DE69937739D1 - Halbleitervorrichtung - Google Patents

Halbleitervorrichtung

Info

Publication number
DE69937739D1
DE69937739D1 DE69937739T DE69937739T DE69937739D1 DE 69937739 D1 DE69937739 D1 DE 69937739D1 DE 69937739 T DE69937739 T DE 69937739T DE 69937739 T DE69937739 T DE 69937739T DE 69937739 D1 DE69937739 D1 DE 69937739D1
Authority
DE
Germany
Prior art keywords
semiconductor device
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69937739T
Other languages
English (en)
Other versions
DE69937739T2 (de
Inventor
Hideo Matsumoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of DE69937739D1 publication Critical patent/DE69937739D1/de
Application granted granted Critical
Publication of DE69937739T2 publication Critical patent/DE69937739T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/02—Containers; Seals
    • H01L23/04—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls
    • H01L23/053—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having an insulating or insulated base as a mounting for the semiconductor body
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
    • H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
    • H01L25/07—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00
    • H01L25/072—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00 the devices being arranged next to each other
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001—Core members of the connector
    • H01L2224/45099—Material
    • H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • H01L2224/45117—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 400°C and less than 950°C
    • H01L2224/45124—Aluminium (Al) as principal constituent
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805—Shape
    • H01L2224/4809—Loop shape
    • H01L2224/48091—Arched
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481—Disposition
    • H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732—Location after the connecting process
    • H01L2224/73251—Location after the connecting process on different surfaces
    • H01L2224/73265—Layer and wire connectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42—Wire connectors; Manufacturing methods related thereto
    • H01L24/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L24/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42—Wire connectors; Manufacturing methods related thereto
    • H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/11—Device type
    • H01L2924/12—Passive devices, e.g. 2 terminal devices
    • H01L2924/1204—Optical Diode
    • H01L2924/12041—LED
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181—Encapsulation

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
DE69937739T 1999-05-11 1999-05-11 Halbleitervorrichtung Expired - Lifetime DE69937739T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP1999/002417 WO2000068992A1 (en) 1999-05-11 1999-05-11 Semiconductor device

Publications (2)

Publication Number Publication Date
DE69937739D1 true DE69937739D1 (de) 2008-01-24
DE69937739T2 DE69937739T2 (de) 2008-11-27

Family

ID=14235649

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69937739T Expired - Lifetime DE69937739T2 (de) 1999-05-11 1999-05-11 Halbleitervorrichtung

Country Status (5)

Country Link
US (1) US6369411B2 (de)
EP (1) EP1104025B1 (de)
JP (1) JP3610015B2 (de)
DE (1) DE69937739T2 (de)
WO (1) WO2000068992A1 (de)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4540884B2 (ja) * 2001-06-19 2010-09-08 三菱電機株式会社 半導体装置
JP2003264265A (ja) * 2002-03-08 2003-09-19 Mitsubishi Electric Corp 電力用半導体装置
JP3910497B2 (ja) * 2002-07-03 2007-04-25 株式会社オートネットワーク技術研究所 電力回路部の防水方法及び電力回路部をもつパワーモジュール
JP2004228352A (ja) * 2003-01-23 2004-08-12 Mitsubishi Electric Corp 電力半導体装置
JP3858834B2 (ja) * 2003-02-24 2006-12-20 オンキヨー株式会社 半導体素子の放熱器
DE102004042367B4 (de) 2004-09-01 2008-07-10 Infineon Technologies Ag Leistungshalbleitermodul
DE102005002813B4 (de) * 2005-01-20 2006-10-19 Robert Bosch Gmbh Steuermodul
US20100301349A1 (en) * 2005-01-26 2010-12-02 Harvatek Corporation Wafer level led package structure for increasing light-emitting efficiency and heat-dissipating effect and method for manufacturing the same
US20060258031A1 (en) * 2005-01-26 2006-11-16 Bily Wang Wafer-level electro-optical semiconductor manufacture fabrication method
DE102005046404B4 (de) * 2005-09-28 2008-12-24 Infineon Technologies Ag Verfahren zur Minderung von Streuungen in der Durchbiegung von gewalzten Bodenplatten und Leistungshalbleitermodul mit einer nach diesem Verfahren hergestellten Bodenplatte
JP2008060204A (ja) * 2006-08-30 2008-03-13 Nec Lcd Technologies Ltd Ｌｅｄバックライトユニットおよびそれを用いた液晶表示装置
DE102006046789A1 (de) * 2006-10-02 2008-04-03 Infineon Technologies Ag Elektronisches Bauteil und Verfahren zur Herstellung elektronischer Bauteile
JP5252819B2 (ja) * 2007-03-26 2013-07-31 三菱電機株式会社 半導体装置およびその製造方法
JP5061717B2 (ja) * 2007-05-18 2012-10-31 富士電機株式会社 半導体モジュール及び半導体モジュールの製造方法
US8651704B1 (en) 2008-12-05 2014-02-18 Musco Corporation Solid state light fixture with cooling system with heat rejection management
US8535989B2 (en) 2010-04-02 2013-09-17 Intel Corporation Embedded semiconductive chips in reconstituted wafers, and systems containing same
US9068707B1 (en) 2010-04-06 2015-06-30 Musco Corporation Compact LED light source and lighting system
JP5260592B2 (ja) * 2010-04-08 2013-08-14 デクセリアルズ株式会社 保護素子、バッテリ制御装置、及びバッテリパック
JP5467933B2 (ja) 2010-05-21 2014-04-09 株式会社東芝 半導体装置
CN104335472A (zh) * 2012-05-28 2015-02-04 三菱电机株式会社 半导体装置
JP5939041B2 (ja) * 2012-06-01 2016-06-22 住友電気工業株式会社 半導体モジュール及び半導体モジュールの製造方法
CN104321864B (zh) * 2012-06-08 2017-06-20 英特尔公司 具有非共面的、包封的微电子器件和无焊内建层的微电子封装
JP2014033092A (ja) * 2012-08-03 2014-02-20 Mitsubishi Electric Corp 半導体装置および半導体装置の製造方法
JP2014056982A (ja) * 2012-09-13 2014-03-27 Mitsubishi Electric Corp パワー半導体装置およびその製造方法
US9196510B2 (en) * 2013-11-12 2015-11-24 Infineon Technologies Ag Semiconductor package comprising two semiconductor modules and laterally extending connectors
KR101983160B1 (ko) * 2013-11-29 2019-05-28 삼성전기주식회사 전력반도체 모듈
DE112016007485T5 (de) 2016-11-29 2019-08-22 Mitsubishi Electric Corporation Halbleitervorrichtung, Steuervorrichtung, und Verfahren zur Herstellung der Halbleitervorrichtung

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1815799C3 (de) * 1968-12-19 1979-09-13 Siemens Ag, 1000 Berlin Und 8000 Muenchen Anordnung eines Halbleiterbauelementgehäuses
US5014159A (en) * 1982-04-19 1991-05-07 Olin Corporation Semiconductor package
JPH04273451A (ja) * 1991-02-28 1992-09-29 Nippon Steel Corp 半導体装置
JPH05166962A (ja) * 1991-12-17 1993-07-02 Oki Electric Ind Co Ltd 電力増幅器の実装構造
JP2725952B2 (ja) * 1992-06-30 1998-03-11 三菱電機株式会社 半導体パワーモジュール
JP2854785B2 (ja) * 1993-08-30 1999-02-03 三菱電機株式会社 半導体装置およびその製造方法
JP3357220B2 (ja) 1995-07-07 2002-12-16 三菱電機株式会社 半導体装置
JPH09172116A (ja) 1995-12-21 1997-06-30 Mitsubishi Electric Corp 半導体装置
JPH09213878A (ja) * 1996-01-29 1997-08-15 Toshiba Corp 半導体装置
JP2967065B2 (ja) * 1996-09-20 1999-10-25 株式会社東芝 半導体モジュール

Also Published As

Publication number Publication date
EP1104025A1 (de) 2001-05-30
WO2000068992A1 (en) 2000-11-16
US6369411B2 (en) 2002-04-09
JP3610015B2 (ja) 2005-01-12
EP1104025A4 (de) 2007-05-02
DE69937739T2 (de) 2008-11-27
US20010002051A1 (en) 2001-05-31
EP1104025B1 (de) 2007-12-12

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