ITUB20152223A1 - Sistema di test integrato - Google Patents
Sistema di test integratoInfo
- Publication number
- ITUB20152223A1 ITUB20152223A1 ITUB2015A002223A ITUB20152223A ITUB20152223A1 IT UB20152223 A1 ITUB20152223 A1 IT UB20152223A1 IT UB2015A002223 A ITUB2015A002223 A IT UB2015A002223A IT UB20152223 A ITUB20152223 A IT UB20152223A IT UB20152223 A1 ITUB20152223 A1 IT UB20152223A1
- Authority
- IT
- Italy
- Prior art keywords
- test system
- integrated test
- integrated
- test
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
- G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2868—Complete testing stations; systems; procedures; software aspects
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
ITUB2015A002223A ITUB20152223A1 (it) | 2015-07-16 | 2015-07-16 | Sistema di test integrato |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
ITUB2015A002223A ITUB20152223A1 (it) | 2015-07-16 | 2015-07-16 | Sistema di test integrato |
Publications (1)
Publication Number | Publication Date |
---|---|
ITUB20152223A1 true ITUB20152223A1 (it) | 2017-01-16 |
Family
ID=54477079
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ITUB2015A002223A ITUB20152223A1 (it) | 2015-07-16 | 2015-07-16 | Sistema di test integrato |
Country Status (1)
Country | Link |
---|---|
IT (1) | ITUB20152223A1 (it) |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008008895A (ja) * | 2006-05-29 | 2008-01-17 | Stk Technology Co Ltd | 半導体デバイスの検査装置および半導体デバイスの検査方法 |
JP2008256678A (ja) * | 2007-03-13 | 2008-10-23 | Stk Technology Co Ltd | 半導体デバイステストシステムのソケットボード循環構造 |
WO2009150239A1 (en) * | 2008-06-13 | 2009-12-17 | Applied Materials Baccini Spa Con Socio Unico | Plant for forming electronic circuits on substrates |
US20100213027A1 (en) * | 2009-02-25 | 2010-08-26 | Kingston Technology Corp. | Conveyor-Based Memory-Module Tester with Elevators Distributing Moving Test Motherboards Among Parallel Conveyors For Testing |
-
2015
- 2015-07-16 IT ITUB2015A002223A patent/ITUB20152223A1/it unknown
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008008895A (ja) * | 2006-05-29 | 2008-01-17 | Stk Technology Co Ltd | 半導体デバイスの検査装置および半導体デバイスの検査方法 |
JP2008256678A (ja) * | 2007-03-13 | 2008-10-23 | Stk Technology Co Ltd | 半導体デバイステストシステムのソケットボード循環構造 |
WO2009150239A1 (en) * | 2008-06-13 | 2009-12-17 | Applied Materials Baccini Spa Con Socio Unico | Plant for forming electronic circuits on substrates |
US20100213027A1 (en) * | 2009-02-25 | 2010-08-26 | Kingston Technology Corp. | Conveyor-Based Memory-Module Tester with Elevators Distributing Moving Test Motherboards Among Parallel Conveyors For Testing |
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