JP2018152447A - Substrate Levitation Transport Device - Google Patents

Substrate Levitation Transport Device Download PDF

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JP2018152447A
JP2018152447A JP2017047054A JP2017047054A JP2018152447A JP 2018152447 A JP2018152447 A JP 2018152447A JP 2017047054 A JP2017047054 A JP 2017047054A JP 2017047054 A JP2017047054 A JP 2017047054A JP 2018152447 A JP2018152447 A JP 2018152447A
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substrate
support
transport direction
reference surface
levitation
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JP6804155B2 (en
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貫志 岡本
Kanji Okamoto
貫志 岡本
健史 濱川
Kenji Hamakawa
健史 濱川
森 俊裕
Toshihiro Mori
俊裕 森
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Toray Engineering Co Ltd
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Toray Engineering Co Ltd
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Abstract

PROBLEM TO BE SOLVED: To provide a substrate levitation transport device capable of restraining impairment of flatness of a substrate, even if a levitated substrate is held while being sucked.SOLUTION: In a substrate levitation transport device for transporting a substrate in levitated state by moving a substrate holding unit in the transport direction, the substrate holding unit has a substrate support part for holding the substrate at a prescribed height position by abutting on the lower surface of the levitated state, the substrate support part has a support reference surface abutting on the lower surface of the substrate, a housing part opening to the support reference surface, and a substrate suction part provided in the housing part and sucking the lower surface of the substrate. When sucked by the substrate suction part, the lower surface of the substrate buts on the support reference surface, and the substrate is held at a position of prescribed height, and a notch is formed lower than the reference height position, at least on the end side in the transport direction, out of the marginal part of the housing part located at the outermost end of the substrate support part in the transport direction.SELECTED DRAWING: Figure 1

Description

本発明は、基板を浮上させながら搬送する基板浮上搬送装置に関するものであり、特に、塗布ムラが形成されるのを抑えることができる基板浮上搬送装置に関するものである。   The present invention relates to a substrate levitation conveyance apparatus that conveys a substrate while levitating, and particularly relates to a substrate levitation conveyance apparatus that can suppress formation of coating unevenness.

液晶ディスプレイやプラズマディスプレイ等のフラットパネルディスプレイには、基板上にレジスト液が塗布されたもの(塗布基板と称す)が使用されている。この塗布基板は、基板搬送装置で基板を搬送しつつ塗布装置により基板上にレジスト液が均一に塗布されることによって塗布膜が形成される。その後、さらに基板搬送装置により搬送され、乾燥装置等により塗布膜が乾燥されることにより生産される。   A flat panel display such as a liquid crystal display or a plasma display uses a substrate coated with a resist solution (referred to as a coated substrate). In the coated substrate, a coating film is formed by uniformly applying a resist solution onto the substrate by the coating device while the substrate is transported by the substrate transport device. Thereafter, the coating film is further transported by a substrate transporting device, and the coating film is dried by a drying device or the like to produce.

最近の基板搬送装置では、塗布基板Wの裏面(塗布面と反対側)の損傷を回避するため、エア浮上や超音波浮上等、基板Wを浮上させながら基板Wを搬送させる基板浮上搬送装置が使用されている。この基板浮上搬送装置は、図12に示すように、基板Wを浮上させる浮上ステージ部100と、浮上した状態の基板Wを吸着して保持する基板保持ユニット102と、基板保持ユニット102を基板Wの搬送方向に移動させる搬送駆動部103とを有しており、搬送駆動部103を駆動させて基板保持ユニット102を移動させることにより、基板Wが浮上ステージ部100上を浮上した状態で搬送方向に搬送されるようになっている。   In recent substrate transport apparatuses, in order to avoid damage to the back surface (the side opposite to the coating surface) of the coated substrate W, there is a substrate floating transport apparatus that transports the substrate W while floating the substrate W, such as air levitation or ultrasonic levitation. It is used. As shown in FIG. 12, the substrate levitation transfer apparatus includes a levitation stage unit 100 that levitates the substrate W, a substrate holding unit 102 that sucks and holds the substrate W in the levitated state, and the substrate holding unit 102. A transfer driving unit 103 that moves the substrate holding unit 102 by driving the transfer driving unit 103 and moving the substrate holding unit 102 in the transfer direction in a state where the substrate W floats on the floating stage unit 100. It is designed to be conveyed.

搬送される基板Wは、搬送途中に設けられた基板処理部(例えば塗布処理部)110で所定の処理が行われる。この基板処理部110で精度よく処理を行うためには、基板Wの姿勢を水平に保持する必要がある。そのため、基板保持ユニット102では、基板Wが水平な姿勢を維持した状態に保持できるように形成されている。具体的には、図13に示すように、基板保持ユニット102は、搬送方向に沿って配列される複数の基板支持部104を有しており、この基板支持部104により基板Wの下面を吸着して保持できるように形成されている。   The substrate W to be transported is subjected to predetermined processing in a substrate processing unit (for example, a coating processing unit) 110 provided in the middle of transport. In order to perform processing with high accuracy by the substrate processing unit 110, it is necessary to hold the posture of the substrate W horizontally. Therefore, the substrate holding unit 102 is formed so that the substrate W can be held in a horizontal state. Specifically, as shown in FIG. 13, the substrate holding unit 102 has a plurality of substrate support portions 104 arranged along the transport direction, and the substrate support portion 104 attracts the lower surface of the substrate W. And can be held.

この基板支持部104は、図13,図14(a)に示すように、基板Wの下面に当接する支持基準面部104aを有しており、それぞれの支持基準面部104aが基準高さ位置に設定されている。そして、支持基準面部104aには、図14(b)に示すように、支持基準面部104aに開口する収容部105が複数配列されて設けられており、これらの収容部105に基板Wを吸引して吸着するための基板吸着部106が収容されている。この基板吸着部106は、その先端部が伸縮性のあるゴム部材で形成された吸着パッド107(図15参照)を有しており、この吸着パッド107に吸引力が発生するように形成されている。そして、図13(b)に示すように、基板保持ユニット102を上昇させて吸着パッド107が浮上した基板Wの下面に当接した状態で吸引力を発生させると、吸着パッド107が収容部105側に収縮することにより、基板Wが基板吸着部106側に引っ張られ、基板Wの下面が支持基準面部104aに当接するようになっている。これにより、基板Wの下面がすべての基板支持部104の支持基準面部104aに当接し、基板W全体が設定された高さ位置に保持されるようになっている。この状態で搬送駆動部103が搬送方向に移動することにより、浮上ステージ部100上に浮上した基板Wは、全体が水平な姿勢を維持しつつ搬送方向に搬送されるようになっている。   As shown in FIGS. 13 and 14A, the substrate support portion 104 has a support reference surface portion 104a that comes into contact with the lower surface of the substrate W, and each support reference surface portion 104a is set at a reference height position. Has been. As shown in FIG. 14B, the support reference surface portion 104 a is provided with a plurality of storage portions 105 that are open to the support reference surface portion 104 a, and the substrate W is sucked into these storage portions 105. A substrate suction portion 106 for suction is accommodated. The substrate suction portion 106 has a suction pad 107 (see FIG. 15) whose tip is formed of a stretchable rubber member, and is formed so that a suction force is generated on the suction pad 107. Yes. Then, as shown in FIG. 13B, when the suction force is generated while the substrate holding unit 102 is raised and the suction pad 107 is in contact with the lower surface of the surface of the substrate W, the suction pad 107 is accommodated in the housing portion 105. By contracting to the side, the substrate W is pulled toward the substrate suction portion 106 side, and the lower surface of the substrate W comes into contact with the support reference surface portion 104a. As a result, the lower surface of the substrate W comes into contact with the support reference surface portion 104a of all the substrate support portions 104, and the entire substrate W is held at the set height position. When the transport driving unit 103 moves in the transport direction in this state, the substrate W that has floated on the levitation stage unit 100 is transported in the transport direction while maintaining the entire horizontal posture.

特開2011−213435号公報JP 2011-213435 A

しかし、上記基板浮上搬送装置では、保持された基板Wの平坦度を均一にすることが困難であるという問題があった。上述したように、上記基板浮上搬送装置では、基板Wが基板吸着部106で吸引されることにより、基板Wの一部が収容部105に引き込まれ僅かに変形する。すなわち、図15に示すように、基板Wが収容部105に引き込まれることにより、収容部105を形成する縁部108(図14(b)参照)に基板Wの下面が当接し(図15における1点鎖線部分)、収容部105から離れるにしたがって支持基準面部104aから離れるように(浮き上がるように)変形する。特に、搬送方向最端部に位置する収容部105aは、搬送方向一方側のみ他の収容部105が存在し、他方側には収容部105が存在しないため、他方側における基板Wの変形量が大きくなる。そのため、搬送方向最端部に位置する収容部105aでは、搬送方向両隣に収容部105が存在する収容部105に比べて、吸着による基板Wの変形量が大きくなり、特に搬送方向最端部に位置する収容部105aで基板Wの平坦度が損なわれる傾向が顕著であった。   However, the above-described substrate floating transport apparatus has a problem that it is difficult to make the flatness of the held substrate W uniform. As described above, in the substrate levitation transfer apparatus, when the substrate W is sucked by the substrate suction unit 106, a part of the substrate W is drawn into the storage unit 105 and slightly deformed. That is, as shown in FIG. 15, when the substrate W is drawn into the housing portion 105, the lower surface of the substrate W comes into contact with the edge portion 108 (see FIG. 14B) that forms the housing portion 105 (see FIG. 15). The one-dot chain line portion) is deformed so as to move away from the support reference surface portion 104a as it moves away from the housing portion 105 (floating up). In particular, the accommodating portion 105a located at the extreme end in the transport direction has the other accommodating portion 105 only on one side in the transport direction and does not have the accommodating portion 105 on the other side, so the deformation amount of the substrate W on the other side is small. growing. For this reason, the amount of deformation of the substrate W due to the suction is larger in the storage unit 105a located at the transport direction end, compared to the storage unit 105 in which the storage unit 105 exists on both sides in the transport direction. The tendency for the flatness of the substrate W to be impaired by the accommodating portion 105a located was remarkable.

そこで、本発明は、浮上した基板を吸着して保持しても、基板の平坦度が損なわれるのを抑えることができる基板浮上搬送装置を提供することを目的としている。   In view of the above, an object of the present invention is to provide a substrate levitating and conveying apparatus that can prevent the flatness of a substrate from being lost even if the levitated substrate is sucked and held.

上記課題を解決するために本発明の基板浮上搬送装置は、基板を浮上させる浮上ステージ部と、前記浮上ステージ部上に浮上された基板を保持する基板保持ユニットと、を備え、前記基板保持ユニットを搬送方向に移動させることにより前記浮上ステージ部上の基板を浮上させた状態で搬送する基板浮上搬送装置であって、前記基板保持ユニットは、浮上している基板の下面に当接することにより基板を所定高さ位置に保持する基板支持部を有しており、この基板支持部は、基板の下面に当接し基準高さ位置に設けられた支持基準面部と、この支持基準面部に開口する収容部と、この収容部に設けられ基板の下面を吸着する基板吸着部とを有しており、前記基板吸着部により基板の下面が吸着されると基板の下面が前記支持基準面部に当接して基板が所定高さ位置に保持されるように形成されており、前記支持基準面部は、前記基板支持部の搬送方向最端部に位置する前記収容部の縁部のうち、少なくとも搬送方向端部側に、基準高さ位置よりも低く形成された切欠部が形成されていることを特徴としている。   In order to solve the above-mentioned problems, a substrate levitation transport apparatus according to the present invention includes a levitation stage unit that levitates a substrate, and a substrate holding unit that holds a substrate levitated on the levitation stage unit, and the substrate holding unit. Is a substrate levitation transport apparatus that transports the substrate on the levitation stage section in a floating state by moving the substrate in the transport direction, wherein the substrate holding unit contacts the lower surface of the floating substrate. The substrate support portion holds the substrate at a predetermined height position. The substrate support portion is in contact with the lower surface of the substrate and is provided at a reference height position. The substrate reference portion is open to the support reference surface portion. And a substrate suction portion that is provided in the housing portion and sucks the lower surface of the substrate. When the lower surface of the substrate is sucked by the substrate suction portion, the lower surface of the substrate comes into contact with the support reference surface portion. The substrate is formed so as to be held at a predetermined height position, and the support reference surface portion is at least an end portion in the transport direction among the edge portions of the housing portion positioned at the transport direction end of the substrate support portion. A cutout portion formed lower than the reference height position is formed on the side.

本発明によれば、基板支持部の搬送方向最端部に位置する収容部の縁部のうち、少なくとも搬送方向端部側に切欠部が形成されているため、吸着による基板の変形量を抑えることができる。すなわち、収容部の基板吸着部により吸引力が発生すると、基板が収容部内に引き込まれ、基板の下面が収容部の縁部に当接して変形するが、搬送方向最端部側に位置する収容部の搬送方向端部側には切欠部が形成されているため、支持基準面部の基準高さ位置よりも低く形成されている。そのため、収容部に引き込まれて変形する基板の下面に当接する縁部が存在しなくなり、基板の変形を抑えることができる。すなわち、従来のように切欠部が形成されていない場合には、搬送方向最端部に位置する収容部の搬送方向端部側(隣接する収容部がない側)で縁部に当接する基板が最も大きく変形するが、搬送方向端部側に切欠部が形成されていることにより、収容部内に引き込まれて縁部に当接することによる基板の変形を抑えることができ、浮上した基板を吸着して保持しても、基板の平坦度が損なわれるのを抑えることができる。   According to the present invention, since the notch portion is formed at least on the transport direction end portion side of the edge portion of the accommodating portion located at the transport direction end of the substrate support portion, the deformation amount of the substrate due to suction is suppressed. be able to. That is, when a suction force is generated by the substrate suction portion of the housing portion, the substrate is drawn into the housing portion, and the lower surface of the substrate contacts the edge of the housing portion and deforms, but the housing located on the end side in the transport direction Since the notch is formed on the end side in the conveyance direction of the part, it is formed lower than the reference height position of the support reference surface part. Therefore, there is no edge that contacts the lower surface of the substrate that is pulled into the housing portion and deforms, and deformation of the substrate can be suppressed. That is, when the notch portion is not formed as in the prior art, the substrate that contacts the edge portion on the transport direction end portion side (the side where there is no adjacent storage portion) of the storage portion located at the transport direction endmost portion is Although it deforms the most, the notch is formed on the end side in the transport direction, so that deformation of the substrate due to being drawn into the accommodating portion and coming into contact with the edge can be suppressed, and the floating substrate is adsorbed. Even if held, the flatness of the substrate can be prevented from being impaired.

また、前記収容部の縁部は円形を有しており、前記切欠部は、搬送方向最端部に位置する前記収容部の縁部のうち、前記基板支持部の搬送方向端部に最も近い部分に形成されている構成にしてもよい。   Moreover, the edge part of the said accommodating part has circular shape, and the said notch part is nearest to the conveyance direction edge part of the said board | substrate support part among the edge parts of the said accommodating part located in the conveyance direction most end part. You may make it the structure currently formed in the part.

この構成によれば、基板が収容部に吸引されると、縁部のうち、搬送方向端部に最も近い部分に基板の裏面が当接して基板の変形量が大きくなるため、この部分に切欠部を設けることにより基板が当接するのを回避でき、基板の平坦度が損なわれるのを抑えることができる。   According to this configuration, when the substrate is sucked into the housing portion, the back surface of the substrate comes into contact with the portion of the edge closest to the end in the transport direction and the amount of deformation of the substrate increases. By providing the portion, it is possible to prevent the substrate from coming into contact, and it is possible to prevent the flatness of the substrate from being impaired.

また、前記切欠部は、前記搬送方向最端部に位置する前記収容部の縁部のうち、前記基板支持部の搬送方向端部側の全体領域に亘って形成されている構成にしてもよい。   Further, the cutout portion may be configured to be formed over the entire region on the conveyance direction end portion side of the substrate support portion in the edge portion of the housing portion located at the extreme end portion in the conveyance direction. .

この構成によれば、切欠部は、搬送方向最端部に位置する収容部の縁部のうち、搬送方向端部側の全体領域に亘って形成されていることにより、切欠部が縁部の一部に設けられている場合に比べて、基板支持部の搬送方向端部側における基板の変形量をより効果的に抑えることができる。   According to this configuration, the notch portion is formed over the entire region on the transport direction end portion side of the accommodating portion located at the transport direction end, so that the notch portion is the edge portion. Compared with the case where the substrate is provided in part, the amount of deformation of the substrate on the side of the substrate support portion in the transport direction can be more effectively suppressed.

また、前記収容部は、搬送方向に複数配列されて設けられており、前記切欠部は、前記収容部間側の縁部に形成されている構成にしてもよい。   Further, a plurality of the accommodating portions may be arranged in the transport direction, and the cutout portion may be formed at an edge portion between the accommodating portions.

この構成によれば、縁部のうち、搬送方向端部側だけでなく、収容部間側にも切欠部が設けられるため、収容部に吸引された基板の裏面が当接するのを回避することができ、基板の平坦度が損なわれるのを抑えることができる。   According to this configuration, since the notch portion is provided not only on the edge portion side in the conveyance direction but also on the inter-accommodating portion side of the edge portion, it is possible to avoid contact of the back surface of the substrate sucked into the accommodating portion. And the deterioration of the flatness of the substrate can be suppressed.

そして、前記切欠部は、隣り合う収容部に形成された切欠部と連結して形成されている構成にしてもよい。   And the said notch part may be set as the structure currently connected with the notch part formed in the adjacent accommodating part.

また、前記切欠部は、前記収容部の縁部から前記基板支持部の端部まで延びて形成されている構成にしてもよい。   The cutout portion may be formed to extend from an edge portion of the housing portion to an end portion of the substrate support portion.

この構成によれば、前記搬送方向最端部に位置する前記収容部の縁部から基板支持部の端部に亘って切欠部が形成されるため、収容部に吸引された基板の裏面が支持基準面部(収容部の縁部を含む)に当接するのを回避することができ、当接する基板の搬送方向端部に位置する基板の変形量を抑えることができる。   According to this configuration, since the notch portion is formed from the edge portion of the accommodating portion located at the end portion in the transport direction to the end portion of the substrate supporting portion, the back surface of the substrate sucked into the accommodating portion is supported. It is possible to avoid contact with the reference surface portion (including the edge portion of the housing portion), and it is possible to suppress the deformation amount of the substrate located at the transport direction end of the contacting substrate.

また、前記基板吸着部は、基板の裏面に吸着する先端部が伸縮性を有しており、その先端部は、基板がない状態では支持基準面部から突出し、基板が載置された状態では、基板の下面を吸着しつつ収縮することにより基板の下面が支持基準面部に当接するように形成されており、前記先端部が完全に収縮した状態では、先端部の高さ位置が支持基準面部の高さ位置に設定されている構成にしてもよい。   Further, the substrate suction portion has a stretchable tip portion that is attracted to the back surface of the substrate, and the tip portion protrudes from the support reference surface portion when there is no substrate, and in a state where the substrate is placed, The bottom surface of the substrate is formed so as to contact the support reference surface portion by contracting while adsorbing the bottom surface of the substrate, and in the state where the tip portion is completely contracted, the height position of the tip portion is the height of the support reference surface portion. It may be configured to be set at the height position.

この構成によれば、吸着部が完全に収縮した状態では、先端部の高さ位置が支持基準面部の高さ位置に設定されているため、基板が収容部に引き込まれても基板の高さ位置を支持基準面に維持することができる。よって、浮上した基板を吸着して保持しても基板の平坦度が損なわれるのを抑えることができる。   According to this configuration, when the suction portion is completely contracted, the height position of the tip portion is set to the height position of the support reference surface portion. The position can be maintained on the support reference plane. Therefore, even if the floating substrate is sucked and held, it is possible to suppress the flatness of the substrate from being impaired.

また、前記切欠部には、吸引力が発生するように形成されている構成にしてもよい。   The cutout portion may be configured to generate a suction force.

この構成によれば、基板の浮き上がりを抑えることができる。すなわち、収容部に吸引力が発生すると、基板のうち、収容部に対応する部分は収容部に吸引されて支持基準面部の高さ位置に保持される。一方、切欠部では、基板の下面が当接するのを回避できるが、収容部から離れるに従って、基板が支持基準面部の高さ位置よりも高く浮き上がるが、切欠部に吸引力を発生することにより、基板の浮き上がりを抑えることができる。   According to this configuration, the floating of the substrate can be suppressed. That is, when a suction force is generated in the housing portion, a portion of the substrate corresponding to the housing portion is sucked by the housing portion and held at the height position of the support reference surface portion. On the other hand, in the notch portion, it is possible to avoid the lower surface of the substrate from abutting, but as the distance from the housing portion, the substrate rises higher than the height position of the support reference surface portion, but by generating a suction force in the notch portion, The floating of the substrate can be suppressed.

また、前記切欠部上には、前記支持基準面部と同じ高さ位置の多孔質部材が設けられており、多孔質部材に吸引力が発生するように形成されている構成にしてもよい。   In addition, a porous member having the same height as the support reference surface portion may be provided on the cutout portion, and the porous member may be configured to generate a suction force.

この構成によれば、収容部に吸引力を発生させて基板が収容部に引き込まれ基板が浮き上がった場合でも、切欠部に設けられた多孔質部材の吸引力により基板が吸引され、この多孔質部材が支持基準面部と同じ高さ位置に設定されているため、吸引された基板が支持基準面部と同じ高さ位置に保持される。したがって、浮上した基板を吸着して保持しても基板の平坦度が損なわれるのを抑えることができる。   According to this configuration, even when a suction force is generated in the housing portion and the substrate is drawn into the housing portion and the substrate is lifted, the substrate is sucked by the suction force of the porous member provided in the notch portion. Since the member is set at the same height as the support reference surface, the sucked substrate is held at the same height as the support reference surface. Therefore, it is possible to suppress the flatness of the substrate from being lost even if the floating substrate is sucked and held.

本発明によれば、浮上した基板を吸着して保持しても、基板の平坦度が損なわれるのを抑えることができる。   According to the present invention, even if the floating substrate is sucked and held, it is possible to prevent the flatness of the substrate from being impaired.

本発明の一実施形態における基板浮上搬送装置と組み合わされる塗布装置を概略的に示す斜視図である。It is a perspective view which shows roughly the coating device combined with the board | substrate floating conveyance apparatus in one Embodiment of this invention. 塗布装置と組み合わされた上記基板浮上搬送装置を搬送方向に見た図である。It is the figure which looked at the said substrate floating conveyance apparatus combined with the coating device in the conveyance direction. 上記基板浮上搬送装置において、浮上した基板を保持した状態をX軸方向に見た図である。In the said board | substrate levitation conveyance apparatus, it is the figure which looked at the state holding the board | substrate which floated in the X-axis direction. 上記基板浮上搬送装置の基板保持ユニットをY軸方向に見た図である。It is the figure which looked at the substrate holding unit of the above-mentioned substrate floating conveyance device in the Y-axis direction. 上記基板浮上搬送装置の基板支持部を示す図であり、(a)は、上方から見た図、(b)は(a)におけるA−A断面図、(c)は、基板を吸着した状態を示す図である。It is a figure which shows the board | substrate support part of the said board | substrate floating conveyance apparatus, (a) is the figure seen from upper direction, (b) is AA sectional drawing in (a), (c) is the state which adsorb | sucked the board | substrate FIG. 上記基板浮上搬送装置の基板保持部の吸着パッドを示す図であり、(a)は吸着する前の状態を示す図であり、(b)は吸着した状態を示す図である。It is a figure which shows the suction pad of the board | substrate holding | maintenance part of the said substrate floating conveyance apparatus, (a) is a figure which shows the state before adsorbing, (b) is a figure which shows the adsorbed state. 上記基板浮上搬送装置の基板支持部を示す図であり、(a)は基板を吸着した状態を示す図、(b)従来の基板支持部において基板を吸着した状態を示す図である。It is a figure which shows the board | substrate support part of the said substrate floating conveyance apparatus, (a) is a figure which shows the state which adsorb | sucked the board | substrate, (b) It is a figure which shows the state which adsorb | sucked the substrate in the conventional board | substrate support part. 上記基板浮上搬送装置の基板支持部を示す図であり、(a)は切欠部を搬送方向最端部の収容部において、基板支持部の端部に最も近い縁部に部分的に設けた例を示す図、(b)は(a)の切欠部が基板支持部の端部まで延びている形状を示す図、(c)は切欠部を搬送方向最端部の収容部において、搬送方向端部側の全体領域に亘って設けた例を示す図、(d)は切欠部を収容部間側に位置する縁部の一部に設ける例を示す図、(e)は切欠部を支持基準面部全体に亘って設けた例を示す図である。It is a figure which shows the board | substrate support part of the said board | substrate floating conveyance apparatus, (a) is the example which provided the notch part partially in the edge part nearest to the edge part of a board | substrate support part in the accommodating part of the conveyance direction end part. FIG. 5B is a diagram illustrating a shape in which the notch portion of FIG. 5A extends to the end portion of the substrate support portion, and FIG. 5C is an end in the transport direction at the housing portion at the extreme end in the transport direction. The figure which shows the example provided over the whole area | region of the part side, (d) is a figure which shows the example which provides a notch part in a part of edge part located in the side between accommodating parts, (e) is a support reference | standard It is a figure which shows the example provided over the whole surface part. 切欠部に溝を形成した例を示す図であり、(a)は、基板支持部を上方から見た図、(b)は(a)のB−B断面図である。It is a figure which shows the example which formed the groove | channel in the notch part, (a) is the figure which looked at the board | substrate support part from upper direction, (b) is BB sectional drawing of (a). 切欠部に多孔質部材を設けた例を示す図であり、(a)基板支持部を上方から見た図、(b)は(a)のB−B断面図である。It is a figure which shows the example which provided the porous member in the notch part, (a) The figure which looked at the board | substrate support part from upper direction, (b) is BB sectional drawing of (a). 切欠部の形状を示す図であり、(a)は切欠部がテーパ状に形成された図、(b)は切欠部が曲線状に形成された図である。It is a figure which shows the shape of a notch part, (a) is the figure in which the notch part was formed in the taper shape, (b) is the figure in which the notch part was formed in the curve shape. 従来の基板浮上搬送装置の一実施形態を示す概略的な斜視図である。It is a schematic perspective view which shows one Embodiment of the conventional board | substrate floating conveyance apparatus. 従来の基板保持ユニットをY軸方向に見た図であり、(a)は、基板を保持していない高さ位置に下降した状態を示す図であり、(b)は、基板を保持する高さ位置に上昇した状態を示す図である。It is the figure which looked at the conventional board | substrate holding unit in the Y-axis direction, (a) is a figure which shows the state which fell to the height position which is not holding a board | substrate, (b) is the height which hold | maintains a board | substrate. It is a figure which shows the state raised to the vertical position. 従来の基板支持部を示す図であり、(a)はY軸方向から見た図、(b)は上方から見た図である。It is a figure which shows the conventional board | substrate support part, (a) is the figure seen from the Y-axis direction, (b) is the figure seen from upper direction. 従来の基板支持部の断面図である。It is sectional drawing of the conventional board | substrate support part.

以下、本発明の基板浮上搬送装置に係る実施の形態について図面を用いて説明する。   DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments according to the present invention will be described below with reference to the drawings.

図1は、本発明の基板浮上搬送装置1と組み合わされる塗布装置2を概略的に示す斜視図であり、図2は、図1における基板浮上搬送装置1と組み合わされる塗布装置2の正面図である。なお、本実施形態では、塗布装置2と組み合わせた例について説明するが、浮上する基板を処理する基板処理装置であれば、塗布装置2以外でも適用することができる。   FIG. 1 is a perspective view schematically showing a coating apparatus 2 combined with the substrate floating conveyance apparatus 1 of the present invention, and FIG. 2 is a front view of the coating apparatus 2 combined with the substrate floating conveyance apparatus 1 in FIG. is there. In addition, although this embodiment demonstrates the example combined with the coating device 2, if it is a substrate processing apparatus which processes the board | substrate which floats, it can apply also except the coating device 2. FIG.

図1、図2において、基板Wを搬送させる基板浮上搬送装置1は、搬送される基板Wに塗布膜を形成する塗布装置2の塗布ユニット21と組み合わされており、一連の基板処理装置を形成している。この基板浮上搬送装置1は、一方向に延びる浮上ステージ部10を有しており、この浮上ステージ部10の延びる方向に沿って基板Wが搬送される。図1の例では、浮上ステージ部10は、X軸方向に延びて形成されており、基板WがX軸方向に上流側(前工程側)から下流側(後工程側)に搬送されるようになっている。そして、塗布ユニット21から塗布液を吐出することにより、基板W上に塗布膜が形成される。   In FIG. 1 and FIG. 2, a substrate floating transfer device 1 that transfers a substrate W is combined with a coating unit 21 of a coating device 2 that forms a coating film on the substrate W to be transferred to form a series of substrate processing devices. doing. The substrate levitation transport apparatus 1 has a levitation stage portion 10 extending in one direction, and the substrate W is transported along the direction in which the levitation stage portion 10 extends. In the example of FIG. 1, the levitation stage unit 10 is formed to extend in the X-axis direction so that the substrate W is transported from the upstream side (pre-process side) to the downstream side (post-process side) in the X-axis direction. It has become. Then, a coating film is formed on the substrate W by discharging the coating liquid from the coating unit 21.

具体的には、基板Wが浮上ステージ部10に浮上された状態でX軸方向に搬送されつつ、塗布ユニット21から塗布液が吐出されることにより、基板W上に均一厚さの塗布膜が形成されるようになっている。   Specifically, a coating film having a uniform thickness is formed on the substrate W by discharging the coating liquid from the coating unit 21 while being transported in the X-axis direction while the substrate W is floated on the floating stage unit 10. It is supposed to be formed.

以下の説明では、基板Wが搬送される方向をX軸方向とし、X軸方向が搬送方向に相当する。また、X軸方向と水平面上で直交する方向をY軸方向とし、特にY軸方向を川幅方向ともいう。そして、X軸方向及びY軸方向の双方に直交する方向をZ軸方向として説明を進めることとする。   In the following description, the direction in which the substrate W is transported is the X-axis direction, and the X-axis direction corresponds to the transport direction. Further, the direction orthogonal to the X-axis direction on the horizontal plane is defined as the Y-axis direction, and the Y-axis direction is also referred to as the river width direction. The description will be made with the direction orthogonal to both the X-axis direction and the Y-axis direction as the Z-axis direction.

塗布ユニット21は、基板Wに塗布液を塗布するものであり、フレーム部22と塗布器23とを有している。フレーム部22は、浮上ステージ部10のY軸方向両側にそれぞれ配置される支柱22aを有しており、この支柱22aに塗布器23が設けられている。具体的には、支柱22aは、Y軸方向(川幅方向)両側に固定して設けられており、後述する基板保持部30の走行を妨げることのないように、基板保持部30の走行経路よりも外側に配置されている。そして、これらの支柱22aに塗布器23が架け渡されており、塗布器23が浮上ステージ部10を横切る状態で取り付けられている。また、支柱22aには昇降機構が設けられており、昇降機構を作動させることにより塗布器23がZ方向に移動できるようになっている。すなわち、昇降機構により塗布器23が浮上ステージ部10に対して接離動作できるようになっている。   The application unit 21 applies an application liquid to the substrate W, and includes a frame portion 22 and an applicator 23. The frame portion 22 has support columns 22a arranged on both sides in the Y-axis direction of the levitation stage unit 10, and an applicator 23 is provided on the support column 22a. Specifically, the support columns 22a are fixedly provided on both sides in the Y-axis direction (river width direction), so that the travel of the substrate holding unit 30 to be described later is prevented from being hindered. Is also arranged on the outside. And the applicator 23 is spanned over these support | pillars 22a, and the applicator 23 is attached in the state which crosses the floating stage part 10. FIG. The support 22a is provided with a lifting mechanism, and the applicator 23 can move in the Z direction by operating the lifting mechanism. That is, the applicator 23 can be moved toward and away from the floating stage unit 10 by the lifting mechanism.

塗布器23は、塗布液を吐出するものであり、一方向に延びて形成されている。この塗布器23は、一方向に延びるスリットノズル23a(図2参照)が形成されており、塗布器23内に貯留された塗布液をスリットノズル23aから吐出できるようになっている。具体的には、スリットノズル23aは、浮上ステージ部10と対向する面に形成されており、塗布器23はスリットノズル23aが川幅方向に延びる状態で設置されている。そして、搬送される基板Wに対して塗布器23を昇降させて基板Wとスリットノズル23aとの距離を所定の距離に合わせた状態で、スリットノズル23aから塗布液を吐出することにより、川幅方向に一様な塗布膜が搬送方向に連続的に形成されるようになっている。そして、スリットノズル23aから塗布液を吐出させつつ、基板Wを移動させることにより、基板W上には、均一厚さの塗布膜が形成されるようになっている。   The applicator 23 is for discharging a coating liquid and is formed to extend in one direction. The applicator 23 is formed with a slit nozzle 23a (see FIG. 2) extending in one direction so that the application liquid stored in the applicator 23 can be discharged from the slit nozzle 23a. Specifically, the slit nozzle 23a is formed on a surface facing the levitation stage unit 10, and the applicator 23 is installed in a state where the slit nozzle 23a extends in the river width direction. Then, in the state where the applicator 23 is moved up and down with respect to the substrate W to be transported and the distance between the substrate W and the slit nozzle 23a is adjusted to a predetermined distance, the coating liquid is ejected from the slit nozzle 23a. A uniform coating film is continuously formed in the transport direction. A coating film having a uniform thickness is formed on the substrate W by moving the substrate W while discharging the coating liquid from the slit nozzle 23a.

また、基板浮上搬送装置1は、基板Wを浮上させつつ、一方向(本実施形態ではX軸方向)に搬送させるものである。基板浮上搬送装置1は、基板Wを浮上させる浮上ステージ部10と、浮上ステージ部10に浮上させた基板Wを保持し搬送させる基板搬送ユニット3とを有している。   Further, the substrate levitation transport apparatus 1 transports the substrate W in one direction (X-axis direction in the present embodiment) while levitating. The substrate levitation transport apparatus 1 includes a levitation stage unit 10 that levitates the substrate W, and a substrate transport unit 3 that holds and transports the substrate W levitated on the levitation stage unit 10.

浮上ステージ部10は、基板Wを浮上させるものであり、本実施形態ではエア浮上機構を有している。浮上ステージ部10は、基台11上に平板部12が設けられて形成されており、複数枚の平板部12がX軸方向に沿って配列されて形成されている。すなわち、平板部12は、平滑な基板浮上面12a(図3参照)を有しており、それぞれの基板浮上面12aが均一高さになるように配列されている。そして、基板浮上面12aには、搬送させる基板Wとの間に空気層が形成されることにより基板Wを所定高さ位置に浮上させることができるようになっている。具体的には、平板部12には、基板浮上面12aに開口する微小な噴出口(不図示)と吸引口(不図示)とが形成されており、噴出口とコンプレッサとが配管で接続され、吸引口と真空ポンプとが配管で接続されている。そして、噴出口から噴出されるエアと吸引口に発生する吸引力とをバランスさせることにより、基板Wが基板浮上面12aから所定高さに水平の姿勢で浮上させることができるようになっている。これにより、基板Wの平面姿勢(平面度という)を高精度に維持した状態で搬送できるようになっている。   The levitation stage unit 10 levitates the substrate W, and has an air levitation mechanism in the present embodiment. The levitation stage unit 10 is formed by providing a flat plate portion 12 on a base 11, and is formed by arranging a plurality of flat plate portions 12 along the X-axis direction. That is, the flat plate portion 12 has a smooth substrate air bearing surface 12a (see FIG. 3), and the substrate air bearing surfaces 12a are arranged so as to have a uniform height. An air layer is formed between the substrate floating surface 12a and the substrate W to be transported, so that the substrate W can be floated to a predetermined height position. Specifically, the flat plate portion 12 is formed with a fine jet port (not shown) and a suction port (not shown) that open to the substrate floating surface 12a, and the jet port and the compressor are connected by a pipe. The suction port and the vacuum pump are connected by piping. Then, by balancing the air ejected from the ejection port and the suction force generated at the suction port, the substrate W can be floated in a horizontal posture at a predetermined height from the substrate air bearing surface 12a. . As a result, the substrate W can be transported in a state in which the planar posture (referred to as flatness) is maintained with high accuracy.

また、浮上ステージ部10の平板部12は、そのY軸方向寸法が搬送される基板WのY軸方向寸法よりも小さく形成されており、基板浮上面12a上に基板Wを載置すると、基板浮上面12aから基板WのY軸方向端部がはみ出した状態となる。このはみ出した部分(はみ出し領域T)を後述の基板搬送ユニット3で保持することにより、基板Wを搬送できるようになっている。この平板部12のY軸方向寸法は、はみ出し領域Tが基板保持部30で保持できる必要最小限の寸法になるように設定されている。すなわち、はみ出し領域Tは、基板保持部30で基板Wのはみ出し領域Tを保持した場合に、基板保持部30と平板部12との間に互いに接触することのない僅かな隙間が形成される程度に設定されている。   Further, the flat plate portion 12 of the levitation stage portion 10 is formed such that the dimension in the Y-axis direction is smaller than the dimension in the Y-axis direction of the substrate W to be transported, and when the substrate W is placed on the substrate floating surface 12a, the substrate The end of the substrate W in the Y-axis direction protrudes from the air bearing surface 12a. By holding the protruding portion (protruding region T) by the substrate transfer unit 3 described later, the substrate W can be transferred. The dimension of the flat plate portion 12 in the Y-axis direction is set so that the protruding region T has a minimum necessary size that can be held by the substrate holding portion 30. That is, the protruding region T is such that a slight gap that does not contact each other is formed between the substrate holding unit 30 and the flat plate portion 12 when the substrate holding unit 30 holds the protruding region T of the substrate W. Is set to

また、基板搬送ユニット3は、浮上状態の基板Wを搬送させるものであり、基板Wを保持する基板保持ユニット30と、基板保持ユニット30を走行させる搬送駆動部31とを有している。   The substrate transport unit 3 transports the floating substrate W, and includes a substrate holding unit 30 that holds the substrate W and a transport drive unit 31 that causes the substrate holding unit 30 to travel.

搬送駆動部31は、基板保持ユニット30を搬送方向に移動させるように構成されており、浮上ステージ部10に沿って搬送方向に延びる搬送レール部31aと、この搬送レール部31a上を走行するベース部31bとで形成されている。具体的には、搬送方向に延びるように設けられた基台31c(図2参照)が浮上ステージ部10の川幅方向両側に配置されており、それぞれの基台31c上に搬送レール部31aが設けられている。すなわち、搬送レール部31aが浮上ステージ部10に沿って途切れることなく連続して設けられている。また、ベース部31bは、凹形状に形成された板状部材であり、図2に示すように、搬送レール部31aの上面を覆うように設けられている。具体的には、ベース部31bは、エアパッド(不図示)を介して搬送レール部31aに覆うように設けられており、リニアモータ(不図示)を駆動させることにより、ベース部31bが搬送レール部31a上を走行するようになっている。すなわち、リニアモータを駆動制御することにより、ベース部31bが搬送レール部31a上を接触することなく走行し、所定の位置で停止できるようになっている。   The transport driving unit 31 is configured to move the substrate holding unit 30 in the transport direction, and includes a transport rail unit 31a that extends in the transport direction along the floating stage unit 10, and a base that travels on the transport rail unit 31a. It is formed with the part 31b. Specifically, bases 31c (see FIG. 2) provided so as to extend in the transport direction are disposed on both sides in the river width direction of the levitation stage unit 10, and transport rails 31a are provided on the respective bases 31c. It has been. That is, the conveyance rail part 31a is continuously provided along the levitation stage part 10 without interruption. Moreover, the base part 31b is a plate-shaped member formed in a concave shape, and as shown in FIG. 2, it is provided so that the upper surface of the conveyance rail part 31a may be covered. Specifically, the base portion 31b is provided so as to cover the transport rail portion 31a via an air pad (not shown), and the base portion 31b is moved to the transport rail portion by driving a linear motor (not shown). It runs on 31a. That is, by driving and controlling the linear motor, the base portion 31b can travel without contacting the transport rail portion 31a and can be stopped at a predetermined position.

また、基板保持ユニット30は、基板Wを保持するものであり、ベース部31bに取り付けられている。具体的には、図4に示すように、基板保持ユニット30は、搬送方向に延びる保持フレーム部40と、この保持フレーム部40に取り付けられた基板支持部41とを有しており、この保持フレーム部40がベース部31bと昇降部42を介して連結されている。そして、昇降部42を駆動させることにより保持フレーム部40が昇降動作し、基板支持部41が基板Wの裏面(下面ともいう)に対して接離できるようになっている。   The substrate holding unit 30 is for holding the substrate W and is attached to the base portion 31b. Specifically, as shown in FIG. 4, the substrate holding unit 30 includes a holding frame portion 40 extending in the transport direction and a substrate support portion 41 attached to the holding frame portion 40. The frame part 40 is connected to the base part 31b via the elevating part 42. Then, by driving the elevating part 42, the holding frame part 40 moves up and down, and the substrate support part 41 can come into contact with and separate from the back surface (also referred to as the lower surface) of the substrate W.

保持フレーム部40は、基板支持部41を取り付けるためのものであり、長尺の平板形状を有している。この保持フレーム部40は、それぞれのベース部31b上に配置されており、ベース部31b上に昇降部42を介して配置されている。この保持フレーム部40は、浮上ステージ部10を川幅方向に挟むように配置され、その長手方向が搬送方向に沿うように配置されている。そして、搬送駆動部31を駆動させると、2つの保持フレーム部40が同調し浮上ステージ部10に沿って走行するようになっている。   The holding frame portion 40 is for attaching the substrate support portion 41 and has a long flat plate shape. The holding frame portion 40 is disposed on each base portion 31b, and is disposed on the base portion 31b via an elevating portion 42. The holding frame portion 40 is disposed so as to sandwich the floating stage portion 10 in the river width direction, and the longitudinal direction thereof is disposed along the transport direction. When the conveyance driving unit 31 is driven, the two holding frame units 40 are synchronized and travel along the levitation stage unit 10.

また、保持フレーム部40の長手方向の長さは、搬送される基板Wの搬送方向長さに応じて形成されており、保持フレーム部40の上端部分には、複数の基板支持部41が配置されている。すなわち、昇降部42を駆動させて保持フレーム部40が上昇するとすべての基板支持部41が一度に上昇し、保持フレーム部40が下降するとすべての基板支持部41が一度に下降する。これにより、基板支持部41毎に昇降部42を有している場合に比べて構成が容易になり、制御が複雑化するのを回避することができる。   The length of the holding frame portion 40 in the longitudinal direction is formed according to the length of the transported substrate W in the transport direction, and a plurality of substrate support portions 41 are arranged at the upper end portion of the holding frame portion 40. Has been. That is, when the elevating part 42 is driven and the holding frame part 40 is raised, all the substrate support parts 41 are raised at once, and when the holding frame part 40 is lowered, all the substrate support parts 41 are lowered at once. Thereby, compared with the case where the board | substrate support part 41 has the raising / lowering part 42, a structure becomes easy and it can avoid that control becomes complicated.

また、本実施形態では、保持フレーム部40には、それぞれの基板支持部41が等間隔に配置されており、搬送方向一方側端部から他方側端部までの寸法は、基板Wの搬送方向長さ以下になるように設定されている。すなわち、基板Wが浮上ステージ部10上に浮上している状態で、保持フレーム部40を上昇させると、すべての基板支持部41が基板Wの下面に当接し、保持フレーム部40を下降させると、すべての基板支持部41が基板Wから離れるようになっている。   Further, in the present embodiment, the holding frame portion 40 has the substrate support portions 41 arranged at equal intervals, and the dimension from the one end portion to the other end portion in the transport direction is the transport direction of the substrate W. It is set to be less than the length. That is, when the holding frame unit 40 is raised while the substrate W is floating on the floating stage unit 10, all the substrate support units 41 come into contact with the lower surface of the substrate W and the holding frame unit 40 is lowered. All the substrate support portions 41 are separated from the substrate W.

また、基板支持部41は、基板Wを吸着保持するものであり、ほぼ直方体のブロック状に形成されている。基板支持部41は、長手方向が基板Wの搬送方向(X軸方向)に沿って配置されており、複数の基板支持部41が搬送方向に沿って一列に配列されている。この基板支持部41は、基板Wの下面に当接させる支持基準面部41aと、この支持基準面部41aに開口して形成される収容部5と、収容部5内に設けられ基板Wの下面を吸着する基板吸着部6とを有している(図5〜図7参照)。   Further, the substrate support portion 41 is configured to suck and hold the substrate W and is formed in a substantially rectangular parallelepiped block shape. The substrate support part 41 has a longitudinal direction arranged along the transport direction (X-axis direction) of the substrate W, and a plurality of substrate support parts 41 are arranged in a line along the transport direction. The substrate support portion 41 includes a support reference surface portion 41a that is brought into contact with the lower surface of the substrate W, an accommodation portion 5 that is formed by opening the support reference surface portion 41a, and a lower surface of the substrate W that is provided in the accommodation portion 5. It has the board | substrate adsorption | suction part 6 to adsorb | suck (refer FIGS. 5-7).

支持基準面部41aは、基板支持部41の上面部分に位置しており、平坦な平面形状に形成されている。この支持基準面部41aは、各基板支持部41で同一高さ(基準高さ位置という)に設定されいる。したがって、保持フレーム部40の昇降動作に合わせて、各支持基準面部41aも昇降動作し、保持フレーム部40が上昇し浮上した基板Wの下面に当接する位置、すなわち保持フレーム部40が下降し基板Wから離れる位置にすべての基板支持部41の支持基準面部41aが位置することができる。したがって、基板Wを吸着させて基板Wの下面を支持基準面部41aに当接させることにより、基板Wを所定の高さ位置に保持できるようになっている。   The support reference surface portion 41a is located on the upper surface portion of the substrate support portion 41, and is formed in a flat planar shape. The support reference surface portion 41a is set to the same height (referred to as a reference height position) in each substrate support portion 41. Accordingly, in accordance with the raising and lowering operation of the holding frame portion 40, each support reference surface portion 41a also moves up and down, and the position where the holding frame portion 40 rises and comes into contact with the lower surface of the substrate W, that is, the holding frame portion 40 lowers and moves to the substrate. The support reference surface portions 41a of all the substrate support portions 41 can be located at positions away from W. Therefore, the substrate W can be held at a predetermined height position by adsorbing the substrate W and bringing the lower surface of the substrate W into contact with the support reference surface portion 41a.

収容部5は、基板吸着部6を収容するものであり、支持基準面部41aに開口して形成されている。本実施形態では、図5に示すように、収容部5は、各基板支持部41の支持基準面部41aに5つ設けられている。これらの収容部5は、搬送方向に沿って一列に配置されており、基板支持部41の端部側から等間隔で配置されている。これらの収容部5は、すべて同じ形状を有しており、本実施形態では、支持基準面部41aに開口する円筒形状に形成されている。すなわち、支持基準面部41aには、収容部5の縁部51が円形に形成されている。ここで、収容部5は、基板支持部41の端部に最も近い位置に配置される収容部5(搬送方向最端部に位置する収容部5)を他の収容部5と区別して呼ぶ場合には、特に収容部5aと呼ぶが、それぞれの収容部5を区別して呼ぶ必要がない場合は、単に収容部5と呼ぶことにする。   The accommodating part 5 accommodates the board | substrate adsorption | suction part 6, and is opened and formed in the support reference surface part 41a. In the present embodiment, as shown in FIG. 5, five accommodating portions 5 are provided on the support reference surface portion 41 a of each substrate support portion 41. These accommodating portions 5 are arranged in a line along the conveyance direction, and are arranged at equal intervals from the end side of the substrate support portion 41. These accommodating portions 5 all have the same shape, and in this embodiment, are formed in a cylindrical shape that opens to the support reference surface portion 41a. That is, the edge portion 51 of the accommodating portion 5 is formed in a circular shape on the support reference surface portion 41a. Here, the accommodating part 5 is a case where the accommodating part 5 (accommodating part 5 located at the end in the transport direction) arranged at the position closest to the end of the substrate support part 41 is referred to as distinguishing from the other accommodating parts 5. In particular, it is referred to as the accommodating portion 5a. However, if it is not necessary to distinguish between the accommodating portions 5, they are simply referred to as the accommodating portions 5.

基板吸着部6は、基板Wを吸着するものであり、収容部5に収容されて設けられている。基板吸着部6は、図5に示すように、その先端部には弾性変形可能な蛇腹形状の吸着パッド61が設けられており、この吸着パッド61が直立した状態で収容部5に収容されている。吸着パッド61は、真空ポンプと連通して接続されており、その先端部分に吸引力を発生させることにより基板Wを吸着保持できるようになっている。すなわち、基板吸着部6の先端部は、図6(a)に示すように、通常状態(基板Wがない状態)では、収容部5から僅かに突出した状態で待機するように設定されている。そして、基板浮上面12aに基板Wが載置されると基板浮上面12aから川幅方向にはみ出した部分(はみ出し領域T)が吸着パッド61に当接する。この状態で吸着パッド61に吸引力を発生させると、基板Wの下面が吸着パッド61で吸引されつつ、その吸引状態を保ったまま、吸着パッド61自体が収容部5内に収縮して基板Wの下面が支持基準面部41aに当接し基板Wがそれぞれの支持基準面部41aで形成される所定の高さ位置に保持されるようになっている(図6(b)参照)。   The substrate adsorbing unit 6 adsorbs the substrate W and is accommodated in the accommodating unit 5. As shown in FIG. 5, the substrate suction portion 6 is provided with an elastically deformable bellows-like suction pad 61 at its tip, and the suction pad 61 is housed in the housing portion 5 in an upright state. Yes. The suction pad 61 is connected in communication with a vacuum pump, and can suck and hold the substrate W by generating a suction force at the tip portion thereof. That is, as shown in FIG. 6A, the front end of the substrate suction portion 6 is set to stand by in a state of slightly protruding from the storage portion 5 in a normal state (a state where there is no substrate W). . Then, when the substrate W is placed on the substrate floating surface 12a, a portion (protruding region T) that protrudes from the substrate floating surface 12a in the river width direction comes into contact with the suction pad 61. When a suction force is generated in the suction pad 61 in this state, the lower surface of the substrate W is sucked by the suction pad 61 and the suction pad 61 itself contracts into the housing portion 5 while maintaining the suction state. The lower surface of the substrate abuts against the support reference surface portion 41a, and the substrate W is held at a predetermined height position formed by each support reference surface portion 41a (see FIG. 6B).

また、基板支持部41には、切欠部7が形成されている。この切欠部7は、基板Wが吸着保持された際に基板Wが収容部5に引き込まれて変形することにより基板Wの平坦度が損なわれるのを抑えるためのものである。具体的には、図5に示すように、切欠部7は、長手方向(搬送方向)端部に設けられており、支持基準面部41aの基準高さ位置よりも低くなるように形成されている。本実施形態では、切欠部7は、搬送方向最端部に位置する収容部5aの縁部51から、基板収容部5の端部に亘って設けられている。すなわち、切欠部7は、搬送方向最端部に位置する収容部5aの縁部51のうち、搬送方向端部側の半円部分を含むように設けられており、その縁部51の半円部分の高さ位置が基準高さ位置よりも低くなっている。   The substrate support portion 41 is formed with a notch portion 7. The cutout portion 7 is for suppressing the flatness of the substrate W from being damaged by the substrate W being pulled into the accommodating portion 5 and deformed when the substrate W is sucked and held. Specifically, as shown in FIG. 5, the notch 7 is provided at the end in the longitudinal direction (conveying direction) and is formed to be lower than the reference height position of the support reference surface 41a. . In the present embodiment, the cutout portion 7 is provided from the edge portion 51 of the storage portion 5 a located at the end in the transport direction to the end portion of the substrate storage portion 5. That is, the notch portion 7 is provided so as to include a semicircular portion on the transport direction end portion side of the edge portion 51 of the accommodating portion 5a located at the transport direction end, and the semicircle of the edge portion 51 is provided. The height position of the part is lower than the reference height position.

なお、この切欠部7は、上述のように基準高さ位置よりも低くなるように形成されていればよく、直線的な段差を付けて基準高さ位置よりも低くなるように形成してもよい。また、図11(a)のように、切欠部7は、収容部5aの縁部51をテーパ状に形成したものでもよく、図11(b)のように、曲線的に形成してもよい。また、切欠部7は、溝状に形成されていてもよく、形成される溝が基板支持部41の底面に貫通するように形成されていてもよい。   The cutout portion 7 may be formed so as to be lower than the reference height position as described above, and may be formed to be lower than the reference height position with a linear step. Good. Further, as shown in FIG. 11A, the cutout portion 7 may be formed by tapering the edge portion 51 of the accommodating portion 5a, or may be formed in a curved shape as shown in FIG. 11B. . Further, the notch portion 7 may be formed in a groove shape, or may be formed so that the formed groove penetrates the bottom surface of the substrate support portion 41.

この切欠部7により、吸着保持された際の基板Wの変形を抑えることができる。すなわち、浮上した基板Wが基板吸着部6によって吸着保持されると、基板吸着部6の吸着パッド61が収容部5内に収縮することにより、基板Wが僅かに収容部5内に引き込まれる。基板Wが収容部5に僅かに引き込まれると、図7(b)に示すように、基板Wの下面が収容部5の縁部51に当接することにより、基板Wが浮き上がり基板Wの平坦度が損なわれる。ここで、収容部5のうち、隣に収容部5が存在する場合には、浮き上がった基板Wが収容部5に吸引されるため、基板Wをほぼ支持基準面部41aに沿わせることができる。一方、搬送方向最端部に位置する収容部5aでは、搬送方向端部側に収容部5が存在せず自由端になってしまうが、収容部5の縁部51が切欠部7により切り取られているため、基板Wの下面に当接する縁部51がなく、従来の図7(b)のように縁部51に当接して基板Wが収容部5から離れるにしたがって支持基準面部41aから離れるように(浮き上がるように)変形すること(図7における一点鎖線部分)を回避することができる。   The cutout 7 can suppress the deformation of the substrate W when being sucked and held. That is, when the floating substrate W is sucked and held by the substrate suction portion 6, the suction pad 61 of the substrate suction portion 6 contracts into the housing portion 5, so that the substrate W is slightly pulled into the housing portion 5. When the substrate W is slightly pulled into the housing portion 5, the lower surface of the substrate W comes into contact with the edge portion 51 of the housing portion 5 as shown in FIG. Is damaged. Here, when the accommodating part 5 exists adjacently among the accommodating parts 5, since the floated board | substrate W is attracted | sucked by the accommodating part 5, the board | substrate W can be made to follow the support reference surface part 41a substantially. On the other hand, in the accommodating part 5a located in the conveyance direction end part, the accommodating part 5 does not exist in the conveyance direction edge part side, but it becomes a free end, but the edge part 51 of the accommodating part 5 is cut off by the notch part 7. FIG. Therefore, there is no edge portion 51 that contacts the lower surface of the substrate W, and the substrate W comes away from the support reference surface portion 41a as the substrate W moves away from the accommodating portion 5 as shown in FIG. It is possible to avoid such deformation (so that it floats up) (one-dot chain line portion in FIG. 7).

上記実施形態の基板浮上搬送装置によれば、基板支持部41の搬送方向最端部に位置する収容部5aの縁部51のうち、少なくとも搬送方向端部側に切欠部7が形成されているため、吸着による基板の変形量を抑えることができる。すなわち、従来のように切欠部7が形成されていない場合には、搬送方向最端部に位置する収容部5aの搬送方向端部側(隣接する収容部5がない側)で縁部51に当接する基板Wが最も大きく変形するが、搬送方向端部側に切欠部7が形成されていることにより、基板Wが収容部5内に引き込まれて縁部51に当接することによる基板Wの変形を抑えることができ、浮上した基板Wを吸着して保持しても、基板Wの平坦度が損なわれるのを抑えることができる。   According to the substrate levitation transfer apparatus of the above-described embodiment, the notch portion 7 is formed at least on the transport direction end portion side of the edge portion 51 of the accommodating portion 5a located at the transport direction endmost portion of the substrate support portion 41. Therefore, the deformation amount of the substrate due to adsorption can be suppressed. That is, when the notch portion 7 is not formed as in the prior art, the edge portion 51 is formed on the transport direction end portion side (the side without the adjacent storage portion 5) of the storage portion 5 a located at the transport direction end. The abutting substrate W is most greatly deformed. However, since the cutout portion 7 is formed on the transport direction end portion side, the substrate W is drawn into the accommodating portion 5 and abuts on the edge portion 51. Deformation can be suppressed, and even if the floating substrate W is attracted and held, the flatness of the substrate W can be suppressed from being impaired.

上記実施形態では、切欠部7が、搬送方向最端部における収容部5aの縁部51から基板支持部41の端部まで形成されている例について説明したが、図8(a)(b)に示すように、縁部51のうち、基板支持部41の端部に最も近い位置に部分的に切欠部7(ハッチング部分)が設けられるものであってもよい。すなわち、吸着による基板Wの変形は、基板Wの裏面が基板支持部41の端部に最も近い縁部51に当接することによって顕著になるため、その基板支持部41の端部に最も近い縁部51に切欠部7を設けることにより、基板Wの裏面が縁部51に当接するのを回避でき、基板Wが浮き上がるように変形するのを抑えることができる。なお、搬送方向最端部における収容部5の縁部51のうち、基板支持部41の端部側に位置する縁部51に当接することにより基板Wが変形する虞があるため、図8(c)に示すように、搬送方向最端部における収容部5の縁部51のうち、基板支持部41の搬送方向端部側の全体領域に亘って形成されていてもよい。   In the said embodiment, although the notch part 7 demonstrated the example currently formed from the edge part 51 of the accommodating part 5a in the conveyance direction end part to the edge part of the board | substrate support part 41, Fig.8 (a) (b) As shown in FIG. 5, the notch 7 (hatched portion) may be partially provided in the edge 51 at a position closest to the end of the substrate support 41. That is, the deformation of the substrate W due to the suction becomes remarkable when the back surface of the substrate W comes into contact with the edge portion 51 closest to the end portion of the substrate support portion 41, and thus the edge closest to the end portion of the substrate support portion 41. By providing the notch portion 7 in the portion 51, it is possible to avoid the back surface of the substrate W from coming into contact with the edge portion 51, and it is possible to suppress the substrate W from being deformed so as to be lifted. In addition, since there exists a possibility that the board | substrate W may deform | transform by contact | abutting to the edge part 51 located in the edge part side of the board | substrate support part 41 among the edge parts 51 of the accommodating part 5 in a conveyance direction end part, FIG. As shown to c), you may form over the whole area | region by the side of the conveyance direction edge part of the board | substrate support part 41 among the edge parts 51 of the accommodating part 5 in a conveyance direction outermost part.

上記実施形態では、切欠部7が、搬送方向最端部における収容部5の縁部51のうち、基板支持部41の端部側に設ける例について説明したが、収容部5間側に位置する縁部51にも設けてもよい。具体的には、図8(d)に示すように、収容部5間側に位置する縁部51の一部に切欠部7を設けてもよいし、図8(e)に示すように、収容部5間側の縁部51を含む支持基準面部41a全体に亘って切欠部7を設けるものであってもよい。すなわち、隣り合う収容部5に形成された切欠部7同士を連結させて設けたものであってもよい。切欠部7を収容部5間に設けることにより、基板Wを吸着した際に、収容部5間に位置する基板Wが浮き上がるのを抑えることができる。   In the said embodiment, although the notch part 7 demonstrated the example provided in the edge part side of the board | substrate support part 41 among the edge parts 51 of the accommodating part 5 in a conveyance direction end part, it is located in the accommodating part 5 side. You may provide also in the edge part 51. FIG. Specifically, as shown in FIG. 8 (d), a notch portion 7 may be provided in a part of the edge portion 51 located on the side between the accommodating portions 5, or as shown in FIG. 8 (e), The cutout portion 7 may be provided over the entire support reference surface portion 41a including the edge portion 51 between the accommodating portions 5. That is, the notch part 7 formed in the adjacent accommodating part 5 may be connected and provided. By providing the notch portion 7 between the accommodating portions 5, it is possible to prevent the substrate W positioned between the accommodating portions 5 from being lifted when the substrate W is sucked.

また、上記実施形態では、基板吸着部6の先端部、すなわち、吸着パッド61が基板Wに吸着すると収容部5内に収縮する例について説明したが、最も収縮した状態で吸着パッド61の先端部分の高さ位置が支持基準面部41aの面一と同じになるように調節されているものであってもよい。このように調節されていることにより、吸着パッド61に吸着された部分の基板Wの高さ位置が支持基準面部41aと一致するため、収容部5位置で縁部51に当接することによる基板Wの変形が抑えられ、基板Wが吸着保持された際の基板Wの平坦度が損なわれるのを抑えることができる。   In the above-described embodiment, the example in which the tip of the substrate suction portion 6, that is, the suction pad 61 contracts into the housing portion 5 when suctioned to the substrate W has been described, but the tip portion of the suction pad 61 in the most contracted state. The height position may be adjusted to be the same as that of the support reference surface portion 41a. By adjusting in this way, the height position of the portion of the substrate W sucked by the suction pad 61 coincides with the support reference surface portion 41a, so that the substrate W is brought into contact with the edge portion 51 at the housing portion 5 position. The deformation of the substrate W can be suppressed, and the flatness of the substrate W when the substrate W is sucked and held can be suppressed.

また、上記実施形態では、切欠部7に吸引力が発生しない例について説明したが、切欠部7に吸引力を発生するように形成し、基板Wが変形して浮き上がるのを抑えるものであってもよい。例えば、図8の切欠部7を溝状に形成し、この溝と真空源とを接続することにより吸引力を発生させるように構成してもよく、図9(a)(b)に示すように、切欠部7にさらに溝71を形成し、この溝71から吸引力を発生させるようにしてもよい。また、切欠部7に多孔質部材8等を設置し、多孔質部材8と真空装置を連結することにより、吸引力を発生させるように構成してもよい。例えば、図10(a)(b)に示すように、切欠部7に多孔質部材8を設置して吸引力を発生させることにより、搬送方向端部側、及び、収容部5間側の基板Wの浮き上がりを抑えることができる。そして、この多孔質部材8の高さ位置が、支持基準面部41aの高さ位置と同じ高さ位置に設定することにより、基板Wが変形して浮き上がるのを防止しつつ、基板Wを支持基準面部41aの高さ位置に保持することができるため、基板Wの平坦度が損なわれるのを極力抑えることができる。特に、収容部5(基板吸着部6)が搬送方向に離れて設けられている場合には、収容部5間隔が延びるため吸着時に基板Wが浮きやすくなるが、収容部5間に切欠部7を設け、その切欠部7に吸引力を発生させるように形成することにより、間隔が広い収容部5であっても基板Wの平坦度が損なわれるのを抑えて基板Wを精度よく保持することができる。   In the above-described embodiment, the example in which the suction force is not generated in the cutout portion 7 has been described. Also good. For example, the cutout portion 7 of FIG. 8 may be formed in a groove shape, and the groove and the vacuum source may be connected to generate a suction force, as shown in FIGS. 9 (a) and 9 (b). In addition, a groove 71 may be further formed in the cutout portion 7 and a suction force may be generated from the groove 71. Alternatively, a porous member 8 or the like may be installed in the cutout portion 7 and the porous member 8 and the vacuum device may be connected to generate a suction force. For example, as shown in FIGS. 10 (a) and 10 (b), by installing a porous member 8 in the cutout portion 7 to generate a suction force, the substrate on the end side in the transport direction and on the side between the accommodating portions 5 is used. W lift can be suppressed. And the height position of this porous member 8 is set to the same height position as the height position of the support reference surface part 41a, thereby preventing the substrate W from being deformed and floating while supporting the substrate W. Since it can hold | maintain in the height position of the surface part 41a, it can suppress as much as possible that the flatness of the board | substrate W is impaired. In particular, when the accommodation unit 5 (substrate adsorption unit 6) is provided away from the conveyance direction, the interval between the accommodation units 5 extends, so that the substrate W is likely to float during adsorption, but the notch 7 between the accommodation units 5 is provided. Is provided so as to generate a suction force at the cutout portion 7, so that the flatness of the substrate W can be prevented from being impaired even in the accommodating portion 5 having a wide interval, and the substrate W can be accurately held. Can do.

1 基板浮上搬送装置
2 塗布装置
5 収容部
6 基板吸着部
7 切欠部
8 多孔質部材
10 浮上ステージ部
30 基板保持ユニット
31 搬送駆動部
41基板支持部
41a 支持基準面部
DESCRIPTION OF SYMBOLS 1 Substrate floating conveyance apparatus 2 Coating apparatus 5 Storage part 6 Substrate adsorption part 7 Notch part 8 Porous member 10 Levitation stage part 30 Substrate holding unit 31 Conveyance drive part 41 Substrate support part 41a Support reference plane part

Claims (9)

基板を浮上させる浮上ステージ部と、
前記浮上ステージ部上に浮上された基板を保持する基板保持ユニットと、
を備え、前記基板保持ユニットを搬送方向に移動させることにより前記浮上ステージ部上の基板を浮上させた状態で搬送する基板浮上搬送装置であって、
前記基板保持ユニットは、浮上している基板の下面に当接することにより基板を所定高さ位置に保持する基板支持部を有しており、
この基板支持部は、基板の下面に当接し基準高さ位置に設けられた支持基準面部と、この支持基準面部に開口する収容部と、この収容部に設けられ基板の下面を吸着する基板吸着部とを有しており、前記基板吸着部により基板の下面が吸着されると基板の下面が前記支持基準面部に当接して基板が所定高さ位置に保持されるように形成されており、
前記支持基準面部は、前記基板支持部の搬送方向最端部に位置する前記収容部の縁部のうち、少なくとも搬送方向端部側に、基準高さ位置よりも低く形成された切欠部が形成されていることを特徴とする基板浮上搬送装置。
A levitation stage for levitating the substrate;
A substrate holding unit for holding a substrate levitated on the levitation stage portion;
A substrate levitating and conveying apparatus for conveying the substrate holding unit in a levitated state by moving the substrate holding unit in the conveying direction,
The substrate holding unit has a substrate support portion that holds the substrate at a predetermined height position by contacting the lower surface of the floating substrate,
The substrate support portion is in contact with the lower surface of the substrate and is provided at a reference height position, a receiving portion that opens to the support reference surface portion, and a substrate suction that is provided in the receiving portion and sucks the lower surface of the substrate. And when the lower surface of the substrate is adsorbed by the substrate adsorbing portion, the lower surface of the substrate is in contact with the support reference surface portion, and the substrate is held at a predetermined height position.
The support reference surface portion is formed with a notch portion formed lower than a reference height position on at least the transport direction end portion side of the edge portion of the housing portion located at the transport direction end portion of the substrate support portion. A substrate levitation transport apparatus characterized in that
前記収容部の縁部は円形を有しており、前記切欠部は、搬送方向最端部に位置する前記収容部の縁部のうち、前記基板支持部の搬送方向端部に最も近い部分に形成されていることを特徴とする請求項1に記載の基板浮上搬送装置。   The edge part of the accommodating part has a circular shape, and the cutout part is located at a portion of the edge part of the accommodating part located at the end part in the transport direction closest to the end part in the transport direction of the substrate support part. The substrate floating transfer device according to claim 1, wherein the substrate floating transfer device is formed. 前記切欠部は、前記搬送方向最端部に位置する前記収容部の縁部のうち、前記基板支持部の搬送方向端部側の全体領域に亘って形成されていることを特徴とする請求項1又は2に記載の基板浮上搬送装置。   The cutout portion is formed over the entire region on the transport direction end portion side of the substrate support portion in the edge portion of the housing portion located at the transport direction endmost portion. The substrate floating transfer apparatus according to 1 or 2. 前記収容部は、搬送方向に複数配列されて設けられており、前記切欠部は、前記収容部間側の縁部に形成されていることを特徴とする請求項1〜3のいずれかに記載の基板浮上搬送装置。   The said accommodating part is arranged in multiple numbers and provided in the conveyance direction, The said notch part is formed in the edge part of the said accommodating part side side, The Claim 1 characterized by the above-mentioned. Substrate floating transfer device. 前記切欠部は、隣り合う収容部に形成された切欠部と連結して形成されていることを特徴とする請求項4に記載の基板浮上搬送装置。   The substrate levitation transfer apparatus according to claim 4, wherein the cutout portion is formed by being connected to a cutout portion formed in an adjacent storage portion. 前記切欠部は、前記収容部の縁部から前記基板支持部の端部まで延びて形成されていることを特徴とする請求項1〜5のいずれかに記載の基板浮上搬送装置。   6. The substrate levitation transfer apparatus according to claim 1, wherein the cutout portion is formed to extend from an edge portion of the housing portion to an end portion of the substrate support portion. 前記基板吸着部は、基板の裏面に吸着する先端部が伸縮性を有しており、その先端部は、基板がない状態では支持基準面部から突出し、基板が載置された状態では、基板の下面を吸着しつつ収縮することにより基板の下面が支持基準面部に当接するように形成されており、前記先端部が完全に収縮した状態では、先端部の高さ位置が支持基準面部の高さ位置に設定されていることを特徴とする請求項1〜6のいずれかに記載の基板浮上搬送装置。   The tip of the substrate adsorbing part has a stretchability at the tip adsorbed on the back surface of the substrate, and the tip protrudes from the support reference surface when there is no substrate, and when the substrate is placed, The lower surface of the substrate is formed so as to contact the support reference surface portion by contracting while adsorbing the lower surface. When the tip portion is completely contracted, the height position of the tip portion is the height of the support reference surface portion. The substrate floating transfer device according to claim 1, wherein the substrate floating transfer device is set at a position. 前記切欠部には、吸引力が発生するように形成されていることを特徴とする請求項1〜7のいずれかに記載されていることを特徴とする基板浮上搬送装置。   8. The substrate levitation transfer apparatus according to claim 1, wherein the notch is formed so as to generate a suction force. 前記切欠部上には、前記支持基準面部と同じ高さ位置の多孔質部材が設けられており、多孔質部材に吸引力が発生するように形成されていることを特徴とする請求項1〜7のいずれかに記載されていることを特徴とする基板浮上搬送装置。   The porous member having the same height as the support reference surface portion is provided on the cutout portion, and is formed so that suction force is generated in the porous member. 7. A substrate levitation transfer apparatus according to claim 7.
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