JP4113637B2 - 音響共振器とその製作方法 - Google Patents
音響共振器とその製作方法 Download PDFInfo
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- JP4113637B2 JP4113637B2 JP15495699A JP15495699A JP4113637B2 JP 4113637 B2 JP4113637 B2 JP 4113637B2 JP 15495699 A JP15495699 A JP 15495699A JP 15495699 A JP15495699 A JP 15495699A JP 4113637 B2 JP4113637 B2 JP 4113637B2
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- 238000005498 polishing Methods 0.000 claims description 12
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 claims description 6
- 229910052750 molybdenum Inorganic materials 0.000 claims description 6
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- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 7
- 230000005684 electric field Effects 0.000 description 7
- 238000005530 etching Methods 0.000 description 6
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Images
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/15—Constructional features of resonators consisting of piezoelectric or electrostrictive material
- H03H9/17—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator
- H03H9/171—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator implemented with thin-film techniques, i.e. of the film bulk acoustic resonator [FBAR] type
- H03H9/172—Means for mounting on a substrate, i.e. means constituting the material interface confining the waves to a volume
- H03H9/173—Air-gaps
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/02—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/02007—Details of bulk acoustic wave devices
- H03H9/02086—Means for compensation or elimination of undesirable effects
- H03H9/02133—Means for compensation or elimination of undesirable effects of stress
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/46—Filters
- H03H9/54—Filters comprising resonators of piezoelectric or electrostrictive material
- H03H9/58—Multiple crystal filters
- H03H9/582—Multiple crystal filters implemented with thin-film techniques
- H03H9/583—Multiple crystal filters implemented with thin-film techniques comprising a plurality of piezoelectric layers acoustically coupled
- H03H9/585—Stacked Crystal Filters [SCF]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/42—Piezoelectric device making
Landscapes
- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
- Piezo-Electric Transducers For Audible Bands (AREA)
- Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US088,964 | 1987-08-21 | ||
| US09/088,964 US6060818A (en) | 1998-06-02 | 1998-06-02 | SBAR structures and method of fabrication of SBAR.FBAR film processing techniques for the manufacturing of SBAR/BAR filters |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2000069594A JP2000069594A (ja) | 2000-03-03 |
| JP2000069594A5 JP2000069594A5 (enExample) | 2006-07-20 |
| JP4113637B2 true JP4113637B2 (ja) | 2008-07-09 |
Family
ID=22214543
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15495699A Expired - Lifetime JP4113637B2 (ja) | 1998-06-02 | 1999-06-02 | 音響共振器とその製作方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US6060818A (enExample) |
| EP (1) | EP0963040B1 (enExample) |
| JP (1) | JP4113637B2 (enExample) |
| DE (1) | DE69933907T2 (enExample) |
Families Citing this family (224)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6339276B1 (en) * | 1999-11-01 | 2002-01-15 | Agere Systems Guardian Corp. | Incremental tuning process for electrical resonators based on mechanical motion |
| US6746577B1 (en) | 1999-12-16 | 2004-06-08 | Agere Systems, Inc. | Method and apparatus for thickness control and reproducibility of dielectric film deposition |
| US6524971B1 (en) | 1999-12-17 | 2003-02-25 | Agere Systems, Inc. | Method of deposition of films |
| US6377136B1 (en) | 2000-02-04 | 2002-04-23 | Agere Systems Guardian Corporation | Thin film resonator filter having at least one component with different resonant frequency sets or electrode capacitance |
| US7296329B1 (en) | 2000-02-04 | 2007-11-20 | Agere Systems Inc. | Method of isolation for acoustic resonator device |
| US6306313B1 (en) | 2000-02-04 | 2001-10-23 | Agere Systems Guardian Corp. | Selective etching of thin films |
| US6437667B1 (en) | 2000-02-04 | 2002-08-20 | Agere Systems Guardian Corp. | Method of tuning thin film resonator filters by removing or adding piezoelectric material |
| US6323744B1 (en) | 2000-02-04 | 2001-11-27 | Agere Systems Guardian Corp. | Grounding of TFR ladder filters |
| US6342134B1 (en) * | 2000-02-11 | 2002-01-29 | Agere Systems Guardian Corp. | Method for producing piezoelectric films with rotating magnetron sputtering system |
| US6329305B1 (en) * | 2000-02-11 | 2001-12-11 | Agere Systems Guardian Corp. | Method for producing devices having piezoelectric films |
| DE10007577C1 (de) * | 2000-02-18 | 2001-09-13 | Infineon Technologies Ag | Piezoresonator |
| US6448793B1 (en) | 2000-04-07 | 2002-09-10 | Rf Micro Devices, Inc. | Adaptive manufacturing of semiconductor circuits |
| US6439693B1 (en) * | 2000-05-04 | 2002-08-27 | Silverbrook Research Pty Ltd. | Thermal bend actuator |
| US6384697B1 (en) * | 2000-05-08 | 2002-05-07 | Agilent Technologies, Inc. | Cavity spanning bottom electrode of a substrate-mounted bulk wave acoustic resonator |
| US6603241B1 (en) | 2000-05-23 | 2003-08-05 | Agere Systems, Inc. | Acoustic mirror materials for acoustic devices |
| GB0012439D0 (en) * | 2000-05-24 | 2000-07-12 | Univ Cranfield | Improvements to filters |
| DE10035421A1 (de) * | 2000-07-20 | 2002-02-07 | Infineon Technologies Ag | Verfahren zur Herstellung eines Halbleiterbauelements mit einer Schichtenfolge zum ineinander Umwandeln von akustischen oder thermischen Signalen und elektrischen Spannungsänderungen |
| DE10035423C1 (de) * | 2000-07-20 | 2001-11-22 | Infineon Technologies Ag | Halbleiterbauelement mit einer Schichtenfolge zum ineinander Umwandeln von akustischen oder thermischen Signalen und elektrischen Spannungsänderungen und Verfahren zu dessen Herstellung |
| US6355498B1 (en) | 2000-08-11 | 2002-03-12 | Agere Systems Guartian Corp. | Thin film resonators fabricated on membranes created by front side releasing |
| US6420820B1 (en) | 2000-08-31 | 2002-07-16 | Agilent Technologies, Inc. | Acoustic wave resonator and method of operating the same to maintain resonance when subjected to temperature variations |
| US6377137B1 (en) | 2000-09-11 | 2002-04-23 | Agilent Technologies, Inc. | Acoustic resonator filter with reduced electromagnetic influence due to die substrate thickness |
| US6486751B1 (en) | 2000-09-26 | 2002-11-26 | Agere Systems Inc. | Increased bandwidth thin film resonator having a columnar structure |
| US6674291B1 (en) | 2000-10-30 | 2004-01-06 | Agere Systems Guardian Corp. | Method and apparatus for determining and/or improving high power reliability in thin film resonator devices, and a thin film resonator device resultant therefrom |
| US6587212B1 (en) | 2000-10-31 | 2003-07-01 | Agere Systems Inc. | Method and apparatus for studying vibrational modes of an electro-acoustic device |
| US6515558B1 (en) | 2000-11-06 | 2003-02-04 | Nokia Mobile Phones Ltd | Thin-film bulk acoustic resonator with enhanced power handling capacity |
| US6743731B1 (en) | 2000-11-17 | 2004-06-01 | Agere Systems Inc. | Method for making a radio frequency component and component produced thereby |
| US6424237B1 (en) | 2000-12-21 | 2002-07-23 | Agilent Technologies, Inc. | Bulk acoustic resonator perimeter reflection system |
| US6496085B2 (en) | 2001-01-02 | 2002-12-17 | Nokia Mobile Phones Ltd | Solidly mounted multi-resonator bulk acoustic wave filter with a patterned acoustic mirror |
| US6407649B1 (en) | 2001-01-05 | 2002-06-18 | Nokia Corporation | Monolithic FBAR duplexer and method of making the same |
| US6518860B2 (en) | 2001-01-05 | 2003-02-11 | Nokia Mobile Phones Ltd | BAW filters having different center frequencies on a single substrate and a method for providing same |
| US6509813B2 (en) | 2001-01-16 | 2003-01-21 | Nokia Mobile Phones Ltd. | Bulk acoustic wave resonator with a conductive mirror |
| US6521100B2 (en) | 2001-02-02 | 2003-02-18 | Nokia Mobile Phones Ltd | Method of producing a piezoelectric thin film and bulk acoustic wave resonator fabricated according to the method |
| US7435613B2 (en) * | 2001-02-12 | 2008-10-14 | Agere Systems Inc. | Methods of fabricating a membrane with improved mechanical integrity |
| US6714102B2 (en) * | 2001-03-01 | 2004-03-30 | Agilent Technologies, Inc. | Method of fabricating thin film bulk acoustic resonator (FBAR) and FBAR structure embodying the method |
| US6617249B2 (en) | 2001-03-05 | 2003-09-09 | Agilent Technologies, Inc. | Method for making thin film bulk acoustic resonators (FBARS) with different frequencies on a single substrate and apparatus embodying the method |
| US6874211B2 (en) * | 2001-03-05 | 2005-04-05 | Agilent Technologies, Inc. | Method for producing thin film bulk acoustic resonators (FBARs) with different frequencies on the same substrate by subtracting method and apparatus embodying the method |
| US6566979B2 (en) * | 2001-03-05 | 2003-05-20 | Agilent Technologies, Inc. | Method of providing differential frequency adjusts in a thin film bulk acoustic resonator (FBAR) filter and apparatus embodying the method |
| US6483229B2 (en) | 2001-03-05 | 2002-11-19 | Agilent Technologies, Inc. | Method of providing differential frequency adjusts in a thin film bulk acoustic resonator (FBAR) filter and apparatus embodying the method |
| US6469597B2 (en) * | 2001-03-05 | 2002-10-22 | Agilent Technologies, Inc. | Method of mass loading of thin film bulk acoustic resonators (FBAR) for creating resonators of different frequencies and apparatus embodying the method |
| US6787048B2 (en) * | 2001-03-05 | 2004-09-07 | Agilent Technologies, Inc. | Method for producing thin bulk acoustic resonators (FBARs) with different frequencies on the same substrate by subtracting method and apparatus embodying the method |
| US6668618B2 (en) | 2001-04-23 | 2003-12-30 | Agilent Technologies, Inc. | Systems and methods of monitoring thin film deposition |
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| US6060818A (en) | 2000-05-09 |
| DE69933907D1 (de) | 2006-12-21 |
| DE69933907T2 (de) | 2007-05-31 |
| JP2000069594A (ja) | 2000-03-03 |
| EP0963040A2 (en) | 1999-12-08 |
| EP0963040B1 (en) | 2006-11-08 |
| EP0963040A3 (en) | 2000-04-05 |
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