US2865791A
(en)
|
1954-03-05 |
1958-12-23 |
Metallgesellschaft Ag |
Metal nitride coating process
|
US4279947A
(en)
|
1975-11-25 |
1981-07-21 |
Motorola, Inc. |
Deposition of silicon nitride
|
GB1573154A
(en)
|
1977-03-01 |
1980-08-13 |
Pilkington Brothers Ltd |
Coating glass
|
FI57975C
(fi)
|
1979-02-28 |
1980-11-10 |
Lohja Ab Oy |
Foerfarande och anordning vid uppbyggande av tunna foereningshinnor
|
JPS5845177B2
(ja)
|
1979-03-09 |
1983-10-07 |
富士通株式会社 |
半導体表面絶縁膜の形成法
|
US4277320A
(en)
|
1979-10-01 |
1981-07-07 |
Rockwell International Corporation |
Process for direct thermal nitridation of silicon semiconductor devices
|
US4262631A
(en)
|
1979-10-01 |
1981-04-21 |
Kubacki Ronald M |
Thin film deposition apparatus using an RF glow discharge
|
US4363828A
(en)
|
1979-12-12 |
1982-12-14 |
International Business Machines Corp. |
Method for depositing silicon films and related materials by a glow discharge in a disiland or higher order silane gas
|
US4389973A
(en)
|
1980-03-18 |
1983-06-28 |
Oy Lohja Ab |
Apparatus for performing growth of compound thin films
|
US4402997A
(en)
|
1982-05-17 |
1983-09-06 |
Motorola, Inc. |
Process for improving nitride deposition on a semiconductor wafer by purging deposition tube with oxygen
|
JPS5958819A
(ja)
|
1982-09-29 |
1984-04-04 |
Hitachi Ltd |
薄膜形成方法
|
JPS5989407A
(ja)
|
1982-11-15 |
1984-05-23 |
Mitsui Toatsu Chem Inc |
アモルフアスシリコン膜の形成方法
|
US4524718A
(en)
|
1982-11-22 |
1985-06-25 |
Gordon Roy G |
Reactor for continuous coating of glass
|
US4428975A
(en)
|
1983-01-28 |
1984-01-31 |
Motorola, Inc. |
Process for improving nitride deposition on a semiconductor wafer
|
US4803127A
(en)
|
1983-02-25 |
1989-02-07 |
Liburdi Engineering Limited |
Vapor deposition of metal compound coating utilizing metal sub-halides and coated metal article
|
US4570328A
(en)
|
1983-03-07 |
1986-02-18 |
Motorola, Inc. |
Method of producing titanium nitride MOS device gate electrode
|
GB8516537D0
(en)
|
1985-06-29 |
1985-07-31 |
Standard Telephones Cables Ltd |
Pulsed plasma apparatus
|
US5769950A
(en)
|
1985-07-23 |
1998-06-23 |
Canon Kabushiki Kaisha |
Device for forming deposited film
|
US4715937A
(en)
|
1986-05-05 |
1987-12-29 |
The Board Of Trustees Of The Leland Stanford Junior University |
Low-temperature direct nitridation of silicon in nitrogen plasma generated by microwave discharge
|
US4699805A
(en)
|
1986-07-03 |
1987-10-13 |
Motorola Inc. |
Process and apparatus for the low pressure chemical vapor deposition of thin films
|
US4684542A
(en)
|
1986-08-11 |
1987-08-04 |
International Business Machines Corporation |
Low pressure chemical vapor deposition of tungsten silicide
|
US4834020A
(en)
|
1987-12-04 |
1989-05-30 |
Watkins-Johnson Company |
Atmospheric pressure chemical vapor deposition apparatus
|
JP2534525B2
(ja)
|
1987-12-19 |
1996-09-18 |
富士通株式会社 |
β−炭化シリコン層の製造方法
|
US4851095A
(en)
|
1988-02-08 |
1989-07-25 |
Optical Coating Laboratory, Inc. |
Magnetron sputtering apparatus and process
|
EP0332101B1
(en)
|
1988-03-11 |
1997-06-04 |
Fujitsu Limited |
Semiconductor device having a region doped to a level exceeding the solubility limit
|
JPH0215067A
(ja)
|
1988-07-04 |
1990-01-18 |
Hokuriku Seiyaku Co Ltd |
イソキノリンスルホンアミド誘導体
|
US5015330A
(en)
|
1989-02-28 |
1991-05-14 |
Kabushiki Kaisha Toshiba |
Film forming method and film forming device
|
US5214002A
(en)
|
1989-10-25 |
1993-05-25 |
Agency Of Industrial Science And Technology |
Process for depositing a thermal CVD film of Si or Ge using a hydrogen post-treatment step and an optional hydrogen pre-treatment step
|
JPH04142079A
(ja)
*
|
1990-10-02 |
1992-05-15 |
Nippon Telegr & Teleph Corp <Ntt> |
半導体装置およびその製造方法
|
US5316844A
(en)
|
1990-04-16 |
1994-05-31 |
Hoya Electronics Corporation |
Magnetic recording medium comprising an aluminum alloy substrate, now magnetic underlayers, magnetic layer, protective layer, particulate containing protective layer and lubricant layer
|
KR100209856B1
(ko)
|
1990-08-31 |
1999-07-15 |
가나이 쓰도무 |
반도체장치의 제조방법
|
WO1992007525A1
(en)
|
1990-10-31 |
1992-05-14 |
Baxter International Inc. |
Close vascularization implant material
|
US5849601A
(en)
|
1990-12-25 |
1998-12-15 |
Semiconductor Energy Laboratory Co., Ltd. |
Electro-optical device and method for manufacturing the same
|
US5356673A
(en)
|
1991-03-18 |
1994-10-18 |
Jet Process Corporation |
Evaporation system and method for gas jet deposition of thin film materials
|
JP2794499B2
(ja)
|
1991-03-26 |
1998-09-03 |
株式会社半導体エネルギー研究所 |
半導体装置の作製方法
|
JP3121131B2
(ja)
|
1991-08-09 |
2000-12-25 |
アプライド マテリアルズ インコーポレイテッド |
低温高圧のシリコン蒸着方法
|
US5695819A
(en)
|
1991-08-09 |
1997-12-09 |
Applied Materials, Inc. |
Method of enhancing step coverage of polysilicon deposits
|
US5614257A
(en)
|
1991-08-09 |
1997-03-25 |
Applied Materials, Inc |
Low temperature, high pressure silicon deposition method
|
US5308655A
(en)
|
1991-08-16 |
1994-05-03 |
Materials Research Corporation |
Processing for forming low resistivity titanium nitride films
|
US5279857A
(en)
|
1991-08-16 |
1994-01-18 |
Materials Research Corporation |
Process for forming low resistivity titanium nitride films
|
JP3181357B2
(ja)
|
1991-08-19 |
2001-07-03 |
株式会社東芝 |
半導体薄膜の形成方法および半導体装置の製造方法
|
US5352636A
(en)
|
1992-01-16 |
1994-10-04 |
Applied Materials, Inc. |
In situ method for cleaning silicon surface and forming layer thereon in same chamber
|
US5723382A
(en)
|
1992-06-12 |
1998-03-03 |
Sandhu; Gurtej S. |
Method of making a low-resistance contact to silicon having a titanium silicide interface, an amorphous titanium nitride barrier layer and a conductive plug
|
JP2740087B2
(ja)
|
1992-08-15 |
1998-04-15 |
株式会社東芝 |
半導体集積回路装置の製造方法
|
US5381302A
(en)
|
1993-04-02 |
1995-01-10 |
Micron Semiconductor, Inc. |
Capacitor compatible with high dielectric constant materials having a low contact resistance layer and the method for forming same
|
US5246881A
(en)
|
1993-04-14 |
1993-09-21 |
Micron Semiconductor, Inc. |
Low-pressure chemical vapor deposition process for depositing high-density, highly-conformal, titanium nitride films of low bulk resistivity
|
DE4419074C2
(de)
|
1993-06-03 |
1998-07-02 |
Micron Semiconductor Inc |
Verfahren zum gleichmäßigen Dotieren von polykristallinem Silizium mit halbkugelförmiger Körnung
|
US5648293A
(en)
|
1993-07-22 |
1997-07-15 |
Nec Corporation |
Method of growing an amorphous silicon film
|
US5471330A
(en)
|
1993-07-29 |
1995-11-28 |
Honeywell Inc. |
Polysilicon pixel electrode
|
US6083810A
(en)
|
1993-11-15 |
2000-07-04 |
Lucent Technologies |
Integrated circuit fabrication process
|
US5656531A
(en)
|
1993-12-10 |
1997-08-12 |
Micron Technology, Inc. |
Method to form hemi-spherical grain (HSG) silicon from amorphous silicon
|
FI100409B
(fi)
|
1994-11-28 |
1997-11-28 |
Asm Int |
Menetelmä ja laitteisto ohutkalvojen valmistamiseksi
|
JP3563819B2
(ja)
|
1995-03-28 |
2004-09-08 |
アネルバ株式会社 |
窒化チタン薄膜の作製方法及びその方法に使用される薄膜作製装置
|
US5698771A
(en)
|
1995-03-30 |
1997-12-16 |
The United States Of America As Represented By The United States National Aeronautics And Space Administration |
Varying potential silicon carbide gas sensor
|
US6161498A
(en)
|
1995-09-14 |
2000-12-19 |
Tokyo Electron Limited |
Plasma processing device and a method of plasma process
|
JP3373990B2
(ja)
|
1995-10-30 |
2003-02-04 |
東京エレクトロン株式会社 |
成膜装置及びその方法
|
US6355656B1
(en)
|
1995-12-04 |
2002-03-12 |
Celgene Corporation |
Phenidate drug formulations having diminished abuse potential
|
US5869389A
(en)
|
1996-01-18 |
1999-02-09 |
Micron Technology, Inc. |
Semiconductor processing method of providing a doped polysilicon layer
|
US5786027A
(en)
|
1996-02-14 |
1998-07-28 |
Micron Technology, Inc. |
Method for depositing polysilicon with discontinuous grain boundaries
|
US5789030A
(en)
|
1996-03-18 |
1998-08-04 |
Micron Technology, Inc. |
Method for depositing doped amorphous or polycrystalline silicon on a substrate
|
JPH09270421A
(ja)
|
1996-04-01 |
1997-10-14 |
Mitsubishi Electric Corp |
表面処理装置および表面処理方法
|
JP2795313B2
(ja)
|
1996-05-08 |
1998-09-10 |
日本電気株式会社 |
容量素子及びその製造方法
|
US6136654A
(en)
|
1996-06-07 |
2000-10-24 |
Texas Instruments Incorporated |
Method of forming thin silicon nitride or silicon oxynitride gate dielectrics
|
US5916365A
(en)
|
1996-08-16 |
1999-06-29 |
Sherman; Arthur |
Sequential chemical vapor deposition
|
NL1005410C2
(nl)
|
1997-02-28 |
1998-08-31 |
Advanced Semiconductor Mat |
Stelsel voor het laden, behandelen en ontladen van op een drager aangebrachte substraten.
|
JP3270730B2
(ja)
|
1997-03-21 |
2002-04-02 |
株式会社日立国際電気 |
基板処理装置及び基板処理方法
|
US7393561B2
(en)
*
|
1997-08-11 |
2008-07-01 |
Applied Materials, Inc. |
Method and apparatus for layer by layer deposition of thin films
|
US5907792A
(en)
|
1997-08-25 |
1999-05-25 |
Motorola,Inc. |
Method of forming a silicon nitride layer
|
US6258170B1
(en)
|
1997-09-11 |
2001-07-10 |
Applied Materials, Inc. |
Vaporization and deposition apparatus
|
JPH1197667A
(ja)
|
1997-09-24 |
1999-04-09 |
Sharp Corp |
超微粒子あるいは超細線の形成方法およびこの形成方法による超微粒子あるいは超細線を用いた半導体素子
|
US6228181B1
(en)
|
1997-10-02 |
2001-05-08 |
Shigeo Yamamoto |
Making epitaxial semiconductor device
|
US6027705A
(en)
|
1998-01-08 |
2000-02-22 |
Showa Denko K.K. |
Method for producing a higher silane
|
US6749687B1
(en)
*
|
1998-01-09 |
2004-06-15 |
Asm America, Inc. |
In situ growth of oxide and silicon layers
|
US6136690A
(en)
|
1998-02-13 |
2000-10-24 |
Micron Technology, Inc. |
In situ plasma pre-deposition wafer treatment in chemical vapor deposition technology for semiconductor integrated circuit applications
|
US6087229A
(en)
|
1998-03-09 |
2000-07-11 |
Lsi Logic Corporation |
Composite semiconductor gate dielectrics
|
JP3854731B2
(ja)
|
1998-03-30 |
2006-12-06 |
シャープ株式会社 |
微細構造の製造方法
|
US6210813B1
(en)
|
1998-09-02 |
2001-04-03 |
Micron Technology, Inc. |
Forming metal silicide resistant to subsequent thermal processing
|
KR100363083B1
(ko)
|
1999-01-20 |
2002-11-30 |
삼성전자 주식회사 |
반구형 그레인 커패시터 및 그 형성방법
|
JP3754568B2
(ja)
|
1999-01-29 |
2006-03-15 |
シャープ株式会社 |
量子細線の製造方法
|
US6200893B1
(en)
|
1999-03-11 |
2001-03-13 |
Genus, Inc |
Radical-assisted sequential CVD
|
US6197669B1
(en)
|
1999-04-15 |
2001-03-06 |
Taiwan Semicondcutor Manufacturing Company |
Reduction of surface defects on amorphous silicon grown by a low-temperature, high pressure LPCVD process
|
US6450116B1
(en)
*
|
1999-04-22 |
2002-09-17 |
Applied Materials, Inc. |
Apparatus for exposing a substrate to plasma radicals
|
US6180462B1
(en)
|
1999-06-07 |
2001-01-30 |
United Microelectronics Corp. |
Method of fabricating an analog integrated circuit with ESD protection
|
JP4192353B2
(ja)
|
1999-09-21 |
2008-12-10 |
株式会社デンソー |
炭化珪素半導体装置及びその製造方法
|
US6203613B1
(en)
|
1999-10-19 |
2001-03-20 |
International Business Machines Corporation |
Atomic layer deposition with nitrate containing precursors
|
US6373112B1
(en)
|
1999-12-02 |
2002-04-16 |
Intel Corporation |
Polysilicon-germanium MOSFET gate electrodes
|
US6348420B1
(en)
|
1999-12-23 |
2002-02-19 |
Asm America, Inc. |
Situ dielectric stacks
|
US6271054B1
(en)
|
2000-06-02 |
2001-08-07 |
International Business Machines Corporation |
Method for reducing dark current effects in a charge couple device
|
US6252295B1
(en)
|
2000-06-19 |
2001-06-26 |
International Business Machines Corporation |
Adhesion of silicon carbide films
|
KR100332313B1
(ko)
|
2000-06-24 |
2002-04-12 |
서성기 |
Ald 박막증착장치 및 증착방법
|
US6585823B1
(en)
|
2000-07-07 |
2003-07-01 |
Asm International, N.V. |
Atomic layer deposition
|
JP3305301B2
(ja)
|
2000-08-02 |
2002-07-22 |
松下電器産業株式会社 |
電極構造体の形成方法及び半導体装置の製造方法
|
US6423201B1
(en)
*
|
2000-08-23 |
2002-07-23 |
Applied Materials, Inc. |
Method of improving the adhesion of copper
|
AU2001292302A1
(en)
*
|
2000-09-29 |
2002-04-08 |
Tokyo Electron Limited |
Heat-treating apparatus and heat-treating method
|
KR100378186B1
(ko)
*
|
2000-10-19 |
2003-03-29 |
삼성전자주식회사 |
원자층 증착법으로 형성된 박막이 채용된 반도체 소자 및그 제조방법
|
US6613695B2
(en)
|
2000-11-24 |
2003-09-02 |
Asm America, Inc. |
Surface preparation prior to deposition
|
KR100385947B1
(ko)
|
2000-12-06 |
2003-06-02 |
삼성전자주식회사 |
원자층 증착 방법에 의한 박막 형성 방법
|
JP4866534B2
(ja)
*
|
2001-02-12 |
2012-02-01 |
エーエスエム アメリカ インコーポレイテッド |
半導体膜の改良された堆積方法
|
US7005392B2
(en)
*
|
2001-03-30 |
2006-02-28 |
Advanced Technology Materials, Inc. |
Source reagent compositions for CVD formation of gate dielectric thin films using amide precursors and method of using same
|
US6503846B1
(en)
|
2001-06-20 |
2003-01-07 |
Texas Instruments Incorporated |
Temperature spike for uniform nitridization of ultra-thin silicon dioxide layers in transistor gates
|
US6391803B1
(en)
|
2001-06-20 |
2002-05-21 |
Samsung Electronics Co., Ltd. |
Method of forming silicon containing thin films by atomic layer deposition utilizing trisdimethylaminosilane
|
US20030059535A1
(en)
*
|
2001-09-25 |
2003-03-27 |
Lee Luo |
Cycling deposition of low temperature films in a cold wall single wafer process chamber
|
US6551893B1
(en)
|
2001-11-27 |
2003-04-22 |
Micron Technology, Inc. |
Atomic layer deposition of capacitor dielectric
|
US6638879B2
(en)
|
2001-12-06 |
2003-10-28 |
Macronix International Co., Ltd. |
Method for forming nitride spacer by using atomic layer deposition
|
US20030111013A1
(en)
*
|
2001-12-19 |
2003-06-19 |
Oosterlaken Theodorus Gerardus Maria |
Method for the deposition of silicon germanium layers
|
US6696345B2
(en)
*
|
2002-01-07 |
2004-02-24 |
Intel Corporation |
Metal-gate electrode for CMOS transistor applications
|
US6911391B2
(en)
*
|
2002-01-26 |
2005-06-28 |
Applied Materials, Inc. |
Integration of titanium and titanium nitride layers
|
JP4074461B2
(ja)
*
|
2002-02-06 |
2008-04-09 |
東京エレクトロン株式会社 |
成膜方法および成膜装置、半導体装置の製造方法
|
KR100829327B1
(ko)
*
|
2002-04-05 |
2008-05-13 |
가부시키가이샤 히다치 고쿠사이 덴키 |
기판 처리 장치 및 반응 용기
|
US20040129212A1
(en)
*
|
2002-05-20 |
2004-07-08 |
Gadgil Pradad N. |
Apparatus and method for delivery of reactive chemical precursors to the surface to be treated
|
US7294582B2
(en)
*
|
2002-07-19 |
2007-11-13 |
Asm International, N.V. |
Low temperature silicon compound deposition
|
WO2004009861A2
(en)
*
|
2002-07-19 |
2004-01-29 |
Asm America, Inc. |
Method to form ultra high quality silicon-containing compound layers
|
WO2004061929A1
(ja)
*
|
2002-12-27 |
2004-07-22 |
Hitachi Kokusai Electric Inc. |
プラズマ発生装置、オゾン発生装置、基板処理装置、及び半導体デバイスの製造方法
|
US6908852B2
(en)
*
|
2003-01-29 |
2005-06-21 |
Freescale Semiconductor, Inc. |
Method of forming an arc layer for a semiconductor device
|
EP1623454A2
(en)
*
|
2003-05-09 |
2006-02-08 |
ASM America, Inc. |
Reactor surface passivation through chemical deactivation
|
JP4823690B2
(ja)
*
|
2003-06-16 |
2011-11-24 |
東京エレクトロン株式会社 |
成膜方法および半導体装置の製造方法
|
US7344755B2
(en)
*
|
2003-08-21 |
2008-03-18 |
Micron Technology, Inc. |
Methods and apparatus for processing microfeature workpieces; methods for conditioning ALD reaction chambers
|
US7422635B2
(en)
*
|
2003-08-28 |
2008-09-09 |
Micron Technology, Inc. |
Methods and apparatus for processing microfeature workpieces, e.g., for depositing materials on microfeature workpieces
|
US6924223B2
(en)
*
|
2003-09-30 |
2005-08-02 |
Tokyo Electron Limited |
Method of forming a metal layer using an intermittent precursor gas flow process
|
US7132338B2
(en)
*
|
2003-10-10 |
2006-11-07 |
Applied Materials, Inc. |
Methods to fabricate MOSFET devices using selective deposition process
|
US7091085B2
(en)
*
|
2003-11-14 |
2006-08-15 |
Micron Technology, Inc. |
Reduced cell-to-cell shorting for memory arrays
|
US7030431B2
(en)
*
|
2004-03-19 |
2006-04-18 |
Nanya Technology Corp. |
Metal gate with composite film stack
|
US7966969B2
(en)
*
|
2004-09-22 |
2011-06-28 |
Asm International N.V. |
Deposition of TiN films in a batch reactor
|
US20060234502A1
(en)
*
|
2005-04-13 |
2006-10-19 |
Vishwanath Bhat |
Method of forming titanium nitride layers
|