CN101523602A - 具有两个晶片的有源像素传感器 - Google Patents
具有两个晶片的有源像素传感器 Download PDFInfo
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- CN101523602A CN101523602A CNA2007800372553A CN200780037255A CN101523602A CN 101523602 A CN101523602 A CN 101523602A CN A2007800372553 A CNA2007800372553 A CN A2007800372553A CN 200780037255 A CN200780037255 A CN 200780037255A CN 101523602 A CN101523602 A CN 101523602A
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- 235000012431 wafers Nutrition 0.000 title claims description 279
- 239000010410 layer Substances 0.000 claims description 58
- 238000006243 chemical reaction Methods 0.000 claims description 41
- 230000007246 mechanism Effects 0.000 claims description 41
- 230000005540 biological transmission Effects 0.000 claims description 40
- 238000000034 method Methods 0.000 claims description 22
- 239000011241 protective layer Substances 0.000 claims description 12
- 229920000642 polymer Polymers 0.000 claims description 6
- 230000000295 complement effect Effects 0.000 claims description 4
- 238000009792 diffusion process Methods 0.000 claims description 3
- 238000012546 transfer Methods 0.000 abstract description 2
- 239000004065 semiconductor Substances 0.000 description 25
- 230000015654 memory Effects 0.000 description 21
- 229910052751 metal Inorganic materials 0.000 description 17
- 239000002184 metal Substances 0.000 description 17
- 238000005516 engineering process Methods 0.000 description 15
- 238000012545 processing Methods 0.000 description 13
- 238000010586 diagram Methods 0.000 description 12
- 238000004519 manufacturing process Methods 0.000 description 9
- 238000003860 storage Methods 0.000 description 7
- 238000004364 calculation method Methods 0.000 description 6
- 230000013011 mating Effects 0.000 description 6
- 238000001228 spectrum Methods 0.000 description 6
- 239000000126 substance Substances 0.000 description 5
- 238000013461 design Methods 0.000 description 4
- 238000003384 imaging method Methods 0.000 description 4
- 230000002093 peripheral effect Effects 0.000 description 4
- 230000008901 benefit Effects 0.000 description 3
- 239000004020 conductor Substances 0.000 description 3
- 210000001503 joint Anatomy 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 238000003491 array Methods 0.000 description 2
- 238000002955 isolation Methods 0.000 description 2
- 229910044991 metal oxide Inorganic materials 0.000 description 2
- 150000004706 metal oxides Chemical class 0.000 description 2
- 239000013047 polymeric layer Substances 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 230000001902 propagating effect Effects 0.000 description 2
- 230000005236 sound signal Effects 0.000 description 2
- 230000002411 adverse Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- -1 for example Substances 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 239000012044 organic layer Substances 0.000 description 1
- 230000000644 propagated effect Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
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-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14634—Assemblies, i.e. Hybrid structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/1464—Back illuminated imager structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14641—Electronic components shared by two or more pixel-elements, e.g. one amplifier shared by two pixel elements
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/1462—Coatings
- H01L27/14621—Colour filter arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14625—Optical elements or arrangements associated with the device
- H01L27/14627—Microlenses
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14636—Interconnect structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14683—Processes or apparatus peculiar to the manufacture or treatment of these devices or parts thereof
- H01L27/14687—Wafer level processing
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Abstract
Description
Claims (19)
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US82825906P | 2006-10-05 | 2006-10-05 | |
US60/828,259 | 2006-10-05 | ||
US11/867,199 | 2007-10-04 | ||
US11/867,199 US8049256B2 (en) | 2006-10-05 | 2007-10-04 | Active pixel sensor having a sensor wafer connected to a support circuit wafer |
PCT/US2007/021450 WO2008045356A2 (en) | 2006-10-05 | 2007-10-05 | Active pixel sensor having two wafers |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101523602A true CN101523602A (zh) | 2009-09-02 |
CN101523602B CN101523602B (zh) | 2012-10-10 |
Family
ID=39125233
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2007800372553A Active CN101523602B (zh) | 2006-10-05 | 2007-10-05 | 具有两个晶片的有源像素传感器 |
Country Status (7)
Country | Link |
---|---|
US (3) | US8049256B2 (zh) |
EP (1) | EP2067171A2 (zh) |
JP (1) | JP2010506404A (zh) |
KR (1) | KR101390071B1 (zh) |
CN (1) | CN101523602B (zh) |
TW (1) | TWI451566B (zh) |
WO (1) | WO2008045356A2 (zh) |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
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CN102959706A (zh) * | 2010-06-30 | 2013-03-06 | 佳能株式会社 | 固态成像装置 |
CN103367377A (zh) * | 2012-04-04 | 2013-10-23 | 索尼公司 | 固态成像装置和电子设备 |
CN103378109A (zh) * | 2012-04-27 | 2013-10-30 | 台湾积体电路制造股份有限公司 | 用于垂直集成的背照式图像传感器的装置 |
CN103378115A (zh) * | 2012-04-18 | 2013-10-30 | 台湾积体电路制造股份有限公司 | 用于在cmos图像传感器中玻璃去除的方法和装置 |
CN101978499B (zh) * | 2008-03-17 | 2013-11-06 | 全视技术有限公司 | 具有共享扩散区域的堆叠式图像传感器 |
CN104600087A (zh) * | 2013-10-31 | 2015-05-06 | (株)赛丽康 | 使用背侧照明光电二极管的图像传感器及其制造方法 |
CN106449678A (zh) * | 2011-04-19 | 2017-02-22 | 阿尔塔传感器公司 | 具有混合型异质结构的图像传感器 |
CN111033742A (zh) * | 2017-08-14 | 2020-04-17 | ams国际有限公司 | 用于检测电磁辐射的组件以及生产用于检测电磁辐射的组件的方法 |
CN111788690A (zh) * | 2017-12-22 | 2020-10-16 | 亮锐有限责任公司 | Iii族氮化物多波长发光二极管 |
Families Citing this family (125)
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JP2008235478A (ja) * | 2007-03-19 | 2008-10-02 | Nikon Corp | 撮像素子 |
KR100835892B1 (ko) * | 2007-03-26 | 2008-06-09 | (주)실리콘화일 | 칩 적층 이미지센서 |
US20100176271A1 (en) * | 2007-06-19 | 2010-07-15 | Siliconfile Technologies Inc. | Pixel array preventing the cross talk between unit pixels and image sensor using the pixel |
KR100922548B1 (ko) * | 2007-11-26 | 2009-10-21 | 주식회사 동부하이텍 | 씨모스 이미지 센서 및 제조 방법 |
KR100922924B1 (ko) * | 2007-12-28 | 2009-10-22 | 주식회사 동부하이텍 | 이미지센서 및 그 제조방법 |
US7960768B2 (en) * | 2008-01-17 | 2011-06-14 | Aptina Imaging Corporation | 3D backside illuminated image sensor with multiplexed pixel structure |
US7858915B2 (en) * | 2008-03-31 | 2010-12-28 | Eastman Kodak Company | Active pixel sensor having two wafers |
KR20090128899A (ko) * | 2008-06-11 | 2009-12-16 | 크로스텍 캐피탈, 엘엘씨 | 후면 조사 이미지 센서 및 그 제조방법 |
KR101002158B1 (ko) * | 2008-07-29 | 2010-12-17 | 주식회사 동부하이텍 | 이미지센서 및 그 제조방법 |
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Also Published As
Publication number | Publication date |
---|---|
US20100248412A1 (en) | 2010-09-30 |
WO2008045356A2 (en) | 2008-04-17 |
CN101523602B (zh) | 2012-10-10 |
KR101390071B1 (ko) | 2014-04-29 |
WO2008045356A3 (en) | 2008-07-24 |
EP2067171A2 (en) | 2009-06-10 |
US8558292B2 (en) | 2013-10-15 |
US20080083939A1 (en) | 2008-04-10 |
KR20090077904A (ko) | 2009-07-16 |
US20110163223A1 (en) | 2011-07-07 |
JP2010506404A (ja) | 2010-02-25 |
TW200824111A (en) | 2008-06-01 |
US8178938B2 (en) | 2012-05-15 |
TWI451566B (zh) | 2014-09-01 |
US8049256B2 (en) | 2011-11-01 |
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