CN102973243B - 用于扫频源光学相干断层的方法和装置 - Google Patents
用于扫频源光学相干断层的方法和装置 Download PDFInfo
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- CN102973243B CN102973243B CN201210459064.9A CN201210459064A CN102973243B CN 102973243 B CN102973243 B CN 102973243B CN 201210459064 A CN201210459064 A CN 201210459064A CN 102973243 B CN102973243 B CN 102973243B
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Classifications
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- G—PHYSICS
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- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/0209—Low-coherence interferometers
- G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B5/00—Measuring for diagnostic purposes; Identification of persons
- A61B5/0059—Measuring for diagnostic purposes; Identification of persons using light, e.g. diagnosis by transillumination, diascopy, fluorescence
- A61B5/0062—Arrangements for scanning
- A61B5/0066—Optical coherence imaging
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B5/00—Measuring for diagnostic purposes; Identification of persons
- A61B5/0059—Measuring for diagnostic purposes; Identification of persons using light, e.g. diagnosis by transillumination, diascopy, fluorescence
- A61B5/0073—Measuring for diagnostic purposes; Identification of persons using light, e.g. diagnosis by transillumination, diascopy, fluorescence by tomography, i.e. reconstruction of 3D images from 2D projections
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
- G01B9/02002—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
- G01B9/02004—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies using frequency scans
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02041—Interferometers characterised by particular imaging or detection techniques
- G01B9/02043—Imaging of the Fourier or pupil or back focal plane, i.e. angle resolved imaging
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- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02062—Active error reduction, i.e. varying with time
- G01B9/02067—Active error reduction, i.e. varying with time by electronic control systems, i.e. using feedback acting on optics or light
- G01B9/02069—Synchronization of light source or manipulator and detector
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/25—Fabry-Perot in interferometer, e.g. etalon, cavity
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- G—PHYSICS
- G01—MEASURING; TESTING
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- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/60—Reference interferometer, i.e. additional interferometer not interacting with object
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- H—ELECTRICITY
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- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
- H01S3/106—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling devices placed within the cavity
- H01S3/1062—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling devices placed within the cavity using a controlled passive interferometer, e.g. a Fabry-Perot etalon
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/14—External cavity lasers
- H01S5/141—External cavity lasers using a wavelength selective device, e.g. a grating or etalon
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/14—External cavity lasers
- H01S5/146—External cavity lasers using a fiber as external cavity
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/50—Amplifier structures not provided for in groups H01S5/02 - H01S5/30
- H01S5/5036—Amplifier structures not provided for in groups H01S5/02 - H01S5/30 the arrangement being polarisation-selective
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- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
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- Optics & Photonics (AREA)
- Automation & Control Theory (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Eye Examination Apparatus (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US87988007P | 2007-01-10 | 2007-01-10 | |
| US60/879,880 | 2007-01-10 | ||
| CN2008800019509A CN101600388B (zh) | 2007-01-10 | 2008-01-10 | 用于扫频源光学相干断层的方法和装置 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2008800019509A Division CN101600388B (zh) | 2007-01-10 | 2008-01-10 | 用于扫频源光学相干断层的方法和装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102973243A CN102973243A (zh) | 2013-03-20 |
| CN102973243B true CN102973243B (zh) | 2015-11-25 |
Family
ID=39495523
Family Applications (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201210459064.9A Active CN102973243B (zh) | 2007-01-10 | 2008-01-10 | 用于扫频源光学相干断层的方法和装置 |
| CN201510714070.8A Active CN105581776B (zh) | 2007-01-10 | 2008-01-10 | 用于可调谐滤波器线性化的装置和方法以及线性化可调谐滤波器 |
| CN2008800019509A Active CN101600388B (zh) | 2007-01-10 | 2008-01-10 | 用于扫频源光学相干断层的方法和装置 |
Family Applications After (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510714070.8A Active CN105581776B (zh) | 2007-01-10 | 2008-01-10 | 用于可调谐滤波器线性化的装置和方法以及线性化可调谐滤波器 |
| CN2008800019509A Active CN101600388B (zh) | 2007-01-10 | 2008-01-10 | 用于扫频源光学相干断层的方法和装置 |
Country Status (6)
| Country | Link |
|---|---|
| US (5) | US7916387B2 (enExample) |
| EP (3) | EP3785615B1 (enExample) |
| JP (4) | JP5269809B2 (enExample) |
| CN (3) | CN102973243B (enExample) |
| ES (3) | ES2534572T3 (enExample) |
| WO (1) | WO2008086017A1 (enExample) |
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| US20150192405A1 (en) | 2015-07-09 |
| EP3785615A1 (en) | 2021-03-03 |
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| US20180003482A1 (en) | 2018-01-04 |
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| EP2106240A1 (en) | 2009-10-07 |
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| ES2534572T3 (es) | 2015-04-24 |
| US20080165366A1 (en) | 2008-07-10 |
| JP2010515919A (ja) | 2010-05-13 |
| EP2106240B1 (en) | 2015-04-01 |
| ES2847098T3 (es) | 2021-07-30 |
| CN105581776B (zh) | 2018-10-16 |
| JP6130434B2 (ja) | 2017-05-17 |
| EP3785615B1 (en) | 2024-12-04 |
| EP2897239A1 (en) | 2015-07-22 |
| CN102973243A (zh) | 2013-03-20 |
| JP2017122740A (ja) | 2017-07-13 |
| JP5750138B2 (ja) | 2015-07-15 |
| US20110216325A1 (en) | 2011-09-08 |
| CN101600388A (zh) | 2009-12-09 |
| JP5269809B2 (ja) | 2013-08-21 |
| US9702687B2 (en) | 2017-07-11 |
| US20110101207A1 (en) | 2011-05-05 |
| CN101600388B (zh) | 2013-01-02 |
| US8325419B2 (en) | 2012-12-04 |
| ES3007239T3 (en) | 2025-03-19 |
| JP2013190438A (ja) | 2013-09-26 |
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