DE4036096C2 - - Google Patents

Info

Publication number
DE4036096C2
DE4036096C2 DE19904036096 DE4036096A DE4036096C2 DE 4036096 C2 DE4036096 C2 DE 4036096C2 DE 19904036096 DE19904036096 DE 19904036096 DE 4036096 A DE4036096 A DE 4036096A DE 4036096 C2 DE4036096 C2 DE 4036096C2
Authority
DE
Germany
Prior art keywords
semiconductor device
wire
resin
semiconductor element
corrosion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE19904036096
Other languages
German (de)
English (en)
Other versions
DE4036096A1 (de
Inventor
Yoshihiro Amagasaki Hyogo Jp Matsunaga
Tadao Amagasaki Hyogo Jp Nishimori
Hiromasa Amagasaki Hyogo Jp Matsuoka
Kozo Amagasaki Hyogo Jp Shimamoto
Kiyoaki Itami Hyogo Jp Tsumura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of DE4036096A1 publication Critical patent/DE4036096A1/de
Application granted granted Critical
Publication of DE4036096C2 publication Critical patent/DE4036096C2/de
Granted legal-status Critical Current

Links

Classifications

    • H10W74/473—
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001—Core members of the connector
    • H01L2224/45099—Material
    • H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
    • H01L2224/45147—Copper (Cu) as principal constituent
    • H10W72/536—
    • H10W72/5363—
    • H10W72/5522—
    • H10W72/5524—
    • H10W72/5525—
    • H10W72/59—
    • H10W72/884—
    • H10W72/952—
    • H10W74/00—
    • H10W90/736—
    • H10W90/756—
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00—Stock material or miscellaneous articles
    • Y10T428/23—Sheet including cover or casing
    • Y10T428/239—Complete cover or casing

Landscapes

  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
  • Epoxy Resins (AREA)
DE19904036096 1989-11-15 1990-11-13 Kunstharzversiegelte halbleitervorrichtung Granted DE4036096A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1297934A JPH03157448A (ja) 1989-11-15 1989-11-15 半導体封止用エポキシ樹脂組成物

Publications (2)

Publication Number Publication Date
DE4036096A1 DE4036096A1 (de) 1991-05-16
DE4036096C2 true DE4036096C2 (enExample) 1993-08-12

Family

ID=17852987

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19904036096 Granted DE4036096A1 (de) 1989-11-15 1990-11-13 Kunstharzversiegelte halbleitervorrichtung

Country Status (4)

Country Link
US (1) US5093712A (enExample)
JP (1) JPH03157448A (enExample)
DE (1) DE4036096A1 (enExample)
GB (1) GB2238660B (enExample)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
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JPH0760839B2 (ja) * 1990-03-15 1995-06-28 株式会社東芝 半導体装置
CN1090646C (zh) * 1993-08-20 2002-09-11 日东电工株式会社 半导体器件
KR100296836B1 (ko) * 1993-08-20 2001-10-24 야마모토 히데키 반도체봉입용열경화성수지조성물및이를이용한반도체장치
JP3656198B2 (ja) * 1994-04-28 2005-06-08 東都化成株式会社 改良されたノボラック型エポキシ樹脂及び電子部品封止用樹脂組成物
JPH08111478A (ja) * 1994-10-06 1996-04-30 Toshiba Corp 樹脂封止型半導体装置
GB2344934A (en) * 1995-10-24 2000-06-21 Altera Corp Integrated circuit package
DE69838610T2 (de) 1997-04-21 2008-02-07 Nitto Denko Corp., Ibaraki Halbleiter-dichtharzzusammensetzung, damit versiegelte halbleiteranordnung, und verfahren zur herstellung einer halbleiteranordnung.
US6653672B1 (en) * 1998-07-14 2003-11-25 Winbond Electronics Corp. Semiconductor die pad placement and wire bond
JP2003092379A (ja) * 2001-09-18 2003-03-28 Hitachi Ltd 半導体装置
DE10262235B4 (de) 2002-11-12 2010-05-12 Kronotec Ag Spanplatte, insbesondere Fußbodenpaneel oder Möbelplatte, und Verfahren zu ihrer Herstellung
DE10252866B3 (de) 2002-11-12 2004-04-29 Kronotec Ag Paneel und Verfahren zur Herstellung eines Paneels
US7617651B2 (en) 2002-11-12 2009-11-17 Kronotec Ag Floor panel
EP1420125B1 (de) 2002-11-15 2008-05-14 Flooring Technologies Ltd. Einrichtung bestehend aus zwei miteinander verbindbaren Bauplatten und einem Einsatz zum Verriegeln dieser Bauplatten
DE10306118A1 (de) 2003-02-14 2004-09-09 Kronotec Ag Bauplatte
US7678425B2 (en) 2003-03-06 2010-03-16 Flooring Technologies Ltd. Process for finishing a wooden board and wooden board produced by the process
DE20304761U1 (de) 2003-03-24 2004-04-08 Kronotec Ag Einrichtung zum Verbinden von Bauplatten, insbesondere Bodenpaneele
DE10362218B4 (de) 2003-09-06 2010-09-16 Kronotec Ag Verfahren zum Versiegeln einer Bauplatte
DE20315676U1 (de) 2003-10-11 2003-12-11 Kronotec Ag Paneel, insbesondere Bodenpaneel
US7506481B2 (en) 2003-12-17 2009-03-24 Kronotec Ag Building board for use in subfloors
DE102004005047B3 (de) 2004-01-30 2005-10-20 Kronotec Ag Verfahren und Einrichtung zum Einbringen eines die Feder einer Platte bildenden Streifens
DE102004011931B4 (de) 2004-03-11 2006-09-14 Kronotec Ag Dämmstoffplatte aus einem Holzwerkstoff-Bindemittelfaser-Gemisch
US7854986B2 (en) 2005-09-08 2010-12-21 Flooring Technologies Ltd. Building board and method for production
DE102005042657B4 (de) 2005-09-08 2010-12-30 Kronotec Ag Bauplatte und Verfahren zur Herstellung
DE102005063034B4 (de) 2005-12-29 2007-10-31 Flooring Technologies Ltd. Paneel, insbesondere Bodenpaneel
DE102006006124A1 (de) 2006-02-10 2007-08-23 Flooring Technologies Ltd. Einrichtung zum Verriegeln zweier Bauplatten
DE102006007976B4 (de) 2006-02-21 2007-11-08 Flooring Technologies Ltd. Verfahren zur Veredelung einer Bauplatte
CN101284265B (zh) * 2007-04-13 2010-09-08 欧利速精密工业股份有限公司 热熔黏胶粉末用于非金属物体表面的处理方法及处理装置
FR2917236B1 (fr) * 2007-06-07 2009-10-23 Commissariat Energie Atomique Procede de realisation de via dans un substrat reconstitue.
KR100893487B1 (ko) * 2007-09-06 2009-04-17 삼성모바일디스플레이주식회사 발광 표시 장치 및 그의 제조 방법
WO2010147187A1 (ja) * 2009-06-18 2010-12-23 ローム株式会社 半導体装置
JPWO2011070739A1 (ja) * 2009-12-07 2013-04-22 住友ベークライト株式会社 半導体封止用エポキシ樹脂組成物、その硬化体及び半導体装置
DE102017121485A1 (de) * 2017-09-15 2019-03-21 Infineon Technologies Austria Ag Halbleitervorrichtung mit Kupferkorrosionsinhibitoren
DE102022115817A1 (de) 2022-06-24 2024-01-04 Infineon Technologies Ag Halbleiterpackage-Einkapselung mit metallaktivierten anorganischen Füllpartikeln

Family Cites Families (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1907017B2 (de) * 1968-02-14 1976-04-15 Hitachi Ltd.; Hitachi Chemical Co. Ltd.; Tokio Waermehaertbare formmasse auf basis von polykondensationsharzen mit pulverfoermigen fuellstoffen
DE2164100A1 (de) * 1971-12-23 1973-06-28 Semikron Gleichrichterbau Elektrisch isolierende einkapselungsmasse fuer halbleiteranordnungen
US4042550A (en) * 1975-11-28 1977-08-16 Allied Chemical Corporation Encapsulant compositions based on anhydride-hardened epoxy resins
US4111905A (en) * 1977-01-28 1978-09-05 M&T Chemicals Inc. Flame retarding agents and polymer compositions containing same
GB1549103A (en) * 1977-07-19 1979-08-01 Allied Chem Epoxy resin encapsulant compositions
US4248920A (en) * 1978-04-26 1981-02-03 Tokyo Shibaura Denki Kabushiki Kaisha Resin-sealed semiconductor device
GB2087159B (en) * 1980-11-08 1984-05-10 Plessey Co Ltd Plastics encapsulated electronic devices
US4330637A (en) * 1981-01-05 1982-05-18 Western Electric Company, Inc. Encapsulated electronic devices and encapsulating compositions
JPS58166747A (ja) * 1982-03-29 1983-10-01 Toshiba Corp 樹脂封止型半導体装置
JPS58174434A (ja) * 1982-04-08 1983-10-13 Sumitomo Bakelite Co Ltd エポキシ樹脂系成形材料
JPS5933319A (ja) * 1982-08-20 1984-02-23 Shin Etsu Chem Co Ltd 難燃性エポキシ樹脂組成物
US4529755A (en) * 1982-10-23 1985-07-16 Denki Kagaku Kogyo Kabushiki Kaisha Epoxy resin composition for encapsulating semiconductor
JPS6038847A (ja) * 1983-08-12 1985-02-28 Hitachi Ltd 樹脂封止半導体装置
JPS6080259A (ja) * 1983-10-07 1985-05-08 Hitachi Ltd 半導体装置
JPS6084322A (ja) * 1983-10-14 1985-05-13 Hitachi Ltd 半導体封止用樹脂組成物
JPS60190453A (ja) * 1984-03-13 1985-09-27 Toagosei Chem Ind Co Ltd 絶縁性保護材料
JPS6119625A (ja) * 1984-07-05 1986-01-28 Toshiba Corp 半導体封止用エポキシ樹脂組成物
JPS61110451A (ja) * 1984-11-02 1986-05-28 Nitto Electric Ind Co Ltd 半導体装置
JPS61166823A (ja) * 1985-01-19 1986-07-28 Toshiba Chem Corp 封止用樹脂組成物
JPS6234920A (ja) * 1985-08-07 1987-02-14 Toshiba Corp エポキシ樹脂組成物およびそれを用いた樹脂封止型半導体装置
US4902732A (en) * 1985-09-30 1990-02-20 Shin-Etsu Chemical Co., Ltd. Epoxy resin-based curable compositions
JPS62150860A (ja) * 1985-12-25 1987-07-04 Hitachi Ltd 半導体装置
JPS62207319A (ja) * 1986-03-06 1987-09-11 Sumitomo Bakelite Co Ltd 難燃性エポキシ樹脂組成物の製造方法
JPS62285912A (ja) * 1986-06-04 1987-12-11 Sumitomo Bakelite Co Ltd 半導体封止用エポキシ樹脂組成物
JPH0649817B2 (ja) * 1986-07-09 1994-06-29 住友ベ−クライト株式会社 半導体封止用エポキシ樹脂組成物
JPH0618985B2 (ja) * 1987-06-03 1994-03-16 信越化学工業株式会社 エポキシ樹脂組成物
JPH0648710B2 (ja) * 1987-08-03 1994-06-22 株式会社日立製作所 樹脂封止型半導体装置
US5008350A (en) * 1987-12-16 1991-04-16 Sumitomo Chemical Company, Limited Glycidyl ethers of phenolic compounds and process for producing the same
JP2660293B2 (ja) * 1988-06-30 1997-10-08 京セラ株式会社 電子部品封止用樹脂組成物
JP2640976B2 (ja) * 1988-12-28 1997-08-13 京セラ株式会社 電子部品封止用樹脂組成物

Also Published As

Publication number Publication date
GB9024722D0 (en) 1991-01-02
GB2238660A (en) 1991-06-05
DE4036096A1 (de) 1991-05-16
GB2238660B (en) 1993-06-02
US5093712A (en) 1992-03-03
JPH03157448A (ja) 1991-07-05

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
D2 Grant after examination
8364 No opposition during term of opposition
8320 Willingness to grant licences declared (paragraph 23)
8328 Change in the person/name/address of the agent

Representative=s name: PRUFER & PARTNER GBR, 81545 MUENCHEN

8339 Ceased/non-payment of the annual fee