WO2003082933A1 - Procede de production de composes a poids moleculaire eleve pour resine photosensible - Google Patents
Procede de production de composes a poids moleculaire eleve pour resine photosensible Download PDFInfo
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- WO2003082933A1 WO2003082933A1 PCT/JP2003/003058 JP0303058W WO03082933A1 WO 2003082933 A1 WO2003082933 A1 WO 2003082933A1 JP 0303058 W JP0303058 W JP 0303058W WO 03082933 A1 WO03082933 A1 WO 03082933A1
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F6/00—Post-polymerisation treatments
- C08F6/14—Treatment of polymer emulsions
- C08F6/16—Purification
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F6/00—Post-polymerisation treatments
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F20/00—Homopolymers and copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical or a salt, anhydride, ester, amide, imide or nitrile thereof
- C08F20/02—Monocarboxylic acids having less than ten carbon atoms, Derivatives thereof
- C08F20/10—Esters
- C08F20/26—Esters containing oxygen in addition to the carboxy oxygen
- C08F20/28—Esters containing oxygen in addition to the carboxy oxygen containing no aromatic rings in the alcohol moiety
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F220/00—Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical or a salt, anhydride ester, amide, imide or nitrile thereof
- C08F220/02—Monocarboxylic acids having less than ten carbon atoms; Derivatives thereof
- C08F220/10—Esters
- C08F220/12—Esters of monohydric alcohols or phenols
- C08F220/16—Esters of monohydric alcohols or phenols of phenols or of alcohols containing two or more carbon atoms
- C08F220/18—Esters of monohydric alcohols or phenols of phenols or of alcohols containing two or more carbon atoms with acrylic or methacrylic acids
- C08F220/1811—C10or C11-(Meth)acrylate, e.g. isodecyl (meth)acrylate, isobornyl (meth)acrylate or 2-naphthyl (meth)acrylate
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F220/00—Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical or a salt, anhydride ester, amide, imide or nitrile thereof
- C08F220/02—Monocarboxylic acids having less than ten carbon atoms; Derivatives thereof
- C08F220/10—Esters
- C08F220/12—Esters of monohydric alcohols or phenols
- C08F220/16—Esters of monohydric alcohols or phenols of phenols or of alcohols containing two or more carbon atoms
- C08F220/18—Esters of monohydric alcohols or phenols of phenols or of alcohols containing two or more carbon atoms with acrylic or methacrylic acids
- C08F220/1818—C13or longer chain (meth)acrylate, e.g. stearyl (meth)acrylate
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F6/00—Post-polymerisation treatments
- C08F6/02—Neutralisation of the polymerisation mass, e.g. killing the catalyst also removal of catalyst residues
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F6/00—Post-polymerisation treatments
- C08F6/06—Treatment of polymer solutions
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
- G03F7/0392—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
- G03F7/0397—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition the macromolecular compound having an alicyclic moiety in a side chain
Definitions
- the present invention relates to a method for producing a polymer compound for photoresist which is useful for preparing a resin composition for a photoresist used for microfabrication of a semiconductor or the like.
- the positive photoresist used in the semiconductor manufacturing process has characteristics such as the property that the irradiated part changes to soluble by light irradiation, adhesion to a silicon wafer, plasma etching resistance, and transparency to the light used. Must be available.
- the positive photoresist is generally used as a solution containing a polymer as a main ingredient, a photooxidant, and several additives for adjusting the above properties.
- the exposure light source of lithography used in the manufacture of semiconductors has become shorter and shorter each year, and an ArF excimer laser with a wavelength of 193 nm is expected as a next-generation exposure light source.
- a polymer for resist used in this ArF excimer laser exposure machine a polymer having a repeating unit containing a rataton skeleton having high adhesion to a substrate or a polymer having a repeating unit containing an alicyclic hydrocarbon skeleton having excellent etching resistance is used.
- Various proposals have been made.
- polymers are usually isolated by polymerizing the monomer mixture and then subjecting the polymerization solution to a precipitation operation.
- the polymer obtained in this way contains impurities such as metal components. Therefore, when used as a resin component of a resin composition for photo resist, desired resist performance (sensitivity, etc.) can be obtained. There is a problem that cannot be.
- metals such as sodium and iron
- the electrical characteristics of a semiconductor or the like deteriorate.
- the surface of the polymer particles becomes hard during drying and the polymer particles are fused to each other, so that it is difficult to dissolve in the solvent for the resist. Disclosure of the invention
- an object of the present invention is to provide a method capable of efficiently producing a polymer compound for photoresist having an extremely small content of impurities such as metal components.
- Another object of the present invention in addition to the above points, is to provide a method for efficiently producing a photoresist polymer compound which is easily and surely dissolved in a resist solvent.
- Still another object of the present invention is to provide a method for producing a polymer compound for a photoresist which does not adversely affect the electrical properties of a semiconductor or the like when used as a resin component of a resin composition for a photoresist. It is in.
- the inventors of the present invention have conducted intensive studies to achieve the above object. As a result, the present inventors have found that the photoresist polymer can be subjected to an extraction operation using an organic solvent and water, or the photoresist polymer can be contained and containing a metal. It has been found that, when a polymer solution having a volume equal to or less than a specific value is passed through a filter composed of a specific porous polyolefin membrane, metal components that adversely affect resist performance and electrical characteristics of semiconductors and the like can be easily removed. Was. The present invention has been completed based on these findings.
- the present invention includes a monomer (a) containing a lactone skeleton, a monomer (b) containing a group which is eliminated by an acid to become alkali-soluble, and an alicyclic skeleton having a hydroxyl group.
- a polymerization step (A) in which a monomer mixture containing at least one monomer selected from the above is subjected to polymerization, and the polymer produced by the polymerization is subjected to an extraction operation using an organic solvent and water.
- a method for producing a polymer compound for photoresist comprising a step (I) of passing a solution through a filter composed of a porous polyolefin membrane having a cation exchange group.
- the monomer (a) containing a ratatone skeleton has the following formula (la), (lb) or (lc)
- R 1 represents a group containing a (meth) atalyloyloxy group
- R 2 , R 3 , and R 4 are each a lower alkyl group
- n is an integer of 0-3
- m is an integer of 0-5.
- the monomer (b) containing a group capable of being alkali-soluble by elimination by an acid includes the following formula (2a) or (2b)
- R is a hydrogen atom or a methyl group
- R 5 is a hydrogen atom or a lower alkyl group
- R 6 , RR 8 , and R 9 are each a lower alkyl group
- n is an integer of 0 to 3.
- the monomer (c) containing an alicyclic skeleton having a hydroxyl group has the following formula:
- R represents a hydrogen atom or a methyl group
- R 1Q represents a methyl group, a hydroxyl group, an oxo group, or a carboxyl group
- K represents an integer of 1 to 3.
- k R 10 At least one is a hydroxyl group
- the monomer mixture may be polymerized in a glycol-based or ester-based solvent by a drop polymerization method.
- an organic solvent having a specific gravity of 0.95 or less and water are added to the polymerization solution obtained in the polymerization step (A) and extracted, and the resulting polymer is added to the organic solvent layer. May be distributed to the aqueous layer.
- the specific gravity is 0.95 or less and the solubility parameter (SP value) is 2 OMP a 1/2 or less in a glycol-based or ester-based solvent solution of the polymer formed by polymerization.
- the organic polymer and water may be added and extracted, and the resulting polymer may be distributed to the organic solvent layer, and the metal component as an impurity may be distributed to the aqueous layer.
- the production method of the present invention may further include a precipitation purification step (C) of precipitating or reprecipitating the polymer produced by the polymerization.
- a solution containing the polymer produced by the polymerization and a glycol-based or ester-based solvent may be added to at least a solvent containing a hydrocarbon to precipitate or reprecipitate the polymer.
- the production method of the present invention may include a repulping step (D) in which the polymer produced by the polymerization is repulped with a solvent.
- a hydrocarbon solvent can be used as the repulpable solvent.
- the production method of the present invention may include a rinsing step (E) of rinsing the polymer produced by the polymerization with a solvent.
- a rinsing solvent a hydrocarbon solvent and / or water such as ultrapure water can be used.
- the production method of the present invention may include a drying step (F) of drying the polymer after subjecting the polymer produced by the polymerization to precipitation purification. Further, the method may include a re-dissolving step (G) of preparing a polymer solution by re-dissolving the polymer in an organic solvent after subjecting the polymer produced by the polymerization to precipitation purification. At least one solvent selected from glycol-based solvents, ester-based solvents and ketone-based solvents can be used as the re-dissolving solvent.
- the production method of the present invention further includes an evaporation step (H) of preparing a polymer solution for photoresist by removing the low boiling point solvent by concentrating the polymer solution obtained by re-dissolving in an organic solvent. You may go out.
- H evaporation step
- the monomers (a), (b) and A filtration step (J) for filtering a polymer solution containing a polymer having a repeating unit corresponding to at least one monomer selected from (c) to remove insolubles may be provided.
- a polymer having a repeating unit corresponding to at least one monomer selected from the monomers (a), (b) and (c) is used before the step (I).
- a water washing step (K) for reducing the metal content in the polymer solution by washing the contained polymer solution with water may be provided.
- metal content is simply used as a reference for polymers of Na, Mg, Al, K, Ca, Cr, Mn, Fe, Ni, Cu, and Zn. Means the total content (as metal) of BEST MODE FOR CARRYING OUT THE INVENTION
- a monomer containing a lactone skeleton (b) a monomer containing a group capable of being alkali-soluble by elimination by an acid, and (c) a hydroxyxyl group
- a monomer mixture containing at least one monomer selected from monomers containing an alicyclic skeleton (for convenience, the monomer mixture is also referred to as a “monomer mixture”) when subjected to polymerization.
- the monomer (a) containing a ratatone skeleton imparts a substrate adhesion function to the polymer.
- the polymer may be provided with an acid-eliminating function (alkali-soluble function) (such as a repeating unit having a ⁇ - (meth) acryloyloxy ⁇ -petit mouth ratatone skeleton).
- alkali-soluble function such as a repeating unit having a ⁇ - (meth) acryloyloxy ⁇ -petit mouth ratatone skeleton.
- the ratatone skeleton is not particularly limited, and includes, for example, a lactone skeleton having about 4 to 20 members.
- the ratatone skeleton may be a monocyclic ring having only a lactone ring, or may be a polycyclic ring in which a non-aromatic or aromatic carbon ring or heterocyclic ring is fused to the lactone ring.
- the lactone skeleton is often bonded to a carbon atom constituting the polymer main chain via an ester bond or an ester bond via a linking group such as an alkylene group.
- Representative examples of the monomer (a) containing a ratatone skeleton include (meth) acrylate monomers represented by the formula (la), (lb) or (lc).
- R 1 R 2 , R 3 , and R 4 are groups bonded to a ring, R 1 represents a group containing a (meth) atalyloyloxy group, and R 2 , R 3 , and R 4 represent the group.
- Examples of the group containing the (meth ') acryloyloxy group include, for example, (meth) atariloyloxy group; (meth) atariloyloxymethyl group, (meth) atariloyloxyshethyl group, and the like.
- R 1 has the formula in (la) is 3- Okisatori cyclo [4.2.4 1.0 4 '8] nonan one 2-on-5 position of the ring, Oite the formula (lb) is 3- Okisatorishikuro [4. 3. 1. I 4 ' 8 ] Indecane-2 In many cases, it is bonded to the 6-position of the one-on ring, or in formula (lc), to the upper or lower position of the ⁇ -petit mouth rataton ring.
- lower alkyl group as RRR 4, for example, methyl, E chill, isopropyl, propyl, heptyl, isobutyl, s- heptyl, include C Bok 4 alkyl group t one heptyl group.
- Preferred lower alkyl groups include a methyl group and an ethyl group, and a methyl group is particularly preferred.
- n R 2 s may be the same group or different groups. R 2 is often attached to the bridgehead carbon atom.
- n R 3 s may be the same group or different groups. R 3 is often attached to the carbon atom at the bridgehead.
- m R 4 groups may be the same group or different groups. m is preferably about 0 to 3.
- (meth) acrylic acid ester monomer represented by the formula (lc) include, for example, ⁇ -attaliroyloxy-2-butyrolactone, ⁇ -atalyloyloxy ⁇ -methyl-1-butyrolacte Ton, ⁇ -Attari-yloxy ⁇ , ⁇ -Dimethyl- ⁇ -petit ratatotone, H-acryloyloxy ⁇ , ⁇ , — Trimethyl-l- ⁇ -butyrolactone, -Acryloyloxy- ⁇ , ⁇ -Dimethyl- ⁇ -butyrolactone 0, Atari Mouth inoleoxy-CK, ⁇ , ⁇ trimethinoley ⁇ -petit mouth ratataton, ⁇ -acryloyloxy- ⁇ , ⁇ , ⁇ , ⁇ — ⁇ tramethyl-1- ⁇ -butyrolactone, ⁇ -atari mouth inoleoxy- ⁇ , ⁇ , ⁇ , ⁇ , ⁇ / —pentamethino
- the monomer (b) containing a group which becomes alkali-soluble by elimination by an acid imparts an alkali-soluble function to the polymer.
- the monomer (b) containing a group which is eliminated by an acid and becomes alkali-soluble the above-mentioned formula (2a) or
- R represents a hydrogen atom or a methyl group
- R 5 is a hydrogen atom or a lower alkyl group
- RR 7, R 8, R 9 are each a lower alkyl group
- n represents an integer of 0 to 3.
- R 7 and R 9 are groups bonded to a ring. Examples of the lower alkyl group include the same groups as described above.
- n R 7 s may be the same group or different groups.
- R 7 is often attached to the carbon atom at the bridgehead.
- Representative examples of the (meth) acrylate monomer represented by the formula (2a) include, for example, 1- (1-acryloyloxy-1-methylethyl) adamantane, and 1- (1-acryloyloxy-1-methylethyl) ⁇ / ) 1,3,5-dimethyladamantane, 1- (1-methacryloyloxy-1-methylethyl) adamantane, 1- (1-methacryloyloxy-1-methylethyl) -3,5-dimethyladamantane and the like.
- n R 9 's may be the same group or different groups. R 9 is often attached to the bridgehead carbon atom.
- (meth) acrylic acid ester monomer represented by the formula (2b) include, for example, 2-acryloyloxy-1,2-methyladamantane, 2-acryloyloxy 2,5, 7-trimethyl adamantane, 2-meta-taryloyloxy-1,2-methyl-adamantane, 2-methacryloyloxy 2,5,7-trimethyl adamantane and the like.
- the monomer ( c ) containing an alicyclic skeleton having a hydroxyl group provides the polymer with anti-cutting property and substrate adhesion function.
- the alicyclic hydrocarbon group may be a monocyclic hydrocarbon group or a polycyclic (bridged cyclic) hydrocarbon group.
- a (meth) acrylic acid ester monomer represented by the above formula (3a) can be mentioned.
- R represents a hydrogen atom or a methyl group
- R 10 represents a substituent bonded to the ring, and represents a methyl group, a hydroxyl group, an oxo group or a carboxyl group.
- k represents an integer of 1 to 3.
- the k R 1 Qs may be the same group or different groups.
- k R 1 0 At least one of them is a hydroxyl group.
- R 1 (3 is often bonded to the carbon atom at the bridgehead.
- Representative examples of the (meth) acrylate monomer represented by the formula (3a) include, for example, 1-atalyloyloxy 3 -hydroxy-1,5,7-dimethyladamantane, 1-hydroxy-1 3 — methacryloyloxy — 5,7—dimethyl adamantane, 1 — acryloyloxy 1 3 — hydroxy adamantane, 1 — hydroxy 1 3 — methacryloyloxyadamantane, 1 — atari mouth inoleoxy 3,5-dihydroxydamantane, 1,3-dihydroxy-5—methacryloyoxydamantane, and the like.
- the monomer to be subjected to polymerization may be any one of the above-mentioned monomers (a), (b), and (c), and two or more of the three monomers, particularly Preferably, three monomers are used. Further, another monomer may be copolymerized as necessary.
- the polymerization can be carried out by a conventional method such as solution polymerization and melt polymerization.
- the polymerization solvent may be any solvent that is usually used when polymerizing an ataryl monomer and a olefin monomer, and examples thereof include a glycol solvent, an ester solvent, a ketone solvent, and an ether solvent. And the like.
- Glycol solvents include, for example, propylene glycol solvents such as propylene glycol monomethyl ether and propylene glycol monomethyl ether acetate; ethylene glycol monomethinoleate, ethylene glycol monomethineoleate tesoleate, ethylene glycol Ethylene glycol solvents such as olemonoethynoleate ethere, ethylene glycol olenoethyl ether acetate, ethylene glycol monobutyl ether, and ethylene glycol / lemonoptinoleate enoleacetate are included.
- propylene glycol solvents such as propylene glycol monomethyl ether and propylene glycol monomethyl ether acetate
- ethylene glycol monomethinoleate ethylene glycol monomethineoleate tesoleate
- Ethylene glycol solvents such as olemonoethynoleate ethere, ethylene glycol olenoethyl
- Ester solvents include lactic acid such as ethyl lactate Ester solvents; propionate solvents such as methyl 3-methoxypropionate; and acetate solvents such as methyl acetate, ethyl acetate, propyl acetate, and butyl acetate.
- Ketone solvents include acetone, methylethylketone, methylisobutylketone, methylamylketone, cyclohexanone, and the like.
- Ether solvents include, for example, methyl ether, diisopropinole ether, diptinole ether, tetrahydrofuran, dioxane, and the like.
- Preferred polymerization solvents include glycolone solvents such as propylene glycol monomethyl ether and propylene glycol monomethyl ether oleate acetate; ester solvents such as ethyl lactate; ketone solvents such as methyl isobutyl ketone and methyl amyl ketone; These mixed solvents are included.
- propylene glycol monomethyl ether acetate single solvent a mixed solvent of propylene glycol monomethyl monoethyl ether acetate and propylene glycol monomethyl monoethyl ether acetate, propylene glycol monomethyl ether acetate, propylene glycol monomethyl ether acetate, ethyl acetate and ethyl acetate
- the polymerization method refers to a method in which polymerization is performed while a monomer (solution) and Z or a polymerization initiator (solution) are sequentially dropped or added into a system.
- a drop polymerization method it is possible to obtain a polymer having a uniform copolymer composition obtained in the initial stage and the late stage of the polymerization.
- Known polymerization initiators can be used.
- the polymerization temperature is, for example, 40 to 150 ° C., preferably 60 to: about L 20 ° C.
- the obtained polymerization solution (polymer dope) may be subjected to a filtration step for removing insolubles.
- the pore size of the filtration material used for filtration is, for example, 1 m or less, preferably 0.8 m or less.
- the polymer produced by the polymerization is subjected to an extraction operation (washing operation) using an organic solvent and water, and the produced polymer is placed in the organic solvent layer, and metal components as impurities are placed in the aqueous layer. Distribute.
- the object to be subjected to the extraction step (B) may be a polymer produced by polymerization or a solution containing the polymer.
- the solution may be any of solutions after appropriate treatment such as washing and the like.
- the organic solvent may be any solvent that can dissolve the polymer and can be separated from water. The amount of the organic solvent and water used is appropriately determined so that the organic solvent layer and the aqueous layer can be separated.
- the polymerization solution obtained in the polymerization step (A) is mixed with an organic solvent having a specific gravity of 0.95 or less (particularly, an organic solvent having a solubility parameter (SP value) of 20 M Pa 1/2 or less). Add water and extract (wash with water).
- a solution of the polymer formed by the polymerization in a dalicol-based or ester-based solvent was mixed with an organic solvent having a specific gravity of 0.95 or less and a solubility parameter (SP value) of 20 MPa a 1/2 or less, and water.
- extraction (washing with water) is also preferable.
- the specific gravity of the organic solvent a value of 20 to 25 ° C can be adopted.
- the SP value of an organic solvent can be determined by the method described in “Polymer Handbook”, 4th edition, pages VII-675 to VII-711 [in particular, the formula (B 3 ) of page 676 and ( B8) Equation].
- the values shown in Table 1 (page VII-683) and Tables 7 to 8 (pages VII-688 to VII-711) of the literature can be adopted.
- the dalicol-based or ester-based solvent solution of the polymer formed by the polymerization may be a polymerization solution at the end of the polymerization (polymer dope), A solution obtained by subjecting the polymerization solution to appropriate treatment such as dilution, concentration, filtration, and washing may be used.
- suitable treatment such as dilution, concentration, filtration, and washing
- glycol-based solvent and the ester-based solvent include the solvents exemplified above.
- Glycol solvents such as propylene glycol monomethinoleate enorea acetate and ester solvents such as ethyl lactate have specific gravities close to water (close to 1), so it is difficult to separate them from water. but the polymer solution containing such glycol or ester solvent, and the SP value in the specific gravity 0.9 5 or less 2 0 MP a 1/2 or less (e.g., 1 3 ⁇ 2 0MP a 1/2)
- the specific gravity of the organic solvent to be added exceeds 0.95, there is not much difference in specific gravity with water, so that it is difficult to obtain good liquid separation properties.
- the specific gravity of the organic solvent to be added is preferably 0.6 to 0.95, more preferably 0.7 to 0.85 (particularly 0.7 to 0.82).
- the SP value of the organic solvent to be added is preferably 16 to 19 MPa a 1/2 , more preferably 16.5 to 18.5 MPa a 1/2 (particularly 16.5 to 18 MPa a 1 / 2 ).
- organic solvent having a specific gravity of 0.95 or less and an SP value of 20 MPaa1 / 2 or less include, for example, hexane (specific gravity 0.659; SP value 14.9), Aliphatic hydrocarbons such as octane (specific gravity 0.703; SP value 15.6), dodecane (specific gravity 0.749; SP value 16.2); cyclohexane (specific gravity 0.7 Alicyclic hydrocarbons such as 7 9; SP value 16.8); ethyl benzene (specific gravity 0.862; SP value 18.0), p-xylene (specific gravity 0.857; SP value 1 8.0), toluene (specific gravity 0.867; SP value 18.2), benzene (specific gravity 0.874; SP value 18.8), and other aromatic hydrocarbons; diisopropyl ether (specific gravity 0.72 6; SP value 14.1) 3058
- Ethers such as 15; diisobutyl ketone (specific gravity 0.806; SP value 16.0), methyl isobutyl ketone (specific gravity 0.796; SP value 17.2), methyl propyl ketone (specific gravity 0 809; SP value 17.8), methylisopropyl ketone (0.87; SP value 17.4), methylethyl ketone (specific gravity 0.805; SP value 19.0) , Methylamyl ketone (specific gravity 0.815; SP value 17.6) and other ketones; isopropyl acetate (specific gravity 0.872; SP value 17.2), butyl acetate (specific gravity 0.
- Esters such as 881; SP value 17.4) and acetic acid pill (specific gravity 0.889; SP value 18.0).
- the specific gravity in parentheses above is the value at 20 ° C ( ⁇ , benzene, p-xylene, ethynolebenzene, and methinoleisobutyl ketone at 25 ° C), and the SP value is expressed in MP a 1 / 2
- ketones such as diisobutyl ketone, methyl isobutyl ketone, methyl propyl ketone, methyl isopropyl ketone and methyl amyl ketone are preferred.
- the amount of the organic solvent having a specific gravity of 0.95 or less and an SP value of 20 MPa a 1/2 or less can be appropriately selected in consideration of extraction efficiency, operability, and the like.
- the amount is 10 to 300 parts by weight, preferably about 20 to 200 parts by weight, based on 100 parts by weight of the ester solvent solution.
- the amount of water to be added can also be appropriately selected in consideration of extraction efficiency, operability, and the like.
- the total amount of the glycol or ester solvent solution of the polymer and the organic solvent is 100 parts by weight. 5 to 300 parts by weight, and preferably about 10 to 200 parts by weight.
- the extraction (washing) operation can be performed by a conventional method, and may be performed in any of a batch system, a semi-batch system, and a continuous system.
- the extraction operation may be repeated a plurality of times (for example, about 2 to 10 times).
- the extraction temperature can be appropriately selected in consideration of operability, solubility, etc., and is, for example, 0 to 100 ° (:, preferably, about 25 to 50 ° C). It is.
- the obtained organic solvent layer may be subjected to a filtration step for removing insolubles.
- the pore size of the filter medium used for filtration is, for example, 1 / zm or less, preferably 0.5 ⁇ or less, and more preferably 0.3 ⁇ or less.
- the solution to be subjected to the precipitation purification treatment may be a solution containing a polymer formed by polymerization, and may be a polymerization solution at the end of polymerization (polymer dope), or may be diluted, concentrated, and filtered with this polymerization solution.
- liquid to be treated examples include the organic solvent layer obtained in the extraction step (II) or a solution obtained by performing a filtration treatment on the organic solvent layer.
- the solvent (precipitation solvent) used for the precipitation or reprecipitation may be any poor solvent for the polymer, for example, aliphatic hydrocarbons (pentane, hexane, heptane, octane, etc.), alicyclic hydrocarbons (cyclohexane) Hydrocarbons such as hexane, methylcyclohexane, and aromatic hydrocarbons (benzene, toluene, xylene, etc.); halogenated aliphatic hydrocarbons (methylene chloride, chloroform, carbon tetrachloride, etc.), halogenated Halogenated hydrocarbons such as aromatic hydrocarbons (eg, benzene, dichlorobenzene, etc.); Nitro compounds such as etromethane and nitroethane; nitriles such as acetonitrile and benzonitrile; linear ethers (eg, ethyl ether, diisopropyl ether
- a mixed solvent containing at least hydrocarbons (particularly, aliphatic hydrocarbons such as hexane and heptane) is preferable as the precipitation solvent.
- a solution containing the polymer produced by the polymerization and a dalicol-based or ester-based solvent is added to a solvent containing at least a hydrocarbon to precipitate or reprecipitate the polymer.
- a solution containing the polymer produced by the polymerization and a glycol-based or ester-based solvent the organic solvent layer containing the glycol-based or ester-based solvent obtained in the extraction step (B) was filtered or subjected to a filtration treatment. Solution and the like.
- the polymer produced by the polymerization is repulped with a solvent.
- a solvent By providing this step, residual monomers and low molecular weight oligomers attached to the polymer can be efficiently removed.
- the high boiling point solvent having an affinity for the polymer is removed, the surface of the polymer particles is hardened in a later drying step or the like, and the fusion of the polymer particles can be prevented. Therefore, the solubility of the polymer in the resist solvent is remarkably improved, and the preparation of the photoresist resin composition can be performed easily and efficiently.
- the material to be subjected to the repulping treatment include the above-mentioned precipitated and purified polymer (for example, the polymer after the precipitation and purification, and the solvent is removed by decantation, filtration, or the like).
- hydrocarbon solvents are particularly preferred.
- the hydrocarbon solvent include aliphatic hydrocarbons such as pentane, hexane, heptane and octane, alicyclic hydrocarbons such as cyclohexane and methylcyclohexane, and aromatic hydrocarbons such as benzene, toluene and xylene. Hydrogen. These may be used in combination of two or more. Among them, aliphatic hydrocarbons, particularly hexane or heptane, or a mixed solvent containing hexane or heptane is preferable.
- the amount of the repulping solvent to be used is, for example, about 1 to 200 times, preferably about 5 to 100 times, more preferably about 10 to 50 times the weight of the polymer.
- the temperature at which the repulping treatment is performed varies depending on the type of the solvent to be used and the like, but is generally 0 to 100 ° C, preferably about 10 to 60 ° C.
- Repulp treatment is performed in a suitable container. The repulp treatment may be performed plural times.
- the treated liquid (repulp liquid) is removed by decantation or the like.
- the polymer produced by the polymerization is rinsed with a solvent.
- a solvent By this step, as in the repulp step, residual monomers and low molecular weight oligomers attached to the polymer can be efficiently removed.
- the solubility of the polymer in the resist solvent is remarkably improved, and the preparation of the resin composition for a photoresist is improved. It is easy to manufacture.
- water as the rinse solvent, metal components adhering to the polymer surface can be efficiently removed. Therefore, deterioration of resist performance due to metal components can be significantly prevented.
- Examples of the object to be subjected to the rinsing treatment include the polymer subjected to the precipitation purification (for example, the polymer obtained after removing the solvent by decantation or the like after the precipitation purification) or the polymer subjected to the repulping treatment (for example, repulping Polymer after removal of the solvent by decantation after treatment).
- a solvent used for the rinsing treatment a rinsing solvent
- a poor solvent for the polymer used for precipitation or reprecipitation is preferable.
- hydrocarbon solvents are particularly preferred.
- the hydrocarbon solvent include aliphatic hydrocarbons such as pentane, hexane, heptane and octane; alicyclic hydrocarbons such as cyclohexane and methylcyclohexane; and aromatic hydrocarbons such as benzene, toluene and xylene. Hydrogen. These may be used as a mixture of two or more.
- aliphatic hydrocarbons particularly hexane or heptane, or a mixed solvent containing hexane or heptane is preferable.
- water as a rinse solvent particularly water having a sodium content of 5 wt. Ppb or less (preferably 3 wt. Ppb or less, more preferably 1.5 wt. Ppb or less)
- ultrapure water is preferred.
- the amount of the rinse solvent used is, for example, 1 to 100 times by weight, and preferably about 2 to 20 times by weight, relative to the polymer.
- the temperature at which the rinsing treatment is performed varies depending on the type of the solvent to be used and the like, but it is generally 0 to 100 ° (: preferably about 10 to 60 ° C.
- the rinsing treatment may be performed a plurality of times, and particularly preferably a combination of a rinsing treatment using a hydrocarbon solvent and a rinsing treatment using water. (Rinse liquid) is removed by decantation, filtration, etc. It is.
- the polymer produced by polymerization is subjected to precipitation purification, and if necessary, repulping treatment and / or rinsing treatment, and then drying the polymer.
- the drying temperature of the polymer is, for example, about 20 to 120 ° C, preferably about 40 to 100 ° C.
- the drying is preferably performed under reduced pressure, for example, at 200 mmHg (26.6 kPa) or less, particularly preferably at 100 mmHg (13.3 kPa) or less.
- the polymer produced by polymerization is subjected to precipitation purification, and if necessary, repulping, rinsing, and drying, and then the polymer is dissolved in an organic solvent (resist solvent).
- an organic solvent resist solvent
- This polymer solution can be used as a polymer solution for photoresist (polymer concentration of about 10 to 40% by weight).
- the organic solvent include glycol-based solvents, ester-based solvents, ketone-based solvents, and mixed solvents thereof exemplified as the polymerization solvent.
- propylene glycol monomethineoleatene propylene glycol monomethyl ether acetate, ethyl lactate, methyl isobutyl ketone, methyl amyl ketone, and a mixture thereof are preferable, and propylene glycol monomethyl ether acetate alone is particularly preferable.
- Solvent at least propylene glycol, such as a mixed solvent of propylene glycol mono-monomethinoleate enorea acetate and propylene glycol mono-methyl enole ether, and a mixed solvent of propylene glycol monomethyl ether acetate and ethyl lactate Solvents containing rumonomethyl ether acetate are preferably used.
- the polymer solution obtained in the re-dissolution step (G) is used. Is concentrated to remove the low-boiling solvents (polymer solvent, extraction solvent, precipitation solvent, repulp solvent, solvent used as rinse solvent, etc.) contained in the polymer solution, and remove the polymer for photo-resist. Prepare solution.
- a low-boiling solvent is contained in the polymer solution obtained in the re-dissolution step (G), for example, when the re-dissolution step (G) is provided without the drying step (F). Useful if you have.
- an organic solvent resist solvent
- concentration eg, about 10 to 40% by weight. The concentration can be performed under normal pressure or reduced pressure.
- the photo-resist polymer solution is further added with a photoacid generator and, if necessary, various additives, and is used for the production of semiconductors.
- a polymer having a repeating unit corresponding to at least one monomer selected from the monomers (a), (b) and (c) (hereinafter referred to as “polymer”) P), and a metal solution having a metal content of not more than 100 parts by weight ppb with respect to the polymer P was constituted by a porous polyolefin membrane having a cation exchange group. Pass through the filter.
- the polymer P is a repeating unit corresponding to the monomer (a) [for example, a repeating unit (ata) corresponding to the (meth) acrylate monomer represented by the formula (la), (lb) or (lc). And a repeating unit corresponding to the monomer (b) [for example, a (meth) acrylate monomer represented by the formula (2a) or (2b)].
- Corresponding repeating unit (repeating unit formed by polymerization of an acrylic moiety) etc., and repeating unit corresponding to monomer (c)
- a repeating unit corresponding to the (meth) acrylate monomer represented by the formula (3a) (a repeating unit formed by polymerization of an acryl moiety) and the like may be used. It is preferable to have two or more, particularly three kinds of repeating units among the three kinds of repeating units. Further, the polymer P may have another repeating unit as required. '
- the above polymer P can be synthesized by the method of the above step (A). More specifically, it is selected from a monomer containing a ratatone skeleton, a monomer containing a group which is eliminated by an acid to become alkali-soluble, and a monomer containing an alicyclic skeleton having a hydroxyl group. It can be synthesized by subjecting at least one type of monomer (acrylic monomer, olefin monomer, etc.) and, if necessary, other monomer to polymerization. The polymerization can be carried out by a conventional method such as solution polymerization and melt polymerization. It is preferable to use a monomer having a low metal content, for example, a monomer having a metal content of 100 weight parts per billion or less.
- the solvent in the solution containing the polymer P is not particularly limited, and includes, for example, esters such as ethyl acetate, butyl acetate, propylene glycol monomethyl ether monoacetate, ethyl lactate, and ethyl benzoate; acetone, ethynole Ketones such as methinole ketone, getinole ketone, isobutyl methyl ketone, and t-butynole methyl ketone; getinole ether, disopropinoleate tezore, t-butinoremethine oleatene, dibutylatene, dime Chain or cyclic ethers such as toxicethane, propylene glycol monomethyl ether, anisol, dioxane, and tetrahydrofuran; alcohols such as methanol, ethanol, isopropyl alcohol, and butanol; acetonitrile, propion
- the cation exchange group of the porous polyolefin membrane includes a strongly acidic cation exchange group such as a sulfonic acid group and a weakly acidic cation exchange group such as a lipoxyl group.
- a strongly acidic cation exchange group such as a sulfonic acid group
- a weakly acidic cation exchange group such as a lipoxyl group.
- the polyolefin that constitutes the polyolefin film include polyethylene such as high-density polyethylene, and polypropylene.
- a hydrophilic filter As the filter composed of a porous polyolefin membrane having a cation exchange group, a hydrophilic filter is preferable, and for example, “Ionclean” (trade name, manufactured by Pall Corporation) is preferably used.
- the solution containing the polymer P (polymer compound for photoresist) is passed through a filter composed of a porous polyolefin membrane having a cation exchange group to remove metal ions.
- hydrogen ions (acids) are generated.
- This hydrogen ion is preferred to be as small as possible, since it removes the acid leaving group of the polymer P and lowers the resist performance. Therefore, the metal content in the polymer P-containing solution to be provided to the filter composed of the porous polyolefin membrane is 100% by weight or less based on the polymer P (for example, 100 to L0000% by weight ppb). It is preferably 800 wt. Ppb or less (for example, 100 to 800 wt.
- Ppb more preferably 500 wt. Ppb or less (for example, 100 to 500 wt. Ppb). If the metal content is more than 1000 wt ppb, the hydrogen ion concentration in the solution after passing through the filter will increase, and the resist performance will increase. Lower.
- the flow rate when the solution containing the polymer P is passed through the filter varies depending on the type of the polyolefin membrane material, the type of the solution (solvent), and the like, and is within a range that does not impair the metal removal efficiency (eg, 100 (ml / min to about 100 L / min).
- the temperature at which the liquid is passed through the filter is usually 0 to 80 ° C, preferably about 10 to 50 ° C. If the temperature is too high, the filter may degrade, the solvent may be decomposed, etc.If the temperature is too low, the solution viscosity increases and it becomes difficult to pass the solution.
- the solution containing the polymer P is passed through the filter.
- the metal solution (based on polymer) has a metal content of, for example, 200 wt ppb or less, preferably 100 wt ppb or less. Can be obtained. Therefore, when the polymer P is used as the resin component of the resin composition for photoresist, it does not adversely affect the electrical characteristics of the semiconductor and the like.
- a filtration step (J) for filtering the solution containing the polymer P to remove insolubles may be provided before the step (I).
- clogging in the step (I) can be prevented, and various troubles due to contamination by foreign matter when forming a pattern using the photoresist resin composition are prevented. it can.
- the filtration material used in the filtration step (J) is not particularly limited,
- a membrane filter or the like is used.
- the pore size of the filter medium is usually about 0.01 to lO / zm, preferably about 0.02 to lm, and more preferably about 0.05 to 0.5 ⁇ .
- a water washing step (K) for reducing the metal content in the solution by washing the solution containing the polymer P with water may be provided before the step (I). If the water-washing step (K) is provided before the step (I), the water-soluble metal compound is efficiently removed, so that not only can the load on the step (I) be reduced, but also the metal ion removal in the step (I). As a result, the amount of hydrogen ions produced can be reduced, and a great advantage is obtained in that the resist performance is not impaired. In particular, when the metal content of the solution containing the polymer P exceeds 100,000 weight ppb, the metal content is reduced to 100,000 weight ppb or less by the water washing treatment step (K), and the solution is supplied to the step (I).
- the water used in the water washing step (K) is preferably water having a low metal content, for example, ultrapure water having a metal content of 1 wt.
- the amount of water is, for example, 100 to 1000 parts by weight, and preferably about 30 to 300 parts by weight, based on 100 parts by weight of the liquid to be treated.
- the temperature at the time of performing the water washing treatment is, for example, about 10 to 50 ° C.
- the wastewater is generated in large quantities, which is costly and disadvantageous.
- a step of subjecting the solution containing the polymer P to another adsorption treatment may be provided as necessary.
- Other adsorption treatments include, for example, activated carbon treatment, chelate resin treatment, chelate fiber treatment, zeta potential membrane treatment, and the like.
- the step (B), (C), (D), (E), (F), (G) or (H) may be provided before or after the step (I).
- the solution containing the polymer P (polymer compound for photoresist) that has undergone the above steps can be used as it is or by isolating the polymer by precipitation or reprecipitation to prepare a resin composition for photoresist. used.
- the solvent (precipitation solvent) used for the precipitation or reprecipitation may be any poor solvent for the polymer, for example, aliphatic hydrocarbons (pentane, hexane, heptane, octane, etc.), alicyclic hydrocarbons (cyclohexane) Hydrocarbons such as hexane, methylcyclohexane, and aromatic hydrocarbons (benzene, toluene, xylene, etc.); halogenated aliphatic hydrocarbons (methylene chloride, chloroform, carbon tetrachloride, etc.), halogenated Halogenated hydrocarbons such as aromatic hydrocarbons (eg, benzene, dichlorobenzene, etc.); Nitro compounds such as nitromethane and nitroethane; nitriles such as acetonitrile ⁇ / and benzonitrile; Butyl ether, diisopropyl ether, dimethyloxe
- a mixed solvent containing at least a hydrocarbon is preferable as the precipitation solvent.
- a solvent having a low metal content for example, a metal having a metal content of 50 ppb or less is preferably used.
- a photoresist polymer compound having an extremely low impurity content such as a metal component can be efficiently produced.
- a polymer compound for photoresist that can be easily and surely dissolved in a solvent for resist can be efficiently produced.
- Example 11 The numbers at the lower right of the parentheses in the structural formulas of Examples 11, 13, 14, and 15 indicate mol% of the monomer unit (repeating unit).
- monomers having a metal content of 100% by weight or less were used.
- PGMEA propylene glycol monomethyl ether acetate
- MIBK methyl isobutyl ketone
- Example 11 a commercially available product was distilled using a glass distillation apparatus to reduce the metal content to 50 wt ppb or less. A commercial product was used as it was except for Example 11.
- Example 11 to 15 and Comparative Examples 4 to 6 the dissolution in the precipitation operation and the repulp operation was performed.
- the medium ethyl acetate, hexane
- ultrapure water pure water
- the metal content was determined using an inductively coupled plasma mass spectrometer (ICP-MS) and expressed as a value (ppb) based on the amount of polymer finally obtained.
- ICP-MS inductively coupled plasma mass spectrometer
- PGMEA propylene glycol monomethyl ether acetate
- MI BK methylisobutyl ketone
- the repulping operation was carried out by stirring for 30 minutes after charging the heptane, allowing the mixture to stand for 90 minutes, and extracting the supernatant. This repulp operation was performed twice in total.
- the residue obtained after the removal of the supernatant was transferred to a centrifuge, and the liquid was removed by centrifugal force of 600 G to obtain a wet polymer.
- 65 g of heptane was added to the wet polymer, and rinsed with a centrifugal force of 600 G to remove the rinse liquid.
- 100 g of ultrapure water Na weight: 0.9 weight ppb
- rinsing was performed by centrifugal force of 600 G to remove the rinsing liquid.
- the obtained wet polymer is taken out, placed in a tray dryer, and dried at 20 mmHg (2.66 kPa) and 70 ° C for 30 hours to obtain a polymer for photo resist (ArF resist).
- (Resin resin) 10.5 g was obtained.
- This polymer for photoresist was dissolved in 31.5 g of PGMEA to obtain a polymer solution for photoresist.
- the obtained polymer for photoresist had a weight average molecular weight of 8250 and a molecular weight distribution of 1.74.
- the content of metal components was Na 95 weight ppb, M g 40 weight ppb, K 40 weight ppb, Ca 45 weight ppb, Zn 48 weight ppb, Fe 38 weight ppb, A 120 weight ppb, Cr 20 weight ppb, Mn 35 weight ppb, Ni 20 weight ppb, Cu 20 weight ppb, residual monomer MNB L 0.05 weight%, HMA O .05 Wt%, 2-MMA 0.08 weight. /. , Residual solvent 2.5 wt 0/0, water 0.5 weight 0 /. Met.
- the solubility of the polymer for photoresist in PGMEA was also good.
- Reaction (polymerization), washing with water (extraction), filtration and precipitation purification were performed in the same manner as in Example 1.
- the residue obtained after extracting 60 g of the supernatant liquid during the precipitation purification was transferred to a centrifuge, and the liquid was removed by centrifugal force of 600 G to obtain a wet polymer.
- 65 g of heptane was added to the wet polymer, and rinsed with a centrifugal force of 600 G to remove the rinse solution.
- 100 g of ultrapure water (Na weight: 0.9 weight ppb) was added, and rinsing was performed by a centrifugal force of 600 G to remove the rinsing liquid.
- the obtained wet polymer (42 g) was dissolved in 63 g of methyl amyl ketone. By concentrating this solution (normal pressure to 2.66 kPa; normal temperature to 75 ° C), 42 g of a 25% by weight polymer solution for photoresist was obtained.
- the obtained polymer for photoresist had a weight average molecular weight of 820 and a molecular weight distribution of 1.75.
- the content of metal components was Na 94 weight ppb, M g 30 weight ppb, K 35 weight ⁇ ⁇ b, ⁇ & 40 weight 1), ⁇ 115 0 weight 13, Fe 42 weight ppb, A 120 weight ppb, Cr 20 weight ppb , Mn 5 wt ppb, Ni 5 wt ppb, Cu 10 wt ppb, residual monomer MNB L 0.09 wt%, HMA O .09 wt%, 2-MMA 0.1 1 wt% .
- the same operation as in Example 2 was performed except that the washing (extraction) operation was not performed, and a polymer solution for a photoresist was obtained.
- the content of the metal component in the polymer (based on the polymer weight) is Na550 weight ppb, Mg 80 weight ppb, K 240 weight ppb, Ca 300 weight ppb, Zn 250 weight ppb, Fe 300 weight ppb, A 1200 weight ppb, Cr 80 weight ppb, Mn 30 weight ppb, Ni 30 weight ppb and Cu 40 weight ppb.
- the reaction was carried out in the same manner as in Example 1.
- the obtained reaction solution (polymer dope) (35 ° C) was passed through a filter having a pore size of 0.5 m and a filter having a pore size of 0.1 ⁇ m, and then 656 g of heptane and 219 g of acetic acid were passed through.
- the mixture was dropped into a mixed solution of ethyl (35 ° C.), and after completion of the dropping, the mixture was stirred for 60 minutes and allowed to stand for 90 minutes to purify the precipitate.
- the residue obtained after removing the supernatant from the precipitation purification was transferred to a centrifuge, and the liquid was removed by centrifugal force of 600 G to obtain a wet polymer.
- 63 g of methyl amyl ketone (MAK) was added and dissolved at 60 ° C.
- the same weight of water was added to the obtained polymer solution.
- the mixture was stirred at 35 ° C. for 30 minutes, and then allowed to stand for 30 minutes to be separated.
- After removing the lower layer (aqueous layer), add the same amount of water as the upper layer to the upper layer (organic layer), stir again at 35 ° C for 30 minutes, and let stand for 30 minutes. ) was removed.
- the obtained photoresist polymer had a weight-average molecular weight of 8280 and a molecular weight distribution of 1.76.
- the content of metal components was Na 85 wt ppb, Mg 25 wt ppb, K 30 wt ppb, Ca 35 wt ppb, Zn 45 wt ppb, Fe 40 wt ppb, All 5 wt ppb, Cr 15 wt ppb, Mn 5 wt ppb, Ni 5 weight ppb, Cu 10 weight ppb, residual monomer MNB L 0.09 weight %, HMA O. 08% by weight, 2-MMA O. 10% by weight. /. Met.
- a mixed solution of 85 g and 48 g of propylene glycol monomethinoleate enorea acetate (PGMEA) was added dropwise over 6 hours. After dropping, the mixture was aged for 2 hours.
- the obtained reaction solution (polymer dope) (30 ° C) was passed through a filter having a pore size of 0.5 ⁇ m, and then 75 g of methyl isobutyl ketone (MIBK) (30 ° C) was added thereto. The same weight of water was added to the obtained polymer solution. The mixture was stirred at 30 ° C. for 30 minutes, and then allowed to stand for 30 minutes to be separated.
- the same amount of water as the upper layer was newly added to the upper layer (organic layer), and the mixture was again stirred at 30 ° C. for 30 minutes, allowed to stand for 30 minutes, and then allowed to stand for 30 minutes. ) was removed. Adjust the upper layer (organic layer) (30 ° C) to 0.1 ⁇ m pore size. After passing through a finole letter of m, the mixture was added dropwise to a mixture of 32,2 g of heptane and 92 g of ethynole acetate (30 ° C). After completion of the addition, the mixture was stirred for 60 minutes to purify the precipitate. went.
- the obtained wet polymer is taken out, placed in a tray dryer, and dried at 20 mmHg (2.66 kPa) and 45 ° C for 65 hours to obtain a polymer for photo resist (A r F resist (resin) 12 g was obtained.
- This polymer for photoresist was dissolved in 36 g of PGMEA to obtain a polymer solution for photoresist.
- the obtained polymer for photoresist had a weight-average molecular weight of 15,000, a molecular weight distribution of 2.50, and an Na content (based on polymer weight) of 70 weight parts per billion.
- the solubility of the polymer for photo resist in PGMEA was also good.
- Example 4 In the same manner as in Example 4, the reaction (polymerization), washing with water (extraction), filtration, precipitation purification, and rinsing were performed.
- the obtained wet polymer (24 g) was dissolved in 96 g of PGMEA.
- the solution was concentrated to (atmospheric pressure ⁇ 8 k P a; room temperature ⁇ 8 0 ° C), to obtain a 2 5 weight 0/0 follower Torejisu preparative polymer solution 4 8 g.
- the weight average molecular weight of the obtained photoresist polymer was 1,480, the molecular weight distribution was 2.45, and the Na content (based on the weight of the polymer) was 65 ppb by weight. Comparative Example 2
- Example 5 The same operation as in Example 5 was performed except that the washing (extraction) operation was not performed, and a polymer solution for a photoresist was obtained.
- the content of the metal component (based on the weight of the polymer) in the obtained photoresist polymer was Na500 weight ppb, Mg 70 weight ppb, K150 weight ppb, and Ca480.
- the mixture was stirred at 35 ° C. for 30 minutes, and then allowed to stand for 30 minutes to be separated. After removing the lower layer (aqueous layer), newly add water of 12 weight of the upper layer to the upper layer (organic layer), stir again at 35 ° C for 30 minutes, leave still for 30 minutes, Aqueous layer) was removed. After passing the upper layer (organic layer) (35 ° C) through a filter with a pore size of 0.1 m, a mixture of 93.5 g of heptane and 136.5 g of ethyl acetate (35 ° C) After completion of the dropwise addition, the mixture was stirred for 30 minutes to perform precipitation purification.
- the obtained wet polymer is taken out, put into a tray dryer, and dried at 20 mmHg (2.66 kPa) and 45 ° C for 40 hours to obtain a polymer for photo resist (ArF).
- (Resist resin) 14 g was obtained.
- the photoresist polymer was dissolved in a mixed solvent of 29 g of PGMEA and 13 g of PGME to obtain a polymer solution for photoresist.
- the weight average molecular weight of the obtained photoresist polymer was 9700, the molecular weight distribution was 2.14, and the Na content (based on the weight of the polymer) was 50 ppb by weight.
- Example 6 In the same manner as in Example 6, the reaction (polymerization), washing (extraction), filtration, precipitation purification and rinsing operations were performed.
- the solution was concentrated to (atmospheric pressure ⁇ 8 k P a; room temperature ⁇ 7 0 ° C), to give a 2 to 5 by weight 0/0 follower Torejisu preparative polymer solution 56 g.
- the weight average molecular weight of the obtained photoresist polymer was 9750, the molecular weight distribution was 2.12, and the Na content (based on the polymer weight) was 48 weight parts per billion.
- Example 7 The same operation as in Example 7 was performed except that the washing (extraction) operation was not performed, and a polymer solution for a photoresist was obtained.
- the content of the metal component (based on the weight of the polymer) in the obtained photoresist polymer was Na 800 weight ppb, Mg 70 weight ppb, K 140 weight ppb, Ca 150 weight ppb, Zn 190 weight ppb, Fe 140 weight ppb, A 190 weight ppb, Cr 70 weight ppb, Mn 30 weight ppb, Ni 30 weight ppb, Cu 30 weight ppb Was.
- Example 1 dimethyl-2,2′-azobis (2-methylpropionate) as a polymerization initiator (initiator: V-601, manufactured by Wako Pure Chemical Industries, Ltd.) was replaced with 0.93 g, instead of 0.93 g. 2'-Azobis [2-methyl-N- (2-hydroxyxethyl) propionamide] (Initiator; Wako Pure Chemical Industries, VA — 08 6) 1.
- Example 16 with the solvent first filling the flask Ethyl lactate 41 g instead of 33 g of propylene glycol monomethyl ether acetate (PGMEA)
- PMEA propylene glycol monomethyl ether acetate
- 41 g of ethyl ethyl lactate was used in place of 4 lg of coal monomethyl ether acetate (PGMEA), and a polymer for photo resist (A rF resist resin) was used. 2 g were obtained. Further, using this polymer, a polymer solution for photoresist was obtained in the same manner as in Example 1.
- the obtained photoresist polymer had a weight average molecular weight of 8350 and a molecular weight distribution of 1.80.
- the content of metal components was Na 85 wt ppb, M g 43 weight ppb, K 30 weight ⁇ ⁇ b, C a 50 weight ppb, Zn 44 weight ppb, Fe 30 weight ppb, All 5 weight ppb, Cr 20 weight ppb, Mn 30 Weight ppb, Ni 25 weight ppb, Cu 20 weight ppb, residual monomer MNB LO .05 weight%, HMA 0.05 weight%, 2-MMA O .06 weight%, residual solvent 2.5 weight. /. , Moisture 0.5 weight. /. Met.
- the solubility of the polymer for photoresist in PGMEA was also good.
- Example 4 dimethyl-2,2′-azobis (2-methylpropionate) as a polymerization initiator (initiator: V-601, manufactured by Wako Pure Chemical Industries, Ltd.) was used instead of 0.85 g. , 2'-Azobis [2-methyl-1-N- (2-hydroxyxethyl) propionamide] (Initiator; Wako Pure Chemical Industries, VA-086) 1. 16 g, solvent to fill the flask first Instead of 12.0 g of propylene glycol monomethyl ether acetate (PGMEA), 12.0 g of ethyl lactate was added to 48 g of propylene glycol monomethyl ether acetate (PGMEA), the solvent of the mixed solution to be added dropwise.
- PGMEA propylene glycol monomethyl ether acetate
- Example 4 The same operation as in Example 4 was carried out except that 48 g of ethyl lactate was used instead, to obtain 11.5 g of a polymer for photo resist (ArF resist resin). In addition, using this polymer, a photoresist was prepared in the same manner as in Example 4. A polymer solution was obtained.
- the weight average molecular weight of the obtained photoresist polymer was 1,500, the molecular weight distribution was 2.35, and the Na content (based on the weight of the polymer) was 60,13.
- the solubility of the photoresist polymer in PGMEA was also good.
- Example 6 dimethyl-2,2′-azobis (2-methylpropionate) which is a polymerization initiator (initiator; V-601, manufactured by Wako Pure Chemical Industries, Ltd.) 2'-azobis [2-methyl-N- (2-hydroxyxethyl) propionamide] (Initiator; Wako Pure Chemical Industries, VA-0886) 0.19 g, solvent to fill the flask first 23.6 g of propylene glycol monomethyl ether acetate (PGMEA) and 33.7 g of ethyl lactate in place of 0.1 g of propylene glycol monomethyl ether (PGME)
- Example 6 was repeated except that propylene glycol monomethyl ether acetate (PGMEA) 43.8 g and propylene glycol monomethyl ether (PGME) 18.8 g were replaced with ethyl acetate lactate 62.6 g. Perform the same operation for the photo 12.8 g of a polymer (ArF resist resin) was obtained. Further, using this
- Example 1 Manufacture of polymer compounds for photoresists with the following structure
- PGMEA propylene glycol monomethyl ether acetate
- the mixture was aged for 2 hours to obtain a polymer solution containing 20% by weight of the polymer compound represented by the above formula. After passing this polymer solution through a membrane filter having a pore size of 0.5, 7.5 g of methyl isobutyl ketone (MIBK) was added. At this time, the metal content in the polymer solution was 450 ppb.
- MIBK methyl isobutyl ketone
- This polymer solution was treated with “Ion Clean” (trade name) composed of a porous polyolefin membrane having cation exchange groups (trade name, manufactured by Nippon Pall Co., Ltd.), material: chemically modified ultra high molecular weight polyethylene, filtration area: 0.1 1 m 2 ) at room temperature at a flow rate of 100 gZmin.
- “Ion Clean” trade name
- material chemically modified ultra high molecular weight polyethylene, filtration area: 0.1 1 m 2
- the obtained solution was dropped into a mixed solvent of 670 g of hexane and 250 g of ethyl acetate, and the resulting precipitate was repulped with 650 g of hexane. Remove the supernatant, transfer the residue to a centrifuge, drain and remove the wet polymer. Obtained.
- the obtained wet polymer was taken out and dried at 20 mmHg (2.66 kPa) at 70 ° C. for 30 hours to obtain 108 g of a product polymer.
- the metal content in the product polymer was 50 ppb.
- Polymerization was carried out in the same manner as in Example 11 except that a commercially available product was used as PGME A, and a polymer solution was obtained. After passing this polymer solution through a membrane filter having a pore size of 0.5 ⁇ , 750 g of commercially available methyl isobutyl ketone ( ⁇ ⁇ ⁇ ) was added. At this time, the metal content in the polymer solution was 1200 pppb.
- This polymer solution was coated with a porous polyolefin membrane having cation exchange groups, "Ion Clean” (trade name) (manufactured by Nippon Pall Co., Ltd., material: chemically modified ultra high molecular weight polyethylene, filtration area: 0.1 1 m 2 ) at room temperature at a flow rate of 100 g Zmin.
- "Ion Clean” trade name
- the resulting solution was dropped into a mixed solvent of 675 g of hexane and 250 g of ethyl acetate, and the resulting precipitate was repulped with 6500 g of hexane.
- the supernatant was removed, the residue was transferred to a centrifuge, and the solution was removed to obtain a wet polymer.
- the obtained wet polymer was taken out, and dried at 20 mmHg (2.66 kPa) and 70 ° C. for 30 hours to obtain 105 g of a product polymer.
- the metal content in the product polymer was 70 ppb.
- Polymerization was carried out in the same manner as in Example 11 except that a commercially available product was used as PGEA, and a polymer solution was obtained. After passing the polymer solution through a membrane filter having a pore size of 0.5 ⁇ m, 75 g of commercially available methyl isobutyl ketone (MIBK) was added. At this time, the metal content in the polymer solution was 1,200 ppb.
- MIBK methyl isobutyl ketone
- This organic layer is made of a porous polyolefin membrane having a cation exchange group, "Ion Clean” (trade name) (manufactured by Nippon Pall Co., Ltd., material: chemically modified type ultra-high molecular weight polyethylene, filtration area: 0. 11 m 2 ) at room temperature at a flow rate of 100 g Zmin.
- "Ion Clean" trade name
- the obtained solution was dropped into a mixed solvent of 650 g of hexane and 250 g of ethyl acetate, and the resulting precipitate was repulped with 650 g of hexane.
- the supernatant was removed, the residue was transferred to a centrifuge, and the solution was removed to obtain a wet polymer.
- the obtained wet polymer was taken out and dried at 20 mmHg (2.66 kPa) at 70 ° C. for 30 hours to obtain 105 g of a product polymer.
- the metal content in the product polymer was 60 ppb.
- Polymerization was carried out in the same manner as in Example 11 except that a commercially available product was used as PGME A to obtain a polymer solution. After passing this polymer solution through a membrane filter having a pore size of 0.5 ⁇ m, 75O g of commercially available methyl isobutyl ketone (MIBK) was added. At this time, the metal content in the polymer solution was 1200 pppb.
- MIBK methyl isobutyl ketone
- This organic layer (polymer solution) was dropped into a mixed solvent of 670 g of hexane and 250 g of ethyl acetate without passing through the porous polyolefin membrane, and the resulting precipitate was washed with hexane 6 Repulp at 500 g. The supernatant was removed, the residue was transferred to a centrifuge, and drained to obtain a wet polymer. The obtained wet polymer was taken out and subjected to 20 mmHg (2.66 kPa), 70. After drying for 30 hours, 103 g of a product polymer was obtained. Product The metal content in the polymer was 250 ppb.
- PMEA propylene glycol monomethyl ether acetate
- 2,6-Norpornancarboractone (metal content: 100 ppb or less) 50 g 2 Methacryloynoreoxy- 12 methyl adamantane (2-MMA) 50 g 1 Hydroxy 50 g of 3-methacryloyloxyadamantane (HMA), 1.8 g of dimethyl-1,2'-azobis (2-methylpropionate) (initiator; V-601, manufactured by Wako Pure Chemical Industries) and A mixed solution of PGMEA (530 g) was added dropwise over 6 hours. After dropping, the mixture was aged for 2 hours, and the polymer compound represented by the above formula was weighed 20 wt. / 0 containing polymer solution was obtained.
- MN BL metal content: 100 ppb or less
- This polymer solution was passed through a membrane filter having a pore size of 0.5 ⁇ , and then 75O g of methyl isobutyl ketone ( ⁇ ⁇ ⁇ ) was added. At this time, the metal content in the polymer solution is 1200 ppb.
- the obtained solution was dropped into a mixed solvent of 670 g of hexane and 250 g of ethyl acetate, and the resulting precipitate was repulped with 650 g of hexane.
- the supernatant was removed, the residue was transferred to a centrifuge, and the solution was removed to obtain a wet polymer.
- the obtained wet polymer was taken out and dried at 20 mmHg (2.66 kPa) and 70 ° C. for 30 hours to obtain 105 g of a product polymer.
- the metal content in the product polymer was 50 ppb.
- Polymerization was carried out in the same manner as in Example 13 to obtain a polymer solution.
- the polymer solution was passed through a 0.5-m-pore-size membran filter, and then 75 g of commercially available methyl isobutyl ketone (MIBK) was added. At this time, the metal content in the polymer solution was 1200 ppb.
- MIBK methyl isobutyl ketone
- This polymer solution was treated with “Ion Clean” (trade name) (made by Nippon Pall Co., Ltd.) composed of a porous polyolefin membrane having cation exchange groups.
- Material chemically modified ultra-high molecular weight polyethylene, filtration area: 0.1 1 m 2 ) at room temperature at a flow rate of 100 g / min.
- the obtained solution was dropped into a mixed solvent of 670 g of hexane and 250 g of ethyl acetate, and the resulting precipitate was repulped with 650 g of hexane.
- the supernatant was removed, the residue was transferred to a centrifuge, and the solution was removed to obtain a wet polymer.
- the obtained wet polymer was taken out and dried at 20 mmHg (2.66 kPa) at 70 ° C. for 30 hours to obtain 108 g of a product polymer.
- the metal content in the product polymer was 70 ppb.
- N-methacryloyloxy 2, 6-norbornane carboractone (metal content less than 10 O ppb) 50 g, 2-methacryloyloxy 2-methyl adamantane (2-MMA) 50 g, 1 , 3-dihydroxy-5-methacryloyloxyadamantane (DHMA) 50 g, dimethyl-1,2'-azobis (2-methylpropionate) (Initiator; Wako Pure Chemical Industries, V — 60 1)
- a mixed solution of 1.8 g and PGMEA 530 g was added dropwise over 6 hours. After dropping, the mixture was aged for 2 hours to obtain a polymer solution containing the polymer compound represented by the above formula at 20% by weight.
- This polymer solution was passed through a membrane filter having a pore size of 0.5 m, and then 75O g of methyl isobutyl ketone (MIBK) was added. At this time, the metal content in the polymer solution was 1200 ppb.
- MIBK methyl isobutyl ketone
- This organic layer is formed of a porous polyolefin membrane having a cation exchange group, "Ion Clean” (trade name) (manufactured by Nippon Pall Co., Ltd., material: chemically modified type ultra-high molecular weight polyethylene, filtration area: 0. 11 m 2 ) at room temperature at a flow rate of 100 g / min.
- "Ion Clean" trade name
- the obtained solution was dropped into a mixed solvent of 670 g of hexane and 2250 g of ethyl acetate, and the resulting precipitate was repulped with 650 g of hexane.
- the supernatant was removed, the residue was transferred to a centrifuge, and the solution was removed to obtain a wet polymer.
- the obtained wet polymer was taken out and dried at 20 mmHg (2.66 kPa) and 70 ° C for 30 hours to obtain 105 g of a product polymer.
- the metal content in the product polymer was 50 ppb.
- PMEA propylene glycol monomethyl ether acetate
- This organic layer is made of a porous polyolefin membrane having a cation exchange group, "Ion Clean” (trade name) (manufactured by Nippon Pall Co., Ltd., material: chemically modified type ultra-high molecular weight polyethylene, filtration area: 0. 11 m 2 ) at room temperature at a flow rate of 100 g / min.
- the obtained solution was dropped into a mixed solvent of 670 g of hexane and 250 g of ethyl acetate, and the resulting precipitate was repulped with 650 g of hexane.
- the supernatant was removed, the residue was transferred to a centrifuge, and the solution was removed to obtain a wet polymer.
- the obtained wet polymer was taken out and dried at 20 mmHg (2.66 kPa) at 70 ° C. for 30 hours to obtain 105 g of a product polymer.
- the metal content in the product polymer was 50 ppb.
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- Chemical Kinetics & Catalysis (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
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- Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
Description
Claims
Priority Applications (9)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE60317651T DE60317651T2 (de) | 2002-04-01 | 2003-03-14 | Verfahren zur herstellung von fotolackpolymerverbindungen |
JP2003580393A JP4286151B2 (ja) | 2002-04-01 | 2003-03-14 | フォトレジスト用高分子化合物の製造法 |
EP03708604A EP1491560B1 (en) | 2002-04-01 | 2003-03-14 | Process for the production of high-molecular compounds for photoresist |
KR1020047015490A KR100955989B1 (ko) | 2002-04-01 | 2003-03-14 | 포토레지스트용 고분자 화합물의 제조법 |
US10/476,211 US7015291B2 (en) | 2002-04-01 | 2003-03-14 | Process for the production of high-molecular compounds for photoresist |
US11/335,589 US20060116494A1 (en) | 2002-04-01 | 2006-01-20 | Process for producing photoresist polymeric compounds |
US11/335,580 US7662897B2 (en) | 2002-04-01 | 2006-01-20 | Process for producing photoresist polymeric compounds |
US12/146,594 US7655743B2 (en) | 2002-04-01 | 2008-06-26 | Process for producing photoresist polymeric compounds |
US12/645,842 US7816471B2 (en) | 2002-04-01 | 2009-12-23 | Process for producing photoresist polymeric compounds |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
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JP2002-98840 | 2002-04-01 | ||
JP2002098841 | 2002-04-01 | ||
JP2002-98841 | 2002-04-01 | ||
JP2002098840 | 2002-04-01 |
Related Child Applications (4)
Application Number | Title | Priority Date | Filing Date |
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US10/476,211 A-371-Of-International US7015291B2 (en) | 2002-04-01 | 2003-03-14 | Process for the production of high-molecular compounds for photoresist |
US11/335,580 Division US7662897B2 (en) | 2002-04-01 | 2006-01-20 | Process for producing photoresist polymeric compounds |
US11/335,589 Division US20060116494A1 (en) | 2002-04-01 | 2006-01-20 | Process for producing photoresist polymeric compounds |
US11/335,589 Continuation US20060116494A1 (en) | 2002-04-01 | 2006-01-20 | Process for producing photoresist polymeric compounds |
Publications (1)
Publication Number | Publication Date |
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WO2003082933A1 true WO2003082933A1 (fr) | 2003-10-09 |
Family
ID=28677605
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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PCT/JP2003/003058 WO2003082933A1 (fr) | 2002-04-01 | 2003-03-14 | Procede de production de composes a poids moleculaire eleve pour resine photosensible |
Country Status (7)
Country | Link |
---|---|
US (5) | US7015291B2 (ja) |
EP (1) | EP1491560B1 (ja) |
JP (1) | JP4286151B2 (ja) |
KR (2) | KR100979871B1 (ja) |
DE (1) | DE60317651T2 (ja) |
TW (1) | TW200307176A (ja) |
WO (1) | WO2003082933A1 (ja) |
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- 2003-03-14 EP EP03708604A patent/EP1491560B1/en not_active Expired - Lifetime
- 2003-03-14 KR KR1020047015490A patent/KR100955989B1/ko active IP Right Grant
- 2003-03-14 US US10/476,211 patent/US7015291B2/en not_active Expired - Lifetime
- 2003-03-14 JP JP2003580393A patent/JP4286151B2/ja not_active Expired - Lifetime
- 2003-03-14 DE DE60317651T patent/DE60317651T2/de not_active Expired - Lifetime
- 2003-03-20 TW TW092106142A patent/TW200307176A/zh unknown
-
2006
- 2006-01-20 US US11/335,589 patent/US20060116494A1/en not_active Abandoned
- 2006-01-20 US US11/335,580 patent/US7662897B2/en active Active
-
2008
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KR100955989B1 (ko) | 2010-05-04 |
JP4286151B2 (ja) | 2009-06-24 |
DE60317651T2 (de) | 2008-03-06 |
TW200307176A (en) | 2003-12-01 |
KR100979871B1 (ko) | 2010-09-02 |
US7655743B2 (en) | 2010-02-02 |
JPWO2003082933A1 (ja) | 2005-08-04 |
EP1491560B1 (en) | 2007-11-21 |
EP1491560A4 (en) | 2005-06-01 |
DE60317651D1 (de) | 2008-01-03 |
US20080268377A1 (en) | 2008-10-30 |
KR20040097240A (ko) | 2004-11-17 |
EP1491560A1 (en) | 2004-12-29 |
US20060116493A1 (en) | 2006-06-01 |
US7662897B2 (en) | 2010-02-16 |
US20050100815A1 (en) | 2005-05-12 |
US7015291B2 (en) | 2006-03-21 |
US20060116494A1 (en) | 2006-06-01 |
US20100099836A1 (en) | 2010-04-22 |
KR20080009220A (ko) | 2008-01-25 |
US7816471B2 (en) | 2010-10-19 |
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