CN104749816A - 一种显示基板的制作方法、显示基板和显示装置 - Google Patents

一种显示基板的制作方法、显示基板和显示装置 Download PDF

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CN104749816A
CN104749816A CN201510176806.0A CN201510176806A CN104749816A CN 104749816 A CN104749816 A CN 104749816A CN 201510176806 A CN201510176806 A CN 201510176806A CN 104749816 A CN104749816 A CN 104749816A
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black matrix
making
photoresist
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metal
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CN104749816B (zh
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张锋
曹占锋
姚琪
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BOE Technology Group Co Ltd
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Abstract

本发明提供了一种显示基板的制作方法、显示基板和显示装置,其中,所述制作方法包括形成黑矩阵的步骤,所述形成黑矩阵的步骤具体包括:形成用于制作所述黑矩阵的金属图形,所述金属图形采用两性金属或两性金属合金;采用碱性溶液对所述金属图形进行处理,形成具有粗糙表面的所述黑矩阵。本发明能够形成具有粗糙表面的金属黑矩阵,降低了金属材料的反射率,进一步地,降低了显示面板对外界环境光线的反射率,提高了显示对比度,改善了画面质量。

Description

一种显示基板的制作方法、显示基板和显示装置
技术领域
本发明涉及液晶显示领域,尤其涉及一种显示基板的制作方法、显示基板和显示装置。
背景技术
液晶显示器件LCD以及有机电致发光器件OLED等显示器件已经成为人们生活中的必需品并悄悄的改变着人们的生活,人们对显示器件的分辨率、色域、亮度等品质的要求也越来越高,最近已有公司开发出500像素密度(PPI)甚至600PPI的产品。
现有技术的LCD显示器件是通过将阵列基板和滤光片基板进行成盒工艺粘贴在一起,在成盒时阵列基板和滤光片基板对应的图案之间会存在一定的偏差,该偏差会导致LCD显示器件开口率降低、漏光等问题。另外,LCD器件PPI越高,开口率的降低越严重,与此同时产品的亮度、色域等都会有所降低,能耗会有所增加。
为了消除阵列基板和滤光片基板之间的偏差,提高开口率、降低成本,面板厂商开发了一种滤光片以及黑矩阵位于阵列基板的技术,也就是COA技术。COA技术通过将黑矩阵设置于阵列基板上数据线、栅线、薄膜晶体管上方,能够减小成盒时阵列基板与滤光片基板对应的图案之间的偏差,能够提高开口率,降低成本,提高产品显示品质。
现有COA技术的结构如图1-3所示,其中,黑矩阵多是由包覆碳黑颗粒的有机树脂组成,另外为了提高开口率,降低寄生电容,黑矩阵也可以采用金属材料来制作。当采用金属材料来制作黑矩阵时,由于金属材料具有一定的反射率,因此显示面板中的金属黑矩阵会反光,造成显示对比度的下降,影响画面质量,以10.1寸显示面板为例,如图4所示,当采用金属材料来制作黑矩阵时,显示面板的反射率相对于采用碳黑颗粒的黑矩阵大幅增加,并且显示面板的反射率与金属黑矩阵的面积大小相关,面积越大,反射率越大。
发明内容
本发明的目的是提供一种显示基板的制作方法、显示基板和显示装置,形成具有粗糙表面的金属黑矩阵,降低金属材料的反射率,进一步地,降低显示面板对外界环境光线的反射率,提高了显示对比度,改善画面质量。
为了实现上述目的,本发明实施例提供了一种显示基板的制作方法,其中,所述制作方法包括形成黑矩阵的步骤,所述形成黑矩阵的步骤具体包括:
形成用于制作所述黑矩阵的金属图形,所述金属图形采用两性金属或两性金属合金;
采用碱性溶液对所述金属图形进行处理,形成具有粗糙表面的所述黑矩阵。
上述的制作方法,其中,所述两性金属为铝、锌或铍。
上述的制作方法,其中,所述碱性溶液为四甲基氢氧化铵TMAH或氢氧化钾KOH溶液,其浓度为0.01%-5%。
上述的制作方法,其中,所述碱性溶液为浓度是0.04%的KOH溶液。
上述的制作方法,其中,在形成用于制作所述黑矩阵的金属图形之后,所述方法还包括:
在未剥离第一光刻胶的所述金属图形上形成第一膜层;
剥离所述第一光刻胶,以剥离在所述第一光刻胶上方区域的所述第一膜层;
在所述第一膜层余下的部分上涂覆第二光刻胶,并对所述第二光刻胶进行曝光;
所述采用碱性溶液对所述金属图形进行处理,形成具有粗糙表面的所述黑矩阵具体为:
利用对曝光后的所述第二光刻胶进行显影的碱性显影液对所述金属图形进行处理,形成具有粗糙表面的所述黑矩阵。
上述的制作方法,其中,所述显示基板为COA基板。
上述的制作方法,其中,所述第一膜层为用于形成像素电极或公共电极的透明导电层。
为了实现上述目的,本发明实施例还提供了一种采用上述任一项所述制作方法制作的显示基板,其中,所述显示基板上形成有具有粗糙表面的金属黑矩阵。
为了实现上述目的,本发明实施例还提供了一种显示装置,其中,所述显示装置包括上述所述的显示基板。
在本发明实施例中,提供了一种显示基板,该显示基板采用两性金属或两性金属合金材料来制作黑矩阵,并采用碱性溶液对金属黑矩阵表面进行处理,由于两性金属会与碱性溶液发生反应,使金属表面出现腐蚀现象,因此原本平整且反射率高的金属表面会变得粗糙不平,从而降低了金属材料的反射率,进一步地,降低了显示面板对外界环境光线的反射率,提高显示对比度,改善了画面质量。
附图说明
图1为现有技术中COA阵列基板的俯视图;
图2为现有技术中COA阵列基板沿A-A’的截面图;
图3为现有技术中COA阵列基板沿B-B’的截面图;
图4为具备不同黑矩阵的显示面板的反射率示意图;
图5为本发明实施例提供的形成黑矩阵的流程示意图;
图6为本发明实施例提供的一种COA阵列基板沿A-A’的截面图;
图7为本发明实施例提供的一种COA阵列基板沿B-B’的截面图;
图8为本发明实施例提供的另一种COA阵列基板沿A-A’的截面图;
图9为本发明实施例提供的再一种COA阵列基板沿A-A’的截面图;
图10为本发明实施例提供的一种制备具有粗糙表面的金属黑矩阵的示意图;
其中,主要组件符号说明:
100:基板、1:栅线、2:栅绝缘层、3:有源层、4:数据线以及源漏极、5:第一钝化层、6:R/G/B彩色滤光片、7:有机膜、8:公共电极、9:第二钝化层、10:像素电极、11:金属黑矩阵、12:反射光线、13:第一光刻胶、14:第二光刻胶。
具体实施方式
为使本发明实施例要解决的技术问题、技术方案和优点更加清楚,下面将结合附图及具体实施例进行详细描述。
本发明实施例提供了一种显示基板的制作方法,其中,所述制作方法包括形成黑矩阵的步骤,所述形成黑矩阵的步骤如图5所示,具体包括:
步骤51,形成用于制作所述黑矩阵的金属图形,所述金属图形采用两性金属或两性金属合金;
步骤52,采用碱性溶液对所述金属图形进行处理,形成具有粗糙表面的所述黑矩阵。
在本发明实施例中,采用两性金属或两性金属合金材料来制作黑矩阵,并采用碱性溶液对金属黑矩阵表面进行处理,由于两性金属或两性金属合金材料会与碱性溶液发生反应,使金属表面出现腐蚀现象,因此原本平整且反射率高的金属表面会变得粗糙不平,从而降低了金属材料的反射率,进一步地,降低了显示面板对外界环境光线的反射率,提高了显示对比度,改善了画面质量。
其中优选地,所述两性金属为铝、锌、铍等金属,两性金属合金为铝、锌、铍等的金属合金。所述碱性溶液为四甲基氢氧化铵TMAH或氢氧化钾KOH等显示基板制备工艺中常用的碱性溶液,其浓度为0.01%-5%。进一步地,所述碱性溶液为浓度是0.04%的KOH溶液。
由于铝、锌或铍等两性金属会与碱性溶液中的OH-发生反应,因此使得金属表面出现腐蚀现象。以金属铝为例,其与碱性溶液中的OH-反应的方程式如下:
2Al+2OH-+6H2O=2Al(OH)4 -+3H2
2Al+2OH-+2H2O=2AlO2 -+3H2
2Al+6OH-+6H2O=2Al(OH)6 3-+3H2
在本发明实施例中,所述显示基板优选地为COA基板。
下面介绍一下采用本发明实施例提供的制作黑矩阵的方法来制作所述COA基板的过程,其中COA基板A-A’截面图以及B-B’截面图分别如图6和7所示。具体步骤包括:
步骤61,形成包括栅极和栅线1的栅金属层的图形;
具体的,可以采用磁控溅射的方法,在基板100例如玻璃基板或石英基板上沉积一层厚度在1000埃至4000埃的金属薄膜,该金属薄膜通常可以采用钼、铝、铝镍合金、钼钨合金、铬、或铜等金属,也可以使用上述几种材料的组合结构。然后,在金属薄膜上涂覆光刻胶,利用掩模板进行曝光后,通过显影、刻蚀、剥离光刻胶等构图工艺处理,在基板100上形成栅金属层的图形。
步骤62,在栅金属层上形成一层栅绝缘层2;
具体的,可以利用化学气相沉积法或者磁控溅射的方法在基板100上沉积厚度为1000埃至6000埃的栅绝缘层薄膜,该栅绝缘层薄膜的材料通常是氮化硅,也可以使用氧化硅和氮氧化硅等。
步骤63,在栅绝缘层2上依次形成有源层3、数据线以及源极和漏极4;
具体的,可以利用化学气相沉积法在栅绝缘层2上沉积金属氧化物半导体薄膜,然后对金属氧化物半导体薄膜进行构图工艺形成有源层3,即在金属氧化物半导体薄膜上涂覆光刻胶后,用掩模板对金属氧化物半导体薄膜进行曝光、显影、刻蚀形成有源层3即可。
进一步地,在基板上沉积一层类似于栅金属的厚度在1000埃至4000埃的金属薄膜,通过构图工艺处理形成数据线以及源极和漏极4。
步骤64,制作覆盖有源层3、数据线以及源极和漏极4的第一钝化层5;
具体的,在整个基板上涂覆一层厚度在1000埃至3000埃的第一钝化层5,其材料通常是氮化硅或透明的有机树脂材料,通过构图工艺形成第一钝化层5的图形。
步骤65,进行R/G/B彩色滤光片6的制备;
步骤66,采用有机膜对彩色滤光片6进行平坦化处理,并通过构图工艺形成有机模7的图形;
步骤67,在完成步骤66的基板表面进行透明导电薄膜的沉积,通过构图工艺形成公共电极8的图形;
具体的,可以采用磁控溅射的方法沉积一层厚度在300埃至500埃之间的ITO或者IZO,之后经过曝光、显影、刻蚀形成公共电极8。
步骤68,在完成步骤67的基板表面进行铝、锌或铍等两性金属,或者其金属合金的沉积,具体的,通过构图工艺形成厚度在1000埃至4000埃的金属图形;并采用0.04%KOH溶液对金属图形的表面进行处理,形成具有粗糙表面的金属黑矩阵11;
由于两性金属会与碱性溶液中的OH-发生反应,使金属图形表面出现腐蚀现象,因此原本平整且反射率高的金属表面会变得粗糙不平,从而会降低金属材料的反射率。
步骤69,在完成步骤68的基板表面沉积第二钝化层9,并通过构图工艺形成第二钝化层9的图形;
步骤70,采用磁控溅射的方法在第二钝化层9上沉积ITO或者IZO,然后通过构图工艺形成像素电极10的图形。
当然,步骤68还可以在步骤70形成像素电极10之后执行,即金属黑矩阵11还可以形成于像素电极10上方,如图8所示。
另外,本发明实施例提供的上述黑矩阵的制作方法还可以同样适用于IPS、TN或者VA模式中采用金属材料制作黑矩阵的情形。
在上述制作过程中,可以在制作所述黑矩阵的金属图形后,单独采用碱性溶液对金属图形表面进行腐蚀处理,以形成具有粗糙表面的金属黑矩阵11。但是,为了简化上述显示基板的制作流程,优选地,在形成用于制作所述黑矩阵的金属图形之后,所述方法还包括:
在未剥离第一光刻胶13的所述金属图形上形成第一膜层;
剥离所述第一光刻胶13,以剥离在所述第一光刻胶13上方区域的所述第一膜层;
在所述第一膜层余下的部分上涂覆第二光刻胶14,并对所述第二光刻胶14进行曝光;
所述步骤52采用碱性溶液对所述金属图形进行处理,形成具有粗糙表面的所述黑矩阵具体为:
利用对曝光后的所述第二光刻胶14进行显影的碱性显影液对所述金属图形进行处理,形成具有粗糙表面的所述黑矩阵。
即在本发明实施例中,可以在形成黑矩阵的金属图形后先不剥离其上的第一光刻胶13,同时继续形成第一膜层,优选地,第一膜层为用于形成像素电极10或公共电极8的透明导电层,在形成所述第一膜层后,剥离所述第一光刻胶13,以剥离掉所述第一膜层处于所述金属图形上方区域内的部分,然后在第一膜层上涂覆第二光刻胶14,并对所述第二光刻胶14进行曝光;利用对曝光后的所述第二光刻胶14进行显影的碱性显影液对所述金属图形进行处理,形成具有粗糙表面的金属黑矩阵11。
其中以利用形成像素电极10时的显影液对金属黑矩阵11的表面进行腐蚀为例,COA基板A-A’截面图如图9所示,金属黑矩阵11和像素电极10的形成过程如图10所示。具体步骤包括:
步骤101,在形成了第二钝化层9的基板表面进行铝、锌或铍等两性金属,或者其金属合金的沉积,采用现有的工艺制作形成黑矩阵的金属图形,但是不剥离金属图形上方的第一光刻胶13;
步骤102,采用磁控溅射的方法在第一光刻胶上方沉积用于制作像素电极10的ITO或者IZO;
步骤103,剥离第一光刻胶13,与此同时像素电极10处于第一光刻胶13上方的部分也被剥离;
步骤104,在所述像素电极10余下的部分上涂覆第二光刻胶14,并对所述第二光刻胶14进行曝光,利用对曝光后的所述第二光刻胶14进行显影的碱性显影液,例如浓度为0.04%的KOH溶液,在对第二光刻胶14进行显影的同时,对所述金属图形进行处理,形成具有粗糙表面的金属黑矩阵11;
步骤105,对ITO层进行刻蚀以形成像素电极10的图形,并剥离第二光刻胶14。
上述过程形成黑矩阵的金属图形后先不对其表面进行腐蚀,而是利用在其后形成的像素电极10的碱性显影液进行黑矩阵的腐蚀处理以及光刻胶的显影。即具有粗糙表面的金属黑矩阵11和像素电极10同层,金属黑矩阵11表面的腐蚀处理与像素电极10的显影过程同步,简化了上述COA基板的制作流程。
本发明实施例还提供了一种采用上述任一项所述制作方法制作的显示基板,其中,所述显示基板上形成有具有粗糙表面的金属黑矩阵。
本发明实施例还提供了一种显示装置,其中,所述显示装置包括上述所述的显示基板。
以上所述仅是本发明的优选实施方式,应当指出,对于本技术领域的普通技术人员来说,在不脱离本发明原理的前提下,还可以做出若干改进和润饰,这些改进和润饰也应视为本发明的保护范围。

Claims (9)

1.一种显示基板的制作方法,其特征在于,所述制作方法包括形成黑矩阵的步骤,所述形成黑矩阵的步骤具体包括:
形成用于制作所述黑矩阵的金属图形,所述金属图形采用两性金属或两性金属合金;
采用碱性溶液对所述金属图形进行处理,形成具有粗糙表面的所述黑矩阵。
2.如权利要求1所述的制作方法,其特征在于,所述两性金属为铝、锌或铍。
3.如权利要求1所述的制作方法,其特征在于,所述碱性溶液为四甲基氢氧化铵TMAH或氢氧化钾KOH溶液,所述碱性溶液的浓度为0.01%-5%。
4.如权利要求3所述的制作方法,其特征在于,所述碱性溶液为浓度是0.04%的KOH溶液。
5.如权利要求1所述的制作方法,其特征在于,在形成用于制作所述黑矩阵的金属图形之后,所述方法还包括:
在未剥离第一光刻胶的所述金属图形上形成第一膜层;
剥离所述第一光刻胶,以剥离在所述第一光刻胶上方区域的所述第一膜层;
在所述第一膜层余下的部分上涂覆第二光刻胶,并对所述第二光刻胶进行曝光;
所述采用碱性溶液对所述金属图形进行处理,形成具有粗糙表面的所述黑矩阵具体为:
利用对曝光后的所述第二光刻胶进行显影的碱性显影液对所述金属图形进行处理,形成具有粗糙表面的所述黑矩阵。
6.如权利要求5所述的制作方法,其特征在于,所述显示基板为COA基板。
7.如权利要求6所述的制作方法,其特征在于,所述第一膜层为用于形成像素电极或公共电极的透明导电层。
8.一种采用如权利要求1-7中任一项所述制作方法制作的显示基板,其特征在于,所述显示基板上形成有具有粗糙表面的金属黑矩阵。
9.一种显示装置,其特征在于,所述显示装置包括权利要求8所述的显示基板。
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