|
US6475276B1
(en)
|
1999-10-15 |
2002-11-05 |
Asm Microchemistry Oy |
Production of elemental thin films using a boron-containing reducing agent
|
|
US6759325B2
(en)
*
|
2000-05-15 |
2004-07-06 |
Asm Microchemistry Oy |
Sealing porous structures
|
|
US7597715B2
(en)
|
2005-04-21 |
2009-10-06 |
Biomet Manufacturing Corp. |
Method and apparatus for use of porous implants
|
|
US8123814B2
(en)
|
2001-02-23 |
2012-02-28 |
Biomet Manufacturing Corp. |
Method and appartus for acetabular reconstruction
|
|
WO2003025243A2
(en)
*
|
2001-09-14 |
2003-03-27 |
Asm International N.V. |
Metal nitride deposition by ald using gettering reactant
|
|
US6759327B2
(en)
|
2001-10-09 |
2004-07-06 |
Applied Materials Inc. |
Method of depositing low k barrier layers
|
|
US6838393B2
(en)
*
|
2001-12-14 |
2005-01-04 |
Applied Materials, Inc. |
Method for producing semiconductor including forming a layer containing at least silicon carbide and forming a second layer containing at least silicon oxygen carbide
|
|
US6890850B2
(en)
*
|
2001-12-14 |
2005-05-10 |
Applied Materials, Inc. |
Method of depositing dielectric materials in damascene applications
|
|
US7091137B2
(en)
*
|
2001-12-14 |
2006-08-15 |
Applied Materials |
Bi-layer approach for a hermetic low dielectric constant layer for barrier applications
|
|
US6541397B1
(en)
*
|
2002-03-29 |
2003-04-01 |
Applied Materials, Inc. |
Removable amorphous carbon CMP stop
|
|
US6800930B2
(en)
*
|
2002-07-31 |
2004-10-05 |
Micron Technology, Inc. |
Semiconductor dice having back side redistribution layer accessed using through-silicon vias, and assemblies
|
|
US7749563B2
(en)
*
|
2002-10-07 |
2010-07-06 |
Applied Materials, Inc. |
Two-layer film for next generation damascene barrier application with good oxidation resistance
|
|
JP2004200203A
(ja)
*
|
2002-12-16 |
2004-07-15 |
Semiconductor Leading Edge Technologies Inc |
半導体装置及びその製造方法
|
|
CN101217136B
(zh)
*
|
2003-05-29 |
2011-03-02 |
日本电气株式会社 |
布线结构及其制造方法
|
|
TWI257120B
(en)
*
|
2003-06-18 |
2006-06-21 |
Fujitsu Ltd |
Method for manufacturing semiconductor device
|
|
KR100964194B1
(ko)
|
2003-07-18 |
2010-06-17 |
매그나칩 반도체 유한회사 |
반도체 소자의 절연막 형성 방법
|
|
US7052990B2
(en)
*
|
2003-09-03 |
2006-05-30 |
Infineon Technologies Ag |
Sealed pores in low-k material damascene conductive structures
|
|
US7553769B2
(en)
*
|
2003-10-10 |
2009-06-30 |
Tokyo Electron Limited |
Method for treating a dielectric film
|
|
US7157373B2
(en)
|
2003-12-11 |
2007-01-02 |
Infineon Technologies Ag |
Sidewall sealing of porous dielectric materials
|
|
US7088003B2
(en)
*
|
2004-02-19 |
2006-08-08 |
International Business Machines Corporation |
Structures and methods for integration of ultralow-k dielectrics with improved reliability
|
|
US7638440B2
(en)
*
|
2004-03-12 |
2009-12-29 |
Applied Materials, Inc. |
Method of depositing an amorphous carbon film for etch hardmask application
|
|
JP4879159B2
(ja)
*
|
2004-03-05 |
2012-02-22 |
アプライド マテリアルズ インコーポレイテッド |
アモルファス炭素膜堆積のためのcvdプロセス
|
|
US7030041B2
(en)
*
|
2004-03-15 |
2006-04-18 |
Applied Materials Inc. |
Adhesion improvement for low k dielectrics
|
|
US7229911B2
(en)
*
|
2004-04-19 |
2007-06-12 |
Applied Materials, Inc. |
Adhesion improvement for low k dielectrics to conductive materials
|
|
US20050233555A1
(en)
*
|
2004-04-19 |
2005-10-20 |
Nagarajan Rajagopalan |
Adhesion improvement for low k dielectrics to conductive materials
|
|
US7244674B2
(en)
*
|
2004-04-27 |
2007-07-17 |
Agency For Science Technology And Research |
Process of forming a composite diffusion barrier in copper/organic low-k damascene technology
|
|
US7015150B2
(en)
*
|
2004-05-26 |
2006-03-21 |
International Business Machines Corporation |
Exposed pore sealing post patterning
|
|
US20050277302A1
(en)
*
|
2004-05-28 |
2005-12-15 |
Nguyen Son V |
Advanced low dielectric constant barrier layers
|
|
US7229041B2
(en)
*
|
2004-06-30 |
2007-06-12 |
Ohio Central Steel Company |
Lifting lid crusher
|
|
US7288205B2
(en)
*
|
2004-07-09 |
2007-10-30 |
Applied Materials, Inc. |
Hermetic low dielectric constant layer for barrier applications
|
|
JP4903373B2
(ja)
*
|
2004-09-02 |
2012-03-28 |
ローム株式会社 |
半導体装置の製造方法
|
|
JP4903374B2
(ja)
*
|
2004-09-02 |
2012-03-28 |
ローム株式会社 |
半導体装置の製造方法
|
|
JP4798334B2
(ja)
*
|
2004-10-15 |
2011-10-19 |
Jsr株式会社 |
表面疎水化用組成物、表面疎水化方法、半導体装置およびその製造方法
|
|
US20060099802A1
(en)
*
|
2004-11-10 |
2006-05-11 |
Jing-Cheng Lin |
Diffusion barrier for damascene structures
|
|
US7678682B2
(en)
*
|
2004-11-12 |
2010-03-16 |
Axcelis Technologies, Inc. |
Ultraviolet assisted pore sealing of porous low k dielectric films
|
|
US20060113675A1
(en)
*
|
2004-12-01 |
2006-06-01 |
Chung-Liang Chang |
Barrier material and process for Cu interconnect
|
|
US7229909B2
(en)
*
|
2004-12-09 |
2007-06-12 |
International Business Machines Corporation |
Integrated circuit chip utilizing dielectric layer having oriented cylindrical voids formed from carbon nanotubes
|
|
US20060131700A1
(en)
*
|
2004-12-22 |
2006-06-22 |
David Moses M |
Flexible electronic circuit articles and methods of making thereof
|
|
JP4408816B2
(ja)
*
|
2005-01-07 |
2010-02-03 |
富士通株式会社 |
半導体装置の製造方法
|
|
JP5324734B2
(ja)
*
|
2005-01-21 |
2013-10-23 |
インターナショナル・ビジネス・マシーンズ・コーポレーション |
誘電体材料とその製造方法
|
|
US7135402B2
(en)
*
|
2005-02-01 |
2006-11-14 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
Sealing pores of low-k dielectrics using CxHy
|
|
US7365026B2
(en)
*
|
2005-02-01 |
2008-04-29 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
CxHy sacrificial layer for cu/low-k interconnects
|
|
JP4201002B2
(ja)
*
|
2005-03-28 |
2008-12-24 |
セイコーエプソン株式会社 |
液晶装置、その製造方法およびプロジェクタ
|
|
US8021432B2
(en)
|
2005-12-05 |
2011-09-20 |
Biomet Manufacturing Corp. |
Apparatus for use of porous implants
|
|
US8292967B2
(en)
*
|
2005-04-21 |
2012-10-23 |
Biomet Manufacturing Corp. |
Method and apparatus for use of porous implants
|
|
US8066778B2
(en)
*
|
2005-04-21 |
2011-11-29 |
Biomet Manufacturing Corp. |
Porous metal cup with cobalt bearing surface
|
|
US8266780B2
(en)
*
|
2005-04-21 |
2012-09-18 |
Biomet Manufacturing Corp. |
Method and apparatus for use of porous implants
|
|
US7335586B2
(en)
*
|
2005-06-10 |
2008-02-26 |
Intel Corporation |
Sealing porous dielectric material using plasma-induced surface polymerization
|
|
US7915735B2
(en)
*
|
2005-08-05 |
2011-03-29 |
Micron Technology, Inc. |
Selective metal deposition over dielectric layers
|
|
JP4965830B2
(ja)
*
|
2005-08-12 |
2012-07-04 |
ルネサスエレクトロニクス株式会社 |
半導体装置の製造方法
|
|
JP4747755B2
(ja)
*
|
2005-09-20 |
2011-08-17 |
独立行政法人産業技術総合研究所 |
有機絶縁膜とその作製方法,及び有機絶縁膜を用いた半導体装置
|
|
US20070126120A1
(en)
*
|
2005-12-06 |
2007-06-07 |
Taiwan Semiconductor Manufacturing Co., Ltd. |
Semiconductor device
|
|
US7635447B2
(en)
*
|
2006-02-17 |
2009-12-22 |
Biomet Manufacturing Corp. |
Method and apparatus for forming porous metal implants
|
|
US7564136B2
(en)
*
|
2006-02-24 |
2009-07-21 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
Integration scheme for Cu/low-k interconnects
|
|
JP5372323B2
(ja)
*
|
2006-03-29 |
2013-12-18 |
富士通株式会社 |
界面ラフネス緩和膜、これを用いた配線層および半導体装置ならびに半導体装置の製造方法
|
|
US20070286954A1
(en)
*
|
2006-06-13 |
2007-12-13 |
Applied Materials, Inc. |
Methods for low temperature deposition of an amorphous carbon layer
|
|
DE102006056626B4
(de)
*
|
2006-11-30 |
2024-12-19 |
Advanced Micro Devices, Inc. |
Verfahren zum Bilden einer Öffnung in einer Metallisierungsstruktur einer Halbleitervorrichtung mittels eines selbstbeschränkenden Abscheideprozesses
|
|
CN101842062B
(zh)
*
|
2007-09-25 |
2013-04-03 |
拜欧米特制造公司 |
非骨水泥型胫骨托的制造方法
|
|
US20090093128A1
(en)
*
|
2007-10-08 |
2009-04-09 |
Martin Jay Seamons |
Methods for high temperature deposition of an amorphous carbon layer
|
|
KR20090048178A
(ko)
*
|
2007-11-09 |
2009-05-13 |
주식회사 하이닉스반도체 |
반도체 소자 및 그의 제조 방법
|
|
US20090269923A1
(en)
*
|
2008-04-25 |
2009-10-29 |
Lee Sang M |
Adhesion and electromigration improvement between dielectric and conductive layers
|
|
CN102047411B
(zh)
*
|
2008-06-17 |
2015-08-05 |
富士通株式会社 |
半导体装置及其制造方法
|
|
JP5332442B2
(ja)
*
|
2008-09-19 |
2013-11-06 |
富士通セミコンダクター株式会社 |
半導体装置の製造方法及び半導体装置
|
|
WO2010047869A1
(en)
*
|
2008-10-20 |
2010-04-29 |
Dow Corning Corporation |
Cvd precursors
|
|
US9653327B2
(en)
|
2011-05-12 |
2017-05-16 |
Applied Materials, Inc. |
Methods of removing a material layer from a substrate using water vapor treatment
|
|
CN103943789A
(zh)
*
|
2014-04-18 |
2014-07-23 |
深圳市华星光电技术有限公司 |
Oled器件及其制备方法
|
|
US9515017B2
(en)
|
2014-12-18 |
2016-12-06 |
Intel Corporation |
Ground via clustering for crosstalk mitigation
|
|
US9230900B1
(en)
*
|
2014-12-18 |
2016-01-05 |
Intel Corporation |
Ground via clustering for crosstalk mitigation
|
|
JP6499001B2
(ja)
*
|
2015-04-20 |
2019-04-10 |
東京エレクトロン株式会社 |
多孔質膜をエッチングする方法
|
|
FR3042067A1
(fr)
|
2015-10-01 |
2017-04-07 |
Stmicroelectronics Rousset |
Protection contre le claquage premature de dielectriques poreux interlignes au sein d'un circuit integre
|
|
US9997451B2
(en)
|
2016-06-30 |
2018-06-12 |
International Business Machines Corporation |
Semiconductor device including a porous dielectric layer, and method of forming the semiconductor device
|
|
US10763419B2
(en)
*
|
2017-06-02 |
2020-09-01 |
Northrop Grumman Systems Corporation |
Deposition methodology for superconductor interconnects
|
|
JP6910387B2
(ja)
*
|
2019-03-05 |
2021-07-28 |
株式会社Kokusai Electric |
半導体装置の製造方法、基板処理方法、基板処理装置およびプログラム
|
|
US11315893B2
(en)
*
|
2020-03-25 |
2022-04-26 |
Nanya Technology Corporation |
Semiconductor device with composite connection structure and method for fabricating the same
|
|
TW202200828A
(zh)
|
2020-06-24 |
2022-01-01 |
荷蘭商Asm Ip私人控股有限公司 |
含鉬薄膜的氣相沉積
|