JP2010509783A - フィーチャ空間集積度を高めるリソグラフィのためのダブルパターニング方法 - Google Patents
フィーチャ空間集積度を高めるリソグラフィのためのダブルパターニング方法 Download PDFInfo
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- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0035—Multiple processes, e.g. applying a further resist layer on an already in a previously step, processed pattern or textured surface
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- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
- G03F7/11—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers having cover layers or intermediate layers, e.g. subbing layers
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- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
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- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
- H01L21/0273—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
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- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
- H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
- H01L21/822—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using silicon technology
- H01L21/8232—Field-effect technology
- H01L21/8234—MIS technology, i.e. integration processes of field effect transistors of the conductor-insulator-semiconductor type
- H01L21/8238—Complementary field-effect transistors, e.g. CMOS
- H01L21/823821—Complementary field-effect transistors, e.g. CMOS with a particular manufacturing method of transistors with a horizontal current flow in a vertical sidewall of a semiconductor body, e.g. FinFET, MuGFET
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- H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
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- H01L29/66795—Unipolar field-effect transistors with an insulated gate, i.e. MISFET with a gate at the side of the channel with a horizontal current flow in a vertical sidewall of a semiconductor body, e.g. FinFET, MuGFET
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- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
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Abstract
Description
a) 第1フォトレジスト層をデバイス層に塗布し、
b) 第1マスクを用いて第1フォトレジストを露光し、
c) 第1フォトレジスト層を現像して第1パターンを基板上に形成し、
d) 基板を保護層で被覆し、
e) 保護層を処理して第1フォトレジストと接触している部分を変化させ、該処理により変化された保護層がその後の露光および/または現像に実質的に影響されないようにし、
f) 基板に第2フォトレジスト層を塗布し、
g) 第2マスクを用いて第2フォトレジスト層を露光し、そして
h) 第2フォトレジスト層を現像して、第1フォトレジスト層の第1パターンに重大な影響を与えることなく、基板上に第2パターンを形成する、
工程を含み、
i) 第1および第2パターンが一緒になって、第1および第2の各パターンに画成されたフィーチャよりも高い空間周波数を有する、散置されたフィーチャを画成することを特徴とする方法である。
Claims (15)
- 基板の中もしくは上の少なくとも1つのデバイス層にパターンを形成する方法であって、
a) 第1フォトレジスト層を前記デバイス層に塗布し、
b) 第1マスクを用いて前記第1フォトレジストを露光し、
c) 前記第1フォトレジスト層を現像して第1パターンを前記基板上に形成し、
d) 前記基板を保護層で被覆し、
e) 前記保護層を処理して第1フォトレジスト11と接触している部分を変化させ、変化された保護層がその後の露光および/または現像に実質的に影響されないようにし、
f) 前記基板に第2フォトレジスト層を塗布し、
g) 第2マスクを用いて前記第2フォトレジスト層を露光し、
h) 前記第2フォトレジスト層を現像して、前記第1フォトレジスト層の第1パターンに重大な影響を与えることなく、前記基板上に第2パターンを形成する、
工程を含み、
i) 前記第1および第2パターンが一緒になって、前記第1および第2の各パターンに画成されたフィーチャよりも高い空間周波数を有する、散置されたフィーチャを画成することを特徴とする方法。 - 工程e)が、前記保護層の架橋結合を生じる高温でのベーキングを含むことを特徴とする請求項1に記載の方法。
- 工程e)が、前記第1フォトレジスト層から供給される触媒によって前記保護層における架橋結合を促進させることを含むことを特徴とする請求項1または2に記載の方法。
- 前記第1フォトレジスト層から供給される触媒が前記保護層内に拡散する酸であることを特徴とする請求項3に記載の方法。
- 前記第1フォトレジストが200nm以下のUVスペクトルの電磁放射を用いるパターニングに適したフォトレジストであることを特徴とする請求項1に記載の方法。
- 前記第1フォトレジストがアクリレート類を含むことを特徴とする請求項1に記載の方法。
- さらに、工程e)の後で、工程f)の前に、工程e)によって変化されなかった前記保護層の部分を取り除くことを含むことを特徴とする請求項1に記載の方法。
- フィンFETの製造に適用され、前記第1マスク(50)がフィンFETのフィン(22、23、24、51)を画成するように構成され、前記第2マスク(52)が同一のデバイス層内の前記フィンを相互接続する共通のソース領域および共通のドレイン領域を画成するように構成されることを特徴とする請求項1に記載の方法。
- 前記第1マスクは複数のフィンFETデバイスのためのフィンを画成するように構成され、複数のデバイスのためのフィンが、個々のデバイス内においても、隣接したデバイス間においても、実質的に一定のピッチを保つことを特徴とする請求項8に記載の方法。
- 前記第2マスクは、前記共通ソース領域および/または前記共通ドレイン領域の中に、前記フィンFETデバイスにおいてフィンが必要とされない選択位置で中断部を設けるように構成され、これら選択位置においてフィンが相互接続されないようになっていることを特徴とする請求項9に記載の方法。
- デバイス構造の製造に適用され、前記第1マスクがデバイス中の水平方向のフィーチャを画成するように構成され、前記第2マスクがデバイス中の垂直方向のフィーチャを画成するように構成され、前記水平および垂直方向のフィーチャが同一のデバイス層内に画成され、選択位置において互いに交差していることを特徴とする請求項1に記載の方法。
- フィンFETの製造に適用され、前記第1マスク(70)がフィンFETの第1群のフィン(22、23、24、71)を画成するよう構成され、前記第2マスク(72)がフィンFETの第2群のフィン(22、23、24、74)を画成するよう構成され、前記第1群及び第2群のフィンが散在していることを特徴とする請求項1に記載の方法。
- 前記第1群のフィンと前記第2群のフィンが交互パターン内に交互配置されていることを特徴とする請求項12に記載の方法。
- 前記第1群のフィンが第1のピッチ間隔で離れており、前記第2群のフィンもまた第1のピッチ間隔で離れており、前記第1および第2群のフィンの合成フィンが前記第1ピッチ間隔のおよそ半分の第2のピッチ間隔で離れていることを特徴とする請求項13に記載の方法。
- デバイス構造の製造に適用され、前記第1マスク(70)が第1の空間周波数を持つ第1群の周期的フィーチャを画成するよう構成され、前記第2マスク(72)が第2の空間周波数を持つ第2群の周期的フィーチャを画成するよう構成され、前記第1および第2空間周波数よりも高い第3の空間周波数で画成された前記第1および第2群の合成フィーチャが生ずるように、前記第1および第2マスクが互いに相対的に位置合わせされていることを特徴とすることを特徴とする請求項1に記載の方法。
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EP06124035 | 2006-11-14 | ||
PCT/IB2007/054604 WO2008059440A2 (en) | 2006-11-14 | 2007-11-13 | Double patterning for lithography to increase feature spatial density |
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EP (1) | EP2092393A2 (ja) |
JP (1) | JP2010509783A (ja) |
CN (1) | CN101542390A (ja) |
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WO2008059440A3 (en) | 2008-08-21 |
EP2092393A2 (en) | 2009-08-26 |
US20100028809A1 (en) | 2010-02-04 |
CN101542390A (zh) | 2009-09-23 |
WO2008059440A2 (en) | 2008-05-22 |
US8148052B2 (en) | 2012-04-03 |
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