CN101236964B - 具有开关元件和两个二极管的半导体装置 - Google Patents
具有开关元件和两个二极管的半导体装置 Download PDFInfo
- Publication number
- CN101236964B CN101236964B CN2007101629044A CN200710162904A CN101236964B CN 101236964 B CN101236964 B CN 101236964B CN 2007101629044 A CN2007101629044 A CN 2007101629044A CN 200710162904 A CN200710162904 A CN 200710162904A CN 101236964 B CN101236964 B CN 101236964B
- Authority
- CN
- China
- Prior art keywords
- diode
- semiconductor device
- anode
- region
- type impurity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D1/00—Resistors, capacitors or inductors
- H10D1/40—Resistors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/60—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D10/00 or H10D18/00, e.g. integration of BJTs
- H10D84/611—Combinations of BJTs and one or more of diodes, resistors or capacitors
- H10D84/613—Combinations of vertical BJTs and one or more of diodes, resistors or capacitors
- H10D84/617—Combinations of vertical BJTs and only diodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D1/00—Resistors, capacitors or inductors
- H10D1/60—Capacitors
- H10D1/62—Capacitors having potential barriers
- H10D1/64—Variable-capacitance diodes, e.g. varactors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/80—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
- H10D84/811—Combinations of field-effect devices and one or more diodes, capacitors or resistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/06—Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
- H01L2224/0601—Structure
- H01L2224/0603—Bonding areas having different sizes, e.g. different heights or widths
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48135—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/48137—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48135—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/48137—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
- H01L2224/48139—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate with an intermediate bond, e.g. continuous wire daisy chain
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
- H01L2924/13055—Insulated gate bipolar transistor [IGBT]
Landscapes
- Bipolar Integrated Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
- Electronic Switches (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007017913A JP5196794B2 (ja) | 2007-01-29 | 2007-01-29 | 半導体装置 |
| JP2007017913 | 2007-01-29 | ||
| JP2007-017913 | 2007-01-29 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101236964A CN101236964A (zh) | 2008-08-06 |
| CN101236964B true CN101236964B (zh) | 2011-04-27 |
Family
ID=39587449
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2007101629044A Expired - Fee Related CN101236964B (zh) | 2007-01-29 | 2007-09-27 | 具有开关元件和两个二极管的半导体装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US7755167B2 (enExample) |
| JP (1) | JP5196794B2 (enExample) |
| KR (1) | KR100941105B1 (enExample) |
| CN (1) | CN101236964B (enExample) |
| DE (1) | DE102007039624A1 (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5539134B2 (ja) * | 2010-09-16 | 2014-07-02 | 三菱電機株式会社 | 半導体装置 |
| KR101301387B1 (ko) | 2011-09-16 | 2013-08-28 | 삼성전기주식회사 | 전력 반도체 모듈 |
| CN106067799B (zh) * | 2016-06-13 | 2019-03-05 | 南京芯舟科技有限公司 | 一种半导体器件 |
| JP2019161495A (ja) * | 2018-03-14 | 2019-09-19 | 富士電機株式会社 | 半導体装置および装置 |
Family Cites Families (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5548958A (en) * | 1978-10-02 | 1980-04-08 | Nec Corp | Semiconductor device |
| JPS6269564A (ja) * | 1985-09-20 | 1987-03-30 | Nec Corp | 半導体装置 |
| JPS62108578A (ja) * | 1985-11-06 | 1987-05-19 | Rohm Co Ltd | 半導体装置 |
| JPS62210858A (ja) | 1986-03-10 | 1987-09-16 | Mitsubishi Electric Corp | 複合ダイオ−ド |
| DE3856174T2 (de) | 1987-10-27 | 1998-09-03 | Nippon Electric Co | Halbleiteranordnung mit einem isolierten vertikalen Leistungs-MOSFET. |
| JP3032745B2 (ja) * | 1992-09-04 | 2000-04-17 | 三菱電機株式会社 | 絶縁ゲート型半導体装置 |
| JP3193827B2 (ja) | 1994-04-28 | 2001-07-30 | 三菱電機株式会社 | 半導体パワーモジュールおよび電力変換装置 |
| JPH09181335A (ja) * | 1995-12-25 | 1997-07-11 | Rohm Co Ltd | 半導体装置 |
| FR2773265B1 (fr) * | 1997-12-30 | 2000-03-10 | Sgs Thomson Microelectronics | Circuit de protection d'interface d'abonnes |
| JP2001111398A (ja) * | 1999-10-13 | 2001-04-20 | Fuji Electric Co Ltd | 半導体双方向スイッチ用スパイク電圧抑制回路 |
| JP2002142443A (ja) * | 2000-11-01 | 2002-05-17 | Fuji Electric Co Ltd | 電力用半導体素子駆動用icの保護回路 |
| JP4761644B2 (ja) | 2001-04-18 | 2011-08-31 | 三菱電機株式会社 | 半導体装置 |
| US6657256B2 (en) | 2001-05-22 | 2003-12-02 | General Semiconductor, Inc. | Trench DMOS transistor having a zener diode for protection from electro-static discharge |
| JP2003033044A (ja) | 2001-07-09 | 2003-01-31 | Mitsubishi Electric Corp | スナバ回路 |
| US6803732B2 (en) * | 2001-12-20 | 2004-10-12 | Osram Opto Semiconductors Gmbh | LED array and LED module with chains of LEDs connected in parallel |
| JP2005057235A (ja) * | 2003-07-24 | 2005-03-03 | Mitsubishi Electric Corp | 絶縁ゲート型バイポーラトランジスタ及びその製造方法、並びに、インバータ回路 |
| DE10334079B4 (de) | 2003-07-25 | 2008-08-21 | Siemens Ag | Transistormodul |
| JP4799829B2 (ja) * | 2003-08-27 | 2011-10-26 | 三菱電機株式会社 | 絶縁ゲート型トランジスタ及びインバータ回路 |
| JP4506276B2 (ja) | 2004-05-17 | 2010-07-21 | 富士電機システムズ株式会社 | 自己消弧形半導体素子の駆動回路 |
| US7297603B2 (en) * | 2005-03-31 | 2007-11-20 | Semiconductor Components Industries, L.L.C. | Bi-directional transistor and method therefor |
| JP5034461B2 (ja) * | 2006-01-10 | 2012-09-26 | 株式会社デンソー | 半導体装置 |
| JP5033335B2 (ja) * | 2006-02-21 | 2012-09-26 | ルネサスエレクトロニクス株式会社 | 半導体装置およびそれを用いたインバータ装置 |
-
2007
- 2007-01-29 JP JP2007017913A patent/JP5196794B2/ja not_active Expired - Fee Related
- 2007-07-12 US US11/776,913 patent/US7755167B2/en not_active Expired - Fee Related
- 2007-08-22 DE DE200710039624 patent/DE102007039624A1/de not_active Withdrawn
- 2007-09-21 KR KR1020070096321A patent/KR100941105B1/ko not_active Expired - Fee Related
- 2007-09-27 CN CN2007101629044A patent/CN101236964B/zh not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| KR20080071054A (ko) | 2008-08-01 |
| US20080179704A1 (en) | 2008-07-31 |
| US7755167B2 (en) | 2010-07-13 |
| JP5196794B2 (ja) | 2013-05-15 |
| JP2008186920A (ja) | 2008-08-14 |
| CN101236964A (zh) | 2008-08-06 |
| DE102007039624A1 (de) | 2008-08-07 |
| KR100941105B1 (ko) | 2010-02-10 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20110427 Termination date: 20140927 |
|
| EXPY | Termination of patent right or utility model |