JP2003338519A5 - - Google Patents
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- Publication number
- JP2003338519A5 JP2003338519A5 JP2002146321A JP2002146321A JP2003338519A5 JP 2003338519 A5 JP2003338519 A5 JP 2003338519A5 JP 2002146321 A JP2002146321 A JP 2002146321A JP 2002146321 A JP2002146321 A JP 2002146321A JP 2003338519 A5 JP2003338519 A5 JP 2003338519A5
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor device
- electrode pads
- wire
- semiconductor chip
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims 35
- 238000000034 method Methods 0.000 claims 2
- 238000007789 sealing Methods 0.000 claims 2
- 241000587161 Gomphocarpus Species 0.000 claims 1
- 239000008393 encapsulating agent Substances 0.000 claims 1
- 239000011347 resin Substances 0.000 claims 1
- 229920005989 resin Polymers 0.000 claims 1
- 239000000523 sample Substances 0.000 claims 1
- 238000001721 transfer moulding Methods 0.000 claims 1
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002146321A JP2003338519A (ja) | 2002-05-21 | 2002-05-21 | 半導体装置及びその製造方法 |
| TW92112447A TWI297184B (en) | 2002-05-21 | 2003-05-07 | A semiconductor device and a method of manufacturing the same |
| US10/430,279 US6900551B2 (en) | 2002-05-21 | 2003-05-07 | Semiconductor device with alternate bonding wire arrangement |
| KR1020030030463A KR20040014167A (ko) | 2002-05-21 | 2003-05-14 | 반도체장치 및 그 제조방법 |
| CNB031237061A CN100481414C (zh) | 2002-05-21 | 2003-05-20 | 半导体器件及其制造方法 |
| US11/035,999 US20050121805A1 (en) | 2002-05-21 | 2005-01-18 | Semiconductor device and a method of manufacturing the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002146321A JP2003338519A (ja) | 2002-05-21 | 2002-05-21 | 半導体装置及びその製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2003338519A JP2003338519A (ja) | 2003-11-28 |
| JP2003338519A5 true JP2003338519A5 (enExample) | 2005-09-29 |
Family
ID=29545121
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2002146321A Pending JP2003338519A (ja) | 2002-05-21 | 2002-05-21 | 半導体装置及びその製造方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US6900551B2 (enExample) |
| JP (1) | JP2003338519A (enExample) |
| KR (1) | KR20040014167A (enExample) |
| CN (1) | CN100481414C (enExample) |
| TW (1) | TWI297184B (enExample) |
Families Citing this family (40)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005166794A (ja) | 2003-12-01 | 2005-06-23 | Ricoh Co Ltd | 部品パッケージとプリント配線基板および電子機器 |
| JP3707487B2 (ja) * | 2003-12-12 | 2005-10-19 | セイコーエプソン株式会社 | 半導体装置及び電子デバイス並びにそれらの製造方法 |
| CN100419982C (zh) * | 2004-05-31 | 2008-09-17 | 松下电器产业株式会社 | 半导体装置 |
| KR100603932B1 (ko) | 2005-01-31 | 2006-07-24 | 삼성전자주식회사 | 칩-온-보오드 기판을 갖는 반도체 장치 |
| WO2006090196A1 (en) * | 2005-02-23 | 2006-08-31 | Infineon Technologies Ag | Rectangular bond pad and method of wire bonding the same with an elongated ball bond |
| JP3988777B2 (ja) * | 2005-07-29 | 2007-10-10 | オムロン株式会社 | 表面実装用の半導体パッケージおよびその製造方法 |
| JP2007103423A (ja) * | 2005-09-30 | 2007-04-19 | Renesas Technology Corp | 半導体装置及びその製造方法 |
| JP5148825B2 (ja) * | 2005-10-14 | 2013-02-20 | ルネサスエレクトロニクス株式会社 | 半導体装置および半導体装置の製造方法 |
| DE102006015222B4 (de) * | 2006-03-30 | 2018-01-04 | Robert Bosch Gmbh | QFN-Gehäuse mit optimierter Anschlussflächengeometrie |
| JP4942020B2 (ja) * | 2006-05-12 | 2012-05-30 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
| US7777353B2 (en) * | 2006-08-15 | 2010-08-17 | Yamaha Corporation | Semiconductor device and wire bonding method therefor |
| WO2008081630A1 (ja) * | 2006-12-29 | 2008-07-10 | Sanyo Electric Co., Ltd. | 半導体装置およびその製造方法 |
| TWI357647B (en) * | 2007-02-01 | 2012-02-01 | Siliconware Precision Industries Co Ltd | Semiconductor substrate structure |
| US8922028B2 (en) * | 2007-02-13 | 2014-12-30 | Advanced Semiconductor Engineering, Inc. | Semiconductor package |
| TWI333689B (en) * | 2007-02-13 | 2010-11-21 | Advanced Semiconductor Eng | Semiconductor package |
| US8227917B2 (en) * | 2007-10-08 | 2012-07-24 | Taiwan Semiconductor Manufacturing Company, Ltd. | Bond pad design for fine pitch wire bonding |
| US20090108436A1 (en) * | 2007-10-31 | 2009-04-30 | Toshio Fujii | Semiconductor package |
| JP5001903B2 (ja) * | 2008-05-28 | 2012-08-15 | ルネサスエレクトロニクス株式会社 | 半導体装置及びその製造方法 |
| JP5518381B2 (ja) * | 2008-07-10 | 2014-06-11 | 株式会社半導体エネルギー研究所 | カラーセンサ及び当該カラーセンサを具備する電子機器 |
| JP5656644B2 (ja) * | 2008-12-19 | 2015-01-21 | 株式会社アドバンテスト | 半導体装置、半導体装置の製造方法およびスイッチ回路 |
| JP5595694B2 (ja) * | 2009-01-15 | 2014-09-24 | パナソニック株式会社 | 半導体装置 |
| JP2011003764A (ja) * | 2009-06-19 | 2011-01-06 | Renesas Electronics Corp | 半導体装置及びその製造方法 |
| US8531013B2 (en) * | 2010-06-11 | 2013-09-10 | Casio Computer Co., Ltd. | Semiconductor device equipped with bonding wires and manufacturing method of semiconductor device equipped with bonding wires |
| JP5467959B2 (ja) | 2010-07-21 | 2014-04-09 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
| CN102456812B (zh) * | 2010-10-28 | 2015-08-12 | 展晶科技(深圳)有限公司 | 发光二极管封装结构 |
| JP2012195459A (ja) * | 2011-03-16 | 2012-10-11 | Sharp Corp | ワイヤーボンディング方法、及び、半導体装置 |
| JP5294351B2 (ja) * | 2011-04-01 | 2013-09-18 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法 |
| JP5968713B2 (ja) * | 2012-07-30 | 2016-08-10 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
| CN104765169B (zh) * | 2015-02-04 | 2018-01-05 | 深圳市华星光电技术有限公司 | 一种阵列基板的检测线路及阵列基板 |
| US20160307873A1 (en) * | 2015-04-16 | 2016-10-20 | Mediatek Inc. | Bonding pad arrangment design for semiconductor package |
| EP3422393A4 (en) * | 2016-02-23 | 2020-02-05 | Renesas Electronics Corporation | SEMICONDUCTOR COMPONENT AND PRODUCTION METHOD THEREFOR |
| JP6304700B2 (ja) * | 2016-09-26 | 2018-04-04 | 株式会社パウデック | 半導体パッケージ、モジュールおよび電気機器 |
| JP2018107296A (ja) * | 2016-12-27 | 2018-07-05 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法 |
| CN108574158B (zh) * | 2017-03-14 | 2020-10-09 | 群创光电股份有限公司 | 显示装置及其制造方法 |
| JP6768569B2 (ja) * | 2017-03-21 | 2020-10-14 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法および半導体装置 |
| JP2022118876A (ja) | 2021-02-03 | 2022-08-16 | キオクシア株式会社 | 半導体装置 |
| KR20230084971A (ko) | 2021-12-06 | 2023-06-13 | 삼성전자주식회사 | 반도체 패키지 |
| US12033903B1 (en) * | 2021-12-09 | 2024-07-09 | Amazon Technologies, Inc. | High-density microbump and probe pad arrangement for semiconductor components |
| JP2023147829A (ja) * | 2022-03-30 | 2023-10-13 | キヤノン株式会社 | 記録素子ユニット及び記録素子ユニットの製造方法 |
| KR20230173269A (ko) * | 2022-06-16 | 2023-12-27 | 삼성전자주식회사 | 반도체 패키지 |
Family Cites Families (30)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0770553B2 (ja) * | 1988-09-26 | 1995-07-31 | 日本電気株式会社 | 半導体集積回路装置の製造方法 |
| JP3723232B2 (ja) * | 1992-03-10 | 2005-12-07 | シリコン システムズ インコーポレーテッド | プローブ針調整ツール及びプローブ針調整法 |
| JPH0634983A (ja) | 1992-07-17 | 1994-02-10 | Sharp Corp | 貼合わせ装置 |
| US6025640A (en) * | 1997-07-16 | 2000-02-15 | Dai Nippon Insatsu Kabushiki Kaisha | Resin-sealed semiconductor device, circuit member for use therein and method of manufacturing resin-sealed semiconductor device |
| JP3000975B2 (ja) * | 1997-10-20 | 2000-01-17 | 富士通株式会社 | 半導体素子の実装構造 |
| US6008532A (en) * | 1997-10-23 | 1999-12-28 | Lsi Logic Corporation | Integrated circuit package having bond fingers with alternate bonding areas |
| US6157085A (en) * | 1998-04-07 | 2000-12-05 | Citizen Watch Co., Ltd. | Semiconductor device for preventing exfoliation from occurring between a semiconductor chip and a resin substrate |
| US6373143B1 (en) * | 1998-09-24 | 2002-04-16 | International Business Machines Corporation | Integrated circuit having wirebond pads suitable for probing |
| TW410446B (en) * | 1999-01-21 | 2000-11-01 | Siliconware Precision Industries Co Ltd | BGA semiconductor package |
| US6348742B1 (en) * | 1999-01-25 | 2002-02-19 | Clear Logic, Inc. | Sacrificial bond pads for laser configured integrated circuits |
| JP3718360B2 (ja) * | 1999-02-09 | 2005-11-24 | ローム株式会社 | 半導体装置 |
| JP3437477B2 (ja) * | 1999-02-10 | 2003-08-18 | シャープ株式会社 | 配線基板および半導体装置 |
| US6251694B1 (en) * | 1999-05-26 | 2001-06-26 | United Microelectronics Corp. | Method of testing and packaging a semiconductor chip |
| US6285077B1 (en) * | 1999-08-19 | 2001-09-04 | Lsi Logic Corporation | Multiple layer tape ball grid array package |
| JP2001144214A (ja) | 1999-11-17 | 2001-05-25 | Canon Inc | 半導体装置およびその接合構造 |
| JP4071914B2 (ja) * | 2000-02-25 | 2008-04-02 | 沖電気工業株式会社 | 半導体素子及びこれを用いた半導体装置 |
| US6291898B1 (en) * | 2000-03-27 | 2001-09-18 | Advanced Semiconductor Engineering, Inc. | Ball grid array package |
| US6429532B1 (en) * | 2000-05-09 | 2002-08-06 | United Microelectronics Corp. | Pad design |
| JP2001338955A (ja) * | 2000-05-29 | 2001-12-07 | Texas Instr Japan Ltd | 半導体装置及びその製造方法 |
| US6541844B2 (en) * | 2000-07-17 | 2003-04-01 | Rohm Co., Ltd. | Semiconductor device having substrate with die-bonding area and wire-bonding areas |
| JP2002043356A (ja) * | 2000-07-31 | 2002-02-08 | Nec Corp | 半導体ウェーハ、半導体装置及びその製造方法 |
| US6539341B1 (en) * | 2000-11-06 | 2003-03-25 | 3Com Corporation | Method and apparatus for log information management and reporting |
| US6538336B1 (en) * | 2000-11-14 | 2003-03-25 | Rambus Inc. | Wirebond assembly for high-speed integrated circuits |
| US6417576B1 (en) * | 2001-06-18 | 2002-07-09 | Amkor Technology, Inc. | Method and apparatus for attaching multiple metal components to integrated circuit modules |
| SG117395A1 (en) * | 2001-08-29 | 2005-12-29 | Micron Technology Inc | Wire bonded microelectronic device assemblies and methods of manufacturing same |
| US6476506B1 (en) * | 2001-09-28 | 2002-11-05 | Motorola, Inc. | Packaged semiconductor with multiple rows of bond pads and method therefor |
| TW510034B (en) * | 2001-11-15 | 2002-11-11 | Siliconware Precision Industries Co Ltd | Ball grid array semiconductor package |
| US6621140B1 (en) * | 2002-02-25 | 2003-09-16 | Rf Micro Devices, Inc. | Leadframe inductors |
| US6844631B2 (en) * | 2002-03-13 | 2005-01-18 | Freescale Semiconductor, Inc. | Semiconductor device having a bond pad and method therefor |
| TW531776B (en) * | 2002-03-21 | 2003-05-11 | Nanya Technology Corp | Metal pad structure suitable for connection pad and inspection pad |
-
2002
- 2002-05-21 JP JP2002146321A patent/JP2003338519A/ja active Pending
-
2003
- 2003-05-07 TW TW92112447A patent/TWI297184B/zh not_active IP Right Cessation
- 2003-05-07 US US10/430,279 patent/US6900551B2/en not_active Expired - Lifetime
- 2003-05-14 KR KR1020030030463A patent/KR20040014167A/ko not_active Withdrawn
- 2003-05-20 CN CNB031237061A patent/CN100481414C/zh not_active Expired - Fee Related
-
2005
- 2005-01-18 US US11/035,999 patent/US20050121805A1/en not_active Abandoned
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