WO2014181768A1 - 絶縁性に優れた熱膨張係数の小さいステンレス製太陽電池用基板およびその製造方法 - Google Patents
絶縁性に優れた熱膨張係数の小さいステンレス製太陽電池用基板およびその製造方法 Download PDFInfo
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- WO2014181768A1 WO2014181768A1 PCT/JP2014/062152 JP2014062152W WO2014181768A1 WO 2014181768 A1 WO2014181768 A1 WO 2014181768A1 JP 2014062152 W JP2014062152 W JP 2014062152W WO 2014181768 A1 WO2014181768 A1 WO 2014181768A1
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- Prior art keywords
- stainless steel
- less
- oxide film
- thermal expansion
- expansion coefficient
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- 229910001220 stainless steel Inorganic materials 0.000 title claims abstract description 113
- 239000010935 stainless steel Substances 0.000 title claims abstract description 94
- 239000000758 substrate Substances 0.000 title claims abstract description 56
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- 238000000034 method Methods 0.000 title claims description 8
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- 239000000463 material Substances 0.000 claims abstract description 50
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- 229910052804 chromium Inorganic materials 0.000 claims abstract description 10
- 229910052748 manganese Inorganic materials 0.000 claims abstract description 8
- 229910052799 carbon Inorganic materials 0.000 claims abstract description 7
- 239000012535 impurity Substances 0.000 claims abstract description 7
- 229910052698 phosphorus Inorganic materials 0.000 claims abstract description 6
- 229910052717 sulfur Inorganic materials 0.000 claims abstract description 6
- 238000010438 heat treatment Methods 0.000 claims description 53
- 229910018072 Al 2 O 3 Inorganic materials 0.000 claims description 50
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- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 13
- 229910052761 rare earth metal Inorganic materials 0.000 claims description 12
- 229910052802 copper Inorganic materials 0.000 claims description 9
- 229910052757 nitrogen Inorganic materials 0.000 claims description 9
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- 229910052759 nickel Inorganic materials 0.000 claims description 8
- 229910052720 vanadium Inorganic materials 0.000 claims description 8
- 229910052727 yttrium Inorganic materials 0.000 claims description 8
- 229910052758 niobium Inorganic materials 0.000 claims description 7
- 229910052735 hafnium Inorganic materials 0.000 claims description 6
- 229910052746 lanthanum Inorganic materials 0.000 claims description 6
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- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 abstract description 7
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract description 3
- 229910052593 corundum Inorganic materials 0.000 abstract 2
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- DVRDHUBQLOKMHZ-UHFFFAOYSA-N chalcopyrite Chemical compound [S-2].[S-2].[Fe+2].[Cu+2] DVRDHUBQLOKMHZ-UHFFFAOYSA-N 0.000 description 3
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- 238000001953 recrystallisation Methods 0.000 description 2
- 229910052721 tungsten Inorganic materials 0.000 description 2
- 229910052684 Cerium Inorganic materials 0.000 description 1
- MYMOFIZGZYHOMD-UHFFFAOYSA-N Dioxygen Chemical compound O=O MYMOFIZGZYHOMD-UHFFFAOYSA-N 0.000 description 1
- 229910001030 Iron–nickel alloy Inorganic materials 0.000 description 1
- 229910052779 Neodymium Inorganic materials 0.000 description 1
- 229910052777 Praseodymium Inorganic materials 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 238000005275 alloying Methods 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 229910000963 austenitic stainless steel Inorganic materials 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
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- 229910052951 chalcopyrite Inorganic materials 0.000 description 1
- 230000003749 cleanliness Effects 0.000 description 1
- 238000005097 cold rolling Methods 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
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- 230000006872 improvement Effects 0.000 description 1
- 230000010534 mechanism of action Effects 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
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- 239000001301 oxygen Substances 0.000 description 1
- 229940063729 oxygen 80 % Drugs 0.000 description 1
- 239000003973 paint Substances 0.000 description 1
- 238000000746 purification Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 230000007480 spreading Effects 0.000 description 1
- 238000003892 spreading Methods 0.000 description 1
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- 238000004381 surface treatment Methods 0.000 description 1
- 229910002058 ternary alloy Inorganic materials 0.000 description 1
- 239000013585 weight reducing agent Substances 0.000 description 1
Classifications
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- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/036—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes
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- C23C8/00—Solid state diffusion of only non-metal elements into metallic material surfaces; Chemical surface treatment of metallic material by reaction of the surface with a reactive gas, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals
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- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/036—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes
- H01L31/0392—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate
- H01L31/03923—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate including AIBIIICVI compound materials, e.g. CIS, CIGS
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/541—CuInSe2 material PV cells
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Definitions
- the present invention relates to a stainless steel solar cell substrate having a small thermal expansion coefficient and having an insulating oxide film formed on the surface without coating, and a method for producing the same.
- Patent Documents 1 and 2 disclose an insulating material in which a smooth stainless steel plate surface is coated with alumina, silicon oxide, or a silicon nitride film.
- As the material general-purpose ferritic stainless steel SUS430 (17Cr steel) is used.
- Patent Document 3 discloses a material that defines both the surface roughness parameters Rz and Rsk as a stainless steel surface having good film forming properties.
- materials SUS430J1L (18Cr-0.4Cu-0.4Nb) to which Nb and Cu are added and general-purpose austenitic stainless steel SUS304 (18Cr-8Ni) are used.
- CIS chalcopyrite
- the CIS solar cell is formed by forming an electrode layer made of a Mo layer on a substrate and forming a chalcopyrite type compound layer as a light absorption layer thereon.
- the chalcopyrite type compound is a ternary alloy represented by Cu (InGa) (SeS) 2 .
- Patent Document 4 an insulating film made of an alumina film is formed on a stainless steel foil of 0.2 mm or less, an electrode made of a Mo layer is formed thereon, and Cu (In) is formed thereon as a light absorption layer.
- a method of manufacturing a solar cell substrate material that forms a film of 1-x Ga x ) Se 2 is disclosed.
- SUS430, SUS444 (18Cr-2Mo), and SUS447J1 (30Cr-2Mo) are used as the material for the stainless steel foil.
- Patent Documents 5 and 6 in a Cu-coated steel sheet having a Cu coating layer, a CIS solar cell in which a Mo coating is formed on the Cu coating layer and a Cu (InGa) (SeS) 2 type compound layer is formed thereon.
- a battery electrode substrate is disclosed.
- Patent Documents 5 and 6 as a base material for a Cu-coated steel sheet, C: 0.0001 to 0.15%, Si: 0.001 to 1.2%, Mn: 0.001 to 1.2%, P : 0.001 to 0.04%, S: 0.0005 to 0.03%, Ni: 0 to 0.6%, Cr: 11.5 to 32.0%, Mo: 0 to 2.5%, Cu: 0 to 1.0%, Nb: 0 to 1.0%, Ti: 0 to 1.0%, Al: 0 to 0.2%, N: 0 to 0.025%, B: 0 to 0 0.01%, V: 0 to 0.5%, W: 0 to 0.3%, Ca, Mg, Y, REM (rare earth elements) total: 0 to 0.1%, balance Fe and unavoidable impurities
- ferritic stainless steel is disclosed. However, the ferritic stainless steel used in the examples is limited to SUS430.
- Patent Document 7 discloses a stainless steel material on which an insulating film with good heat resistance is formed and a method for producing the same.
- C 0.0001 to 0.15%
- Si 0.001 to 1.2%
- Mn 0.001 to 2.0%
- P 0.00. 001 to 0.05%
- S 0.0005 to 0.03%
- Cu 0 to 1.0%
- Cr 11.0 to 32.0%
- Mo 0 -3.0%
- Al 1.0-6.0%
- Nb 0-1.0%
- B 0-0.
- a mixed layer of NiO and NiFe 2 O 4 having a thickness of 1.0 ⁇ m or more is formed on the surface of the base material via an Al oxide layer.
- the steel used in the examples is Al: ferritic stainless steel containing less than 0.4% Si.
- Patent Document 7 describes that the Si content of steel may be controlled to 0.5% or less.
- the mixed layer of NiO or the like and the Al oxide layer are formed by forming an Ni plating layer by electroplating, and then forming an Al oxide layer at the interface between the steel and the Ni plating layer by heat treatment in the atmosphere. It is generated by changing the quality into an oxide layer.
- Patent Documents 8 and 9 disclose a method for producing stainless steel in which an insulating property is imparted to the surface of the stainless steel without depending on coating of a paint.
- Patent Document 8 describes a method of forming an aluminum oxide layer by heating 2% or more of an Al-containing ferritic stainless steel sheet to 850 ° C. or more.
- the heat treatment time of steel added with Al to SUS430 containing impurities of C and N is limited to 60 minutes.
- Patent Document 9 discloses stainless steel that is oxidized at 1000 ° C. for 1 hour or longer and is coated with ⁇ -Al 2 O 3 whose entire surface is made of equiaxed crystals and / or columnar crystals. .
- the stainless steel used in the examples is limited to 20Cr-5Al.
- the insulating properties of stainless steel used for the substrate are involved. That is, it is desired to achieve an insulating surface that does not impair the conversion efficiency of the solar cell regardless of coating or plating.
- the application technology of stainless steel by coating or plating has been mainstream so far.
- the heat treatment of stainless steel added with Al to SUS430 disclosed in Patent Document 8 is performed at 850 ° C. or more for 60 minutes, or disclosed in Patent Document 9.
- the 20Cr-5Al stainless steel is heat-treated at 1000 ° C. for 1 hour or longer.
- an object of the present invention is to provide a stainless steel substrate for a solar cell on which an oxide film having an excellent insulating property capable of maintaining high conversion efficiency of the solar cell is formed on the surface, and an excellent insulating property on the surface regardless of the coating.
- Another object of the present invention is to provide a method for producing a solar cell substrate capable of forming an oxide film.
- the present inventors have focused on the effects of alloying elements (Cr, Si, Al, etc.) on the insulating properties of oxide films formed on the surface of ferritic stainless steel by heat treatment.
- the present invention was completed through extensive experiments and studies. The knowledge obtained by the present invention will be described below.
- Al is an effective element that provides an insulating property by forming an alumina (Al 2 O 3 ) film on the surface of stainless steel by heat treatment.
- alumina Al 2 O 3
- the thermal expansion coefficient of these high Al content ferritic stainless steels is not necessarily small at the time of temperature rise when forming the electrode layer and the light absorption layer of the CIS solar cell, and the film formability and the durability of the battery There is a problem with sex.
- a stainless steel having an Al content of 2.0% or more has a significantly large thermal expansion coefficient.
- the addition of Al to SUS430 with a large amount of impurities has restrictions on the heat treatment conditions (850 ° C., 1 hour or more) for forming the alumina film in addition to the problem of the material surface including the thermal expansion coefficient.
- the present inventors do not depend on excessive Al addition, but by adding stainless steel and adjusting the Cr content, the stainless steel has a low thermal expansion coefficient and is suitable for improving the durability of solar cells. It has been found that a remarkable effect can be obtained that an oxide film having the above can be formed by heat treatment. Although there are still many unclear points regarding the insulating effect of the oxide film formed by heat treatment on the surface of Si-added Al-containing ferritic stainless steel with a small coefficient of thermal expansion, the following discussion Based on the results, the mechanism of action is inferred.
- Si is an element effective for lowering the thermal expansion coefficient of ferritic stainless steel.
- Si is an element effective for lowering the thermal expansion coefficient of ferritic stainless steel.
- an increase in the thermal expansion coefficient due to the inclusion of Al can be effectively suppressed.
- Si effectively acts on the formation of an insulating oxide film in addition to the reduction of the thermal expansion coefficient.
- a SiO 2 continuous film is formed on the surface by heat-treating the Si-added stainless steel. This SiO 2 continuous film has the effect of significantly increasing the electrical resistance of Cr 2 O 3 which is a semiconductor and promoting the formation of an insulating Al 2 O 3 film, even if it does not provide insulation. Have. It has been found that such an effect of modifying the oxide film by Si is manifested by containing 0.4% or more of Si.
- the insulation suitable for the substrate of the solar cell is (i) Al 2 O 3 Has been found that it can be imparted by an oxide film containing 50% or more of (i) Al 2 O 3 and (ii) SiO 2 in total.
- the oxide film further includes (iii) Al-containing spinel oxide (MgAl 2 O 4 ). In this case, the inventors have found a new finding that better insulating properties can be obtained.
- (D) facilitate the formation of the oxide film containing the above-mentioned (i) an oxide film containing Al 2 O 3 or (i) Al 2 O 3 and (ii) SiO 2 and / or (iii) MgAl 2 O 4,
- the content of each element of Cr, Si, Mn, and Al is limited, and Cr + 10Si + Mn + Al> 24.5 (however, the element symbol in the formula is the mass% of the element in steel). It has been found that it is effective to adjust the alloy composition to satisfy.
- Mn suppresses the oxidation of Fe during the heat treatment of stainless steel and promotes the formation of an insulating oxide film containing an oxide containing Al and an oxide containing Si.
- a small amount of Mg has an action of promoting the formation of Al-based spinel oxide and enhancing the insulating properties. Further, when Sn and Zr are added in combination, the formation of (i) to (iii) is promoted. Further, it has been found that the adjustment of the alloy composition is effective in suppressing the increase in the thermal expansion coefficient of the Al-containing ferritic stainless steel in addition to the formation of the oxide film.
- the stainless steel material having excellent thermal insulation and low thermal expansion coefficient according to (1) wherein the stainless steel material contains Al: 2.0% or more and Si: 0.3% or more. Battery substrate.
- the stainless steel material is, in mass%, further Sn: 1% or less, Zr: 0.5% or less, Mg: 0.005% or less, Ni: 1% or less, Cu: 1% or less, Co: 0.5% or less, Mo: 2% or less, V: 0.5% or less, B: 0.005% or less, Ca: 0.005% or less, La: 0.1% or less, Y: 0.1% Or less, Hf: 0.1% or less, REM: 0.1% or less, Nb: 1% or less, Ti: 1% or less (1) or A substrate for a solar cell made of stainless steel having a small thermal expansion coefficient and having excellent insulation properties according to (2).
- the stainless steel solar cell substrate having a small thermal expansion coefficient and excellent insulation properties according to (3), wherein the oxide film contains (iii) MgAl 2 O 4 .
- the content of (iii) MgAl 2 O 4 in the oxide film is 5% or more, and for stainless steel solar cells with excellent thermal insulation and low thermal expansion coefficient according to (4) substrate.
- the surface of the stainless steel material is formed.
- substrate for stainless steel solar cells with a small thermal expansion coefficient excellent in the insulation characterized by having the formation film process which forms an oxide film.
- the heat treatment is performed in an atmosphere containing water vapor having a dew point of 40 ° C. or higher.
- the stainless steel solar cell with excellent insulation and small thermal expansion coefficient according to (6) A method for manufacturing a substrate.
- the stainless steel solar cell substrate of the present invention includes Al: 0.5% or more and / or Si: 0.4% or more on the surface of a stainless steel material having a composition satisfying the above formula (1). i) are those oxide film containing a total of more than 50% of the Al containing 2 O 3 50% or more, or (i) Al 2 O 3 and (ii) SiO 2 is formed on the surface, coating or plating Regardless of this, an insulating surface that maintains the conversion efficiency of the solar cell at a high level is formed. Therefore, the stainless steel solar cell substrate of the present invention is suitable as a solar cell substrate.
- the stainless steel material of the substrate for a stainless steel solar cell of the present invention contains Al: 2.0% or more and Si: 0.3% or more, formation of an insulating oxide film by Al and Si is promoted during heat treatment. The synergistic effect is obtained, and the increase in the thermal expansion coefficient due to the inclusion of Al is effectively suppressed by Si. As a result, it becomes a stainless steel solar cell substrate suitable for a solar cell substrate having an oxide film with further excellent insulating properties and a low thermal expansion coefficient.
- the stainless steel solar cell substrate of the present embodiment is formed on the surface of a stainless steel material by (i) an oxide film containing Al 2 O 3 , or (i) Al 2 O 3 and (ii) SiO 2 and / or (iii). ) An oxide film containing MgAl 2 O 4 is formed.
- the stainless steel material included in the stainless steel solar cell substrate of the present embodiment has the following composition, by performing heat treatment, (i) an oxide film containing Al 2 O 3 or (i An oxide film containing (1) Al 2 O 3 and (ii) SiO 2 and / or (iii) MgAl 2 O 4 is formed on the surface.
- the stainless steel material included in the stainless steel solar cell substrate of this embodiment is ferritic stainless steel.
- Cr is a main constituent element of the ferritic stainless steel used in the present embodiment.
- an oxide film containing Al 2 O 3 or (i) Al 2 O 3 and (ii) SiO 2 and / or (iii) MgAl 2 O 4 are added.
- the lower limit of the Cr content is 9%, preferably 10%, and more preferably 11%.
- the upper limit of the Cr content is 25%, preferably 20%, more preferably 18%, from the viewpoint of suppressing deterioration of the toughness and workability of the steel due to the addition of Si and Al.
- C inhibits improvement of corrosion resistance and inhibits formation of the insulating oxide film. For this reason, the lower the content of C, the better.
- the upper limit is 0.03%, and preferably 0.02%.
- the lower limit of the C content is preferably 0.001%, more preferably 0.002%.
- Mn suppresses the oxidation of Fe during the heat treatment of stainless steel and promotes the formation of the insulating oxide film.
- the Mn content is preferably 0.06% or more, more preferably 0.3% or more, and 0.4% or more. More preferably.
- the upper limit is made 2%, preferably 1.5%, more preferably 1.0%.
- the upper limit of the P content is set to 0.05%, preferably 0.04%.
- the lower limit of the P content is preferably 0.005%, more preferably 0.01%.
- the upper limit of the S content is 0.01%, and preferably 0.002%.
- the lower limit of the S content is preferably 0.0001%, more preferably 0.0002%.
- the upper limit of the N content is preferably 0.03% and is preferably 0.015%.
- the lower limit of the N content is preferably 0.001%, more preferably 0.005%.
- Si is contained in an amount of 0.05% or more, and preferably 0.10% or more.
- the upper limit of the Si content is 4.0%, preferably 3.5%, and more preferably 2.0%.
- Al is contained in an amount of 0.005% or more and preferably 0.010% or more in order to obtain an action as a deoxidizing element as in the case of Si.
- excessive Al addition increases the thermal expansion coefficient of the steel and impairs the durability of the oxide film obtained by heat treatment.
- the upper limit of the Al content is 5.0%, preferably 3.5%, and more preferably 2.5%. If the Al content exceeds 5.0%, the coefficient of thermal expansion is large, which is not preferable as a solar cell substrate.
- the stainless steel material used in this embodiment contains 0.4% or more of Si and / or 0.5% or more of Al.
- the stainless steel material used in this embodiment contains 0.4% or more of Si and / or 0.5% or more of Al.
- a stainless steel material that satisfies one of the conditions of Si: 0.4% or more and Al: 0.5% or more an insulating oxide film that can be used as a solar cell substrate can be obtained by heat treatment. .
- a stainless steel material containing 0.4% or more of Si and 0.5% or more of Al the generation of Al 2 O 3 or Al-containing spinel oxide can be promoted very effectively during heat treatment.
- the effect of promoting the formation of the insulating oxide film can be obtained, and the effect of reducing the thermal expansion coefficient of the stainless steel material can be obtained.
- the Si content is preferably 0.5% or more, and more preferably 1.0% or more, in order to obtain the effect of promoting the formation of the insulating oxide film.
- Al in an amount of 0.5% or more, the effect of promoting the formation of the insulating oxide film can be obtained.
- the Al content is preferably 1.0% or more, and more preferably 1.5% or more, in order to obtain the effect of promoting the formation of the insulating oxide film.
- Cr + 10Si + Al + Mn > 24.5 (however, the element symbol in the formula means the mass% of the element in steel).
- Si effectively functions to form an insulating oxide film and lower the thermal expansion coefficient, and a combined addition of Si and Al is suitable.
- Mn also promotes the formation of these oxide films without increasing the thermal expansion coefficient.
- Cr + 10Si + Al + Mn is preferably 27 or more. The upper limit is not particularly specified, but it is preferably 40 and more preferably 35 in consideration of the influence on the productivity of steel due to the addition of Si and Al.
- the stainless steel material used in this embodiment may contain Al: 2.0% or more and Si: 0.3% or more.
- the insulating property of the oxide film obtained by the heat treatment is further improved.
- the thermal expansion coefficient increases as the Al content increases.
- the Si content when Al is contained at 2.0% or more is more preferably 0.4% or more.
- the stainless steel material used in the present embodiment is further Sn: 1% or less, Zr: 0.5% or less, Mg: 0.005% or less, Ni: 1% or less, Cu: 1%, if necessary.
- Sn is added as necessary in the ferritic stainless steel used in this embodiment to suppress the oxidation of Fe and promote the formation of an insulating oxide film enriched in Si and / or Al.
- Sn it is preferable to set it as 0.01% or more which the effect expresses, 0.05% or more is preferable, and it is more preferable to set it as 0.1% or more.
- the upper limit of the Sn content is 1%, preferably 0.5%, and more preferably 0.3%.
- Zr is added as necessary in order to promote the formation of an insulating oxide film by a synergistic effect with Si and Al.
- the upper limit of the Zr content is 0.5%, preferably 0.3%, and more preferably 0.15%. .
- Mg has an action of promoting the formation of Al-based spinel oxide (MgAl 2 O 4 ) by performing heat treatment.
- MgAl 2 O 4 Al-based spinel oxide
- the upper limit of the Mg content is 0.005%, preferably 0.0015%.
- Ni, Cu, Co, Mo, and V are effective elements for promoting the formation of the insulating oxide film and enhancing the corrosion resistance by a synergistic effect with Si and Al, and are added as necessary.
- V and Co are added, the content is preferably 0.01% or more at which the effect is exhibited.
- the upper limit of Ni and Cu is 1%, and the upper limit of V and Co is 0.5%.
- Mo is an element effective for lowering the thermal expansion coefficient, the upper limit is made 2%.
- the lower limit of the more preferable content of any element is 0.1%, and the upper limit is 0.5%.
- B and Ca are elements that improve hot workability and secondary workability, and addition to ferritic stainless steel is effective.
- the lower limit of the content of each of B and Ca is preferably 0.0003%, more preferably 0.0005%, at which they exhibit an effect.
- the upper limit of the content of each of B and Ca is set to 0.005%, preferably 0.0015%.
- La, Y, Hf, and REM are effective elements for improving the hot workability and the cleanliness of the steel, and improving the adhesion of the oxide film obtained by the heat treatment, and may be added as necessary.
- La, Y, Hf, and REM it is preferable to make these content 0.001% or more which the effect expresses, respectively.
- the upper limit of the contents of La, Y, Hf, and REM is 0.1%, and more preferably 0.05%.
- REM is an element belonging to atomic numbers 57 to 71, such as Ce, Pr, and Nd.
- Nb is added as necessary in order to promote the formation of the insulating oxide film through the purification of steel by the action of the stabilizing element that fixes C and N.
- the Nb content is preferably 0.03% or more, at which the effect is manifested, preferably 0.05% or more, and more preferably 0.1% or more.
- the upper limit of the Nb content is 1%, preferably 0.5%, more preferably 0.3%.
- Ti is added as necessary in order to promote the formation of the insulating oxide film in addition to the high purity of the steel by the action of the stabilizing element that fixes C and N.
- the Ti content is preferably 0.01% or more, at which the effect is manifested, preferably 0.02% or more, and more preferably 0.05% or more.
- the upper limit of Ti content is 1%, more preferably 0.35%, Preferably it is 0.2%.
- the surface of the stainless steel solar cell substrate of this embodiment includes (i) 50% or more of Al 2 O 3 , or (i) includes 50% or more of the total of Al 2 O 3 and (ii) SiO 2.
- An oxide film is formed. Since the stainless steel solar cell substrate of this embodiment has such an oxide film formed on the surface of a stainless steel material, it has an insulating surface suitable for the solar cell substrate.
- the oxide film may include (i) Al 2 O 3 and (iii) MgAl 2 O 4 (Al-containing spinel oxide), or (i) Al 2 O 3 and ( ii) In addition to SiO 2 , it may further contain (iii) MgAl 2 O 4 (Al-containing spinel oxide). When the oxide film contains (iii) MgAl 2 O 4 , it is preferable because (i) the insulating properties can be improved regardless of the properties of Al 2 O 3 .
- the content of (i) Al 2 O 3 may be 55% or more in order to obtain better insulation. Preferably, it is 60% or more.
- the upper limit of the content of (i) Al 2 O 3 in the oxide film is not particularly limited. In the case where the oxide film contains (iii) MgAl 2 O 4 together with (i) Al 2 O 3 , (iii) the oxide film contains an MgAl 2 O 4 so that better insulation can be obtained.
- the upper limit of the content of Al 2 O 3 is preferably 95%, more preferably 80%.
- the oxide film is intended to include (ii) SiO 2
- (ii ) the content of SiO 2 in the oxide film is preferably 5% or more, and more preferably 15% or more.
- the content of (ii) SiO 2 in the oxide film is 5% or more, the formation of (ii) Al 2 O 3 is sufficiently promoted by forming (ii) SiO 2 .
- the oxide film is intended to include (ii) SiO 2, to ensure the content of in the oxide film (i) Al 2 O 3, in order to ensure insulation, in the oxide film (ii) SiO 2
- the content of is preferably 30% or less, and more preferably 25% or less.
- oxide film to (iii) MgAl 2 O 4 (iii) as an effect of improving the insulating property by MgAl 2 O 4 can be sufficiently obtained, in the oxide film (iii) of MgAl 2 O 4
- the content is preferably 5% or more, and more preferably 10% or more.
- the upper limit of the content of (iii) MgAl 2 O 4 in the oxide film is not particularly specified, but in order to obtain excellent insulation by securing the content of (i) Al 2 O 3 in the oxide film.
- the content of MgAl 2 O 4 is preferably 50% or less, and more preferably 30% or less.
- the thickness of the oxide film is preferably 0.01 ⁇ m or more in order to maintain an insulating surface.
- the upper limit of the film thickness is not particularly specified, but is preferably 5 ⁇ m in consideration of the efficiency of heat treatment described later.
- (iii) by forming the oxide film containing MgAl 2 O 4 it is possible to ensure surface insulation even when the film thickness is as thin as 1 ⁇ m or less.
- the temperature is 300 to 1000 ° C. in an atmosphere containing water vapor. It is preferable to perform a heat treatment in the temperature range (formation film process).
- the heat-treated stainless steel material has the components described in the item (I) and is obtained by a conventionally known production method.
- the stainless steel material to be heat-treated may have any shape as long as it can be used as a stainless steel solar cell substrate.
- the surface property of the stainless steel material to be heat treated is not particularly specified, and BA, 2B, 2D, No, conforming to JIS G 4304: 2012 and JIS G 4305: 2012 (corresponding to ISO 16143-1: 2004). . 4. It can be polishing or the like.
- heat treatment is preferably performed at 300 ° C. or higher, and more preferably at 400 ° C. or higher.
- the heat treatment temperature is excessively high, the Al concentration and the Si concentration in the oxide film are decreased, the Fe concentration is increased, and the insulating property and adhesion of the oxide film are inhibited. Therefore, the upper limit of the heat treatment temperature is preferably 1000 ° C., more preferably 900 ° C.
- the heat treatment time is not particularly defined and can be, for example, 1 minute to 72 hours.
- the heat treatment is preferably a continuous annealing for 10 minutes or less or a batch type heat treatment for 24 to 72 hours.
- the heat treatment for forming the oxide film is preferably performed in an atmosphere containing water vapor.
- an atmosphere containing water vapor By performing the heat treatment in an atmosphere containing water vapor, the oxidation of Al and Si on the surface of the stainless steel material is promoted.
- the atmosphere containing water vapor include an atmosphere containing water vapor by humidifying dry air (20% oxygen-80% nitrogen).
- the heat treatment for forming the oxide film is more preferably performed in an atmosphere containing 5% or more of water vapor in pure oxygen gas. By performing heat treatment in such an atmosphere, the target oxide film of this embodiment can be easily formed.
- the heat treatment for forming the oxide film is more preferably performed in an atmosphere containing water vapor having a dew point of 40 ° C. or higher. By performing the heat treatment in such an atmosphere, (iii) MgAl 2 O 4 is efficiently formed.
- the upper limit of the dew point is not particularly specified, but is 90 ° C. in consideration of the workability of heat treatment.
- the contents of (i) to (iii) contained in the oxide film can be controlled by changing the composition within the above range and changing the heat treatment conditions within the above heat treatment atmosphere and heat treatment temperature.
- the height (cps) of each of the diffraction peaks (i) to (iii) measured by X-ray diffraction was counted. Then, it is assumed that the oxide film is composed of the above (i) to (iv), and each oxidation of (i) to (iii) is performed in accordance with the following (i) calculation method of the abundance ratio of Al 2 O 3 The abundance ratio was calculated. For example, in the case of (i) Al 2 O 3 , the abundance ratio of the oxide was calculated by (i) / ⁇ (i) + (ii) + (iii) + (iv) ⁇ ⁇ 100.
- (I) to (iv) in the above formula are (i) the (104) plane of Al 2 O 3 , (ii) the (101) plane of SiO 2 , and (iii) MgAl measured by the above X-ray diffraction. It means the diffraction peak height (cps) obtained from the (311) plane of 2 O 4 and (iv) the (110) plane of Cr 2 O 3 , respectively.
- the value of (iv) in the above formula employs the diffraction peak height of the (110) plane as the main diffraction peak.
- (Iv) In order to distinguish the presence of Cr 2 O 3 from the diffraction peak of (i) Al 2 O 3 , it was confirmed that a diffraction peak of (104) plane was present.
- “ratio%” indicates the total of the existing ratios of (i) to (iii).
- the insulation property of the steel plate surface was evaluated by depositing an aluminum film (10 mm square ⁇ 0.2 ⁇ m thickness) on the surface as an electrode, and then placing a tester on the electrode to measure the electrical resistance. The measurement was made 10 times in the measurement area, and the average value was taken as the measurement value.
- the target insulation in this embodiment is an electrical resistance value of 1 k ⁇ or more suitable as a CIS solar cell substrate, and the obtained steel plate is designated as “B”, and a higher resistance value (10 k ⁇ or more) is stable.
- the steel plate indicated as “A” was designated as “A”. Further, “C” was defined as less than 1 k ⁇ .
- the thermal expansion coefficient was obtained by preparing a test piece of 1 mm thickness ⁇ 10 mm width ⁇ 50 mm length and measuring the thermal expansion with a push rod. In an Ar atmosphere, the spring compression load was measured at 50 g or less. The thermal expansion coefficient was calculated by measuring the thermal expansion when the temperature was raised from 50 ° C. to 600 ° C. assuming film formation of a CIS solar cell. The target thermal expansion coefficient of the present embodiment is based on 50 ° C., and the average linear expansion coefficient when the temperature is raised to 600 ° C. maintains the durability of the film formed on the CIS solar cell substrate.
- the steel sheet obtained by the above-mentioned process was 12.5 ⁇ 10 ⁇ 6 / ° C. or less, and “B” was obtained as the steel sheet from which it was obtained, and “C” was defined as exceeding 12.5 ⁇ 10 ⁇ 6 / ° C.
- Table 2 summarizes the heat treatment conditions and the evaluation results.
- Test No. 1-10 the surface of a stainless steel material having a composition defined in the present embodiment, by heat treatment (i) Al containing 2 O 3 more than 50%, or (i) Al 2 O 3 and (ii) SiO 2 And an oxide film containing a total of 50% or more.
- the target surface insulation and thermal expansion coefficient were obtained in this embodiment.
- No. 1 was subjected to heat treatment using steels C, D, F, G, H, and I under heat treatment conditions having a dew point of 40 ° C. or higher.
- Nos. 3, 4, and 6 to 9 were (iii) formed with an oxide film containing MgAl 2 O 4 and had a surface insulation property of “A”.
- Test No. Nos. 11 to 13, 15, and 16 are made of steel that deviates from the composition defined in this embodiment and either or both of the formulas (1).
- Test No. The steel sheets of 12, 15, and 16 had an oxide film formed by heat treatment under the heat treatment conditions shown in Table 2, but this oxide film contains (i) 50% or more of Al 2 O 3 or (i It was not an oxide film containing 50% or more of the total of () Al 2 O 3 and (ii) SiO 2, and the target surface insulation in this embodiment was not obtained.
- the test number No. 11 and 13 had good insulating properties, but were not preferable as solar cell substrates because of their very large thermal expansion coefficients.
- Test No. 14 is a low Cr steel that deviates from the components defined in the present embodiment, and uses a steel that satisfies the formula (1) defined in the present embodiment.
- Test No. No. 14 the target thermal expansion coefficient in this embodiment was not obtained.
- oxide film by annealing in heat treatment conditions shown in Table 2 were formed, the oxide film includes (i) Al 2 O 3 50% or more, or (i) Al 2 O 3 ( ii) It was not an oxide film containing 50% or more of SiO 2 in total, and the target surface insulating property in this embodiment was not obtained.
- the surface contains (i) 50% or more of (i) Al 2 O 3 defined in this embodiment, or (i) Al 2 O 3. And (ii) it is necessary that an oxide film containing 50% or more of the total of SiO 2 is formed.
- (ii) MgAl 2 O 4 is further added. It is effective to form an oxide film containing.
- the component defined in the present embodiment and the component adjustment of the formula (1) are effective.
- the present invention it is possible to obtain a stainless steel solar cell substrate suitable for a solar cell substrate having an insulating surface that maintains a high conversion efficiency of a solar cell regardless of coating or plating and having a low thermal expansion coefficient. it can.
- the present invention is suitable for a CIS solar cell substrate in which an electrode and a light absorption layer are formed on an insulating substrate.
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Abstract
Description
本願は、2013年5月10日に、日本に出願された特願2013-100592号に基づき優先権を主張し、その内容をここに援用する。
たとえば特許文献1,2には、平滑なステンレス鋼板の表面にアルミナや酸化シリコンあるいは窒化シリコン膜をコーティングした絶縁性材料が開示されている。素材には、汎用のフェライト系ステンレス鋼SUS430(17Cr鋼)が使用されている。
すなわち、上記課題に対しては、コーティングやメッキによらず太陽電池の変換効率を損なわない絶縁性表面を達成することが望まれる。この点に関しては、特許文献1~7で開示されている通り、これまで、コーティングやメッキによるステンレス鋼の適用技術が主流である。さらに、コーティングによらない絶縁性を付与する技術については、現状、特許文献8に開示されているSUS430にAl添加したステンレス鋼への850℃以上60分の熱処理または、特許文献9に開示されている20Cr-5Alのステンレス鋼に対して、1000℃以上,1時間以上の熱処理を施す方法に限定されている。
Cr、Si、Mn、Alの主構成元素に加えて、微量のMgはAl系スピネル酸化物の生成を促進して絶縁性を高める作用を持つ。更に、SnならびにZrを複合添加した場合に(i)~(iii)の形成は促進される。また、上記合金組成の調整は、酸化皮膜の形成に加えて、Al含有フェライト系ステンレス鋼の熱膨張係数の上昇抑制にも効果的であることを知見した。
上記(a)~(f)の知見に基づいて成された本発明の要旨は、以下の通りである。
Cr+10Si+Mn+Al>24.5 ・・・(1)
但し、(1)式中の元素記号は、当該元素の鋼中における含有質量%を意味する。
(3) 前記ステンレス鋼材が、質量%にて、更にSn:1%以下、Zr:0.5%以下、Mg:0.005%以下、Ni:1%以下、Cu:1%以下、Co:0.5%以下、Mo:2%以下、V:0.5%以下、B:0.005%以下、Ca:0.005%以下、La:0.1%以下,Y:0.1%以下,Hf:0.1%以下,REM:0.1%以下、Nb:1%以下、Ti:1%以下の1種または2種以上を含有していることを特徴とする(1)または(2)に記載の絶縁性に優れた熱膨張係数の小さいステンレス製太陽電池用基板。
(5) 前記酸化皮膜中の(iii)MgAl2O4の含有量が5%以上であることを特徴とする(4)に記載の絶縁性に優れた熱膨張係数の小さいステンレス製太陽電池用基板。
(7) 前記形成皮膜工程において、露点40℃以上の水蒸気を含む雰囲気中で前記熱処理を行うことを特徴とする(6)に記載の絶縁性に優れた熱膨張係数の小さいステンレス製太陽電池用基板の製造方法。
また、本発明のステンレス製太陽電池用基板のステンレス鋼材が、Al:2.0%以上及びSi:0.3%以上を含む場合、熱処理時にAlとSiとによる絶縁性酸化皮膜の形成を促進させる相乗効果が得られるとともに、Alを含有させることによる熱膨張係数の上昇が、Siによって効果的に抑制される。その結果、より一層絶縁性に優れた酸化皮膜を有し、しかも熱膨張係数が小さい太陽電池基板に好適なステンレス製太陽電池用基板となる。
本実施形態のステンレス製太陽電池用基板は、ステンレス鋼材の表面に、上記(i)Al2O3を含む酸化皮膜、または(i)Al2O3と(ii)SiO2および/または(iii)MgAl2O4とを含む酸化皮膜が形成されている。
本実施形態のステンレス製太陽電池用基板に含まれるステンレス鋼材は、以下に示す組成を有しているため、熱処理を行うことにより、上記(i)Al2O3を含む酸化皮膜、または(i)Al2O3と(ii)SiO2および/または(iii)MgAl2O4とを含む酸化皮膜が表面に形成されるものとなっている。
本実施形態のステンレス製太陽電池用基板に含まれるステンレス鋼材は、フェライト系ステンレス鋼である。Crは、本実施形態において用いられるフェライト系ステンレス鋼の主構成元素である。Crは、SiおよびAlとともに添加することにより、(i)Al2O3を含む酸化皮膜、または(i)Al2O3と(ii)SiO2および/または(iii)MgAl2O4とを含む上記絶縁性酸化皮膜の形成を促進し、熱膨張係数を低下させる必須の元素である。上記効果を得るために、Cr含有量の下限は9%とし、10%とすることが好ましく、11%とすることがより好ましい。Cr含有量の上限は、SiおよびAlの添加による鋼の靭性や加工性の低下を抑制する観点から25%とし、好ましくは20%、より好ましくは18%とする。
一方、過度なSi添加は鋼の靭性と加工性の低下を招く。このため、Si含有量の上限は4.0%とし、3.5%とすることが好ましく、2.0%とすることがより好ましい。
一方、過度なAl添加は、鋼の熱膨張係数を上昇させて熱処理により得られる酸化皮膜の耐久性を阻害する。このため、Al含有量の上限は5.0%であり、3.5%とすることが好ましく、2.5%とすることがより好ましい。Al含有量が5.0%を超えると、熱膨張係数が大きいために太陽電池基板として好ましくない。
また、0.4%以上のSi及び0.5%以上のAlを含有するステンレス鋼材とすることで、熱処理時に、Al2O3やAl含有スピネル酸化物の生成を極めて効果的に促進できる。
Alを0.5%以上含有させることで、上記の絶縁性酸化皮膜の形成を促進する作用が得られる。Al含有量は、絶縁性酸化皮膜の形成を促進する作用を得るためには、1.0%以上とすることが好ましく、1.5%以上とすることがより好ましい。
Alを2.0%以上含有する場合、熱処理によって得られる酸化皮膜の絶縁性が、より一層向上する。しかし、Alの含有量を増加させるほど、熱膨張係数が大きくなる。このため、Alを2.0%以上含有させる場合、Si含有量を0.3%以上とすることが好ましい。Siを0.3%以上含有させることで、Alを2.0%以上含有させることによる熱膨張係数の上昇を抑制できる。Alを2.0%以上含有させる場合のSi含有量は、熱膨張係数の上昇を効果的に抑制するために、0.4%以上とすることがより好ましい。熱膨張係数が十分に小さいステンレス鋼材は、太陽電池基板として用いられた場合に、基板とMo電極およびCIS光吸収層との密着性が高いものとなり、優れた耐久性が得られる。
なお、Alの含有量が2.0%未満である場合には、Si含有量が0.3%未満であっても、熱膨張係数の十分に小さいステンレス鋼材となる。また、Alの含有量が5.0%を超える場合、Siを含有させることにより熱膨張係数の上昇を抑制しても、熱膨張係数が十分に低いステンレス鋼材は得られない。
本実施形態のステンレス製太陽電池用基板では、前記(I)項に記載する成分を有するステンレス鋼材の表面に、本実施形態の目的とする太陽電池用基板に好適な絶縁性表面を付与するため、以下に示す酸化皮膜が形成されている。
また、前記酸化皮膜は、(i)Al2O3と(iii)MgAl2O4(Al含有スピネル系酸化物)とを含むものであってもよいし、(i)Al2O3と(ii)SiO2に加えて、さらに(iii)MgAl2O4(Al含有スピネル系酸化物)を含むものであってもよい。酸化皮膜が(iii)MgAl2O4を含む場合、(i)Al2O3の性状によらず絶縁性を向上させることができ好ましい。
酸化皮膜中の(ii)SiO2の含有量が5%以上である場合、(ii)SiO2を形成することによって(i)Al2O3の形成が十分に促進されたものとなる。また、酸化皮膜が(ii)SiO2を含むものである場合、酸化皮膜中の(i)Al2O3の含有量を確保して、絶縁性を確保するため、酸化皮膜中の(ii)SiO2の含有量は30%以下であることが好ましく、25%以下であることがより好ましい。
本実施形態の製造方法においては、(I)項に記載される成分のステンレス鋼材の表面に(II)項に記載した酸化皮膜を形成するために、水蒸気を含む雰囲気中で300~1000℃の温度範囲で熱処理を行う(形成皮膜工程)ことが好ましい。
なお、熱処理されるステンレス鋼材は、(I)項に記載する成分を有するものであり、従来公知の製造方法で得られたものである。熱処理されるステンレス鋼材は、ステンレス製太陽電池用基板として使用可能な形状であれば、如何なる形状を有するものであってもよい。また、熱処理されるステンレス鋼材の表面性状については特に規定するものでなく、JIS G 4304:2012及びJIS G 4305:2012(ISO 16143-1:2004に対応)に準拠したBA、2B、2D、No.4、研磨等とすることができる。
熱処理は、10分以下の連続焼鈍もしくは24~72時間のバッチ式タイプの熱処理とすることが好ましい。
表1に示す成分を有するフェライト系ステンレス鋼を溶製し、熱間圧延と焼鈍を実施した後、冷間圧延を経て板厚0.5mmの冷延鋼板とした。ここで、鋼の成分は、本実施形態で規定される範囲とそれ以外とした。冷延鋼板は、いずれも再結晶が完了する800~1000℃の範囲で仕上げ焼鈍・酸洗を行った。
(i)Al2O3:(104)面、2θ=35.15°
(ii)SiO2:(101)面、2θ=26.64°
(iii)MgAl2O4:(311)面、2θ=36.85°
(iv)Cr2O3:(110)面、2θ=36.16°/(104)面、2θ=33.6°
酸化物の存在比率は、例えば、(i)Al2O3の場合、(i)/{(i)+(ii)+(iii)+(iv)}×100により算出した。なお、上式中の(i)~(iv)は、上記X線回折で測定した(i)Al2O3の(104)面、(ii)SiO2の(101)面、(iii)MgAl2O4の(311)面、及び(iv)Cr2O3の(110)面から得られた回折ピーク高さ(cps)をそれぞれ意味する。
上式の(iv)の値はメイン回折ピークとして(110)面の回折ピーク高さを採用した。(iv)Cr2O3の存在は、(i)Al2O3の回折ピークと識別するために、(104)面の回折ピークが存在することを確認した。
表2において「比率%」は(i)~(iii)の存在比率の合計を示す。
試験番号No.1~10は、本実施形態で規定される組成を有するステンレス鋼材の表面に、熱処理により(i)Al2O3を50%以上含む、または(i)Al2O3と(ii)SiO2との合計を50%以上含む酸化皮膜が形成されているものである。
試験番号1~10の鋼板は、本実施形態で目標とする表面絶縁性と熱膨張係数が得られた。
中でも、鋼C、D、F、G、H、Iを用いて露点40℃以上の熱処理条件で熱処理したNo.3、4、6~9は、(iii)MgAl2O4を含む酸化皮膜が形成されているものであり、表面絶縁性が「A」であった。
試験番号No.12、15、16の鋼板は、表2に示す熱処理条件で熱処理を行うことにより酸化皮膜が形成されていたものの、この酸化皮膜は(i)Al2O3を50%以上含む、または(i)Al2O3と(ii)SiO2との合計を50%以上含む酸化皮膜ではなく、本実施形態で目標とする表面絶縁性が得られなかった。
また、試験番号No.11、13は、絶縁性は良好であったが、熱膨張係数が非常に大きいため太陽電池基板として好ましくないものであった。
Claims (7)
- 質量%にて、Cr:9~25%、C:0.03%以下、Mn:2%以下、P:0.05%以下、S:0.01%以下、N:0.03%以下、Al:0.005~5.0%、Si:0.05~4.0%を含み、残部がFeおよび不可避的不純物からなり、Al:0.5%以上、及び/又は、Si:0.4%以上を含み、下記(1)式を満たす組成を有するステンレス鋼材の表面に、(i)Al2O3を50%以上含む、または(i)Al2O3と(ii)SiO2との合計を50%以上含む酸化皮膜が形成されていることを特徴とする絶縁性に優れた熱膨張係数の小さいステンレス製太陽電池用基板。
Cr+10Si+Mn+Al>24.5 ・・・(1)
但し、(1)式中の元素記号は、当該元素の鋼中における含有質量%を意味する。 - 前記ステンレス鋼材が、Al:2.0%以上及びSi:0.3%以上を含むものであることを特徴とする請求項1に記載の絶縁性に優れた熱膨張係数の小さいステンレス製太陽電池用基板。
- 前記ステンレス鋼材が、質量%にて、更にSn:1%以下、Zr:0.5%以下、Mg:0.005%以下、Ni:1%以下、Cu:1%以下、Co:0.5%以下、Mo:2%以下、V:0.5%以下、B:0.005%以下、Ca:0.005%以下、La:0.1%以下,Y:0.1%以下,Hf:0.1%以下,REM:0.1%以下、Nb:1%以下、Ti:1%以下の1種または2種以上を含有していることを特徴とする請求項1または請求項2に記載の絶縁性に優れた熱膨張係数の小さいステンレス製太陽電池用基板。
- 前記酸化皮膜が(iii)MgAl2O4を含むことを特徴とする請求項3に記載の絶縁性に優れた熱膨張係数の小さいステンレス製太陽電池用基板。
- 前記酸化皮膜中の(iii)MgAl2O4の含有量が5%以上であることを特徴とする請求項4に記載の絶縁性に優れた熱膨張係数の小さいステンレス製太陽電池用基板。
- 請求項1~請求項3のいずれか一項に記載の組成を有するステンレス鋼材を、水蒸気を含む雰囲気中で300~1000℃の温度範囲で熱処理することにより、前記ステンレス鋼材の表面に酸化皮膜を形成する形成皮膜工程を有することを特徴とする絶縁性に優れた熱膨張係数の小さいステンレス製太陽電池用基板の製造方法。
- 前記形成皮膜工程において、露点40℃以上の水蒸気を含む雰囲気中で前記熱処理を行うことを特徴とする請求項6に記載の絶縁性に優れた熱膨張係数の小さいステンレス製太陽電池用基板の製造方法。
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KR20150140809A (ko) | 2015-12-16 |
US9837567B2 (en) | 2017-12-05 |
CN105209651B (zh) | 2018-10-16 |
CN105209651A (zh) | 2015-12-30 |
TWI518189B (zh) | 2016-01-21 |
JP6392501B2 (ja) | 2018-09-19 |
EP2995697A1 (en) | 2016-03-16 |
EP2995697A4 (en) | 2017-01-18 |
EP2995697B1 (en) | 2019-12-18 |
TW201504456A (zh) | 2015-02-01 |
US20160079455A1 (en) | 2016-03-17 |
JP2014218728A (ja) | 2014-11-20 |
KR101773277B1 (ko) | 2017-08-31 |
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