JP2005097074A - 絶縁化超微粉末とその製造方法、およびそれを用いた高誘電率樹脂複合材料 - Google Patents
絶縁化超微粉末とその製造方法、およびそれを用いた高誘電率樹脂複合材料 Download PDFInfo
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- JP2005097074A JP2005097074A JP2004002446A JP2004002446A JP2005097074A JP 2005097074 A JP2005097074 A JP 2005097074A JP 2004002446 A JP2004002446 A JP 2004002446A JP 2004002446 A JP2004002446 A JP 2004002446A JP 2005097074 A JP2005097074 A JP 2005097074A
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- ultrafine powder
- dielectric constant
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- insulated
- composite material
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Abstract
フィラー添加量を抑制し、樹脂材料本来の加工性、成形性を保持した高誘電率樹脂複合材料を提供する。
【解決手段】
高誘電率フィラーとして、短径が1nm以上100nm以下の球状、長球状もしくは針状の導電性超微粉末を絶縁被覆した絶縁化超微粉末を樹脂に添加する。
【選択図】 図2
Description
本発明で用いる導電性超微粉末は、この中でも針状体が球状体よりも望ましい。これは針状体のほうが、比誘電率が20以上である樹脂複合材料として連続層を形成するために必要な添加量が少なくてすむためである。針状体の導電性超微粉末のアスペクト比は、2以上100以下が望ましく、10以上40以下がより望ましい。
d=w/(S・ρ)
但し、w:導電性超微粉末に対する絶縁皮膜の重量比
S:導電性超微粉末の比表面積
ρ:絶縁性皮膜を構成する材質の真密度
dは、w、S、ρから計算した絶縁皮膜の厚さの概算値である。導電性超微粉末1(g)を、w(g)の絶縁性材質で被覆する場合を考える。皮膜厚さdと比表面積Sとの積が、導電性超微粉末1(g)の絶縁性皮膜体積の概算値となる。したがって絶縁性皮膜材質の真密度ρを用いて、導電性超微粉末1(g)あたりについて、Sdρ≒wとなる。但し、あくまでも概算値であり、被覆処理時の導電性超微粉末の凝集状態によっては、実際に観察される二次粒子表面にdの5倍から10倍程度の厚い皮膜が形成されることもあるが、上述のように本発明における絶縁効果の有用な目安となる。
望ましくは、皮膜の厚みが0.3nm以上、導電性超微粉末の短径以下の範囲であり、かつ、被覆する導電性粒子の粒径と導電性超微粉末の短径との比率が、0.01以上0.9以下、さらに望ましくはこの比率が、0.01以上0.5以下となる厚さである。この比率が0.01以上であると、十分な絶縁効果があり、導通を防げ、誘電体として十分に機能する。一方、この比率が0.9以下であると、樹脂複合材料の比誘電率が低下することがない。
以下、実施例により本発明を具体的に説明するが、当然これに限定されるものではない。
イソプロパノール200g中に針状アンチモンドープ酸化スズ(石原産業(株)製、FS-10P短径10〜20nm、長径200〜2000nm、比表面積25〜35m2/g)50gとテトラプロピルオキシチタネート27gを添加し、室温(20〜30℃)にて30分アジターで攪拌混合した。この分散溶液に蒸留水:イソプロパノールの比が1:6の混合液134gを30分かけて滴下した。滴下終了後更に30分攪拌を継続し、濾過し、12時間自然乾燥した後、100℃にて真空乾燥した。図1に示したとおり、このゾルゲル反応により生成したチタン水酸化物粒子が針状アンチモンドープ酸化スズの表面に付着しているのを走査型電子顕微鏡にて確認した。この粉末をマッフル炉にて1000℃で3時間、焼成した。図2に示したとおり、走査型電子顕微鏡にて多層構造を確認した。得られた絶縁化超微粉末は、短径15〜40nm、長径200〜2000nmであり、その表面は、厚さが5〜10nmのルチル型二酸化チタンからなる絶縁皮膜によって隙間無く被覆されていた。なお、二酸化チタンと針状アンチモンドープ酸化スズとの重量比は0.2:1、針状アンチモンドープ酸化スズの比表面積は25〜35m2/gであり、絶縁皮膜に関するd値は1.67nmであった。このd値と電子顕微鏡観察値との差異は、既に述べたように絶縁被覆処理時の針状アンチモンドープ酸化スズの凝集によると考えられる。
硬化物を得るに当たり、焼成して得られた絶縁化超微粉末の量を7.5g、ビスフェノールA型エポキシモノマーの量を7.5gとした以外は実施例1と同様にして硬化物の板を得た。これは焼成粉末を13vol%添加したことになる。実施例1と同様に誘電率を測定したところ、比誘電率は96.2であった。
硬化物を得るに当たり、導電性超微粉末に球状アンチモンドープ酸化スズ(石原産業(株)製SN−100P、粒径10〜30nm、比表面積65〜80m2/g)を用い、絶縁化超微粉末を得た。電子顕微鏡観察による絶縁皮膜の厚さは2〜10nmであった。なお、この場合の絶縁皮膜に関するd値は0.64nmであった。該絶縁化超微粉末の量を9g、ビスフェノールA型エポキシモノマーの量を6gとした以外は実施例2と同様にして、硬化物の板を得た。これは焼成粉末を20vol%添加したことになる。実施例1と同様に誘電率を測定したところ、比誘電率は88.7であった。
球状アンチモンドープ酸化スズ(石原産業(株)製SN―100P粒径10〜30nm)を1000℃にて6時間焼成した。この結果、粒径が40nm〜60nmとなった。硬化物を得るに当り、この球状アンチモンドープ酸化スズを用い、焼成して得られた絶縁化超微粉末の量を9g、ビスフェノールA型エポキシモノマーの量を6gとした以外は実施例2と同様にして、硬化物の板を得た。これは焼成粉末を20vol%添加したことになる。実施例1と同様に誘電率を測定したところ、比誘電率は57.6であった。
実施例1において、焼成して得られた絶縁化超微粉末の代わりに針状アンチモンドープ酸化スズ(FS−10P)を5gとしたこと以外は同様にして硬化物の板を得た。これは体積組成では7vol%添加したことになる。誘電率測定を試みたが、この板は体積抵抗率11.2Ωmの導電体であり誘電率は測定できなかった。すなわち、この硬化物の板は誘電体ではなかった。
硬化物を得るに当たり、粒径2μmのチタン酸バリウムを9.3g、ビスフェノールA型エポキシモノマーの量を2.7gとした以外は実施例1と同様にして、硬化物の板を得た。これはチタン酸バリウム粉末を20vol%添加したことになる。実施例1と同様に誘電率を測定したところ、比誘電率は6.8であった。
球状アンチモンドープ酸化スズ(石原産業(株)製SN―100P、粒径10〜30nm)を1000℃にて480時間焼成した。この結果、粒径が100nmを超える球状のアンチモンドープ酸化スズとなった。硬化物を得るに当り、該アンチモンドープ酸化スズを用い焼成して得られた絶縁化超微粉末の量を9g、ビスフェノールA型エポキシモノマーの量を6gとした以外は実施例2と同様にして、硬化物の板を得た。これは焼成粉末を20vol%添加したことになる。実施例1と同様に誘電率を測定したところ、比誘電率は17.8であった。
テトラプロピルオキシチタネートの添加量を2.7gとした以外は実施例1と同様にした。電子顕微鏡観察による二酸化チタン皮膜の厚さは0.2nmであった。また、この場合d値は0.17nmであった。この場合、導通した。
テトラプロピルオキシチタネートの添加量を6.8gとした以外は実施例3と同様にした。この場合、電子顕微鏡観察による二酸化チタン皮膜の厚さは0.2nmであった。また、d値は0.17nmであった。この場合、導通した。
テトラプロピルオキシチタネートの添加量を54gとした以外は実施例1と同様にした。この場合、電子顕微鏡観察により絶縁化処理後の短径が60nm以上となっていたことから、絶縁皮膜の厚は30nm以上と考えられる。この場合の誘電率は7.8であった。
Claims (11)
- 短径が1nm以上100nm以下の球状、長球状もしくは針状の導電性超微粉末に絶縁皮膜を設けてなる絶縁化超微粉末。
- 前記絶縁皮膜の比誘電率が20以上である請求項1に記載の絶縁化超微粉末。
- 絶縁皮膜が絶縁性酸化物及び絶縁性窒化物から選ばれる少なくとも1種からなる請求項1に記載の絶縁化超微粉末。
- 導電性超微粉末が金属酸化物からなる請求項1に記載の絶縁化超微粉末。
- 絶縁皮膜の厚さが0.3nm以上で、かつ導電性超微粉末の短径以下である請求項1に記載の絶縁化超微粉末。
- 短径が1nm以上100nm以下の球状、長球状もしくは針状の導電性超微粉末に、比誘電率20以上の金属酸化物からなる絶縁皮膜を設けてなる絶縁化超微粉末の製造方法であって、下記のa)、b)又はc)のいずれかの工程を有し、かつ、該工程に次いで、金属酸化物の融点より900℃低い温度以上で、かつ、該金属酸化物の融点未満の温度で焼成する工程を有する絶縁化超微粉末の製造方法。
a)有機溶媒中に導電性超微粉末を分散し、金属アルコキシドを添加し、ゾルゲル反応により、導電性超微粉末の表面に金属酸化物を析出させる工程、
b)金属塩水溶液中に導電性超微粉末を分散し、アルカリを添加し、該導電性超微粉末の表面に金属水酸化物を析出させ、さらに乾燥による脱水縮合を経て金属酸化物を該導電性超微粉末の表面に付着させる工程、
c)導電性超微粉末の水分散液に、金属塩水溶液とアルカリ水溶液を同時または逐次添加し、該導電性超微粉末の表面に金属水酸化物を析出させ、さらに乾燥による脱水縮合を経て金属酸化物を該導電性超微粉末の表面に付着させる工程。 - 請求項1〜5のいずれかに記載の絶縁化超微粉末と樹脂を、絶縁化超微粉末/樹脂の体積比で5/95〜50/50の範囲で配合する樹脂複合材料。
- さらに、充填剤を含有する請求項7に記載の樹脂複合材料。
- 比誘電率が20以上である請求項7又は8に記載の樹脂複合材料。
- 請求項7〜9のいずれかに記載の樹脂複合材料を用いて形成される、高誘電率フィルム又はシート。
- 請求項11に記載の高誘電率フィルム又はシートを用いることを特徴とする電子部品。
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JP2006344570A (ja) * | 2004-08-06 | 2006-12-21 | Mitsubishi Gas Chem Co Inc | 絶縁化超微粉末および高誘電率樹脂複合材料 |
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US8807438B2 (en) | 2006-02-22 | 2014-08-19 | Toyo Seikan Kaisha, Ltd. | RFID tag substrate for metal component |
JP2011026189A (ja) * | 2009-06-30 | 2011-02-10 | Mitsubishi Materials Corp | 導電性針状酸化アンチモン錫微粉末およびその製造方法 |
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JP2013542548A (ja) * | 2010-03-31 | 2013-11-21 | スリーエム イノベイティブ プロパティズ カンパニー | ディスプレイ用の電子物品、及びその製造方法 |
Also Published As
Publication number | Publication date |
---|---|
US8173051B2 (en) | 2012-05-08 |
EP1447817B1 (en) | 2008-04-16 |
JP4867130B2 (ja) | 2012-02-01 |
EP1447817A3 (en) | 2005-11-23 |
KR101082658B1 (ko) | 2011-11-14 |
DE602004013064D1 (de) | 2008-05-29 |
KR20040074951A (ko) | 2004-08-26 |
US20040162365A1 (en) | 2004-08-19 |
US8187710B2 (en) | 2012-05-29 |
US20110108776A1 (en) | 2011-05-12 |
US20100009179A1 (en) | 2010-01-14 |
EP1447817A2 (en) | 2004-08-18 |
DE602004013064T2 (de) | 2009-07-02 |
US7592065B2 (en) | 2009-09-22 |
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