150μmの高さの位置に浮上されている。また、塗布領域22bにおいては、浮上ステージ22の表面に多数の噴射孔29aと吸引孔29bが例えば千鳥状に設けられており、噴射孔29aから気体すなわち空気を噴射すると共に、吸引孔29bから吸引することによって基板Gが約50μmの高さの位置に浮上されている。なお、搬入領域22aと塗布領域22bとの間、及び塗布領域22bと搬出領域22cとの間には、それぞれ両者間の高さのギャップを繋げる繋ぎ領域22d,22eが設けられている。これら繋ぎ領域22d,22eにおいては、多数の噴射孔29aと吸引孔29bとが設けられており、気体である空気の噴射量及び吸引量を調整することによって基板Gを徐々に下降又は上昇するように構成されている。   In this case, as shown in FIGS. 2 and 3, the levitation stage 22 includes a carry-in region 22a including a plurality of lift pins 28a that can be moved up and down to receive a substrate G transported by a transport arm (not shown), and a resist supply. An application region 22b that maintains a gap between the nozzle 23 and the substrate G at a certain distance, for example, 100 to 150 μm, and a carry-out region 22c that includes a plurality of, for example, four lift pins 28b that can move up and down to transfer the substrate G are provided. Yes. In the carry-in area 22a and the carry-out area 22c, gas, for example, air is injected from a large number of injection holes 29a provided on the surface of the levitation stage 22, and the substrate G is levitated at a height of about 100 to 150 μm. Further, in the application region 22b, a large number of injection holes 29a and suction holes 29b are provided on the surface of the levitation stage 22, for example, in a staggered manner. Gas or air is injected from the injection holes 29a and suction is performed from the suction holes 29b. As a result, the substrate G is levitated at a height of about 50 μm. In addition, between the carrying-in area | region 22a and the application | coating area | region 22b, and between the application | coating area | region 22b and the carrying-out area | region 22c, the connection area | regions 22d and 22e which respectively connect the height gap between both are provided. In these connection regions 22d and 22e, a large number of injection holes 29a and suction holes 29b are provided so that the substrate G is gradually lowered or raised by adjusting the injection amount and the suction amount of air, which is a gas. It is configured.

上記レジスト供給ノズル23は、浮上ステージ22の上方を跨ぐ門形フレーム(図示せず)に固定されており、図示しないレジストタンクに接続される供給管23aによって供給されるレジスト液Rを、基板Gの表面に帯状に供給(吐出,滴下)するように構成されている。   The resist supply nozzle 23 is fixed to a gate-shaped frame (not shown) straddling the top of the floating stage 22, and the resist solution R supplied by a supply pipe 23a connected to a resist tank (not shown) is supplied to the substrate G. It is configured so as to be supplied (discharged or dropped) in the form of a band on the surface.

上記基板保持部材24は、基板Gの両側端をそれぞれ着脱可能に吸引保持する複数の吸着パッド60と、各吸着パッド60と図示しない真空装置とを接続するバキューム管61とを具備している。この場合、吸着パッド60は、図11に示すように、例えば、合成ゴム製のパッド本体60aの上面に複数の長孔状の吸引孔60bを設けてなる。なお、吸引孔60bを長孔に変えて小孔としてもよい。また、パッド本体60a内に設けられた室(図示せず)に接続するバキューム管61は、複数の通路60cを有する合成ゴム製の帯状のチューブによって形成されている。このように形成されるバキューム管61は、図5に示すように、移動機構27を構成するスライダ26の上部にヒンジ62を介して垂直方向に揺動可能に枢着されている。このように構成することにより、基板保持部材24すなわち吸着パッド60の変位に追従してバキューム管61も変位可能となる。なお、各吸着パッド60に接続するバキューム管61は、共通の主バキューム管(図示せず)を介して真空装置に接続されている。   The substrate holding member 24 includes a plurality of suction pads 60 that detachably hold both side ends of the substrate G, and a vacuum tube 61 that connects each suction pad 60 to a vacuum device (not shown). In this case, as shown in FIG. 11, the suction pad 60 is provided with, for example, a plurality of elongated suction holes 60b on the upper surface of a synthetic rubber pad body 60a. The suction hole 60b may be a small hole instead of a long hole. The vacuum tube 61 connected to a chamber (not shown) provided in the pad main body 60a is formed by a synthetic rubber belt-like tube having a plurality of passages 60c. As shown in FIG. 5, the vacuum tube 61 formed in this way is pivotally attached to the upper portion of the slider 26 constituting the moving mechanism 27 via a hinge 62 so as to be swingable in the vertical direction. With this configuration, the vacuum tube 61 can also be displaced following the displacement of the substrate holding member 24, that is, the suction pad 60. In addition, the vacuum pipe | tube 61 connected to each suction pad 60 is connected to the vacuum apparatus through the common main vacuum pipe | tube (not shown).

上記移動機構27は、浮上ステージ22の両側に互いに平行に配置されるガイドレール25に摺動自在に装着されるスライダ26を移動するリニアモータによって形成されている。   The moving mechanism 27 is formed by a linear motor that moves a slider 26 that is slidably mounted on guide rails 25 that are arranged parallel to each other on both sides of the levitation stage 22.

一方、上記連結手段50は、基板保持部材24の吸着パッド60とスライダ26とを連結すると共に、基板Gの浮上高さに追従して変位可能な板ばね部材51によって形成されている。この場合、板ばね部材51は、基板保持部材24が基板Gを保持する保持力すなわち吸着パッド60の吸着力より弱いばね力(弾撥力)を有するようにばね定数が設定されている。このように板ばね部材51のばね定数を設定することにより、基板保持部材24による基板Gの保持力(吸着力)を維持した状態で、基板Gの浮上高さに追従して基板保持部材24を変位することができる。   On the other hand, the connecting means 50 is formed by a leaf spring member 51 that connects the suction pad 60 of the substrate holding member 24 and the slider 26 and can be displaced following the flying height of the substrate G. In this case, the spring constant of the leaf spring member 51 is set so that the substrate holding member 24 has a holding force for holding the substrate G, that is, a spring force (elastic force) that is weaker than the suction force of the suction pad 60. By setting the spring constant of the leaf spring member 51 in this manner, the substrate holding member 24 follows the flying height of the substrate G while maintaining the holding force (adsorption force) of the substrate G by the substrate holding member 24. Can be displaced.

上記板ばね部材51は、各吸着パッド60とスライダ26とを連結する複数部材であっても差し支えないが、好ましくは、1部材によって形成する方がよい。すなわち、図6に示すように、基板Gの移動方向に連続して複数の基板保持部材24の吸着パッド60を保持する保持部51aと、切欠き51bを介して互いに間隔をおいて列設されて、保持部51aとスライダ26とを連結する可撓性を有する連結部51cとを具備する1部材にて形成する方が好ましい。このように、板ばね部材51を1部材によって形成することにより、連結手段50における基板Gの搬送方向の剛性を確保することができ、基板Gを更に確実に搬送することができる。   The leaf spring member 51 may be a plurality of members that connect the suction pads 60 and the slider 26, but it is preferable that the leaf spring member 51 be formed of one member. That is, as shown in FIG. 6, the holding portions 51 a that hold the suction pads 60 of the plurality of substrate holding members 24 and the notches 51 b are arranged at intervals from each other continuously in the moving direction of the substrate G. Thus, it is preferable to form the holding portion 51a and the slider 26 with one member including a flexible connecting portion 51c. Thus, by forming the leaf spring member 51 with one member, the rigidity of the connecting means 50 in the transport direction of the substrate G can be secured, and the substrate G can be transported more reliably.

次に、上記のように構成されるレジスト塗布処理装置20の動作態様について説明する。まず、熱的処理ユニット(TB)31によって熱処理された基板Gが図示しない搬送アームによって浮上ステージ22の搬入領域22a上に搬入されると、リフトピン28aが上昇して基板Gを受け取る。その後、搬送アームは浮上ステージ22上から外方へ退避する。基板Gを受け取った後、リフトピン28aは下降する一方、基板Gは搬入領域22aの表面から噴出する空気によって約100〜150μmの高さの位置に浮上され、この状態で、真空装置が作動して基板保持部材24の吸着パッド60によって基板Gが吸着保持される。この際、板ばね部材51が基板Gの浮上高さとスライダ26の高さとのギャップを吸収するので、基板Gは浮上ステージ22の搬入領域22a上の約100〜150μmの高さの位置に水平状態に維持される。   Next, the operation | movement aspect of the resist coating processing apparatus 20 comprised as mentioned above is demonstrated. First, when the substrate G that has been heat-treated by the thermal processing unit (TB) 31 is loaded onto the loading region 22a of the levitation stage 22 by a transfer arm (not shown), the lift pins 28a rise to receive the substrate G. Thereafter, the transfer arm retracts outward from the levitation stage 22. After receiving the substrate G, the lift pins 28a are lowered, while the substrate G is levitated to a height of about 100 to 150 μm by the air ejected from the surface of the carry-in area 22a, and in this state, the vacuum apparatus is activated. The substrate G is sucked and held by the suction pad 60 of the substrate holding member 24. At this time, since the leaf spring member 51 absorbs the gap between the flying height of the substrate G and the height of the slider 26, the substrate G is in a horizontal state at a height of about 100 to 150 μm on the loading area 22 a of the flying stage 22. Maintained.

次いで、リニアモータ27(移動機構)が駆動して基板Gが塗布領域22bに搬送される。塗布領域22bにおいては、浮上ステージ22の表面から空気の噴出と吸引とのバランスによって基板Gは約50μmの高さの位置に浮上される。この際、板ばね部材51が基板Gの浮上高さとスライダ26の高さとのギャップを吸収するので、基板Gは浮上ステージ22の塗布領域22b上の約50μmの高さの位置に水平状態に維持され、レジスト供給ノズル23との間に所定の隙間S(100〜150μm)を維持する。この状態で、レジスト供給ノズル23からレジスト液Rを帯状に供給(吐出)すると共に、基板Gを移動することによって、基板Gの表面にレジスト膜が均一に形成される。   Next, the linear motor 27 (moving mechanism) is driven to transport the substrate G to the coating region 22b. In the coating region 22b, the substrate G is levitated from the surface of the levitation stage 22 to a position having a height of about 50 μm due to the balance between air ejection and suction. At this time, since the leaf spring member 51 absorbs the gap between the flying height of the substrate G and the height of the slider 26, the substrate G is maintained in a horizontal state at a height of about 50 μm on the coating region 22 b of the flying stage 22. Then, a predetermined gap S (100 to 150 μm) is maintained with the resist supply nozzle 23. In this state, the resist solution R is supplied (discharged) in a strip shape from the resist supply nozzle 23 and the substrate G is moved, whereby a resist film is uniformly formed on the surface of the substrate G.

レジスト膜が形成された基板Gは搬出領域22cに移動されると、基板Gは搬出領域22cの表面から噴出する空気によって約100〜150μmの高さの位置に浮上され、この状態で、真空装置を停止して基板Gの吸着保持が解かれる。すると、リフトピン28bが上昇して基板Gを上方の受渡し位置へ移動する。この状態で、図示しない搬送アームが基板Gを受け取って基板Gを次工程の減圧乾燥装置(VD)21へ搬送する。   When the substrate G on which the resist film is formed is moved to the carry-out region 22c, the substrate G is levitated to a position having a height of about 100 to 150 μm by the air ejected from the surface of the carry-out region 22c. Is stopped and the adsorption holding of the substrate G is released. Then, the lift pins 28b are moved up to move the substrate G to the upper delivery position. In this state, a transfer arm (not shown) receives the substrate G and transfers the substrate G to the vacuum drying apparatus (VD) 21 in the next process.

図7は、この発明における連結手段50Aの別の実施形態を示す断面図である。図7では、連結手段50Aを、スライダ26に揺動自在に枢着される腕部材52によって形成した場合である。すなわち、一端がスライダ26にヒンジピン52aを介して垂直方向に揺動自在に枢着される腕部材52の他端に基板保持部材24の吸着パッド60を連結した場合である。なお、腕部材52の形状は任意でよく、例えば棒状や板状等のいずれであってもよい。   FIG. 7 is a cross-sectional view showing another embodiment of the connecting means 50A in the present invention. In FIG. 7, the connecting means 50 </ b> A is formed by an arm member 52 pivotally attached to the slider 26. That is, this is a case where the suction pad 60 of the substrate holding member 24 is connected to the other end of the arm member 52 pivotally attached to the slider 26 via the hinge pin 52a so as to be swingable in the vertical direction. In addition, the shape of the arm member 52 may be arbitrary, for example, any of rod shape, plate shape, etc. may be sufficient.

このように構成することにより、基板Gの浮上高さ位置とスライダ26の高さ位置とのギャップに対して腕部材52が追従して変位するので、基板Gの浮上高さを所定の位置に維持することができる。   With this configuration, the arm member 52 follows the gap between the flying height position of the substrate G and the slider 26 so that the flying height of the substrate G is set to a predetermined position. Can be maintained.

なお、上記腕部材52の枢着部にばね部材例えばリターンばね53を装着して連結手段50Bを形成してもよい。すなわち、図8に示すように、連結手段50Bを、スライダ26に揺動自在に枢着される腕部材52によって形成すると共に、腕部材52の枢着部に、基板保持部材24の保持力に抗して作用するばね力を有するばね部材例えばリターンばね53を装着して、形成してもよい。   A connecting member 50B may be formed by attaching a spring member, for example, a return spring 53 to the pivot portion of the arm member 52. That is, as shown in FIG. 8, the connecting means 50B is formed by the arm member 52 pivotably attached to the slider 26, and the holding force of the substrate holding member 24 is applied to the pivoting portion of the arm member 52. A spring member having a spring force acting against it, for example, a return spring 53 may be attached and formed.

なお、図7及び図8に示す実施形態において、その他の部分は、第1実施形態と同じであるので、同一部分には同一符号を付して、説明は省略する。   In the embodiment shown in FIGS. 7 and 8, the other parts are the same as those in the first embodiment, so the same parts are denoted by the same reference numerals and the description thereof is omitted.

図9Aは、この発明における連結手段50Cの更に別の実施形態を示す断面図である。図9Aでは、連結手段50Cを、中間部がスライダ26に揺動自在に枢着され、基板保持部側と反対側にバランスウエイト54を具備する揺動部材55にて形成した場合である。すなわち、一端に基板保持部材24の吸着パッド60を連結し、他端部にバランスウエイト54を具備する揺動部材55の中間部を、スライダ26にヒンジピン52bを介して垂直方向に揺動自在に枢着した場合である。   FIG. 9A is a cross-sectional view showing still another embodiment of the connecting means 50C in the present invention. In FIG. 9A, the connecting means 50C is formed by a swing member 55 having an intermediate portion pivotably attached to the slider 26 and having a balance weight 54 on the side opposite to the substrate holding portion side. That is, the suction pad 60 of the substrate holding member 24 is connected to one end, and the middle portion of the swinging member 55 having the balance weight 54 is connected to the slider 26 so that the slider 26 can swing in the vertical direction via the hinge pin 52b. This is the case when it is pivotally attached.

このように構成することにより、基板Gの吸着保持状態において、バランスウエイト54が作用して基板Gの浮上高さ位置とスライダ26の高さ位置とのギャップに対して揺動部材55が追従して変位するので、基板Gの浮上高さを所定の位置に維持することができる。   With this configuration, when the substrate G is attracted and held, the balance weight 54 acts and the swing member 55 follows the gap between the flying height position of the substrate G and the height position of the slider 26. Therefore, the flying height of the substrate G can be maintained at a predetermined position.

なお、上記説明では、揺動部材55とバランスウェイト54とを一体に形成した場合について説明したが、揺動部材55Aとバランスウェイト54Aとを別体に形成してもよい。すなわち、図9Bの示すように、スライダ26の上面に突設されたブラケット26aにヒンジピン52bによって揺動可能に枢着される揺動部材55Aにおける吸着パッド60側と反対側端部に雌ねじ部55aを設け、この雌ねじ部55aに、バランスウェイト54Aに突設されたねじ部54aをねじ部結合して、バランスウェイト54Aを進退可能に形成してもよい。なお、ねじ部54aにはロックナット54bが螺合されており、このロックナット54bを揺動部材55Aの端面に押圧することでバランスウェイト54Aの取付位置が固定される。   In the above description, the swing member 55 and the balance weight 54 are integrally formed. However, the swing member 55A and the balance weight 54A may be formed separately. That is, as shown in FIG. 9B, the female thread portion 55a is provided at the end opposite to the suction pad 60 side in the swing member 55A pivotably mounted by the hinge pin 52b on the bracket 26a protruding from the upper surface of the slider 26. The balance weight 54A may be formed so that the balance weight 54A can be advanced and retracted by connecting the thread portion 54a projecting from the balance weight 54A to the female thread portion 55a. A lock nut 54b is screwed into the threaded portion 54a, and the mounting position of the balance weight 54A is fixed by pressing the lock nut 54b against the end surface of the swing member 55A.

上記のように、揺動部材55Aにおける吸着パッド60側と反対側にバランスウェイト54Aを進退可能にねじ結合することにより、浮上ステージ22にて規定される基板Gの浮上高さに影響を与えないように吸着パッド60から基板Gにかかる荷重を調整することができる。   As described above, the balance weight 54A is screwed to the opposite side to the suction pad 60 side of the swing member 55A so that the balance weight 54A can be advanced and retracted, so that the flying height of the substrate G defined by the flying stage 22 is not affected. Thus, the load applied to the substrate G from the suction pad 60 can be adjusted.

なお、図9A及び図9Bに示す実施形態において、その他の部分は、第1実施形態と同じであるので、同一部分には同一符号を付して、説明は省略する。   In the embodiment shown in FIGS. 9A and 9B, the other parts are the same as those in the first embodiment, so the same parts are denoted by the same reference numerals and the description thereof is omitted.

図10は、この発明における連結手段50Dの更に別の実施形態を示す断面図である。図10では、連結手段50Dは、スライダ26にヒンジピン52cを介して垂直方向に揺動自在に枢着される略ベルクランク状のリンク部材56によって形成されると共に、このリンク部材56の垂直片56aとスライダ26の対向面に、励磁によって基板保持部材24(吸着パッド60)の吸着保持力より小さい反発力を生ずる電磁石57を具備している。この場合、電磁石57を励磁(ON)すると、電磁石57に反発力が生じて吸着パッド60が上昇し、電磁石57が非励磁(OFF)のときは、電磁石57同士が吸着して吸着パッド60が下降するように構成されている。なお、リンク部材56をばね部材にて形成してもよい。リンク部材56をばね部材によって形成することにより、弱い(小さい)ばね定数とすることができるので、基板Gの浮上高さの維持をより精度の高いものとすることができる。   FIG. 10 is a sectional view showing still another embodiment of the connecting means 50D in the present invention. In FIG. 10, the connecting means 50D is formed by a substantially bell crank-shaped link member 56 pivotally attached to the slider 26 via a hinge pin 52c so as to be swingable in the vertical direction, and a vertical piece 56a of the link member 56. And an electromagnet 57 that generates a repulsive force smaller than the suction holding force of the substrate holding member 24 (suction pad 60) by excitation. In this case, when the electromagnet 57 is excited (ON), a repulsive force is generated in the electromagnet 57 and the suction pad 60 is raised. When the electromagnet 57 is not excited (OFF), the electromagnets 57 are attracted to each other and the suction pad 60 is It is configured to descend. The link member 56 may be formed of a spring member. By forming the link member 56 with a spring member, a weak (small) spring constant can be obtained, so that the flying height of the substrate G can be maintained with higher accuracy.

上記のように構成することにより、基板保持部材24の吸着パッド60が基板Gを吸着保持するとき、電磁石57を励磁(ON)にすれば、電磁石57に反発力が生じて吸着パッド60が上昇して基板Gを吸着保持する。この状態で基板Gを搬送すると、電磁石57の反発力が作用して基板Gの浮上高さ位置とスライダ26の高さ位置とのギャップに対して吸着パッド60が追従して変位するので、基板Gの浮上高さを所定の位置に維持することができる。   With the configuration described above, when the suction pad 60 of the substrate holding member 24 holds the substrate G by suction, if the electromagnet 57 is excited (ON), a repulsive force is generated in the electromagnet 57 and the suction pad 60 is raised. Then, the substrate G is sucked and held. When the substrate G is transported in this state, the repulsive force of the electromagnet 57 acts to displace the suction pad 60 following the gap between the flying height position of the substrate G and the height position of the slider 26. The flying height of G can be maintained at a predetermined position.

なお、図10に示す実施形態において、その他の部分は、第1実施形態と同じであるので、同一部分には同一符号を付して、説明は省略する。   In the embodiment shown in FIG. 10, the other parts are the same as those in the first embodiment. Therefore, the same parts are denoted by the same reference numerals and description thereof is omitted.

図12は、この発明における連結手段50Eの更に別の実施形態を示す断面図である。図12では、連結手段50Eは、スライダ26に一端が連結し、他端に筒状軸受け101を有する支持部材100と、吸着パッド60の下部に連結し、筒状軸受け101内に摺動自在に挿入される昇降軸102とを具備するベアリングによって形成されている。この場合、昇降軸102の重量をできる限り小さくする方が好ましい。   FIG. 12 is a cross-sectional view showing still another embodiment of the connecting means 50E according to the present invention. In FIG. 12, the connecting means 50 </ b> E is connected to the slider 26 at one end and connected to the support member 100 having the cylindrical bearing 101 at the other end and the lower portion of the suction pad 60, and is slidable within the cylindrical bearing 101. It is formed by the bearing which has the raising / lowering shaft 102 inserted. In this case, it is preferable to make the weight of the lifting shaft 102 as small as possible.

このように、連結手段50Eを、スライダ26に連結される支持部材101の端部に設けられる筒状軸受け101と、この筒状軸受け101内に揺動自在に挿入されてテレスコープ状に可動(昇降)する昇降軸102とからなるベアリングによって形成することにより、基板Gの浮上高さ位置とスライダ26の高さ位置とのギャップに対して昇降軸102が追従して変位(昇降)するので、基板Gの浮上高さを所定の位置に維持することができる。   Thus, the connecting means 50E is inserted into the cylindrical bearing 101 at the end of the support member 101 connected to the slider 26, and is slidably inserted into the cylindrical bearing 101 so as to be movable in a telescope shape ( By forming the bearing by the lift shaft 102 that moves up and down), the lift shaft 102 follows and displaces (lifts) the gap between the flying height position of the substrate G and the height position of the slider 26. The flying height of the substrate G can be maintained at a predetermined position.

なお、上記連結手段50Eでは、昇降軸102の重量を考慮して浮上ステージ22から噴射される空気の噴射量を調整する必要がある。   In the connecting means 50E, it is necessary to adjust the injection amount of air injected from the levitation stage 22 in consideration of the weight of the lifting shaft 102.

図13は、この発明における連結手段50Fの更に別の実施形態を示す断面図である。図13では、連結手段50Fは、上記筒状軸受け101と、この筒状軸受け101内に嵌挿される筒状の多孔質ブッシュ204と、この多孔質ブッシュ204内に遊嵌状すなわち隙間をおいて挿入される昇降軸102と、筒状軸受け101を介して多孔質ブッシュ204と昇降軸102との間に空気層を形成すべく気体例えば空気を供給する気体供給手段200を具備するエアーベアリングによって形成されている。この場合、多孔質ブッシュ204の上下2箇所には、筒状軸受け101の内面に圧接されるOリング201,202が周設されて、供給される空気のシール性が維持されている。また、筒状軸受け101における両Oリング201,202間に気体供給手段200を構成する空気供給口203が設けられ、図示しない空気供給源から供給される空気を両Oリング201,202間に供給することで、多孔質ブッシュ204の内径全周から空気が吹き出されて昇降軸102の上下動の摩擦抵抗を低減し、基板Gへの昇降軸102の追従性を確保することができる。したがって、基板Gの搬送を安定させることができる。なお、この場合も、昇降軸102の重量をできる限り小さくする方が好ましい。   FIG. 13 is a sectional view showing still another embodiment of the connecting means 50F in the present invention. In FIG. 13, the connecting means 50 </ b> F includes the cylindrical bearing 101, a cylindrical porous bush 204 that is inserted into the cylindrical bearing 101, and a loose fit, that is, a gap in the porous bush 204. Formed by an elevating shaft 102 to be inserted and an air bearing having a gas supply means 200 for supplying gas, for example, air, to form an air layer between the porous bush 204 and the elevating shaft 102 via the cylindrical bearing 101. Has been. In this case, O-rings 201 and 202 that are press-contacted to the inner surface of the cylindrical bearing 101 are provided around the upper and lower portions of the porous bush 204 to maintain the sealing performance of the supplied air. Further, an air supply port 203 constituting the gas supply means 200 is provided between the O-rings 201 and 202 in the cylindrical bearing 101, and air supplied from an air supply source (not shown) is supplied between the O-rings 201 and 202. By doing so, air is blown out from the entire inner circumference of the porous bush 204 to reduce the frictional resistance of the vertical movement of the lifting shaft 102, and the followability of the lifting shaft 102 to the substrate G can be ensured. Therefore, the conveyance of the substrate G can be stabilized. In this case as well, it is preferable to make the weight of the lifting shaft 102 as small as possible.

また、上記のように、連結手段50Fをエアーベアリングによって形成することにより、昇降軸102の上下動の摩擦抵抗を低減し、基板Gへの昇降軸102の追従性を確保した状態で、浮上ステージ22から噴射される空気の噴射量を設定することができるので、基板Gの浮上高さを所定の位置に高精度に維持することができる。   In addition, as described above, the coupling means 50F is formed of an air bearing, thereby reducing the frictional resistance of the vertical movement of the lifting shaft 102 and ensuring the followability of the lifting shaft 102 to the substrate G. Since the injection amount of the air injected from 22 can be set, the flying height of the substrate G can be maintained at a predetermined position with high accuracy.

なお、連結手段50Fの一部をエアーベアリングによって形成する場合、図13に二点鎖線で示すように、筒状軸受け101の上端開口側に内方に向かってストッパ片103を突設し、昇降軸102には、ストッパ片103に係合可能な突起104を突設することにより、空気圧によって昇降軸102が上昇してストッパ片103と突起104とが係合した状態で昇降軸102の上限位置を規制することができる。これにより、基板吸着保持時における基板Gと吸着パッド60の密着性の確保が図れる。   When a part of the connecting means 50F is formed by an air bearing, as shown by a two-dot chain line in FIG. 13, a stopper piece 103 protrudes inwardly on the upper end opening side of the cylindrical bearing 101 and moves up and down. The shaft 102 is provided with a protrusion 104 that can be engaged with the stopper piece 103, so that the lifting shaft 102 is raised by air pressure and the stopper piece 103 and the protrusion 104 are engaged with each other. Can be regulated. Thereby, it is possible to secure the adhesion between the substrate G and the suction pad 60 during the substrate suction holding.

図14は、この発明における連結手段50Gの更に別の実施形態を示す断面図である。図14では、連結手段50Gは、上記ベアリング、エアーベアリングに代えてマグネットベアリングを具備する。すなわち、連結手段50Gは、上記筒状軸受け101の内面の対向する部位同士が同極の4極スプライン状に装着される第1の磁石体301と、上記昇降軸102の外面の対向する部位同士が同極に形成され、第1の磁石体301との間で磁気吸引力を促す4極スプライン状に装着される第2の磁石体302とを具備する。   FIG. 14 is a sectional view showing still another embodiment of the connecting means 50G in the present invention. In FIG. 14, the connecting means 50G includes a magnet bearing instead of the bearing and the air bearing. That is, the connecting means 50G includes a first magnet body 301 in which the opposing portions of the inner surface of the cylindrical bearing 101 are mounted in a quadrupole spline with the same polarity, and the opposing portions of the outer surface of the lifting shaft 102. Are formed with the same polarity, and the second magnet body 302 is mounted in a four-pole spline shape that promotes a magnetic attraction force with the first magnet body 301.

上記のように、連結手段50Gの一部をマグネットベアリングによって形成することにより、第1の磁石体301と第2の磁石体302との間で磁気吸引力が促されて昇降軸102の重量がキャンセルされて無重力状態となる。したがって、昇降軸102の重量を考慮せずに浮上ステージ22から噴射される空気の噴射量を設定することができるので、基板Gの浮上高さを所定の位置に高精度に維持することができる。   As described above, by forming a part of the connecting means 50G by the magnet bearing, a magnetic attractive force is promoted between the first magnet body 301 and the second magnet body 302, and the weight of the lifting shaft 102 is increased. Canceled to zero gravity. Therefore, the amount of air injected from the levitation stage 22 can be set without considering the weight of the elevating shaft 102, so that the flying height of the substrate G can be maintained at a predetermined position with high accuracy. .

なお、上記第1の磁石体301及び第2の磁石体302の磁石を電磁石によって形成して、磁気吸引力を調整可能にするようにしてもよい。   The magnets of the first magnet body 301 and the second magnet body 302 may be formed of electromagnets so that the magnetic attractive force can be adjusted.

図15は、この発明に係る浮上式基板搬送処理装置を適用したレジスト塗布処理装置の第2実施形態の一例を示す概略平面図、図16は、図15の側面図、図17は、第2実施形態におけるガイドピンを示す概略側面図である。   FIG. 15 is a schematic plan view showing an example of a second embodiment of a resist coating processing apparatus to which the floating substrate transfer processing apparatus according to the present invention is applied, FIG. 16 is a side view of FIG. 15, and FIG. It is a schematic side view which shows the guide pin in embodiment.

第2実施形態は、第1実施形態のレジスト塗布処理装置と同様に構成される他に、スライダ26に連結されて、基板Gの移動方向の前後端縁に係脱すべく垂直移動可能なガイドピン70を更に具備して、基板Gの搬送始動・停止時の加速度による基板Gの不用意な移動(ずれ)を防止するようにした場合である。ここでは、第1実施形態と同じ部分には同一符号を付して、説明は省略する。   The second embodiment is configured in the same manner as the resist coating apparatus of the first embodiment, and is connected to the slider 26 and vertically movable to be engaged with and disengaged from the front and rear edges in the moving direction of the substrate G. 70 is further provided to prevent inadvertent movement (displacement) of the substrate G due to acceleration at the start and stop of conveyance of the substrate G. Here, the same parts as those in the first embodiment are denoted by the same reference numerals, and description thereof is omitted.

第2実施形態では、両スライダ26の移動方向の前後端部から内方側に向かって保持ブラケット71が突設されており、この保持ブラケット71の上に、位置決め用水平移動手段である水平シリンダ72が載置固定されている。また、水平シリンダ72のピストンロッド72aに、垂直移動手段である垂直シリンダ73が連結されており、この垂直シリンダ73のピストンロッド73aの先端側にガイドピン70が延在されている。   In the second embodiment, a holding bracket 71 protrudes inward from the front and rear end portions in the moving direction of both sliders 26, and a horizontal cylinder that is a horizontal moving means for positioning is provided on the holding bracket 71. 72 is mounted and fixed. In addition, a vertical cylinder 73 as vertical moving means is connected to the piston rod 72 a of the horizontal cylinder 72, and a guide pin 70 extends on the tip side of the piston rod 73 a of the vertical cylinder 73.

このように構成される第2実施形態のレジスト塗布処理装置によれば、図17(a)に示すように、図示しない搬送アームによって基板Gが浮上ステージ22の上方に搬入された後、リフトピン(図示せず)によって受け取られると、まず、垂直シリンダ73が作動してガイドピン70が上昇する(図17(b)参照)。次いで、水平シリンダ72が作動してガイドピン70が基板Gの移動方向の前後端縁に当接して、基板Gの移動方向側の位置決め(アライメント)が行われる(図17(c)参照)。この場合、ガイドピン70の先端部がレジスト供給ノズル23に干渉しないように、ガイドピン70の先端面と基板Gの表面とをほぼ同一面上におく方が望ましい。   According to the resist coating apparatus of the second embodiment configured as described above, as shown in FIG. 17A, after the substrate G is carried above the levitation stage 22 by a transfer arm (not shown), lift pins ( First, the vertical cylinder 73 is actuated to raise the guide pin 70 (see FIG. 17B). Next, the horizontal cylinder 72 is actuated to bring the guide pins 70 into contact with the front and rear end edges in the movement direction of the substrate G, and positioning (alignment) on the movement direction side of the substrate G is performed (see FIG. 17C). In this case, it is desirable to place the tip surface of the guide pin 70 and the surface of the substrate G substantially on the same plane so that the tip portion of the guide pin 70 does not interfere with the resist supply nozzle 23.

また、ガイドピン70に基板Gの搬送始動・停止時の加速度による基板Gのずれを防止する機能のみをもたせる場合は、基板Gの前後端のいずれか一方のガイドピン70を上昇させるようにしてもよい。   Further, when the guide pin 70 has only a function of preventing the displacement of the substrate G due to the acceleration at the start and stop of the conveyance of the substrate G, either one of the guide pins 70 at the front and rear ends of the substrate G is raised. Also good.

なお、基板Gの移動方向(X方向)と直交する方向(Y方向)の位置決め(アライメント)は、両スライダ26の移動方向の両端部付近に載置された水平シリンダ81のピストンロッド81aに連結された垂直シリンダ82のピストンロッド82aの先端側に延在するY方向に移動可能なガイドピン80によって位置決めされる。   The positioning (alignment) in the direction (Y direction) perpendicular to the moving direction (X direction) of the substrate G is connected to the piston rod 81a of the horizontal cylinder 81 placed near both ends in the moving direction of both sliders 26. The vertical cylinder 82 is positioned by a guide pin 80 that is movable in the Y direction and extends toward the tip of the piston rod 82a of the vertical cylinder 82.

上記のようにして、ガイドピン70を基板Gの前後端縁に当接させた状態で、基板Gを移動させると、基板Gの搬送始動・停止時の加速度による基板Gの不用意な移動(ずれ)を防止することができる。したがって、加速度のパラメータに余裕ができると共に、処理精度の維持が図れる。また、基板保持部材24(吸着パッド60)の数を削減することができると共に、基板保持力を低減することができるので、構成部材の削減及び装置の小型化が図れる。   As described above, if the substrate G is moved in a state where the guide pins 70 are in contact with the front and rear edges of the substrate G, the substrate G is inadvertently moved due to acceleration at the start and stop of conveyance of the substrate G ( Misalignment) can be prevented. Therefore, the acceleration parameter can be afforded and the processing accuracy can be maintained. In addition, since the number of substrate holding members 24 (suction pads 60) can be reduced and the substrate holding force can be reduced, the number of constituent members and the size of the apparatus can be reduced.

なお、図15では、板ばね部材51によって形成される連結手段50を用いた場合について説明したが、その他の連結手段50A〜50Gを用いてもよいことは勿論である。   In addition, in FIG. 15, although the case where the connection means 50 formed by the leaf | plate spring member 51 was used was demonstrated, it is needless to say that other connection means 50A-50G may be used.

なお、第2実施形態に加えて、ガイドピン70にリフトピンの機能を持たせることも可能である。例えば、ガイドピン70の中間部に、水平方向に向って支持ピン90を突設することにより、ガイドピン70の昇降動作によって基板Gの受け渡しを行うことができる。すなわち、図18(a)に示すように浮上ステージ22の上方に基板Gが搬入されたとき、まず、ガイドピン70を水平移動して基板Gの端縁に当接する(図18(b)参照)。次に、ガイドピン70を上昇させて基板Gの下面を支持ピン90によって支持して基板Gを受け取る(図18(c)参照)。次に、吸着パッド60によって基板Gを吸着保持した後に、ガイドピン70が下降して支持ピン90の支持を解き、ガイドピン70を基板Gの前後端縁に当接させた状態で基板Gを移動する(図18(d)参照)。そして、搬出領域22cに移動された処理済の基板Gを搬送アームに受け渡す場合は、上述と同様の動作を行って基板Gを、レジスト塗布処理装置20から搬出することができる。   In addition to the second embodiment, the guide pin 70 may have a lift pin function. For example, by providing a support pin 90 in the middle of the guide pin 70 in the horizontal direction, the substrate G can be transferred by the lifting and lowering operation of the guide pin 70. That is, as shown in FIG. 18A, when the substrate G is loaded above the levitation stage 22, first, the guide pins 70 are moved horizontally to contact the edge of the substrate G (see FIG. 18B). ). Next, the guide pins 70 are raised, the lower surface of the substrate G is supported by the support pins 90, and the substrate G is received (see FIG. 18C). Next, after the substrate G is sucked and held by the suction pad 60, the guide pins 70 are lowered to release the support pins 90, and the substrate G is held in a state where the guide pins 70 are in contact with the front and rear edges of the substrate G. It moves (see FIG. 18D). When the processed substrate G moved to the carry-out area 22c is transferred to the transfer arm, the substrate G can be carried out from the resist coating apparatus 20 by performing the same operation as described above.

<その他の実施形態>
上記実施形態では、基板保持部材24を吸着パッド60によって形成する場合について説明したが、吸着パッド60に代えて図19に示すような静電パッド60Aを使用することも可能である。この静電パッド60Aは、内部に設けた金属電極60dに電圧を印加し、基板Gと静電パッド60Aの表面に正・負の電荷を発生させ、この間に働くジャンセン・ラーベック力によって基板Gを吸着保持するものである。なお、図19では、単極型の静電パッド60Aについて説明したが、静電パッドの内部に複数(例えば2個)の電極60dを設けて、これら電極60d間に電位差を与えて基板Gを吸着保持する双極型静電パッドを使用することも可能である。
<Other embodiments>
In the above embodiment, the case where the substrate holding member 24 is formed by the suction pad 60 has been described. However, instead of the suction pad 60, an electrostatic pad 60A as shown in FIG. The electrostatic pad 60A applies a voltage to the metal electrode 60d provided therein to generate positive and negative charges on the surface of the substrate G and the electrostatic pad 60A, and the substrate G is caused by the Jansen-Rahbek force acting between them. Adsorbed and held. In FIG. 19, the monopolar electrostatic pad 60A has been described. However, a plurality of (for example, two) electrodes 60d are provided inside the electrostatic pad, and a potential difference is applied between the electrodes 60d to attach the substrate G. It is also possible to use a bipolar electrostatic pad that is attracted and held.

また、上記実施形態では、この発明に係る浮上式基板搬送処理装置をレジスト塗布処理装置に適用した場合について説明したが、レジスト塗布処理装置以外の装置、例えば現像処理装置にも適用できることは勿論である。   In the above embodiment, the case where the floating substrate transfer processing apparatus according to the present invention is applied to a resist coating processing apparatus has been described. However, the present invention can be applied to apparatuses other than the resist coating processing apparatus, for example, development processing apparatuses. is there.

この発明に係る浮上式基板搬送処理装置を適用したLCD用ガラス基板のレジスト塗布現像処理装置を示す概略平面図である。1 is a schematic plan view showing a resist coating and developing treatment apparatus for a glass substrate for LCD to which a floating substrate transfer processing apparatus according to the present invention is applied. 上記浮上式基板搬送処理装置を適用したレジスト塗布処理装置の第1実施形態を示す概略斜視図である。It is a schematic perspective view which shows 1st Embodiment of the resist coating processing apparatus to which the said floating type substrate conveyance processing apparatus is applied. 上記レジスト塗布処理装置の基板の移動方向に沿う概略断面図である。It is a schematic sectional drawing in alignment with the moving direction of the board | substrate of the said resist coating processing apparatus. 上記レジスト塗布処理装置の基板の移動方向と直交する方向に沿う概略断面図である。It is a schematic sectional drawing in alignment with the direction orthogonal to the moving direction of the board | substrate of the said resist coating processing apparatus. この発明における連結手段の第1実施形態を示す概略断面図である。It is a schematic sectional drawing which shows 1st Embodiment of the connection means in this invention. 上記連結手段を形成する板ばね部材を1部材によって形成した場合の斜視図である。It is a perspective view at the time of forming the leaf | plate spring member which forms the said connection means by 1 member. この発明における連結手段の別の実施形態を示す概略断面図である。It is a schematic sectional drawing which shows another embodiment of the connection means in this invention. この発明における連結手段の更に別の実施形態を示す概略断面図である。It is a schematic sectional drawing which shows another embodiment of the connection means in this invention. この発明における連結手段の更に別の実施形態で、揺動部材とバランスウェイトを具備する場合を示す概略断面図である。It is a schematic sectional drawing which shows the case where another embodiment of the connection means in this invention is equipped with a rocking | swiveling member and a balance weight. この発明における連結手段が揺動部材とバランスウェイトを具備する場合の別の形態を示す概略断面図である。It is a schematic sectional drawing which shows another form in case the connection means in this invention comprises a rocking | swiveling member and a balance weight. この発明における連結手段の更に別の実施形態を示す概略断面図である。It is a schematic sectional drawing which shows another embodiment of the connection means in this invention. この発明における基板保持部材を形成する吸着パッドの一例を示す斜視図である。It is a perspective view which shows an example of the suction pad which forms the board | substrate holding member in this invention. この発明における連結手段の更に別の実施形態で、ベアリングを具備する場合の概略断面図である。In another embodiment of the connection means in this invention, it is a schematic sectional drawing in the case of comprising a bearing. この発明における連結手段がエアーベアリングを具備する場合の概略断面図である。It is a schematic sectional drawing in case the connection means in this invention comprises an air bearing. この発明における連結手段がマグネットベアリングを具備する場合の概略断面図(a)及び(a)のI−I線に沿う断面図(b)である。It is sectional drawing (b) in alignment with the II line | wire of schematic sectional drawing (a) and (a) in case the connection means in this invention comprises a magnet bearing. この発明に係る浮上式基板搬送処理装置を適用したレジスト塗布処理装置の第2実施形態を示す概略平面図である。It is a schematic plan view which shows 2nd Embodiment of the resist coating processing apparatus to which the floating type substrate conveyance processing apparatus which concerns on this invention is applied. 図15の側面図である。FIG. 16 is a side view of FIG. 15. 第2実施形態におけるガイドピンの動作態様を示す概略側面図である。It is a schematic side view which shows the operation | movement aspect of the guide pin in 2nd Embodiment. 上記ガイドピンの変形例の動作態様を示す概略側面図である。It is a schematic side view which shows the operation | movement aspect of the modification of the said guide pin. この発明における基板保持部材の別の形態を示す概略断面図である。It is a schematic sectional drawing which shows another form of the board | substrate holding member in this invention.

G LCD用ガラス基板(被処理基板)
22 浮上ステージ
23 レジスト供給ノズル(処理液供給手段)
24 基板保持部材
25 ガイドレール
26 スライダ
27 リニアモータ(移動機構)
50,50A,50B,50C,50D,50E,50F,50G 連結手段
51 板ばね部材
52 腕部材
52a,52b,52c ヒンジピン
53 リターンばね(ばね部材)
54,54A バランスウエイト
54a ねじ部
55,55A 揺動部材
55a 雌ねじ部
56 リンク部材
57 電磁石
60 吸着パッド
60A 静電パッド
70 ガイドピン
72 水平シリンダ(位置決め用水平移動手段)
73 垂直シリンダ(垂直移動手段)
100 支持部材
101 筒状軸受け
102 昇降軸
200 気体供給手段
201,202 Oリング
203 気体供給口
204 多孔質ブッシュ
301 第1の磁石体
302 第2の磁石体
G Glass substrate for LCD (substrate to be processed)
22 Floating stage 23 Resist supply nozzle (Processing liquid supply means)
24 substrate holding member 25 guide rail 26 slider 27 linear motor (movement mechanism)
50, 50A, 50B, 50C, 50D, 50E, 50F, 50G Connecting means 51 Leaf spring member 52 Arm member 52a, 52b, 52c Hinge pin 53 Return spring (spring member)
54, 54A Balance weight 54a Screw part 55, 55A Oscillating member 55a Female thread part 56 Link member 57 Electromagnet 60 Adsorption pad 60A Electrostatic pad 70 Guide pin 72 Horizontal cylinder (horizontal moving means for positioning)
73 Vertical cylinder (vertical moving means)
DESCRIPTION OF SYMBOLS 100 Support member 101 Cylindrical bearing 102 Elevating shaft 200 Gas supply means 201,202 O-ring 203 Gas supply port 204 Porous bush 301 First magnet body 302 Second magnet body

Claims (5)

表面から気体を噴射又は噴射及び吸引して被処理基板を任意の高さに浮上させることができる浮上ステージと、
上記浮上ステージの上方に配置され、上記被処理基板の表面に処理液を帯状に供給する処理液供給手段と、
上記被処理基板の両側端をそれぞれ着脱可能に吸引保持する複数の基板保持部材と、
上記浮上ステージの両側に互いに平行に配置されるガイドレールに沿ってスライダを移動する移動機構と、
上記基板保持部材とスライダとを連結すると共に、上記被処理基板の浮上高さに追従して変位可能な連結手段と、を具備し、
上記連結手段は板ばね部材によって形成され、
上記板ばね部材が、被処理基板の移動方向に連続して複数の基板保持部材を保持する保持部と、切欠きを介して互いに間隔をおいて列設されて、上記保持部とスライダとを連結する可撓性を有する連結部とを具備する、ことを特徴とする浮上式基板搬送処理装置。
A levitation stage capable of levitation of a substrate to be processed to an arbitrary height by jetting or jetting and sucking gas from the surface;
A processing liquid supply means disposed above the levitation stage and supplying a processing liquid to the surface of the substrate to be processed in a strip shape;
A plurality of substrate holding members that detachably hold both side ends of the substrate to be processed;
A moving mechanism for moving the slider along guide rails arranged parallel to each other on both sides of the levitation stage;
A connecting means for connecting the substrate holding member and the slider, and displaceable following the flying height of the substrate to be processed;
The connecting means is formed by a leaf spring member,
The leaf spring members are arranged in a row at intervals from each other via a notch, a holding portion for holding a plurality of substrate holding members continuously in the moving direction of the substrate to be processed, and the holding portion and the slider are connected to each other. And a connecting portion having flexibility for connection.
表面から気体を噴射又は噴射及び吸引して被処理基板を任意の高さに浮上させることができる浮上ステージと、
上記浮上ステージの上方に配置され、上記被処理基板の表面に処理液を帯状に供給する処理液供給手段と、
上記被処理基板の両側端をそれぞれ着脱可能に吸引保持する複数の基板保持部材と、
上記浮上ステージの両側に互いに平行に配置されるガイドレールに沿ってスライダを移動する移動機構と、
上記基板保持部材とスライダとを連結すると共に、上記被処理基板の浮上高さに追従して変位可能な連結手段と、を具備し、
上記連結手段は、中間部がスライダに揺動自在に枢着される揺動部材における基板保持部側と反対側にバランスウェイトを具備し、
上記揺動部材の端部に、バランスウェイトを進退可能にねじ結合してなる、ことを特徴とする浮上式基板搬送処理装置。
A levitation stage capable of levitation of a substrate to be processed to an arbitrary height by jetting or jetting and sucking gas from the surface;
A processing liquid supply means disposed above the levitation stage and supplying a processing liquid to the surface of the substrate to be processed in a strip shape;
A plurality of substrate holding members that detachably hold both side ends of the substrate to be processed;
A moving mechanism for moving the slider along guide rails arranged parallel to each other on both sides of the levitation stage;
A connecting means for connecting the substrate holding member and the slider, and displaceable following the flying height of the substrate to be processed;
The connecting means comprises a balance weight on the side opposite to the substrate holding part side in the swinging member pivotally attached to the slider at the intermediate part,
A floating substrate transfer processing apparatus, wherein a balance weight is screwed to an end of the swing member so as to be able to advance and retreat.
表面から気体を噴射又は噴射及び吸引して被処理基板を任意の高さに浮上させることができる浮上ステージと、
上記浮上ステージの上方に配置され、上記被処理基板の表面に処理液を帯状に供給する処理液供給手段と、
上記被処理基板の両側端をそれぞれ着脱可能に吸引保持する複数の基板保持部材と、
上記浮上ステージの両側に互いに平行に配置されるガイドレールに沿ってスライダを移動する移動機構と、
上記基板保持部材とスライダとを連結すると共に、上記被処理基板の浮上高さに追従して変位可能な連結手段と、を具備し、
上記連結手段は、スライダに揺動自在に枢着される略ベルクランク状のリンク部材によって形成されると共に、このリンク部材の垂直片と上記スライダの対向面に、励磁によって基板保持部材の吸着保持力より小さい反発力を生ずる電磁石を具備してなる、ことを特徴とする浮上式基板搬送処理装置。
A levitation stage capable of levitation of a substrate to be processed to an arbitrary height by jetting or jetting and sucking gas from the surface;
A processing liquid supply means disposed above the levitation stage and supplying a processing liquid to the surface of the substrate to be processed in a strip shape;
A plurality of substrate holding members that detachably hold both side ends of the substrate to be processed;
A moving mechanism for moving the slider along guide rails arranged parallel to each other on both sides of the levitation stage;
A connecting means for connecting the substrate holding member and the slider, and displaceable following the flying height of the substrate to be processed;
The connecting means is formed by a substantially bell crank-shaped link member pivotably attached to the slider, and the substrate holding member is attracted and held by excitation between the vertical piece of the link member and the opposing surface of the slider. A floating substrate transfer processing apparatus comprising an electromagnet that generates a repulsive force smaller than a force.
請求項1ないしのいずれかに記載の浮上式基板搬送処理装置において、
上記スライダに連結され、上記被処理基板の移動方向の前後端縁に係脱すべく垂直移動可能なガイドピンと、上記ガイドピンを垂直方向に移動する垂直移動手段と、上記ガイドピン及び垂直移動手段を水平方向に移動する位置決め用水平移動手段とを更に具備する、ことを特徴とする浮上式基板搬送処理装置。
In the floating type substrate transfer processing apparatus according to any one of claims 1 to 3 ,
A guide pin connected to the slider and vertically movable to be engaged with and disengaged from the front and rear edges in the moving direction of the substrate to be processed, vertical moving means for moving the guide pin in the vertical direction, and the guide pin and the vertical moving means A floating substrate transfer processing apparatus, further comprising a horizontal moving means for positioning that moves in a horizontal direction.
請求項記載の浮上式基板搬送処理装置において、
上記ガイドピンの中間部に基板を支持する支持ピンを突設してなる、ことを特徴とする浮上式基板搬送処理装置。
In the floating type substrate transfer processing apparatus according to claim 4 ,
A levitation-type substrate transport processing apparatus, wherein a support pin for supporting a substrate protrudes from an intermediate portion of the guide pin.
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