FI117369B - Förfarande för tillverkning av en elektronikmodul - Google Patents

Förfarande för tillverkning av en elektronikmodul Download PDF

Info

Publication number
FI117369B
FI117369B FI20041524A FI20041524A FI117369B FI 117369 B FI117369 B FI 117369B FI 20041524 A FI20041524 A FI 20041524A FI 20041524 A FI20041524 A FI 20041524A FI 117369 B FI117369 B FI 117369B
Authority
FI
Finland
Prior art keywords
layer
conductor
component
film
contact
Prior art date
Application number
FI20041524A
Other languages
English (en)
Finnish (fi)
Other versions
FI20041524A0 (sv
FI20041524A (sv
Inventor
Antti Iihola
Risto Tuominen
Original Assignee
Imbera Electronics Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Imbera Electronics Oy filed Critical Imbera Electronics Oy
Priority to FI20041524A priority Critical patent/FI117369B/sv
Publication of FI20041524A0 publication Critical patent/FI20041524A0/sv
Priority to CN2005800402916A priority patent/CN101065843B/zh
Priority to US11/667,429 priority patent/US8062537B2/en
Priority to PCT/FI2005/000499 priority patent/WO2006056643A2/en
Priority to JP2007542017A priority patent/JP5160895B2/ja
Priority to KR1020077014479A priority patent/KR101101603B1/ko
Publication of FI20041524A publication Critical patent/FI20041524A/sv
Application granted granted Critical
Publication of FI117369B publication Critical patent/FI117369B/sv

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/18Printed circuits structurally associated with non-printed electric components
    • H05K1/182Printed circuits structurally associated with non-printed electric components associated with components mounted in the printed circuit board, e.g. insert mounted components [IMC]
    • H05K1/185Components encapsulated in the insulating substrate of the printed circuit or incorporated in internal layers of a multilayer circuit
    • H05K1/188Components encapsulated in the insulating substrate of the printed circuit or incorporated in internal layers of a multilayer circuit manufactured by mounting on or attaching to a structure having a conductive layer, e.g. a metal foil, such that the terminals of the component are connected to or adjacent to the conductive layer before embedding, and by using the conductive layer, which is patterned after embedding, at least partially for connecting the component
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/52Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/538Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/48Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
    • H01L21/4814Conductive parts
    • H01L21/4846Leads on or in insulating or insulated substrates, e.g. metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/52Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/538Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates
    • H01L23/5389Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates the chips being integrally enclosed by the interconnect and support structures
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/18High density interconnect [HDI] connectors; Manufacturing methods related thereto
    • H01L24/19Manufacturing methods of high density interconnect preforms
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/18High density interconnect [HDI] connectors; Manufacturing methods related thereto
    • H01L24/23Structure, shape, material or disposition of the high density interconnect connectors after the connecting process
    • H01L24/24Structure, shape, material or disposition of the high density interconnect connectors after the connecting process of an individual high density interconnect connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L24/82Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected by forming build-up interconnects at chip-level, e.g. for high density interconnects [HDI]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6835Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/04105Bonding areas formed on an encapsulation of the semiconductor or solid-state body, e.g. bonding areas on chip-scale packages
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32225Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/82Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected by forming build-up interconnects at chip-level, e.g. for high density interconnects [HDI]
    • H01L2224/82009Pre-treatment of the connector or the bonding area
    • H01L2224/8203Reshaping, e.g. forming vias
    • H01L2224/82035Reshaping, e.g. forming vias by heating means
    • H01L2224/82039Reshaping, e.g. forming vias by heating means using a laser
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/82Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected by forming build-up interconnects at chip-level, e.g. for high density interconnects [HDI]
    • H01L2224/82009Pre-treatment of the connector or the bonding area
    • H01L2224/8203Reshaping, e.g. forming vias
    • H01L2224/82047Reshaping, e.g. forming vias by mechanical means, e.g. severing, pressing, stamping
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H01L2224/8312Aligning
    • H01L2224/83121Active alignment, i.e. by apparatus steering, e.g. optical alignment using marks or sensors
    • H01L2224/83132Active alignment, i.e. by apparatus steering, e.g. optical alignment using marks or sensors using marks formed outside the semiconductor or solid-state body, i.e. "off-chip"
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/91Methods for connecting semiconductor or solid state bodies including different methods provided for in two or more of groups H01L2224/80 - H01L2224/90
    • H01L2224/92Specific sequence of method steps
    • H01L2224/921Connecting a surface with connectors of different types
    • H01L2224/9212Sequential connecting processes
    • H01L2224/92142Sequential connecting processes the first connecting process involving a layer connector
    • H01L2224/92144Sequential connecting processes the first connecting process involving a layer connector the second connecting process involving a build-up interconnect
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/498Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
    • H01L23/49827Via connections through the substrates, e.g. pins going through the substrate, coaxial cables
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01005Boron [B]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01006Carbon [C]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01013Aluminum [Al]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01029Copper [Cu]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01033Arsenic [As]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01078Platinum [Pt]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01082Lead [Pb]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/06Polymers
    • H01L2924/078Adhesive characteristics other than chemical
    • H01L2924/07802Adhesive characteristics other than chemical not being an ohmic electrical conductor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30Technical effects
    • H01L2924/35Mechanical effects
    • H01L2924/351Thermal stress
    • H01L2924/3511Warping
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/03Conductive materials
    • H05K2201/0332Structure of the conductor
    • H05K2201/0335Layered conductors or foils
    • H05K2201/0355Metal foils
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10613Details of electrical connections of non-printed components, e.g. special leads
    • H05K2201/10621Components characterised by their electrical contacts
    • H05K2201/10674Flip chip
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/40Forming printed elements for providing electric connections to or between printed circuits
    • H05K3/42Plated through-holes or plated via connections
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00Metal working
    • Y10T29/49Method of mechanical manufacture
    • Y10T29/49002Electrical device making
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00Metal working
    • Y10T29/49Method of mechanical manufacture
    • Y10T29/49002Electrical device making
    • Y10T29/49117Conductor or circuit manufacturing
    • Y10T29/49124On flat or curved insulated base, e.g., printed circuit, etc.
    • Y10T29/49126Assembling bases

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
  • Non-Metallic Protective Coatings For Printed Circuits (AREA)
  • Manufacturing Of Printed Wiring (AREA)

Claims (12)

1. Förfarande för tillverkning av en elektronikmodul, vilken innehäller ätminstone en komponent (6) med ätminstone ett kontaktomräde (7), vilket är elektriskt anslutet tili ett 5 ledarmönsterskikt (14), k ä n n e t e c k n a t av att vid förfarandet: - väljs en skiktfilm, vilken omfattar ätminstone ett ledarskikt (4) samt ett isoleringsskikt (10) pä en första yta av ledarskiktet (4), - utformas kontaktöppningar (17), vilkas inbördes position motsvarar den inbördes positionen for vaije for fästning avsedd komponents (6) kontaktomräden (7) och 10 vilka penetrerar bäde ledarskiktet (4) och isoleringsskiktet (10), - fasts efter utformningen av kontaktöppningama (17) varje komponent (6) pä ytan (6) av skiktfilmens isoleringsskikt (10) pä sä sätt anordnat, att komponentens (6) kontaktomräden (7) kommer att ligga mot motsvarande kontaktöppningar (17), - framställs ätminstone i kontaktöppningama (17) och komponentens (6) kontakt- 15 omraden (7) ledarraaterial, vilket ansluter komponenten (6) tili ledarskiktet (4), och - ledarskiktet (4) konfigureras tili ett ledarmönsterskikt (14). M· * • «M • « • i i « ♦· • ·
2. Förfarande i enlighet med patentkrav 1, kännetecknat av att före *:**: utformningen av kontaktöppningama (17): bestär skiktfilmen av ett ledarskikt (4) samt 20 ett isoleringsskikt (10) pä den första ytan av ledarskiktet (4). • v · i * • * «ta I
: 3. Förfarande i enlighet med patentkrav 1, kännetecknat av att före I utformningen av kontaktöppningama (17): omfattar skiktfilmen ett stödskikt (12) pä I den andra ytan av ledarskiktet (4). I M * 117369
4. Förfarande i enlighet med nägot av patentkraven 1-3, kännetecknat av att före utformningen av kontaktöppningama (17): innehäller skiktfilmens ledarskikt (4) väsentligen alli det ledarmaterial varav ledarmonsterskiktet (14) senare bildas.
5 5. Förfarande i enlighet med nägot av patentkraven 1-4, kännetecknat av att skiktfilmens isoleringsskikt (10) utgörs av epoxi.
6. Förfarande i enlighet med nägot av patentkraven 1-5, kännetecknat av att tjockleken av skiktfilmens isoleringsskikt (10) ligger under 10 mikrometer, lämpligen i 10 intervallet 4-7 mikrometer.
7. Förfarande i enlighet med nägot av patentkraven 1-6, kännetecknat av att komponenten fasts vid isoleringsskiktet (10) medelst isolerande lim (5). 15
8. Förfarande i enlighet med nägot av patentkraven 1-7, kännetecknat av att ·;· ledarmaterialet, som ansluter komponenten (6) tili ledarskiktet (4), framställs medelst *··« ett kemiskt och/eller elektrokemiskt metalliseringsförfarande. • e * « · • · · ··· · * » ββ·ϊ·
9. Förfarande i enlighet med nägot av patentkraven 1-8, kännetecknat av att 20 ledarmaterialet, som ansluter komponenten (6) tili ledarskiktet (4), utformas genom att fylla kontaktöppningama (17) med ledarmaterial, t.ex. ledande pasta. • i « e t · » ·#· ··# • ψ *99 9 : V.
10. Förfarande i enlighet med nägot av patentkraven 1-9, kännetecknat av att i • * . * * ·; elektronikmodulen tillverkas ätminstone ett andra ledarmönsterskikt (19). at* ·:··: 25 99 9 9 9 9 9 9 * t 117369
11. Förfarande i enlighet med nigot av patentkraven 1-10, kännetecknat av att i elektronikmodulen anordnas flera än en komponent (6) och de insänkta komponentema (6) ansluts elektriskt med varandra för att bilda en fimktionell helhet. 5
12. Förfarande i enlighet med nägot av patentkraven 1-11, där ätminstone en komponent (6) avsedd att fästas vid ledarskiktet (4) utgörs av en icke-packad mikrokretschip. • f · « «««« • · • « 1 • ·· • 9 • 1 • · » * · « ««I « ft ft ft ··· ft • ••ft ft ·· ft ft ft ft ft ft ft • • ft ft ft ft ft • •ft • ft· ft ft ft ft ··· ft • ft ft ft ft ft • ft ft ft ftft ft ft ft ft ft·· ft • ft ft «· ft ft · ft • ft ft ft
FI20041524A 2004-11-26 2004-11-26 Förfarande för tillverkning av en elektronikmodul FI117369B (sv)

Priority Applications (6)

Application Number Priority Date Filing Date Title
FI20041524A FI117369B (sv) 2004-11-26 2004-11-26 Förfarande för tillverkning av en elektronikmodul
CN2005800402916A CN101065843B (zh) 2004-11-26 2005-11-23 制造电子模块的方法
US11/667,429 US8062537B2 (en) 2004-11-26 2005-11-23 Method for manufacturing an electronics module
PCT/FI2005/000499 WO2006056643A2 (en) 2004-11-26 2005-11-23 Method for manufacturing an electronics module
JP2007542017A JP5160895B2 (ja) 2004-11-26 2005-11-23 電子モジュールの製造方法
KR1020077014479A KR101101603B1 (ko) 2004-11-26 2005-11-23 전자 모듈 제조 방법

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20041524A FI117369B (sv) 2004-11-26 2004-11-26 Förfarande för tillverkning av en elektronikmodul
FI20041524 2004-11-26

Publications (3)

Publication Number Publication Date
FI20041524A0 FI20041524A0 (sv) 2004-11-26
FI20041524A FI20041524A (sv) 2006-03-17
FI117369B true FI117369B (sv) 2006-09-15

Family

ID=33515276

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20041524A FI117369B (sv) 2004-11-26 2004-11-26 Förfarande för tillverkning av en elektronikmodul

Country Status (6)

Country Link
US (1) US8062537B2 (sv)
JP (1) JP5160895B2 (sv)
KR (1) KR101101603B1 (sv)
CN (1) CN101065843B (sv)
FI (1) FI117369B (sv)
WO (1) WO2006056643A2 (sv)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8742572B2 (en) 2006-08-04 2014-06-03 Micron Technology, Inc. Microelectronic devices and methods for manufacturing microelectronic devices

Families Citing this family (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI20031341A (sv) 2003-09-18 2005-03-19 Imbera Electronics Oy Förfarande för tillverkning av en elektronikmodul
FI117814B (sv) * 2004-06-15 2007-02-28 Imbera Electronics Oy Förfarande för tillverkning av en elektronikmodul
DE102005003632A1 (de) 2005-01-20 2006-08-17 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Katheter für die transvaskuläre Implantation von Herzklappenprothesen
FI122128B (sv) * 2005-06-16 2011-08-31 Imbera Electronics Oy Förfarande för tillverkning av kretskortskonstruktion
WO2006134220A1 (en) 2005-06-16 2006-12-21 Imbera Electronics Oy Method for manufacturing a circuit board structure, and a circuit board structure
FI119714B (sv) 2005-06-16 2009-02-13 Imbera Electronics Oy Kretskortskonstruktion och förfarande för tillverkning av kretskortskonstruktion
WO2008078899A1 (en) * 2006-12-23 2008-07-03 Lg Innotek Co., Ltd Semiconductor package and manufacturing method thereof
US20100328913A1 (en) * 2007-03-30 2010-12-30 Andreas Kugler Method for the producing an electronic subassembly, as well as electronic subassembly
DE102007015819A1 (de) * 2007-03-30 2008-10-09 Robert Bosch Gmbh Verfahren zur Herstellung einer elektronischen Baugruppe sowie elektronische Baugruppe
US7896915B2 (en) 2007-04-13 2011-03-01 Jenavalve Technology, Inc. Medical device for treating a heart valve insufficiency
DE102007024189A1 (de) * 2007-05-24 2008-11-27 Robert Bosch Gmbh Verfahren zur Herstellung einer elektronischen Baugruppe
DE102008009220A1 (de) * 2008-02-06 2009-08-13 Robert Bosch Gmbh Verfahren zum Herstellen einer Leiterplatte
ES2903231T3 (es) 2008-02-26 2022-03-31 Jenavalve Tech Inc Stent para el posicionamiento y anclaje de una prótesis valvular en un sitio de implantación en el corazón de un paciente
US9044318B2 (en) 2008-02-26 2015-06-02 Jenavalve Technology Gmbh Stent for the positioning and anchoring of a valvular prosthesis
US8264085B2 (en) 2008-05-05 2012-09-11 Infineon Technologies Ag Semiconductor device package interconnections
FI123205B (sv) 2008-05-12 2012-12-31 Imbera Electronics Oy Kretsmodul och förfarande för tillverkning av en kretsmodul
AT12316U1 (de) 2008-10-30 2012-03-15 Austria Tech & System Tech Verfahren zur integration eines elektronischen bauteils in eine leiterplatte
CN102204418B (zh) 2008-10-30 2016-05-18 At&S奥地利科技及系统技术股份公司 用于将电子部件集成到印制电路板中的方法
US8124449B2 (en) 2008-12-02 2012-02-28 Infineon Technologies Ag Device including a semiconductor chip and metal foils
FI122216B (sv) 2009-01-05 2011-10-14 Imbera Electronics Oy Rigid-flex modul
FI20095110A0 (sv) 2009-02-06 2009-02-06 Imbera Electronics Oy Elektronisk modul med EMI-skydd
JP2013526388A (ja) 2010-05-25 2013-06-24 イエナバルブ テクノロジー インク 人工心臓弁、及び人工心臓弁とステントを備える経カテーテル搬送体内プロテーゼ
US8735735B2 (en) 2010-07-23 2014-05-27 Ge Embedded Electronics Oy Electronic module with embedded jumper conductor
AT13055U1 (de) * 2011-01-26 2013-05-15 Austria Tech & System Tech Verfahren zur integration eines elektronischen bauteils in eine leiterplatte oder ein leiterplatten-zwischenprodukt sowie leiterplatte oder leiterplatten-zwischenprodukt
EP2775808A4 (en) 2011-10-31 2015-05-27 Meiko Electronics Co Ltd METHOD FOR MANUFACTURING A SUBSTRATE HAVING AN INTEGRATED COMPONENT, AND SUBSTRATE HAVING AN INTEGRATED COMPONENT MANUFACTURED BY SAID METHOD
US20140299367A1 (en) 2011-11-08 2014-10-09 Meiko Electronics Co., Ltd. Component-Embedded Substrate Manufacturing Method and Component-Embedded Substrate Manufactured Using the Same
KR101233640B1 (ko) * 2011-11-28 2013-02-15 대덕전자 주식회사 내장형 인쇄회로기판의 수율 향상방법
JP5521130B1 (ja) 2012-08-30 2014-06-11 パナソニック株式会社 電子部品パッケージおよびその製造方法
JP5651807B2 (ja) 2012-09-05 2015-01-14 パナソニックIpマネジメント株式会社 半導体装置およびその製造方法
US9084382B2 (en) * 2012-10-18 2015-07-14 Infineon Technologies Austria Ag Method of embedding an electronic component into an aperture of a substrate
JP5624699B1 (ja) 2012-12-21 2014-11-12 パナソニック株式会社 電子部品パッケージおよびその製造方法
US9595651B2 (en) 2012-12-21 2017-03-14 Panasonic Intellectual Property Management Co., Ltd. Electronic component package and method for manufacturing same
WO2014097641A1 (ja) 2012-12-21 2014-06-26 パナソニック株式会社 電子部品パッケージおよびその製造方法
WO2014097642A1 (ja) 2012-12-21 2014-06-26 パナソニック株式会社 電子部品パッケージおよびその製造方法
JP6563394B2 (ja) 2013-08-30 2019-08-21 イェーナヴァルヴ テクノロジー インコーポレイテッド 人工弁のための径方向に折り畳み自在のフレーム及び当該フレームを製造するための方法
US9380697B2 (en) 2014-01-28 2016-06-28 Panasonic Intellectual Property Management Co., Ltd. Electronic device and manufacturing method for same
US9373762B2 (en) 2014-06-17 2016-06-21 Panasonic Intellectual Property Management Co., Ltd. Electronic part package
CN107530168B (zh) 2015-05-01 2020-06-09 耶拿阀门科技股份有限公司 在心脏瓣膜替换中具有降低的起搏器比例的装置和方法
JP6620989B2 (ja) 2015-05-25 2019-12-18 パナソニックIpマネジメント株式会社 電子部品パッケージ
EP3454795B1 (en) 2016-05-13 2023-01-11 JenaValve Technology, Inc. Heart valve prosthesis delivery system for delivery of heart valve prosthesis with introducer sheath and loading system
JP7094965B2 (ja) 2017-01-27 2022-07-04 イエナバルブ テクノロジー インク 心臓弁模倣
EP3557608A1 (en) 2018-04-19 2019-10-23 AT & S Austria Technologie & Systemtechnik Aktiengesellschaft Packaged integrated circuit with interposing functionality and method for manufacturing such a packaged integrated circuit

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4246595A (en) 1977-03-08 1981-01-20 Matsushita Electric Industrial Co., Ltd. Electronics circuit device and method of making the same
JP3094481B2 (ja) 1991-03-13 2000-10-03 松下電器産業株式会社 電子回路装置とその製造方法
US5302851A (en) * 1991-12-19 1994-04-12 International Business Machines Corporation Circuit assembly with polyimide insulator
US5838545A (en) 1996-10-17 1998-11-17 International Business Machines Corporation High performance, low cost multi-chip modle package
US6232666B1 (en) * 1998-12-04 2001-05-15 Mciron Technology, Inc. Interconnect for packaging semiconductor dice and fabricating BGA packages
KR100298828B1 (ko) 1999-07-12 2001-11-01 윤종용 재배선 필름과 솔더 접합을 이용한 웨이퍼 레벨 칩 스케일 패키지 제조방법
US6284564B1 (en) * 1999-09-20 2001-09-04 Lockheed Martin Corp. HDI chip attachment method for reduced processing
US6242282B1 (en) 1999-10-04 2001-06-05 General Electric Company Circuit chip package and fabrication method
US6271469B1 (en) 1999-11-12 2001-08-07 Intel Corporation Direct build-up layer on an encapsulated die package
US6475877B1 (en) * 1999-12-22 2002-11-05 General Electric Company Method for aligning die to interconnect metal on flex substrate
US6596968B2 (en) * 2000-08-28 2003-07-22 Ube Industries, Ltd. Method of producing through-hole in aromatic polyimide film
US6489185B1 (en) 2000-09-13 2002-12-03 Intel Corporation Protective film for the fabrication of direct build-up layers on an encapsulated die package
JP2002158307A (ja) 2000-11-22 2002-05-31 Toshiba Corp 半導体装置及びその製造方法
FI115285B (sv) * 2002-01-31 2005-03-31 Imbera Electronics Oy Förfarande för insänkning av en komponent i ett basmaterial och för bildning av en kontakt
FI119215B (sv) * 2002-01-31 2008-08-29 Imbera Electronics Oy Förfarande för insättning av en komponent i ett basmaterial och elektronikmodul
JP2004063890A (ja) * 2002-07-30 2004-02-26 Fujitsu Ltd 半導体装置の製造方法
FI115601B (sv) 2003-04-01 2005-05-31 Imbera Electronics Oy Förfarande för tillverkning av en elektronikmodul och en elektronikmodul
EP1654884A1 (en) * 2003-08-05 2006-05-10 Koninklijke Philips Electronics N.V. Multi-view image generation
FI117812B (sv) * 2004-08-05 2007-02-28 Imbera Electronics Oy Tillverkning av ett skikt innehållande en komponent
JP2006100666A (ja) * 2004-09-30 2006-04-13 Toshiba Corp 半導体装置及びその製造方法
US7743128B2 (en) * 2005-04-20 2010-06-22 Netqos, Inc. Method and system for visualizing network performance characteristics

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8742572B2 (en) 2006-08-04 2014-06-03 Micron Technology, Inc. Microelectronic devices and methods for manufacturing microelectronic devices

Also Published As

Publication number Publication date
CN101065843B (zh) 2010-08-18
WO2006056643A2 (en) 2006-06-01
JP5160895B2 (ja) 2013-03-13
US8062537B2 (en) 2011-11-22
FI20041524A0 (sv) 2004-11-26
KR20070086645A (ko) 2007-08-27
JP2008522396A (ja) 2008-06-26
FI20041524A (sv) 2006-03-17
US20070267136A1 (en) 2007-11-22
KR101101603B1 (ko) 2012-01-02
CN101065843A (zh) 2007-10-31
WO2006056643A3 (en) 2006-11-09

Similar Documents

Publication Publication Date Title
FI117369B (sv) Förfarande för tillverkning av en elektronikmodul
FI117812B (sv) Tillverkning av ett skikt innehållande en komponent
FI117814B (sv) Förfarande för tillverkning av en elektronikmodul
US9820375B2 (en) Rigid-flex module and manufacturing method
FI122128B (sv) Förfarande för tillverkning av kretskortskonstruktion
FI119714B (sv) Kretskortskonstruktion och förfarande för tillverkning av kretskortskonstruktion
US8547701B2 (en) Electronics module and method for manufacturing the same
US8789271B2 (en) Method for integrating an electronic component into a printed circuit board
CN101827494B (zh) 线路板及其制造方法
KR20060066115A (ko) 전자 모듈 제조 방법
US8487194B2 (en) Circuit board including an embedded component
US9596765B2 (en) Manufacturing method for component incorporated substrate and component incorporated substrate manufactured using the method
CN110521292A (zh) 印刷电路板及其制造方法
JP2010147331A (ja) 電子デバイスおよびその製造方法
JP2003283092A (ja) 回路基板

Legal Events

Date Code Title Description
FG Patent granted

Ref document number: 117369

Country of ref document: FI

PC Transfer of assignment of patent

Owner name: GE EMBEDDED ELECTRONICS OY

PC Transfer of assignment of patent

Owner name: IMBERA TEK, LLC