ATE370419T1 - Federsensor - Google Patents

Federsensor

Info

Publication number
ATE370419T1
ATE370419T1 AT04078167T AT04078167T ATE370419T1 AT E370419 T1 ATE370419 T1 AT E370419T1 AT 04078167 T AT04078167 T AT 04078167T AT 04078167 T AT04078167 T AT 04078167T AT E370419 T1 ATE370419 T1 AT E370419T1
Authority
AT
Austria
Prior art keywords
tip
contact
section
component
flange
Prior art date
Application number
AT04078167T
Other languages
English (en)
Inventor
Gordon A Vinther
Scott D Chabineau
Charles J Johnston
Original Assignee
Capital Formation Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Capital Formation Inc filed Critical Capital Formation Inc
Application granted granted Critical
Publication of ATE370419T1 publication Critical patent/ATE370419T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Ultra Sonic Daignosis Equipment (AREA)
  • Measurement Of The Respiration, Hearing Ability, Form, And Blood Characteristics Of Living Organisms (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Springs (AREA)
  • Cable Accessories (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
AT04078167T 1999-02-18 1999-04-13 Federsensor ATE370419T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/253,320 US6396293B1 (en) 1999-02-18 1999-02-18 Self-closing spring probe

Publications (1)

Publication Number Publication Date
ATE370419T1 true ATE370419T1 (de) 2007-09-15

Family

ID=22959787

Family Applications (2)

Application Number Title Priority Date Filing Date
AT99302847T ATE322691T1 (de) 1999-02-18 1999-04-13 Federsensor
AT04078167T ATE370419T1 (de) 1999-02-18 1999-04-13 Federsensor

Family Applications Before (1)

Application Number Title Priority Date Filing Date
AT99302847T ATE322691T1 (de) 1999-02-18 1999-04-13 Federsensor

Country Status (7)

Country Link
US (1) US6396293B1 (de)
EP (2) EP1510827B1 (de)
JP (1) JP3210645B2 (de)
AT (2) ATE322691T1 (de)
DE (2) DE69930717T2 (de)
GB (1) GB2347023B (de)
TW (1) TW528871B (de)

Families Citing this family (68)

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JP3626609B2 (ja) 1998-10-30 2005-03-09 日本電気株式会社 マルチプロセッサシステム
JP4450397B2 (ja) * 1999-06-03 2010-04-14 有限会社清田製作所 両端摺動型コンタクトプローブ
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US6524251B2 (en) 1999-10-05 2003-02-25 Omnisonics Medical Technologies, Inc. Ultrasonic device for tissue ablation and sheath for use therewith
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JP4521106B2 (ja) * 2000-09-28 2010-08-11 日本発條株式会社 可動ガイドプレート付き導電性接触子
JP2002159913A (ja) * 2000-11-22 2002-06-04 Shin Etsu Polymer Co Ltd コネクタ付きバイブレータ及びその接続構造
JP3767810B2 (ja) * 2001-04-27 2006-04-19 株式会社ヨコオ スプリングコネクタ
JP2002350463A (ja) * 2001-05-23 2002-12-04 Sanyu Kogyo Kk コンタクトプローブ
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EP1889080A2 (de) * 2005-06-10 2008-02-20 Delaware Capital Formation, Inc. Elektrische kontaktsonde mit passendem internem verbindungsanschluss
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JP5713559B2 (ja) * 2007-04-27 2015-05-07 日本発條株式会社 導電性接触子
US7521949B2 (en) * 2007-05-07 2009-04-21 Intel Corporation Test pin, method of manufacturing same, and system containing same
US7862391B2 (en) 2007-09-18 2011-01-04 Delaware Capital Formation, Inc. Spring contact assembly
US8410948B2 (en) * 2008-05-12 2013-04-02 John Vander Horst Recreational vehicle holding tank sensor probe
CN102112885A (zh) * 2008-08-08 2011-06-29 日本发条株式会社 电接点部件及接触式探头
TWM354896U (en) * 2008-09-30 2009-04-11 Hon Hai Prec Ind Co Ltd Terminal of electrical connector
JP5291585B2 (ja) * 2008-11-07 2013-09-18 株式会社日本マイクロニクス 接触子及び電気的接続装置
JP4900843B2 (ja) 2008-12-26 2012-03-21 山一電機株式会社 半導体装置用電気接続装置及びそれに使用されるコンタクト
JP2012520461A (ja) * 2009-03-10 2012-09-06 ジョンステック インターナショナル コーポレーション マイクロ回路テスタ用の導電ピン
US20130002285A1 (en) 2010-03-10 2013-01-03 Johnstech International Corporation Electrically Conductive Pins For Microcircuit Tester
JP5361518B2 (ja) * 2009-04-27 2013-12-04 株式会社ヨコオ コンタクトプローブ及びソケット
JPWO2011096067A1 (ja) * 2010-02-05 2013-06-10 株式会社日本マイクロニクス 接触子及び電気的接続装置
KR101149758B1 (ko) 2010-06-30 2012-07-11 리노공업주식회사 프로브
TWI534432B (zh) * 2010-09-07 2016-05-21 瓊斯科技國際公司 用於微電路測試器之電氣傳導針腳
US9007082B2 (en) 2010-09-07 2015-04-14 Johnstech International Corporation Electrically conductive pins for microcircuit tester
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JPWO2012067126A1 (ja) * 2010-11-17 2014-05-12 日本発條株式会社 コンタクトプローブおよびプローブユニット
JP2012112709A (ja) * 2010-11-22 2012-06-14 Unitechno Inc ケルビンコンタクトプローブおよびそれを備えたケルビン検査治具
JP5782261B2 (ja) 2011-01-17 2015-09-24 株式会社ヨコオ ソケット
JP5097968B1 (ja) * 2011-08-02 2012-12-12 株式会社クローバーテクノロジー 異方導電性部材
JP6009544B2 (ja) * 2012-04-17 2016-10-19 ユニテクノ株式会社 ケルビンコンタクトプローブおよびそれを備えたケルビン検査治具
US9128121B2 (en) * 2012-09-28 2015-09-08 Intel Corporation Mechanism for facilitating a dynamic electro-mechanical interconnect having a cavity for embedding electrical components and isolating electrical paths
KR101439343B1 (ko) * 2013-04-18 2014-09-16 주식회사 아이에스시 포고핀용 탐침부재
KR101439342B1 (ko) 2013-04-18 2014-09-16 주식회사 아이에스시 포고핀용 탐침부재
JP2015004614A (ja) * 2013-06-21 2015-01-08 株式会社ミタカ コンタクトプローブ
JP6231690B2 (ja) * 2014-08-08 2017-11-15 日本発條株式会社 接続端子
KR101591013B1 (ko) * 2014-09-29 2016-02-03 (주) 네스텍코리아 셀프결합형 프로브 핀
DE102015102031B4 (de) * 2015-02-12 2017-12-14 Ptr Messtechnik Gmbh Verfahren zur Montage eines eine Hülse, einen Kolben mit Kolbenkopf und eine Feder aufweisenden Bauteiles sowie Bauteil
KR101785591B1 (ko) * 2015-09-24 2017-10-17 (주)엠투엔 상호 접속 구조체 및 이를 포함하는 프로브 카드
KR101785605B1 (ko) * 2015-09-24 2017-10-17 (주)엠투엔 상호 접속 구조체 및 이를 포함하는 프로브 카드
JP6556612B2 (ja) * 2015-12-04 2019-08-07 ルネサスエレクトロニクス株式会社 半導体装置の製造方法
JP6837283B2 (ja) 2016-02-29 2021-03-03 株式会社ヨコオ ソケット
HUP1700051A2 (hu) 2017-02-02 2018-08-28 Equip Test Kft Kontaktáló eszköz, fejegység ahhoz, valamint eljárások kontaktáló eszköz és fejegység elõállítására
JP6892277B2 (ja) * 2017-02-10 2021-06-23 株式会社日本マイクロニクス プローブ及び電気的接続装置
JP6969929B2 (ja) * 2017-08-24 2021-11-24 株式会社日本マイクロニクス プローブ及びその製造方法
JP6889067B2 (ja) * 2017-08-24 2021-06-18 株式会社日本マイクロニクス 電気的接続装置
JP7141796B2 (ja) * 2018-09-26 2022-09-26 株式会社エンプラス コンタクトピン及びソケット
JP7274853B2 (ja) * 2018-12-03 2023-05-17 株式会社エンプラス コンタクトピンおよびソケット
JP6837513B2 (ja) * 2019-05-07 2021-03-03 株式会社ヨコオ ソケット
JP6923821B2 (ja) * 2019-09-06 2021-08-25 山一電機株式会社 コンタクトプローブ及びこれを備えた検査用ソケット
JP7136362B2 (ja) * 2019-10-04 2022-09-13 株式会社村田製作所 プローブ
DE102021120146A1 (de) 2021-08-03 2023-02-09 F I X T E S T Prüfmittelbau GmbH Kontaktstift
CN115877169A (zh) * 2021-09-27 2023-03-31 史密斯互连美洲公司 用于半导体集成电路的具有阶梯环的测试插座和探针
USD1090440S1 (en) 2023-01-12 2025-08-26 Johnstech International Corporation Spring probe contact assembly

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Also Published As

Publication number Publication date
EP1037055A2 (de) 2000-09-20
EP1510827B1 (de) 2007-08-15
US6396293B1 (en) 2002-05-28
EP1037055B1 (de) 2006-04-05
JP2000241447A (ja) 2000-09-08
TW528871B (en) 2003-04-21
DE69936893D1 (de) 2007-09-27
HK1033976A1 (zh) 2001-10-05
JP3210645B2 (ja) 2001-09-17
HK1030455A1 (en) 2001-05-04
HK1035030A1 (en) 2001-11-09
GB2347023A (en) 2000-08-23
DE69930717D1 (de) 2006-05-18
ATE322691T1 (de) 2006-04-15
HK1033977A1 (en) 2001-10-05
EP1510827A1 (de) 2005-03-02
DE69936893T2 (de) 2008-05-15
GB2347023B (en) 2001-07-25
EP1037055A3 (de) 2001-03-28
GB9905858D0 (en) 1999-05-05
DE69930717T2 (de) 2007-01-25

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Legal Events

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RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties