JP6804155B2 - Board floating transfer device - Google Patents

Board floating transfer device Download PDF

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JP6804155B2
JP6804155B2 JP2017047054A JP2017047054A JP6804155B2 JP 6804155 B2 JP6804155 B2 JP 6804155B2 JP 2017047054 A JP2017047054 A JP 2017047054A JP 2017047054 A JP2017047054 A JP 2017047054A JP 6804155 B2 JP6804155 B2 JP 6804155B2
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substrate
support
accommodating
transport direction
levitation
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JP2018152447A (en
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貫志 岡本
貫志 岡本
健史 濱川
健史 濱川
森 俊裕
俊裕 森
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Toray Engineering Co Ltd
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Description

本発明は、基板を浮上させながら搬送する基板浮上搬送装置に関するものであり、特に、塗布ムラが形成されるのを抑えることができる基板浮上搬送装置に関するものである。 The present invention relates to a substrate floating transport device that transports a substrate while floating it, and more particularly to a substrate floating transport device that can suppress the formation of coating unevenness.

液晶ディスプレイやプラズマディスプレイ等のフラットパネルディスプレイには、基板上にレジスト液が塗布されたもの(塗布基板と称す)が使用されている。この塗布基板は、基板搬送装置で基板を搬送しつつ塗布装置により基板上にレジスト液が均一に塗布されることによって塗布膜が形成される。その後、さらに基板搬送装置により搬送され、乾燥装置等により塗布膜が乾燥されることにより生産される。 For flat panel displays such as liquid crystal displays and plasma displays, those in which a resist solution is coated on a substrate (referred to as a coated substrate) are used. A coating film is formed on this coated substrate by uniformly coating the resist liquid on the substrate by the coating device while transporting the substrate by the substrate transporting device. After that, it is further conveyed by a substrate transfer device, and is produced by drying the coating film by a drying device or the like.

最近の基板搬送装置では、塗布基板Wの裏面(塗布面と反対側)の損傷を回避するため、エア浮上や超音波浮上等、基板Wを浮上させながら基板Wを搬送させる基板浮上搬送装置が使用されている。この基板浮上搬送装置は、図12に示すように、基板Wを浮上させる浮上ステージ部100と、浮上した状態の基板Wを吸着して保持する基板保持ユニット102と、基板保持ユニット102を基板Wの搬送方向に移動させる搬送駆動部103とを有しており、搬送駆動部103を駆動させて基板保持ユニット102を移動させることにより、基板Wが浮上ステージ部100上を浮上した状態で搬送方向に搬送されるようになっている。 In recent substrate transfer devices, in order to avoid damage to the back surface of the coated substrate W (the side opposite to the coated surface), a substrate floating transfer device that transports the substrate W while floating the substrate W, such as air levitation or ultrasonic levitation, is used. in use. As shown in FIG. 12, this substrate levitation transport device has a levitation stage portion 100 for levitation of the substrate W, a substrate holding unit 102 for sucking and holding the floating substrate W, and a substrate holding unit 102 for the substrate W. It has a transport drive unit 103 that moves the substrate W in the transport direction, and by driving the transport drive unit 103 to move the substrate holding unit 102, the substrate W floats on the levitation stage unit 100 in the transport direction. It is designed to be transported to.

搬送される基板Wは、搬送途中に設けられた基板処理部(例えば塗布処理部)110で所定の処理が行われる。この基板処理部110で精度よく処理を行うためには、基板Wの姿勢を水平に保持する必要がある。そのため、基板保持ユニット102では、基板Wが水平な姿勢を維持した状態に保持できるように形成されている。具体的には、図13に示すように、基板保持ユニット102は、搬送方向に沿って配列される複数の基板支持部104を有しており、この基板支持部104により基板Wの下面を吸着して保持できるように形成されている。 The substrate W to be conveyed is subjected to a predetermined process by a substrate processing unit (for example, a coating processing unit) 110 provided during the transfer. In order for the substrate processing unit 110 to perform processing with high accuracy, it is necessary to hold the posture of the substrate W horizontally. Therefore, the substrate holding unit 102 is formed so that the substrate W can be held in a state of maintaining a horizontal posture. Specifically, as shown in FIG. 13, the substrate holding unit 102 has a plurality of substrate support portions 104 arranged along the transport direction, and the substrate support portion 104 attracts the lower surface of the substrate W. It is formed so that it can be held.

この基板支持部104は、図13,図14(a)に示すように、基板Wの下面に当接する支持基準面部104aを有しており、それぞれの支持基準面部104aが基準高さ位置に設定されている。そして、支持基準面部104aには、図14(b)に示すように、支持基準面部104aに開口する収容部105が複数配列されて設けられており、これらの収容部105に基板Wを吸引して吸着するための基板吸着部106が収容されている。この基板吸着部106は、その先端部が伸縮性のあるゴム部材で形成された吸着パッド107(図15参照)を有しており、この吸着パッド107に吸引力が発生するように形成されている。そして、図13(b)に示すように、基板保持ユニット102を上昇させて吸着パッド107が浮上した基板Wの下面に当接した状態で吸引力を発生させると、吸着パッド107が収容部105側に収縮することにより、基板Wが基板吸着部106側に引っ張られ、基板Wの下面が支持基準面部104aに当接するようになっている。これにより、基板Wの下面がすべての基板支持部104の支持基準面部104aに当接し、基板W全体が設定された高さ位置に保持されるようになっている。この状態で搬送駆動部103が搬送方向に移動することにより、浮上ステージ部100上に浮上した基板Wは、全体が水平な姿勢を維持しつつ搬送方向に搬送されるようになっている。 As shown in FIGS. 13 and 14 (a), the substrate support portion 104 has a support reference surface portion 104a that abuts on the lower surface of the substrate W, and each support reference surface portion 104a is set at a reference height position. Has been done. Then, as shown in FIG. 14B, the support reference surface portion 104a is provided with a plurality of accommodating portions 105 that open to the support reference surface portion 104a, and the substrate W is attracted to these accommodating portions 105. A substrate suction unit 106 for suction is housed. The substrate suction portion 106 has a suction pad 107 (see FIG. 15) whose tip portion is formed of an elastic rubber member, and the suction pad 107 is formed so as to generate a suction force. There is. Then, as shown in FIG. 13B, when the substrate holding unit 102 is raised to generate a suction force in a state where the suction pad 107 is in contact with the lower surface of the surfaced substrate W, the suction pad 107 is moved to the accommodating portion 105. By contracting to the side, the substrate W is pulled toward the substrate suction portion 106, and the lower surface of the substrate W comes into contact with the support reference surface portion 104a. As a result, the lower surface of the substrate W comes into contact with the support reference surface portions 104a of all the substrate support portions 104, and the entire substrate W is held at a set height position. By moving the transfer drive unit 103 in the transfer direction in this state, the substrate W that has floated on the levitation stage unit 100 is conveyed in the transfer direction while maintaining a horizontal posture as a whole.

特開2011−213435号公報Japanese Unexamined Patent Publication No. 2011-21435

しかし、上記基板浮上搬送装置では、保持された基板Wの平坦度を均一にすることが困難であるという問題があった。上述したように、上記基板浮上搬送装置では、基板Wが基板吸着部106で吸引されることにより、基板Wの一部が収容部105に引き込まれ僅かに変形する。すなわち、図15に示すように、基板Wが収容部105に引き込まれることにより、収容部105を形成する縁部108(図14(b)参照)に基板Wの下面が当接し(図15における1点鎖線部分)、収容部105から離れるにしたがって支持基準面部104aから離れるように(浮き上がるように)変形する。特に、搬送方向最端部に位置する収容部105aは、搬送方向一方側のみ他の収容部105が存在し、他方側には収容部105が存在しないため、他方側における基板Wの変形量が大きくなる。そのため、搬送方向最端部に位置する収容部105aでは、搬送方向両隣に収容部105が存在する収容部105に比べて、吸着による基板Wの変形量が大きくなり、特に搬送方向最端部に位置する収容部105aで基板Wの平坦度が損なわれる傾向が顕著であった。 However, the substrate floating transfer device has a problem that it is difficult to make the flatness of the held substrate W uniform. As described above, in the substrate floating transfer device, the substrate W is sucked by the substrate suction portion 106, so that a part of the substrate W is drawn into the accommodating portion 105 and is slightly deformed. That is, as shown in FIG. 15, when the substrate W is pulled into the accommodating portion 105, the lower surface of the substrate W comes into contact with the edge portion 108 (see FIG. 14B) forming the accommodating portion 105 (in FIG. 15). The one-dot chain line portion) is deformed so as to be separated from the support reference surface portion 104a (to be lifted) as the distance from the accommodating portion 105 is increased. In particular, the accommodating portion 105a located at the end end in the transport direction has the other accommodating portion 105 on only one side in the transport direction and no accommodating portion 105 on the other side, so that the amount of deformation of the substrate W on the other side is large. growing. Therefore, in the accommodating portion 105a located at the endmost portion in the transport direction, the amount of deformation of the substrate W due to adsorption is larger than that in the accommodating portion 105 in which the accommodating portions 105 are present on both sides in the transport direction, and particularly at the end end portion in the transport direction. There was a remarkable tendency for the flatness of the substrate W to be impaired at the position of the accommodating portion 105a.

そこで、本発明は、浮上した基板を吸着して保持しても、基板の平坦度が損なわれるのを抑えることができる基板浮上搬送装置を提供することを目的としている。 Therefore, an object of the present invention is to provide a substrate floating transfer device capable of suppressing the flatness of the substrate from being impaired even if the floating substrate is adsorbed and held.

上記課題を解決するために本発明の基板浮上搬送装置は、基板を浮上させる浮上ステージ部と、前記浮上ステージ部上に浮上された基板を保持する基板保持ユニットと、を備え、前記基板保持ユニットを搬送方向に移動させることにより前記浮上ステージ部上の基板を浮上させた状態で搬送する基板浮上搬送装置であって、前記基板保持ユニットは、浮上している基板の下面に当接することにより基板を所定高さ位置に保持する基板支持部を有しており、この基板支持部は、基板の下面に当接し基準高さ位置に設けられた支持基準面部と、この支持基準面部に開口する収容部と、この収容部に設けられ基板の下面を吸着する基板吸着部とを有しており、前記基板吸着部により基板の下面が吸着されると基板の下面が前記支持基準面部に当接して基板が所定高さ位置に保持されるように形成されており、前記支持基準面部は、前記基板支持部の搬送方向最端部に位置する前記収容部の縁部のうち、少なくとも搬送方向端部側に、基準高さ位置よりも低く形成された切欠部が形成されており、前記収容部は、搬送方向に複数配列されて設けられており、前記切欠部は、前記収容部間側の縁部に形成され、前記切欠部は、隣り合う収容部に形成された切欠部と連結して形成されていることを特徴としている。 In order to solve the above problems, the substrate levitation transport device of the present invention includes a levitation stage portion for levitation of the substrate and a substrate holding unit for holding the substrate floated on the levitation stage portion. Is a substrate levitation transport device that transports a substrate on the levitation stage portion in a floating state by moving the substrate in the transport direction, and the substrate holding unit abuts on the lower surface of the levitation substrate to convey the substrate. Has a substrate support portion that holds the substrate at a predetermined height position, and the substrate support portion has a support reference surface portion that abuts on the lower surface of the substrate and is provided at a reference height position, and a housing that opens to the support reference surface portion. It has a portion and a substrate adsorption portion provided in the accommodating portion to attract the lower surface of the substrate, and when the lower surface of the substrate is attracted by the substrate adsorption portion, the lower surface of the substrate comes into contact with the support reference surface portion. The substrate is formed so as to be held at a predetermined height position, and the support reference surface portion is at least an end portion in the transport direction of the edge portion of the accommodating portion located at the end portion in the transport direction of the substrate support portion. A notch formed lower than the reference height position is formed on the side, and a plurality of the accommodating portions are arranged in the transport direction, and the notch portion is an edge on the side between the accommodating portions. The notch is formed in a portion, and the notch is characterized in that it is formed in connection with a notch formed in an adjacent accommodating portion .

本発明によれば、基板支持部の搬送方向最端部に位置する収容部の縁部のうち、少なくとも搬送方向端部側に切欠部が形成されているため、吸着による基板の変形量を抑えることができる。すなわち、収容部の基板吸着部により吸引力が発生すると、基板が収容部内に引き込まれ、基板の下面が収容部の縁部に当接して変形するが、搬送方向最端部側に位置する収容部の搬送方向端部側には切欠部が形成されているため、支持基準面部の基準高さ位置よりも低く形成されている。そのため、収容部に引き込まれて変形する基板の下面に当接する縁部が存在しなくなり、基板の変形を抑えることができる。すなわち、従来のように切欠部が形成されていない場合には、搬送方向最端部に位置する収容部の搬送方向端部側(隣接する収容部がない側)で縁部に当接する基板が最も大きく変形するが、搬送方向端部側に切欠部が形成されていることにより、収容部内に引き込まれて縁部に当接することによる基板の変形を抑えることができ、浮上した基板を吸着して保持しても、基板の平坦度が損なわれるのを抑えることができる。また、縁部のうち、搬送方向端部側だけでなく、収容部間側にも切欠部が設けられるため、収容部に吸引された基板の裏面が当接するのを回避することができ、基板の平坦度が損なわれるのを抑えることができる。 According to the present invention, among the edges of the accommodating portion located at the end of the substrate support in the transport direction, a notch is formed at least on the end side in the transport direction, so that the amount of deformation of the substrate due to adsorption is suppressed. be able to. That is, when a suction force is generated by the substrate suction portion of the accommodating portion, the substrate is pulled into the accommodating portion, and the lower surface of the substrate abuts on the edge portion of the accommodating portion to be deformed, but the accommodating portion is located on the end side in the transport direction. Since a notch is formed on the end side in the transport direction of the portion, it is formed lower than the reference height position of the support reference surface portion. Therefore, there is no edge portion that comes into contact with the lower surface of the substrate that is drawn into the accommodating portion and deforms, and the deformation of the substrate can be suppressed. That is, when the notch is not formed as in the conventional case, the substrate that comes into contact with the edge portion on the transport direction end side (the side without the adjacent accommodating portion) of the accommodating portion located at the end end in the transport direction Although it deforms the most, the notch is formed on the end side in the transport direction, so that the deformation of the substrate due to being drawn into the accommodating portion and contacting the edge can be suppressed, and the floating substrate is adsorbed. It is possible to prevent the flatness of the substrate from being impaired even if the substrate is held. Further, since the notch is provided not only on the end side in the transport direction but also on the inter-accommodation side of the edge portion, it is possible to prevent the back surface of the substrate sucked into the accommodating portion from coming into contact with the substrate. It is possible to suppress the loss of flatness.

また、前記収容部の縁部は円形を有しており、前記切欠部は、搬送方向最端部に位置する前記収容部の縁部のうち、前記基板支持部の搬送方向端部に最も近い部分に形成されている構成にしてもよい。 Further, the edge portion of the housing portion has a circular shape, and the notch portion is the closest to the transport direction end portion of the substrate support portion among the edge portions of the housing portion located at the end end portion in the transport direction. The configuration may be formed in a portion.

この構成によれば、基板が収容部に吸引されると、縁部のうち、搬送方向端部に最も近い部分に基板の裏面が当接して基板の変形量が大きくなるため、この部分に切欠部を設けることにより基板が当接するのを回避でき、基板の平坦度が損なわれるのを抑えることができる。 According to this configuration, when the substrate is sucked into the accommodating portion, the back surface of the substrate abuts on the portion of the edge portion closest to the end portion in the transport direction, and the amount of deformation of the substrate increases. By providing the portion, it is possible to prevent the substrates from coming into contact with each other, and it is possible to prevent the flatness of the substrate from being impaired.

また、前記切欠部は、前記搬送方向最端部に位置する前記収容部の縁部のうち、前記基板支持部の搬送方向端部側の全体領域に亘って形成されている構成にしてもよい。 Further, the notch may be formed over the entire region of the substrate support portion on the transport direction end side of the edge portion of the accommodating portion located at the transport direction end end. ..

この構成によれば、切欠部は、搬送方向最端部に位置する収容部の縁部のうち、搬送方向端部側の全体領域に亘って形成されていることにより、切欠部が縁部の一部に設けられている場合に比べて、基板支持部の搬送方向端部側における基板の変形量をより効果的に抑えることができる。 According to this configuration, the cutout portion is formed over the entire area of the edge portion of the accommodating portion located at the end end portion in the transport direction on the end portion side in the transport direction, so that the notch portion is formed on the edge portion. The amount of deformation of the substrate on the transport direction end side of the substrate support portion can be suppressed more effectively than when the substrate is partially provided.

また、前記切欠部は、前記収容部の縁部から前記基板支持部の端部まで延びて形成されている構成にしてもよい。 Further, the notch portion may be formed so as to extend from the edge portion of the accommodating portion to the end portion of the substrate support portion.

この構成によれば、前記搬送方向最端部に位置する前記収容部の縁部から基板支持部の端部に亘って切欠部が形成されるため、収容部に吸引された基板の裏面が支持基準面部(収容部の縁部を含む)に当接するのを回避することができ、当接する基板の搬送方向端部に位置する基板の変形量を抑えることができる。 According to this configuration, a notch is formed from the edge of the accommodating portion located at the end end in the transport direction to the end of the substrate support portion, so that the back surface of the substrate sucked into the accommodating portion is supported. It is possible to avoid contacting the reference surface portion (including the edge portion of the accommodating portion), and it is possible to suppress the amount of deformation of the substrate located at the end portion of the contacting substrate in the transport direction.

また、前記基板吸着部は、基板の裏面に吸着する先端部が伸縮性を有しており、その先端部は、基板がない状態では支持基準面部から突出し、基板が載置された状態では、基板の下面を吸着しつつ収縮することにより基板の下面が支持基準面部に当接するように形成されており、前記先端部が完全に収縮した状態では、先端部の高さ位置が支持基準面部の高さ位置に設定されている構成にしてもよい。 Further, in the substrate suction portion, the tip portion that is attracted to the back surface of the substrate has elasticity, and the tip portion protrudes from the support reference surface portion when there is no substrate, and when the substrate is placed, the tip portion protrudes from the support reference surface portion. The lower surface of the substrate is formed to come into contact with the support reference surface portion by shrinking while adsorbing the lower surface of the substrate, and when the tip portion is completely contracted, the height position of the tip portion is the support reference surface portion. The configuration may be set at the height position.

この構成によれば、吸着部が完全に収縮した状態では、先端部の高さ位置が支持基準面部の高さ位置に設定されているため、基板が収容部に引き込まれても基板の高さ位置を支持基準面に維持することができる。よって、浮上した基板を吸着して保持しても基板の平坦度が損なわれるのを抑えることができる。 According to this configuration, when the suction portion is completely contracted, the height position of the tip portion is set to the height position of the support reference surface portion, so that the height of the substrate is set even if the substrate is pulled into the accommodating portion. The position can be maintained on the support reference plane. Therefore, it is possible to prevent the flatness of the substrate from being impaired even if the floating substrate is attracted and held.

また、前記切欠部に、吸引力を発生させるように形成されている構成にしてもよい。 Further, the notch may be formed so as to generate a suction force .

この構成によれば、基板の浮き上がりを抑えることができる。すなわち、収容部に吸引力が発生すると、基板のうち、収容部に対応する部分は収容部に吸引されて支持基準面部の高さ位置に保持される。一方、切欠部では、基板の下面が当接するのを回避できるが、収容部から離れるに従って、基板が支持基準面部の高さ位置よりも高く浮き上がるが、切欠部に吸引力を発生することにより、基板の浮き上がりを抑えることができる。 According to this configuration, the floating of the substrate can be suppressed. That is, when a suction force is generated in the accommodating portion, the portion of the substrate corresponding to the accommodating portion is attracted by the accommodating portion and held at the height position of the support reference surface portion. On the other hand, in the notch portion, it is possible to avoid contact with the lower surface of the substrate, but as the distance from the accommodating portion increases, the substrate rises higher than the height position of the support reference surface portion, but by generating an attractive force in the notch portion It is possible to suppress the lifting of the substrate.

また、前記切欠部上には、前記支持基準面部と同じ高さ位置の多孔質部材が設けられており、多孔質部材に吸引力が発生するように形成されている構成にしてもよい。 Further, a porous member at the same height as the support reference surface portion may be provided on the notch portion, and the porous member may be formed so as to generate an attractive force.

この構成によれば、収容部に吸引力を発生させて基板が収容部に引き込まれ基板が浮き上がった場合でも、切欠部に設けられた多孔質部材の吸引力により基板が吸引され、この多孔質部材が支持基準面部と同じ高さ位置に設定されているため、吸引された基板が支持基準面部と同じ高さ位置に保持される。したがって、浮上した基板を吸着して保持しても基板の平坦度が損なわれるのを抑えることができる。 According to this configuration, even when the substrate is pulled into the accommodating portion by generating an attractive force in the accommodating portion and the substrate is lifted, the substrate is attracted by the attractive force of the porous member provided in the notch portion, and this porous portion is formed. Since the member is set at the same height position as the support reference surface portion, the sucked substrate is held at the same height position as the support reference surface portion. Therefore, it is possible to prevent the flatness of the substrate from being impaired even if the floating substrate is attracted and held.

本発明によれば、浮上した基板を吸着して保持しても、基板の平坦度が損なわれるのを抑えることができる。 According to the present invention, even if the floating substrate is adsorbed and held, the flatness of the substrate can be suppressed from being impaired.

本発明の一実施形態における基板浮上搬送装置と組み合わされる塗布装置を概略的に示す斜視図である。It is a perspective view which shows typically the coating apparatus which is combined with the substrate floating transfer apparatus in one Embodiment of this invention. 塗布装置と組み合わされた上記基板浮上搬送装置を搬送方向に見た図である。It is a figure which looked at the said substrate floating transfer apparatus combined with the coating apparatus in the transfer direction. 上記基板浮上搬送装置において、浮上した基板を保持した状態をX軸方向に見た図である。It is a figure which looked at the state which held the floating substrate in the said substrate floating transfer apparatus in the X-axis direction. 上記基板浮上搬送装置の基板保持ユニットをY軸方向に見た図である。It is a figure which looked at the substrate holding unit of the said substrate floating transfer apparatus in the Y-axis direction. 上記基板浮上搬送装置の基板支持部を示す図であり、(a)は、上方から見た図、(b)は(a)におけるA−A断面図、(c)は、基板を吸着した状態を示す図である。It is a figure which shows the substrate support part of the substrate buoyant transfer apparatus, (a) is a view seen from above, (b) is a sectional view of AA in (a), (c) is a state where a substrate is adsorbed. It is a figure which shows. 上記基板浮上搬送装置の基板保持部の吸着パッドを示す図であり、(a)は吸着する前の状態を示す図であり、(b)は吸着した状態を示す図である。It is a figure which shows the suction pad of the substrate holding part of the substrate floating transfer apparatus, (a) is a figure which shows the state before suction, and (b) is the figure which shows the state which sucked. 上記基板浮上搬送装置の基板支持部を示す図であり、(a)は基板を吸着した状態を示す図、(b)従来の基板支持部において基板を吸着した状態を示す図である。It is a figure which shows the substrate support part of the substrate floating transfer apparatus, (a) is the figure which shows the state which sucked a substrate, (b) is the figure which shows the state which sucked a substrate in the conventional board support part. 上記基板浮上搬送装置の基板支持部を示す図であり、(a)は切欠部を搬送方向最端部の収容部において、基板支持部の端部に最も近い縁部に部分的に設けた例を示す図、(b)は(a)の切欠部が基板支持部の端部まで延びている形状を示す図、(c)は切欠部を搬送方向最端部の収容部において、搬送方向端部側の全体領域に亘って設けた例を示す図、(d)は切欠部を収容部間側に位置する縁部の一部に設ける例を示す図、(e)は切欠部を支持基準面部全体に亘って設けた例を示す図である。It is a figure which shows the substrate support part of the said substrate floating transfer apparatus, (a) is the example which provided the cutout part in the edge part which is closest to the end part of the substrate support part in the accommodation part of the end part in the transport direction. (B) is a diagram showing a shape in which the notch portion of (a) extends to the end portion of the substrate support portion, and (c) is a diagram showing the notch portion in the accommodation portion at the end end portion in the transport direction. The figure which shows the example which provided over the whole area of the part side, (d) is the figure which shows the example which provided the cutout part in a part of the edge part located on the side between accommodating parts, (e) is the figure which supports the cutout part It is a figure which shows the example provided over the whole surface part. 切欠部に溝を形成した例を示す図であり、(a)は、基板支持部を上方から見た図、(b)は(a)のB−B断面図である。It is a figure which shows the example which formed the groove in the cutout part, (a) is the view which looked at the substrate support part from above, (b) is the BB sectional view of (a). 切欠部に多孔質部材を設けた例を示す図であり、(a)基板支持部を上方から見た図、(b)は(a)のB−B断面図である。It is a figure which shows the example which provided the porous member in the cutout part, (a) is the view which looked at the substrate support part from above, (b) is the BB sectional view of (a). 切欠部の形状を示す図であり、(a)は切欠部がテーパ状に形成された図、(b)は切欠部が曲線状に形成された図である。It is a figure which shows the shape of the notch part, (a) is the figure which the notch part was formed in a taper shape, (b) is the figure which the notch part was formed in a curved shape. 従来の基板浮上搬送装置の一実施形態を示す概略的な斜視図である。It is a schematic perspective view which shows one Embodiment of the conventional substrate floating transfer apparatus. 従来の基板保持ユニットをY軸方向に見た図であり、(a)は、基板を保持していない高さ位置に下降した状態を示す図であり、(b)は、基板を保持する高さ位置に上昇した状態を示す図である。It is the figure which looked at the conventional board holding unit in the Y-axis direction, (a) is the figure which shows the state which lowered to the height position which does not hold a board, (b) is the figure which holds the board. It is a figure which shows the state which ascended to the position. 従来の基板支持部を示す図であり、(a)はY軸方向から見た図、(b)は上方から見た図である。It is a figure which shows the conventional substrate support part, (a) is a view seen from the Y-axis direction, (b) is a view seen from above. 従来の基板支持部の断面図である。It is sectional drawing of the conventional substrate support part.

以下、本発明の基板浮上搬送装置に係る実施の形態について図面を用いて説明する。 Hereinafter, embodiments of the substrate floating transfer device of the present invention will be described with reference to the drawings.

図1は、本発明の基板浮上搬送装置1と組み合わされる塗布装置2を概略的に示す斜視図であり、図2は、図1における基板浮上搬送装置1と組み合わされる塗布装置2の正面図である。なお、本実施形態では、塗布装置2と組み合わせた例について説明するが、浮上する基板を処理する基板処理装置であれば、塗布装置2以外でも適用することができる。 FIG. 1 is a perspective view schematically showing a coating device 2 combined with the substrate floating transfer device 1 of the present invention, and FIG. 2 is a front view of the coating device 2 combined with the substrate floating transfer device 1 in FIG. is there. In this embodiment, an example in combination with the coating device 2 will be described, but any substrate processing device that processes a floating substrate can be applied to other than the coating device 2.

図1、図2において、基板Wを搬送させる基板浮上搬送装置1は、搬送される基板Wに塗布膜を形成する塗布装置2の塗布ユニット21と組み合わされており、一連の基板処理装置を形成している。この基板浮上搬送装置1は、一方向に延びる浮上ステージ部10を有しており、この浮上ステージ部10の延びる方向に沿って基板Wが搬送される。図1の例では、浮上ステージ部10は、X軸方向に延びて形成されており、基板WがX軸方向に上流側(前工程側)から下流側(後工程側)に搬送されるようになっている。そして、塗布ユニット21から塗布液を吐出することにより、基板W上に塗布膜が形成される。 In FIGS. 1 and 2, the substrate floating transfer device 1 that conveys the substrate W is combined with the coating unit 21 of the coating device 2 that forms a coating film on the transferred substrate W to form a series of substrate processing devices. doing. The substrate floating transfer device 1 has a floating stage portion 10 extending in one direction, and the substrate W is conveyed along the extending direction of the floating stage portion 10. In the example of FIG. 1, the levitation stage portion 10 is formed so as to extend in the X-axis direction, so that the substrate W is conveyed from the upstream side (pre-process side) to the downstream side (post-process side) in the X-axis direction. It has become. Then, the coating film is formed on the substrate W by discharging the coating liquid from the coating unit 21.

具体的には、基板Wが浮上ステージ部10に浮上された状態でX軸方向に搬送されつつ、塗布ユニット21から塗布液が吐出されることにより、基板W上に均一厚さの塗布膜が形成されるようになっている。 Specifically, the coating liquid is discharged from the coating unit 21 while the substrate W is transported in the X-axis direction while being floated on the levitation stage portion 10, so that a coating film having a uniform thickness is formed on the substrate W. It is supposed to be formed.

以下の説明では、基板Wが搬送される方向をX軸方向とし、X軸方向が搬送方向に相当する。また、X軸方向と水平面上で直交する方向をY軸方向とし、特にY軸方向を川幅方向ともいう。そして、X軸方向及びY軸方向の双方に直交する方向をZ軸方向として説明を進めることとする。 In the following description, the direction in which the substrate W is conveyed is the X-axis direction, and the X-axis direction corresponds to the transfer direction. Further, the direction orthogonal to the X-axis direction on the horizontal plane is referred to as the Y-axis direction, and particularly the Y-axis direction is also referred to as the river width direction. Then, the direction orthogonal to both the X-axis direction and the Y-axis direction will be referred to as the Z-axis direction.

塗布ユニット21は、基板Wに塗布液を塗布するものであり、フレーム部22と塗布器23とを有している。フレーム部22は、浮上ステージ部10のY軸方向両側にそれぞれ配置される支柱22aを有しており、この支柱22aに塗布器23が設けられている。具体的には、支柱22aは、Y軸方向(川幅方向)両側に固定して設けられており、後述する基板保持部30の走行を妨げることのないように、基板保持部30の走行経路よりも外側に配置されている。そして、これらの支柱22aに塗布器23が架け渡されており、塗布器23が浮上ステージ部10を横切る状態で取り付けられている。また、支柱22aには昇降機構が設けられており、昇降機構を作動させることにより塗布器23がZ方向に移動できるようになっている。すなわち、昇降機構により塗布器23が浮上ステージ部10に対して接離動作できるようになっている。 The coating unit 21 coats the coating liquid on the substrate W, and has a frame portion 22 and a coating device 23. The frame portion 22 has columns 22a arranged on both sides of the levitation stage portion 10 in the Y-axis direction, and the applicator 23 is provided on the columns 22a. Specifically, the columns 22a are fixedly provided on both sides in the Y-axis direction (river width direction), and are provided from the traveling path of the substrate holding portion 30 so as not to interfere with the traveling of the substrate holding portion 30 described later. Is also located on the outside. Then, the applicator 23 is bridged over these columns 22a, and the applicator 23 is attached in a state of crossing the levitation stage portion 10. Further, the support column 22a is provided with an elevating mechanism, and the applicator 23 can be moved in the Z direction by operating the elevating mechanism. That is, the elevating mechanism enables the applicator 23 to move in and out of the levitation stage portion 10.

塗布器23は、塗布液を吐出するものであり、一方向に延びて形成されている。この塗布器23は、一方向に延びるスリットノズル23a(図2参照)が形成されており、塗布器23内に貯留された塗布液をスリットノズル23aから吐出できるようになっている。具体的には、スリットノズル23aは、浮上ステージ部10と対向する面に形成されており、塗布器23はスリットノズル23aが川幅方向に延びる状態で設置されている。そして、搬送される基板Wに対して塗布器23を昇降させて基板Wとスリットノズル23aとの距離を所定の距離に合わせた状態で、スリットノズル23aから塗布液を吐出することにより、川幅方向に一様な塗布膜が搬送方向に連続的に形成されるようになっている。そして、スリットノズル23aから塗布液を吐出させつつ、基板Wを移動させることにより、基板W上には、均一厚さの塗布膜が形成されるようになっている。 The coating device 23 discharges the coating liquid, and is formed so as to extend in one direction. The coating device 23 is formed with a slit nozzle 23a (see FIG. 2) extending in one direction, so that the coating liquid stored in the coating device 23 can be discharged from the slit nozzle 23a. Specifically, the slit nozzle 23a is formed on a surface facing the levitation stage portion 10, and the applicator 23 is installed with the slit nozzle 23a extending in the river width direction. Then, the coating device 23 is moved up and down with respect to the substrate W to be conveyed, and the coating liquid is discharged from the slit nozzle 23a in a state where the distance between the substrate W and the slit nozzle 23a is adjusted to a predetermined distance in the river width direction. A uniform coating film is continuously formed in the transport direction. Then, by moving the substrate W while discharging the coating liquid from the slit nozzle 23a, a coating film having a uniform thickness is formed on the substrate W.

また、基板浮上搬送装置1は、基板Wを浮上させつつ、一方向(本実施形態ではX軸方向)に搬送させるものである。基板浮上搬送装置1は、基板Wを浮上させる浮上ステージ部10と、浮上ステージ部10に浮上させた基板Wを保持し搬送させる基板搬送ユニット3とを有している。 Further, the substrate floating transport device 1 transports the substrate W in one direction (in the X-axis direction in the present embodiment) while floating the substrate W. The substrate levitation transport device 1 has a levitation stage portion 10 for levitation of the substrate W and a substrate transport unit 3 for holding and transporting the levitation substrate W on the levitation stage portion 10.

浮上ステージ部10は、基板Wを浮上させるものであり、本実施形態ではエア浮上機構を有している。浮上ステージ部10は、基台11上に平板部12が設けられて形成されており、複数枚の平板部12がX軸方向に沿って配列されて形成されている。すなわち、平板部12は、平滑な基板浮上面12a(図3参照)を有しており、それぞれの基板浮上面12aが均一高さになるように配列されている。そして、基板浮上面12aには、搬送させる基板Wとの間に空気層が形成されることにより基板Wを所定高さ位置に浮上させることができるようになっている。具体的には、平板部12には、基板浮上面12aに開口する微小な噴出口(不図示)と吸引口(不図示)とが形成されており、噴出口とコンプレッサとが配管で接続され、吸引口と真空ポンプとが配管で接続されている。そして、噴出口から噴出されるエアと吸引口に発生する吸引力とをバランスさせることにより、基板Wが基板浮上面12aから所定高さに水平の姿勢で浮上させることができるようになっている。これにより、基板Wの平面姿勢(平面度という)を高精度に維持した状態で搬送できるようになっている。 The levitation stage portion 10 floats the substrate W, and has an air levitation mechanism in the present embodiment. The levitation stage portion 10 is formed by providing a flat plate portion 12 on the base 11, and a plurality of flat plate portions 12 are arranged and formed along the X-axis direction. That is, the flat plate portion 12 has a smooth substrate floating top surface 12a (see FIG. 3), and the respective substrate floating top surfaces 12a are arranged so as to have a uniform height. Then, the substrate W can be levitated to a predetermined height position by forming an air layer on the substrate floating upper surface 12a with the substrate W to be conveyed. Specifically, the flat plate portion 12 is formed with a minute spout (not shown) and a suction port (not shown) that open in the floating upper surface 12a of the substrate, and the spout and the compressor are connected by piping. , The suction port and the vacuum pump are connected by piping. Then, by balancing the air ejected from the ejection port and the suction force generated in the suction port, the substrate W can be levitated from the substrate floating upper surface 12a in a horizontal posture to a predetermined height. .. As a result, the substrate W can be conveyed while maintaining a flat posture (referred to as flatness) with high accuracy.

また、浮上ステージ部10の平板部12は、そのY軸方向寸法が搬送される基板WのY軸方向寸法よりも小さく形成されており、基板浮上面12a上に基板Wを載置すると、基板浮上面12aから基板WのY軸方向端部がはみ出した状態となる。このはみ出した部分(はみ出し領域T)を後述の基板搬送ユニット3で保持することにより、基板Wを搬送できるようになっている。この平板部12のY軸方向寸法は、はみ出し領域Tが基板保持部30で保持できる必要最小限の寸法になるように設定されている。すなわち、はみ出し領域Tは、基板保持部30で基板Wのはみ出し領域Tを保持した場合に、基板保持部30と平板部12との間に互いに接触することのない僅かな隙間が形成される程度に設定されている。 Further, the flat plate portion 12 of the levitation stage portion 10 is formed so that its Y-axis direction dimension is smaller than the Y-axis direction dimension of the substrate W to which the levitation stage portion 10 is conveyed. When the substrate W is placed on the substrate levitation top surface 12a, the substrate W is formed. The end portion of the substrate W in the Y-axis direction protrudes from the floating upper surface 12a. By holding the protruding portion (protruding region T) with the substrate transport unit 3 described later, the substrate W can be transported. The Y-axis direction dimension of the flat plate portion 12 is set so that the protruding region T is the minimum necessary dimension that can be held by the substrate holding portion 30. That is, the protruding region T is such that when the protruding region T of the substrate W is held by the substrate holding portion 30, a slight gap that does not come into contact with each other is formed between the substrate holding portion 30 and the flat plate portion 12. Is set to.

また、基板搬送ユニット3は、浮上状態の基板Wを搬送させるものであり、基板Wを保持する基板保持ユニット30と、基板保持ユニット30を走行させる搬送駆動部31とを有している。 Further, the substrate transport unit 3 transports the floating substrate W, and has a substrate holding unit 30 that holds the substrate W and a transport drive unit 31 that runs the substrate holding unit 30.

搬送駆動部31は、基板保持ユニット30を搬送方向に移動させるように構成されており、浮上ステージ部10に沿って搬送方向に延びる搬送レール部31aと、この搬送レール部31a上を走行するベース部31bとで形成されている。具体的には、搬送方向に延びるように設けられた基台31c(図2参照)が浮上ステージ部10の川幅方向両側に配置されており、それぞれの基台31c上に搬送レール部31aが設けられている。すなわち、搬送レール部31aが浮上ステージ部10に沿って途切れることなく連続して設けられている。また、ベース部31bは、凹形状に形成された板状部材であり、図2に示すように、搬送レール部31aの上面を覆うように設けられている。具体的には、ベース部31bは、エアパッド(不図示)を介して搬送レール部31aに覆うように設けられており、リニアモータ(不図示)を駆動させることにより、ベース部31bが搬送レール部31a上を走行するようになっている。すなわち、リニアモータを駆動制御することにより、ベース部31bが搬送レール部31a上を接触することなく走行し、所定の位置で停止できるようになっている。 The transport drive unit 31 is configured to move the substrate holding unit 30 in the transport direction, and has a transport rail portion 31a extending in the transport direction along the levitation stage portion 10 and a base traveling on the transport rail portion 31a. It is formed by the portion 31b. Specifically, bases 31c (see FIG. 2) provided so as to extend in the transport direction are arranged on both sides of the levitation stage portion 10 in the river width direction, and transport rail portions 31a are provided on each base 31c. Has been done. That is, the transport rail portion 31a is continuously provided along the levitation stage portion 10 without interruption. Further, the base portion 31b is a plate-shaped member formed in a concave shape, and is provided so as to cover the upper surface of the transport rail portion 31a as shown in FIG. Specifically, the base portion 31b is provided so as to cover the transport rail portion 31a via an air pad (not shown), and by driving a linear motor (not shown), the base portion 31b becomes the transport rail portion. It is designed to run on 31a. That is, by driving and controlling the linear motor, the base portion 31b can travel on the transport rail portion 31a without contacting and can be stopped at a predetermined position.

また、基板保持ユニット30は、基板Wを保持するものであり、ベース部31bに取り付けられている。具体的には、図4に示すように、基板保持ユニット30は、搬送方向に延びる保持フレーム部40と、この保持フレーム部40に取り付けられた基板支持部41とを有しており、この保持フレーム部40がベース部31bと昇降部42を介して連結されている。そして、昇降部42を駆動させることにより保持フレーム部40が昇降動作し、基板支持部41が基板Wの裏面(下面ともいう)に対して接離できるようになっている。 Further, the substrate holding unit 30 holds the substrate W and is attached to the base portion 31b. Specifically, as shown in FIG. 4, the substrate holding unit 30 has a holding frame portion 40 extending in the transport direction and a substrate supporting portion 41 attached to the holding frame portion 40, and the holding frame portion 40 is held. The frame portion 40 is connected to the base portion 31b via the elevating portion 42. Then, the holding frame portion 40 moves up and down by driving the elevating portion 42, and the substrate support portion 41 can be brought into contact with and separated from the back surface (also referred to as the lower surface) of the substrate W.

保持フレーム部40は、基板支持部41を取り付けるためのものであり、長尺の平板形状を有している。この保持フレーム部40は、それぞれのベース部31b上に配置されており、ベース部31b上に昇降部42を介して配置されている。この保持フレーム部40は、浮上ステージ部10を川幅方向に挟むように配置され、その長手方向が搬送方向に沿うように配置されている。そして、搬送駆動部31を駆動させると、2つの保持フレーム部40が同調し浮上ステージ部10に沿って走行するようになっている。 The holding frame portion 40 is for attaching the substrate support portion 41, and has a long flat plate shape. The holding frame portion 40 is arranged on each of the base portions 31b, and is arranged on the base portion 31b via the elevating portion 42. The holding frame portion 40 is arranged so as to sandwich the floating stage portion 10 in the river width direction, and is arranged so that the longitudinal direction thereof is along the transport direction. Then, when the transport drive unit 31 is driven, the two holding frame units 40 are synchronized and travel along the levitation stage unit 10.

また、保持フレーム部40の長手方向の長さは、搬送される基板Wの搬送方向長さに応じて形成されており、保持フレーム部40の上端部分には、複数の基板支持部41が配置されている。すなわち、昇降部42を駆動させて保持フレーム部40が上昇するとすべての基板支持部41が一度に上昇し、保持フレーム部40が下降するとすべての基板支持部41が一度に下降する。これにより、基板支持部41毎に昇降部42を有している場合に比べて構成が容易になり、制御が複雑化するのを回避することができる。 Further, the length of the holding frame portion 40 in the longitudinal direction is formed according to the length of the substrate W to be conveyed in the conveying direction, and a plurality of substrate supporting portions 41 are arranged at the upper end portion of the holding frame portion 40. Has been done. That is, when the elevating portion 42 is driven to raise the holding frame portion 40, all the board support portions 41 are raised at once, and when the holding frame portion 40 is lowered, all the substrate support portions 41 are lowered at once. As a result, the configuration becomes easier as compared with the case where each board support portion 41 has an elevating portion 42, and it is possible to avoid complicating control.

また、本実施形態では、保持フレーム部40には、それぞれの基板支持部41が等間隔に配置されており、搬送方向一方側端部から他方側端部までの寸法は、基板Wの搬送方向長さ以下になるように設定されている。すなわち、基板Wが浮上ステージ部10上に浮上している状態で、保持フレーム部40を上昇させると、すべての基板支持部41が基板Wの下面に当接し、保持フレーム部40を下降させると、すべての基板支持部41が基板Wから離れるようになっている。 Further, in the present embodiment, the respective substrate support portions 41 are arranged at equal intervals in the holding frame portion 40, and the dimension from one side end portion to the other side end portion in the transport direction is the transport direction of the substrate W. It is set to be less than or equal to the length. That is, when the holding frame portion 40 is raised while the substrate W is floating on the levitation stage portion 10, all the substrate supporting portions 41 come into contact with the lower surface of the substrate W and the holding frame portion 40 is lowered. , All the substrate support portions 41 are separated from the substrate W.

また、基板支持部41は、基板Wを吸着保持するものであり、ほぼ直方体のブロック状に形成されている。基板支持部41は、長手方向が基板Wの搬送方向(X軸方向)に沿って配置されており、複数の基板支持部41が搬送方向に沿って一列に配列されている。この基板支持部41は、基板Wの下面に当接させる支持基準面部41aと、この支持基準面部41aに開口して形成される収容部5と、収容部5内に設けられ基板Wの下面を吸着する基板吸着部6とを有している(図5〜図7参照)。 Further, the substrate support portion 41 sucks and holds the substrate W, and is formed in a substantially rectangular parallelepiped block shape. The board support portions 41 are arranged in the longitudinal direction along the transport direction (X-axis direction) of the substrate W, and a plurality of board support portions 41 are arranged in a row along the transport direction. The substrate support portion 41 includes a support reference surface portion 41a that comes into contact with the lower surface of the substrate W, an accommodating portion 5 formed by opening the support reference surface portion 41a, and a lower surface of the substrate W provided in the accommodating portion 5. It has a substrate adsorption portion 6 for adsorption (see FIGS. 5 to 7).

支持基準面部41aは、基板支持部41の上面部分に位置しており、平坦な平面形状に形成されている。この支持基準面部41aは、各基板支持部41で同一高さ(基準高さ位置という)に設定されいる。したがって、保持フレーム部40の昇降動作に合わせて、各支持基準面部41aも昇降動作し、保持フレーム部40が上昇し浮上した基板Wの下面に当接する位置、すなわち保持フレーム部40が下降し基板Wから離れる位置にすべての基板支持部41の支持基準面部41aが位置することができる。したがって、基板Wを吸着させて基板Wの下面を支持基準面部41aに当接させることにより、基板Wを所定の高さ位置に保持できるようになっている。 The support reference surface portion 41a is located on the upper surface portion of the substrate support portion 41 and is formed in a flat planar shape. The support reference surface portion 41a is set to the same height (referred to as a reference height position) in each substrate support portion 41. Therefore, each support reference surface portion 41a also moves up and down in accordance with the raising and lowering operation of the holding frame portion 40, and the position where the holding frame portion 40 rises and comes into contact with the lower surface of the raised substrate W, that is, the holding frame portion 40 lowers and the substrate The support reference surface portions 41a of all the substrate support portions 41 can be located at positions away from W. Therefore, the substrate W can be held at a predetermined height position by attracting the substrate W and bringing the lower surface of the substrate W into contact with the support reference surface portion 41a.

収容部5は、基板吸着部6を収容するものであり、支持基準面部41aに開口して形成されている。本実施形態では、図5に示すように、収容部5は、各基板支持部41の支持基準面部41aに5つ設けられている。これらの収容部5は、搬送方向に沿って一列に配置されており、基板支持部41の端部側から等間隔で配置されている。これらの収容部5は、すべて同じ形状を有しており、本実施形態では、支持基準面部41aに開口する円筒形状に形成されている。すなわち、支持基準面部41aには、収容部5の縁部51が円形に形成されている。ここで、収容部5は、基板支持部41の端部に最も近い位置に配置される収容部5(搬送方向最端部に位置する収容部5)を他の収容部5と区別して呼ぶ場合には、特に収容部5aと呼ぶが、それぞれの収容部5を区別して呼ぶ必要がない場合は、単に収容部5と呼ぶことにする。 The accommodating portion 5 accommodates the substrate suction portion 6 and is formed by opening into the support reference surface portion 41a. In the present embodiment, as shown in FIG. 5, five accommodating portions 5 are provided on the support reference surface portion 41a of each substrate support portion 41. These accommodating portions 5 are arranged in a row along the transport direction, and are arranged at equal intervals from the end side of the substrate support portion 41. All of these accommodating portions 5 have the same shape, and in the present embodiment, they are formed in a cylindrical shape that opens into the support reference surface portion 41a. That is, the edge portion 51 of the accommodating portion 5 is formed in a circular shape on the support reference surface portion 41a. Here, when the accommodating portion 5 refers to the accommodating portion 5 (accommodating portion 5 located at the endmost portion in the transport direction) located closest to the end portion of the substrate support portion 41 to be distinguished from other accommodating portions 5. However, when it is not necessary to distinguish each of the accommodating portions 5a, it is simply referred to as the accommodating portion 5.

基板吸着部6は、基板Wを吸着するものであり、収容部5に収容されて設けられている。基板吸着部6は、図5に示すように、その先端部には弾性変形可能な蛇腹形状の吸着パッド61が設けられており、この吸着パッド61が直立した状態で収容部5に収容されている。吸着パッド61は、真空ポンプと連通して接続されており、その先端部分に吸引力を発生させることにより基板Wを吸着保持できるようになっている。すなわち、基板吸着部6の先端部は、図6(a)に示すように、通常状態(基板Wがない状態)では、収容部5から僅かに突出した状態で待機するように設定されている。そして、基板浮上面12aに基板Wが載置されると基板浮上面12aから川幅方向にはみ出した部分(はみ出し領域T)が吸着パッド61に当接する。この状態で吸着パッド61に吸引力を発生させると、基板Wの下面が吸着パッド61で吸引されつつ、その吸引状態を保ったまま、吸着パッド61自体が収容部5内に収縮して基板Wの下面が支持基準面部41aに当接し基板Wがそれぞれの支持基準面部41aで形成される所定の高さ位置に保持されるようになっている(図6(b)参照)。 The substrate suction portion 6 sucks the substrate W and is accommodated and provided in the accommodating portion 5. As shown in FIG. 5, the substrate suction portion 6 is provided with a bellows-shaped suction pad 61 that can be elastically deformed at its tip, and the suction pad 61 is housed in the storage portion 5 in an upright state. There is. The suction pad 61 is connected to the vacuum pump in communication with each other, and the substrate W can be sucked and held by generating a suction force at the tip portion thereof. That is, as shown in FIG. 6A, the tip portion of the substrate suction portion 6 is set to stand by in a state of slightly protruding from the accommodating portion 5 in a normal state (a state without the substrate W). .. When the substrate W is placed on the floating upper surface 12a of the substrate, a portion (protruding region T) protruding from the floating upper surface 12a of the substrate in the river width direction comes into contact with the suction pad 61. When a suction force is generated in the suction pad 61 in this state, the lower surface of the substrate W is sucked by the suction pad 61, and the suction pad 61 itself contracts into the accommodating portion 5 while maintaining the suction state, and the substrate W The lower surface of the substrate W is in contact with the support reference surface portion 41a, and the substrate W is held at a predetermined height position formed by the respective support reference surface portions 41a (see FIG. 6B).

また、基板支持部41には、切欠部7が形成されている。この切欠部7は、基板Wが吸着保持された際に基板Wが収容部5に引き込まれて変形することにより基板Wの平坦度が損なわれるのを抑えるためのものである。具体的には、図5に示すように、切欠部7は、長手方向(搬送方向)端部に設けられており、支持基準面部41aの基準高さ位置よりも低くなるように形成されている。本実施形態では、切欠部7は、搬送方向最端部に位置する収容部5aの縁部51から、基板収容部5の端部に亘って設けられている。すなわち、切欠部7は、搬送方向最端部に位置する収容部5aの縁部51のうち、搬送方向端部側の半円部分を含むように設けられており、その縁部51の半円部分の高さ位置が基準高さ位置よりも低くなっている。 Further, the substrate support portion 41 is formed with a notch portion 7. The cutout portion 7 is for suppressing the flatness of the substrate W from being impaired due to the substrate W being pulled into the accommodating portion 5 and deformed when the substrate W is attracted and held. Specifically, as shown in FIG. 5, the notch portion 7 is provided at the end portion in the longitudinal direction (transportation direction), and is formed so as to be lower than the reference height position of the support reference surface portion 41a. .. In the present embodiment, the notch portion 7 is provided from the edge portion 51 of the accommodating portion 5a located at the end end in the transport direction to the end portion of the substrate accommodating portion 5. That is, the cutout portion 7 is provided so as to include a half-circle portion on the end portion side in the transport direction of the edge portion 51 of the accommodating portion 5a located at the end end portion in the transport direction, and the half circle portion of the edge portion 51. The height position of the part is lower than the reference height position.

なお、この切欠部7は、上述のように基準高さ位置よりも低くなるように形成されていればよく、直線的な段差を付けて基準高さ位置よりも低くなるように形成してもよい。また、図11(a)のように、切欠部7は、収容部5aの縁部51をテーパ状に形成したものでもよく、図11(b)のように、曲線的に形成してもよい。また、切欠部7は、溝状に形成されていてもよく、形成される溝が基板支持部41の底面に貫通するように形成されていてもよい。 The cutout portion 7 may be formed so as to be lower than the reference height position as described above, and may be formed so as to be lower than the reference height position with a linear step. Good. Further, as shown in FIG. 11A, the notch portion 7 may be formed by forming the edge portion 51 of the accommodating portion 5a in a tapered shape, or may be formed in a curved shape as shown in FIG. 11B. .. Further, the notch portion 7 may be formed in a groove shape, or may be formed so that the formed groove penetrates the bottom surface of the substrate support portion 41.

この切欠部7により、吸着保持された際の基板Wの変形を抑えることができる。すなわち、浮上した基板Wが基板吸着部6によって吸着保持されると、基板吸着部6の吸着パッド61が収容部5内に収縮することにより、基板Wが僅かに収容部5内に引き込まれる。基板Wが収容部5に僅かに引き込まれると、図7(b)に示すように、基板Wの下面が収容部5の縁部51に当接することにより、基板Wが浮き上がり基板Wの平坦度が損なわれる。ここで、収容部5のうち、隣に収容部5が存在する場合には、浮き上がった基板Wが収容部5に吸引されるため、基板Wをほぼ支持基準面部41aに沿わせることができる。一方、搬送方向最端部に位置する収容部5aでは、搬送方向端部側に収容部5が存在せず自由端になってしまうが、収容部5の縁部51が切欠部7により切り取られているため、基板Wの下面に当接する縁部51がなく、従来の図7(b)のように縁部51に当接して基板Wが収容部5から離れるにしたがって支持基準面部41aから離れるように(浮き上がるように)変形すること(図7における一点鎖線部分)を回避することができる。 The notch 7 can suppress the deformation of the substrate W when it is attracted and held. That is, when the floating substrate W is sucked and held by the substrate suction portion 6, the suction pad 61 of the substrate suction portion 6 contracts in the accommodating portion 5, so that the substrate W is slightly pulled into the accommodating portion 5. When the substrate W is slightly pulled into the accommodating portion 5, as shown in FIG. 7B, the lower surface of the substrate W comes into contact with the edge portion 51 of the accommodating portion 5, so that the substrate W is lifted and the flatness of the substrate W is flat. Is impaired. Here, when the accommodating portion 5 is present next to the accommodating portion 5, the raised substrate W is attracted to the accommodating portion 5, so that the substrate W can be substantially aligned with the support reference surface portion 41a. On the other hand, in the accommodating portion 5a located at the endmost portion in the transport direction, the accommodating portion 5 does not exist on the end portion side in the transport direction and becomes a free end, but the edge portion 51 of the accommodating portion 5 is cut off by the notch portion 7. Therefore, there is no edge portion 51 that abuts on the lower surface of the substrate W, and as shown in the conventional FIG. 7B, the substrate W abuts on the edge portion 51 and separates from the support reference surface portion 41a as the substrate W separates from the accommodating portion 5. It is possible to avoid such deformation (the one-dot chain line portion in FIG. 7).

上記実施形態の基板浮上搬送装置によれば、基板支持部41の搬送方向最端部に位置する収容部5aの縁部51のうち、少なくとも搬送方向端部側に切欠部7が形成されているため、吸着による基板の変形量を抑えることができる。すなわち、従来のように切欠部7が形成されていない場合には、搬送方向最端部に位置する収容部5aの搬送方向端部側(隣接する収容部5がない側)で縁部51に当接する基板Wが最も大きく変形するが、搬送方向端部側に切欠部7が形成されていることにより、基板Wが収容部5内に引き込まれて縁部51に当接することによる基板Wの変形を抑えることができ、浮上した基板Wを吸着して保持しても、基板Wの平坦度が損なわれるのを抑えることができる。 According to the substrate floating transfer device of the above embodiment, the notch 7 is formed at least on the end side in the transfer direction of the edge 51 of the accommodating portion 5a located at the end end in the transfer direction of the substrate support 41. Therefore, the amount of deformation of the substrate due to adsorption can be suppressed. That is, when the cutout portion 7 is not formed as in the conventional case, the edge portion 51 is formed on the transport direction end portion side (the side where there is no adjacent accommodating portion 5) of the accommodating portion 5a located at the end end portion in the transport direction. The abutting substrate W is most deformed, but the notch 7 is formed on the end side in the transport direction, so that the substrate W is pulled into the accommodating portion 5 and abuts on the edge 51 of the substrate W. Deformation can be suppressed, and even if the surfaced substrate W is attracted and held, the flatness of the substrate W can be suppressed from being impaired.

上記実施形態では、切欠部7が、搬送方向最端部における収容部5aの縁部51から基板支持部41の端部まで形成されている例について説明したが、図8(a)(b)に示すように、縁部51のうち、基板支持部41の端部に最も近い位置に部分的に切欠部7(ハッチング部分)が設けられるものであってもよい。すなわち、吸着による基板Wの変形は、基板Wの裏面が基板支持部41の端部に最も近い縁部51に当接することによって顕著になるため、その基板支持部41の端部に最も近い縁部51に切欠部7を設けることにより、基板Wの裏面が縁部51に当接するのを回避でき、基板Wが浮き上がるように変形するのを抑えることができる。なお、搬送方向最端部における収容部5の縁部51のうち、基板支持部41の端部側に位置する縁部51に当接することにより基板Wが変形する虞があるため、図8(c)に示すように、搬送方向最端部における収容部5の縁部51のうち、基板支持部41の搬送方向端部側の全体領域に亘って形成されていてもよい。 In the above embodiment, an example in which the notch portion 7 is formed from the edge portion 51 of the accommodating portion 5a to the end portion of the substrate support portion 41 at the endmost portion in the transport direction has been described, but FIGS. 8A and 8B have been described. As shown in the above, the cutout portion 7 (hatched portion) may be partially provided at a position closest to the end portion of the substrate support portion 41 among the edge portions 51. That is, the deformation of the substrate W due to adsorption becomes remarkable when the back surface of the substrate W comes into contact with the edge portion 51 closest to the end portion of the substrate support portion 41, and therefore the edge closest to the end portion of the substrate support portion 41. By providing the notch 7 in the portion 51, it is possible to prevent the back surface of the substrate W from coming into contact with the edge portion 51, and it is possible to prevent the substrate W from being deformed so as to float. Of the edge 51 of the accommodating portion 5 at the end end in the transport direction, the substrate W may be deformed by coming into contact with the edge 51 located on the end side of the substrate support 41. As shown in c), it may be formed over the entire region of the substrate support portion 41 on the transport direction end side of the edge portion 51 of the accommodating portion 5 at the transport direction end end.

上記実施形態では、切欠部7が、搬送方向最端部における収容部5の縁部51のうち、基板支持部41の端部側に設ける例について説明したが、収容部5間側に位置する縁部51にも設けてもよい。具体的には、図8(d)に示すように、収容部5間側に位置する縁部51の一部に切欠部7を設けてもよいし、図8(e)に示すように、収容部5間側の縁部51を含む支持基準面部41a全体に亘って切欠部7を設けるものであってもよい。すなわち、隣り合う収容部5に形成された切欠部7同士を連結させて設けたものであってもよい。切欠部7を収容部5間に設けることにより、基板Wを吸着した際に、収容部5間に位置する基板Wが浮き上がるのを抑えることができる。 In the above embodiment, an example in which the notch portion 7 is provided on the end side of the substrate support portion 41 among the edge portions 51 of the accommodating portion 5 at the end end portion in the transport direction has been described, but it is located on the side between the accommodating portions 5. It may also be provided on the edge portion 51. Specifically, as shown in FIG. 8 (d), a notch 7 may be provided in a part of the edge portion 51 located on the side between the accommodating portions 5, or as shown in FIG. 8 (e). The cutout portion 7 may be provided over the entire support reference surface portion 41a including the edge portion 51 on the side between the accommodating portions 5. That is, the notches 7 formed in the adjacent accommodating portions 5 may be connected to each other. By providing the notch 7 between the accommodating portions 5, it is possible to prevent the substrate W located between the accommodating portions 5 from being lifted when the substrate W is adsorbed.

また、上記実施形態では、基板吸着部6の先端部、すなわち、吸着パッド61が基板Wに吸着すると収容部5内に収縮する例について説明したが、最も収縮した状態で吸着パッド61の先端部分の高さ位置が支持基準面部41aの面一と同じになるように調節されているものであってもよい。このように調節されていることにより、吸着パッド61に吸着された部分の基板Wの高さ位置が支持基準面部41aと一致するため、収容部5位置で縁部51に当接することによる基板Wの変形が抑えられ、基板Wが吸着保持された際の基板Wの平坦度が損なわれるのを抑えることができる。 Further, in the above embodiment, an example in which the tip portion of the substrate suction portion 6, that is, the suction pad 61 contracts into the accommodating portion 5 when attracted to the substrate W has been described, but the tip portion of the suction pad 61 in the most contracted state has been described. The height position of the support reference surface portion 41a may be adjusted so as to be flush with the support reference surface portion 41a. By being adjusted in this way, the height position of the substrate W of the portion attracted to the suction pad 61 coincides with the support reference surface portion 41a, so that the substrate W is brought into contact with the edge portion 51 at the accommodation portion 5 position. It is possible to suppress the deformation of the substrate W and prevent the flatness of the substrate W from being impaired when the substrate W is attracted and held.

また、上記実施形態では、切欠部7に吸引力が発生しない例について説明したが、切欠部7に吸引力を発生するように形成し、基板Wが変形して浮き上がるのを抑えるものであってもよい。例えば、図8の切欠部7を溝状に形成し、この溝と真空源とを接続することにより吸引力を発生させるように構成してもよく、図9(a)(b)に示すように、切欠部7にさらに溝71を形成し、この溝71から吸引力を発生させるようにしてもよい。また、切欠部7に多孔質部材8等を設置し、多孔質部材8と真空装置を連結することにより、吸引力を発生させるように構成してもよい。例えば、図10(a)(b)に示すように、切欠部7に多孔質部材8を設置して吸引力を発生させることにより、搬送方向端部側、及び、収容部5間側の基板Wの浮き上がりを抑えることができる。そして、この多孔質部材8の高さ位置が、支持基準面部41aの高さ位置と同じ高さ位置に設定することにより、基板Wが変形して浮き上がるのを防止しつつ、基板Wを支持基準面部41aの高さ位置に保持することができるため、基板Wの平坦度が損なわれるのを極力抑えることができる。特に、収容部5(基板吸着部6)が搬送方向に離れて設けられている場合には、収容部5間隔が延びるため吸着時に基板Wが浮きやすくなるが、収容部5間に切欠部7を設け、その切欠部7に吸引力を発生させるように形成することにより、間隔が広い収容部5であっても基板Wの平坦度が損なわれるのを抑えて基板Wを精度よく保持することができる。 Further, in the above embodiment, the example in which the suction force is not generated in the notch portion 7 has been described, but the substrate W is formed so as to generate the suction force in the notch portion 7 to prevent the substrate W from being deformed and lifted. May be good. For example, the notch 7 in FIG. 8 may be formed in a groove shape, and the groove and the vacuum source may be connected to generate a suction force, as shown in FIGS. 9A and 9B. In addition, a groove 71 may be further formed in the notch 7, and a suction force may be generated from the groove 71. Further, a porous member 8 or the like may be installed in the notch 7, and the porous member 8 and the vacuum device may be connected to generate a suction force. For example, as shown in FIGS. 10A and 10B, by installing the porous member 8 in the notch 7 and generating a suction force, the substrate on the end side in the transport direction and on the side between the accommodating portions 5 It is possible to suppress the floating of W. Then, by setting the height position of the porous member 8 to the same height position as the height position of the support reference surface portion 41a, the substrate W is supported by the support reference while preventing the substrate W from being deformed and lifted. Since it can be held at the height position of the surface portion 41a, it is possible to suppress the deterioration of the flatness of the substrate W as much as possible. In particular, when the accommodating portions 5 (board suction portions 6) are provided apart from each other in the transport direction, the intervals between the accommodating portions 5 are extended, so that the substrate W tends to float during adsorption. By providing the notch 7 so as to generate a suction force, the flatness of the substrate W can be suppressed from being impaired even in the accommodating portion 5 having a wide interval, and the substrate W can be held accurately. Can be done.

1 基板浮上搬送装置
2 塗布装置
5 収容部
6 基板吸着部
7 切欠部
8 多孔質部材
10 浮上ステージ部
30 基板保持ユニット
31 搬送駆動部
41基板支持部
41a 支持基準面部
1 Substrate levitation transfer device 2 Coating device 5 Accommodating section 6 Substrate suction section 7 Notch section 8 Porous member 10 Floating stage section 30 Board holding unit 31 Transfer drive section 41 Board support section 41a Support reference surface section

Claims (7)

基板を浮上させる浮上ステージ部と、
前記浮上ステージ部上に浮上された基板を保持する基板保持ユニットと、
を備え、前記基板保持ユニットを搬送方向に移動させることにより前記浮上ステージ部上の基板を浮上させた状態で搬送する基板浮上搬送装置であって、
前記基板保持ユニットは、浮上している基板の下面に当接することにより基板を所定高さ位置に保持する基板支持部を有しており、
この基板支持部は、基板の下面に当接し基準高さ位置に設けられた支持基準面部と、この支持基準面部に開口する収容部と、この収容部に設けられ基板の下面を吸着する基板吸着部とを有しており、前記基板吸着部により基板の下面が吸着されると基板の下面が前記支持基準面部に当接して基板が所定高さ位置に保持されるように形成されており、
前記支持基準面部は、前記基板支持部の搬送方向最端部に位置する前記収容部の縁部のうち、少なくとも搬送方向端部側に、基準高さ位置よりも低く形成された切欠部が形成されており
前記収容部は、搬送方向に複数配列されて設けられており、前記切欠部は、前記収容部間側の縁部に形成され、
前記切欠部は、隣り合う収容部に形成された切欠部と連結して形成されていることを特徴とする基板浮上搬送装置。
The floating stage part that floats the board and
A substrate holding unit that holds the substrate floated on the levitation stage portion and
A substrate levitation transfer device for transporting a substrate on a levitation stage portion in a levitation state by moving the substrate holding unit in a transport direction.
The substrate holding unit has a substrate supporting portion that holds the substrate at a predetermined height position by contacting the lower surface of the floating substrate.
This substrate support portion includes a support reference surface portion provided at a reference height position in contact with the lower surface of the substrate, an accommodating portion opened in the support reference surface portion, and a substrate adsorption portion provided in the accommodating portion to adsorb the lower surface of the substrate. It is formed so that when the lower surface of the substrate is attracted by the substrate suction portion, the lower surface of the substrate abuts on the support reference surface portion and the substrate is held at a predetermined height position.
The support reference surface portion is formed with a notch formed lower than the reference height position at least on the transport direction end side of the edge portion of the accommodating portion located at the transport direction end end of the substrate support portion. It has been,
A plurality of the accommodating portions are arranged in the transport direction, and the notch portions are formed at the edge portion on the side between the accommodating portions.
The substrate levitation transport device , wherein the cutout portion is formed by being connected to a cutout portion formed in adjacent accommodating portions .
基板を浮上させる浮上ステージ部と、
前記浮上ステージ部上に浮上された基板を保持する基板保持ユニットと、
を備え、前記基板保持ユニットを搬送方向に移動させることにより前記浮上ステージ部上の基板を浮上させた状態で搬送する基板浮上搬送装置であって、
前記基板保持ユニットは、浮上している基板の下面に当接することにより基板を所定高さ位置に保持する基板支持部を有しており、
この基板支持部は、基板の下面に当接し基準高さ位置に設けられた支持基準面部と、この支持基準面部に開口する収容部と、この収容部に設けられ基板の下面を吸着する基板吸着部とを有しており、前記基板吸着部により基板の下面が吸着されると基板の下面が前記支持基準面部に当接して基板が所定高さ位置に保持されるように形成されており、
前記支持基準面部は、前記基板支持部の搬送方向最端部に位置する前記収容部の縁部のうち、少なくとも搬送方向端部側に、基準高さ位置よりも低く形成された切欠部が形成されており
前記切欠部は、前記収容部の縁部から前記基板支持部の端部まで延びて形成されていることを特徴とする基板浮上搬送装置。
The floating stage part that floats the board and
A substrate holding unit that holds the substrate floated on the levitation stage portion and
A substrate levitation transfer device for transporting a substrate on a levitation stage portion in a levitation state by moving the substrate holding unit in a transport direction.
The substrate holding unit has a substrate supporting portion that holds the substrate at a predetermined height position by contacting the lower surface of the floating substrate.
This substrate support portion includes a support reference surface portion provided at a reference height position in contact with the lower surface of the substrate, an accommodating portion opened in the support reference surface portion, and a substrate adsorption portion provided in the accommodating portion to adsorb the lower surface of the substrate. It is formed so that when the lower surface of the substrate is attracted by the substrate suction portion, the lower surface of the substrate abuts on the support reference surface portion and the substrate is held at a predetermined height position.
The support reference surface portion is formed with a notch formed lower than the reference height position at least on the transport direction end side of the edge portion of the accommodating portion located at the transport direction end end of the substrate support portion. It has been,
A substrate levitation transport device , wherein the notch portion extends from an edge portion of the accommodating portion to an end portion of the substrate support portion .
基板を浮上させる浮上ステージ部と、
前記浮上ステージ部上に浮上された基板を保持する基板保持ユニットと、
を備え、前記基板保持ユニットを搬送方向に移動させることにより前記浮上ステージ部上の基板を浮上させた状態で搬送する基板浮上搬送装置であって、
前記基板保持ユニットは、浮上している基板の下面に当接することにより基板を所定高さ位置に保持する基板支持部を有しており、
この基板支持部は、基板の下面に当接し基準高さ位置に設けられた支持基準面部と、この支持基準面部に開口する収容部と、この収容部に設けられ基板の下面を吸着する基板吸着部とを有しており、前記基板吸着部により基板の下面が吸着されると基板の下面が前記支持基準面部に当接して基板が所定高さ位置に保持されるように形成されており、
前記支持基準面部は、前記基板支持部の搬送方向最端部に位置する前記収容部の縁部のうち、少なくとも搬送方向端部側に、基準高さ位置よりも低く形成された切欠部が形成されており
前記切欠部上には、前記支持基準面部と同じ高さ位置の多孔質部材が設けられており、多孔質部材に吸引力が発生するように形成されていることを特徴とする基板浮上搬送装置。
The floating stage part that floats the board and
A substrate holding unit that holds the substrate floated on the levitation stage portion and
A substrate levitation transfer device for transporting a substrate on a levitation stage portion in a levitation state by moving the substrate holding unit in a transport direction.
The substrate holding unit has a substrate supporting portion that holds the substrate at a predetermined height position by contacting the lower surface of the floating substrate.
This substrate support portion includes a support reference surface portion provided at a reference height position in contact with the lower surface of the substrate, an accommodating portion opened in the support reference surface portion, and a substrate adsorption portion provided in the accommodating portion to adsorb the lower surface of the substrate. It is formed so that when the lower surface of the substrate is attracted by the substrate suction portion, the lower surface of the substrate abuts on the support reference surface portion and the substrate is held at a predetermined height position.
The support reference surface portion is formed with a notch formed lower than the reference height position at least on the transport direction end side of the edge portion of the accommodating portion located at the transport direction end end of the substrate support portion. It has been,
A substrate levitation transport device is provided on the notch portion at the same height as the support reference surface portion, and is formed so that an attractive force is generated in the porous member. ..
前記収容部の縁部は円形を有しており、前記切欠部は、搬送方向最端部に位置する前記収容部の縁部のうち、前記基板支持部の搬送方向端部に最も近い部分に形成されていることを特徴とする請求項1〜3のいずれかに記載の基板浮上搬送装置。 The edge portion of the accommodating portion has a circular shape, and the notch portion is located at the end portion of the accommodating portion located at the most end portion in the transport direction and is closest to the end portion of the substrate support portion in the transport direction. The substrate floating transfer device according to any one of claims 1 to 3, wherein the substrate is formed. 前記切欠部は、前記搬送方向最端部に位置する前記収容部の縁部のうち、前記基板支持部の搬送方向端部側の全体領域に亘って形成されていることを特徴とする請求項1〜4のいずれかに記載の基板浮上搬送装置。 The claim is characterized in that the cutout portion is formed over the entire region of the substrate support portion on the transport direction end portion side of the edge portion of the accommodating portion located at the end end portion in the transport direction. The substrate floating transfer device according to any one of 1 to 4 . 前記基板吸着部は、基板の裏面に吸着する先端部が伸縮性を有しており、その先端部は、基板がない状態では支持基準面部から突出し、基板が載置された状態では、基板の下面を吸着しつつ収縮することにより基板の下面が支持基準面部に当接するように形成されており、前記先端部が完全に収縮した状態では、先端部の高さ位置が支持基準面部の高さ位置に設定されていることを特徴とする請求項1〜のいずれかに記載の基板浮上搬送装置。 In the substrate suction portion, the tip portion that is attracted to the back surface of the substrate has elasticity, and the tip portion protrudes from the support reference surface portion in the absence of the substrate, and in the state where the substrate is placed, the substrate The lower surface of the substrate is formed to come into contact with the support reference surface portion by shrinking while adsorbing the lower surface, and when the tip portion is completely contracted, the height position of the tip portion is the height of the support reference surface portion. The substrate floating transfer device according to any one of claims 1 to 5 , wherein the board is set at a position. 前記切欠部に、吸引力を発生させるように形成されていることを特徴とする請求項1〜のいずれかに記載されていることを特徴とする基板浮上搬送装置。 The substrate floating transfer device according to any one of claims 1 to 6 , wherein the cutout portion is formed so as to generate a suction force .
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