JP4211696B2 - 固体撮像装置の製造方法 - Google Patents
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- JP4211696B2 JP4211696B2 JP2004193278A JP2004193278A JP4211696B2 JP 4211696 B2 JP4211696 B2 JP 4211696B2 JP 2004193278 A JP2004193278 A JP 2004193278A JP 2004193278 A JP2004193278 A JP 2004193278A JP 4211696 B2 JP4211696 B2 JP 4211696B2
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- 238000003384 imaging method Methods 0.000 title claims description 45
- 238000004519 manufacturing process Methods 0.000 title claims description 25
- 238000000034 method Methods 0.000 title description 20
- 239000012535 impurity Substances 0.000 claims description 99
- 239000000758 substrate Substances 0.000 claims description 71
- 238000005247 gettering Methods 0.000 claims description 29
- 230000015572 biosynthetic process Effects 0.000 claims description 10
- 238000006243 chemical reaction Methods 0.000 claims description 7
- 229910052799 carbon Inorganic materials 0.000 claims description 5
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 4
- 239000010410 layer Substances 0.000 description 185
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 10
- 229910052710 silicon Inorganic materials 0.000 description 10
- 239000010703 silicon Substances 0.000 description 10
- 230000007547 defect Effects 0.000 description 9
- 229910052751 metal Inorganic materials 0.000 description 9
- 239000002184 metal Substances 0.000 description 9
- 239000004065 semiconductor Substances 0.000 description 8
- 239000002344 surface layer Substances 0.000 description 8
- 238000011109 contamination Methods 0.000 description 7
- 239000013078 crystal Substances 0.000 description 7
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 6
- 238000002161 passivation Methods 0.000 description 5
- 229910052814 silicon oxide Inorganic materials 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 238000009792 diffusion process Methods 0.000 description 4
- 239000011229 interlayer Substances 0.000 description 4
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 3
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- 238000005468 ion implantation Methods 0.000 description 3
- 230000002265 prevention Effects 0.000 description 3
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- 238000010438 heat treatment Methods 0.000 description 2
- 238000003199 nucleic acid amplification method Methods 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 238000001039 wet etching Methods 0.000 description 2
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- -1 carbon ions Chemical class 0.000 description 1
- 230000005465 channeling Effects 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000002513 implantation Methods 0.000 description 1
- 239000011259 mixed solution Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 125000000896 monocarboxylic acid group Chemical group 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
- QPJSUIGXIBEQAC-UHFFFAOYSA-N n-(2,4-dichloro-5-propan-2-yloxyphenyl)acetamide Chemical compound CC(C)OC1=CC(NC(C)=O)=C(Cl)C=C1Cl QPJSUIGXIBEQAC-UHFFFAOYSA-N 0.000 description 1
- 229910017604 nitric acid Inorganic materials 0.000 description 1
- 238000005192 partition Methods 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/26—Bombardment with radiation
- H01L21/263—Bombardment with radiation with high-energy radiation
- H01L21/265—Bombardment with radiation with high-energy radiation producing ion implantation
- H01L21/26506—Bombardment with radiation with high-energy radiation producing ion implantation in group IV semiconductors
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- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14632—Wafer-level processed structures
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/1464—Back illuminated imager structures
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
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- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14683—Processes or apparatus peculiar to the manufacture or treatment of these devices or parts thereof
- H01L27/14687—Wafer level processing
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- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14683—Processes or apparatus peculiar to the manufacture or treatment of these devices or parts thereof
- H01L27/14698—Post-treatment for the devices, e.g. annealing, impurity-gettering, shor-circuit elimination, recrystallisation
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- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/322—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to modify their internal properties, e.g. to produce internal imperfections
- H01L21/3221—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to modify their internal properties, e.g. to produce internal imperfections of silicon bodies, e.g. for gettering
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- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
Description
ここで、エピタキシャル層側から基板側へといくに従って不純物濃度が高くなる濃度勾配をもつ第1導電型不純物層を有する構造体を用意することにより、基板を除去した後に、除去面にいくに従って不純物濃度が高くなり、除去面において最大濃度となるような第1導電型不純物層が残る。
界面位置は比較的結晶性が悪いことから、基板を除去する工程において、界面位置を越えてエピタキシャル層に形成された第1導電型不純物層の途中まで除去することにより、除去面における結晶性が良好となる。
上記の濃度勾配をもつことにより、エピタキシャル層で発生した電荷が第2導電型領域へ移動するような電界が発生するため、電荷が有効に第2導電型領域に蓄積される。
また、第2面の位置において最大濃度となることから、第2面位置において電位井戸が形成されることが防止され、エピタキシャル層で発生した電荷が界面(第2面)位置に捕獲されることが防止される。
本発明の固体撮像装置によれば、暗電流の発生を抑制し量子効率を向上させることができる。
型不純物層11と同様の機能を有する。
本実施形態では、CMOSイメージセンサと称されるMOS型の固体撮像装置について説明したが、CCD型の固体撮像装置にも適用可能である。ゲッタリング層21の形成には、炭素以外の他の不純物をイオン注入してもよく、例えばリンをイオン注入してもよい。また、ゲッタリング層21を形成する前にp+ 型不純物層22を形成してもよい。
その他、本発明の要旨を逸脱しない範囲で、種々の変更が可能である。
Claims (6)
- ゲッタリング層を内部に含む基板上に、第1導電型のエピタキシャル層が形成され、前記基板と前記エピタキシャル層の界面を跨がるように前記基板および前記エピタキシャル層に、前記エピタキシャル層よりも第1導電型の不純物濃度が高い第1導電型不純物層が形成された構造体を作製する工程と、
前記エピタキシャル層に光電変換により発生する電荷を蓄積する第2導電型領域を形成する工程と、
前記エピタキシャル層上に配線層を形成する工程と、
前記配線層を形成した後、前記第1導電型不純物層を残して前記基板を除去する工程と
を有し、
前記構造体を作製する工程は、
前記基板に前記ゲッタリング層を形成する工程と、
前記基板に第1導電型不純物を導入する工程と、
前記第1導電型不純物の導入後に、前記基板上に前記エピタキシャル層を形成する工程とを含み、
前記基板に導入された第1導電型不純物を、前記エピタキシャル層中に拡散させて、前記界面位置を跨がる前記第1導電型不純物層を形成する
固体撮像装置の製造方法。 - ゲッタリング層を内部に含む基板上に、第1導電型のエピタキシャル層が形成され、前記基板と前記エピタキシャル層の界面を跨がるように前記基板および前記エピタキシャル層に、前記エピタキシャル層よりも第1導電型の不純物濃度が高い第1導電型不純物層が形成された構造体を作製する工程と、
前記エピタキシャル層に光電変換により発生する電荷を蓄積する第2導電型領域を形成する工程と、
前記エピタキシャル層上に配線層を形成する工程と、
前記配線層を形成した後、前記第1導電型不純物層を残して前記基板を除去する工程と
を有し、
前記構造体を作製する工程は、
前記基板に前記ゲッタリング層を形成する工程と、
前記基板上に前記エピタキシャル層を形成する工程と、
前記エピタキシャル層の形成途中あるいは形成後に、前記基板に前記第1導電型不純物
を導入する工程とを含み、
前記基板に導入された前記第1導電型不純物を、前記エピタキシャル層中まで拡散させ
て、前記界面位置を跨がる前記第1導電型不純物層を形成する
固体撮像装置の製造方法。 - 前記構造体を作製する工程において、前記エピタキシャル層側から前記基板側へといくに従って不純物濃度が高くなる濃度勾配をもつ前記第1導電型不純物層を有する前記構造体を作製する
請求項1または2に記載の固体撮像装置の製造方法。 - 前記基板を除去する工程において、前記界面位置を越えて前記エピタキシャル層に形成された前記第1導電型不純物層の途中まで除去する
請求項1から3のいずれか1項に記載の固体撮像装置の製造方法。 - 前記ゲッタリング層は、前記基板に炭素を導入することにより形成する
請求項1から4のいずれか1項に記載の固体撮像装置の製造方法。 - 前記配線層を形成する工程の後、前記基板を除去する工程の前に、支持基板を前記配線層上に形成する工程をさらに有する
請求項1から5のいずれか1項に記載の固体撮像装置の製造方法。
Priority Applications (9)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004193278A JP4211696B2 (ja) | 2004-06-30 | 2004-06-30 | 固体撮像装置の製造方法 |
TW094119701A TWI281252B (en) | 2004-06-30 | 2005-06-14 | Solid-state imaging device, camera and method of producing the solid-state imaging device |
KR1020050056723A KR101093926B1 (ko) | 2004-06-30 | 2005-06-29 | 고체 촬상 장치의 제조 방법 |
EP05014098A EP1612863B1 (en) | 2004-06-30 | 2005-06-29 | Method of producing a solid-state imaging device |
US11/169,592 US7452742B2 (en) | 2004-06-30 | 2005-06-29 | Solid-state imaging device, camera and method of producing the solid-state imaging device |
EP10008545A EP2246888A3 (en) | 2004-06-30 | 2005-06-29 | Method of producing a solid-state imaging device |
CNB2005100813900A CN100481474C (zh) | 2004-06-30 | 2005-06-30 | 固态成像装置、相机及制造固态成像装置的方法 |
US12/248,633 US7843027B2 (en) | 2004-06-30 | 2008-10-09 | Solid-state imaging device, camera and method of producing the solid-state imaging device |
US12/943,440 US8084286B2 (en) | 2004-06-30 | 2010-11-10 | Solid-state imaging device, camera and method of producing the solid-state imaging device |
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JP2004193278A JP4211696B2 (ja) | 2004-06-30 | 2004-06-30 | 固体撮像装置の製造方法 |
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JP2008215998A Division JP2008294479A (ja) | 2008-08-25 | 2008-08-25 | 固体撮像装置 |
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JP2006019360A JP2006019360A (ja) | 2006-01-19 |
JP4211696B2 true JP4211696B2 (ja) | 2009-01-21 |
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JP2004193278A Expired - Fee Related JP4211696B2 (ja) | 2004-06-30 | 2004-06-30 | 固体撮像装置の製造方法 |
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Country | Link |
---|---|
US (3) | US7452742B2 (ja) |
EP (2) | EP1612863B1 (ja) |
JP (1) | JP4211696B2 (ja) |
KR (1) | KR101093926B1 (ja) |
CN (1) | CN100481474C (ja) |
TW (1) | TWI281252B (ja) |
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JP4211696B2 (ja) * | 2004-06-30 | 2009-01-21 | ソニー株式会社 | 固体撮像装置の製造方法 |
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JP4641820B2 (ja) | 2005-02-17 | 2011-03-02 | 三洋電機株式会社 | 半導体装置の製造方法 |
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JP5006547B2 (ja) * | 2006-01-26 | 2012-08-22 | ルネサスエレクトロニクス株式会社 | 固体撮像装置 |
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