JP2004514129A5 - - Google Patents

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Publication number
JP2004514129A5
JP2004514129A5 JP2002542833A JP2002542833A JP2004514129A5 JP 2004514129 A5 JP2004514129 A5 JP 2004514129A5 JP 2002542833 A JP2002542833 A JP 2002542833A JP 2002542833 A JP2002542833 A JP 2002542833A JP 2004514129 A5 JP2004514129 A5 JP 2004514129A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2002542833A
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Japanese (ja)
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JP2004514129A (ja
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Publication date
Priority claimed from HU0004571A external-priority patent/HU226937B1/hu
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Publication of JP2004514129A publication Critical patent/JP2004514129A/ja
Publication of JP2004514129A5 publication Critical patent/JP2004514129A5/ja
Pending legal-status Critical Current

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JP2002542833A 2000-11-17 2001-11-16 レーザ走査顕微鏡を用い、材料によって放射、反射及び透過された光の偏光特性を測定する方法及び装置 Pending JP2004514129A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
HU0004571A HU226937B1 (en) 2000-11-17 2000-11-17 Method and apparatus for determining polarization amount of material by a laser scanning microscope
PCT/HU2001/000116 WO2002040953A1 (en) 2000-11-17 2001-11-16 Method and apparatus for determining the polarization properties of light emitted, reflected or transmitted by a material using a laser scanning microscope

Publications (2)

Publication Number Publication Date
JP2004514129A JP2004514129A (ja) 2004-05-13
JP2004514129A5 true JP2004514129A5 (enExample) 2005-12-22

Family

ID=89978770

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002542833A Pending JP2004514129A (ja) 2000-11-17 2001-11-16 レーザ走査顕微鏡を用い、材料によって放射、反射及び透過された光の偏光特性を測定する方法及び装置

Country Status (7)

Country Link
US (1) US6856391B2 (enExample)
EP (1) EP1334339B8 (enExample)
JP (1) JP2004514129A (enExample)
AT (1) ATE372507T1 (enExample)
DE (1) DE60130356T2 (enExample)
HU (1) HU226937B1 (enExample)
WO (1) WO2002040953A1 (enExample)

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JP6009944B2 (ja) 2011-01-26 2016-10-19 オリンパス株式会社 核酸分子の多型識別方法
EP2693201A4 (en) 2011-03-29 2014-10-29 Olympus Corp PHOTOMETRIC ANALYSIS DEVICE, PHOTOMETRIC ANALYSIS METHOD, AND COMPUTER PROGRAM FOR PHOTOMETRIC ANALYSIS, DETECTING SINGLE LIGHT EMITTING PARTICLE
EP2706346A4 (en) 2011-04-13 2014-11-19 Olympus Corp PHOTO-ANALYSIS DEVICE USING SINGLE-LIGHT EMITTING PARTICLE DETECTION, METHOD FOR PHOTO-ANALYSIS, AND COMPUTER PROGRAM FOR PHOTO-ANALYSIS
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CN103733047B (zh) 2011-08-11 2016-03-30 奥林巴斯株式会社 目标粒子的检测方法
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WO2013031309A1 (ja) 2011-08-26 2013-03-07 オリンパス株式会社 光分析を用いた単一粒子検出装置、単一粒子検出方法及び単一粒子検出用コンピュータプログラム
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WO2013031377A1 (ja) 2011-08-30 2013-03-07 オリンパス株式会社 単一発光粒子検出を用いた光分析装置、光分析方法及び光分析用コンピュータプログラム
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CN105518711B (zh) * 2015-06-29 2019-11-29 北京旷视科技有限公司 活体检测方法、活体检测系统以及计算机程序产品
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US11506877B2 (en) 2016-11-10 2022-11-22 The Trustees Of Columbia University In The City Of New York Imaging instrument having objective axis and light sheet or light beam projector axis intersecting at less than 90 degrees
JP6351893B1 (ja) * 2018-02-26 2018-07-04 日本分光株式会社 位相差制御装置
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CN110261319B (zh) * 2019-06-24 2021-11-16 西安理工大学 基于四次测量Mueller矩阵光谱的装置及测量方法
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