DE60003312D1 - Parallelprüfer für halbleiterschaltungen - Google Patents

Parallelprüfer für halbleiterschaltungen

Info

Publication number
DE60003312D1
DE60003312D1 DE60003312T DE60003312T DE60003312D1 DE 60003312 D1 DE60003312 D1 DE 60003312D1 DE 60003312 T DE60003312 T DE 60003312T DE 60003312 T DE60003312 T DE 60003312T DE 60003312 D1 DE60003312 D1 DE 60003312D1
Authority
DE
Germany
Prior art keywords
semiconductor circuits
parallel controller
controller
parallel
circuits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE60003312T
Other languages
English (en)
Other versions
DE60003312T2 (de
Inventor
E Lecolst
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Application granted granted Critical
Publication of DE60003312D1 publication Critical patent/DE60003312D1/de
Publication of DE60003312T2 publication Critical patent/DE60003312T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
DE60003312T 1999-06-28 2000-06-28 Parallelprüfer für halbleiterschaltungen Expired - Fee Related DE60003312T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/340,832 US6476628B1 (en) 1999-06-28 1999-06-28 Semiconductor parallel tester
US340832 1999-06-28
PCT/US2000/017792 WO2001001247A2 (en) 1999-06-28 2000-06-28 Semiconductor parallel tester

Publications (2)

Publication Number Publication Date
DE60003312D1 true DE60003312D1 (de) 2003-07-17
DE60003312T2 DE60003312T2 (de) 2004-05-13

Family

ID=23335115

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60003312T Expired - Fee Related DE60003312T2 (de) 1999-06-28 2000-06-28 Parallelprüfer für halbleiterschaltungen

Country Status (8)

Country Link
US (1) US6476628B1 (de)
EP (1) EP1190322B1 (de)
JP (1) JP5173097B2 (de)
KR (1) KR100696321B1 (de)
DE (1) DE60003312T2 (de)
MY (1) MY119234A (de)
TW (1) TW469485B (de)
WO (1) WO2001001247A2 (de)

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US6671844B1 (en) * 2000-10-02 2003-12-30 Agilent Technologies, Inc. Memory tester tests multiple DUT's per test site
US6988232B2 (en) * 2001-07-05 2006-01-17 Intellitech Corporation Method and apparatus for optimized parallel testing and access of electronic circuits
US7009381B2 (en) * 2002-03-21 2006-03-07 Agilent Technologies, Inc. Adapter method and apparatus for interfacing a tester with a device under test
JP3621938B2 (ja) 2002-08-09 2005-02-23 日本電子材料株式会社 プローブカード
US6842022B2 (en) * 2002-09-20 2005-01-11 Agilent Technologies, Inc. System and method for heterogeneous multi-site testing
US7437261B2 (en) * 2003-02-14 2008-10-14 Advantest Corporation Method and apparatus for testing integrated circuits
EP1629289A4 (de) * 2003-05-22 2006-06-14 Teseda Corp Testerarchitektur zum prüfen integrierter halbleiterschaltungen
US7053648B2 (en) * 2003-06-09 2006-05-30 Credence Systems Corporation Distributed, load sharing power supply system for IC tester
KR100498509B1 (ko) * 2003-11-12 2005-07-01 삼성전자주식회사 검사시간을 단축하는 플래시 메모리 테스터 및 이를이용한 전기적 검사방법
US7464287B2 (en) * 2004-03-31 2008-12-09 Intel Corporation Strategy to verify asynchronous links across chips
US7913002B2 (en) * 2004-08-20 2011-03-22 Advantest Corporation Test apparatus, configuration method, and device interface
US7543200B2 (en) * 2005-02-17 2009-06-02 Advantest Corporation Method and system for scheduling tests in a parallel test system
US20060214679A1 (en) * 2005-03-28 2006-09-28 Formfactor, Inc. Active diagnostic interface for wafer probe applications
US7292059B2 (en) * 2005-03-31 2007-11-06 Credence Systems Corporation Power supply assembly for a semiconductor circuit tester
JP2006343146A (ja) * 2005-06-07 2006-12-21 Advantest Corp 試験装置
JP2006343182A (ja) * 2005-06-08 2006-12-21 Renesas Technology Corp 半導体集積回路装置の製造方法
JP5021924B2 (ja) * 2005-09-27 2012-09-12 株式会社アドバンテスト パフォーマンスボード、試験装置及び試験方法
KR100748663B1 (ko) * 2005-12-19 2007-08-10 현대자동차주식회사 엘피아이 차량의 연료계 모니터링 방법
US7458837B2 (en) 2006-01-13 2008-12-02 Advantest Corporation Connector housing block, interface member and electronic device testing apparatus
JP4488438B2 (ja) * 2006-01-13 2010-06-23 株式会社アドバンテスト コネクタハウジングブロック、インターフェイス部材および電子部品試験装置
US7475164B2 (en) * 2006-02-28 2009-01-06 International Business Machines Corporation Apparatus, system, and method for automated device configuration and testing
US7552370B2 (en) * 2006-03-31 2009-06-23 Robert Pochowski Application specific distributed test engine architecture system and method
US7598728B2 (en) * 2006-08-04 2009-10-06 Suckheui Chung System and method for utilizing an automatic circuit tester system having multiple automatic circuit tester platforms
US7825650B2 (en) * 2006-12-15 2010-11-02 Verigy (Singapore) Ptd. Ltd. Automated loader for removing and inserting removable devices to improve load time for automated test equipment
US7821254B2 (en) * 2006-12-15 2010-10-26 Verigy (Singapore) Pte. Ltd. Method and apparatus for improving load time for automated test equipment
US7768278B2 (en) * 2007-02-14 2010-08-03 Verigy (Singapore) Pte. Ltd. High impedance, high parallelism, high temperature memory test system architecture
US8305098B2 (en) * 2007-04-26 2012-11-06 Advantest (Singapore) Pte Ltd Element usable with the method, and a standalone probe card tester formable using the method
DE112008001172T5 (de) * 2007-04-27 2010-06-02 Advantest Corp. Prüfgerät und Prüfverfahren
US7739070B2 (en) * 2007-08-28 2010-06-15 Agilent Technologies, Inc. Standardized interfaces for proprietary instruments
US20090134898A1 (en) * 2007-11-26 2009-05-28 Carlsen Richard D Coaxial Spring Probe Grounding Method
US7680615B2 (en) * 2008-01-25 2010-03-16 Azurewave Technologies, Inc. Parallel testing system with shared golden calibration table and method thereof
TWI461712B (zh) * 2009-01-21 2014-11-21 King Yuan Electronics Co Ltd 平行測試轉換裝置、平行測試系統以及平行測試之方法
KR101534163B1 (ko) * 2009-04-01 2015-07-06 삼성전자주식회사 실장 테스트에 적합한 메인 보드 및 이를 포함하는 메모리 실장 테스트 시스템
JP5528539B2 (ja) * 2009-04-09 2014-06-25 テラダイン、 インコーポレイテッド 内蔵型直列絶縁抵抗器を有する試験信号伝達チャネルを利用した自動試験装置
CN102360064A (zh) * 2011-08-01 2012-02-22 上海宏力半导体制造有限公司 芯片的测试系统
JP7170494B2 (ja) * 2018-10-15 2022-11-14 東京エレクトロン株式会社 中間接続部材及び検査装置
KR102520852B1 (ko) * 2022-10-14 2023-04-13 주식회사 유니밴스 프로브카드용 탑 보강판

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3587858D1 (de) * 1984-06-29 1994-07-21 Advantest Corp IC-Testvorrichtung.
JP2537892Y2 (ja) * 1990-06-08 1997-06-04 株式会社アドバンテスト Ｉｃ試験装置
JP2641816B2 (ja) * 1991-07-23 1997-08-20 三菱電機株式会社 半導体集積回路の測定方法
JPH0792479B2 (ja) * 1993-03-18 1995-10-09 東京エレクトロン株式会社 プローブ装置の平行度調整方法
JPH0732579U (ja) * 1993-11-22 1995-06-16 株式会社アドバンテスト デバイス・インターフェイスのリーク防止機構
JPH0732955U (ja) * 1993-12-01 1995-06-16 株式会社アドバンテスト 半導体試験装置のマザーボード
JPH07318587A (ja) * 1994-05-27 1995-12-08 Tokyo Electron Ltd プローブカード
JP3401713B2 (ja) * 1994-09-13 2003-04-28 富士通株式会社 集積回路試験装置
US5546405A (en) * 1995-07-17 1996-08-13 Advanced Micro Devices, Inc. Debug apparatus for an automated semiconductor testing system
JP2720146B2 (ja) * 1995-08-29 1998-02-25 ミナトエレクトロニクス株式会社 ウェーハプローバ用接続リング
US5907247A (en) * 1995-10-06 1999-05-25 Texas Instruments Incorporated Test system and process with microcomputers and serial interface
US5705932A (en) * 1995-10-10 1998-01-06 Xilinx, Inc. System for expanding space provided by test computer to test multiple integrated circuits simultaneously
US5729150A (en) 1995-12-01 1998-03-17 Cascade Microtech, Inc. Low-current probe card with reduced triboelectric current generating cables
JPH10213628A (ja) * 1996-02-19 1998-08-11 Ando Electric Co Ltd 半導体試験装置
JPH09251053A (ja) * 1996-03-13 1997-09-22 Ando Electric Co Ltd 半導体試験装置
JPH10227830A (ja) * 1996-07-31 1998-08-25 Ando Electric Co Ltd Ｉｃテスタ用テストボード
JP3302576B2 (ja) * 1996-09-30 2002-07-15 アジレント・テクノロジー株式会社 コネクタ付きプローブカード及びｄｕｔ接続装置
JP3730340B2 (ja) * 1996-11-20 2006-01-05 株式会社アドバンテスト 半導体試験装置
JPH1183935A (ja) * 1997-09-05 1999-03-26 Advantest Corp 半導体試験装置
US5794175A (en) * 1997-09-09 1998-08-11 Teradyne, Inc. Low cost, highly parallel memory tester
US6028439A (en) * 1997-10-31 2000-02-22 Credence Systems Corporation Modular integrated circuit tester with distributed synchronization and control
JP3833370B2 (ja) * 1997-11-21 2006-10-11 株式会社アドバンテスト Ｉｃ試験装置
US6166553A (en) * 1998-06-29 2000-12-26 Xandex, Inc. Prober-tester electrical interface for semiconductor test
US6204679B1 (en) * 1998-11-04 2001-03-20 Teradyne, Inc. Low cost memory tester with high throughput
JP5907245B2 (ja) * 2014-12-01 2016-04-26 株式会社三洋物産 遊技機

Also Published As

Publication number Publication date
DE60003312T2 (de) 2004-05-13
US6476628B1 (en) 2002-11-05
EP1190322B1 (de) 2003-06-11
KR100696321B1 (ko) 2007-03-19
JP2003503712A (ja) 2003-01-28
EP1190322A2 (de) 2002-03-27
JP5173097B2 (ja) 2013-03-27
TW469485B (en) 2001-12-21
WO2001001247A3 (en) 2001-09-07
WO2001001247A2 (en) 2001-01-04
MY119234A (en) 2005-04-30
KR20020038597A (ko) 2002-05-23

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee