JP2000173289A - エラー訂正可能なフラッシュメモリシステム - Google Patents

エラー訂正可能なフラッシュメモリシステム

Info

Publication number
JP2000173289A
JP2000173289A JP35143598A JP35143598A JP2000173289A JP 2000173289 A JP2000173289 A JP 2000173289A JP 35143598 A JP35143598 A JP 35143598A JP 35143598 A JP35143598 A JP 35143598A JP 2000173289 A JP2000173289 A JP 2000173289A
Authority
JP
Japan
Prior art keywords
memory
error
flash memory
sector
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP35143598A
Other languages
English (en)
Japanese (ja)
Other versions
JP2000173289A5 (https=
Inventor
Tomoharu Tanaka
智晴 田中
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP35143598A priority Critical patent/JP2000173289A/ja
Priority to US09/456,340 priority patent/US6185134B1/en
Priority to EP99124043A priority patent/EP1008936A3/en
Priority to KR1019990056034A priority patent/KR100321302B1/ko
Priority to TW088121627A priority patent/TW455874B/zh
Publication of JP2000173289A publication Critical patent/JP2000173289A/ja
Priority to US11/039,459 priority patent/USRE40252E1/en
Publication of JP2000173289A5 publication Critical patent/JP2000173289A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5621—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/14—Error detection or correction of the data by redundancy in operations
    • G06F11/1402—Saving, restoring, recovering or retrying
    • G06F11/1415—Saving, restoring, recovering or retrying at system level
    • G06F11/1433—Saving, restoring, recovering or retrying at system level during software upgrading
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1068—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices in sector programmable memories, e.g. flash disk
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Read Only Memory (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP35143598A 1998-12-10 1998-12-10 エラー訂正可能なフラッシュメモリシステム Pending JP2000173289A (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP35143598A JP2000173289A (ja) 1998-12-10 1998-12-10 エラー訂正可能なフラッシュメモリシステム
US09/456,340 US6185134B1 (en) 1998-12-10 1999-12-08 Flash memory control method, flash memory system using the control method and flash memory device using the control method
EP99124043A EP1008936A3 (en) 1998-12-10 1999-12-09 Flash memory control method
KR1019990056034A KR100321302B1 (ko) 1998-12-10 1999-12-09 플래시 메모리의 제어 방법, 및 이 제어 방법을 이용한플래시 메모리 시스템과 이 제어 방법을 이용한 플래시메모리 칩
TW088121627A TW455874B (en) 1998-12-10 1999-12-10 A method of controlling flash memory and a flash memory chip
US11/039,459 USRE40252E1 (en) 1998-12-10 2005-01-20 Flash memory control method, flash memory system using the control method and flash memory device using the control method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP35143598A JP2000173289A (ja) 1998-12-10 1998-12-10 エラー訂正可能なフラッシュメモリシステム

Publications (2)

Publication Number Publication Date
JP2000173289A true JP2000173289A (ja) 2000-06-23
JP2000173289A5 JP2000173289A5 (https=) 2005-08-25

Family

ID=18417275

Family Applications (1)

Application Number Title Priority Date Filing Date
JP35143598A Pending JP2000173289A (ja) 1998-12-10 1998-12-10 エラー訂正可能なフラッシュメモリシステム

Country Status (5)

Country Link
US (2) US6185134B1 (https=)
EP (1) EP1008936A3 (https=)
JP (1) JP2000173289A (https=)
KR (1) KR100321302B1 (https=)
TW (1) TW455874B (https=)

Cited By (26)

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JP2005056394A (ja) * 2003-07-18 2005-03-03 Toshiba Corp 記憶装置及びメモリカード
JP2005234883A (ja) * 2004-02-19 2005-09-02 Nec Corp 記憶装置のデータ書き込み、読み出し方法およびデータ記憶システム
WO2005111812A1 (ja) * 2004-05-19 2005-11-24 Matsushita Electric Industrial Co., Ltd. 不揮発性記憶装置のためのエラー訂正方法
JP2006048777A (ja) * 2004-08-02 2006-02-16 Toshiba Corp Ｎａｎｄフラッシュメモリおよびデータ書き込み方法
JP2007102942A (ja) * 2005-10-05 2007-04-19 Toshiba Corp 不揮発性半導体記憶装置及びそれを用いた不揮発性メモリシステム
WO2007119485A1 (ja) * 2006-04-06 2007-10-25 Advantest Corporation 試験装置および試験方法
US7403436B2 (en) 2001-09-06 2008-07-22 Renesas Technology Corp. Non-volatile semiconductor memory device
JP2008198337A (ja) * 2007-01-17 2008-08-28 Toshiba Corp 半導体記憶装置
KR100857947B1 (ko) 2006-01-20 2008-09-09 가부시끼가이샤 도시바 반도체 메모리 장치
JP2008287798A (ja) * 2007-05-17 2008-11-27 Yokogawa Electric Corp 半導体試験装置
JP2009158061A (ja) * 2007-12-27 2009-07-16 Toshiba Corp 半導体記憶装置
JP2009176393A (ja) * 2007-12-27 2009-08-06 Toshiba Corp 不揮発性半導体記憶装置及びその自動テスト方法
WO2009098776A1 (ja) * 2008-02-08 2009-08-13 Fujitsu Limited バックアップ方法、ディスクアレイ装置及びコントローラ
JP2009217603A (ja) * 2008-03-11 2009-09-24 Toshiba Corp メモリシステム
JP2010500699A (ja) * 2006-08-31 2010-01-07 インテル・コーポレーション メモリデバイス内のセクタごとに許容できるビットエラー
JP2010198657A (ja) * 2009-02-23 2010-09-09 Oki Semiconductor Co Ltd メモリ装置
JP2010211912A (ja) * 2003-06-17 2010-09-24 Ramot At Tel Aviv University Ltd フラッシュメモリの信頼性増強方法
US7962838B2 (en) 2008-10-31 2011-06-14 Kabushiki Kaisha Toshiba Memory device with an ECC system
US8078941B2 (en) 2004-11-30 2011-12-13 Kabushiki Kaisha Toshiba Memory system, memory system controller, and a data processing method in a host apparatus
JP2012069180A (ja) * 2010-09-21 2012-04-05 Toshiba Corp 半導体記憶装置
JP4933268B2 (ja) * 2003-12-31 2012-05-16 サンディスク コーポレイション フラッシュメモリシステムの起動動作
US8468434B2 (en) 2010-02-12 2013-06-18 Kabushiki Kaisha Toshiba Error detection and correction system including a syndrome element calculating unit
US8856613B2 (en) 2010-09-22 2014-10-07 Kabushiki Kaisha Toshiba Semiconductor storage device, memory control device, and control method of semiconductor memory
US8910017B2 (en) 2012-07-02 2014-12-09 Sandisk Technologies Inc. Flash memory with random partition
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JP2015212992A (ja) * 2014-05-01 2015-11-26 株式会社東芝 半導体記憶装置

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JP2003059276A (ja) * 2001-08-08 2003-02-28 Mitsubishi Electric Corp 不揮発性半導体記憶装置
JP4059472B2 (ja) * 2001-08-09 2008-03-12 株式会社ルネサステクノロジ メモリカード及びメモリコントローラ
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US6917542B2 (en) * 2003-07-29 2005-07-12 Sandisk Corporation Detecting over programmed memory
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TWI307019B (en) * 2003-12-05 2009-03-01 Hon Hai Prec Ind Co Ltd A system and method for ensuring completeness of data
JP4357331B2 (ja) * 2004-03-24 2009-11-04 東芝メモリシステムズ株式会社 マイクロプロセッサブートアップ制御装置、及び情報処理システム
JP4135680B2 (ja) * 2004-05-31 2008-08-20 ソニー株式会社 半導体記憶装置および信号処理システム
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