JP2010518760A5 - - Google Patents
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- JP2010518760A5 JP2010518760A5 JP2009549272A JP2009549272A JP2010518760A5 JP 2010518760 A5 JP2010518760 A5 JP 2010518760A5 JP 2009549272 A JP2009549272 A JP 2009549272A JP 2009549272 A JP2009549272 A JP 2009549272A JP 2010518760 A5 JP2010518760 A5 JP 2010518760A5
- Authority
- JP
- Japan
- Prior art keywords
- data
- tester
- speed serial
- signal
- receiver
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims 11
- 230000000737 periodic effect Effects 0.000 claims 2
- 238000011084 recovery Methods 0.000 claims 2
- 238000004891 communication Methods 0.000 claims 1
- 238000013481 data capture Methods 0.000 claims 1
- 238000009662 stress testing Methods 0.000 claims 1
- 238000011144 upstream manufacturing Methods 0.000 claims 1
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US88908507P | 2007-02-09 | 2007-02-09 | |
| PCT/US2008/053476 WO2008098202A2 (en) | 2007-02-09 | 2008-02-08 | Physical-layer testing of high-speed serial links in their mission environments |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2010518760A JP2010518760A (ja) | 2010-05-27 |
| JP2010518760A5 true JP2010518760A5 (enExample) | 2012-04-12 |
Family
ID=39682443
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009549272A Pending JP2010518760A (ja) | 2007-02-09 | 2008-02-08 | ハイスピード・シリアル・リンクのミッション環境における、該ハイスピード・シリアル・リンクの物理層テスティングのためのシステム及び方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20080192814A1 (enExample) |
| EP (1) | EP2115940A2 (enExample) |
| JP (1) | JP2010518760A (enExample) |
| TW (1) | TW200935781A (enExample) |
| WO (1) | WO2008098202A2 (enExample) |
Families Citing this family (42)
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| US9804991B2 (en) * | 2015-03-03 | 2017-10-31 | Qualcomm Incorporated | High-frequency signal observations in electronic systems |
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| KR102629185B1 (ko) * | 2016-12-07 | 2024-01-24 | 에스케이하이닉스 주식회사 | 데이터 통신을 위한 수신기 |
| US10892966B2 (en) * | 2018-06-01 | 2021-01-12 | Apple Inc. | Monitoring interconnect failures over time |
| KR20210119422A (ko) * | 2019-01-31 | 2021-10-05 | 텍트로닉스 인코포레이티드 | 고속 입력/출력 마진 테스팅을 위한 시스템, 방법 및 디바이스 |
| US11940483B2 (en) * | 2019-01-31 | 2024-03-26 | Tektronix, Inc. | Systems, methods and devices for high-speed input/output margin testing |
| TWI762828B (zh) * | 2019-11-01 | 2022-05-01 | 緯穎科技服務股份有限公司 | 高速序列電腦匯流排的訊號調整方法及其相關電腦系統 |
| CN111682979B (zh) * | 2020-05-28 | 2021-12-07 | 杭州迪普科技股份有限公司 | 高速信号测试板生成方法及装置 |
| US12061232B2 (en) | 2020-09-21 | 2024-08-13 | Tektronix, Inc. | Margin test data tagging and predictive expected margins |
| WO2022115494A1 (en) | 2020-11-24 | 2022-06-02 | Tektronix, Inc. | Systems, methods, and devices for high-speed input/output margin testing |
| US11843376B2 (en) | 2021-05-12 | 2023-12-12 | Gowin Semiconductor Corporation | Methods and apparatus for providing a high-speed universal serial bus (USB) interface for a field-programmable gate array (FPGA) |
| US11474969B1 (en) * | 2021-05-12 | 2022-10-18 | Gowin Semiconductor Corporation | Methods and apparatus for providing a serializer and deserializer (SERDES) block facilitating high-speed data transmissions for a field-programmable gate array (FPGA) |
| CN115237094B (zh) * | 2022-07-19 | 2025-09-16 | 超聚变数字技术有限公司 | 一种测试装置和测试设备 |
| CN115396353B (zh) * | 2022-08-31 | 2024-08-27 | 深圳市国芯物联科技有限公司 | 一种高速串行芯片误码率测试系统及方法 |
| CN116318155B (zh) * | 2023-05-19 | 2023-08-11 | 武汉普赛斯电子股份有限公司 | 一种精密时基等效采样装置及方法 |
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-
2008
- 2008-02-08 WO PCT/US2008/053476 patent/WO2008098202A2/en not_active Ceased
- 2008-02-08 JP JP2009549272A patent/JP2010518760A/ja active Pending
- 2008-02-08 US US12/028,577 patent/US20080192814A1/en not_active Abandoned
- 2008-02-08 EP EP08729440A patent/EP2115940A2/en not_active Withdrawn
- 2008-05-13 TW TW097117514A patent/TW200935781A/zh unknown
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