JP2014220278A - 半導体装置 - Google Patents
半導体装置 Download PDFInfo
- Publication number
- JP2014220278A JP2014220278A JP2013096477A JP2013096477A JP2014220278A JP 2014220278 A JP2014220278 A JP 2014220278A JP 2013096477 A JP2013096477 A JP 2013096477A JP 2013096477 A JP2013096477 A JP 2013096477A JP 2014220278 A JP2014220278 A JP 2014220278A
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- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
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Abstract
【解決手段】BGA5において、長方形のコントロールチップ2とメモリチップ3のそれぞれの長辺2aa,2ab、3aa,3abが、配線基板1の上面1aの第1辺1aa,1abにそれぞれ沿って配置されている。リッドは、1組の第1縁部と1組の第2縁部とを備え、かつ上記第2縁部の幅が上記第1縁部より広く形成されており、配線基板1の上面1aのコントロールチップ2とメモリチップ3のそれぞれの短辺2ac,2ad,3ac,3ad側の外側の領域にチップ部品9の搭載領域1gと上記リッドの接合代領域1hを確保することで、上記リッドの幅広の上記第2縁部を接合代領域1hに配置できる。これにより、BGA5の実装面積を小さくできる。
【選択図】図2
Description
図1は実施の形態の半導体装置の構造の一例を示す平面図、図2は図1に示す半導体装置の構造を蓋部材を透過して示す平面図、図3は図1に示すA−A線に沿って切断した構造を示す断面図、図4は図1に示すB−B線に沿って切断した構造を示す断面図、図5は図3に示すC部を拡大して示す部分拡大断面図、図6は図4に示すC部を拡大して示す部分拡大断面図である。また、図7は図1に示す半導体装置の裏面側の構造を示す裏面図、図8は図1に示す半導体装置に搭載されるチップ部品の構造の一例を示す斜視図、図9は図1に示す半導体装置に設けられた蓋部材の構造の一例を示す平面図および側面図である。
1a 上面(第1面)
1aa,1ab 第1辺
1ac,1ad 第2辺
1b 下面(第2面)
1c,1d ランド(端子、電極)
1e 基材
1f ソルダレジスト膜(絶縁膜)
1g 搭載領域
1h 接合代領域
1i マーク
1j,1k 溝(樹脂拡散回避部、凹部)
2 コントロールチップ(第1半導体チップ)
2a 主面(第1主面)
2aa,2ab 長辺
2ac,2ad 短辺
2b 裏面(第1裏面)
2c 電極パッド(電極)
2d 側面
3 メモリチップ(第2半導体チップ)
3a 主面(第2主面)
3aa,3ab 長辺
3ac,3ad 短辺
3b 裏面(第2裏面)
3c 電極パッド(電極)
3d 側面
3e 貫通電極
4 バンプ電極(バンプ、突起電極)
5 BGA(Ball Grid Array 、半導体装置)
6,6a,6b アンダーフィル(樹脂)
7 リッド(蓋部材)
7a,7b 縁部(第1縁部、鍔部)
7c,7d 縁部(第2縁部、鍔部)
7e 曲げ部
7f 天井部
7g 金属めっき
8 ボール電極(外部接続用端子、外部電極端子)
9,9a,9b チップ部品
9c 本体部
9d 端子部(電極部)
10 接着材
11 空間部
12 熱伝導性接着材(導電性樹脂、半田)
13 半田
14 BGA(Ball Grid Array 、半導体装置)
15 メモリチップ
16 BGA(Ball Grid Array 、半導体装置)
17 接着材
18 バンプ
20,21 BGA
22 開口部
23 半田
Claims (15)
- 第1主面とその反対側の第1裏面とを有し、前記第1主面が長方形に形成された第1半導体チップと、
第2主面とその反対側の第2裏面とを有し、前記第2主面が長方形に形成された第2半導体チップと、
第1面とその反対側の第2面とを有し、前記第1面上に前記第1および第2半導体チップがそれぞれ複数の突起電極を介して搭載され、かつ前記第1面が、相互に対向する一対の第1辺および相互に対向する一対の第2辺からなる四角形に形成された配線基板と、
前記配線基板の前記第1面上に配置され、前記第1および第2半導体チップを覆う蓋部材と、
を有し、
前記第1半導体チップの前記第1主面および前記第2半導体チップの前記第2主面は、それぞれ前記配線基板の前記第1面と対向して配置され、
前記第1半導体チップの前記第1主面の長辺および前記第2半導体チップの前記第2主面の長辺は、それぞれ前記配線基板の前記第1面の前記第1辺に沿って配置され、
前記蓋部材は、前記配線基板の前記第1面の前記第1辺に沿って配置される1組の第1縁部と、前記第2辺に沿って配置される1組の第2縁部とを備え、
前記第2縁部の幅は、前記第1縁部の幅より広い、半導体装置。 - 請求項1に記載の半導体装置において、
前記配線基板の前記第1面は、正方形である、半導体装置。 - 請求項2に記載の半導体装置において、
前記配線基板の前記第1面の前記第1および第2半導体チップのそれぞれの短辺の外側に、複数のチップ部品が搭載されている、半導体装置。 - 請求項3に記載の半導体装置において、
前記蓋部材の前記第2縁部と前記配線基板の前記第1面とは、接着材を介して接合されている、半導体装置。 - 請求項4に記載の半導体装置において、
前記蓋部材の前記第1縁部と前記配線基板の前記第1面とは、空間部を介して配置されている、半導体装置。 - 請求項1に記載の半導体装置において、
前記第1および第2半導体チップは、それぞれ前記配線基板との間に樹脂が充填されている、半導体装置。 - 請求項6に記載の半導体装置において、
前記配線基板の前記第1面の前記第1半導体チップと前記第2半導体チップの間の領域に樹脂拡散回避部が形成されている、半導体装置。 - 請求項7に記載の半導体装置において、
前記配線基板の前記第1面の前記第1半導体チップまたは前記第2半導体チップのうちの何れかの半導体チップと複数のチップ部品との間の領域に前記樹脂拡散回避部が形成されている、半導体装置。 - 請求項8に記載の半導体装置において、
前記樹脂拡散回避部は、溝である、半導体装置。 - 請求項1に記載の半導体装置において、
前記第1半導体チップの前記第1裏面および前記第2半導体チップの前記第2裏面は、それぞれ熱伝導性接着材もしくは半田材を介して前記蓋部材と接合している、半導体装置。 - 請求項1に記載の半導体装置において、
前記蓋部材は、金属板からなる、半導体装置。 - 請求項1に記載の半導体装置において、
前記配線基板の前記第2面に、複数の外部接続用端子および複数のチップ部品が設けられている、半導体装置。 - 請求項12に記載の半導体装置において、
前記複数の外部接続用端子それぞれの前記第2面からの高さは、前記第2面に設けられた前記複数のチップ部品の前記第2面からの高さよりも高い、半導体装置。 - 請求項1に記載の半導体装置において、
前記第1半導体チップは、コントロールチップであり、前記第2半導体チップは、メモリチップであり、前記メモリチップは、前記コントロールチップによって制御される、半導体装置。 - 請求項3に記載の半導体装置において、
前記複数のチップ部品のそれぞれは、チップコンデンサであり、前記配線基板の前記第2面に設けられた複数の外部接続用端子は、ボール電極である、半導体装置。
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JP2013096477A JP6199601B2 (ja) | 2013-05-01 | 2013-05-01 | 半導体装置 |
US14/254,805 US9460938B2 (en) | 2013-05-01 | 2014-04-16 | Semiconductor device including a plurality of semiconductor chips, and a cover member with first and second brims |
CN201410182740.1A CN104134651B (zh) | 2013-05-01 | 2014-04-30 | 半导体装置 |
HK15102428.1A HK1201989A1 (en) | 2013-05-01 | 2015-03-10 | Semiconductor device |
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JP2017041603A (ja) * | 2015-08-21 | 2017-02-23 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
JP2017112241A (ja) * | 2015-12-17 | 2017-06-22 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
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WO2016203967A1 (ja) | 2015-06-15 | 2016-12-22 | ソニー株式会社 | 半導体装置、電子機器、並びに製造方法 |
JP2017123446A (ja) * | 2016-01-08 | 2017-07-13 | 株式会社日立製作所 | 半導体装置および半導体パッケージ装置 |
US10796976B2 (en) | 2018-10-31 | 2020-10-06 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor device and method of forming the same |
KR20210022911A (ko) * | 2019-08-21 | 2021-03-04 | 삼성전기주식회사 | 반도체 패키지 |
JP2022081872A (ja) * | 2020-11-20 | 2022-06-01 | ルネサスエレクトロニクス株式会社 | 半導体装置およびその製造方法 |
TW202307717A (zh) * | 2021-08-04 | 2023-02-16 | 義守大學 | 配置三維堆疊晶片間的訊號墊片的方法和電子裝置 |
CN114210597B (zh) * | 2022-02-22 | 2022-04-26 | 深圳市正和兴电子有限公司 | 一种半导体器件的导电胶推荐方法、系统和可读存储介质 |
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Also Published As
Publication number | Publication date |
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CN104134651A (zh) | 2014-11-05 |
US20140327138A1 (en) | 2014-11-06 |
CN104134651B (zh) | 2018-06-26 |
US9460938B2 (en) | 2016-10-04 |
JP6199601B2 (ja) | 2017-09-20 |
HK1201989A1 (en) | 2015-09-11 |
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