JP2019522348A5 - - Google Patents

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JP2019522348A5
JP2019522348A5 JP2018555266A JP2018555266A JP2019522348A5 JP 2019522348 A5 JP2019522348 A5 JP 2019522348A5 JP 2018555266 A JP2018555266 A JP 2018555266A JP 2018555266 A JP2018555266 A JP 2018555266A JP 2019522348 A5 JP2019522348 A5 JP 2019522348A5
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layer
metal film
semiconductor wafer
single crystal
crystal semiconductor
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JP6775804B2 (ja
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JP2018555266A 2016-05-12 2017-04-28 シリコン系誘電体上の六方晶窒化ホウ素の直接形成 Active JP6775804B2 (ja)

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Application Number Priority Date Filing Date Title
US201662335149P 2016-05-12 2016-05-12
US62/335,149 2016-05-12
PCT/US2017/030124 WO2017196559A1 (en) 2016-05-12 2017-04-28 Direct formation of hexagonal boron nitride on silicon based dielectrics

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JP2020163797A Division JP7066127B2 (ja) 2016-05-12 2020-09-29 シリコン系誘電体上の六方晶窒化ホウ素の直接形成

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JP2019522348A JP2019522348A (ja) 2019-08-08
JP2019522348A5 true JP2019522348A5 (enExample) 2020-05-07
JP6775804B2 JP6775804B2 (ja) 2020-10-28

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JP2018555266A Active JP6775804B2 (ja) 2016-05-12 2017-04-28 シリコン系誘電体上の六方晶窒化ホウ素の直接形成
JP2020163797A Active JP7066127B2 (ja) 2016-05-12 2020-09-29 シリコン系誘電体上の六方晶窒化ホウ素の直接形成
JP2022066022A Active JP7283707B2 (ja) 2016-05-12 2022-04-13 シリコン系誘電体上の六方晶窒化ホウ素の直接形成

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JP2022066022A Active JP7283707B2 (ja) 2016-05-12 2022-04-13 シリコン系誘電体上の六方晶窒化ホウ素の直接形成

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US (3) US10658472B2 (enExample)
EP (3) EP4131338A3 (enExample)
JP (3) JP6775804B2 (enExample)
KR (3) KR102419924B1 (enExample)
CN (1) CN109791876B (enExample)
ES (1) ES2940083T3 (enExample)
WO (1) WO2017196559A1 (enExample)

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