DE112017001127B4 - Filmausbildevorrichtung - Google Patents
Filmausbildevorrichtung Download PDFInfo
- Publication number
- DE112017001127B4 DE112017001127B4 DE112017001127.2T DE112017001127T DE112017001127B4 DE 112017001127 B4 DE112017001127 B4 DE 112017001127B4 DE 112017001127 T DE112017001127 T DE 112017001127T DE 112017001127 B4 DE112017001127 B4 DE 112017001127B4
- Authority
- DE
- Germany
- Prior art keywords
- partition
- pipe
- gas
- peripheral surface
- tubes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45561—Gas plumbing upstream of the reaction chamber
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/32—Carbides
- C23C16/325—Silicon carbide
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45519—Inert gas curtains
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45574—Nozzles for more than one gas
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45576—Coaxial inlets for each gas
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45587—Mechanical means for changing the gas flow
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/14—Feed and outlet means for the gases; Modifying the flow of the reactive gases
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/36—Carbides
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0451—Apparatus for manufacturing or treating in a plurality of work-stations
- H10P72/0462—Apparatus for manufacturing or treating in a plurality of work-stations characterised by the construction of the processing chambers, e.g. modular processing chambers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01F—MIXING, e.g. DISSOLVING, EMULSIFYING OR DISPERSING
- B01F23/00—Mixing according to the phases to be mixed, e.g. dispersing or emulsifying
- B01F23/10—Mixing gases with gases
- B01F23/19—Mixing systems, i.e. flow charts or diagrams; Arrangements, e.g. comprising controlling means
- B01F23/191—Mixing systems, i.e. flow charts or diagrams; Arrangements, e.g. comprising controlling means characterised by the construction of the controlling means
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/34—Deposited materials, e.g. layers
- H10P14/3402—Deposited materials, e.g. layers characterised by the chemical composition
- H10P14/3404—Deposited materials, e.g. layers characterised by the chemical composition being Group IVA materials
- H10P14/3408—Silicon carbide
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Mechanical Engineering (AREA)
- Inorganic Chemistry (AREA)
- Crystallography & Structural Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016039270A JP6664993B2 (ja) | 2016-03-01 | 2016-03-01 | 成膜装置 |
| JP2016-039270 | 2016-03-01 | ||
| PCT/JP2017/007292 WO2017150400A1 (ja) | 2016-03-01 | 2017-02-27 | 成膜装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE112017001127T5 DE112017001127T5 (de) | 2018-11-15 |
| DE112017001127B4 true DE112017001127B4 (de) | 2024-06-06 |
Family
ID=59742958
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE112017001127.2T Active DE112017001127B4 (de) | 2016-03-01 | 2017-02-27 | Filmausbildevorrichtung |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US10896831B2 (enExample) |
| JP (1) | JP6664993B2 (enExample) |
| KR (1) | KR102211543B1 (enExample) |
| CN (1) | CN109075038B (enExample) |
| DE (1) | DE112017001127B4 (enExample) |
| TW (1) | TWI630282B (enExample) |
| WO (1) | WO2017150400A1 (enExample) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11944988B2 (en) * | 2018-05-18 | 2024-04-02 | Applied Materials, Inc. | Multi-zone showerhead |
| JP7365761B2 (ja) * | 2018-08-24 | 2023-10-20 | 株式会社ニューフレアテクノロジー | 気相成長装置 |
| JP7175169B2 (ja) | 2018-11-30 | 2022-11-18 | 昭和電工株式会社 | SiCエピタキシャル成長装置 |
| JP7242990B2 (ja) * | 2018-12-03 | 2023-03-22 | 株式会社レゾナック | SiC化学気相成長装置及びSiCエピタキシャルウェハの製造方法 |
| JP7152970B2 (ja) * | 2019-03-01 | 2022-10-13 | 株式会社ニューフレアテクノロジー | 気相成長装置 |
| KR20250133987A (ko) * | 2019-03-11 | 2025-09-09 | 어플라이드 머티어리얼스, 인코포레이티드 | 기판 프로세싱 챔버들을 위한 덮개 조립체 장치 및 방법들 |
| US12060652B2 (en) * | 2019-11-27 | 2024-08-13 | Sino Nitride Semiconductor Co., Ltd. | Linear showerhead for growing GaN |
| WO2022130926A1 (ja) * | 2020-12-14 | 2022-06-23 | 株式会社ニューフレアテクノロジー | 気相成長装置及び気相成長方法 |
| KR102678091B1 (ko) * | 2020-12-14 | 2024-06-26 | 가부시키가이샤 뉴플레어 테크놀로지 | 기상 성장 장치 및 기상 성장 방법 |
| CN114855278A (zh) * | 2022-05-25 | 2022-08-05 | 西北电子装备技术研究所(中国电子科技集团公司第二研究所) | 一种碳化硅外延炉的源载气输送结构 |
| CN117684152A (zh) * | 2022-09-05 | 2024-03-12 | 中微半导体设备(上海)股份有限公司 | 一种气体供给装置及成膜装置 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000144432A (ja) | 1998-11-04 | 2000-05-26 | Ebara Corp | ガス噴射ヘッド |
| DE102005055468A1 (de) | 2005-11-22 | 2007-05-24 | Aixtron Ag | Verfahren zum Abscheiden von Schichten in einem CVD-Reaktor sowie Gaseinlassorgan für einen CVD-Reaktor |
| JP2008155658A (ja) | 2006-12-20 | 2008-07-10 | Sumitomo Rubber Ind Ltd | 自動二輪車用タイヤ |
Family Cites Families (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0292896A (ja) * | 1988-09-28 | 1990-04-03 | Toshiba Corp | Si単結晶の製造方法 |
| JPH02205316A (ja) * | 1989-02-03 | 1990-08-15 | Sumitomo Metal Ind Ltd | エピタキシャル気相成長装置 |
| JPH02308534A (ja) * | 1989-05-24 | 1990-12-21 | Toshiba Corp | 半導体基板の薄膜形成装置 |
| JPH0383897A (ja) * | 1989-08-24 | 1991-04-09 | Mitsubishi Electric Corp | 気相成長装置 |
| JP2969596B2 (ja) * | 1989-10-06 | 1999-11-02 | アネルバ株式会社 | Cvd装置 |
| JP3406959B2 (ja) * | 1992-10-16 | 2003-05-19 | キヤノン株式会社 | マイクロ波プラズマcvd法による堆積膜形成方法 |
| JP2500773B2 (ja) * | 1993-06-30 | 1996-05-29 | 日本電気株式会社 | 気相成長装置 |
| JP3360098B2 (ja) * | 1995-04-20 | 2002-12-24 | 東京エレクトロン株式会社 | 処理装置のシャワーヘッド構造 |
| JP2000252270A (ja) * | 1999-03-01 | 2000-09-14 | Ebara Corp | ガス噴射ヘッド |
| JP2004076076A (ja) * | 2002-08-14 | 2004-03-11 | Konica Minolta Holdings Inc | 大気圧プラズマ処理装置及び大気圧プラズマ処理方法 |
| JP3869778B2 (ja) * | 2002-09-11 | 2007-01-17 | エア・ウォーター株式会社 | 成膜装置 |
| JP4794942B2 (ja) * | 2005-08-03 | 2011-10-19 | 古河機械金属株式会社 | 原子層堆積装置 |
| JP2008226857A (ja) * | 2008-05-16 | 2008-09-25 | Matsushita Electric Ind Co Ltd | プラズマ処理方法及び装置 |
| JP5026373B2 (ja) * | 2008-09-04 | 2012-09-12 | シャープ株式会社 | 気相成長装置及び気相成長方法 |
| JP5400795B2 (ja) * | 2008-11-21 | 2014-01-29 | 国立大学法人長岡技術科学大学 | 基板処理方法及び基板処理装置 |
| JP2011114081A (ja) * | 2009-11-25 | 2011-06-09 | Sharp Corp | 気相成長装置 |
| DE112011102327T5 (de) * | 2010-07-12 | 2013-06-06 | Ulvac, Inc. | Schichtbildungsvorrichtung |
| JP5542584B2 (ja) * | 2010-08-27 | 2014-07-09 | 株式会社ニューフレアテクノロジー | 成膜装置および成膜方法 |
| JP2013122067A (ja) | 2011-12-09 | 2013-06-20 | Cornes Technologies Ltd | マイクロ波プラズマ処理装置 |
| JP2013121885A (ja) | 2011-12-09 | 2013-06-20 | Cornes Technologies Ltd | マイクロ波プラズマ処理装置 |
| JP2013122066A (ja) | 2011-12-09 | 2013-06-20 | Cornes Technologies Ltd | マイクロ波プラズマ処理装置 |
| JP6096547B2 (ja) * | 2013-03-21 | 2017-03-15 | 東京エレクトロン株式会社 | プラズマ処理装置及びシャワープレート |
| JP6065762B2 (ja) | 2013-06-21 | 2017-01-25 | 株式会社デンソー | 炭化珪素半導体成膜装置およびそれを用いた成膜方法 |
| JP2016050164A (ja) | 2014-09-02 | 2016-04-11 | 昭和電工株式会社 | SiC化学気相成長装置 |
-
2016
- 2016-03-01 JP JP2016039270A patent/JP6664993B2/ja active Active
-
2017
- 2017-02-27 CN CN201780012924.5A patent/CN109075038B/zh active Active
- 2017-02-27 KR KR1020187028294A patent/KR102211543B1/ko active Active
- 2017-02-27 WO PCT/JP2017/007292 patent/WO2017150400A1/ja not_active Ceased
- 2017-02-27 DE DE112017001127.2T patent/DE112017001127B4/de active Active
- 2017-03-01 TW TW106106581A patent/TWI630282B/zh active
-
2018
- 2018-08-31 US US16/118,734 patent/US10896831B2/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000144432A (ja) | 1998-11-04 | 2000-05-26 | Ebara Corp | ガス噴射ヘッド |
| DE102005055468A1 (de) | 2005-11-22 | 2007-05-24 | Aixtron Ag | Verfahren zum Abscheiden von Schichten in einem CVD-Reaktor sowie Gaseinlassorgan für einen CVD-Reaktor |
| JP2008155658A (ja) | 2006-12-20 | 2008-07-10 | Sumitomo Rubber Ind Ltd | 自動二輪車用タイヤ |
Also Published As
| Publication number | Publication date |
|---|---|
| CN109075038A (zh) | 2018-12-21 |
| WO2017150400A1 (ja) | 2017-09-08 |
| KR20180128919A (ko) | 2018-12-04 |
| CN109075038B (zh) | 2023-08-15 |
| US10896831B2 (en) | 2021-01-19 |
| TWI630282B (zh) | 2018-07-21 |
| TW201739952A (zh) | 2017-11-16 |
| US20180374721A1 (en) | 2018-12-27 |
| DE112017001127T5 (de) | 2018-11-15 |
| KR102211543B1 (ko) | 2021-02-02 |
| JP2017157678A (ja) | 2017-09-07 |
| JP6664993B2 (ja) | 2020-03-13 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| DE112017001127B4 (de) | Filmausbildevorrichtung | |
| DE69126122T2 (de) | Methode und apparat zum wachsen von verbindungshalbleiterkristallen | |
| DE112010002199B4 (de) | Brausekopf für eine Vakuumschichtabscheidungsvorrichtung | |
| DE102014201554A1 (de) | Dampfphasenepitaxievorrichtung und Dampfphasenepitaxieverfahren | |
| DE112014002916B4 (de) | Vorrichtung zum Ausbilden eines Siliciumcarbidhalbleiterfilms und Filmbildungsverfahren, welches diese verwendet | |
| DE69732722T2 (de) | CVD Verfahren | |
| DE60305605T2 (de) | Schicht bildendes Apparat und Verfahren | |
| DE4005796C2 (de) | Vorrichtung zur Herstellung einer Dünnschicht | |
| DE60317147T2 (de) | Plasmabearbeitungsvorrichtung | |
| DE112006003315T5 (de) | Gaskopf und Dünnfilm-Herstellungsvorrichtung | |
| DE69433656T2 (de) | Verfahren zum Einleiten reaktiven Gases in eine Substratbearbeitungsvorrichtung | |
| DE112018001223T5 (de) | Epitaxialwachstumsvorrichtung, Vorwärmring und Verfahren zum Herstellen von Epitaxialwafern unter Verwendung dieser | |
| DE102019133704A1 (de) | Anlage zur chemischen sic-gasphasenabscheidung | |
| DE112005000715B4 (de) | Halbleitereinkristall-Herstellungsvorrichtung | |
| DE102015101462A1 (de) | Verfahren und Vorrichtung zum Abscheiden einer III-V-Halbleiterschicht | |
| DE112007000933T5 (de) | Katalytische, chemische Gasphasenabscheidungsvorrichtung | |
| DE102008010041A1 (de) | Schichtabscheidevorrichtung und Verfahren zu deren Betrieb | |
| DE112010000724T5 (de) | Plasmaverarbeitungsvorrichtung und Plasma-CVD-Filmbildungsverfahren | |
| DE102009043840A1 (de) | CVD-Reaktor mit streifenförmig verlaufenden Gaseintrittszonen sowie Verfahren zum Abscheiden einer Schicht auf einem Substrat in einem derartigen CVD-Reaktor | |
| DE102018124957A1 (de) | CVD-Reaktor mit auf Gaspolstern aufliegenden Substrathaltern | |
| WO2005080631A1 (de) | Einlasssystem für einen mocvd-reaktor | |
| DE102019132074A1 (de) | Anlage zur chemischen sic-gasphasenabscheidung und verfahren zur herstellung von sic-epitaxiewafern | |
| DE102018129105A1 (de) | SiC EPITAXIALWACHSTUMSVORRICHTUNG | |
| DE69133144T2 (de) | Reaktor zur Behandlung von Wafern | |
| DE60004290T2 (de) | Dosierrohr für Gasabgabe |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R012 | Request for examination validly filed | ||
| R081 | Change of applicant/patentee |
Owner name: RESONAC CORPORATION, JP Free format text: FORMER OWNERS: CENTRAL RESEARCH INSTITUTE OF ELECTRIC POWER INDUSTRY, TOKYO, JP; NUFLARE TECHNOLOGY, INC., YOKOHAMA-SHI, KANAGAWA-KEN, JP; SHOWA DENKO K.K., TOKYO, JP Owner name: NUFLARE TECHNOLOGY, INC., YOKOHAMA-SHI, JP Free format text: FORMER OWNERS: CENTRAL RESEARCH INSTITUTE OF ELECTRIC POWER INDUSTRY, TOKYO, JP; NUFLARE TECHNOLOGY, INC., YOKOHAMA-SHI, KANAGAWA-KEN, JP; SHOWA DENKO K.K., TOKYO, JP Owner name: SHOWA DENKO K.K., JP Free format text: FORMER OWNERS: CENTRAL RESEARCH INSTITUTE OF ELECTRIC POWER INDUSTRY, TOKYO, JP; NUFLARE TECHNOLOGY, INC., YOKOHAMA-SHI, KANAGAWA-KEN, JP; SHOWA DENKO K.K., TOKYO, JP |
|
| R082 | Change of representative |
Representative=s name: HOFFMANN - EITLE PATENT- UND RECHTSANWAELTE PA, DE |
|
| R016 | Response to examination communication | ||
| R081 | Change of applicant/patentee |
Owner name: RESONAC CORPORATION, JP Free format text: FORMER OWNERS: NUFLARE TECHNOLOGY, INC., YOKOHAMA-SHI, KANAGAWA-KEN, JP; SHOWA DENKO K.K., TOKYO, JP Owner name: NUFLARE TECHNOLOGY, INC., YOKOHAMA-SHI, JP Free format text: FORMER OWNERS: NUFLARE TECHNOLOGY, INC., YOKOHAMA-SHI, KANAGAWA-KEN, JP; SHOWA DENKO K.K., TOKYO, JP |
|
| R018 | Grant decision by examination section/examining division | ||
| R020 | Patent grant now final | ||
| R079 | Amendment of ipc main class |
Free format text: PREVIOUS MAIN CLASS: H01L0021205000 Ipc: H10P0014240000 |