JP2009524152A - 符号化及び信号処理機能を有するフラッシュメモリ - Google Patents
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- 239000004065 semiconductor Substances 0.000 description 2
- 210000000352 storage cell Anatomy 0.000 description 2
- 108010076504 Protein Sorting Signals Proteins 0.000 description 1
- 230000004913 activation Effects 0.000 description 1
- 230000003044 adaptive effect Effects 0.000 description 1
- 238000007792 addition Methods 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000004422 calculation algorithm Methods 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
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- G11C7/1006—Data managing, e.g. manipulating data before writing or reading out, data bus switches or control circuits therefor
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- G11C—STATIC STORES
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Abstract
【選択図】 図3A
Description
Claims (40)
- 第1の符号器と、
前記第1の符号器により符号化されたデータを記憶するマルチレベル固体不揮発性メモリアレイと、
前記メモリアレイから取出されたデータを復号化する第1の復号器と、
を含む固体不揮発性メモリユニット。 - 前記メモリアレイは、フラッシュEEPROMアレイである、請求項1に記載の固体不揮発性メモリユニット。
- 前記第1の符号器と通信する第2の符号器と、
前記第1の復号器と通信する第2の復号器と、
を更に含む、請求項1に記載の固体不揮発性メモリユニット。 - 前記第1の符号器は、第1のECCを実行し、
前記第1のECCは、前記第2の符号器により実行される第2のECCとは異なる、請求項3に記載の固体不揮発性メモリユニット。 - 前記第2の符号器は、リード−ソロモン符号器を含む、請求項3に記載の固体不揮発性メモリユニット。
- 前記符号化されたデータを変調する変調器と、
前記メモリアレイから取出された前記変調されたデータを復調する復調器と、
を更に含む、請求項1に記載の固体不揮発性メモリユニット。 - 前記第1の符号器は、バイナリ符号器である、請求項1に記載の固体不揮発性メモリユニット。
- 前記バイナリ符号器は、ハミング符号、BCH符号、リード−マラー符号、及びアレイ符号から構成される群から選択されるバイナリ符号に従って符号化する、請求項7に記載の固体不揮発性メモリユニット。
- 前記第1の符号器は、非バイナリ符号器及び畳み込み符号器から構成される群から選択される、請求項1に記載の固体不揮発性メモリユニット。
- 前記第1の符号器は、トレリス符号化変調器内に配置される、請求項1に記載の固体不揮発性メモリユニット。
- 前記第1の符号器は、反復符号器である、請求項1に記載の固体不揮発性メモリユニット。
- 前記反復符号器は、低密度パリティチェック符号、及び、ターボ符号を含む群から選択される符号に従って符号化する、請求項11に記載の固体不揮発性メモリユニット。
- 前記反復符号器は、シンボルに基づいた反復符号器である、請求項11に記載の固体不揮発性メモリユニット。
- 集積回路内に配置される、請求項1に記載の固体不揮発性メモリユニット。
- 固体不揮発性メモリユニットを動作させる方法であって、
第1のデータを符号化することと、
符号化された前記第1のデータを、マルチレベル固体不揮発性メモリアレイ内に記憶することと、
前記メモリアレイから符号化された前記第1のデータを取出すことと、
前記メモリアレイから取出された前記第1のデータを復号化することと、
を含む方法。 - 前記メモリアレイは、フラッシュEEPROMアレイである、請求項15に記載の方法。
- 前記第1のデータを生成すべく第2のデータを符号化することと、
前記第2のデータを生成すべく復号化された前記第1のデータを復号化することと、
を更に含む、請求項15に記載の方法。 - 前記第1のデータの符号化は、第1のECCに従って実行され、
前記第1のECCは、第2のECCとは異なり、
前記第2のデータは、前記第2のECCに従って符号化される、請求項17に記載の方法。 - 前記第2のECCは、リード−ソロモン符号である、請求項18に記載の方法。
- 前記符号化されたデータを変調することと、
前記変調されたデータを前記メモリアレイ内に記憶することと、
前記メモリアレイから前記変調されたデータを取出すことと、
前記メモリアレイから取出された前記データを復調することと、
を更に含む、請求項15に記載の方法。 - 前記第1のデータを、バイナリ符号に従って符号化することを更に含む、請求項15に記載の方法。
- 前記バイナリ符号は、ハミング符号、BCH符号、リード−マラー符号、及びアレイ符号から構成される群から選択される、請求項21に記載の方法。
- 前記第1のデータを、非バイナリ符号及び畳み込み符号のうちの1つに従って符号化することを更に含む、請求項15に記載の方法。
- 前記符号化は、トレリス符号化変調を含む、請求項20に記載の方法。
- 前記符号化は、反復符号化である、請求項15に記載の方法。
- 前記反復符号化は、低密度パリティチェック符号及びターボ符号から構成される群から選択される符号に従って実行される、請求項25に記載の方法。
- 前記反復符号化は、シンボルに基づいた反復符号化である、請求項25に記載の方法。
- 第1のデータを符号化する手段と、
符号化された前記第1のデータをマルチレベル固体不揮発性メモリアレイ内に記憶する手段と、
前記メモリアレイから符号化された前記第1のデータを取出する手段と、
前記メモリアレイから取出された前記第1のデータを復号化する手段と、
を含む固体不揮発性メモリユニット。 - 前記メモリアレイは、フラッシュEEPROMアレイである、請求項28に記載の固体不揮発性メモリユニット。
- 前記第1のデータを生成すべく第2のデータを符号化する手段と、
前記第2のデータを生成すべく復号化された前記第1のデータを復号化する手段と、
を更に含む、請求項28に記載の固体不揮発性メモリユニット。 - 前記第1のデータを符号化する前記手段は、第1のECCを実行し、
前記第1のECCは、前記第2のデータを符号化する前記手段により実行される第2のECCとは異なる、請求項30に記載の固体不揮発性メモリユニット。 - 前記第2のECCは、リード−ソロモン符号である、請求項31に記載の固体不揮発性メモリユニット。
- 前記符号化されたデータを変調する手段と、
前記変調されたデータを前記メモリアレイ内に記憶する手段と、
前記メモリアレイから前記変調されたデータを取出す手段と、
前記メモリアレイから取出された前記データを復調する手段と、
を更に含む、請求項28に記載の固体不揮発性メモリユニット。 - 前記第1のデータを符号化する前記手段は、バイナリ符号に従って符号化する、請求項28に記載の固体不揮発性メモリユニット。
- 前記第1のデータを符号化する前記手段は、ハミング符号、BCH符号、リード−マラー符号、及びアレイ符号から構成される群から選択されるバイナリ符号に従って符号化する、請求項34に記載の固体不揮発性メモリユニット。
- 前記第1のデータを符号化する前記手段は、非バイナリ符号器及び畳み込み符号器から構成される群から選択される、請求項28に記載の固体不揮発性メモリユニット。
- 前記第1のデータを符号化する前記手段は、トレリス符号化変調器内に配置される、請求項33に記載の固体不揮発性メモリユニット。
- 前記第1のデータを符号化する前記手段は、反復符号器である、請求項28に記載の固体不揮発性メモリユニット。
- 前記反復符号器は、低密度パリティチェック符号及びターボ符号から構成される群から選択される符号に従って符号化する、請求項38に記載の固体不揮発性メモリユニット。
- 前記反復符号器は、シンボルに基づいた反復符号器である、請求項38に記載の固体不揮発性メモリユニット。
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US76062206P | 2006-01-20 | 2006-01-20 | |
US60/760,622 | 2006-01-20 | ||
US76188806P | 2006-01-25 | 2006-01-25 | |
US60/761,888 | 2006-01-25 | ||
US77162106P | 2006-02-08 | 2006-02-08 | |
US60/771,621 | 2006-02-08 | ||
US11/598,178 US8055979B2 (en) | 2006-01-20 | 2006-11-08 | Flash memory with coding and signal processing |
US11/598,178 | 2006-11-08 | ||
PCT/US2007/001623 WO2007084751A2 (en) | 2006-01-20 | 2007-01-19 | Flash memory with coding and signal processing |
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Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010511968A (ja) * | 2006-12-06 | 2010-04-15 | サムスン エレクトロニクス カンパニー リミテッド | マルチレベルセルメモリ装置および方法 |
JP2010123236A (ja) * | 2008-08-08 | 2010-06-03 | Marvell World Trade Ltd | 部分参照電圧を利用するメモリアクセス |
JP2011508357A (ja) * | 2007-12-27 | 2011-03-10 | サンディスク アイエル リミテッド | 1セル当り単一ビットnandフラッシュメモリをエミュレートする1セル当り多ビットnandフラッシュメモリ用コントローラ |
JP2011243198A (ja) * | 2010-05-19 | 2011-12-01 | Micron Technology Inc | 拡張マルチレベルメモリ |
JP2012504842A (ja) * | 2008-09-30 | 2012-02-23 | エルエスアイ コーポレーション | 基準セルを使用する、メモリ・デバイスの軟データ生成の方法および装置 |
JP2012507819A (ja) * | 2008-10-30 | 2012-03-29 | マイクロン テクノロジー, インク. | マルチレベルセルメモリに対するデータパス、格納方法およびメモリアレイの使用方法 |
JP2013539120A (ja) * | 2010-09-23 | 2013-10-17 | マイクロン テクノロジー, インク. | メモリ品質監視ベースの補正方法および装置 |
KR20140081753A (ko) * | 2012-12-21 | 2014-07-01 | 삼성전자주식회사 | 무선 통신 시스템에서 복수의 변조 기법을 이용한 신호 송수신 방법 및 장치 |
JP2014517976A (ja) * | 2011-05-12 | 2014-07-24 | マイクロン テクノロジー, インク. | メモリセルをプログラミングすること |
JP2015535640A (ja) * | 2012-12-03 | 2015-12-14 | ウェスタン デジタル テクノロジーズ インコーポレーテッド | ランタイム可変raid保護スキームを有する方法、ソリッドステートドライブコントローラー、及びデータ格納装置 |
JP2017504925A (ja) * | 2013-12-20 | 2017-02-09 | アップル インコーポレイテッド | アナログメモリセルにおけるセル当り非整数個のビットを用いたデータ記憶の管理 |
JP2023071144A (ja) * | 2021-11-10 | 2023-05-22 | ウェスタン デジタル テクノロジーズ インコーポレーテッド | マルチセルマッピングのための記憶システム及び方法 |
Families Citing this family (273)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100605100B1 (ko) * | 2003-11-05 | 2006-07-26 | 삼성전자주식회사 | 데이터 전송 속도가 향상된 아이씨 카드, 아이씨 카드프로세서 및 아이씨 카드 시스템 |
US9557994B2 (en) * | 2004-07-13 | 2017-01-31 | Arm Limited | Data processing apparatus and method for performing N-way interleaving and de-interleaving operations where N is an odd plural number |
WO2007132457A2 (en) | 2006-05-12 | 2007-11-22 | Anobit Technologies Ltd. | Combined distortion estimation and error correction coding for memory devices |
CN103280239B (zh) | 2006-05-12 | 2016-04-06 | 苹果公司 | 存储设备中的失真估计和消除 |
US8239735B2 (en) | 2006-05-12 | 2012-08-07 | Apple Inc. | Memory Device with adaptive capacity |
WO2007132452A2 (en) | 2006-05-12 | 2007-11-22 | Anobit Technologies | Reducing programming error in memory devices |
US20070266296A1 (en) * | 2006-05-15 | 2007-11-15 | Conley Kevin M | Nonvolatile Memory with Convolutional Coding |
US7840875B2 (en) * | 2006-05-15 | 2010-11-23 | Sandisk Corporation | Convolutional coding methods for nonvolatile memory |
JP4896605B2 (ja) * | 2006-07-04 | 2012-03-14 | 株式会社東芝 | 不揮発性半導体記憶システム |
US8046660B2 (en) * | 2006-08-07 | 2011-10-25 | Marvell World Trade Ltd. | System and method for correcting errors in non-volatile memory using product codes |
US7369434B2 (en) * | 2006-08-14 | 2008-05-06 | Micron Technology, Inc. | Flash memory with multi-bit read |
WO2008026203A2 (en) | 2006-08-27 | 2008-03-06 | Anobit Technologies | Estimation of non-linear distortion in memory devices |
US7818653B2 (en) | 2006-09-28 | 2010-10-19 | Sandisk Corporation | Methods of soft-input soft-output decoding for nonvolatile memory |
US7904783B2 (en) * | 2006-09-28 | 2011-03-08 | Sandisk Corporation | Soft-input soft-output decoder for nonvolatile memory |
US7805663B2 (en) * | 2006-09-28 | 2010-09-28 | Sandisk Corporation | Methods of adapting operation of nonvolatile memory |
US7821826B2 (en) | 2006-10-30 | 2010-10-26 | Anobit Technologies, Ltd. | Memory cell readout using successive approximation |
US7975192B2 (en) | 2006-10-30 | 2011-07-05 | Anobit Technologies Ltd. | Reading memory cells using multiple thresholds |
US7924648B2 (en) | 2006-11-28 | 2011-04-12 | Anobit Technologies Ltd. | Memory power and performance management |
US7827450B1 (en) | 2006-11-28 | 2010-11-02 | Marvell International Ltd. | Defect detection and handling for memory based on pilot cells |
US8190961B1 (en) | 2006-11-28 | 2012-05-29 | Marvell International Ltd. | System and method for using pilot signals in non-volatile memory devices |
US8151163B2 (en) | 2006-12-03 | 2012-04-03 | Anobit Technologies Ltd. | Automatic defect management in memory devices |
CN101681282A (zh) | 2006-12-06 | 2010-03-24 | 弗森多系统公司(dba弗森-艾奥) | 用于共享的、前端、分布式raid的装置、系统和方法 |
KR100785925B1 (ko) * | 2006-12-06 | 2007-12-17 | 삼성전자주식회사 | Tcm을 이용한 멀티 레벨 셀 메모리 장치 |
US9116823B2 (en) * | 2006-12-06 | 2015-08-25 | Intelligent Intellectual Property Holdings 2 Llc | Systems and methods for adaptive error-correction coding |
US7900102B2 (en) | 2006-12-17 | 2011-03-01 | Anobit Technologies Ltd. | High-speed programming of memory devices |
KR100822030B1 (ko) * | 2006-12-26 | 2008-04-15 | 삼성전자주식회사 | 고 부호화율 부호를 이용한 멀티 레벨 셀 메모리 장치 |
US8583981B2 (en) * | 2006-12-29 | 2013-11-12 | Marvell World Trade Ltd. | Concatenated codes for holographic storage |
KR100842680B1 (ko) * | 2007-01-08 | 2008-07-01 | 삼성전자주식회사 | 플래시 메모리 장치의 오류 정정 컨트롤러 및 그것을포함하는 메모리 시스템 |
US8151166B2 (en) | 2007-01-24 | 2012-04-03 | Anobit Technologies Ltd. | Reduction of back pattern dependency effects in memory devices |
US7751240B2 (en) | 2007-01-24 | 2010-07-06 | Anobit Technologies Ltd. | Memory device with negative thresholds |
WO2008111058A2 (en) | 2007-03-12 | 2008-09-18 | Anobit Technologies Ltd. | Adaptive estimation of memory cell read thresholds |
US7904793B2 (en) * | 2007-03-29 | 2011-03-08 | Sandisk Corporation | Method for decoding data in non-volatile storage using reliability metrics based on multiple reads |
US7966546B2 (en) * | 2007-03-31 | 2011-06-21 | Sandisk Technologies Inc. | Non-volatile memory with soft bit data transmission for error correction control |
US7975209B2 (en) * | 2007-03-31 | 2011-07-05 | Sandisk Technologies Inc. | Non-volatile memory with guided simulated annealing error correction control |
US7971127B2 (en) * | 2007-03-31 | 2011-06-28 | Sandisk Technologies Inc. | Guided simulated annealing in non-volatile memory error correction control |
US7966550B2 (en) * | 2007-03-31 | 2011-06-21 | Sandisk Technologies Inc. | Soft bit data transmission for error correction control in non-volatile memory |
US8001320B2 (en) | 2007-04-22 | 2011-08-16 | Anobit Technologies Ltd. | Command interface for memory devices |
US8234545B2 (en) | 2007-05-12 | 2012-07-31 | Apple Inc. | Data storage with incremental redundancy |
WO2008139441A2 (en) | 2007-05-12 | 2008-11-20 | Anobit Technologies Ltd. | Memory device with internal signal processing unit |
US8117520B2 (en) * | 2007-06-15 | 2012-02-14 | Micron Technology, Inc. | Error detection for multi-bit memory |
US8051358B2 (en) * | 2007-07-06 | 2011-11-01 | Micron Technology, Inc. | Error recovery storage along a nand-flash string |
US8065583B2 (en) | 2007-07-06 | 2011-11-22 | Micron Technology, Inc. | Data storage with an outer block code and a stream-based inner code |
US7925936B1 (en) | 2007-07-13 | 2011-04-12 | Anobit Technologies Ltd. | Memory device with non-uniform programming levels |
KR101480383B1 (ko) * | 2007-07-25 | 2015-01-09 | 삼성전자주식회사 | 코드 인코딩 장치 |
US8259497B2 (en) | 2007-08-06 | 2012-09-04 | Apple Inc. | Programming schemes for multi-level analog memory cells |
US7782232B2 (en) * | 2007-08-08 | 2010-08-24 | Marvell World Trade Ltd. | Encoding and decoding methods using generalized concatenated codes (GCC) |
US7995412B2 (en) * | 2007-09-07 | 2011-08-09 | Micron Technology, Inc. | Analog-to-digital and digital-to-analog conversion window adjustment based on reference cells in a memory device |
US8174905B2 (en) | 2007-09-19 | 2012-05-08 | Anobit Technologies Ltd. | Programming orders for reducing distortion in arrays of multi-level analog memory cells |
US8650352B2 (en) | 2007-09-20 | 2014-02-11 | Densbits Technologies Ltd. | Systems and methods for determining logical values of coupled flash memory cells |
WO2009095902A2 (en) | 2008-01-31 | 2009-08-06 | Densbits Technologies Ltd. | Systems and methods for handling immediate data errors in flash memory |
US7773413B2 (en) | 2007-10-08 | 2010-08-10 | Anobit Technologies Ltd. | Reliable data storage in analog memory cells in the presence of temperature variations |
US8068360B2 (en) | 2007-10-19 | 2011-11-29 | Anobit Technologies Ltd. | Reading analog memory cells using built-in multi-threshold commands |
US8000141B1 (en) | 2007-10-19 | 2011-08-16 | Anobit Technologies Ltd. | Compensation for voltage drifts in analog memory cells |
US8527819B2 (en) | 2007-10-19 | 2013-09-03 | Apple Inc. | Data storage in analog memory cell arrays having erase failures |
US8694715B2 (en) | 2007-10-22 | 2014-04-08 | Densbits Technologies Ltd. | Methods for adaptively programming flash memory devices and flash memory systems incorporating same |
US8301963B2 (en) * | 2007-10-23 | 2012-10-30 | Spansion Llc | Low-density parity-check code based error correction for memory device |
US8443242B2 (en) | 2007-10-25 | 2013-05-14 | Densbits Technologies Ltd. | Systems and methods for multiple coding rates in flash devices |
US8270246B2 (en) | 2007-11-13 | 2012-09-18 | Apple Inc. | Optimized selection of memory chips in multi-chips memory devices |
US8225180B2 (en) * | 2007-11-20 | 2012-07-17 | California Institute Of Technology | Error correcting codes for rank modulation |
US8499229B2 (en) | 2007-11-21 | 2013-07-30 | Micro Technology, Inc. | Method and apparatus for reading data from flash memory |
US8046542B2 (en) * | 2007-11-21 | 2011-10-25 | Micron Technology, Inc. | Fault-tolerant non-volatile integrated circuit memory |
US7633798B2 (en) * | 2007-11-21 | 2009-12-15 | Micron Technology, Inc. | M+N bit programming and M+L bit read for M bit memory cells |
US8327245B2 (en) * | 2007-11-21 | 2012-12-04 | Micron Technology, Inc. | Memory controller supporting rate-compatible punctured codes |
US8225181B2 (en) | 2007-11-30 | 2012-07-17 | Apple Inc. | Efficient re-read operations from memory devices |
WO2009072104A2 (en) | 2007-12-05 | 2009-06-11 | Densbits Technologies Ltd. | Flash memory device with physical cell value deterioration accommodation and methods useful in conjunction therewith |
WO2009072103A2 (en) | 2007-12-05 | 2009-06-11 | Densbits Technologies Ltd. | Flash memory apparatus and methods using a plurality of decoding stages including optional use of concatenated bch codes and/or designation of 'first below' cells |
US8607128B2 (en) | 2007-12-05 | 2013-12-10 | Densbits Technologies Ltd. | Low power chien-search based BCH/RS decoding system for flash memory, mobile communications devices and other applications |
US8234539B2 (en) * | 2007-12-06 | 2012-07-31 | Sandisk Il Ltd. | Correction of errors in a memory array |
US8209588B2 (en) | 2007-12-12 | 2012-06-26 | Anobit Technologies Ltd. | Efficient interference cancellation in analog memory cell arrays |
WO2009074979A2 (en) * | 2007-12-12 | 2009-06-18 | Densbits Technologies Ltd. | Chien-search system employing a clock-gating scheme to save power for error correction decoder and other applications |
US8359516B2 (en) * | 2007-12-12 | 2013-01-22 | Densbits Technologies Ltd. | Systems and methods for error correction and decoding on multi-level physical media |
US8456905B2 (en) | 2007-12-16 | 2013-06-04 | Apple Inc. | Efficient data storage in multi-plane memory devices |
US8327246B2 (en) | 2007-12-18 | 2012-12-04 | Densbits Technologies Ltd. | Apparatus for coding at a plurality of rates in multi-level flash memory systems, and methods useful in conjunction therewith |
US8085586B2 (en) | 2007-12-27 | 2011-12-27 | Anobit Technologies Ltd. | Wear level estimation in analog memory cells |
US8156398B2 (en) | 2008-02-05 | 2012-04-10 | Anobit Technologies Ltd. | Parameter estimation based on error correction code parity check equations |
US7924587B2 (en) | 2008-02-21 | 2011-04-12 | Anobit Technologies Ltd. | Programming of analog memory cells using a single programming pulse per state transition |
US7864573B2 (en) | 2008-02-24 | 2011-01-04 | Anobit Technologies Ltd. | Programming analog memory cells for reduced variance after retention |
KR101497073B1 (ko) * | 2008-02-29 | 2015-03-02 | 삼성전자주식회사 | 메모리 셀에 저장되는 데이터의 비트 수를 결정하는 장치 |
US8230300B2 (en) | 2008-03-07 | 2012-07-24 | Apple Inc. | Efficient readout from analog memory cells using data compression |
WO2009110144A1 (en) * | 2008-03-07 | 2009-09-11 | Kabushiki Kaisha Toshiba | Information processing apparatus and non-volatile semiconductor memory drive |
KR20090097673A (ko) * | 2008-03-12 | 2009-09-16 | 삼성전자주식회사 | 연판정 값에 기반하여 메모리에 저장된 데이터를 검출하는장치 |
US8400858B2 (en) | 2008-03-18 | 2013-03-19 | Apple Inc. | Memory device with reduced sense time readout |
US8059457B2 (en) | 2008-03-18 | 2011-11-15 | Anobit Technologies Ltd. | Memory device with multiple-accuracy read commands |
US8972472B2 (en) | 2008-03-25 | 2015-03-03 | Densbits Technologies Ltd. | Apparatus and methods for hardware-efficient unbiased rounding |
US8239728B1 (en) * | 2008-06-27 | 2012-08-07 | Link—A—Media Devices Corporation | Set partitioning and multilevel coding |
JP5710475B2 (ja) * | 2008-07-01 | 2015-04-30 | エルエスアイ コーポレーション | フラッシュ・メモリにおけるソフト・デマッピングおよびセル間干渉軽減のための方法および装置 |
US7924613B1 (en) | 2008-08-05 | 2011-04-12 | Anobit Technologies Ltd. | Data storage in analog memory cells with protection against programming interruption |
US7995388B1 (en) | 2008-08-05 | 2011-08-09 | Anobit Technologies Ltd. | Data storage using modified voltages |
US8332725B2 (en) | 2008-08-20 | 2012-12-11 | Densbits Technologies Ltd. | Reprogramming non volatile memory portions |
US7986158B2 (en) * | 2008-08-21 | 2011-07-26 | OFID Microdevices, Inc. | Methods, apparatuses, and products for a secure circuit |
US8169825B1 (en) | 2008-09-02 | 2012-05-01 | Anobit Technologies Ltd. | Reliable data storage in analog memory cells subjected to long retention periods |
US8949684B1 (en) | 2008-09-02 | 2015-02-03 | Apple Inc. | Segmented data storage |
US8000135B1 (en) | 2008-09-14 | 2011-08-16 | Anobit Technologies Ltd. | Estimation of memory cell read thresholds by sampling inside programming level distribution intervals |
US8482978B1 (en) | 2008-09-14 | 2013-07-09 | Apple Inc. | Estimation of memory cell read thresholds by sampling inside programming level distribution intervals |
US8239734B1 (en) * | 2008-10-15 | 2012-08-07 | Apple Inc. | Efficient data storage in storage device arrays |
US8261159B1 (en) | 2008-10-30 | 2012-09-04 | Apple, Inc. | Data scrambling schemes for memory devices |
US8208304B2 (en) | 2008-11-16 | 2012-06-26 | Anobit Technologies Ltd. | Storage at M bits/cell density in N bits/cell analog memory cell devices, M>N |
US8291297B2 (en) * | 2008-12-18 | 2012-10-16 | Intel Corporation | Data error recovery in non-volatile memory |
US8248831B2 (en) | 2008-12-31 | 2012-08-21 | Apple Inc. | Rejuvenation of analog memory cells |
WO2010077408A1 (en) * | 2008-12-31 | 2010-07-08 | Rambus Inc. | Pattern-sensitive coding of data for storage in multi-level memory cells |
US8397131B1 (en) | 2008-12-31 | 2013-03-12 | Apple Inc. | Efficient readout schemes for analog memory cell devices |
US8924661B1 (en) | 2009-01-18 | 2014-12-30 | Apple Inc. | Memory system including a controller and processors associated with memory devices |
US8228701B2 (en) | 2009-03-01 | 2012-07-24 | Apple Inc. | Selective activation of programming schemes in analog memory cell arrays |
US8259506B1 (en) | 2009-03-25 | 2012-09-04 | Apple Inc. | Database of memory read thresholds |
US8832354B2 (en) | 2009-03-25 | 2014-09-09 | Apple Inc. | Use of host system resources by memory controller |
US8418021B2 (en) | 2009-03-27 | 2013-04-09 | Mediatek Inc. | Storage controller with encoding/decoding circuit programmable to support different ECC requirements and related method thereof |
CN101847447A (zh) * | 2009-03-27 | 2010-09-29 | 联发科技股份有限公司 | 存储控制器、存储控制方法及数据存取系统 |
US8819385B2 (en) | 2009-04-06 | 2014-08-26 | Densbits Technologies Ltd. | Device and method for managing a flash memory |
US8458574B2 (en) | 2009-04-06 | 2013-06-04 | Densbits Technologies Ltd. | Compact chien-search based decoding apparatus and method |
US8238157B1 (en) | 2009-04-12 | 2012-08-07 | Apple Inc. | Selective re-programming of analog memory cells |
US8370709B2 (en) * | 2009-04-16 | 2013-02-05 | Micron Technology, Inc. | Multiple-level memory cells and error detection |
US8341501B2 (en) | 2009-04-30 | 2012-12-25 | International Business Machines Corporation | Adaptive endurance coding of non-volatile memories |
US8307261B2 (en) * | 2009-05-04 | 2012-11-06 | National Tsing Hua University | Non-volatile memory management method |
US8566510B2 (en) | 2009-05-12 | 2013-10-22 | Densbits Technologies Ltd. | Systems and method for flash memory management |
US8479080B1 (en) | 2009-07-12 | 2013-07-02 | Apple Inc. | Adaptive over-provisioning in memory systems |
US8995197B1 (en) | 2009-08-26 | 2015-03-31 | Densbits Technologies Ltd. | System and methods for dynamic erase and program control for flash memory device memories |
US9330767B1 (en) | 2009-08-26 | 2016-05-03 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Flash memory module and method for programming a page of flash memory cells |
US8305812B2 (en) | 2009-08-26 | 2012-11-06 | Densbits Technologies Ltd. | Flash memory module and method for programming a page of flash memory cells |
US8868821B2 (en) | 2009-08-26 | 2014-10-21 | Densbits Technologies Ltd. | Systems and methods for pre-equalization and code design for a flash memory |
US8730729B2 (en) | 2009-10-15 | 2014-05-20 | Densbits Technologies Ltd. | Systems and methods for averaging error rates in non-volatile devices and storage systems |
US8495465B1 (en) | 2009-10-15 | 2013-07-23 | Apple Inc. | Error correction coding over multiple memory pages |
US8724387B2 (en) | 2009-10-22 | 2014-05-13 | Densbits Technologies Ltd. | Method, system, and computer readable medium for reading and programming flash memory cells using multiple bias voltages |
US8626988B2 (en) | 2009-11-19 | 2014-01-07 | Densbits Technologies Ltd. | System and method for uncoded bit error rate equalization via interleaving |
US8130553B2 (en) * | 2009-12-02 | 2012-03-06 | Seagate Technology Llc | Systems and methods for low wear operation of solid state memory |
US8176234B2 (en) * | 2009-12-04 | 2012-05-08 | International Business Machines Corporation | Multi-write coding of non-volatile memories |
US8176235B2 (en) * | 2009-12-04 | 2012-05-08 | International Business Machines Corporation | Non-volatile memories with enhanced write performance and endurance |
US8677054B1 (en) | 2009-12-16 | 2014-03-18 | Apple Inc. | Memory management schemes for non-volatile memory devices |
CN102656566B (zh) | 2009-12-17 | 2015-12-16 | 国际商业机器公司 | 固态存储系统中的数据管理 |
US9037777B2 (en) | 2009-12-22 | 2015-05-19 | Densbits Technologies Ltd. | Device, system, and method for reducing program/read disturb in flash arrays |
US8607124B2 (en) | 2009-12-24 | 2013-12-10 | Densbits Technologies Ltd. | System and method for setting a flash memory cell read threshold |
TWI419481B (zh) * | 2009-12-31 | 2013-12-11 | Nat Univ Tsing Hua | 低密度奇偶檢查碼編解碼器及其方法 |
US8694814B1 (en) | 2010-01-10 | 2014-04-08 | Apple Inc. | Reuse of host hibernation storage space by memory controller |
US8572311B1 (en) | 2010-01-11 | 2013-10-29 | Apple Inc. | Redundant data storage in multi-die memory systems |
US8700970B2 (en) | 2010-02-28 | 2014-04-15 | Densbits Technologies Ltd. | System and method for multi-dimensional decoding |
WO2011108540A1 (ja) | 2010-03-03 | 2011-09-09 | 国立大学法人大阪大学 | ヌクレオチドを識別する方法および装置、ならびにポリヌクレオチドのヌクレオチド配列を決定する方法および装置 |
KR101541040B1 (ko) | 2010-03-12 | 2015-08-03 | 엘에스아이 코포레이션 | 플래시 메모리들을 위한 ldpc 소거 디코딩 |
US8418022B2 (en) * | 2010-03-25 | 2013-04-09 | Allen LeRoy Limberg | Utilization of non-systematic (207, 187) Reed-Solomon coding in mobile/hand-held digital television receivers |
US8775913B2 (en) | 2010-03-31 | 2014-07-08 | Lsi Corporation | Methods and apparatus for computing soft data or log likelihood ratios for received values in communication or storage systems |
US8429500B2 (en) | 2010-03-31 | 2013-04-23 | Lsi Corporation | Methods and apparatus for computing a probability value of a received value in communication or storage systems |
US8504885B2 (en) | 2010-03-31 | 2013-08-06 | Lsi Corporation | Methods and apparatus for approximating a probability density function or distribution for a received value in communication or storage systems |
US8516274B2 (en) | 2010-04-06 | 2013-08-20 | Densbits Technologies Ltd. | Method, system and medium for analog encryption in a flash memory |
US8527840B2 (en) | 2010-04-06 | 2013-09-03 | Densbits Technologies Ltd. | System and method for restoring damaged data programmed on a flash device |
US8745317B2 (en) | 2010-04-07 | 2014-06-03 | Densbits Technologies Ltd. | System and method for storing information in a multi-level cell memory |
US9021177B2 (en) | 2010-04-29 | 2015-04-28 | Densbits Technologies Ltd. | System and method for allocating and using spare blocks in a flash memory |
US8694853B1 (en) | 2010-05-04 | 2014-04-08 | Apple Inc. | Read commands for reading interfering memory cells |
US8406051B2 (en) * | 2010-05-17 | 2013-03-26 | Seagate Technology Llc | Iterative demodulation and decoding for multi-page memory architecture |
US8489979B2 (en) | 2010-05-28 | 2013-07-16 | Seagate Technology Llc | Methods and devices to reduce outer code failure rate variability |
US8572457B2 (en) | 2010-05-28 | 2013-10-29 | Seagate Technology Llc | Outer code protection for solid state memory devices |
US11336303B2 (en) * | 2010-06-04 | 2022-05-17 | Micron Technology, Inc. | Advanced bitwise operations and apparatus in a multi-level system with nonvolatile memory |
US8615703B2 (en) * | 2010-06-04 | 2013-12-24 | Micron Technology, Inc. | Advanced bitwise operations and apparatus in a multi-level system with nonvolatile memory |
US8572423B1 (en) | 2010-06-22 | 2013-10-29 | Apple Inc. | Reducing peak current in memory systems |
US8468431B2 (en) | 2010-07-01 | 2013-06-18 | Densbits Technologies Ltd. | System and method for multi-dimensional encoding and decoding |
US8539311B2 (en) | 2010-07-01 | 2013-09-17 | Densbits Technologies Ltd. | System and method for data recovery in multi-level cell memories |
US8467249B2 (en) | 2010-07-06 | 2013-06-18 | Densbits Technologies Ltd. | Systems and methods for storing, retrieving, and adjusting read thresholds in flash memory storage system |
US8595591B1 (en) | 2010-07-11 | 2013-11-26 | Apple Inc. | Interference-aware assignment of programming levels in analog memory cells |
US9104580B1 (en) | 2010-07-27 | 2015-08-11 | Apple Inc. | Cache memory for hybrid disk drives |
US8767459B1 (en) | 2010-07-31 | 2014-07-01 | Apple Inc. | Data storage in analog memory cells across word lines using a non-integer number of bits per cell |
US8856475B1 (en) | 2010-08-01 | 2014-10-07 | Apple Inc. | Efficient selection of memory blocks for compaction |
US8694854B1 (en) | 2010-08-17 | 2014-04-08 | Apple Inc. | Read threshold setting based on soft readout statistics |
US8964464B2 (en) | 2010-08-24 | 2015-02-24 | Densbits Technologies Ltd. | System and method for accelerated sampling |
US8508995B2 (en) | 2010-09-15 | 2013-08-13 | Densbits Technologies Ltd. | System and method for adjusting read voltage thresholds in memories |
US9021181B1 (en) | 2010-09-27 | 2015-04-28 | Apple Inc. | Memory management for unifying memory cell conditions by using maximum time intervals |
GB2498298B (en) | 2010-09-29 | 2017-03-22 | Ibm | Decoding in solid state memory devices |
US8341498B2 (en) | 2010-10-01 | 2012-12-25 | Sandisk Technologies Inc. | System and method of data encoding |
US8769374B2 (en) | 2010-10-13 | 2014-07-01 | International Business Machines Corporation | Multi-write endurance and error control coding of non-volatile memories |
WO2012058328A1 (en) * | 2010-10-27 | 2012-05-03 | Sandforce, Inc. | Adaptive ecc techniques for flash memory based data storage |
US9063878B2 (en) | 2010-11-03 | 2015-06-23 | Densbits Technologies Ltd. | Method, system and computer readable medium for copy back |
US8464137B2 (en) | 2010-12-03 | 2013-06-11 | International Business Machines Corporation | Probabilistic multi-tier error correction in not-and (NAND) flash memory |
US8850100B2 (en) | 2010-12-07 | 2014-09-30 | Densbits Technologies Ltd. | Interleaving codeword portions between multiple planes and/or dies of a flash memory device |
US8719663B2 (en) | 2010-12-12 | 2014-05-06 | Lsi Corporation | Cross-decoding for non-volatile storage |
US8756473B1 (en) | 2010-12-23 | 2014-06-17 | Sk Hynix Memory Solutions Inc. | Solid state device coding architecture for chipkill and endurance improvement |
US9898361B2 (en) | 2011-01-04 | 2018-02-20 | Seagate Technology Llc | Multi-tier detection and decoding in flash memories |
US9292377B2 (en) | 2011-01-04 | 2016-03-22 | Seagate Technology Llc | Detection and decoding in flash memories using correlation of neighboring bits and probability based reliability values |
US10079068B2 (en) | 2011-02-23 | 2018-09-18 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Devices and method for wear estimation based memory management |
US9502117B2 (en) | 2011-03-14 | 2016-11-22 | Seagate Technology Llc | Cell-level statistics collection for detection and decoding in flash memories |
US8693258B2 (en) | 2011-03-17 | 2014-04-08 | Densbits Technologies Ltd. | Obtaining soft information using a hard interface |
US8839076B2 (en) * | 2011-03-31 | 2014-09-16 | International Business Machines Corporation | Encoding a data word for writing the encoded data word in a multi-level solid state memory |
US8990665B1 (en) | 2011-04-06 | 2015-03-24 | Densbits Technologies Ltd. | System, method and computer program product for joint search of a read threshold and soft decoding |
US8719656B2 (en) * | 2011-04-11 | 2014-05-06 | Nec Laboratories America, Inc. | Four-dimensional non-binary LDPC-coded modulation schemes for ultra high-speed optical fiber communication |
US9501392B1 (en) | 2011-05-12 | 2016-11-22 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Management of a non-volatile memory module |
US9372792B1 (en) | 2011-05-12 | 2016-06-21 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Advanced management of a non-volatile memory |
US9195592B1 (en) | 2011-05-12 | 2015-11-24 | Densbits Technologies Ltd. | Advanced management of a non-volatile memory |
US8996790B1 (en) | 2011-05-12 | 2015-03-31 | Densbits Technologies Ltd. | System and method for flash memory management |
US9110785B1 (en) | 2011-05-12 | 2015-08-18 | Densbits Technologies Ltd. | Ordered merge of data sectors that belong to memory space portions |
US9396106B2 (en) | 2011-05-12 | 2016-07-19 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Advanced management of a non-volatile memory |
US8667211B2 (en) | 2011-06-01 | 2014-03-04 | Densbits Technologies Ltd. | System and method for managing a non-volatile memory |
US8588003B1 (en) | 2011-08-01 | 2013-11-19 | Densbits Technologies Ltd. | System, method and computer program product for programming and for recovering from a power failure |
US8527849B2 (en) * | 2011-08-19 | 2013-09-03 | Stec, Inc. | High speed hard LDPC decoder |
US8553468B2 (en) | 2011-09-21 | 2013-10-08 | Densbits Technologies Ltd. | System and method for managing erase operations in a non-volatile memory |
US8918705B1 (en) | 2012-01-11 | 2014-12-23 | Sk Hynix Memory Solutions Inc. | Error recovery by modifying soft information |
US8996788B2 (en) | 2012-02-09 | 2015-03-31 | Densbits Technologies Ltd. | Configurable flash interface |
US8947941B2 (en) | 2012-02-09 | 2015-02-03 | Densbits Technologies Ltd. | State responsive operations relating to flash memory cells |
US8788743B2 (en) * | 2012-04-11 | 2014-07-22 | Micron Technology, Inc. | Mapping between program states and data patterns |
US8996793B1 (en) | 2012-04-24 | 2015-03-31 | Densbits Technologies Ltd. | System, method and computer readable medium for generating soft information |
US8856611B2 (en) | 2012-08-04 | 2014-10-07 | Lsi Corporation | Soft-decision compensation for flash channel variation |
US9176812B1 (en) | 2012-05-22 | 2015-11-03 | Pmc-Sierra, Inc. | Systems and methods for storing data in page stripes of a flash drive |
US9183085B1 (en) | 2012-05-22 | 2015-11-10 | Pmc-Sierra, Inc. | Systems and methods for adaptively selecting from among a plurality of error correction coding schemes in a flash drive for robustness and low latency |
US9047214B1 (en) | 2012-05-22 | 2015-06-02 | Pmc-Sierra, Inc. | System and method for tolerating a failed page in a flash device |
US9021333B1 (en) | 2012-05-22 | 2015-04-28 | Pmc-Sierra, Inc. | Systems and methods for recovering data from failed portions of a flash drive |
US8793556B1 (en) | 2012-05-22 | 2014-07-29 | Pmc-Sierra, Inc. | Systems and methods for reclaiming flash blocks of a flash drive |
US9021336B1 (en) | 2012-05-22 | 2015-04-28 | Pmc-Sierra, Inc. | Systems and methods for redundantly storing error correction codes in a flash drive with secondary parity information spread out across each page of a group of pages |
US9021337B1 (en) | 2012-05-22 | 2015-04-28 | Pmc-Sierra, Inc. | Systems and methods for adaptively selecting among different error correction coding schemes in a flash drive |
US8788910B1 (en) | 2012-05-22 | 2014-07-22 | Pmc-Sierra, Inc. | Systems and methods for low latency, high reliability error correction in a flash drive |
US8996957B1 (en) | 2012-05-22 | 2015-03-31 | Pmc-Sierra, Inc. | Systems and methods for initializing regions of a flash drive having diverse error correction coding (ECC) schemes |
US8972824B1 (en) | 2012-05-22 | 2015-03-03 | Pmc-Sierra, Inc. | Systems and methods for transparently varying error correction code strength in a flash drive |
US8838937B1 (en) | 2012-05-23 | 2014-09-16 | Densbits Technologies Ltd. | Methods, systems and computer readable medium for writing and reading data |
US8879325B1 (en) | 2012-05-30 | 2014-11-04 | Densbits Technologies Ltd. | System, method and computer program product for processing read threshold information and for reading a flash memory module |
US8804415B2 (en) | 2012-06-19 | 2014-08-12 | Fusion-Io, Inc. | Adaptive voltage range management in non-volatile memory |
US8856431B2 (en) | 2012-08-02 | 2014-10-07 | Lsi Corporation | Mixed granularity higher-level redundancy for non-volatile memory |
US9239754B2 (en) | 2012-08-04 | 2016-01-19 | Seagate Technology Llc | Single read based soft-decision decoding of non-volatile memory |
US9921954B1 (en) | 2012-08-27 | 2018-03-20 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Method and system for split flash memory management between host and storage controller |
US9577673B2 (en) | 2012-11-08 | 2017-02-21 | Micron Technology, Inc. | Error correction methods and apparatuses using first and second decoders |
US9368225B1 (en) | 2012-11-21 | 2016-06-14 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Determining read thresholds based upon read error direction statistics |
US9069659B1 (en) | 2013-01-03 | 2015-06-30 | Densbits Technologies Ltd. | Read threshold determination using reference read threshold |
US9214965B2 (en) | 2013-02-20 | 2015-12-15 | Sandisk Enterprise Ip Llc | Method and system for improving data integrity in non-volatile storage |
US9208018B1 (en) | 2013-03-15 | 2015-12-08 | Pmc-Sierra, Inc. | Systems and methods for reclaiming memory for solid-state memory |
US9053012B1 (en) | 2013-03-15 | 2015-06-09 | Pmc-Sierra, Inc. | Systems and methods for storing data for solid-state memory |
US9026867B1 (en) | 2013-03-15 | 2015-05-05 | Pmc-Sierra, Inc. | Systems and methods for adapting to changing characteristics of multi-level cells in solid-state memory |
US9081701B1 (en) | 2013-03-15 | 2015-07-14 | Pmc-Sierra, Inc. | Systems and methods for decoding data for solid-state memory |
US9047211B2 (en) | 2013-03-15 | 2015-06-02 | SanDisk Technologies, Inc. | Managing data reliability |
US9009565B1 (en) | 2013-03-15 | 2015-04-14 | Pmc-Sierra, Inc. | Systems and methods for mapping for solid-state memory |
US9136876B1 (en) | 2013-06-13 | 2015-09-15 | Densbits Technologies Ltd. | Size limited multi-dimensional decoding |
US9183095B1 (en) | 2013-06-28 | 2015-11-10 | Sk Hynix Memory Solutions Inc. | Recovering from a program failure by combining write data |
KR102068519B1 (ko) | 2013-07-01 | 2020-01-21 | 삼성전자주식회사 | 저장 장치, 그것의 쓰기 방법 및 읽기 방법 |
WO2015016880A1 (en) | 2013-07-31 | 2015-02-05 | Hewlett-Packard Development Company, L.P. | Global error correction |
KR102120823B1 (ko) * | 2013-08-14 | 2020-06-09 | 삼성전자주식회사 | 비휘발성 메모리 장치의 독출 시퀀스 제어 방법 및 이를 수행하는 메모리 시스템 |
CA2929929A1 (en) | 2013-09-18 | 2015-03-26 | Quantum Biosystems Inc. | Biomolecule sequencing devices, systems and methods |
US9413491B1 (en) | 2013-10-08 | 2016-08-09 | Avago Technologies General Ip (Singapore) Pte. Ltd. | System and method for multiple dimension decoding and encoding a message |
US9348694B1 (en) | 2013-10-09 | 2016-05-24 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Detecting and managing bad columns |
US9786388B1 (en) | 2013-10-09 | 2017-10-10 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Detecting and managing bad columns |
US9397706B1 (en) | 2013-10-09 | 2016-07-19 | Avago Technologies General Ip (Singapore) Pte. Ltd. | System and method for irregular multiple dimension decoding and encoding |
JP2015077652A (ja) | 2013-10-16 | 2015-04-23 | クオンタムバイオシステムズ株式会社 | ナノギャップ電極およびその製造方法 |
US9559725B1 (en) | 2013-10-23 | 2017-01-31 | Seagate Technology Llc | Multi-strength reed-solomon outer code protection |
US11140018B2 (en) * | 2014-01-07 | 2021-10-05 | Quantumsine Acquisitions Inc. | Method and apparatus for intra-symbol multi-dimensional modulation |
US9536612B1 (en) | 2014-01-23 | 2017-01-03 | Avago Technologies General Ip (Singapore) Pte. Ltd | Digital signaling processing for three dimensional flash memory arrays |
US10120792B1 (en) | 2014-01-29 | 2018-11-06 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Programming an embedded flash storage device |
US10438811B1 (en) | 2014-04-15 | 2019-10-08 | Quantum Biosystems Inc. | Methods for forming nano-gap electrodes for use in nanosensors |
WO2015170782A1 (en) | 2014-05-08 | 2015-11-12 | Osaka University | Devices, systems and methods for linearization of polymers |
US9542262B1 (en) | 2014-05-29 | 2017-01-10 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Error correction |
US9213602B1 (en) | 2014-06-23 | 2015-12-15 | Seagate Technology Llc | Write mapping to mitigate hard errors via soft-decision decoding |
US9892033B1 (en) | 2014-06-24 | 2018-02-13 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Management of memory units |
US9972393B1 (en) | 2014-07-03 | 2018-05-15 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Accelerating programming of a flash memory module |
US9584159B1 (en) | 2014-07-03 | 2017-02-28 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Interleaved encoding |
US9449702B1 (en) | 2014-07-08 | 2016-09-20 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Power management |
US9710199B2 (en) | 2014-11-07 | 2017-07-18 | International Business Machines Corporation | Non-volatile memory data storage with low read amplification |
US9524211B1 (en) | 2014-11-18 | 2016-12-20 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Codeword management |
WO2016094741A1 (en) * | 2014-12-10 | 2016-06-16 | California Institute Of Technology | Improving nand flash reliability with rank modulation |
US10162700B2 (en) | 2014-12-23 | 2018-12-25 | International Business Machines Corporation | Workload-adaptive data packing algorithm |
US10305515B1 (en) | 2015-02-02 | 2019-05-28 | Avago Technologies International Sales Pte. Limited | System and method for encoding using multiple linear feedback shift registers |
US9811417B2 (en) | 2015-03-12 | 2017-11-07 | Toshiba Memory Corporation | Semiconductor memory device |
US10628255B1 (en) | 2015-06-11 | 2020-04-21 | Avago Technologies International Sales Pte. Limited | Multi-dimensional decoding |
US9851921B1 (en) | 2015-07-05 | 2017-12-26 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Flash memory chip processing |
US9712190B2 (en) | 2015-09-24 | 2017-07-18 | International Business Machines Corporation | Data packing for compression-enabled storage systems |
US9870285B2 (en) | 2015-11-18 | 2018-01-16 | International Business Machines Corporation | Selectively de-straddling data pages in non-volatile memory |
US9954558B1 (en) | 2016-03-03 | 2018-04-24 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Fast decoding of data stored in a flash memory |
KR20190017738A (ko) * | 2016-04-11 | 2019-02-20 | 퀀텀 바이오시스템즈 가부시키가이샤 | 생물학적 데이터 관리를 위한 시스템 및 방법 |
KR20190075010A (ko) | 2016-04-27 | 2019-06-28 | 퀀텀 바이오시스템즈 가부시키가이샤 | 생체분자의 측정 및 시퀀싱을 위한 시스템 및 방법 |
US9886979B1 (en) | 2016-12-30 | 2018-02-06 | Western Digital Technologies, Inc. | Implementing BER-list modulation code for hard disk drives |
US10552256B2 (en) * | 2017-05-08 | 2020-02-04 | Samsung Electronics Co., Ltd. | Morphable ECC encoder/decoder for NVDIMM over DDR channel |
US10304550B1 (en) | 2017-11-29 | 2019-05-28 | Sandisk Technologies Llc | Sense amplifier with negative threshold sensing for non-volatile memory |
TWI640997B (zh) * | 2017-12-27 | 2018-11-11 | 群聯電子股份有限公司 | 資料保護方法、記憶體控制電路單元與記憶體儲存裝置 |
US10846172B2 (en) * | 2018-01-08 | 2020-11-24 | SK Hynix Inc. | Encoding method and system for memory device including QLC cells |
TWI759672B (zh) * | 2018-04-20 | 2022-04-01 | 慧榮科技股份有限公司 | 解碼方法及相關的快閃記憶體控制器與電子裝置 |
US11003375B2 (en) | 2018-05-15 | 2021-05-11 | Micron Technology, Inc. | Code word format and structure |
US10831653B2 (en) * | 2018-05-15 | 2020-11-10 | Micron Technology, Inc. | Forwarding code word address |
US10862512B2 (en) | 2018-09-20 | 2020-12-08 | Western Digital Technologies, Inc. | Data driven ICAD graph generation |
US10735031B2 (en) | 2018-09-20 | 2020-08-04 | Western Digital Technologies, Inc. | Content aware decoding method and system |
US10643695B1 (en) | 2019-01-10 | 2020-05-05 | Sandisk Technologies Llc | Concurrent multi-state program verify for non-volatile memory |
US11024392B1 (en) | 2019-12-23 | 2021-06-01 | Sandisk Technologies Llc | Sense amplifier for bidirectional sensing of memory cells of a non-volatile memory |
US11556416B2 (en) | 2021-05-05 | 2023-01-17 | Apple Inc. | Controlling memory readout reliability and throughput by adjusting distance between read thresholds |
US11847342B2 (en) | 2021-07-28 | 2023-12-19 | Apple Inc. | Efficient transfer of hard data and confidence levels in reading a nonvolatile memory |
US12093124B2 (en) * | 2022-09-29 | 2024-09-17 | Advanced Micro Devices, Inc. | Multi-level signal reception |
TWI819876B (zh) * | 2022-11-02 | 2023-10-21 | 群聯電子股份有限公司 | 資料儲存方法、記憶體儲存裝置及記憶體控制電路單元 |
Citations (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07221655A (ja) * | 1993-12-22 | 1995-08-18 | At & T Corp | 通信システムおよび情報処理方法 |
JPH0832633A (ja) * | 1994-07-20 | 1996-02-02 | Toshiba Corp | トレリス復号器 |
JPH08163085A (ja) * | 1994-12-02 | 1996-06-21 | Toshiba Corp | 情報通信装置 |
JPH09284348A (ja) * | 1996-04-15 | 1997-10-31 | Ricoh Co Ltd | 復号方法 |
JPH10313275A (ja) * | 1997-03-12 | 1998-11-24 | Lg Semicon Co Ltd | 移動電話システムのデータ処理用メモリ |
JPH11136139A (ja) * | 1997-11-04 | 1999-05-21 | Hitachi Ltd | 復号方法および装置、記憶装置およびこれを用いた情報機器、メモリチップ、記録符号、光通信システム |
JPH11143787A (ja) * | 1997-11-06 | 1999-05-28 | Hitachi Ltd | 記録再生装置 |
JPH11213693A (ja) * | 1998-01-27 | 1999-08-06 | Sony Corp | メモリ装置 |
JPH11213692A (ja) * | 1998-01-21 | 1999-08-06 | Sony Corp | メモリ装置 |
JP2000286719A (ja) * | 1999-03-31 | 2000-10-13 | Mitsubishi Electric Corp | 誤り訂正システム |
JP2001014888A (ja) * | 1999-06-28 | 2001-01-19 | Toshiba Corp | フラッシュメモリ |
JP2002204274A (ja) * | 2000-12-28 | 2002-07-19 | Sanyo Electric Co Ltd | データ受信装置 |
JP2003051749A (ja) * | 2001-08-07 | 2003-02-21 | Nec Microsystems Ltd | ブランチメトリック算出装置およびその算出方法 |
JP2005034758A (ja) * | 2003-07-16 | 2005-02-10 | Matsushita Electric Ind Co Ltd | 厨芥処理機およびその制御方法 |
JP2005078721A (ja) * | 2003-09-01 | 2005-03-24 | Nippon Telegr & Teleph Corp <Ntt> | 誤り訂正方法およびメモリ回路 |
JP2005527062A (ja) * | 2002-05-20 | 2005-09-08 | サンディスク コーポレイション | 格納されたデータの品質についての情報を用いることによる誤り訂正符号の効率向上およびマルチレベルメモリシステムの操作 |
JP2005346758A (ja) * | 2004-05-31 | 2005-12-15 | Sony Corp | 半導体記憶装置および信号処理システム |
Family Cites Families (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6011360B2 (ja) * | 1981-12-15 | 1985-03-25 | ケイディディ株式会社 | 音声符号化方式 |
NL9100218A (nl) * | 1991-02-07 | 1992-09-01 | Philips Nv | Encodeer/decodeer-schakeling, alsmede digitaal video-systeem voorzien van de schakeling. |
US6222762B1 (en) * | 1992-01-14 | 2001-04-24 | Sandisk Corporation | Multi-state memory |
US5365530A (en) * | 1992-05-12 | 1994-11-15 | Mitsubishi Denki Kabushiki Kaisha | Error-correction encoding and decoding system |
JPH09251427A (ja) | 1996-03-18 | 1997-09-22 | Nec Home Electron Ltd | フラッシュメモリの符号誤り訂正装置及び方法 |
WO1998009219A1 (de) * | 1996-08-30 | 1998-03-05 | Siemens Aktiengesellschaft | Fehlererkennung in einem speichersystem |
KR100246184B1 (ko) | 1997-07-02 | 2000-03-15 | 김영환 | 리드-솔로몬 에러 정정 코드를 이용한 프레쉬 메모리 시스템의 운영 방법 |
US6279133B1 (en) * | 1997-12-31 | 2001-08-21 | Kawasaki Steel Corporation | Method and apparatus for significantly improving the reliability of multilevel memory architecture |
US7890846B2 (en) * | 2000-01-06 | 2011-02-15 | Supertalent Electronics, Inc. | Electronic data flash card with Reed Solomon error detection and correction capability |
US6715116B2 (en) * | 2000-01-26 | 2004-03-30 | Hewlett-Packard Company, L.P. | Memory data verify operation |
US6810502B2 (en) * | 2000-01-28 | 2004-10-26 | Conexant Systems, Inc. | Iteractive decoder employing multiple external code error checks to lower the error floor |
JP2001332982A (ja) * | 2000-05-18 | 2001-11-30 | Mitsubishi Electric Corp | 光伝送システム、fec多重化装置、fec多重分離装置、および誤り訂正方法 |
JP2002100192A (ja) * | 2000-09-22 | 2002-04-05 | Toshiba Corp | 不揮発性半導体メモリ |
WO2002086719A2 (en) | 2001-04-24 | 2002-10-31 | Koninklijke Philips Electronics N.V. | Improved error correction scheme for use in flash memory allowing bit alterability |
US7142612B2 (en) * | 2001-11-16 | 2006-11-28 | Rambus, Inc. | Method and apparatus for multi-level signaling |
EP1355234B1 (en) * | 2002-04-15 | 2016-06-29 | Micron Technology, Inc. | Use of an error correction circuit in program and erase verify procedures |
TW575806B (en) | 2002-07-15 | 2004-02-11 | Silicon Motion Tech Inc | A method for enhancing flash memory error correction capability and providing data encryption in the same time |
US20040083334A1 (en) * | 2002-10-28 | 2004-04-29 | Sandisk Corporation | Method and apparatus for managing the integrity of data in non-volatile memory system |
US7379505B2 (en) * | 2003-02-13 | 2008-05-27 | Broadcom Corporation | Method and apparatus for performing trellis coded modulation of signals for transmission on a TDMA channel of a cable network |
US7012835B2 (en) | 2003-10-03 | 2006-03-14 | Sandisk Corporation | Flash memory data correction and scrub techniques |
KR100547146B1 (ko) * | 2003-10-06 | 2006-01-26 | 삼성전자주식회사 | 영상처리장치 및 그 방법 |
JP4056488B2 (ja) * | 2004-03-30 | 2008-03-05 | エルピーダメモリ株式会社 | 半導体装置の試験方法及び製造方法 |
JP4614732B2 (ja) * | 2004-10-22 | 2011-01-19 | パナソニック株式会社 | デコード装置 |
KR100680473B1 (ko) * | 2005-04-11 | 2007-02-08 | 주식회사 하이닉스반도체 | 액세스 시간이 감소된 플래시 메모리 장치 |
US7844879B2 (en) * | 2006-01-20 | 2010-11-30 | Marvell World Trade Ltd. | Method and system for error correction in flash memory |
-
2006
- 2006-11-08 US US11/598,178 patent/US8055979B2/en active Active
-
2007
- 2007-01-19 JP JP2008551453A patent/JP5232014B2/ja active Active
- 2007-01-19 WO PCT/US2007/001623 patent/WO2007084751A2/en active Application Filing
- 2007-01-19 EP EP07718319.2A patent/EP1984923B1/en active Active
- 2007-01-19 KR KR1020087020393A patent/KR101373789B1/ko active IP Right Grant
- 2007-01-22 TW TW096102390A patent/TWI352284B/zh active
Patent Citations (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07221655A (ja) * | 1993-12-22 | 1995-08-18 | At & T Corp | 通信システムおよび情報処理方法 |
JPH0832633A (ja) * | 1994-07-20 | 1996-02-02 | Toshiba Corp | トレリス復号器 |
JPH08163085A (ja) * | 1994-12-02 | 1996-06-21 | Toshiba Corp | 情報通信装置 |
JPH09284348A (ja) * | 1996-04-15 | 1997-10-31 | Ricoh Co Ltd | 復号方法 |
JPH10313275A (ja) * | 1997-03-12 | 1998-11-24 | Lg Semicon Co Ltd | 移動電話システムのデータ処理用メモリ |
JPH11136139A (ja) * | 1997-11-04 | 1999-05-21 | Hitachi Ltd | 復号方法および装置、記憶装置およびこれを用いた情報機器、メモリチップ、記録符号、光通信システム |
JPH11143787A (ja) * | 1997-11-06 | 1999-05-28 | Hitachi Ltd | 記録再生装置 |
JPH11213692A (ja) * | 1998-01-21 | 1999-08-06 | Sony Corp | メモリ装置 |
JPH11213693A (ja) * | 1998-01-27 | 1999-08-06 | Sony Corp | メモリ装置 |
JP2000286719A (ja) * | 1999-03-31 | 2000-10-13 | Mitsubishi Electric Corp | 誤り訂正システム |
JP2001014888A (ja) * | 1999-06-28 | 2001-01-19 | Toshiba Corp | フラッシュメモリ |
JP2002204274A (ja) * | 2000-12-28 | 2002-07-19 | Sanyo Electric Co Ltd | データ受信装置 |
JP2003051749A (ja) * | 2001-08-07 | 2003-02-21 | Nec Microsystems Ltd | ブランチメトリック算出装置およびその算出方法 |
JP2005527062A (ja) * | 2002-05-20 | 2005-09-08 | サンディスク コーポレイション | 格納されたデータの品質についての情報を用いることによる誤り訂正符号の効率向上およびマルチレベルメモリシステムの操作 |
JP2005034758A (ja) * | 2003-07-16 | 2005-02-10 | Matsushita Electric Ind Co Ltd | 厨芥処理機およびその制御方法 |
JP2005078721A (ja) * | 2003-09-01 | 2005-03-24 | Nippon Telegr & Teleph Corp <Ntt> | 誤り訂正方法およびメモリ回路 |
JP2005346758A (ja) * | 2004-05-31 | 2005-12-15 | Sony Corp | 半導体記憶装置および信号処理システム |
Cited By (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010511968A (ja) * | 2006-12-06 | 2010-04-15 | サムスン エレクトロニクス カンパニー リミテッド | マルチレベルセルメモリ装置および方法 |
JP2011508357A (ja) * | 2007-12-27 | 2011-03-10 | サンディスク アイエル リミテッド | 1セル当り単一ビットnandフラッシュメモリをエミュレートする1セル当り多ビットnandフラッシュメモリ用コントローラ |
JP2010123236A (ja) * | 2008-08-08 | 2010-06-03 | Marvell World Trade Ltd | 部分参照電圧を利用するメモリアクセス |
JP2012504842A (ja) * | 2008-09-30 | 2012-02-23 | エルエスアイ コーポレーション | 基準セルを使用する、メモリ・デバイスの軟データ生成の方法および装置 |
JP2012507819A (ja) * | 2008-10-30 | 2012-03-29 | マイクロン テクノロジー, インク. | マルチレベルセルメモリに対するデータパス、格納方法およびメモリアレイの使用方法 |
JP2011243198A (ja) * | 2010-05-19 | 2011-12-01 | Micron Technology Inc | 拡張マルチレベルメモリ |
US8700978B2 (en) | 2010-05-19 | 2014-04-15 | Micron Technology, Inc. | Enhanced multilevel memory |
JP2013539120A (ja) * | 2010-09-23 | 2013-10-17 | マイクロン テクノロジー, インク. | メモリ品質監視ベースの補正方法および装置 |
JP2014517976A (ja) * | 2011-05-12 | 2014-07-24 | マイクロン テクノロジー, インク. | メモリセルをプログラミングすること |
JP2015535640A (ja) * | 2012-12-03 | 2015-12-14 | ウェスタン デジタル テクノロジーズ インコーポレーテッド | ランタイム可変raid保護スキームを有する方法、ソリッドステートドライブコントローラー、及びデータ格納装置 |
KR20140081753A (ko) * | 2012-12-21 | 2014-07-01 | 삼성전자주식회사 | 무선 통신 시스템에서 복수의 변조 기법을 이용한 신호 송수신 방법 및 장치 |
JP2016507945A (ja) * | 2012-12-21 | 2016-03-10 | サムスン エレクトロニクス カンパニー リミテッド | 無線通信システムにおける複数の変調技法を用いた信号送受信方法及び装置 |
US10069665B2 (en) | 2012-12-21 | 2018-09-04 | Samsung Electronics Co., Ltd. | Method and device for transmitting and receiving signal by using modulation techniques in wireless communication system |
KR102141431B1 (ko) * | 2012-12-21 | 2020-08-05 | 삼성전자주식회사 | 무선 통신 시스템에서 복수의 변조 기법을 이용한 신호 송수신 방법 및 장치 |
JP2017504925A (ja) * | 2013-12-20 | 2017-02-09 | アップル インコーポレイテッド | アナログメモリセルにおけるセル当り非整数個のビットを用いたデータ記憶の管理 |
JP2023071144A (ja) * | 2021-11-10 | 2023-05-22 | ウェスタン デジタル テクノロジーズ インコーポレーテッド | マルチセルマッピングのための記憶システム及び方法 |
US11822820B2 (en) | 2021-11-10 | 2023-11-21 | Western Digital Technologies, Inc. | Storage system and method for multi-cell mapping |
Also Published As
Publication number | Publication date |
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WO2007084751A2 (en) | 2007-07-26 |
EP1984923A2 (en) | 2008-10-29 |
KR101373789B1 (ko) | 2014-03-13 |
WO2007084751A3 (en) | 2008-01-10 |
US8055979B2 (en) | 2011-11-08 |
TW200739334A (en) | 2007-10-16 |
KR20080098041A (ko) | 2008-11-06 |
TWI352284B (en) | 2011-11-11 |
EP1984923A4 (en) | 2009-07-22 |
JP5232014B2 (ja) | 2013-07-10 |
EP1984923B1 (en) | 2013-08-14 |
US20070171714A1 (en) | 2007-07-26 |
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