WO2005020276A2 - 電力変換装置及び半導体装置の実装構造 - Google Patents
電力変換装置及び半導体装置の実装構造 Download PDFInfo
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- WO2005020276A2 WO2005020276A2 PCT/JP2004/011970 JP2004011970W WO2005020276A2 WO 2005020276 A2 WO2005020276 A2 WO 2005020276A2 JP 2004011970 W JP2004011970 W JP 2004011970W WO 2005020276 A2 WO2005020276 A2 WO 2005020276A2
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- electrode plate
- semiconductor
- semiconductor module
- holding member
- mounting structure
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Classifications
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M7/00—Conversion of ac power input into dc power output; Conversion of dc power input into ac power output
- H02M7/003—Constructional details, e.g. physical layout, assembly, wiring or busbar connections
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/40—Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs
- H01L23/4006—Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs with bolts or screws
- H01L23/4012—Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs with bolts or screws for stacked arrangements of a plurality of semiconductor devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/46—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements involving the transfer of heat by flowing fluids
- H01L23/473—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements involving the transfer of heat by flowing fluids by flowing liquids
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/07—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00
- H01L25/072—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00 the devices being arranged next to each other
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/16—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different main groups of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. forming hybrid circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/18—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different subgroups of the same main group of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32245—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/33—Structure, shape, material or disposition of the layer connectors after the connecting process of a plurality of layer connectors
- H01L2224/331—Disposition
- H01L2224/3318—Disposition being disposed on at least two different sides of the body, e.g. dual array
- H01L2224/33181—On opposite sides of the body
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
- H01L2924/13055—Insulated gate bipolar transistor [IGBT]
Definitions
- the present invention relates to a semiconductor device mounting structure suitable for a power conversion device such as an inverter device using a semiconductor module and a semiconductor device used as an inverter device.
- the inverter circuit (power conversion circuit) is configured using a semiconductor module having a built-in IGBT element or the like.
- the inverter circuit power conversion circuit
- the conventional power conversion device 9 is configured by incorporating a cooling device 91 for cooling the semiconductor module 92 as shown in FIG.
- a power wiring unit that arranges a semiconductor module 92 so as to face the cooling device 91 and further allows a current such as a bus bar to enter and exit the semiconductor module 92 so as to face the semiconductor module 92.
- the power conversion device 9 is configured by arranging 93 and further arranging a control circuit board 95 via a shield layer 94.
- the control circuit board section 95 has a force for controlling the semiconductor module 92.
- the interposition of the shield layer 94 is essential.
- the structure of such a power converter is disclosed, for example, in Japanese Patent Application Laid-Open No. H11-69774.
- the conventional power converter 9 has the following problems. That is, in the above-described conventional power converter 9, the interposition of the shield layer 94 is indispensable in order to enhance the operation performance of the control circuit board unit 95. As a result, the number of parts increases, and it becomes difficult to meet the overall cost reduction requirement.
- connection line 955 connecting the control circuit board section 95 and the semiconductor module 92 still passes through the shield layer 94 and the power wiring section 93. Therefore, it is difficult to eliminate the influence of noise on the control circuit board 95.
- Inverter device 1510 includes a plurality of semiconductor modules.
- each semiconductor module has an internal semiconductor element (switch element) 1511, a pair of electrodes on both sides thereof, and a signal terminal connected to an external control circuit.
- the semiconductor element 1511 is switched by a control signal input from the control circuit 1512 via a signal terminal, and a pseudo AC is generated.
- high-frequency noise is generated in a current-carrying part thereof, and is emitted from DC power lines 1514 and 1515 and AC power line 1516.
- high-frequency capacitors 1521, 1522 and 1523 are connected between the DC power lines 1514 and 1515 and ground and between the AC power line 1516 and ground via lead wires 1526 to reduce noise components. It is designed to bypass.
- the conventional self-excited rectifier circuit shown in FIG. 26 includes a self-excited rectifier circuit section 1532 for converting AC supplied from a commercial power supply 1530 into a desired DC voltage. Including 1535.
- the noise generated due to the switching operation of the rectifying element 1536 constituting the rectifying circuit unit 1535 flows into the commercial power supply 1530 and has an adverse effect.
- a noise suppression circuit 1540 is arranged between the self-excited rectification circuit units 1532 and 1535.
- the noise suppression circuit 1540 includes a noise suppression resistor 1542 arranged on each phase line 1541, a capacitor 1544 arranged between each phase line 1541, and a capacitor 1546 arranged between one phase line and the ground. including.
- the noise suppression rear turtle 1542 and the capacitor 1544 suppress the emission of the normal mode noise, and the capacitor 1546 suppresses the emission of the common mode noise.
- the inverter device 1510 for an electric vehicle or the like described above has the following problems.
- Power spring 1514-1516 This high-frequency capacitor 1521-1523 is connected to lead wire 1526 Represents large resistance and inductance components.
- a high-frequency current passing through high-frequency capacitors 1521 to 1523 becomes a leakage current, which may cause malfunction of inverter device 1510.
- the semiconductor module as a noise source and the high-frequency capacitor 1521 1523 for bypassing noise are separated from the power source by a distance S, a certain amount of noise emission from the power lines 1514 to 1516 between them is inevitable.
- the above-mentioned self-excited rectifier circuit only shows the arrangement of the rear turtle 1542 on each phase line 1541 and the capacitor 1544 between each phase line 1541.
- the specific mounting method of the capacitors 1544 and 1546 is shown. I don't know. In any case, providing the capacitors 1544 and 1546 will increase the cost and space accordingly.
- the lead connecting the capacitors 1544 and 1546 to the phase line 1541 has a resistance component and the like. Furthermore, the capacitors 1544 and 1546 are separated from the rectifier circuit 1535, and noise is easily emitted from the phase line 1541 between the two.
- the present invention has been made in view of a strong conventional problem, and is capable of reducing the number of components and suppressing the influence of noise from a power wiring unit.
- the primary purpose is to provide It is a second object of the present invention to provide a semiconductor device mounting structure capable of effectively suppressing the emission of noise generated in a semiconductor element without externally connecting a special bypass capacitor.
- a power conversion device includes a main circuit unit including a semiconductor module that forms a part of a power conversion circuit, and a cooling device that cools the semiconductor module.
- a control circuit board portion electrically connected to a signal terminal of the semiconductor module and having a control circuit for controlling the semiconductor module;
- a power wiring portion connected to a main electrode terminal of the semiconductor module and for allowing a current to flow in and out of the semiconductor module;
- the main circuit section is interposed between the control circuit board section and the power wiring section.
- the power converter of the present invention is arranged such that the main circuit section including the semiconductor module and the cooling device as described above is sandwiched between the control circuit board section and the power wiring section. Therefore, the main circuit section functions as a shield section between the control circuit board section and the power wiring section, and it is possible to suppress transmission of electrical noise from the power wiring section to the control circuit board section. . This eliminates the need for the shield layer, which was conventionally required, and reduces the number of components.
- the main circuit section and the control circuit board section are arranged adjacent to each other, an electrical junction between them can be arranged at a boundary between them, and the power wiring It is not necessary to penetrate the part. Therefore, the influence of electrical noise from the power wiring section to the control circuit board section can be further suppressed.
- the mounting structure of the semiconductor device may be configured such that a semiconductor element of a semiconductor module and a holding member for holding the semiconductor module from both sides, or a semiconductor element and a semiconductor
- a bypass capacitor is formed as a dielectric by interposing a part of the semiconductor module, a part of the holding member, or another intermediary member between the module and a case for housing the module.
- the mounting structure of the first semiconductor device includes a power semiconductor element, a first electrode plate and a second electrode plate bonded to one surface and the other surface of the semiconductor element, respectively, A semiconductor module including a connection terminal to a control circuit for controlling the element, an insulating resin mold for sealing the semiconductor element and the first and second electrode plates, and a first insulating member and a (2) A conductive first holding member and a second holding member for holding the semiconductor module from both sides via the insulating member.
- noise generated during operation of the semiconductor module is caused by the first electrode plate and / or the second electrode plate, the first holding member and / or the second holding member, and the It is absorbed by the noise suppression bypass capacitor composed of the first insulating member and the Z or second insulating member located between the plate and the holding member, and is prevented from being released to the power line or the like. That is, the emission of noise generated in the power semiconductor element is caused between the electrode plate and the holding member.
- the noise is suppressed by a noise suppressing bypass capacitor having the insulating member located as a dielectric.
- bypass capacitor is arranged in the vicinity of the semiconductor element and the force is arranged for each semiconductor element, the effect of suppressing the emission noise is assured and effective. Further, since the holding member is conductive, grounding is easy.
- the first insulating member and the second insulating member are connected to the exposed portions of the first electrode plate and the second electrode plate.
- it is an insulating plate interposed between the first holding member and the second holding member.
- the insulating plate interposed between the semiconductor module and the conductive holding member becomes the dielectric. Therefore, a general-purpose semiconductor module and a holding tube can be used as they are, and an increase in cost can be minimized.
- the insulating coating integrated with the resin mold of the semiconductor module becomes a dielectric.
- the first insulating member and the second insulating member were integrated with the first holding member and the second holding member so as to face the exposed portion.
- An insulating film may be used. According to this mounting structure, the insulating coating integrated with the holding tube becomes the dielectric. Therefore, a bypass capacitor can be easily formed by only slightly improving the general-purpose semiconductor module and the holding tube.
- the first holding member and the second holding member are preferably grounded. As described above, when the holding member is grounded, the suppression of noise by the bypass capacitor is more reliable. Further, the first holding member and the second holding member may have a structure in which a conductive cooling medium is circulated inside and the cooling medium is grounded. In this case, the cooling medium, which is the cooling means for the semiconductor element, can be used as the grounding means, and the suppression of noise becomes more reliable.
- the mounting structure of the second semiconductor device includes a power semiconductor element and a semiconductor device.
- a first electrode plate and a second electrode plate bonded to one surface and the other surface of the semiconductor element, a connection terminal for a control circuit for controlling the semiconductor element, a semiconductor element, and the first electrode plate and the second electrode plate
- a semiconductor module including: an insulating resin mold that seals the semiconductor module;
- a conductive first internal member and a second internal member are inserted to hold the semiconductor module from both sides, and include an insulating first holding member and a second holding member serving as a dielectric.
- the mounting structure noise generated when the semiconductor module operates is generated by the first electrode plate and / or the second electrode plate, the first internal member and the Z or second internal member, and the The noise is suppressed by the bypass capacitor for noise suppression composed of the first holding member and the Z or the wall of the second holding member located between the inner member and the first holding member and the wall of the second holding member.
- the bypass capacitor for noise suppression composed of the first holding member and the Z or the wall of the second holding member located between the inner member and the first holding member and the wall of the second holding member.
- a dedicated bypass capacitor for suppressing noise emission is not required, and labor and time for externally attaching the bypass capacitor are not required, thereby reducing costs.
- the bypass capacitor is arranged near the semiconductor element and the force is arranged for each semiconductor element, the effect of suppressing the emission noise is assured and the force is effective.
- the holding member is insulative, the range of choice of materials is widened, and the weight is reduced depending on the material.
- the first internal member and the second internal member are preferably grounded. Further, the first internal member and the second internal member may have a structure in which a conductive cooling medium flows and the cooling medium is grounded. In any case, noise can be more reliably suppressed by the bypass capacitor.
- the mounting structure of the third semiconductor device comprises a power semiconductor element, a first electrode plate and a second electrode plate joined to one surface and the other surface of the semiconductor element, respectively.
- a semiconductor module including: a connection terminal for a control circuit that controls the semiconductor element; and an insulating resin mold that seals the semiconductor element and the first and second electrode plates.
- a metal case containing a conductive cooling medium and a plurality of semiconductor modules arranged in close proximity to each other in the cooling medium.
- noise generated during operation of the semiconductor module is generated by the first electrode plate and / or the second electrode plate, the cooling medium, and the tree located between the electrode plate and the cooling medium.
- Noise suppression composed of the first mold part and / or the second mold part of the resin mold It is absorbed by the control bypass capacitor and is prevented from being released to a power line or the like.
- the emission of noise generated in the power semiconductor element is suppressed by the noise suppression bypass capacitor having the molded portion of the resin mold located between the electrode plate and the cooling medium as a dielectric.
- a dedicated bypass capacitor for suppressing noise emission is not required, and labor and time for externally attaching the capacitor are not required, thereby reducing costs.
- bypass capacitor is arranged near the semiconductor element and the force is arranged for each semiconductor element, the effect of suppressing the emission noise is assured and effective. Further, since the case containing the cooling medium also functions as the positioning means of the semiconductor module, a holding member is not required, so that the number of parts can be reduced and the assembling process can be simplified.
- the cooling medium is preferably grounded. As a result, the effect of suppressing the emission noise by the bypass capacitor becomes more reliable.
- FIG. 1 is an explanatory diagram showing an arrangement of each part of a power conversion device according to a first embodiment.
- FIG. 2 is an explanatory view showing a semiconductor module in Embodiment 1.
- Example 1 is an explanatory diagram showing a power wiring portion, (b) is an explanatory diagram showing a main circuit portion, and (c) is an explanatory diagram showing a control circuit board portion.
- FIG. 4 is an explanatory diagram illustrating a configuration of a power conversion device according to the first embodiment.
- FIG. 5 is an explanatory diagram illustrating a configuration of a power conversion device according to a second embodiment.
- FIG. 6 is an explanatory diagram showing an arrangement of each part of a power conversion device in a conventional example.
- FIG. 7 is an explanatory diagram of an electric vehicle system according to a third embodiment.
- FIG. 8 is a front sectional view showing a mounting structure of a semiconductor device in a third embodiment.
- FIG. 9 is a sectional view taken along the line 1003-1003 in FIG.
- FIG. 10 is a sectional view taken along the line 1004-1004 in FIG.
- FIG. 11 is a perspective view of a semiconductor module according to a third embodiment.
- FIG. 12 is an exploded perspective view of a semiconductor module of Embodiment 3.
- FIG. 13 (a) is a sectional view taken along the line 1007-1007 in FIG. 11, and (b) is an enlarged view of a main part thereof.
- FIG. 14 is a front sectional view showing a mounting structure of a semiconductor device in a fourth embodiment.
- FIG. 15 is a sectional view taken along the line 1009-1009 in FIG.
- FIG. 16 is a sectional view taken along line 1010-1010 of FIG. 14.
- FIG. 17 is a sectional view corresponding to FIG. 13 (a).
- FIG. 18 is a cross-sectional view corresponding to FIG. 13A in Example 5.
- FIG. 19 is a front sectional view showing a mounting structure of a semiconductor device according to a fifth embodiment.
- FIG. 20 is a sectional view taken along line 1014-1014 of FIG.
- FIG. 21 (a) is a cross-sectional view taken along the line 1015-1015 in FIG. 19, and FIG. 21 (b) is an enlarged view of a main part of FIG.
- FIG. 22 is a front view (partial cross section) showing the mounting structure of the semiconductor device in Example 6.
- FIG. 23 is a plan view showing a mounting structure of a semiconductor device in Embodiment 6.
- FIG. 24 is a front view showing a semiconductor module of Embodiment 6.
- FIG. 25 is a circuit diagram of a first conventional example.
- FIG. 26 is a circuit diagram of a second conventional example.
- a power wiring section is composed of, for example, a bus bar connected to a three-phase motor and a connection section between the bus bar and the main electrode terminal of the semiconductor module, and inputs a current to be controlled to the semiconductor module. And output from the semiconductor module.
- the control circuit board section is a section that is connected to the signal terminal of the semiconductor module and has a control circuit that sends a control signal to the semiconductor module.
- the main circuit section includes a semiconductor module and a cooling device for cooling the semiconductor module.
- the semiconductor module is configured using one or more semiconductor elements and provided with a main electrode terminal and a signal terminal.
- a double-sided cooling type as described later that is, a semiconductor module that can be cooled not only from one surface but from another surface opposite thereto is preferable.
- an electronic component connected to the semiconductor module is provided in the power wiring section. That is, the electronic component itself or the bus bar connected to the electronic component may generate electric noise in some cases, and it is preferable to dispose the electronic component in the power wiring portion. This suppresses the influence of electrical noise from the electronic components on the control circuit board.
- Examples of electronic components include components such as a rear turtle and a capacitor. These electronic components constitute a booster circuit.
- the semiconductor module includes a module main body containing a semiconductor, a main electrode terminal protruding from the module main body, and a signal terminal protruding in a direction substantially 180 degrees different from the protruding direction of the main electrode terminal.
- the cooling device has a pair of refrigerant tubes arranged so as to sandwich the module main body from both sides, and a cooling medium is circulated through the refrigerant tubes to cool the module main body from both sides.
- the semiconductor module is arranged such that the main electrode terminal and the signal terminal project in mutually different directions substantially perpendicular to the longitudinal direction of the pair of refrigerant tubes. .
- the semiconductor module and the refrigerant tube can be arranged in parallel, and the main electrode terminal and the signal terminal can be arranged in different directions orthogonal to the arrangement direction. it can. Therefore, it is very easy to distribute and arrange the control circuit board section and the power wiring section on both sides of the main circuit section in which the semiconductor module and the refrigerant tube are arranged.
- the main circuit portion has a laminated structure in which a plurality of refrigerant tubes and semiconductor modules are alternately laminated, and the main electrode terminals of the semiconductor module are protruded from one surface in a direction orthogonal to the laminating direction, and the opposite ends. Surface force It is preferable that the signal terminal is protruded.
- the laminated structure of the semiconductor module and the refrigerant tube can be easily integrated into one unit, and the entire main circuit can be compacted. Can be easier.
- the arrangement of the semiconductor modules and the refrigerant tubes may employ an arrangement method in which one set of two refrigerant tubes sandwiching one row of semiconductor modules is taken as one unit, and this unit is repeatedly arranged.
- the whole can be assembled by preparing a plurality of one unit, arranging them in parallel, and connecting a plurality of refrigerant tubes by a pair of header portions.
- the power converter 1 of the first embodiment is a power converter for a hybrid vehicle, and includes a main circuit unit 10, a control circuit board unit 2, and a power wiring unit 3, as shown in FIG.
- the main circuit section 10 is interposed between the control circuit board section 2 and the power wiring section 3.
- the main circuit section 10 includes a semiconductor module 4 that forms a part of a power conversion circuit, and a cooling device 5 that cools the semiconductor module 4.
- the control circuit board section 2 is a board that is electrically connected to the signal terminal 42 of the semiconductor module 4 and has a control circuit (not shown) for controlling the semiconductor module 4.
- the power wiring section 3 is a section that is connected to the main electrode terminal 41 of the semiconductor module 4 and allows current to flow into and out of the semiconductor module 4.
- the semiconductor module 4 includes a module body 40 having a built-in semiconductor element, and a main electrode protruding from the module body 40. And a signal terminal 42 protruding in a direction substantially 180 degrees different from the direction in which the main electrode terminal 41 protrudes.
- a heat sink 451 conducting to the main electrode terminal 41 is exposed on both main surfaces 401 and 402 of the module main body.
- the cooling device 5 has a pair of refrigerant tubes 51 arranged so as to sandwich the module body 40 from both sides as shown in FIG. 3 (b).
- two semiconductor modules 4 were arranged and sandwiched between a pair of refrigerant tubes 51.
- the main circuit section 10 was formed by alternately stacking the refrigerant tubes 51 and the rows of the semiconductor modules 4. As a result, all the semiconductor modules 4 are in a state where both surfaces 401 and 402 are sandwiched by the refrigerant tube 51.
- Each refrigerant tube 51 has a refrigerant passage (not shown) therein, and is configured to allow a cooling medium to flow therethrough. Also, as shown in FIG. 3 (b), a bellows pipe 59 is arranged so as to connect both ends of the plurality of refrigerant tubes 51 to form a header portion 50. Then, by flowing a cooling medium through the refrigerant tube 51, the module main body 40 is cooled off P by both sides 401, 402. Each semiconductor module 4 is arranged so that the main electrode terminal 41 and the signal terminal 42 project in mutually different directions substantially perpendicular to the longitudinal direction of the pair of refrigerant tubes 51. As a result, the control circuit board section 2 and the power wiring section 3 are provided on both sides of the main circuit section 10 in which the semiconductor module 4 and the refrigerant tube 51 are arranged. It is very easy to sort out and arrange.
- the control circuit board section 2 has a plurality of connection holes 22 into which the signal terminals 42 of the semiconductor module 4 are inserted as shown in FIG. 3C, and the signal terminals 42 are inserted into the connection holes 22. Thus, the control circuit and the signal terminal 42 are electrically connected.
- the support rod 29 erected on the control circuit board 2 comes into contact with the refrigerant tube 51 of the main circuit 10 to maintain a constant distance between the main circuit 10 and the control circuit board 2. It functions as a spacer.
- the power wiring section 3 is composed of a plurality of bus bars 31 connected to a three-phase motor (not shown) as shown in Fig. 3 (a), and a resin molding section 30 obtained by molding a part of these bus bars 31. .
- a plurality of bonding terminal portions (not shown) to be bonded to the main electrode terminals 41 of the semiconductor module 4 are provided on a surface 302 of the power wiring portion 3 facing the main circuit portion 10.
- the power wiring section 3 is disposed adjacently above the main circuit section 10
- the control circuit board section 2 is disposed adjacently below the main circuit section 10, and the main electrodes of the semiconductor module 4
- the power converter 1 of the present example is obtained.
- the power converter 1 of the present example is configured such that the main circuit section 10 including the semiconductor module 4 and the cooling device 5 as described above is sandwiched between the control circuit board section 2 and the power wiring section 3. It is arranged. Therefore, the main circuit section 10 functions as a shield section between the control circuit board section 2 and the power wiring section 3 and suppresses transmission of electrical noise from the power wiring section 3 to the control circuit board section 2. be able to. This eliminates the need for the shield layer, which was conventionally required, and reduces the number of components.
- the main circuit section 10 and the control circuit board section 2 are arranged adjacent to each other, the electrical junction between them can be arranged at the boundary between them, and the power wiring section can be arranged. No need to penetrate 3. Therefore, the influence of electrical noise from the power wiring section 3 to the control circuit board section 2 can be further suppressed.
- a semiconductor module 4 having a structure capable of being cooled on both sides and having a main electrode terminal 41 and a signal terminal 42 projecting in directions different from each other by approximately 180 degrees was employed.
- a laminated structure with the refrigerant tube 51 is realized as described above.
- the structure was such that the main electrode terminal 41 and the signal terminal 42 respectively protruded in different directions orthogonal to the laminating direction.
- the cooling efficiency of the semiconductor module 4 can be improved, and a structure in which the control circuit board section 2 and the power wiring section 3 are separately arranged on both surfaces of the main circuit section 10 can be easily achieved.
- the main circuit section 10 is arranged above the control circuit board section 2 and the power wiring section 3 is arranged further above the control circuit board section 2.
- the power wiring section 3 is arranged further above the control circuit board section 2.
- a rear turtle 61 and a capacitor 62 constituting a part of a booster circuit are disposed in a power wiring section 3 thereof. It is. In this case, it is possible to suppress the influence of electrical noise on the control circuit board unit 3 from the rear turtle 61 and the capacitor 62, which are the electronic components constituting the booster circuit. Otherwise, the same operation and effect as those of the first embodiment can be obtained.
- the mounting structure of this semiconductor device can be classified into the following three types according to the method of forming a noise suppression bypass capacitor, and in particular, what constitutes a dielectric (insulator).
- an insulating plate or film interposed between a semiconductor module and a holding member that holds or sandwiches the semiconductor module from both sides is a dielectric.
- the state is included.
- a part of an electrode plate of a semiconductor module is exposed from a resin mold of a semiconductor module forming one electrode plate.
- the holding member is made of a conductive material to form the other electrode plate.
- bypass capacitor be connected to both the first electrode plate on the front side and the second electrode plate on the back side of the semiconductor module.
- a bypass capacitor may be connected only to the first or second electrode plate.
- an insulating plate or the like may be interposed only between one electrode plate and the holding member facing the electrode plate. This is based on the second to fourth aspects of the first type and the second type described later. The same applies to the third and third types.
- a part (mold part) of a resin mold that covers an electrode plate of a semiconductor module becomes a dielectric.
- a part of the exposed electrode plate of the semiconductor module is covered with an insulating film integrated with the resin module, and the dielectric plate is made of a dielectric.
- the insulating film integrated with the holding member and facing a part of the exposed electrode plate of the semiconductor module becomes a dielectric.
- the cooling medium circulates inside the holding member.
- the cooling medium not only suppresses the temperature rise in the semiconductor module but also is effective in grounding the holding member to the vehicle body when it is conductive.
- holding members for holding or sandwiching the semiconductor module from both sides are a dielectric and the other electrode plate.
- the holding member is made of an insulating material, and a conductive internal member is inserted therein. A part of the electrode plate of the semiconductor module is exposed. Further, a cooling medium can be circulated inside the holding member.
- the third type does not include a holding member for holding the semiconductor module from both sides.
- One electrode and a dielectric are formed on the semiconductor module, and the other electrode is a conductive cooling medium contained in a metal case.
- the electrode plate of the semiconductor module is covered by a part (mold part) of the resin mold.
- the plurality of semiconductor modules are positioned in a predetermined state by the case.
- the drive system of the hybrid vehicle shown in FIG. 7 includes a battery 1010, a generator motor (MG) 1020, and an inverter device 1060. Between the positive terminal and the negative terminal of the battery 1010, between the extended DC busbars 1011 and 1012, a smoothing capacitor 1013 and a semiconductor pair for three-phase alternating current (U-phase, V-phase and W-phase) constituting the inverter device 60. And are arranged.
- a U-phase line 1016 extends from the first and second U-phase semiconductor elements 1031 and 1032 to the MG 1020.
- a V-phase line 1017 extends between the first and second V-phase semiconductor elements 1031 and 1032 to form a first W and a second W
- the force between the phase semiconductor elements 1031 and 1032 also extends to the MG 1020 with 1018 W-phase wires.
- the inverter device 1060 is configured by alternately stacking a holding tube 1055 and a plurality of semiconductor modules 1030 in the height direction via an insulating material 1050. As shown in FIGS. 11 to 13, each semiconductor module 1030 is joined to the first semiconductor element (IGBT) 1031 and the second semiconductor element (flywheel diode) 1032 via solders 1033a and 1033b. And a second electrode plate 1036 joined to the substrate side (back side) via solder (not shown).
- the first electrode plate 1035 and the second electrode plate 1036 have a first drive electrode terminal 1038 and a second
- the control electrode terminal 1041 is joined to the first semiconductor element 1031 by a signal line such as a bonding wire 1042.
- the control electrode terminal 1041 is a gate terminal (G) and an emitter terminal (Ke) for turning on and off the first semiconductor element 1031, and an output terminal of a temperature diode formed on the surface of the first semiconductor element 1031 and detecting its temperature. ( ⁇ , A) and a current detection terminal (Se) for detecting a current flowing through the first semiconductor element 1031.
- the first semiconductor element 1031 and the second semiconductor element 1032, the first electrode plate 1035 and the second electrode plate 1036, the first drive electrode terminal 1038 and the second drive electrode terminal 1039, and the control terminal 1041 and the like are formed of a molding resin. Sealed by 1045.
- the mold resin 1045 is filled between the first electrode plate 1035 and the second electrode plate 1036 to ensure insulation between the two electrode plates 1035 and 1036, and to fix the connection terminal 1041 to the first electrode plate 1035. Ensure insulation between the two electrode plates 1036 and the connection terminals 1041.
- the back surfaces of the first electrode plate 1035 and the second electrode plate 1036 are exposed.
- the semiconductor module 1030 has a flat rectangular shape.
- the insulating material 1050 is made of, for example, a plate or a film of aluminum nitride / silicon nitride and has a rectangular shape slightly larger than the semiconductor module 1030.
- the holding tube (holding tube) 1055 is formed by extruding aluminum or the like, is partitioned by fins 1056b, and has a space 1056a extending in the longitudinal direction.
- the holding tube 1055 has a width that is slightly larger than the width of the electrode plates 1035 and 1036 of the semiconductor module 1030 and a length that allows a plurality of semiconductor modules 1030 to be placed.
- the void 1056b penetrates in the length direction, A conductive cooling medium flows through the inside.
- a combination of a plurality of semiconductor modules 1030 arranged side by side, an upper (first) holding tube 1055A on the front surface side, and a lower (second) holding tube 1055B on the rear surface side will be considered.
- the upper holding tube 1055A faces the first electrode plate 1035 via the first insulating plate 1050A
- the lower holding tube 1055B faces the second electrode plate 36 via the second insulating plate 50B.
- the first drive electrode terminal 1038 and the second drive electrode terminal 1039 protrude to one side of the upper holding tube 1055A and the lower holding tube 1055B, respectively, and a positive DC bus bar 1011, a negative DC bus bar 1012, and an MG 1020, respectively. Connected to AC busbar 1016 1018 connected to.
- the control electrode terminal 1041 projects from the other side and is connected to the control circuit 1048.
- the holding pipes 1055A and 1055B are connected to a part of the body of the hybrid vehicle.
- the first insulating plate 1050A which is a non-conductive material, exists between the first electrode plate 1035, which is a conductive material, and the first holding tube 1055A, and the first bypass capacitor 1057A is formed by these three members. It is formed. Similarly, a second bypass capacitor 1057B is formed by the second electrode plate 1036, the second holding tube 1055B, and the second insulating plate 1050B existing therebetween.
- the bellows member 1061 is interposed between both ends of the adjacent upper holding pipe 1055A and lower holding pipe 1055B. Both ends are brazed to the upper holding tube 1055A and the lower holding tube 1055B in a state where airtightness is secured, and they are adhered by bonding or the like.
- the bellows member 1061 is supplied with a cooling medium from the pipe 1062, and thus flows through the gap 1056 of the holding tube 1055.
- a circulation path of the cooling medium is formed by the pipe 1062, the piping pump, the radiator, and the like (not shown).
- the stacked body of the plurality of holding tubes 1055 and the plurality of semiconductor modules 1030 is accommodated in a metal case (not shown), and the metal case is fixed to the body of the electric vehicle and is electrically conductive. As a result, the holding pipe 1055 is grounded to the vehicle body.
- the DC of battery 1010 is converted to AC by inverter device 1060, and MG1020 is driven.
- the AC generated by driving the MG 1020 is converted into DC, and the battery 1010 is charged. Since the action itself is well known, a detailed description is omitted.
- the following effects can be obtained with respect to noise suppression.
- emission of noise generated in the first semiconductor element 1031 and the second semiconductor element 1032 to the bus bars 1011, 1012, and 1016 is suppressed without mounting a special or dedicated bypass capacitor.
- Electrode plate 1035, 1036 force S-Segment plate, holding tube 1055A, 1055B force S Other electrode plate, insulating plate 1050A, 1050B force S dielectric, forming bypass capacitors 1057A, 1057B It is.
- the insulating plates 1050A and 1050B are originally provided for the purpose of electrically insulating the semiconductor elements 1031 and 1032 and the holding tubes 1055A and 1055B from each other. It also functions as a body. As a result, the time and effort for connecting a dedicated bypass capacitor with a lead wire is not only unnecessary, but also space is advantageous.
- Capacitors 1057A and 1057B are individually connected to the first and semiconductor elements 1031 and 1032, respectively, and the bypass capacitors 1057A and 1057B are connected to the first and second semiconductor elements 1031 and 1032, which are noise sources. It depends on what is located nearby.
- the effect of suppressing emission noise is high for two reasons.
- the first holding pipe 1055A and the second holding pipe 1055B are connected to the body of the vehicle via conductive LLC, a pump, a radiator and the like flowing through the inside.
- the impedance of the path that bypasses the noise of the semiconductor elements 1031, 1032 to the body decreases.
- the fins 1056b formed inside the inner peripheral surface of the gap 1056a improve the electrical coupling between the holding tube 1055 and the LLC.
- FIGS. 14 to 17 show a fourth embodiment.
- a part of the resin mold 1110 of the semiconductor module constitutes a dielectric instead of the first and second insulating plates 1050A and 1050B of the third embodiment. More specifically, the front surface of the first electrode plate 1035 and the back surface of the second electrode plate 1036 are not exposed, and are covered by the first mold portion 1112 and the second mold portion 1113, respectively.
- the bypass capacitors 1115A and 1115B are formed.
- the same effect as that of the third embodiment can be obtained.
- the power of the semiconductor device is reduced to S compact.
- the first and second molded portions 1112 and 1113 function as insulating materials between the first and second semiconductor elements 1031 and 1032 and the first and second holding tubes 1055A and 1055B, and This is because it also functions as a dielectric of the pass capacitor. Further, the first and second insulating plates 1050A and 1050B in the third embodiment become unnecessary.
- first and second insulating coatings 1153 and 1154 are tightly formed on the first and second molded portions 1151 and 1152. , And cover the exposed portions of the first and second electrode plates 1035 and 1036.
- the first and second insulating coatings 1153 and 1154 are made of, for example, a sprayed film of alumina or a coating force of DLC (diamond dike carbon).
- the first and second semiconductor elements 1031 and 1032, the first and second holding tubes 1055A and 1055B, and the first and second insulating coatings 1153 and 1154 located between the first and second semiconductor elements 1031 and 1032, and the bypass capacitors 1155A and 1155 1155B is configured.
- the same effects as in the third embodiment can be obtained.
- the capacitance of the bypass capacitors 1155A and 1155B can be increased.
- the capacitance of a capacitor is inversely proportional to the thickness of the insulating coating 1153, 1154. Therefore, the thickness of the insulating coatings 1153 and 1154 should be reduced when increasing the capacitance, and increased when decreasing the capacitance. Since the capacitance is proportional to the surface area of the electrode plates 1035 and 1036, the surface area of the electrode plates 1035 and 1036 can be adjusted concurrently with or separately from the adjustment of the film thickness of the insulating films 1153 and 1154. .
- first and second electrode plates 1035 and 1036 of the semiconductor module 1030 are exposed.
- first and second insulating films 1153 and 1154 may be formed on the first and second holding tubes 1055A and 1055B.
- a holding tube 1210 made of an insulating material such as resin-ceramic is used instead of the metal holding tube 1055.
- a conductive inner tube 1215 is inserted into the hollow portion of the insulating holding tube 1210 so that the cooling medium flows through the gap 1216.
- the first and second electrode plates 1035 and 1036 of the semiconductor module 1030 are exposed. Therefore, the first and second electrode plates 1035 and 1036, the first and second inner tubes 1215A and 1215B, and the walls 1212A and 1212B of the holding tubes 1210A and 1210B located therebetween are noise.
- Capacitors 1220A and 1220B are configured.
- the insulating wall portion 1212 of the holding tube 1210 for allowing the cooling medium to flow is made of a dielectric material. It is not necessary to form a dielectric on 30. Further, since conductivity is not required for the holding tube 1210, the range of material selection is widened.
- Embodiment 7 is shown in FIGS.
- the first and second drive electrode terminals 1038 and 1039 of the semiconductor module 1030 and the control terminal 1041 protrude from the same side surface.
- the front surface of the first electrode plate 1035 and the back surface (both not shown) of the second electrode plate 1036 are covered with the first and second mono-reed components 1251 and 1252, respectively.
- the metal case 1260 has a plurality of openings 1262 on the upper end side, and the inside thereof is filled with a conductive cooling medium 1265.
- the lower end of each semiconductor module 1030 is immersed in the cooling medium 1265 of the case 1260, the upper end protrudes upward from the opening 1262, and is sealed with a seal member 1263.
- the first and second semiconductor elements 1031 and 1032, the cooling medium 1265, and the mold parts 1251 and 1252 located between them form first and second bypass capacitors 1270A and 1270B.
- the bypass capacitors 1270A and 1270B are formed for each of the first and second semiconductor elements 1031 and 1032, and in the vicinity thereof, thereby effectively suppressing noise.
- a metal case 1260 containing a cooling medium 1265 positions the plurality of semiconductor modules 1030 in a predetermined state. Each semiconductor module 1030 can be set in a predetermined state only by inserting it through the opening 1262 of the case 1260, and the time required to manufacture the inverter device can be reduced.
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Inverter Devices (AREA)
Abstract
Description
Claims
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP04771931A EP1657806B1 (en) | 2003-08-21 | 2004-08-20 | Power converter and semiconductor device mounting structure |
US10/554,998 US7508668B2 (en) | 2003-08-21 | 2004-08-20 | Electric power converter and mounting structure of semiconductor device |
US12/073,871 US7724523B2 (en) | 2003-08-21 | 2008-03-11 | Electric power converter and mounting structure of semiconductor device |
US12/457,246 US8027161B2 (en) | 2003-08-21 | 2009-06-04 | Electronic power converter and mounting structure of semiconductor device |
US12/457,245 US7826226B2 (en) | 2003-08-21 | 2009-06-04 | Electric power converter and mounting structure of semiconductor device |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
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JP2003-297833 | 2003-08-21 | ||
JP2003297833A JP4075734B2 (ja) | 2003-08-21 | 2003-08-21 | 半導体装置の実装構造 |
JP2003-299248 | 2003-08-22 | ||
JP2003299248A JP4003719B2 (ja) | 2003-08-22 | 2003-08-22 | 電力変換装置 |
Related Child Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US10554998 A-371-Of-International | 2004-08-20 | ||
US12/073,871 Division US7724523B2 (en) | 2003-08-21 | 2008-03-11 | Electric power converter and mounting structure of semiconductor device |
Publications (2)
Publication Number | Publication Date |
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WO2005020276A2 true WO2005020276A2 (ja) | 2005-03-03 |
WO2005020276A3 WO2005020276A3 (ja) | 2005-04-14 |
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PCT/JP2004/011970 WO2005020276A2 (ja) | 2003-08-21 | 2004-08-20 | 電力変換装置及び半導体装置の実装構造 |
Country Status (3)
Country | Link |
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US (4) | US7508668B2 (ja) |
EP (4) | EP2216892B1 (ja) |
WO (1) | WO2005020276A2 (ja) |
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Also Published As
Publication number | Publication date |
---|---|
EP2216892A3 (en) | 2010-09-29 |
EP2216891B1 (en) | 2012-01-04 |
US7724523B2 (en) | 2010-05-25 |
US20090251858A1 (en) | 2009-10-08 |
US20090251859A1 (en) | 2009-10-08 |
EP2216890B1 (en) | 2012-01-04 |
EP1657806A2 (en) | 2006-05-17 |
EP1657806B1 (en) | 2011-11-30 |
US8027161B2 (en) | 2011-09-27 |
EP2216891A2 (en) | 2010-08-11 |
EP2216892B1 (en) | 2012-01-18 |
EP1657806A4 (en) | 2008-10-29 |
EP2216892A2 (en) | 2010-08-11 |
US20080164607A1 (en) | 2008-07-10 |
EP2216891A3 (en) | 2010-09-29 |
US7508668B2 (en) | 2009-03-24 |
EP2216890A3 (en) | 2010-09-29 |
EP2216890A2 (en) | 2010-08-11 |
WO2005020276A3 (ja) | 2005-04-14 |
US20060284308A1 (en) | 2006-12-21 |
US7826226B2 (en) | 2010-11-02 |
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