WO2012070528A1 - 単結晶引き上げ装置、及び単結晶引き上げ装置に用いられる低熱伝導性部材 - Google Patents
単結晶引き上げ装置、及び単結晶引き上げ装置に用いられる低熱伝導性部材 Download PDFInfo
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- WO2012070528A1 WO2012070528A1 PCT/JP2011/076798 JP2011076798W WO2012070528A1 WO 2012070528 A1 WO2012070528 A1 WO 2012070528A1 JP 2011076798 W JP2011076798 W JP 2011076798W WO 2012070528 A1 WO2012070528 A1 WO 2012070528A1
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- Prior art keywords
- crucible
- single crystal
- crystal pulling
- saucer
- pulling apparatus
- Prior art date
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/10—Crucibles or containers for supporting the melt
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- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/71—Ceramic products containing macroscopic reinforcing agents
- C04B35/78—Ceramic products containing macroscopic reinforcing agents containing non-metallic materials
- C04B35/80—Fibres, filaments, whiskers, platelets, or the like
- C04B35/83—Carbon fibres in a carbon matrix
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/14—Heating of the melt or the crystallised materials
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/30—Mechanisms for rotating or moving either the melt or the crystal
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
- Y10T117/1032—Seed pulling
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
- Y10T117/1032—Seed pulling
- Y10T117/1068—Seed pulling including heating or cooling details [e.g., shield configuration]
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
- Y10T117/1032—Seed pulling
- Y10T117/1072—Seed pulling including details of means providing product movement [e.g., shaft guides, servo means]
Definitions
- the present invention relates to a single crystal pulling apparatus for producing a metal single crystal from a metal raw material for single crystallization such as silicon and germanium by the Czochralski method, and a low thermal conductive member used in the single crystal pulling apparatus,
- the present invention relates to a heat escape prevention structure that prevents heat from escaping from the crucible used in a single crystal pulling apparatus to the outside of the furnace via a crucible rotating shaft.
- CZ method As a method for producing a silicon single crystal from polycrystalline silicon, there is a Czochralski method (hereinafter referred to as “CZ method”).
- the general configuration of the single crystal pulling apparatus used in the CZ method is as follows: a quartz crucible for containing a silicon melt, a graphite crucible for holding the quartz crucible, a saucer for fixing and holding the graphite crucible at the bottom, and the saucer And a crucible rotating shaft that moves up and down while rotating the saucer and the crucible, and a heater arranged on the outer periphery of the graphite crucible. Then, the graphite crucible and the quartz crucible are heated by a heater to melt silicon.
- the crucible, the saucer, and the crucible rotating shaft are generally all made of graphite, the following problems occur. That is, since the graphite material is a material having high thermal conductivity, the heat in the crucible is conducted from the tray to the crucible rotating shaft and escapes to the outside of the furnace. In other words, the amount of heat applied to dissolve the metal conducts the graphite material and escapes, causing heat loss. As a result, the temperature in the crucible is lowered, and in order to cover this heat loss, there is a problem that it is necessary to heat by an amount corresponding to the loss, resulting in an extra power consumption.
- Patent Document 1 proposes that the low heat conductive member is formed of a carbon fiber reinforced carbon composite material, that all the crucible rotation shafts are formed of a carbon fiber reinforced carbon composite material, and the like.
- CZ method As a method for producing a silicon single crystal from polycrystalline silicon, there is a Czochralski method (hereinafter referred to as “CZ method”). As shown in FIG. 10, the general structure of the single crystal pulling apparatus used in the CZ method is as follows: a quartz crucible 50 that contains a silicon melt, a graphite crucible 51 that holds the quartz crucible 50, the graphite crucible 51, and The quartz crucible 50 is composed of a crucible rotating shaft 52 that moves up and down while rotating, a heater 53 disposed on the outer periphery of the graphite crucible 51, and the like. In addition, 54 is a heat shielding member, 55 and 56 are exhaust paths, such as SiO gas, and 57 is an exhaust port.
- Patent Document 1 Another problem of the conventional example described in Patent Document 1 is that the conventional crucible rotating shaft cannot be used as it is, and it is necessary to process a groove or a hole for interposing a low heat conductive member on the crucible rotating shaft. There is. Therefore, the manufacturing cost is increased. Further, when all the crucible rotating shafts are formed of carbon fiber reinforced carbon composite material, the manufacturing cost is significantly increased compared to the conventional crucible rotating shaft, which is impractical.
- the polycrystalline silicon lump filled in the quartz crucible 50 is heated by the heater 53 from the surroundings.
- the quartz crucible 50 is directly heated, it is softened and deformed at a high temperature and broken.
- the graphite crucible 51 is placed outside and held.
- the graphite crucible 51 is generally divided into two or three parts vertically to prevent breakage due to the difference in shrinkage from the quartz crucible 50 during cooling.
- the quartz crucible 50 and the graphite crucible 51 are always in contact at the same position and become high temperature, the following reactions (1) and (2) occur in the graphite crucible 51.
- the curved surface portion (R portion) extending from the side surface to the bottom surface of the dividing surface is gradually consumed to reduce the thickness, and on the inner surface side, SiC is generated from the inner surface toward the inside by a silicidation (SiC) reaction.
- SiC silicidation
- This SiC is formed thickest in the vicinity of the R portion having the longest time during which the single crystal is pulled, which is maintained at high temperature. Since SiC is generated by entering silicon (Si) into the hexagonal system of graphite, the volume expands in a three-dimensional direction on the inner surface side of the graphite crucible.
- the object of the present invention has been devised in view of the above circumstances, and can further suppress the heat escape from the crucible rotating shaft to the outside of the furnace. Moreover, the crucible, the saucer, the crucible rotating shaft, etc. It is an object of the present invention to provide a single crystal pulling apparatus that can use the constituent members of the crystal pulling apparatus as they are, and can suppress the manufacturing cost at a low cost, and a low thermal conductivity member used in the single crystal pulling apparatus. Another object of the present invention has been devised in view of the above circumstances, and is a single crystal capable of avoiding problems due to thickness reduction due to oxidation consumption and silicification (SiC conversion) relating to a graphite crucible. It is to provide a pulling device.
- the present invention provides a crucible device comprising a crucible and a saucer for holding and holding the crucible at the lower part, and a crucible rotation that supports the saucer at the lower part and moves up and down while rotating the saucer and the crucible.
- a single crystal pulling apparatus comprising a shaft, wherein a gap is formed between at least one of the crucible and the saucer and between the saucer and the crucible rotating shaft.
- the single crystal pulling apparatus is not limited to a silicon single crystal pulling apparatus provided with a quartz crucible for storing a silicon melt and a graphite crucible for holding the quartz crucible, and a germanium melt or the like is directly graphitized. Also includes a single crystal pulling device housed in a crucible.
- the gap is formed between at least one of the crucible and the saucer and between the saucer and the crucible rotating shaft, heat escape can be suppressed. More specifically, a part of the amount of heat transmitted from the heater to the crucible escapes to the outside of the furnace through the tray and the crucible rotating shaft. At this time, (1) when a gap is formed between the crucible and the saucer, heat escape from the crucible to the saucer is suppressed, and (2) a gap is formed between the saucer and the crucible rotating shaft.
- the gap is formed between at least one of the crucible and the saucer and between the saucer and the crucible rotation shaft, the amount of heat leaking from the crucible rotation shaft to the outside of the furnace can be reduced.
- the amount of heat applied to the metal raw material melt such as silicon inside can be maintained, and the temperature in the crucible can be maintained at or above the melting point of the metal raw material.
- the amount of heat leaking from the lower portion of the crucible rotating shaft is reduced by forming the gap portion, a large amount of heat generated by the heater is not required in consideration of heat loss.
- the present invention is more effective than the configuration in which the low heat conductive member is disposed on the crucible rotating shaft as in the conventional example. Can be suppressed.
- a thin member may be disposed on the joint surface between the crucible and the saucer and the joint surface between the saucer and the crucible rotating shaft.
- the constituent members of the single crystal pulling device such as the saucer and the crucible rotating shaft can be used as they are, and the manufacturing cost can be reduced.
- the gap formed between the crucible and the tray is located below the bottom of the crucible.
- the amount of heat escape from the bottom of the crucible can be suppressed, so that the temperature of the melt at the bottom of the crucible can be prevented from decreasing, and the melting caused by the difference from the temperature of the melt at the top of the crucible Generation of convection of objects can be suppressed.
- the gap formed between the saucer and the crucible rotating shaft is located below the saucer bottom.
- At least one of the joining surface between the crucible and the saucer and the joining surface between the saucer and the crucible rotating shaft is perpendicular to the main surface (corresponding to the thickness direction). It is preferable that a low thermal conductive member having low conductivity is interposed.
- the crucible and the saucer are not in direct contact, and the saucer and the crucible rotating shaft are not in direct contact. Accordingly, since the escape heat always passes through the low thermal conductivity member, the thermal conduction is suppressed by the low thermal conductivity member. Therefore, the heat escape to the crucible rotating shaft can be delayed, and the heat loss of the crucible can be prevented.
- the low thermal conductivity member is interposed on the joint surface between the crucible and the saucer and the joint surface between the saucer and the crucible rotation shaft, the constituent members of the single crystal pulling device such as the crucible, the saucer, the crucible rotation shaft, etc. It can be used as it is, and there is no need to process a groove or hole for interposing a low heat conducting member on the crucible rotating shaft as in the conventional example, and the manufacturing cost can be kept low.
- the low heat conductive member is not particularly limited as long as it is a material that can reduce heat conduction, but it is sufficient for compressive stress generated by the weight of the crucible, the saucer and the like placed on the upper side.
- a material having resistance is preferred.
- a strength equivalent to that of artificial graphite such as a crucible is sufficient, and a compressive strength of 80 MPa or more is preferable.
- the range of “low thermal conductivity” of the low thermal conductivity member is that the thermal conductivity is 10 W / m ⁇ K or less, preferably 5 W / m ⁇ K or less at room temperature.
- the low thermal conductivity member is preferably made of a one-dimensional carbon fiber reinforced carbon composite material or a two-dimensional carbon fiber reinforced carbon composite material.
- the compressive strength in the direction perpendicular to the main surface of the carbon fiber reinforced carbon composite material is higher than that of the graphite material, and may be 200 MPa or more. Since it has sufficient resistance to the compressive stress generated by the above, it is convenient as a material for the low thermal conductivity member according to the present invention. Therefore, as a material for the low thermal conductivity member, any one of a one-dimensional carbon fiber reinforced carbon composite material, a two-dimensional carbon fiber reinforced carbon composite material, and a three-dimensional carbon fiber reinforced carbon composite material may be used, but preferably Is a one-dimensional carbon fiber reinforced carbon composite or a two-dimensional carbon fiber reinforced carbon composite. The reason is as follows.
- Both the one-dimensional carbon fiber reinforced carbon composite and the two-dimensional carbon fiber reinforced carbon composite have low thermal conductivity in the direction perpendicular to the main surface (thickness direction of the carbon fiber reinforced carbon composite). Therefore, heat escape from the crucible can be effectively prevented. Since the three-dimensional carbon fiber reinforced carbon composite material has a property of high thermal conductivity in the vertical direction, the heat insulation effect is higher than that of the one-dimensional carbon fiber reinforced carbon composite material or the two-dimensional carbon fiber reinforced carbon composite material. It is also bad and extremely expensive. Therefore, in consideration of the heat insulation effect and the price of the low thermal conductivity member, a one-dimensional carbon fiber reinforced carbon composite material or a two-dimensional carbon fiber reinforced carbon composite material is preferable as the material of the low thermal conductivity member.
- the said carbon fiber reinforced carbon composite material is the structure currently formed in substantially cyclic
- the shape of the carbon fiber reinforced carbon composite material may be any shape such as a circular shape or an annular shape, but is preferably an annular shape. This is because, when the carbon fiber reinforced carbon composite material is formed in a substantially annular shape, a void portion can be surely formed on the lower side of the crucible bottom or the lower side of the saucer bottom. In addition, the crucible can be stably fixed and supported. Furthermore, since the contact area is smaller in the annular shape than in the circular shape, the effect of preventing heat escape can be further enhanced.
- the present invention is a low thermal conductivity member used in a single crystal pulling apparatus, and is interposed on at least one of a joint surface between the crucible and the saucer and a joint surface between the saucer and the crucible rotating shaft, It is used for suppressing the conduction of heat from the crucible to the crucible rotating shaft.
- the low thermal conductivity member is preferably made of a one-dimensional carbon fiber reinforced carbon composite material or a two-dimensional carbon fiber reinforced carbon composite material.
- it is preferable that the low heat conductive member is formed in the substantially cyclic
- the crucible device holds a quartz crucible having a straight body portion, a bottom portion, and a curved surface portion extending from the bottom portion to the straight body portion, and holds the quartz crucible at a lower portion. It is preferably composed of a graphite tray.
- a crucible device that does not use a graphite crucible makes it possible to avoid the thickness reduction due to oxidation consumption and the problem due to silicidation (SiC), which have been conventionally problematic. Further, the manufacturing is easy and the cost can be reduced. More specifically, the graphite crucible of the conventional example is manufactured by punching a graphite block into a bottomed cylindrical shape and further finishing the inside. Therefore, it took time and effort to manufacture. On the other hand, in the case of a graphite tray, since it has a dish shape without a straight body portion, there is an advantage that processing is easy and manufacturing is not troublesome. In addition, since there is no straight body portion, there is an advantage that the material cost can be reduced.
- the tray is preferably configured to hold at least the bottom of the quartz crucible.
- the saucer holds at least the bottom of the quartz crucible.
- the tray is preferably configured to hold the bottom portion and the curved portion of the quartz crucible.
- the structure that holds the curved surface portion can suppress deformation due to softening of the quartz crucible when heated by a heater. Therefore, in the single crystal pulling apparatus using the interposition member described later, the risk of contact between the quartz crucible and the interposition member is reduced, so that the quartz crucible and the interposition member may be in contact with each other during the manufacturing process. There is no.
- the outer peripheral surface of the tray and the outer peripheral surface of the straight body of the quartz crucible are preferably substantially flush with each other. It becomes easy to arrange
- a crucible device heating device for heating the crucible device, and the crucible device heating device includes a heater disposed so as to surround an outer periphery of the crucible device, and the crucible device. And an interposing member made of a cylindrical carbonaceous material disposed so as to surround the outer periphery of the crucible device.
- the heat of the heater heats the quartz crucible through the graphite interposition member.
- the interposition member is cylindrical and has no slit, the heat generation variation of the heater is alleviated by the interposition member and the quartz crucible is heated. For this reason, the quartz crucible is heated uniformly.
- the interposition member is configured to be arranged with a small gap from the quartz crucible.
- the size of the minute gap M is, for example, about 1 to 3 mm when using a 22-inch quartz crucible.
- the reason for this restriction is that if it is too narrow, the quartz crucible may come into contact with slight deformation, and if it is too wide, heat transfer from the heater may be insufficient.
- the present invention it is possible to reduce the amount of heat leaked from the crucible rotary shaft to the outside of the furnace by forming a gap between at least one of the crucible and the saucer and between the saucer and the crucible rotary shaft.
- the amount of heat applied to the metal raw material melt such as silicon in the crucible can be maintained, and the temperature in the crucible can be maintained above the melting point of the metal raw material.
- the amount of heat leaking from the lower portion of the crucible rotating shaft is reduced by forming the gap portion, a large amount of heat generated by the heater is not required in consideration of heat loss.
- the present invention is more effective than the configuration in which the low heat conductive member is disposed on the crucible rotating shaft as in the conventional example. Can be suppressed.
- a thin member may be disposed on the joint surface between the crucible and the saucer and the joint surface between the saucer and the crucible rotating shaft.
- the constituent members of the single crystal pulling device such as the saucer and the crucible rotating shaft can be used as they are, and the manufacturing cost can be reduced.
- FIG. 1 is a cross-sectional view of a main part of a silicon single crystal pulling apparatus according to Embodiment 1-1.
- FIG. 1 is a cross-sectional view of a main part of the silicon single crystal pulling apparatus according to the embodiment 1-1.
- 1 is a single crystal pulling device
- 2 is a quartz crucible for containing a silicon melt
- 4 is a graphite crucible for holding the quartz crucible 2
- 5 is a graphite tray for fixing and holding the graphite crucible 4 at the bottom
- Reference numeral 6 denotes a graphite crucible rotating shaft that supports the receiving tray 5 at the lower portion and moves up and down while rotating the receiving tray 5 and the crucibles 2 and 4.
- the quartz crucible 2, the graphite crucible 4, and the graphite tray 5 constitute a crucible device.
- the crucible rotating shaft 6 is controlled to be rotatable by a rotation / lifting drive device (not shown). Then, the crucible rotating shaft 6 rotates the receiving plate 5, the graphite crucible 4 and the quartz crucible 2 with the pulling axis direction of the silicon single crystal as the rotating shaft, and is moved upward to make the melt surface of the silicon melt 3 constant. It is designed to maintain the height.
- a heater 7 is disposed on the outer periphery of the graphite crucible 4. The silicon melt 3 is heated by the heater 7 through the graphite crucible 4 and the quartz crucible 2, and a silicon single crystal is produced while pulling up the ingot 8. .
- the low heat conduction member 10 is interposed on the joint surface between the tray 5 and the crucible rotating shaft 6. That is, the low thermal conductive member 10 is interposed between the bottom surface of the bottom of the tray 5 and the top surface of the flange portion 6 a of the crucible rotating shaft 6.
- the low heat conductive member 10 is formed in a substantially tubular shape, and is disposed in a state where the convex portion 6b of the crucible rotating shaft 6 is inserted through the central hole of the low heat conductive member 10. Thereby, the space
- the low heat conductive member 10 is made of a two-dimensional carbon fiber reinforced carbon composite material.
- the carbon fiber reinforced carbon composite material any one of a one-dimensional carbon fiber reinforced carbon composite material, a two-dimensional carbon fiber reinforced carbon composite material, and a three-dimensional carbon fiber reinforced carbon composite material may be used. However, it is preferably a one-dimensional carbon fiber reinforced carbon composite material or a two-dimensional carbon fiber reinforced carbon composite material, and more preferably a two-dimensional carbon fiber reinforced carbon composite material. The reason is as follows.
- the material of the low thermal conductive member 10 has sufficient strength, low thermal conductivity, low cost, and the like.
- the three-dimensional carbon fiber reinforced carbon composite material has a higher thermal conductivity in the vertical direction (corresponding to the crucible rotation axis direction in the present embodiment) than the two-dimensional carbon fiber reinforced carbon composite material, and has a low heat insulation effect.
- the price is high. Accordingly, it is preferable to use a two-dimensional carbon fiber reinforced carbon composite material rather than a three-dimensional carbon fiber reinforced carbon composite material.
- the one-dimensional carbon fiber reinforced carbon composite material has the same thermal insulation effect as the two-dimensional carbon fiber reinforced carbon composite material, and the price is also the same as the two-dimensional carbon fiber reinforced carbon composite material. .
- a one-dimensional carbon fiber reinforced carbon composite material is easily cracked when formed in an annular shape. Therefore, when the low thermal conductive member 10 is in the shape of a disk, a one-dimensional carbon fiber reinforced carbon composite material may be used as the material of the low thermal conductive member 10, but the low thermal conductive member 10 is annular. When forming, it is preferable to use a two-dimensional carbon fiber reinforced carbon composite material.
- the thickness of the low thermal conductive member 10 made of a two-dimensional carbon fiber reinforced carbon composite material is 3 to 10 mm. Increasing the thickness lowers the heat conduction and improves the heat insulation effect. However, considering a practical range, the thickness is preferably in the range of 3 to 10 mm.
- the size of the gap 11 is 2 mm or more, preferably 3 mm or more, more preferably 5 mm or more. However, if it is too large, the stability of the crucible will deteriorate, so that it is preferably less than 50 mm.
- the heater 7 generates heat, and the quartz crucible 2 is heated via the graphite crucible 4, so that the polycrystalline silicon in the quartz crucible 2 exceeds the melting point of silicon. Melts when heated.
- the seed crystal attached to the seed chuck is lowered and immersed in the molten silicon melt 3, and then the seed chuck is pulled up while rotating the seed chuck and the graphite crucible 4 in the same direction or in the opposite direction. A silicon crystal is grown.
- the graphite crucible 4 is heated by the heater 7, but the amount of heat of the graphite crucible 4 is transmitted from the graphite crucible 4 ⁇ the tray 5 ⁇ the crucible rotating shaft 6, and heat from the lower part of the crucible rotating shaft 6 to the outside of the furnace. Will run away.
- the gap 11 is formed below the bottom of the tray 5, heat escape from the bottom of the tray 5 to the crucible rotating shaft 6 is suppressed. Therefore, the heat escape from the tray 5 to the crucible rotating shaft 6 is mainly via the low heat conducting member 10.
- the low thermal conductive member 10 is made of a two-dimensional carbon fiber reinforced carbon composite material and is lower than the thermal conductivity of the graphite material, the transfer of heat from the tray 5 to the crucible rotating shaft 6 is suppressed. Thereby, the heat escape to the crucible rotating shaft 6 can be delayed, and the heat loss of the crucible can be prevented. Furthermore, since the heat at the bottom of the graphite crucible 4 is difficult to escape, the temperature uniformity at the bottom of the crucibles 4 and 2 is improved, so that the convection of the silicon melt due to the temperature difference from the upper side of the crucible is suppressed. Is possible.
- FIG. 3 is a cross-sectional view of a main part of the silicon single crystal pulling apparatus according to Embodiment 1-2.
- the embodiment 1-2 is characterized in that a gap 11A is formed below the bottom of the graphite crucible 4 and a low heat conductive member 10A is interposed on the joint surface between the graphite crucible 4 and the receiving tray 5.
- Embodiment 1-1 is characterized by a heat insulation structure between the tray 5 and the crucible rotating shaft 6
- this Embodiment 1-2 is a heat insulation structure between the graphite crucible 4 and the tray 5 It is characterized by.
- a specific structure of the embodiment 1-2 will be described.
- a substantially tubular low thermal conductive member 10 ⁇ / b> A is interposed on the joint surface between the graphite crucible and the tray 5. That is, the low thermal conductive member 10 ⁇ / b> A is interposed between the surface near the bottom outer side of the graphite crucible 4 and the upper surface of the tray 5.
- the center hole of the low heat conducting member 10A has a size substantially corresponding to the recess 5a of the tray 5, and the bottom of the graphite crucible 4 is fitted in the center hole and is disposed so as to face the bottom of the recess 5a.
- a gap 11 ⁇ / b> A is formed below the bottom of the graphite crucible 4.
- the bottom of the graphite crucible 4 is used in the following meaning in the present specification. That is, as shown in FIG. 3, when the length from the bottom of the graphite crucible 4 to the top of the crucible is L1, the length in the vertical direction from the bottom of the graphite crucible 4 to the bottom on the outer peripheral side is 1 / 3L.
- the region M when the length from the bottom of the graphite crucible 4 to the top of the crucible is L1, the length in the vertical direction from the bottom of the graphite crucible 4 to the bottom on the outer peripheral side is 1 / 3L.
- the region M when the length from the bottom of the graphite crucible 4 to the top of the crucible is L1, the length in the vertical direction from the bottom of the graphite crucible 4 to the bottom on the outer peripheral side is 1 / 3L.
- the heat of the graphite crucible 4 becomes difficult to be transferred to the tray 5, and the heat escape to the crucible rotating shaft 6 is prevented. It can be delayed, and the heat loss of the graphite crucible 4 can be prevented. Further, since it is difficult to escape heat from the bottom of the graphite crucible 4, the temperature uniformity at the bottom of the crucibles 4 and 2 is improved, so that the convection of the silicon melt due to the temperature difference from the upper side of the crucible is suppressed. It becomes possible.
- FIG. 4 is a cross-sectional view of a main part of the silicon single crystal pulling apparatus according to Embodiment 1-3.
- the third embodiment is characterized in that both a heat insulating structure between the tray 5 and the crucible rotating shaft 6 and a heat insulating structure between the graphite crucible 4 and the tray 5 are provided.
- the present embodiment 1-3 has a structure in which the above embodiment 1-1 and the above embodiment 1-2 are combined.
- the substantially crucible low heat conductive member 10A is interposed at the joint surface between the graphite crucible 4 and the receiving tray 5, and thereby the graphite crucible 4 A gap 11A is formed below the bottom. Further, a substantially tubular low heat conductive member 10 is interposed at the joint surface between the saucer 5 and the crucible rotating shaft 6, whereby a gap 11 is formed below the bottom of the saucer 5. With such a structure, a heat insulating effect between the receiving tray 5 and the crucible rotating shaft 6 and a heat insulating effect between the graphite crucible 4 and the receiving tray 5 are achieved, so that the heat loss of the crucible can be further prevented.
- the silicon single crystal pulling apparatus including the quartz crucible for storing the silicon melt and the graphite crucible for holding the quartz crucible has been described.
- the present invention can be applied to a single crystal pulling apparatus that directly stores a germanium melt or the like in a graphite crucible.
- the annular low thermal conductive member is integrally formed, but it may be configured to be annular by combining a plurality of members. Moreover, you may make it comprise with the some member spaced apart in the circumferential direction. However, the annular low heat conductive member formed integrally as in the first to third embodiments is more preferable. This is because only one member is required and handling is easy.
- the low heat conductive member is formed in an annular shape, it may be in a disk shape. However, the case of an annular shape is preferred. This is because the annular shape can surely form a gap portion below the bottom of the graphite crucible or the bottom of the tray, and the crucible can be stably fixed and supported.
- the tray itself is formed of a carbon fiber reinforced carbon composite, it seems that the same heat insulating effect as that of the present invention can be obtained, but there is no two-dimensional carbon fiber reinforced carbon composite that is thick enough to be a tray. Moreover, if it manufactures by laminating
- FIG. 5 is a cross-sectional view of a main part of the silicon single crystal pulling apparatus according to the second embodiment
- FIG. 6 is an enlarged cross-sectional view of a part of FIG.
- the single crystal pulling apparatus 21 includes a CZ furnace (chamber) 22 as a single crystal pulling container.
- a crucible device 23 is provided in the CZ furnace 22.
- the crucible device 23 is composed of a quartz crucible 25 that melts a polycrystalline silicon raw material and stores it as a melt 24, and a graphite tray 26 that holds the quartz crucible 25 at the bottom.
- a graphite tray 26 is used instead of the graphite crucible provided in the conventional crucible device.
- a crucible rotating shaft 27 is provided below the crucible device 23.
- the crucible rotating shaft 27 supports the receiving tray 26 at the lower part and moves it up and down while rotating the receiving tray 26 and the quartz crucible 25.
- the crucible rotating shaft 27 is rotatably controlled by a rotation / lifting drive device (not shown).
- the crucible rotating shaft 27 rotates the tray 26 and the quartz crucible 25 with the pulling axis direction of the silicon single crystal as the rotation axis, and also moves upward to maintain the melt surface of the silicon melt 24 at a constant height. It is supposed to be.
- a heating device 30 is provided on the outer peripheral side of the crucible device 23.
- the heating device 30 includes a cylindrical graphite heater 31 disposed so as to surround the outer periphery of the crucible device, and a cylindrical shape disposed between the crucible device 23 and the heater 31 so as to surround the outer periphery of the crucible device 23.
- a graphite interposition member 32 and a heat shielding member 33 are provided.
- the interposition member 32 is an isotropic graphite material or a carbon fiber reinforced carbon material (C / C material), and is disposed with a minute gap M from the quartz crucible 25.
- the size of the minute gap M is about 1 to 3 mm when a quartz crucible 25 of 22 inch size is used.
- the reason for this restriction is that if it is too narrow, the quartz crucible 25 may come into contact with slight deformation, and if it is too wide, heat transfer from the heater 31 may be insufficient.
- the interposition member 32 also serves to hold the quartz crucible 25 in an auxiliary manner. That is, when the quartz crucible 25 is deformed beyond the minute gap M due to some trouble, the quartz crucible 25 is held by the interposition member 32, so that the stability of the quartz crucible 25 is always maintained. .
- the quartz crucible 25 is substantially cup-shaped, and includes a bottom portion 25a, a straight body portion 25c, and a curved portion (R portion) 25b continuous from the bottom portion 25a to the straight body portion 25c.
- the tray 26 includes a first tray portion 26a that holds the bottom portion 25a, and a second tray portion 26b that holds the curved portion 25b.
- the outer peripheral surface of the second saucer portion 26 b of the saucer 26 is substantially flush with the outer peripheral surface of the straight barrel portion 25 c of the quartz crucible 25. Thereby, the minute gap M is easily formed.
- the receiving tray 26 can be regarded as a structure composed of only the bottom portion without the straight body portion of the graphite crucible as compared with the graphite crucible of the conventional example.
- Various problems of the conventional graphite crucible are mainly caused by the existence of the straight body of the graphite crucible, and therefore, it is considered that the straight body of the graphite crucible is eliminated and only the bottom is formed.
- the crucible device 23 of the present embodiment using the receiving tray 26 that can be used, it is possible to avoid the problem of thickness reduction due to oxidation consumption and silicification (SiC conversion) related to the graphite crucible. That is, since the quartz crucible 25 is in contact with the surrounding graphite parts, it is possible to avoid thickness reduction due to oxidation consumption and problems due to silicification (SiC conversion).
- the intervening member 32 is cylindrical and has no slit
- the quartz crucible 25 is heated uniformly by heating the quartz crucible 25 after the intervening member 32 relaxes the heat generation variation of the heater 31. become. Therefore, the stability of the quality of the metal crystal is maintained.
- the graphite crucible of the conventional example is generally divided into two or three parts, there is a slit in the divided part, and the quartz crucible is not heated uniformly due to this slit, and the quality of the metal crystal is stabilized. There was a problem of inhibiting sex. In the present embodiment, such a problem is solved by using the interposition member 32.
- the manufacturing is easy and the cost can be reduced.
- the graphite crucible of the conventional example is manufactured by punching a graphite block into a bottomed cylindrical shape and further finishing the inside. Therefore, it took time and effort to manufacture.
- the graphite tray 26 since it has a dish shape without a straight body portion, there is an advantage that the processing is simple and the manufacturing is not troublesome. In addition, since there is no straight body portion, there is an advantage that the material cost can be reduced.
- the inside of the CZ furnace 22 is maintained in a vacuum by shutting off the outside air from the CZ furnace 22. That is, argon gas as an inert gas is supplied into the CZ furnace 22 and is exhausted from the exhaust port 43 in the CZ furnace 22 by a pump. Thereby, the inside of the CZ furnace 22 is depressurized to a predetermined pressure. Further, various evaporants are generated in the CZ furnace 22 during the single crystal pulling process (one batch). Therefore, argon gas is supplied into the CZ furnace 22 and exhausted together with the evaporated substance outside the CZ furnace 22 to remove the evaporated substance from the CZ furnace 22 and clean it.
- a heat shielding member 40 having a substantially inverted truncated cone shape is provided above the quartz crucible 25.
- the heat shielding member 40 guides argon gas as a carrier gas supplied from above into the CZ furnace 22 to the center of the surface of the melt 24, and further passes the surface of the melt 24 to the peripheral portion of the surface of the melt 24. Lead. Then, the argon gas flows with the gas such as SiO evaporated from the melt through the path 41 and the path 42 and is discharged from the exhaust port 43 provided in the lower part of the CZ furnace 22. With such a configuration, the SiO gas is sucked up to a position higher than the upper end of the heater 31 in the hot zone, and then flows toward the exhaust port 43 through the outside of the hot zone.
- the heater 30 generates heat, and the quartz crucible 25 is heated via the interposition member 32, so that the polycrystalline silicon in the quartz crucible 25 exceeds the melting point of silicon. Melts when heated.
- the seed chuck 45 is rotated while rotating the seed chuck 45 and the crucible device 23 in the same direction or in the opposite direction. Pull up to produce a silicon single crystal.
- Embodiment 3-1 is a combination of the above embodiment 2 and the above embodiment 1-1.
- the low heat conducting member 10 is interposed on the joint surface between the tray 26 and the crucible rotating shaft 27.
- the low heat conductive member 10 is interposed between the bottom surface of the bottom of the tray 26 and the top surface of the flange portion 27 a of the crucible rotating shaft 27.
- the low heat conductive member 10 is formed in a substantially tubular shape, and is interposed and disposed in a state where the convex portion 27 b of the crucible rotating shaft 27 is inserted through the central hole of the low heat conductive member 10.
- the present embodiment 3-2 is a combination of the above embodiment 2 and the above embodiment 1-2. Specifically, as shown in FIG. 8, a gap 11 ⁇ / b> A is formed below the bottom of the quartz crucible 25, and the low heat conductive member 10 ⁇ / b> A is interposed on the joint surface between the quartz crucible 25 and the receiving tray 26.
- the quartz crucible 25 and the tray 26 do not have a direct contact portion as in the embodiment 1-2, so that the heat of the quartz crucible 25 is not easily transferred to the tray 26.
- the heat escape to the crucible rotating shaft 27 can be delayed, and the heat loss of the quartz crucible 25 can be prevented.
- the temperature uniformity at the bottom of the quartz crucible 25 is improved, and thus the convection of the silicon melt due to the temperature difference from the upper side of the crucible is suppressed. Is possible.
- the present embodiment 3-3 is a combination of the second embodiment and the first to third embodiments. That is, the present embodiment 3-3 is characterized in that both a heat insulating structure between the tray 26 and the crucible rotating shaft 27 and a heat insulating structure between the quartz crucible 25 and the tray 26 are provided. Specifically, as shown in FIG. 9, a substantially tubular low thermal conductive member 10 ⁇ / b> A is interposed at the joint surface between the quartz crucible 25 and the receiving tray 26, so that a gap is formed below the bottom of the quartz crucible 25. 11A is formed.
- a substantially tubular low heat conductive member 10 is interposed at the joint surface between the saucer 26 and the crucible rotating shaft 27, thereby forming a gap 11 below the bottom of the saucer 26.
- the present invention is applied to a single crystal pulling apparatus such as silicon.
Abstract
Description
多結晶シリコンからシリコン単結晶を作製する方法としては、チョクラルスキー法(以下、「CZ法」という。)がある。このCZ法に用いられる単結晶引上げ装置の一般的な構成は、シリコン融液を収容する石英ルツボ、該石英ルツボを保持する黒鉛ルツボ、該黒鉛ルツボを下部で固定保持するための受け皿、該受け皿を下部で支持し受皿及びルツボを回転させながら昇降させるルツボ回転軸、前記黒鉛ルツボの外周に配置されているヒータ等から構成されている。そして、ヒータにより黒鉛ルツボ及び石英ルツボを加熱してシリコンを融液している。
多結晶シリコンからシリコン単結晶を作製する方法としては、チョクラルスキー法(以下、「CZ法」という。)がある。このCZ法に用いられる単結晶引上げ装置の一般的な構成は、図10に示すように、シリコン融液を収容する石英ルツボ50、該石英ルツボ50を保持する黒鉛ルツボ51、該黒鉛ルツボ51及び石英ルツボ50を回転させながら昇降させるルツボ回転軸52、前記黒鉛ルツボ51の外周に配置されているヒータ53等から構成されている。なお、54は熱遮蔽部材、55、56はSiOガス等の排気経路、57は排気口である。
上記特許文献1に記載の従来例では、ルツボからの熱がルツボ回転軸を介して下部に伝達することを抑制できる。しかし、低熱伝導部材は高価であり、且つ熱伝導の抑制が十分でなく、低価格で且つ熱伝導の抑制の効果がより大きい構成が求められている。
上記のような単結晶引上げ装置においては、石英ルツボ50に充填した多結晶シリコン塊を溶解するために周囲からヒータ53で加熱するが、石英ルツボ50を直接加熱すると高温で軟化変形して壊れるため、それを防止する目的で外側に黒鉛ルツボ51を置いて保持する。この黒鉛ルツボ51は、冷却時に石英ルツボ50との収縮量の差で破損するのを防止するために、縦に2又は3分割されているのが一般的である。ところが、石英ルツボ50と黒鉛ルツボ51は常に同じ位置で接触したまま高温になるため、黒鉛ルツボ51に以下の(1)、(2)の反応が生じる。
C+SiO2→SiO+CO…(1)
2C+SiO→SiC+CO…(2)
このような酸化消耗による肉厚低減と珪化(SiC化)による問題を回避するために黒鉛ルツボは消耗品として定期的に交換される。
また、本発明の他の目的は、上記の実情を鑑みて考え出されたものであり、黒鉛ルツボに関する酸化消耗による肉厚低減と珪化(SiC化)による問題を回避することが可能な単結晶引上げ装置を提供することである。
炭素繊維強化炭素複合材の形状としては、円形状、環状等のいずれの形状であってもよいが、好ましくは環状である。なぜなら、炭素繊維強化炭素複合材が略環状に形成されていると、ルツボ底部下側や受け皿底部下側に空隙部を確実に形成することができるからである。加えて、ルツボを安定よく固定、支持することも可能となるからである。更に、円形形状に比べて、環状形状の方が接触面積が小さいため、熱逃げ防止効果をさらに高めることができる。
本発明においては、低熱伝導性部材が1次元の炭素繊維強化炭素複合材又は2次元の炭素繊維強化炭素複合材から成るのが好ましい。
また、低熱伝導性部材は略環状に形成されているのが好ましい。
また、製造が容易で、且つコストの低減を図ることができる。具体的に説明すると、従来例の黒鉛ルツボは、黒鉛ブロックを有底円筒状に刳り抜き加工を行い、さらに内部を仕上げ加工して製造していた。そのため、製造に手間がかかっていた。これに対して、黒鉛製受け皿の場合は、直胴部のない皿状であるので、加工が簡単であり、製造に手間がかからないというメリットがある。加えて、直胴部がないので、材料コストを低減できるというメリットもある。
(実施の形態1-1)
(金属単結晶引上げ装置の構成)
図1は本実施の形態1-1に係るシリコン単結晶引き上げ装置の要部断面図である。図において、1は単結晶引き上げ装置、2はシリコン融液3を収容する石英ルツボ、4は石英ルツボ2を保持する黒鉛ルツボ、5は黒鉛ルツボ4を下部で固定保持するための黒鉛製受け皿、6は受け皿5を下部で支持し受け皿5及びルツボ2,4を回転させながら昇降させる黒鉛製ルツボ回転軸である。石英ルツボ2、黒鉛ルツボ4及び黒鉛製受け皿5はルツボ装置を構成する。ルツボ回転軸6は回転/昇降駆動装置(図示せず)により回転自在に制御される。そして、ルツボ回転軸6は、シリコン単結晶の引上げ軸方向を回転軸として受け皿5、黒鉛ルツボ4及び石英ルツボ2を回転させ、また、上方移動させてシリコン融液3の融液面を一定の高さに維持するようになっている。また、黒鉛ルツボ4の外周にはヒータ7が配置されており、このヒータ7により黒鉛ルツボ4及び石英ルツボ2を介してシリコン融液3を加熱し、インゴット8を引き上げながらシリコン単結晶を作製する。
3次元の炭素繊維強化炭素複合材は垂直方向(本実施の形態においてはルツボ回転軸方向に相当)の熱伝導率が2次元の炭素繊維強化炭素複合材よりも高く、断熱効果が低い。加えて、価格が高い。従って、3次元の炭素繊維強化炭素複合材よりも2次元炭素繊維強化炭素複合材を用いるのが好ましい。一方、1次元の炭素繊維強化炭素複合材は、2次元の炭素繊維強化炭素複合材と同程度の断熱効果を有しており、価格についても2次元炭素繊維強化炭素複合材と同程度である。しかし、1次元の炭素繊維強化炭素複合材は環状に形成した場合に割れ易い。従って、低熱伝導部材10を円板形状のように場合には、低熱伝導部材10の素材としては1次元の炭素繊維強化炭素複合材を用いるようにしてもよいが、低熱伝導部材10を環状に形成する場合には2次元の炭素繊維強化炭素複合材を用いるのが好ましい。
先ず、多結晶シリコンを石英ルツボ2内に充填した後、ヒータ7を発熱させ、黒鉛ルツボ4を介して石英ルツボ2を加熱することにより、石英ルツボ2内の多結晶シリコンをシリコンの融点以上に熱して融解する。次いで、シードチャックに取り付けられた種結晶を下降し、融解したシリコン融液3に浸漬させた後、シードチャックと黒鉛ルツボ4とを同方向又は逆方向に回転させつつ、シードチャックを引き上げて、シリコン結晶を成長させる。
図3は実施の形態1-2に係るシリコン単結晶引き上げ装置の要部断面図である。本実施の形態1-2は、黒鉛ルツボ4底部下側に空隙部11Aが形成されており且つ黒鉛ルツボ4と受け皿5との接合面に低熱伝導部材10Aが介在されていることを特徴とする。上記実施の形態1-1が受け皿5とルツボ回転軸6との間の断熱構造を特徴としたのに対して、本実施の形態1-2は黒鉛ルツボ4と受け皿5との間の断熱構造を特徴としたものである。以下、本実施の形態1-2の具体的な構造について説明する。本実施の形態では、黒鉛ルツボと受け皿5との接合面に、略管状の低熱伝導部材10Aが介在されていることである。即ち、黒鉛ルツボ4底部外側寄りの面と、受け皿5上面との間に、低熱伝導部材10Aが介在されている。この低熱伝導部材10Aの中央孔は受け皿5の凹部5aに略対応した大きさであり、黒鉛ルツボ4底部が該中央孔に嵌り込んで、凹部5aの底面に臨む状態で配置されている。これにより、黒鉛ルツボ4の底部下側に空隙部11Aが形成されている。
図4は実施の形態1-3に係るシリコン単結晶引き上げ装置の要部断面図である。本実施の形態3は、受け皿5とルツボ回転軸6との間の断熱構造と、黒鉛ルツボ4と受け皿5との間の断熱構造の両者を備えたことを特徴とする。換言すれば、本実施の形態1-3は、上記実施の形態1-1と上記実施の形態1-2とを組み合わせた構造を有するものである。
(1)上記実施の形態1-1~1-3では、シリコン融液を収納する石英ルツボと該石英ルツボを保持する黒鉛ルツボとを備えたシリコン単結晶引き上げ装置について説明したが、石英ルツボがなく、ゲルマニウム融液等を直接黒鉛ルツボに収納する単結晶引き上げ装置にも本発明は適用することができる。
図5は本実施の形態2に係るシリコン単結晶引き上げ装置の要部断面図、図6は図5の一部を拡大した断面図である。単結晶引き上げ装置21は、単結晶引き上げ用容器としてのCZ炉(チャンバ)22を備えている。CZ炉22内には、ルツボ装置23が設けられている。ルツボ装置23は、多結晶シリコンの原料を溶融して融液24として収容する石英ルツボ25と、石英ルツボ25を下部で保持する黒鉛製受け皿26とで構成されている。このように、本実施の形態に係るルツボ装置23では、従来例のルツボ装置に備えられる黒鉛ルツボに代えて、黒鉛製受け皿26が用いられている。このように黒鉛ルツボを使用しないルツボ装置23を用いることにより、従来から問題とされてきた黒鉛ルツボに関する酸化消耗による肉厚低減と珪化(SiC化)による問題を回避することが可能となる。なお、この点に関しては、後に詳細に説明する。
石英ルツボ25は、略コップ状であって、底部25aと、直胴部25cと、底部25aから直胴部25cに連なる曲面状部分(R部分)25bとからなる。受け皿26は、底部25aを保持する第1受け皿部26aと、曲面状部分25bを保持する第2受け皿部26bとから構成されている。このように、受け皿26によって石英ルツボ25の曲面状部分25bが保持されているので、ヒータ31で加熱された場合に、石英ルツボ25の軟化による変形が抑えられて介在部材32との接触の恐れが軽減される。
また、受け皿26の第2受け皿部26b外周面は、石英ルツボ25の直胴部25c外周面と略面一となっている。これにより、微小隙間Mが形成し易くなる。
(実施の形態3-1)
本実施の形態3-1は、上記実施の形態2と上記実施の形態1-1とを組み合わせたものである。具体的には、図7に示すように、受け皿26とルツボ回転軸27との接合面に、低熱伝導部材10が介在されていることである。即ち、受け皿26の底部下面と、ルツボ回転軸27の鍔部27a上面との間に低熱伝導部材10が介在されている。この低熱伝導部材10は略管状に形成されており、低熱伝導部材10の中央孔をルツボ回転軸27の凸部27bが挿通した状態で介在配置されている。これにより、受け皿26の底部下側に空隙部11が形成されている。上記構成であれば、上記実施の形態1-1と同様に、空隙部11の存在により、受け皿26底部からルツボ回転軸27への熱逃げが抑制され、更に、低熱伝導部材10の存在により、受け皿26からルツボ回転軸27への熱の伝達が抑制される。
本実施の形態3-2は、上記実施の形態2と上記実施の形態1-2とを組み合わせたものである。具体的には、図8に示すように、石英ルツボ25底部下側に空隙部11Aが形成されており且つ石英ルツボ25と受け皿26との接合面に低熱伝導部材10Aが介在されている。上記構成であれば、上記実施の形態1-2と同様に、石英ルツボ25と受け皿26とは直接接触する部位がない構成であるため、石英ルツボ25の熱が、受け皿26に伝熱され難くなり、ルツボ回転軸27への熱逃げを遅延させることができ、石英ルツボ25の熱量ロスを防止できる。更に、石英ルツボ25底部の熱の逃げが困難なことから、石英ルツボ25の底部の温度の均一性が良好となるので、ルツボ上側との温度差に起因したシリコン融液の対流を抑制することが可能となる。
本実施の形態3-3は、上記実施の形態2と上記実施の形態1-3とを組み合わせたものである。即ち、本実施の形態3-3は、受け皿26とルツボ回転軸27との間の断熱構造と、石英ルツボ25と受け皿26との間の断熱構造の両者を備えたことを特徴とする。具体的には、図9に示すように、石英ルツボ25と受け皿26との接合面に、略管状の低熱伝導部材10Aが介在されており、これにより、石英ルツボ25の底部下側に空隙部11Aが形成されている。また、受け皿26とルツボ回転軸27の接合面に、略管状の低熱伝導部材10が介在されており、これにより、受け皿26の底部下側に空隙部11が形成されている。このような構造により、受け皿26とルツボ回転軸27との間の断熱効果、及び、石英ルツボ25と受け皿26との間の断熱効果が達成されるため、よりルツボの熱量ロスを防止できる。
2:石英ルツボ
3:シリコン融液
4:黒鉛ルツボ
5:受け皿
6:ルツボ回転軸
10,10A:低熱伝導部材
11,11A:空隙部
21:単結晶引き上げ装置
22:CZ炉
23:ルツボ装置
25:石英ルツボ
25a:石英ルツボの底部
25b:石英ルツボの曲面状部分(R部)
25c:石英ルツボの直胴部
26:黒鉛製受け皿
26a:第1受け皿部
26b:第2受け皿部
27:ルツボ回転軸
30:加熱装置
31:ヒータ
32:介在部材
M:微小隙間
Claims (15)
- ルツボと該ルツボを下部で固定保持するための受け皿とで構成されるルツボ装置と、該受け皿を下部で支持し受け皿及びルツボを回転させながら昇降させるルツボ回転軸とを備えた単結晶引き上げ装置であって、
前記ルツボと前記受け皿との間、及び、前記受け皿と前記ルツボ回転軸との間の少なくとも一方に、空隙部が形成されていることを特徴とする単結晶引き上げ装置。 - 前記ルツボと前記受け皿との間に形成される空隙部は、ルツボ底部の下に位置している請求項1記載の単結晶引き上げ装置。
- 前記受け皿と前記ルツボ回転軸との間に形成される空隙部は、受け皿底部の下に位置している請求項1記載の単結晶引き上げ装置。
- 前記ルツボと前記受け皿との接合面、及び、前記受け皿と前記ルツボ回転軸との接合面の少なくとも一方に、主面に対して垂直方向の熱伝導が低い低熱伝導性部材が介在している請求項1記載の単結晶引き上げ装置。
- 前記低熱伝導性部材は1次元の炭素繊維強化炭素複合材又は2次元の炭素繊維強化炭素複合材から成る請求項4記載の単結晶引き上げ装置。
- 前記炭素繊維強化炭素複合材は、略環状に形成されている請求項5記載の単結晶引き上げ装置。
- 請求項1に記載の単結晶引き上げ装置に用いられる低熱伝導性部材であって、前記ルツボと前記受け皿との接合面、及び、前記受け皿と前記ルツボ回転軸との接合面の少なくとも一方に介在され、ルツボからルツボ回転軸への熱の伝導を抑制するために用いられることを特徴とする低熱伝導性部材。
- 請求項7に記載の低熱伝導性部材であって、1次元の炭素繊維強化炭素複合材又は2次元の炭素繊維強化炭素複合材から成る低熱伝導性部材。
- 請求項8に記載の低熱伝導性部材であって、略環状に形成されている低熱伝導性部材。
- 前記ルツボ装置は、直胴部と底部と該底部から該直胴部に連なる曲面状部分とからなる石英ルツボと、該石英ルツボを下部で保持する黒鉛製の受け皿とから構成されている請求項1記載の単結晶引き上げ装置。
- 前記受け皿は、少なくとも前記石英ルツボの底部を保持する請求項10記載の単結晶引き上げ装置。
- 前記受け皿は、前記石英ルツボの底部及び曲面状部分を保持する請求項11記載の単結晶引き上げ装置。
- 前記受け皿の外周面と、前記石英ルツボの直胴部外周面とは、略面一となっている請求項12記載の単結晶引き上げ装置。
- 更に、前記ルツボ装置を加熱するためのルツボ装置用加熱装置を備え、
このルツボ装置用加熱装置は、
前記ルツボ装置の外周を囲むようにして配置されるヒータと、
前記ルツボ装置と前記ヒータとの間に介在され、ルツボ装置の外周を囲むようにして配置される円筒状の炭素質材から成る介在部材と、
を備えている請求項10記載の単結晶引き上げ装置。 - 前記介在部材は、前記石英ルツボと微小隙間をあけて配置されている請求項14記載の単結晶引き上げ装置。
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CN2011800533871A CN103189547A (zh) | 2010-11-22 | 2011-11-21 | 单晶提拉装置及单晶提拉装置中使用的低导热性构件 |
US13/881,074 US9453291B2 (en) | 2010-11-22 | 2011-11-21 | Single crystal pulling apparatus and low heat conductive member used for single crystal pulling apparatus |
EP11843787.0A EP2644755B1 (en) | 2010-11-22 | 2011-11-21 | Single crystal pulling device and low heat conductive member to be used in single crystal pulling device |
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JP2010-260242 | 2010-11-22 | ||
JP2011141661A JP2013006748A (ja) | 2011-06-27 | 2011-06-27 | 単結晶引上げ装置 |
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CN110257900A (zh) * | 2019-07-25 | 2019-09-20 | 晶科能源有限公司 | 一种单晶炉及其坩埚托杆 |
CN110512276A (zh) * | 2019-09-06 | 2019-11-29 | 上海新昇半导体科技有限公司 | 一种用于晶体生长的坩埚底座装置 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2528285B2 (ja) | 1986-05-27 | 1996-08-28 | 東洋炭素株式会社 | 黒鉛ルツボの保護方法 |
JPH09255475A (ja) * | 1996-03-22 | 1997-09-30 | Sumitomo Sitix Corp | 単結晶成長装置 |
JPH1081592A (ja) | 1996-09-02 | 1998-03-31 | Super Silicon Kenkyusho:Kk | シリコン単結晶製造装置 |
JP2002220296A (ja) * | 2000-11-24 | 2002-08-09 | Sumitomo Metal Ind Ltd | 単結晶引上げ装置 |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3291571A (en) * | 1963-12-23 | 1966-12-13 | Gen Motors Corp | Crystal growth |
US3798007A (en) * | 1969-12-05 | 1974-03-19 | Ibm | Method and apparatus for producing large diameter monocrystals |
JPS58125689A (ja) | 1982-01-21 | 1983-07-26 | Toshiba Ceramics Co Ltd | 単結晶引上げ用黒鉛ルツボ |
JPS58121377U (ja) | 1982-02-09 | 1983-08-18 | イビデン株式会社 | シリコン単結晶引上げ装置用黒鉛部品 |
US4888242A (en) | 1986-05-27 | 1989-12-19 | Toyo Tanson Co., Ltd. | Graphite sheet material |
US5207992A (en) * | 1986-12-26 | 1993-05-04 | Toshiba Ceramics Co., Ltd. | Silicon single crystal pulling-up apparatus |
JPS6414189A (en) | 1987-07-09 | 1989-01-18 | Mitsubishi Monsanto Chem | Growing device for crystal of semiconductor |
JPH03208881A (ja) | 1990-01-12 | 1991-09-12 | Komatsu Denshi Kinzoku Kk | 単結晶引上げ装置のルツボ受け |
JPH04198084A (ja) | 1990-11-28 | 1992-07-17 | Mitsubishi Materials Corp | 半導体単結晶引上用底着き防止治具 |
JPH0859387A (ja) * | 1994-06-09 | 1996-03-05 | Sumitomo Metal Ind Ltd | 単結晶引き上げ用黒鉛部品 |
JP2000072588A (ja) * | 1998-08-28 | 2000-03-07 | Tokai Carbon Co Ltd | 単結晶引き上げ用炭素ルツボ |
JP2000143394A (ja) * | 1998-10-31 | 2000-05-23 | Ibiden Co Ltd | シリコン単結晶引き上げ装置用の回転軸 |
JP4198806B2 (ja) | 1998-11-30 | 2008-12-17 | イビデン株式会社 | シリコン単結晶引き上げ装置用の回転軸 |
JP2000169295A (ja) | 1998-11-30 | 2000-06-20 | Ibiden Co Ltd | ルツボ受け皿 |
US20020166503A1 (en) * | 2001-03-08 | 2002-11-14 | Hitco Carbon Composites, Inc. | Hybrid crucible susceptor |
KR20030050334A (ko) * | 2001-12-18 | 2003-06-25 | 주식회사 실트론 | 실리콘 잉곳 성장장치 |
JP2005225718A (ja) | 2004-02-13 | 2005-08-25 | Shin Etsu Handotai Co Ltd | 黒鉛ルツボ及び黒鉛ルツボの管理方法 |
CN101148777B (zh) * | 2007-07-19 | 2011-03-23 | 任丙彦 | 直拉法生长掺镓硅单晶的方法和装置 |
-
2011
- 2011-11-21 EP EP11843787.0A patent/EP2644755B1/en not_active Not-in-force
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Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2528285B2 (ja) | 1986-05-27 | 1996-08-28 | 東洋炭素株式会社 | 黒鉛ルツボの保護方法 |
JPH09255475A (ja) * | 1996-03-22 | 1997-09-30 | Sumitomo Sitix Corp | 単結晶成長装置 |
JPH1081592A (ja) | 1996-09-02 | 1998-03-31 | Super Silicon Kenkyusho:Kk | シリコン単結晶製造装置 |
JP2002220296A (ja) * | 2000-11-24 | 2002-08-09 | Sumitomo Metal Ind Ltd | 単結晶引上げ装置 |
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EP2644755B1 (en) | 2018-07-18 |
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TWI518215B (zh) | 2016-01-21 |
EP2644755A1 (en) | 2013-10-02 |
US20130233241A1 (en) | 2013-09-12 |
CN103189547A (zh) | 2013-07-03 |
TW201245509A (en) | 2012-11-16 |
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