CN102076881B - 用于在衬底上形成电子电路的装置 - Google Patents
用于在衬底上形成电子电路的装置 Download PDFInfo
- Publication number
- CN102076881B CN102076881B CN200980124530.4A CN200980124530A CN102076881B CN 102076881 B CN102076881 B CN 102076881B CN 200980124530 A CN200980124530 A CN 200980124530A CN 102076881 B CN102076881 B CN 102076881B
- Authority
- CN
- China
- Prior art keywords
- substrate
- cluster tool
- support surface
- transport element
- workshop section
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
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Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/32—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations between different workstations
- H10P72/3212—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations between different workstations the substrates to be conveyed not being semiconductor wafers or large planar substrates, e.g. chips or lead frames
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4418—Methods for making free-standing articles
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/54—Apparatus specially adapted for continuous coating
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0442—Apparatus for placing on an insulating substrate, e.g. tape
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0446—Apparatus for mounting on conductive members, e.g. leadframes or conductors on insulating substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0451—Apparatus for manufacturing or treating in a plurality of work-stations
- H10P72/0452—Apparatus for manufacturing or treating in a plurality of work-stations characterised by the layout of the process chambers
- H10P72/0456—Apparatus for manufacturing or treating in a plurality of work-stations characterised by the layout of the process chambers in-line arrangement
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/33—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations into and out of processing chamber
- H10P72/3314—Continuous loading and unloading into and out of a processing chamber, e.g. transporting belts within processing chambers
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Drying Of Solid Materials (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| ITUD2008A000136 | 2008-06-13 | ||
| IT000136A ITUD20080136A1 (it) | 2008-06-13 | 2008-06-13 | Impianto per la lavorazione di piastre per circuiti elettronici |
| PCT/EP2009/057317 WO2009150239A1 (en) | 2008-06-13 | 2009-06-12 | Plant for forming electronic circuits on substrates |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102076881A CN102076881A (zh) | 2011-05-25 |
| CN102076881B true CN102076881B (zh) | 2014-03-26 |
Family
ID=40302209
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN200980124530.4A Expired - Fee Related CN102076881B (zh) | 2008-06-13 | 2009-06-12 | 用于在衬底上形成电子电路的装置 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US20110165316A1 (https=) |
| EP (1) | EP2304073A1 (https=) |
| JP (1) | JP2011523224A (https=) |
| KR (1) | KR20110022051A (https=) |
| CN (1) | CN102076881B (https=) |
| IT (1) | ITUD20080136A1 (https=) |
| WO (1) | WO2009150239A1 (https=) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20090308860A1 (en) * | 2008-06-11 | 2009-12-17 | Applied Materials, Inc. | Short thermal profile oven useful for screen printing |
| US9090114B1 (en) * | 2010-09-08 | 2015-07-28 | Brian A Stumm | Machine including LED-based UV radiation sources to process coatings |
| ITUD20110164A1 (it) * | 2011-10-14 | 2013-04-15 | Applied Materials Italia Srl | Impianto e procedimento per la produzione di moduli fotovoltaici |
| JP2013137284A (ja) * | 2011-12-28 | 2013-07-11 | Advantest Corp | 電子部品移載装置、電子部品ハンドリング装置、及び電子部品試験装置 |
| JP2013137285A (ja) | 2011-12-28 | 2013-07-11 | Advantest Corp | ピッチ変更装置、電子部品ハンドリング装置、及び電子部品試験装置 |
| WO2013103609A1 (en) * | 2012-01-03 | 2013-07-11 | Applied Materials, Inc. | Advanced platform for passivating crystalline silicon solar cells |
| NL2009147C2 (nl) * | 2012-07-06 | 2014-01-07 | Fico Bv | Inrichting en werkwijze voor het separeren, ten minste gedeeltelijk drogen en inspecteren van elektronische componenten. |
| DE102013104577B3 (de) * | 2013-05-03 | 2014-07-24 | Heraeus Noblelight Gmbh | Vorrichtung zum Trocknen und Sintern metallhaltiger Tinte auf einem Substrat |
| CN104461153A (zh) * | 2014-12-23 | 2015-03-25 | 合肥鑫晟光电科技有限公司 | Ogs触摸屏及其制作装置和方法 |
| ITUB20152223A1 (it) * | 2015-07-16 | 2017-01-16 | Eles Semiconductor Equipment S P A | Sistema di test integrato |
| CN107393850A (zh) * | 2017-08-16 | 2017-11-24 | 君泰创新(北京)科技有限公司 | 太阳能电池浆料的干燥方法及系统 |
| KR102547210B1 (ko) * | 2019-10-07 | 2023-06-26 | 핑크 게엠베하 써모시스테메 | 전자 조립체를 연결하기 위한 시스템 및 방법 |
| FR3103629B1 (fr) * | 2019-11-25 | 2021-10-22 | Soitec Silicon On Insulator | Procédé de collage de deux substrats |
| CN111129222B (zh) * | 2019-12-24 | 2021-07-20 | 浙江芯能光伏科技股份有限公司 | 一种太阳能多晶硅片的生产装置 |
| MY209872A (en) * | 2021-01-29 | 2025-08-08 | Pink Gmbh Thermosysteme | System and method for connecting electronic assemblies |
| US11970303B2 (en) * | 2022-01-26 | 2024-04-30 | The Procter & Gamble Company | Infrared-assisted shrink wrap product bundling |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6336204B1 (en) * | 1998-05-07 | 2002-01-01 | Applied Materials, Inc. | Method and apparatus for handling deadlocks in multiple chamber cluster tools |
| US20020134310A1 (en) * | 2001-03-21 | 2002-09-26 | Condrashoff Robert S. | Material handling system and method for a multi-workpiece plasma treatment system |
| US20030013285A1 (en) * | 2001-07-16 | 2003-01-16 | Gramarossa Daniel J. | Method of processing and plating wafers and other planar articles |
| US20050119787A1 (en) * | 2003-12-02 | 2005-06-02 | Chien-Jung Huang | Transport system with multiple-load-port stockers |
| US20070026151A1 (en) * | 2005-07-13 | 2007-02-01 | Higginson John A | Fluid Deposition Cluster Tool |
| US20070274810A1 (en) * | 2006-05-26 | 2007-11-29 | Holtkamp William H | Linearly distributed semiconductor workpiece processing tool |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0469713A (ja) * | 1990-07-11 | 1992-03-04 | Hitachi Ltd | 自走台車及び半導体製造ライン |
| JPH0717480Y2 (ja) * | 1990-11-16 | 1995-04-26 | 東海商事株式会社 | 全自動スクリーン印刷機のワーク搬送装置 |
| JPH06168874A (ja) * | 1992-11-30 | 1994-06-14 | Dainippon Printing Co Ltd | 半導体装置の製造方法 |
| JPH0858062A (ja) * | 1994-08-19 | 1996-03-05 | Nippon Bunka Seiko Kk | Cd多色印刷装置 |
| JP3073403B2 (ja) * | 1994-09-05 | 2000-08-07 | 松下電器産業株式会社 | クリーム半田印刷装置 |
| JPH11238776A (ja) * | 1998-02-20 | 1999-08-31 | Hirata Corp | 基板製造ラインおよび基板製造方法 |
| JP2000151070A (ja) * | 1998-11-05 | 2000-05-30 | Kyoei Sangyo Kk | 多面付けプリント配線板の不良面マーキング装置 |
| JP2000236008A (ja) * | 1999-02-15 | 2000-08-29 | Mitsubishi Electric Corp | ウエハ自動搬送システムにおける搬送制御方法 |
| JP3758463B2 (ja) * | 2000-05-09 | 2006-03-22 | 松下電器産業株式会社 | スクリーン印刷の検査方法 |
| JP2002225221A (ja) * | 2001-02-02 | 2002-08-14 | Matsushita Electric Ind Co Ltd | スクリーン印刷機及びスクリーン印刷方法 |
| JP4234934B2 (ja) * | 2002-02-15 | 2009-03-04 | 東京エレクトロン株式会社 | 無人搬送車システム |
| JP2004304085A (ja) * | 2003-04-01 | 2004-10-28 | Renesas Technology Corp | 半導体装置の製造方法 |
| JP2006140394A (ja) * | 2004-11-15 | 2006-06-01 | Seiko Epson Corp | パターン形成方法、回路基板、パターン形成装置及び電子機器 |
-
2008
- 2008-06-13 IT IT000136A patent/ITUD20080136A1/it unknown
-
2009
- 2009-06-12 US US12/997,698 patent/US20110165316A1/en not_active Abandoned
- 2009-06-12 CN CN200980124530.4A patent/CN102076881B/zh not_active Expired - Fee Related
- 2009-06-12 EP EP09761800A patent/EP2304073A1/en not_active Withdrawn
- 2009-06-12 KR KR1020117000925A patent/KR20110022051A/ko not_active Withdrawn
- 2009-06-12 WO PCT/EP2009/057317 patent/WO2009150239A1/en not_active Ceased
- 2009-06-12 JP JP2011512998A patent/JP2011523224A/ja not_active Ceased
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6336204B1 (en) * | 1998-05-07 | 2002-01-01 | Applied Materials, Inc. | Method and apparatus for handling deadlocks in multiple chamber cluster tools |
| US20020134310A1 (en) * | 2001-03-21 | 2002-09-26 | Condrashoff Robert S. | Material handling system and method for a multi-workpiece plasma treatment system |
| US20030013285A1 (en) * | 2001-07-16 | 2003-01-16 | Gramarossa Daniel J. | Method of processing and plating wafers and other planar articles |
| US20050119787A1 (en) * | 2003-12-02 | 2005-06-02 | Chien-Jung Huang | Transport system with multiple-load-port stockers |
| US20070026151A1 (en) * | 2005-07-13 | 2007-02-01 | Higginson John A | Fluid Deposition Cluster Tool |
| US20070274810A1 (en) * | 2006-05-26 | 2007-11-29 | Holtkamp William H | Linearly distributed semiconductor workpiece processing tool |
Also Published As
| Publication number | Publication date |
|---|---|
| EP2304073A1 (en) | 2011-04-06 |
| US20110165316A1 (en) | 2011-07-07 |
| KR20110022051A (ko) | 2011-03-04 |
| WO2009150239A1 (en) | 2009-12-17 |
| CN102076881A (zh) | 2011-05-25 |
| JP2011523224A (ja) | 2011-08-04 |
| ITUD20080136A1 (it) | 2009-12-14 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20140326 Termination date: 20190612 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |