HK1030455A1 - Spring probe - Google Patents
Spring probeInfo
- Publication number
- HK1030455A1 HK1030455A1 HK01101340A HK01101340A HK1030455A1 HK 1030455 A1 HK1030455 A1 HK 1030455A1 HK 01101340 A HK01101340 A HK 01101340A HK 01101340 A HK01101340 A HK 01101340A HK 1030455 A1 HK1030455 A1 HK 1030455A1
- Authority
- HK
- Hong Kong
- Prior art keywords
- tip
- contact
- section
- spring probe
- component
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06722—Spring-loaded
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
- Ultra Sonic Daignosis Equipment (AREA)
- Geophysics And Detection Of Objects (AREA)
- Springs (AREA)
- Cable Accessories (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measurement Of The Respiration, Hearing Ability, Form, And Blood Characteristics Of Living Organisms (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/253,320 US6396293B1 (en) | 1999-02-18 | 1999-02-18 | Self-closing spring probe |
Publications (1)
Publication Number | Publication Date |
---|---|
HK1030455A1 true HK1030455A1 (en) | 2001-05-04 |
Family
ID=22959787
Family Applications (4)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK01101340A HK1030455A1 (en) | 1999-02-18 | 2001-02-23 | Spring probe |
HK01104425A HK1033976A1 (en) | 1999-02-18 | 2001-06-27 | Spring probe |
HK01104426A HK1033977A1 (en) | 1999-02-18 | 2001-06-27 | Spring probe assemblies |
HK01105237A HK1035030A1 (en) | 1999-02-18 | 2001-07-27 | Spring probe |
Family Applications After (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK01104425A HK1033976A1 (en) | 1999-02-18 | 2001-06-27 | Spring probe |
HK01104426A HK1033977A1 (en) | 1999-02-18 | 2001-06-27 | Spring probe assemblies |
HK01105237A HK1035030A1 (en) | 1999-02-18 | 2001-07-27 | Spring probe |
Country Status (8)
Country | Link |
---|---|
US (1) | US6396293B1 (xx) |
EP (2) | EP1510827B1 (xx) |
JP (1) | JP3210645B2 (xx) |
AT (2) | ATE322691T1 (xx) |
DE (2) | DE69936893T2 (xx) |
GB (1) | GB2347023B (xx) |
HK (4) | HK1030455A1 (xx) |
TW (1) | TW528871B (xx) |
Families Citing this family (64)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4060919B2 (ja) * | 1997-11-28 | 2008-03-12 | 富士通株式会社 | 電気的接続装置、接触子製造方法、及び半導体試験方法 |
JP4450397B2 (ja) * | 1999-06-03 | 2010-04-14 | 有限会社清田製作所 | 両端摺動型コンタクトプローブ |
US20040097996A1 (en) | 1999-10-05 | 2004-05-20 | Omnisonics Medical Technologies, Inc. | Apparatus and method of removing occlusions using an ultrasonic medical device operating in a transverse mode |
WO2001096883A2 (en) * | 2000-06-16 | 2001-12-20 | Nhk Spring Co., Ltd. | Microcontactor probe and electric probe unit |
JP4521106B2 (ja) * | 2000-09-28 | 2010-08-11 | 日本発條株式会社 | 可動ガイドプレート付き導電性接触子 |
JP2002159913A (ja) * | 2000-11-22 | 2002-06-04 | Shin Etsu Polymer Co Ltd | コネクタ付きバイブレータ及びその接続構造 |
JP3767810B2 (ja) * | 2001-04-27 | 2006-04-19 | 株式会社ヨコオ | スプリングコネクタ |
JP2002350463A (ja) * | 2001-05-23 | 2002-12-04 | Sanyu Kogyo Kk | コンタクトプローブ |
ATE371196T1 (de) * | 2002-03-05 | 2007-09-15 | Rika Denshi America Inc | Vorrichtung für eine schnittstelle zwischen elektronischen gehäusen und testgeräten |
KR100840834B1 (ko) * | 2002-06-05 | 2008-06-23 | 이노우에 쇼지 가부시키가이샤 | 프린트 배선판의 검사지그 |
US20040210140A1 (en) * | 2003-04-15 | 2004-10-21 | Omnisonics Medical Technologies, Inc. | Apparatus and method for preshaped ultrasonic probe |
JP4695337B2 (ja) | 2004-02-04 | 2011-06-08 | 日本発條株式会社 | 導電性接触子および導電性接触子ユニット |
US7794414B2 (en) | 2004-02-09 | 2010-09-14 | Emigrant Bank, N.A. | Apparatus and method for an ultrasonic medical device operating in torsional and transverse modes |
KR100608232B1 (ko) * | 2004-05-17 | 2006-08-03 | 리노공업주식회사 | 대전류용 프로브 |
US7315176B2 (en) * | 2004-06-16 | 2008-01-01 | Rika Denshi America, Inc. | Electrical test probes, methods of making, and methods of using |
KR100584225B1 (ko) * | 2004-10-06 | 2006-05-29 | 황동원 | 전자장치용 콘택트 |
US7256593B2 (en) * | 2005-06-10 | 2007-08-14 | Delaware Capital Formation, Inc. | Electrical contact probe with compliant internal interconnect |
US7154286B1 (en) * | 2005-06-30 | 2006-12-26 | Interconnect Devices, Inc. | Dual tapered spring probe |
US7392946B2 (en) * | 2006-06-12 | 2008-07-01 | Sony Ericsson Mobile Communications Ab | Mobile radio terminal having a multiple form factor memory card reader |
US20080143367A1 (en) * | 2006-12-14 | 2008-06-19 | Scott Chabineau-Lovgren | Compliant electrical contact having maximized the internal spring volume |
KR100769891B1 (ko) * | 2007-01-25 | 2007-10-24 | 리노공업주식회사 | 검사용 탐침 장치 및 이를 이용한 검사용 소켓 |
US20100123476A1 (en) * | 2007-04-27 | 2010-05-20 | Nhk Spring Co., Ltd. | Conductive contact |
US7521949B2 (en) * | 2007-05-07 | 2009-04-21 | Intel Corporation | Test pin, method of manufacturing same, and system containing same |
US7862391B2 (en) | 2007-09-18 | 2011-01-04 | Delaware Capital Formation, Inc. | Spring contact assembly |
US8410948B2 (en) * | 2008-05-12 | 2013-04-02 | John Vander Horst | Recreational vehicle holding tank sensor probe |
JPWO2010016608A1 (ja) * | 2008-08-08 | 2012-01-26 | 日本発條株式会社 | ワーク部材、電気接点部材、コンタクトプローブおよび電気接点部材の製造方法 |
TWM354896U (en) * | 2008-09-30 | 2009-04-11 | Hon Hai Prec Ind Co Ltd | Terminal of electrical connector |
JP5291585B2 (ja) * | 2008-11-07 | 2013-09-18 | 株式会社日本マイクロニクス | 接触子及び電気的接続装置 |
JP4900843B2 (ja) | 2008-12-26 | 2012-03-21 | 山一電機株式会社 | 半導体装置用電気接続装置及びそれに使用されるコンタクト |
CN102422726B (zh) * | 2009-03-10 | 2015-07-01 | 约翰国际有限公司 | 用于微电路测试器的导电引脚 |
US20130002285A1 (en) | 2010-03-10 | 2013-01-03 | Johnstech International Corporation | Electrically Conductive Pins For Microcircuit Tester |
JP5361518B2 (ja) * | 2009-04-27 | 2013-12-04 | 株式会社ヨコオ | コンタクトプローブ及びソケット |
US8721372B2 (en) | 2010-02-05 | 2014-05-13 | Kabushiki Kaisha Nihon Micronics | Contact and electrical connecting apparatus |
KR101149758B1 (ko) * | 2010-06-30 | 2012-07-11 | 리노공업주식회사 | 프로브 |
TWI534432B (zh) | 2010-09-07 | 2016-05-21 | 瓊斯科技國際公司 | 用於微電路測試器之電氣傳導針腳 |
US9007082B2 (en) | 2010-09-07 | 2015-04-14 | Johnstech International Corporation | Electrically conductive pins for microcircuit tester |
CN102466740A (zh) * | 2010-11-12 | 2012-05-23 | 金英杰 | 半导体开尔文测试探针 |
WO2012067126A1 (ja) * | 2010-11-17 | 2012-05-24 | 日本発條株式会社 | コンタクトプローブおよびプローブユニット |
JP2012112709A (ja) * | 2010-11-22 | 2012-06-14 | Unitechno Inc | ケルビンコンタクトプローブおよびそれを備えたケルビン検査治具 |
JP5782261B2 (ja) | 2011-01-17 | 2015-09-24 | 株式会社ヨコオ | ソケット |
JP5097968B1 (ja) * | 2011-08-02 | 2012-12-12 | 株式会社クローバーテクノロジー | 異方導電性部材 |
JP6009544B2 (ja) * | 2012-04-17 | 2016-10-19 | ユニテクノ株式会社 | ケルビンコンタクトプローブおよびそれを備えたケルビン検査治具 |
US9128121B2 (en) * | 2012-09-28 | 2015-09-08 | Intel Corporation | Mechanism for facilitating a dynamic electro-mechanical interconnect having a cavity for embedding electrical components and isolating electrical paths |
KR101439342B1 (ko) | 2013-04-18 | 2014-09-16 | 주식회사 아이에스시 | 포고핀용 탐침부재 |
KR101439343B1 (ko) * | 2013-04-18 | 2014-09-16 | 주식회사 아이에스시 | 포고핀용 탐침부재 |
JP2015004614A (ja) * | 2013-06-21 | 2015-01-08 | 株式会社ミタカ | コンタクトプローブ |
EP3179255B1 (en) * | 2014-08-08 | 2022-12-21 | NHK Spring Co., Ltd. | Connecting terminal |
KR101591013B1 (ko) * | 2014-09-29 | 2016-02-03 | (주) 네스텍코리아 | 셀프결합형 프로브 핀 |
DE102015102031B4 (de) * | 2015-02-12 | 2017-12-14 | Ptr Messtechnik Gmbh | Verfahren zur Montage eines eine Hülse, einen Kolben mit Kolbenkopf und eine Feder aufweisenden Bauteiles sowie Bauteil |
KR101785605B1 (ko) * | 2015-09-24 | 2017-10-17 | (주)엠투엔 | 상호 접속 구조체 및 이를 포함하는 프로브 카드 |
KR101785591B1 (ko) * | 2015-09-24 | 2017-10-17 | (주)엠투엔 | 상호 접속 구조체 및 이를 포함하는 프로브 카드 |
JP6556612B2 (ja) * | 2015-12-04 | 2019-08-07 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法 |
JP6837283B2 (ja) * | 2016-02-29 | 2021-03-03 | 株式会社ヨコオ | ソケット |
HUP1700051A2 (hu) | 2017-02-02 | 2018-08-28 | Equip Test Kft | Kontaktáló eszköz, fejegység ahhoz, valamint eljárások kontaktáló eszköz és fejegység elõállítására |
JP6892277B2 (ja) | 2017-02-10 | 2021-06-23 | 株式会社日本マイクロニクス | プローブ及び電気的接続装置 |
JP6889067B2 (ja) * | 2017-08-24 | 2021-06-18 | 株式会社日本マイクロニクス | 電気的接続装置 |
JP6969929B2 (ja) * | 2017-08-24 | 2021-11-24 | 株式会社日本マイクロニクス | プローブ及びその製造方法 |
JP7141796B2 (ja) * | 2018-09-26 | 2022-09-26 | 株式会社エンプラス | コンタクトピン及びソケット |
JP7274853B2 (ja) * | 2018-12-03 | 2023-05-17 | 株式会社エンプラス | コンタクトピンおよびソケット |
JP6837513B2 (ja) * | 2019-05-07 | 2021-03-03 | 株式会社ヨコオ | ソケット |
JP6923821B2 (ja) * | 2019-09-06 | 2021-08-25 | 山一電機株式会社 | コンタクトプローブ及びこれを備えた検査用ソケット |
WO2021065702A1 (ja) * | 2019-10-04 | 2021-04-08 | 株式会社村田製作所 | プローブ |
DE102021120146A1 (de) | 2021-08-03 | 2023-02-09 | F I X T E S T Prüfmittelbau GmbH | Kontaktstift |
CN115877169A (zh) * | 2021-09-27 | 2023-03-31 | 史密斯互连美洲公司 | 用于半导体集成电路的具有阶梯环的测试插座和探针 |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1324053A (en) | 1971-09-09 | 1973-07-18 | Carr V | Electrical contact probe |
US3754731A (en) * | 1972-01-18 | 1973-08-28 | Halkey Roberts Corp | Inflation manifold valve and flange assembly |
FR2224757A1 (en) | 1973-04-03 | 1974-10-31 | Cit Alcatel | Probe for printed circuit boards - mounted on subsidiary board in desired spatial arrangement for testing |
US4438397A (en) * | 1979-12-26 | 1984-03-20 | Teradyne, Inc. | Test pin |
US4740746A (en) | 1984-11-13 | 1988-04-26 | Tektronix, Inc. | Controlled impedance microcircuit probe |
JPS6212875A (ja) | 1985-07-10 | 1987-01-21 | Mitsubishi Electric Corp | デイジタル保護継電装置の試験装置 |
US4701700A (en) | 1985-12-02 | 1987-10-20 | Jenkins Jack E | Captivated, pre-loaded spring means for vacuum displaced circuit board testing |
US4897043A (en) * | 1986-06-23 | 1990-01-30 | Feinmetall Gmbh | Resilient contact pin |
US4935695A (en) | 1988-07-13 | 1990-06-19 | Hewlett-Packard Company | Board alignment system |
US4904213A (en) | 1989-04-06 | 1990-02-27 | Motorola, Inc. | Low impedance electric connector |
EP0462706A1 (en) | 1990-06-11 | 1991-12-27 | ITT INDUSTRIES, INC. (a Delaware corporation) | Contact assembly |
US5174763A (en) | 1990-06-11 | 1992-12-29 | Itt Corporation | Contact assembly |
US5227718A (en) * | 1992-03-10 | 1993-07-13 | Virginia Panel Corporation | Double-headed spring contact probe assembly |
JP2532331B2 (ja) | 1992-11-09 | 1996-09-11 | 日本発条株式会社 | 導電性接触子 |
EP0616394A1 (en) | 1993-03-16 | 1994-09-21 | Hewlett-Packard Company | Method and system for producing electrically interconnected circuits |
US5746606A (en) * | 1996-09-30 | 1998-05-05 | Hughes Electronics | Spring loaded contact device and rotary connector |
DE69700120T2 (de) * | 1997-02-04 | 1999-10-28 | Durtal S.A., Delemont | Federkontaktelement |
US6104205A (en) * | 1998-02-26 | 2000-08-15 | Interconnect Devices, Inc. | Probe with tab retainer |
-
1999
- 1999-02-18 US US09/253,320 patent/US6396293B1/en not_active Expired - Lifetime
- 1999-03-16 GB GB9905858A patent/GB2347023B/en not_active Expired - Lifetime
- 1999-04-03 TW TW088105387A patent/TW528871B/zh not_active IP Right Cessation
- 1999-04-13 EP EP04078167A patent/EP1510827B1/en not_active Expired - Lifetime
- 1999-04-13 DE DE69936893T patent/DE69936893T2/de not_active Expired - Lifetime
- 1999-04-13 AT AT99302847T patent/ATE322691T1/de not_active IP Right Cessation
- 1999-04-13 DE DE69930717T patent/DE69930717T2/de not_active Expired - Lifetime
- 1999-04-13 AT AT04078167T patent/ATE370419T1/de not_active IP Right Cessation
- 1999-04-13 EP EP99302847A patent/EP1037055B1/en not_active Expired - Lifetime
- 1999-06-07 JP JP15944299A patent/JP3210645B2/ja not_active Expired - Lifetime
-
2001
- 2001-02-23 HK HK01101340A patent/HK1030455A1/xx not_active IP Right Cessation
- 2001-06-27 HK HK01104425A patent/HK1033976A1/xx not_active IP Right Cessation
- 2001-06-27 HK HK01104426A patent/HK1033977A1/xx not_active IP Right Cessation
- 2001-07-27 HK HK01105237A patent/HK1035030A1/xx not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
JP3210645B2 (ja) | 2001-09-17 |
DE69930717T2 (de) | 2007-01-25 |
HK1033977A1 (en) | 2001-10-05 |
US6396293B1 (en) | 2002-05-28 |
GB2347023B (en) | 2001-07-25 |
TW528871B (en) | 2003-04-21 |
DE69936893T2 (de) | 2008-05-15 |
EP1510827B1 (en) | 2007-08-15 |
EP1037055A3 (en) | 2001-03-28 |
HK1033976A1 (en) | 2001-10-05 |
HK1035030A1 (en) | 2001-11-09 |
ATE370419T1 (de) | 2007-09-15 |
ATE322691T1 (de) | 2006-04-15 |
GB9905858D0 (en) | 1999-05-05 |
DE69936893D1 (de) | 2007-09-27 |
EP1510827A1 (en) | 2005-03-02 |
GB2347023A (en) | 2000-08-23 |
EP1037055A2 (en) | 2000-09-20 |
DE69930717D1 (de) | 2006-05-18 |
EP1037055B1 (en) | 2006-04-05 |
JP2000241447A (ja) | 2000-09-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PF | Patent in force | ||
PE | Patent expired |
Effective date: 20190315 |