CN102576700A - 在适于堆叠的集成电路中使用间断式硅过孔 - Google Patents
在适于堆叠的集成电路中使用间断式硅过孔 Download PDFInfo
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- CN102576700A CN102576700A CN201080039115.1A CN201080039115A CN102576700A CN 102576700 A CN102576700 A CN 102576700A CN 201080039115 A CN201080039115 A CN 201080039115A CN 102576700 A CN102576700 A CN 102576700A
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Abstract
Description
TSV输入 | 编码芯片ID |
100000… | 000 |
110000… | 001 |
111000… | 010 |
111100… | 011 |
111110… | 100 |
装置ID | 命令 | 地址 | 地址 | 数据 | 数据 | 数据 | …… |
装置ID | 命令 | 数据 |
11111111 | 11111111 | 00000000 |
装置ID | 命令 | 地址1 | 地址2 | 数据1 | 数据2 |
00000000 | 00000001 | 00000000 | 00000000 | 01010101 | 10101010 |
00000001 | 00000001 | 00000000 | 00000000 | 01010101 | 10101010 |
00000010 | 00000001 | 00000000 | 00000000 | 01010101 | 10101010 |
………… | |||||
00001111 | 00000001 | 00000000 | 00000000 | 01010101 | 10101010 |
00000000 | 00000000 | 00000000 | 00000000 | ||
00000001 | 00000000 | 00000000 | 00000000 | ||
00000010 | 00000000 | 00000000 | 00000000 | ||
……… | |||||
00001111 | 00000000 | 00000000 | 00000000 |
命令 | 数据 | 说明 |
10000000 | 清除诊断命令 | |
10000001 | 输出命令输入到数据引脚 | |
10000010 | 输出地址输入到数据引脚 | |
10000100 | 清除冗余寄存器 | |
10000101 | Bit# | 跳过命令比特 |
10000110 | Bit# | 跳过地址比特 |
10000111 | But# | 跳过数据比特 |
11111111 | 设置装置ID |
Claims (33)
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US23921109P | 2009-09-02 | 2009-09-02 | |
US61/239211 | 2009-09-02 | ||
US12/757540 | 2010-04-09 | ||
US12/757,540 US8400781B2 (en) | 2009-09-02 | 2010-04-09 | Using interrupted through-silicon-vias in integrated circuits adapted for stacking |
PCT/CA2010/001321 WO2011026218A1 (en) | 2009-09-02 | 2010-08-27 | Using interrupted through-silicon-vias in integrated circuits adapted for stacking |
Publications (1)
Publication Number | Publication Date |
---|---|
CN102576700A true CN102576700A (zh) | 2012-07-11 |
Family
ID=43623938
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201080039115.1A Pending CN102576700A (zh) | 2009-09-02 | 2010-08-27 | 在适于堆叠的集成电路中使用间断式硅过孔 |
Country Status (7)
Country | Link |
---|---|
US (4) | US8400781B2 (zh) |
EP (1) | EP2474030A4 (zh) |
JP (1) | JP2013504183A (zh) |
KR (1) | KR20120090955A (zh) |
CN (1) | CN102576700A (zh) |
TW (2) | TW201423937A (zh) |
WO (1) | WO2011026218A1 (zh) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
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CN102809724A (zh) * | 2012-07-31 | 2012-12-05 | 工业和信息化部电子第五研究所 | 电路板组装工艺质量评估试验组件及其设计方法 |
CN103066041A (zh) * | 2012-12-17 | 2013-04-24 | 三星半导体(中国)研究开发有限公司 | 芯片堆叠结构及其制造方法 |
CN104517945A (zh) * | 2013-10-03 | 2015-04-15 | 南亚科技股份有限公司 | 多晶粒堆叠结构 |
CN104716056A (zh) * | 2013-12-17 | 2015-06-17 | 中芯国际集成电路制造(上海)有限公司 | 一种晶圆键合方法 |
CN107483150A (zh) * | 2017-08-10 | 2017-12-15 | 北京信息科技大学 | 基于tsv传输的信道级联码编码方法和信号传输方法及装置 |
CN109326580A (zh) * | 2018-11-20 | 2019-02-12 | 中国科学院苏州纳米技术与纳米仿生研究所南昌研究院 | 一种多芯片封装互联结构及多芯片封装互联方法 |
CN109585400A (zh) * | 2017-09-28 | 2019-04-05 | 三星电子株式会社 | 堆叠半导体装置、系统及在半导体装置中传输信号的方法 |
CN115802602A (zh) * | 2023-02-08 | 2023-03-14 | 深圳时识科技有限公司 | 三维堆叠装置及方法、电路板和电子设备 |
Families Citing this family (71)
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KR100713121B1 (ko) * | 2005-09-27 | 2007-05-02 | 한국전자통신연구원 | 칩과 이를 이용한 칩 스택 및 그 제조방법 |
US9064717B2 (en) * | 2008-09-26 | 2015-06-23 | International Business Machines Corporation | Lock and key through-via method for wafer level 3D integration and structures produced thereby |
US9171824B2 (en) | 2009-05-26 | 2015-10-27 | Rambus Inc. | Stacked semiconductor device assembly |
CN102598255A (zh) | 2009-10-23 | 2012-07-18 | 拉姆伯斯公司 | 层叠的半导体器件 |
US8012802B2 (en) * | 2010-02-04 | 2011-09-06 | Headway Technologies, Inc. | Method of manufacturing layered chip package |
US8102064B2 (en) * | 2010-04-08 | 2012-01-24 | Nanya Technology Corp. | Electrical alignment mark set and method for aligning wafer stack |
WO2011156887A1 (en) * | 2010-06-17 | 2011-12-22 | Mosaid Technologies Incorporated | Semiconductor device with through-silicon vias |
KR101124251B1 (ko) * | 2010-07-07 | 2012-03-27 | 주식회사 하이닉스반도체 | 적층된 칩들에 아이디를 부여하는 시스템, 반도체 장치 및 그 방법 |
KR101683814B1 (ko) * | 2010-07-26 | 2016-12-08 | 삼성전자주식회사 | 관통 전극을 구비하는 반도체 장치 |
JP5650984B2 (ja) * | 2010-10-29 | 2015-01-07 | ピーエスフォー ルクスコ エスエイアールエルPS4 Luxco S.a.r.l. | 半導体装置 |
WO2012061633A2 (en) | 2010-11-03 | 2012-05-10 | Netlist, Inc. | Method and apparatus for optimizing driver load in a memory package |
JP2012099714A (ja) * | 2010-11-04 | 2012-05-24 | Elpida Memory Inc | 半導体チップ及びこれを備える半導体装置 |
US8516409B2 (en) * | 2010-11-11 | 2013-08-20 | International Business Machines Corporation | Implementing vertical die stacking to distribute logical function over multiple dies in through-silicon-via stacked semiconductor device |
CN103229240B (zh) | 2010-11-23 | 2015-05-20 | 考文森智财管理公司 | 用于共享集成电路装置中的内部电源的方法和设备 |
JP5654855B2 (ja) * | 2010-11-30 | 2015-01-14 | ピーエスフォー ルクスコ エスエイアールエルPS4 Luxco S.a.r.l. | 半導体装置 |
JP2012155814A (ja) | 2011-01-28 | 2012-08-16 | Elpida Memory Inc | 半導体装置及びこれを備える情報処理システム |
US8547769B2 (en) | 2011-03-31 | 2013-10-01 | Intel Corporation | Energy efficient power distribution for 3D integrated circuit stack |
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EP2474030A4 (en) | 2013-12-04 |
KR20120090955A (ko) | 2012-08-17 |
US9780073B2 (en) | 2017-10-03 |
TW201126673A (en) | 2011-08-01 |
TW201423937A (zh) | 2014-06-16 |
TWI447875B (zh) | 2014-08-01 |
US8711573B2 (en) | 2014-04-29 |
US20130169343A1 (en) | 2013-07-04 |
WO2011026218A9 (en) | 2011-04-21 |
EP2474030A1 (en) | 2012-07-11 |
JP2013504183A (ja) | 2013-02-04 |
US20140227829A1 (en) | 2014-08-14 |
US20110050320A1 (en) | 2011-03-03 |
US9190369B2 (en) | 2015-11-17 |
US8400781B2 (en) | 2013-03-19 |
WO2011026218A1 (en) | 2011-03-10 |
US20160099234A1 (en) | 2016-04-07 |
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