JP4764260B2 - 半導体積層構造及びその製造方法 - Google Patents
半導体積層構造及びその製造方法 Download PDFInfo
- Publication number
- JP4764260B2 JP4764260B2 JP2006160276A JP2006160276A JP4764260B2 JP 4764260 B2 JP4764260 B2 JP 4764260B2 JP 2006160276 A JP2006160276 A JP 2006160276A JP 2006160276 A JP2006160276 A JP 2006160276A JP 4764260 B2 JP4764260 B2 JP 4764260B2
- Authority
- JP
- Japan
- Prior art keywords
- single crystal
- substrate
- sic
- layer
- graphite layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Landscapes
- Semiconductor Lasers (AREA)
- Led Devices (AREA)
Description
2 (0001)6H−SiC基板の表面に、Si原子の蒸発により形成されたC原子
3 h−BN単結晶膜
4 単結晶グラファイト層
5 6H−SiC単結晶基板
Claims (4)
- SiC単結晶基板と、
該基板の表面に形成されたグラファイト層と、
該グラファイト層上に形成された六方晶窒化ホウ素単結晶膜と
を備えることを特徴とする半導体積層構造。 - 前記SiC単結晶基板は、6H−SiC単結晶基板又は4H−SiC単結晶基板であることを特徴とする請求項1に記載の半導体積層構造。
- SiC単結晶基板の所定の面の、少なくとも最表面のSiを蒸発させて、前記SiC単結晶基板とグラファイト層との積層を形成する工程と、
前記グラファイト層上に六方晶窒化ホウ素単結晶膜をヘテロエピタキシャル成長させる工程と
を有することを特徴とする半導体積層構造の製造方法。 - 前記SiC単結晶基板は、6H−SiC単結晶基板又は4H−SiC単結晶基板であることを特徴とする請求項3に記載の半導体積層構造の製造方法。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006160276A JP4764260B2 (ja) | 2006-06-08 | 2006-06-08 | 半導体積層構造及びその製造方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006160276A JP4764260B2 (ja) | 2006-06-08 | 2006-06-08 | 半導体積層構造及びその製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2007329354A JP2007329354A (ja) | 2007-12-20 |
JP4764260B2 true JP4764260B2 (ja) | 2011-08-31 |
Family
ID=38929613
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2006160276A Expired - Fee Related JP4764260B2 (ja) | 2006-06-08 | 2006-06-08 | 半導体積層構造及びその製造方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP4764260B2 (ja) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5453045B2 (ja) * | 2008-11-26 | 2014-03-26 | 株式会社日立製作所 | グラフェン層が成長された基板およびそれを用いた電子・光集積回路装置 |
KR101172950B1 (ko) * | 2009-12-02 | 2012-08-10 | 정경화 | 그라파이트 기반의 발광다이오드용 기판 및 이를 이용한 발광다이오드 |
KR101267450B1 (ko) | 2011-08-16 | 2013-05-31 | 서울대학교산학협력단 | 광소자 및 그 제조방법 |
EP4131339A3 (en) | 2016-05-12 | 2023-02-15 | GlobalWafers Co., Ltd. | Direct formation of hexagonal boron nitride on silicon based dielectrics |
CN108242452B (zh) * | 2016-12-27 | 2020-12-04 | 青岛翼晨镭硕科技有限公司 | 光子集成器件及其制作方法 |
KR20210027893A (ko) * | 2019-09-03 | 2021-03-11 | 삼성전자주식회사 | 육방정계 질화붕소의 제조 방법 |
-
2006
- 2006-06-08 JP JP2006160276A patent/JP4764260B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP2007329354A (ja) | 2007-12-20 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5295871B2 (ja) | Iii族窒化物半導体基板の製造方法 | |
JP4764260B2 (ja) | 半導体積層構造及びその製造方法 | |
Kobayashi et al. | Hexagonal boron nitride grown by MOVPE | |
JP2007273946A (ja) | 窒化物半導体単結晶膜 | |
US20080224268A1 (en) | Nitride semiconductor single crystal substrate | |
Wang et al. | Oxygen defect dominated photoluminescence emission of ScxAl1− xN grown by molecular beam epitaxy | |
Xie et al. | Enforced c-axis growth of ZnO epitaxial chemical vapor deposition films on a-plane sapphire | |
JP4907476B2 (ja) | 窒化物半導体単結晶 | |
CN113658848A (zh) | 半导体基板的制造方法、soi晶圆的制造方法及soi晶圆 | |
Uesugi et al. | Fabrication of AlN templates on SiC substrates by sputtering-deposition and high-temperature annealing | |
Narayan et al. | Characteristics of nucleation layer and epitaxy in GaN/sapphire heterostructures | |
KR20040058206A (ko) | 4원 광 밴드갭 반도체의 저온 에피택셜 성장 | |
US20140159055A1 (en) | Substrates for semiconductor devices | |
CN109119327A (zh) | 在纳米图形化蓝宝石衬底上外延生长氮化铝的方法 | |
JP2004200384A (ja) | エピタキシャル成長用基板 | |
JP2010062482A (ja) | 窒化物半導体基板およびその製造方法 | |
JP2009298626A (ja) | 六方晶窒化ホウ素構造および製造方法 | |
TWI379021B (en) | Method for forming group-iii nitride semiconductor epilayer on silicon substrate | |
US20100264424A1 (en) | GaN LAYER CONTAINING MULTILAYER SUBSTRATE, PROCESS FOR PRODUCING SAME, AND DEVICE | |
Man et al. | Effects of ZnO buffer layers on the fabrication of GaN films using pulsed laser deposition | |
JP2023096845A (ja) | 窒化物半導体膜を作製するためのテンプレート及びその製造方法 | |
Kobayashi et al. | Boron Nitride Thin Films Grown on Graphitized 6H–SiC Substrates by Metalorganic Vapor Phase Epitaxy | |
JP2020038968A (ja) | 半導体積層構造体の製造方法及び半導体積層構造体 | |
JP7120598B2 (ja) | 窒化アルミニウム単結晶膜及び半導体素子の製造方法 | |
Luo et al. | Epitaxial growth and characterization of SiC on C-plane sapphire substrates by ammonia nitridation |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20080806 |
|
RD02 | Notification of acceptance of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7422 Effective date: 20100514 |
|
RD04 | Notification of resignation of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7424 Effective date: 20100514 |
|
RD02 | Notification of acceptance of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7422 Effective date: 20100906 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20110513 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20110603 |
|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20110610 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20140617 Year of fee payment: 3 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 4764260 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
S531 | Written request for registration of change of domicile |
Free format text: JAPANESE INTERMEDIATE CODE: R313531 |
|
R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
LAPS | Cancellation because of no payment of annual fees |