HK1035030A1 - Spring probe - Google Patents

Spring probe

Info

Publication number
HK1035030A1
HK1035030A1 HK01105237A HK01105237A HK1035030A1 HK 1035030 A1 HK1035030 A1 HK 1035030A1 HK 01105237 A HK01105237 A HK 01105237A HK 01105237 A HK01105237 A HK 01105237A HK 1035030 A1 HK1035030 A1 HK 1035030A1
Authority
HK
Hong Kong
Prior art keywords
tip
contact
section
spring probe
component
Prior art date
Application number
HK01105237A
Other languages
English (en)
Inventor
Gordon A Vinther
Scott D Chabineau
Charles J Johnston
Original Assignee
Capital Formation Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Capital Formation Inc filed Critical Capital Formation Inc
Publication of HK1035030A1 publication Critical patent/HK1035030A1/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Ultra Sonic Daignosis Equipment (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Cable Accessories (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Springs (AREA)
  • Measurement Of The Respiration, Hearing Ability, Form, And Blood Characteristics Of Living Organisms (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
HK01105237A 1999-02-18 2001-07-27 Spring probe HK1035030A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/253,320 US6396293B1 (en) 1999-02-18 1999-02-18 Self-closing spring probe

Publications (1)

Publication Number Publication Date
HK1035030A1 true HK1035030A1 (en) 2001-11-09

Family

ID=22959787

Family Applications (4)

Application Number Title Priority Date Filing Date
HK01101340A HK1030455A1 (en) 1999-02-18 2001-02-23 Spring probe
HK01104425A HK1033976A1 (en) 1999-02-18 2001-06-27 Spring probe
HK01104426A HK1033977A1 (en) 1999-02-18 2001-06-27 Spring probe assemblies
HK01105237A HK1035030A1 (en) 1999-02-18 2001-07-27 Spring probe

Family Applications Before (3)

Application Number Title Priority Date Filing Date
HK01101340A HK1030455A1 (en) 1999-02-18 2001-02-23 Spring probe
HK01104425A HK1033976A1 (en) 1999-02-18 2001-06-27 Spring probe
HK01104426A HK1033977A1 (en) 1999-02-18 2001-06-27 Spring probe assemblies

Country Status (8)

Country Link
US (1) US6396293B1 (xx)
EP (2) EP1510827B1 (xx)
JP (1) JP3210645B2 (xx)
AT (2) ATE322691T1 (xx)
DE (2) DE69930717T2 (xx)
GB (1) GB2347023B (xx)
HK (4) HK1030455A1 (xx)
TW (1) TW528871B (xx)

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US7862391B2 (en) * 2007-09-18 2011-01-04 Delaware Capital Formation, Inc. Spring contact assembly
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JP5291585B2 (ja) * 2008-11-07 2013-09-18 株式会社日本マイクロニクス 接触子及び電気的接続装置
JP4900843B2 (ja) 2008-12-26 2012-03-21 山一電機株式会社 半導体装置用電気接続装置及びそれに使用されるコンタクト
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US20130002285A1 (en) 2010-03-10 2013-01-03 Johnstech International Corporation Electrically Conductive Pins For Microcircuit Tester
JP5361518B2 (ja) * 2009-04-27 2013-12-04 株式会社ヨコオ コンタクトプローブ及びソケット
JPWO2011096067A1 (ja) * 2010-02-05 2013-06-10 株式会社日本マイクロニクス 接触子及び電気的接続装置
KR101149758B1 (ko) 2010-06-30 2012-07-11 리노공업주식회사 프로브
US9007082B2 (en) 2010-09-07 2015-04-14 Johnstech International Corporation Electrically conductive pins for microcircuit tester
TWI534432B (zh) * 2010-09-07 2016-05-21 瓊斯科技國際公司 用於微電路測試器之電氣傳導針腳
CN102466740A (zh) * 2010-11-12 2012-05-23 金英杰 半导体开尔文测试探针
JPWO2012067126A1 (ja) * 2010-11-17 2014-05-12 日本発條株式会社 コンタクトプローブおよびプローブユニット
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JP5782261B2 (ja) 2011-01-17 2015-09-24 株式会社ヨコオ ソケット
JP5097968B1 (ja) * 2011-08-02 2012-12-12 株式会社クローバーテクノロジー 異方導電性部材
JP6009544B2 (ja) * 2012-04-17 2016-10-19 ユニテクノ株式会社 ケルビンコンタクトプローブおよびそれを備えたケルビン検査治具
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KR101439343B1 (ko) * 2013-04-18 2014-09-16 주식회사 아이에스시 포고핀용 탐침부재
JP2015004614A (ja) * 2013-06-21 2015-01-08 株式会社ミタカ コンタクトプローブ
CN106574937B (zh) * 2014-08-08 2020-06-23 日本发条株式会社 连接端子
KR101591013B1 (ko) * 2014-09-29 2016-02-03 (주) 네스텍코리아 셀프결합형 프로브 핀
DE102015102031B4 (de) * 2015-02-12 2017-12-14 Ptr Messtechnik Gmbh Verfahren zur Montage eines eine Hülse, einen Kolben mit Kolbenkopf und eine Feder aufweisenden Bauteiles sowie Bauteil
KR101785605B1 (ko) * 2015-09-24 2017-10-17 (주)엠투엔 상호 접속 구조체 및 이를 포함하는 프로브 카드
KR101785591B1 (ko) * 2015-09-24 2017-10-17 (주)엠투엔 상호 접속 구조체 및 이를 포함하는 프로브 카드
JP6556612B2 (ja) * 2015-12-04 2019-08-07 ルネサスエレクトロニクス株式会社 半導体装置の製造方法
JP6837283B2 (ja) * 2016-02-29 2021-03-03 株式会社ヨコオ ソケット
HUP1700051A2 (hu) 2017-02-02 2018-08-28 Equip Test Kft Kontaktáló eszköz, fejegység ahhoz, valamint eljárások kontaktáló eszköz és fejegység elõállítására
JP6892277B2 (ja) * 2017-02-10 2021-06-23 株式会社日本マイクロニクス プローブ及び電気的接続装置
JP6969929B2 (ja) * 2017-08-24 2021-11-24 株式会社日本マイクロニクス プローブ及びその製造方法
JP6889067B2 (ja) * 2017-08-24 2021-06-18 株式会社日本マイクロニクス 電気的接続装置
JP7141796B2 (ja) 2018-09-26 2022-09-26 株式会社エンプラス コンタクトピン及びソケット
JP7274853B2 (ja) * 2018-12-03 2023-05-17 株式会社エンプラス コンタクトピンおよびソケット
JP6837513B2 (ja) * 2019-05-07 2021-03-03 株式会社ヨコオ ソケット
JP6923821B2 (ja) * 2019-09-06 2021-08-25 山一電機株式会社 コンタクトプローブ及びこれを備えた検査用ソケット
JP7136362B2 (ja) * 2019-10-04 2022-09-13 株式会社村田製作所 プローブ
DE102021120146A1 (de) 2021-08-03 2023-02-09 F I X T E S T Prüfmittelbau GmbH Kontaktstift
CN115877169A (zh) * 2021-09-27 2023-03-31 史密斯互连美洲公司 用于半导体集成电路的具有阶梯环的测试插座和探针

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Also Published As

Publication number Publication date
GB2347023A (en) 2000-08-23
EP1510827B1 (en) 2007-08-15
ATE322691T1 (de) 2006-04-15
DE69936893T2 (de) 2008-05-15
JP3210645B2 (ja) 2001-09-17
HK1033977A1 (en) 2001-10-05
EP1037055B1 (en) 2006-04-05
GB9905858D0 (en) 1999-05-05
HK1030455A1 (en) 2001-05-04
DE69930717D1 (de) 2006-05-18
HK1033976A1 (en) 2001-10-05
JP2000241447A (ja) 2000-09-08
GB2347023B (en) 2001-07-25
TW528871B (en) 2003-04-21
ATE370419T1 (de) 2007-09-15
DE69936893D1 (de) 2007-09-27
US6396293B1 (en) 2002-05-28
EP1037055A3 (en) 2001-03-28
DE69930717T2 (de) 2007-01-25
EP1510827A1 (en) 2005-03-02
EP1037055A2 (en) 2000-09-20

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Legal Events

Date Code Title Description
PF Patent in force
PE Patent expired

Effective date: 20190315