US20160313641A1 - Photosensitive polyimide compositions - Google Patents

Photosensitive polyimide compositions Download PDF

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Publication number
US20160313641A1
US20160313641A1 US15/132,472 US201615132472A US2016313641A1 US 20160313641 A1 US20160313641 A1 US 20160313641A1 US 201615132472 A US201615132472 A US 201615132472A US 2016313641 A1 US2016313641 A1 US 2016313641A1
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United States
Prior art keywords
polymeric layer
dry film
photosensitive polymeric
film structure
meth
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
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US15/132,472
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English (en)
Inventor
Binod B. De
Sanjay Malik
Raj Sakamuri
William A. Reinerth
Ognian N. Dimov
Ahmad A. Naiini
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Electronic Materials USA Inc
Original Assignee
Fujifilm Electronic Materials USA Inc
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Application filed by Fujifilm Electronic Materials USA Inc filed Critical Fujifilm Electronic Materials USA Inc
Priority to US15/132,472 priority Critical patent/US20160313641A1/en
Assigned to FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. reassignment FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: DIMOV, OGNIAN N., MALIK, SANJAY, SAKAMURI, RAJ, DE, BINOD B., NAIINI, AHMAD A., REINERTH, WILLIAM A.
Publication of US20160313641A1 publication Critical patent/US20160313641A1/en
Priority to US16/822,072 priority patent/US11899364B2/en
Abandoned legal-status Critical Current

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    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
    • G03F7/0387—Polyamides or polyimides
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C67/00—Shaping techniques not covered by groups B29C39/00 - B29C65/00, B29C70/00 or B29C73/00
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
    • C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
    • C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • C08G73/1003—Preparatory processes
    • C08G73/1007—Preparatory processes from tetracarboxylic acids or derivatives and diamines
    • C08G73/101—Preparatory processes from tetracarboxylic acids or derivatives and diamines containing chain terminating or branching agents
    • C08G73/1014—Preparatory processes from tetracarboxylic acids or derivatives and diamines containing chain terminating or branching agents in the form of (mono)anhydrid
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
    • C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
    • C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • C08G73/1039—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors comprising halogen-containing substituents
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
    • C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
    • C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • C08G73/1042—Copolyimides derived from at least two different tetracarboxylic compounds or two different diamino compounds
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
    • C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
    • C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • C08G73/1046—Polyimides containing oxygen in the form of ether bonds in the main chain
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
    • C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
    • C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • C08G73/1067—Wholly aromatic polyimides, i.e. having both tetracarboxylic and diamino moieties aromatically bound
    • C—CHEMISTRY; METALLURGY
    • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
    • C09D179/00—Coating compositions based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing nitrogen, with or without oxygen, or carbon only, not provided for in groups C09D161/00 - C09D177/00
    • C09D179/04—Polycondensates having nitrogen-containing heterocyclic rings in the main chain; Polyhydrazides; Polyamide acids or similar polyimide precursors
    • C09D179/08—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03C—PHOTOSENSITIVE MATERIALS FOR PHOTOGRAPHIC PURPOSES; PHOTOGRAPHIC PROCESSES, e.g. CINE, X-RAY, COLOUR, STEREO-PHOTOGRAPHIC PROCESSES; AUXILIARY PROCESSES IN PHOTOGRAPHY
    • G03C1/00—Photosensitive materials
    • G03C1/76—Photosensitive materials characterised by the base or auxiliary layers
    • G03C1/805—Photosensitive materials characterised by the base or auxiliary layers characterised by stripping layers or stripping means
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • G03F7/032—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders
    • G03F7/037—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders the binders being polyamides or polyimides
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
    • G03F7/11—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers having cover layers or intermediate layers, e.g. subbing layers
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/16—Coating processes; Apparatus therefor
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20—Exposure; Apparatus therefor
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26—Processing photosensitive materials; Apparatus therefor
    • G03F7/30—Imagewise removal using liquid means
    • G03F7/32—Liquid compositions therefor, e.g. developers
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26—Processing photosensitive materials; Apparatus therefor
    • G03F7/30—Imagewise removal using liquid means
    • G03F7/32—Liquid compositions therefor, e.g. developers
    • G03F7/325—Non-aqueous compositions
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26—Processing photosensitive materials; Apparatus therefor
    • G03F7/34—Imagewise removal by selective transfer, e.g. peeling away
    • G03F7/343—Lamination or delamination methods or apparatus for photolitographic photosensitive material
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26—Processing photosensitive materials; Apparatus therefor
    • G03F7/40—Treatment after imagewise removal, e.g. baking
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104—Forming layers
    • H01L21/02107—Forming insulating materials on a substrate
    • H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
    • H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
    • H01L21/02118—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer carbon based polymeric organic or inorganic material, e.g. polyimides, poly cyclobutene or PVC
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
    • H01L21/0273—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3105—After-treatment
    • H01L21/311—Etching the insulating layers by chemical or physical means

Definitions

  • Circular substrates such as silicon wafers, permit coating materials like photoresists and dielectric materials to be applied by spin coating.
  • spin coating has been the preferred method for applying photosensitive materials to semiconductor substrates.
  • the semiconductor industry has begun to explore methods for applying photosensitive coatings to large, non-circular panel substrates. These substrates, which may be flexible or rigid, present special challenges and require alternative methods for processing and applying semiconductor coatings.
  • One preferred method for applying coatings to these advanced substrates is the use of a dry, polymeric film which can be applied to virtually any type of substrate. Once applied, the dry film is then laminated so that the semiconductor coating is affixed to the substrate. In the case of a photoimageable dry film resist material, after this lamination step the resist material is patternwise exposed to radiation and developed.
  • PIDs photoimageable dielectrics
  • Next generation semiconductor packaging requires PID materials that possess a combination of excellent lithographic resolution, superior thermal and mechanical properties as well as chemical stability. Resolution of these PID materials should allow the printing of fine features ( ⁇ 3 microns) with high aspect ratios (>2:1).
  • Current PID materials possess numerous deficiencies making them unable to meet the requirements of next generation semiconductor packaging applications.
  • Two key obstacles that current materials have yet to overcome are (1) patterning of high resolution ( ⁇ 3 micron) features and (2) production of thin ( ⁇ 5 micron) PID dry films. This necessitates the development of advanced dry film PID materials to meet these needs.
  • the dry film PID materials of this disclosure address the needs of advanced packaging applications by overcoming the limitations of current materials.
  • this disclosure features a dry film structure that includes a carrier substrate, and a photosensitive polymeric layer supported by the carrier substrate, the photosensitive polymeric layer including at least one fully imidized polyimide polymer; wherein the photosensitive polymeric layer has a film thickness of at most about 5 microns (e.g., at most about 4 microns or at most about 3 microns).
  • the photosensitive polymeric layer further includes at least one reactive functional compound (RFC) and at least one photoinitiator.
  • the at least one fully imidized polyimide polymer is prepared from at least one diamine, the at least one diamine including a compound selected from the group consisting of a diamine of Structure (Ia) and a diamine of Structure (Ib),
  • each of R 1 , R 2 , R 3 , R 4 , R 5 , R 11 , R 12 , R 13 , and R 14 independently, is H, a substituted or unsubstituted C 1 -C 6 linear or branched alkyl group, or a C 5 -C 7 cycloalkyl group.
  • the at least one diamine is selected from the group consisting of 1-(4-aminophenyl)-1,3,3-trimethylindan-5-amine, 1-(4-aminophenyl)-1,3,3-trimethyl-2H-inden-5-amine, 1-(4-aminophenyl)-1,3,3-trimethyl-indan-5-amine, [1-(4-aminophenyl)-1,3,3-trimethyl-indan-5-yl]amine, and 1-(4-aminophenyl)-2,3-dihydro-1,3,3-trimethyl-1H-inden-5-amine), 5-amino-6-methyl-1-(3′-amino-4′-methylphenyl)-1,3,3-trimethylindan, 4-amino-6-methyl-1-(3′-amino-4′-methylphenyl)-1,3,3-trimethylindan, 5,7-diamino-1,1-dimethylindan, 4,7-diamino
  • the at least one diamine includes (a) a compound selected from the group consisting of a diamine of Structure (Ia) and a diamine of Structure (Ib), and (b) at least one diamine of Structure (II),
  • R 15 , R 16 , R 17 and R 18 independently, can be H, a substituted or unsubstituted C 1 -C 6 linear or branched alkyl group, or C 5 -C 7 cycloalkyl group, provided that at least two of R 15 , R 16 , R 17 and R 18 are not hydrogen.
  • the at least one diamine of Structure (II) is selected from the group consisting of 2,3,5,6-tetramethylphenylenediamine, 2,4-diamino-1,3,5-trimethylbenzene, 2,4-diamino-1,3,5-triethylbenzene, 2,4-diamino-3,5-dimethyl-1-ethylbenzene, 2,4-diamino-1,5-dimethyl-3-ethylbenzene 2,4-diamino-1,3,5-triisopropylbenzene, 2,3,5,6-tetraisopropyl-phenylenediamine and 2,4-diamino-1,3,5,6-tetramethylbenzene.
  • the at least one fully imidized polyimide polymer is prepared from at least one dianhydride, the at least one dianhydride including a compound selected from the group consisting of 3,3′,4,4′-benzophenone tetracarboxylic dianhydride, 3,3′,4,4′-diphenylsulfone tetracarboxylic dianhydride, 3,3′,4,4′-diphenyl ether tetracarboxylic dianhydride, 2,3,3′,4′-diphenyl ether tetracarboxylic dianhydride, and 2,2-[bis(3, 4-dicarboxyphenyl)] hexafluoropropane dianhydride.
  • the at least one dianhydride including a compound selected from the group consisting of 3,3′,4,4′-benzophenone tetracarboxylic dianhydride, 3,3′,4,4′-diphenylsulfone tetracarboxylic
  • the at least one fully imidized polyimide polymer is prepared from at least one dianhydride, the at least one dianhydride including a compound selected from the group consisting of:
  • the reactive functional compound includes at least one functional group selected from the group consisting of a vinyl group, an allyl group, a vinyl ether group, a propenyl ether group, a (meth)acryloyl group, an a SiH group, and a thiol group.
  • the reactive functional compounds is selected from the group consisting of 1,6-hexanediol di(meth)acrylate, tetraethyleneglycol di(meth)acrylate, divinylbenzene, ethoxylated bisphenol-A-di(meth)acrylate, diethylene glycol bis(allyl carbonate), trimethylolpropane tri(meth)acrylate, ditrimethylolpropane tetra(meth)acrylate, pentaerythritol tri(meth)acrylate, pentaerythritol tetra(meth)acrylate, dipentaerythritol penta-/hexa-(meth)acrylate, isocyanurate tri(meth)acrylate, bis(2-hydroxyethyl)-isocyanurate di(meth)acrylate, 1,3-butanediol tri(meth)acrylate, 1,4-butanediol tri(meth)
  • the dry film structure can further include a protective layer, in which the first polymeric layer is between the carrier substrate and the protective layer.
  • the dry film structure can further include a second polymeric layer, in which the second polymeric layer is between the photosensitive polymeric layer and the carrier substrate or the second polymeric layer is between the photosensitive polymeric layer and the optional protective layer.
  • the second polymeric layer can include a water soluble polymer.
  • the photosensitive polymeric layer is capable of forming a patterned layer containing at least one element having a feature size of at most about 3 microns after the photosensitive polymeric layer is exposed to actinic radiation and developed.
  • this disclosure features methods for preparation of a dry film structure.
  • the method includes: (a) coating a carrier substrate with a photosensitive polymeric composition (e.g., a negative tone photosensitive polymeric composition) to form a coated composition, (b) drying the coated composition to form a photosensitive polymeric layer, and (c) applying a protective layer to the photosensitive polymeric layer to form a dry film structure.
  • the photosensitive polymeric layer has a film thickness of at most about 5 microns.
  • the photosensitive polymeric composition contains at least one polyimide polymer described in this disclosure, at least one reactive functional compound (RFC), at least one initiator, and optionally at least one solvent.
  • this disclosure features a process of forming a laminate.
  • the process can include applying the dry film structure described herein onto an electronic substrate to form a laminate.
  • the process can further include removing the protective layer from the dry film structure before applying the dry film structure.
  • the process can further include converting the photosensitive polymeric layer into a patterned layer.
  • the conversion can include exposing the photosensitive polymeric layer in the laminate to actinic radiation.
  • the conversion can further include removing the carrier substrate before or after exposing the photosensitive polymeric layer.
  • the conversion can further include developing the exposed photosensitive polymeric layer to form a patterned layer having a relief pattern.
  • the developing can include removing unexposed portions in the polymeric layer by using a developer to form a patterned layer having a relief pattern and rinsing the relief pattern on the substrate with a solvent or a mixture of solvents.
  • this disclosure features a process of forming a patterned film (e.g., a laminate containing a patterned film).
  • a process can be performed, for example, by: (a) providing a dry film structure including: a carrier substrate; a protective layer; and a photosensitive polymeric layer between the carrier substrate and the protective layer; in which the photosensitive polymeric layer has a film thickness of at most about 5 microns, (b) removing the protective layer from the dry film structure; (c) applying the structure obtained in step (b) onto an electronic substrate to form a laminate, the laminate containing the photosensitive polymeric layer between the electronic substrate and the carrier substrate; and (d) converting the photosensitive polymeric layer into a patterned layer; in which the patterned layer has a thickness of at most about 5 microns (e.g., at most about 4 microns or at most about 3 microns) and includes at least one element having a feature size of at most about 3 microns.
  • the photosensitive polymeric layer include
  • this disclosure features a three dimensional object including at least one pattern film formed by a process described herein.
  • the three dimensional objects can include pattern films in at least two stacks (e.g., at least three stacks).
  • the disclosure features a semiconductor device that includes the three dimensional object described herein.
  • the semiconductor device is an integrated circuit, a light emitting diode, a solar cell, or a transistor.
  • lamination is a process for affixing or adhering the polymeric layer of a dry film structure to a surface of a substrate (e.g., an electronic substrate).
  • Pre-lamination is treatment of the substrate prior to lamination.
  • Pre-lamination includes, but is not limited to, rinsing the substrate with solvent or additive and drying before lamination.
  • the phrase “unexposed film” or “a film unexposed to actinic radiation” refers to a film unexposed to actinic radiation under lithographic conditions used to form patterns.
  • the term “fully imidized” means the polyimide polymers of this disclosure are at least about 90% (e.g., at least about 95%, at least about 98%, at least about 99%, or about 100%) imidized. Imidization to form a polyimide can be confirmed by observation of characteristic absorptions in the infrared spectrum from 1770 and 1700 cm ⁇ 1 attributable to the imide ring structure.
  • the dry film structures can include a carrier substrate, and a photosensitive polymeric layer supported by the carrier substrate.
  • the photosensitive polymeric layer can be prepared from a photosensitive polymeric composition (e.g., a negative tone photosensitive polymeric composition) by coating the composition on a carrier substrate.
  • the photosensitive polymeric layer or photosensitive polymeric composition can contain the following components: (A) at least one polyimide polymer (e.g., at least one fully imidized polyimide polymer), (B) at least one reactive functional compound (RFC); and (C) at least one photoinitiator.
  • the dry film structure can further include a protective layer such that the photosensitive polymeric layer is between the carrier substrate and the protective layer.
  • the photosensitive polymeric layer can have a film thickness of at most 5 microns and a resolution (e.g., the feature size of an element formed in the photosensitive polymeric layer) of at most 3 microns.
  • the at least one fully imidized polyimide (i.e., component (A)) of the photosensitive polymeric composition or the polymeric layer of the dry film structure is prepared by reaction of at least one diamine as a monomer with at least one dianhydride (e.g., at least one tetracarboxylic acid dianhydride) as another monomer.
  • at least one diamine as a monomer
  • at least one dianhydride e.g., at least one tetracarboxylic acid dianhydride
  • diamines include, but are not limited to, 1-(4-aminophenyl)-1,3,3-trimethylindan-5-amine (alternative names including 4,4′-[1,4-phenylene-bis(1-methylethylidene)]bisaniline), 1-(4-aminophenyl)-1,3,3-trimethyl-2H-inden-5-amine, 1-(4-aminophenyl)-1,3,3-trimethyl-indan-5-amine, [1-(4-aminophenyl)-1,3,3-trimethyl-indan-5-yl]amine, and 1-(4-aminophenyl)-2,3-dihydro-1,3,3-trimethyl-1H-inden-5-amine), 5-amino-6-methyl-1-(3′-amino-4′-methylphenyl)-1,3,3-trimethylindan, 4-amino-6-methyl-1-(3′-amino-4′-methylphenyl)-1,3,3-trimethylindan
  • the at least one diamine includes a compound selected from the group consisting of a diamine of Structure (Ia) and a diamine of Structure (Ib):
  • each of R 1 , R 2 , R 3 , R 4 , R 5 , R 11 , R 12 , R 13 , and R 14 independently, is H, a substituted or unsubstituted C 1 -C 6 linear or branched alkyl group, or C 5 -C 7 cycloalkyl group.
  • Examples of the substituted or unsubstituted C 1 -C 6 linear or branched alkyl groups in R 1 , R 2 , R 3 , R 4 , R 5 , R 11 , R 12 , R 13 , and R 14 include, but are not limited to, methyl, ethyl, propyl, isopropyl, butyl, isobutyl, t-butyl, amyl, hexyl, and 2-methylhexyl.
  • Examples of the C 5 -C 7 cycloalkyl group in R 1 , R 2 , R 3 , R 4 , R 5 , R 11 , R 12 , R 13 , and R 14 include, but are not limited to, cyclopentyl, cyclohexyl, and cycloheptyl.
  • diamines of Structure (Ia) or (Ib) include, but are not limited to, 1-(4-aminophenyl)-1,3,3-trimethylindan-5-amine (alternative names including 4,4′-[1,4-phenylene-bis(1-methylethylidene)] bisaniline, 1-(4-aminophenyl)-1,3,3-trimethyl-2H-inden-5-amine, 1-(4-aminophenyl)-1, 3,3-trimethyl-indan-5-amine, [1-(4-aminophenyl)-1,3,3-trimethyl-indan-5-yl]amine, and 1-(4-aminophenyl)-2,3-dihydro-1,3,3-trimethyl-1H-inden-5-amine), 5-amino-6-methyl-1-(3′-amino-4′-methylphenyl)-1,3,3-trimethylindan, 4-amino-6-methyl-1-(3′-amino-4′-methylpheny
  • the at least one diamine includes (a) a compound selected from the group consisting of a diamine of Structure (Ia) and a diamine of Structure (Ib), and (b) at least one diamine of Structure (II),
  • each of R 15 , R 16 , R 17 and R 18 can be H, a substituted or unsubstituted C 1 -C 6 linear or branched alkyl group, or C 5 -C 7 cycloalkyl group, provided that at least two of R 15 , R 16 , R 17 and R 18 are not hydrogen.
  • Examples of the substituted or unsubstituted C 1 -C 6 linear or branched alkyl groups in R 15 , R 16 , R 17 and R 18 include, but are not limited to, methyl, ethyl, propyl, isopropyl, butyl, isobutyl, t-butyl, amyl, hexyl, and 2-methylhexyl.
  • Examples of the C 5 -C 7 cycloalkyl group in R 15 , R 18 , R 17 and R 18 include, but are not limited to, cyclopentyl, cyclohexyl, and cycloheptyl.
  • Examples of diamines of Structure (II) include, but are not limited to, 2,3,5,6-tetramethylphenylenediamine, 1,4-diamino-1,3,5-trimethylbenzene, 2,4-diamino-1,3,5-triethylbenzene, 2,4-diamino-3,5-dimethyl-1-ethylbenzene, 2,4-diamino-1,5-dimethyl-3-ethylbenzene, 2,4-diamino-1,3,5-triisopropylbenzene, 2,3,5,6-tetraisopropyl-phenylenediamine and 2,4-diamino-1,3,5,6-tetramethylbenzene.
  • the molar percentage of the diamines of Structures (Ia) and (Ib) in the total amount of diamines is at least about 10% (e.g., at least about 20%, at least about 25%, at least about 30%, at least about 35%, at least about 40%, at least about 45%, or at least about 50%) to at most about 90% (e.g., at most about 85%, at most about 80%, at most about 75%, at most about 70%, at most about 65%, or at most about 60%).
  • the molar percentage of the diamines of Structure (II) in the total amount of diamines is at least about 10% (e.g., at least about 20%, at least about 25%, at least about 30%, at least about 35%, at least about 40%, at least about 45%, or at least about 50%) to at most about 90% (e.g., at most about 85%, at most about 80%, at most about 75%, at most about 70%, at most about 65%, or at most about 60%).
  • the diamines can be reacted with at least one dianhydride, such as at least one tetracarboxylic acid dianhydride.
  • the tetracarboxylic acid dianhydrides have the Structure (V) with a moiety Y.
  • the moiety Y is a tetravalent organic group, such as a group selected from the group consisting of:
  • divalent linking groups L 1 include, but are not limited to, those shown below of which each of n3, n4 and n5, independently, has the same meaning defined above:
  • Suitable examples of Y include, but are not limited to, the following moieties:
  • tetracarboxylic acid anhydrides include, but are not limited to, 1-(3′,4′-dicarboxyphenyl)-1,3,3-trimethylindan-5,6-dicarboxylic acid dianhydride, 1-(3′,4′-dicarboxyphenyl)-1,3,3-trimethylindan-6,7-dicarboxylic acid dianhydride, 1-(3′,4′-dicarboxyphenyl)-3-methylindan-5,6-dicarboxylic acid dianhydride, and 1-(3′,4′-dicarboxyphenyl)-3-methylindan-6,7-dicarboxylic acid anhydride, pyromellitic dianhydride, benzene-1,2,3,4-tetracarboxylic dianhydride, 2,3,5,6-naphthalenetetracarboxylic acid dianhydride, 2,3,6,7-naphthalenetetracarboxylic acid dianhydride, 1,4,5,
  • Examples of preferred tetracarboxylic acid dianhydride monomers include, but are not limited to, 1-(3′,4′-dicarboxyphenyl)-1,3,3-trimethylindan-5,6-dicarboxylic acid dianhydride, 1-(3′,4′-dicarboxyphenyl)-1,3,3-trimethylindan-6,7-dicarboxylic acid dianhydride, 1-(3′,4′-dicarboxyphenyl)-3-methylindan-5,6-dicarboxylic acid dianhydride, and 1-(3′,4′-dicarboxyphenyl)-3-methylindan-6,7-dicarboxylic acid anhydride, pyrazine-2,3,5,6-tetracarboxylic dianhydride, thiophene-2,3,4,5-tetracarboxylic dianhydride, 2,3,5,6-pyridinetetracarboxylic acid dianhydride, norbornane-2,3,5,6-t
  • More preferred tetracarboxylic acid dianhydride monomers include 3,3′,4,4′-benzophenone tetracarboxylic dianhydride, 3,3′,4,4′-diphenylsulfone tetracarboxylic dianhydride, 3,3′,4,4′-diphenyl ether tetracarboxylic dianhydride, 2,3,3′,4′-diphenyl ether tetracarboxylic dianhydride, and 2,2-[bis(3,4-dicarboxyphenyl)] hexafluoropropane dianhydride.
  • Any suitable combination of tetracarboxylic acid dianhydride monomers described above in any suitable ratio can be used to form the polyimide polymer describe herein.
  • examples of tetracarboxylic acid dianhydride monomers include:
  • the at least one diamine is selected from the group consisting of a diamine of Structure (Ia) and a diamine of Structure (Ib), and the tetracarboxylic acid dianhydride is selected from the group consisting of pyrazine-2,3,5,6-tetracarboxylic dianhydride, thiophene-2,3,4,5-tetracarboxylic dianhydride, 2,3,5,6-pyridinetetracarboxylic acid dianhydride, norbornane-2,3,5,6-tetracarboxylic acid dianhydride, bicyclo[2.2.2]oct-7-ene-3,4,8,9-tetracarboxylic acid dianhydride, tetracyclo[4.4.1.0 2,5 .0 7,10 ]undecane-1,2,3,4-tetracarboxylic acid dianhydride, 3,3′,4,4′-benzophenone tetracarboxylic dianhydride, 3,3′,
  • the at least one diamine is selected from the group consisting of a diamine of Structure (Ia) and a diamine of Structure (Ib), and the tetracarboxylic acid dianhydride is selected from a group consisting of 3,3′,4,4′-benzophenone tetracarboxylic dianhydride, 3,3′,4,4′-diphenylsulfone tetracarboxylic dianhydride, 3,3′,4,4′-diphenyl ether tetracarboxylic dianhydride, 2,3,3′,4′-diphenyl ether tetracarboxylic dianhydride, and 2,2-[bis(3,4-dicarboxyphenyl)] hexafluoropropane dianhydride.
  • the at least one diamine is reacted with at least one tetracarboxylic acid dianhydride to yield a polyamic acid of Structure (VII), where a is an integer ranging from at least 2 (e.g., at least 3, at least 4, at least 5, at least 6, at least 8, at least 10, or at least 15) to at most 500 (e.g., at most 450, at most 400, at most 350, at most 300, at most 250, at most 200, at most 150, at most 100, or at most 50), X is the nucleus of the precursor diamine, and Y is the nucleus of the precursor dianhydride and is defined above.
  • VII polyamic acid of Structure
  • nucleus refers to the portion of the molecule between the amine functional groups.
  • nucleus refers to the portion of the molecule between the anhydride functional groups.
  • the polyamic acid of Structure (VII) can be synthesized by numerous synthetic procedures or variations of those procedures known to those skilled in the art.
  • a polyamic acid of Structure (VII) can be formed through a condensation polymerization reaction between one or more diamines and one or more tetracarboxylic acid dianhydrides.
  • one can bring one or more diamines in contact with one or more tetracarboxylic acid dianhydrides in the presence of a solvent suitable to dissolve the monomers and, preferably, the resultant polyamic acid.
  • the diamine component and tetracarboxylic acid dianhydride component are charged into a reaction vessel at the same time or by charging one of the components in the form of a solid or solution into a solution of the other component (complete dissolution of all materials might not occur).
  • charging both components at the same time can be advantageous in view of the productivity because the time required for charging is shortened.
  • the condensation polymerization reaction between the diamine component and tetracarboxylic acid dianhydride component can be carried out at about 15° C. to about 80° C. for about 1 to about 48 hours.
  • Suitable polymerization solvents useful in the present disclosure include, but are not limited to, N-methyl-2-pyrrolidone, N,N-dimethylformamide, dimethylsulfoxide, gamma -butyrolactone, N,N-dimethylacetamide, tetramethylene sulfone, p-chlorophenol, m-cresol, diethyleneglycol methyl ether, methyl-3-methoxyproprionate, ethyl-3-ethoxypropionate, cyclohexanone, propylene glycol monomethyl ether acetate, and 2-chloro-4-hydroxytoluene. These solvents can be used singly or in combination of two or more.
  • N-methyl-2-pyrrolidone preferred are N-methyl-2-pyrrolidone, gamma-butyrolactone and N,N-dimethylacetamide, with N-methyl-2-pyrrolidone being more preferred.
  • a poor solvent for the polyimide can be used in combination with these solvents in such an amount to not allow the polyamic acid to precipitate.
  • examples of such a poor solvent include hexane, heptane, benzene, toluene, xylene, chlorobenzene and o-dichlorobenzene.
  • the amount of the poor solvent to be used is preferably 50 percent by weight or less (inclusive of zero) based on the total amount of the solvents.
  • the polyamic acid thus produced can be isolated by precipitation into a non-solvent or a poor solvent and collected by filtration, followed by further synthetic processes for conversion to a polyimide. In some embodiments, such isolation of the polyamic acid is not required.
  • the molar ratio of diamine component(s) to tetracarboxylic acid dianhydride component(s) can be greater than 1.00.
  • the resulting polymer is an amino-terminated polyamic acid (e.g., a polyamic acid of Structure (VIIa)).
  • the molar ratio of diamine component(s) to tetracarboxylic acid dianhydride component(s) can range from 1.01 to 1.40 and can have a direct effect on final molecular weight of polyamic acid and polyimide prepared by imidization of the polyamic acid.
  • the molar ratio is selected such that the polyamic acid at the end of reaction has a weight average molecular weight (Mw) of at least about 10,000 Daltons (e.g. at least about 20,000 Daltons, at least about 30,000 Daltons, at least about 40,000 Daltons, or at least about 50,000 Daltons) and/or at most about 90,000 Daltons (e.g. at most about 80,000 Daltons, at most about 70,000 Daltons, at most about 60,000 Daltons).
  • Mw weight average molecular weight
  • anhydride-terminated polyamic acid e.g., a polyamic acid of Structure (VIIb)
  • VIIb a polyamic acid of Structure
  • the molar ratio of tetracarboxylic acid dianhydride component(s) to diamine component(s) can range from 0.8 to 0.99 and can have a direct effect on final molecular weight of polyamic acid and polyimide prepared by imidization of the polyamic acid.
  • the molar ratio is selected such that the polyamic acid at the end of the reaction has a weight average molecular weight (Mw) of at least about 10,000 Daltons (e.g. at least about 20,000 Daltons, at least about 30,000 Daltons, at least about 40,000 Daltons, or at least about 50,000 Daltons) and/or at most about 90,000 Daltons (e.g. at most about 80,000 Daltons, at most about 70,000 Daltons, at most about 60,000 Daltons).
  • Mw weight average molecular weight
  • polyamic acids e.g., those of Structures (VIIa) and (VIIb)
  • one pathway is to imidize polyamic acids of Structures (VIIa) and (VIIb) using chemical or thermal imidization techniques to form polyimides of Structure (VIIIa) or (VIIIb).
  • the polyimide described herein can be end-capped by reaction of the terminal group (e.g., the terminal NH 2 in Structure (VIIa) or the terminal anhydride in Structure (VIIIb)) with a compound having a functional group which is reactive with the terminal group and then imidized.
  • the end-capping reaction of the terminal group in Structure (VIIa) or (VIIIb) can be done after the chemical or thermal imidization.
  • Another synthetic pathway is to include in the polymerization reaction a monoamine or monoanhydride.
  • the end-capping reaction is performed together with the polymerization reaction.
  • the thermal imidization can, for example, be performed in the solid state at a temperature ranging from about 100° C. to about 400° C. (e.g., from about 200° C. to about 300° C., or about 250° C.). In another embodiment, the thermal imidization can be performed in a solution at a temperature ranging from about 100° C. to about 250° C. When the heat treatment is performed within this temperature range, the imidization reactivity can be controlled within a desired range, minimizing non-reacted polyamic acid. In some embodiments, the thermal imidization in this manner is best done before reaction of the polymer terminal groups.
  • the polyamic acid can also be dehydrated in an imidization reaction using an azeotroping thermal procedure.
  • An example of this reaction is described in U.S. Pat. No. 5,478,915.
  • toluene is added, and the solution is azeotropically refluxed at 155° C., collecting the water in a Dean-Stark trap.
  • the polyimide of Structure (VIIa) or (VIIIb) is produced by chemical imidization.
  • a chemical imidizing agent e.g., a dehydrating agent
  • This chemical imidization agent can catalyze the ring-closing dehydration process of the polyamic acid groups to form imide functionalities on the polymer backbone. If the polyamic acid is isolated after the synthesis, it can be re-dissolved in a compatible solvent. Normally, when a chemical imidization is employed, the imidization reaction takes place without isolation of the polyamic acid.
  • a suitable dehydrating agent can be used alone or in combination with a non-nucleophilic base to imidize the polyamic acid.
  • suitable dehydrating agents include, but are not limited to, trifluoromethane sulfonic acid, methanesulfonic acid, p-toluenesulfonic acid, ethanesulfonic acid, butanesulfonic acid, perfluorobutanesulfonic acid, acetic anhydride, propionic anhydride, and butyric anhydride.
  • the non-nucleophilic base employed can be the same as or different from a non-nucleophilic base employed in the end-capping reaction.
  • non-nucleophilic bases include, but are not limited to, pyridine, triethylamine, tripropylamine, tributylamine, dicyclohexylmethylamine, 2-methylpyridine, 2,6-lutidine, 3,5-lutidine, 4-picoline, 4-dimethylaminopyridine (DMAP) and the like.
  • the chemical imidization process is carried out with a suitable dehydrating agent and a non-nucleophilic base at about 60° C. to about 130° C. for about 6 hours to about 48 hours.
  • the dehydrating agent and non-nucleophilic base can be employed in equimolar concentrations.
  • the molar ratio of dehydrating agent to non-nucleophilic base is from about 1.1 to about 10 (e.g., from about 1.25 to 5, or from about 1.5 to about 3.0).
  • about 90 mole % to 200 mole % of a dehydrating agent based on the total amount of the polyamic acid present in the mixture is used to complete the imidization reaction.
  • 100 mole % to 160 mole % of a dehydrating agent is used to complete the imidization process.
  • the terminal NH 2 groups of the polymers of Structures (VIIa) and (VIIa) can be optionally end-capped by reaction with an end-capping compound having a functional group which is reactive to an amine.
  • end-capping compounds include, but are not limited to, acid chloride compounds, dicarboxylic acid anhydrides, epoxide compounds, and isocyanate compounds.
  • end-capping compounds can be those containing at least one second functional group selected from a substituted or unsubstituted alkenyl group (e.g., a C 2 -C 6 linear alkenyl group) and a substituted or unsubstituted alkynyl group (e.g., a C 2 -C 6 linear alkynyl group).
  • substituted alkenyl groups include, but are not limited to, acrylates, methacrylates, stilbenes, and vinyl ethers.
  • alkynyl groups examples include, but are not limited to, alkyl (e.g., Me or Et), aryl (e.g., phenyl or substituted phenyl), alkanoyl (e.g., acetyl) and aroyl (e.g., benzoyl).
  • alkyl e.g., Me or Et
  • aryl e.g., phenyl or substituted phenyl
  • alkanoyl e.g., acetyl
  • aroyl e.g., benzoyl
  • end-capping compounds having a functional group reactive to the terminal NH 2 groups that also have at least one second functional group selected from a substituted or unsubstituted alkenyl group and a substituted or unsubstituted alkynyl group include, but are not limited to, the following compounds:
  • the monoanhydride suitable for preparing the end capped polyamic acids or polyimides contains a “masked” maleic anhydride group, which after conversion of the anhydride group to an imide group, becomes a “masked” maleimide group.
  • This terminal imide group is able to undergo a cycloreversion reaction (e.g., a retro-Diels-Alder reaction) to unmask the maleimide group.
  • a polyimide polymer containing maleimide groups as end-cap groups can react with a reactive functional compound (RFC) (e.g., a compound containing at least two thiol groups) to form a cross-linked polyimide.
  • RRC reactive functional compound
  • Examples of monoanhydrides that can undergo a cycloreversion reaction include, but are not limited to, compounds described by Structure IX:
  • G is —O—, —(NR 25 )—, —[C(R 26 ) ⁇ C(R 27 )]—, or —[C ⁇ C(R 28 ) 2 ]—, in which each of R 25 , R 26 , R 27 , and R 28 , independently, is H, a substituted or unsubstituted C 1 -C 12 linear, branched, monocyclic or polycyclic alkyl group, or a substituted or unsubstituted phenyl group, and each of R 21 , R 22 , R 23 and R 24 , independently, is H, a substituted or unsubstituted C 1 -C 12 linear, branched, monocyclic or polycyclic alkyl group, a substituted or unsubstituted phenyl group, OR 29 , CH 2 OR 30 , CH 2 OC( ⁇ O)R 31 , CH 2 C( ⁇ O)OR 32 , CH 2 NHR 33 , CH 2 NHC( ⁇ O)
  • Examples of specific suitable monoanhydrides of Structure IX include, but are not limited to, the following compounds:
  • terminal anhydride groups of the anhydride terminated polymers of Structures (VIIb) and (VIIIb) can be optionally end-capped by reaction with a compound having a functional group which is reactive with an anhydride.
  • functional groups include, but are not limited to, amino, hydroxyl, and thiol groups.
  • end-capping compounds are those having at least one second functional group selected from a substituted or unsubstituted alkenyl group and a substituted or unsubstituted alkynyl group.
  • end-capping compounds containing reactive groups include, but are not limited to, the following compounds:
  • a non-nucleophilic base can be used to facilitate the reaction between end-capping compounds and the terminal anhydride groups.
  • suitable non-nucleophilic bases include, but are not limited to, pyridine, triethylamine, tripropylamine, tributylamine, dicyclohexylmethylamine, 2-methylpyridine, 2,6-lutidine, 3,5-lutidine, 4-picoline, 4-dimethylaminopyridine (DMAP) and the like.
  • anhydride terminated polymers of Structures (VIIb) and (VIIIb) are end-capped with an amine containing compound, end groups containing amic acids are produced.
  • the polyamic acids are imidized, the endcap is imidized as well.
  • the polyamic acid resulting from the end-capping of anhydride terminated polyimides of Structure (VIIIb) with an amine containing compound can be isolated.
  • the terminal polyamic acid can be imidized thermally or chemically during or after the formation of the polyimide.
  • the resulting polyimides of the present disclosure can be isolated by precipitation into water and/or an organic solvent, recovered by filtration, and dried.
  • the polyimide of the present disclosure can be isolated by addition of its solution to a combination of water and a suitable water-immiscible solvent. Because of the lower polarity nature of the monomer moieties in the polyimide polymer, higher solubility in lower polarity water immiscible solvents allows the polyimide of this disclosure, unlike most polyimides, to be extracted from the higher polarity reaction solvent/water mixture. This extracted polymer solution can be purified by washing with water followed by separation of the water layer, distillation of various volatile compounds, and subsequent extraction into a higher boiling solvent.
  • the reactive functional compound (RFC) (component B) in the photosensitive polymeric composition or the photosensitive polymeric layer generally helps generate a contrast in the dissolution rate of the film prepared from the photosensitive composition described herein before and after exposure.
  • the RFC possesses at least one (e.g., at least two or at least three) functional groups capable of reacting with other RFC compounds or with the optional terminal functional group on the polyimide polymer (e.g., the second functional group of the end-capping reagent, which becomes a part of the polyimide polymer described above after the end-capping reaction).
  • the RFC can be a monomer or an oligomer.
  • the oligomer can contain two or more monomer units and is capable of further reactions to be incorporated in the final polyimide polymer.
  • monomer units/oligomers are based on one or more of the following types: (meth)acrylates, esters, vinyl compounds (e.g., vinyl alcohol), urethanes, ureas, imides, amides, carboxazoles, carbonates, pyranoses, siloxanes, urea-formaldehydes and melamine-formaldehydes.
  • the term “(meth)acrylate” include both acrylate compounds and methacrylate compounds.
  • the RFC contains at least one terminal and/or pendant reactive functional group capable of radical, or thermal reaction with the at least one second functional group.
  • the reactive functional group on the RFC includes a double or triple bond.
  • Suitable examples of reactive functional groups on the RFC include, but are not limited to, a vinyl group, an allyl group, a vinyl ether group, a propenyl ether group, a (meth)acryloyl group, a —SiH group and a —SH (thiol) group.
  • a suitable example of an RFC includes, but is not limited to, an urethane acrylate oligomer.
  • urethane acrylate oligomer refers to a class of compounds that contain urethane linkages and have (meth)acrylate (e.g., acrylate or methacrylate) functional groups such as urethane multi(meth)acrylate, multiurethane (meth)acrylate, and multiurethane multi(meth)acrylate.
  • (meth)acrylate e.g., acrylate or methacrylate
  • Types of urethane (meth)acrylate oligomers have been described by, for example, Coady et al., U.S. Pat. No. 4,608,409 and by Chisholm et al., U.S. Pat.
  • RFC examples include 1,6-hexanediol di(meth)acrylate, tetraethyleneglycol di(meth)acrylate, divinylbenzene, ethoxylated bisphenol-A-di(meth)acrylate, diethylene glycol bis(allyl carbonate), trimethylolpropane tri(meth)acrylate, ditrimethylolpropane tetra(meth)acrylate, pentaerythritol tri(meth)acrylate, pentaerythritol tetra(meth)acrylate, dipentaerythritol penta-/hexa-(meth)acrylate, isocyanurate tri(meth)acrylate, bis(2-hydroxyethyl)-isocyanurate di(meth)acrylate, 1,3-butanediol tri(meth)acrylate, 1,4-butanediol tri(meth)acrylate,
  • RFC compounds containing thiol groups include, but are not limited to, trimethylolpropane tris(mercaptoacetate), pentaerythritol tetrakis(mercaptoacetate), dipentaerythritol hexakis(3-mercaptopropionate), and ethoxylated trimethylolpropane tri-3-mercaptopropionate.
  • RFC compounds containing vinyl ether groups include, but are not limited to, 1,4-butanediol divinyl ether, 1,4-cyclohexanedimethanol divinyl ether, di(ethylene glycol) vinyl ether, poly(ethylene glycol) divinyl ether, and bis[4-(vinyloxy)butyl] (4-methyl-1,3-phenylene)biscarbamate.
  • RFC compound containing a SiH group is octasilane POSS® SH1310 available from Hybrid Plastics.
  • a photoinitiator (i.e., component (C)) in the photosensitive polymeric composition or the photosensitive polymeric layer of the dry film structure is a compound capable of initiating a reaction between the functional groups of the reactive functional compound (RFC) or between a functional group of an RFC and the second functional group of optionally end-capped polymers, when the composition, or a portion of the composition, is exposed to actinic radiation.
  • Some photoinitiators used in the composition function by generating free radicals after absorbing light at the wavelength of exposure.
  • nonionic-type photoinitiators are (5-toluylsulfonyloxyimino-5H-thiophen-2-ylidene)-2-methylphenyl-acetonitrile(Irgacure 121 from BASF), phenacyl p-methylbenzenesulfonate, benzoin p-toluenesulfonate, (p-toluene-sulfonyloxy)methylbenzoin, 3-(p-toluenesulfonyloxy)-2-hydroxy-2-phenyl-1-phenylpropyl ether, N-(p-dodecylbenzenesulfonyloxy)-1,8-naphthalimide, N-(phenyl-sulfonyloxy)-1,8-napthalimide, bis(cyclohexylsulfonyl)diazomethane, 1-p-toluenesulfonyl-1
  • a combination of a photosensitizer and an initiator may be used in the photosensitive composition.
  • a photosensitizer absorbs the light and transfers energy to the initiator to start reactions with the RFC.
  • photosensitizers include, but are not limited to, 9-methylanthracene, anthracenemethanol, acenaphthylene, thioxanthone, methyl-2-naphthyl ketone, 4-acetylbiphenyl, and 1,2-benzofluorene.
  • the photosensitive polymeric composition described herein can include at least one organic solvent.
  • organic solvents include, but are not limited to, gamma-butyrolactone (GBL), N-methyl-2-pyrrolidone (NMP), dimethylimidazolidinone, N-methylcaprolactam, N-methylpropionamide, N,N-dimethylacetamide (DMAc), dimethyl sulfoxide (DMSO), N,N-dimethylformamide (DMF), N,N-diethylfornamide, diethylacetamide, methyl ethyl ketone (MEK), methyl isobutyl ketone (MIBK), 2-heptanone, cyclopentanone (CP), cyclohexanone, n-butyl acetate (nBA), propylene glycol methyl ether acetate (PGMEA), propylene glycol methyl ether (PGME), ethyl lactate (EL), propyl
  • GBL gam
  • Preferred solvents are gamma-butyrolactone (GBL), cyclopentanone (CP), cyclohexanone, isosorbide dimethyl), ethyl lactate (EL) and dimethylsulfoxide (DMSO). These solvents can be used individually or in combination.
  • the polyimide polymer described herein can be soluble in the organic solvent described above.
  • the polyimide polymer can have a solubility in one of the organic solvents described in the preceding paragraph of at least about 50 mg/mL (e.g., at least about 100 mg/mL or at least about 200 mg/mL) at 25° C.
  • the photosensitive polymeric layer can optionally include at least one solvent.
  • the solvent in the photosensitive polymeric layer can be the residual of the solvent in the photosensitive polymeric composition described above.
  • the amount of solvent in the photosensitive polymeric layer of the dry film of this disclosure depends on drying time and temperature.
  • the amount of solvent is at least about 0.5 weight % (e.g., at least about 1 weight %, at least about 2 weight %, at least about 3 weight %, at least about 4 weight %, or at least about 4.5 weight %) and/or at most about 20 weight % (e.g., at most about 17 weight %, at most about 14 weight %, at most about 11 weight %, at most about 8 weight %, or at most about 5 weight %) of the entire weight of the photosensitive polymeric layer of dry film.
  • the photosensitive polymeric layer can have a thickness from at most about 5 ⁇ m (e.g., at most about 4 ⁇ m, or at most about 3 ⁇ m) to at least about 1 ⁇ m (e.g., at least about 2 ⁇ m, or at least about 3 ⁇ m).
  • the amount of polyimide (component (A)) is at least about 5 weight % (e.g., at least about 10 weight %, at least about 20 weight %, at least about 30 weight %, or at least about 40 weight %) and/or at most about 95 weight % (e.g., at most about 90 weight %, at most about 85 weight %, at most about 80 weight %, or at most about 75 weight %) of the entire weight of the photosensitive polymeric composition.
  • the amount of component (B) (RFC) having at least one reactive functional group is at least about 1 weight % (e.g., at least about 4 weight %, at least about 8 weight %, at least about 12 weight %, at least about 16 weight %, or at least about 20 weight %) and/or at most about 50 weight % (e.g., at most about 45 weight %, at most about 40 weight %, at most about 35 weight %, or at most about 30 weight %) of the entire weight of the photosensitive polymeric composition.
  • the amount of reactive functional compound (RFC) is at most about 60 wt % (e.g., at most about 55 wt %, at most about 50 wt %, at most about 45 wt %, at most about 40 wt %, or at most about 35 wt %) of the amount of the polyimide polymer. If the amount of reactive functional compound (RFC) is higher than about 60 wt % of the amount of the polyimide polymer, it is believed that the mechanical properties as well as chemical resistance of the film made from such a dry film can suffer and coating defects and tackiness of film due to lower viscosity can be observed.
  • the amount of reactive functional compound (RFC) is at least about 10 wt % (e.g., at least about 15 wt %, at least about 20 wt %, at least about 25 wt %, or at least about 30 wt %) of the amount of the polyimide polymer. If the amount of reactive functional compound (RFC) is less than about 10 wt % of the amount of the polyimide polymer, it is believed that there can be poor contrast between exposed and unexposed areas of the film made from such a dry film and lithographic performance of the film will suffer greatly.
  • the amount of component (C) (photoinitiator) is at least about 0.0001 weight % (e.g., at least about 0.01 weight %, at least about 0.1 weight %, or at least about 1 weight %) and/or at most about 10 weight % (e.g., at most about 7 weight %, at most about 5 weight %, or at most about 3 weight %) of the entire weight of the photosensitive polymeric composition.
  • the photosensitive polymeric composition or the photosensitive polymeric layer of the dry film structure of this disclosure may optionally contain other additives including, but not limited to, adhesion promoters, surfactants, nanoparticles, and plasticizers.
  • additional additives can range from 0 wt % to about 15 wt % based on the entire weight of the photosensitive polymeric composition or the photosensitive polymeric layer.
  • adhesion promoters are described in “Silane Coupling Agent” Edwin P. Plueddemann, 1982 Plenum Press, New York.
  • Classes of adhesion promoters include, but are not limited to, vinylalkoxysilanes, methacryloxyalkoxyysilanes (e.g., 3-methacryloxypropyldimethoxymethylsilane, and 3-methacryloxypropyltrimethoxysilane), mercaptoalkoxysilanes, aminoalkoxysilanes, epoxyalkoxysilanes and glycidyloxyalkoxysilanes.
  • adhesion promoters include, but are not limited to, gamma-aminopropyltrimethoxysilane, gamma-glycidyloxypropylmethyldimethoxysilane, gamma-glycidyloxypropyl-methyldiethoxysilane, glycidyloxypropyltrimethoxysilane, and gamma-mercaptopropyl-methyldimethoxysilane.
  • the adhesion promoter contains a silicon compound without a thiol group. In some embodiments, the adhesion promoter contains a silicon compound without an acrylic moiety. In some embodiments, the adhesion promoter contains a silicon compound without an epoxy group.
  • the concentration of the optional adhesion promoter ranges from at least about 0.1% by weight (e.g., at least about 0.2% by weight or at least about 0.3% by weight) to at most about 5% by weight (e.g., at most about 1.5% by weight or at most about 1% by weight) of the polymeric composition.
  • the photosensitive polymeric composition or the photosensitive polymeric layer of the dry film structure of this disclosure can also optionally contain at least one surfactant. If a surfactant is employed, it can be added from at least about 0.001% by weight (e.g., at least about 0.05% by weight or at least about 0.1% by weight) to at most about 2% by weight (e.g., at most about 1.5% by weight or at most about 1% by weight) of the first polymeric layer compositions.
  • a surfactant can be added from at least about 0.001% by weight (e.g., at least about 0.05% by weight or at least about 0.1% by weight) to at most about 2% by weight (e.g., at most about 1.5% by weight or at most about 1% by weight) of the first polymeric layer compositions.
  • Suitable surfactants include, but are not limited to, the surfactants described in JP-A-62-36663, JP-A-61-226746, JP-A-61-226745, JP-A-62-170950, JP-A-63-34540, JP-A-7-230165, JP-A-8-62834, JP-A-9-54432 and JP-A-9-5988.
  • the photosensitive polymeric composition or the photosensitive polymeric layer of the dry film structure of the present disclosure can optionally contain at least one plasticizer.
  • the amount of the optional plasticizer, if employed, can range from at least about 1% by weight (e.g., at least about 1.5% by weight or at least about 2% by weight) to at most about 20% by weight (e.g., at most about 10% by weight or at most about 5% by weight) of the first polymeric layer composition.
  • the photosensitive polymeric composition or the photosensitive polymeric layer of the dry film structure of this disclosure can further include at least one nanoparticle (e.g., a plurality of nanoparticles).
  • the nanoparticle can be made from one or more polymers, inorganic materials, and/or metals.
  • the nanoparticles suitable for this application are preferably less than 200 ⁇ m in diameter and are compatible with the other components of the compositions of this disclosure. Examples of such nanoparticles are found, e.g., in U.S. Pat. Nos. 6,291,070 and 6,844,950, the contents of which are hereby incorporated by reference. Without wishing to be bound by theory, it is believed that the nanoparticles can improve the mechanical properties (e.g., CTE) and electrical properties (e.g., dielectric properties) of the polymeric layer of the dry film structure made by such photosensitive compositions.
  • nanoparticles examples include silica, alumina, titania, zirconia, hafnium oxide, CdSe, CdS, CdTe, CuO, zinc oxide, lanthanum oxide, niobium oxide, tungsten oxide, strontium oxide, calcium titanium oxide, sodium titanate, and potassium niobate.
  • the nanoparticles can be surface treated or untreated nanoparticles.
  • the photosensitive compositions of the present disclosure include one or more additional polymers which form a continuous phase with the polyimide polymer described above.
  • additional polymers include, but are not limited to, polyamic acids, polyamic esters, polyesters, polyamides, polyhydroxyamides, polyetherimides, polyarylenes, polyethers and polyarylsulfides. These additional polymers may contain reactive groups (e.g. unsaturated groups) at their termini and/or along their backbone.
  • the additional polymer is added in amounts of from at least about 0.5 weight % (e.g., at least about 1 weight % or at least about 5 weight %) to at most about 20 weight % (e.g., at most about 15 weight % or at most about 10 weight %) relative to the polyimide polymer(s).
  • the compositions of the present disclosure are substantially free of a polymer which forms a discontinuous phase with the polyimide polymer described above.
  • this disclosure features methods of preparation of a dry film structure.
  • the method includes: (a) coating a carrier substrate with a photosensitive polymeric composition described herein to form a coated composition, (b) drying the coated composition to form a photosensitive polymeric layer, and (c) optionally applying a protective layer to the photosensitive polymeric layer to form a dry film structure.
  • the carrier substrate is a single or multiple layer film, which optionally has undergone treatment to modify the surface of the film that will contact the photosensitive polymeric layer of the dry film structure.
  • one or more layers of a multilayer carrier substrate can contain particles.
  • particles include, but are not limited to, inorganic particles such as silicon dioxide particles (aggregated silica and the like), calcium carbonate particles, alumina particles, titanium oxide particles, and barium sulfate particles; organic particles such as crosslinked polystyrene particles, acrylic particles, and imide particles; and their mixtures. Without wishing to be bound by theory, it is believed that the particles can improve the adhesion properties of the carrier substrate, and can improve the uniformity of the photosensitive polymeric layer coated on the carrier substrate.
  • the carrier substrate has excellent optical transparency and is substantially transparent to actinic irradiation used to form a relief pattern in the photosensitive polymeric layer.
  • the carrier substrate can possess low surface roughness.
  • the carrier substrate in general should be sufficiently strong and they should be insoluble in the solvent used to form the polymeric layer.
  • the carrier substrate can be removed from the remainder of the dry film structure (e.g., the photosensitive polymeric layer) in subsequent use, or can form part of the final structure of the fabricated device. In situations where the carrier substrate is eventually removed from the final device, such as by peeling, adhesion between the carrier substrate and the photosensitive polymeric layer should be weak enough to allow for ease of separation.
  • the carrier substrate can include a release layer on the surface to be coated by the photosensitive polymeric layer to facilitate removal of the carrier substrate.
  • adhesion should be high to prevent peeling of the carrier substrate.
  • the carrier substrate there may be various plastic films such as polyethylene terephthalate (PET), polyethylene naphthalate, polypropylene, polyethylene, cellulose tri-acetate, cellulose di-acetate, poly(metha)acrylic acid alkyl ester, poly(metha)acrylic acid ester copolymer, polyvinylchloride, polyvinyl alcohol, polycarbonate, polystyrene, cellophane, polyvinyl chloride copolymer, polyamide, polyimide, vinyl chloride-vinyl acetate copolymer, polytetrafluoroethylene, polytrifluoroethylene, and the like.
  • PET polyethylene terephthalate
  • PET polyethylene naphthalate
  • polypropylene polyethylene
  • polyethylene cellulose tri-acetate
  • cellulose di-acetate poly(metha)acrylic acid alkyl ester
  • poly(metha)acrylic acid ester copolymer polyvinylchloride
  • polyvinyl alcohol poly
  • the thickness of the carrier substrate can be in the range of at least about 10 ⁇ m (e.g., at least about 15 ⁇ m, at least about 20 ⁇ m, at least about 30 ⁇ m, at least about 40 ⁇ m, at least about 50 ⁇ m or at least about 60 ⁇ m) to at most about 150 ⁇ m (e.g., at most about 140 ⁇ m, at most about 120 ⁇ m, at most about 100 ⁇ m, at most about 90 ⁇ m, at most about 80 ⁇ m, or at most about 70 ⁇ m).
  • the Young's modulus of the carrier substrate can be in the range of at least about 100 MPa (e.g., at least about 150 MPa, at least about 200 MPa, or at least about 250 MPa) to at most about 500 MPa (e.g., at most about 450 MPa, at most about 400 MPa, or at most about 350 MPa).
  • the carrier substrate can be used with or without corona treatment.
  • Corona is ionized air created by discharging high frequency high voltage energy across a metal or insulated electrode. This electrode is positioned over a grounded roll.
  • the corona treatment of films can optimize surfaces for adhesion by removing surface contaminants, creating bonding sites and raising the surface energy.
  • corona treatment can be done during winding of the carrier substrate film to form a roll by passing the film through a corona process. This produces pretreated corona film.
  • Such corona treated carrier substrate films are commercially available.
  • Another option is “online corona treatment” where the carrier substrate film is passed through a corona chamber just before coating of the photosensitive polymeric layer composition onto the carrier substrate.
  • corona treatment of carrier substrates can improve print quality, eliminates pinholing in coating, and increases dry film structure productivity.
  • the coating method to form the photosensitive polymeric layer of the dry film structure is not particularly limited.
  • methods such as spray coating, roll coating, rotation coating, slit coating, compression coating, curtain coating, die coating, wire bar coating, and knife coating can be used to form the photosensitive polymeric layer.
  • the drying temperature used to form the photosensitive polymeric layer can vary according to the components, the organic solvent, and the content ratio. In some embodiments, drying is carried out at a temperature of at least about 60° C. (e.g., at least about 65° C., at least about 70° C. or at least about 75° C.) to at most about 120° C. (e.g., at most about 105° C., at most about 90° C.
  • drying means is a convection oven using hot air, but any suitable heating means can be employed.
  • melt viscosity and melting point can be important thermal properties of the above described photosensitive polymeric layer. Both of these properties can be critical for effective lamination of the dry film structure onto a substrate.
  • the dry film structure contains a photosensitive polymeric layer having a melt viscosity of at least about 10 poise (e.g., at least about 20 poise, at least about 30 poise, at least about 40 poise or at least about 50 poise) and/or at most 150 poise (e.g., at most about 140 poise, at most about 130 poise, at most about 120 poise, at most about 110 poise, at most about 100 poise or at most about 90 poise) at a temperature from about 60° C. to about 140° C.
  • melt viscosity of the photosensitive polymeric layer is too low, over-flowing of the photosensitive polymeric layer can occur during lamination.
  • melt viscosity is too high, polymer flow can be unusually slow which results in voids and air-bubbles in the layer thus formed.
  • low polymer flow can cause incomplete and improper filling of the patterns.
  • the photosensitive polymeric layer has a melting point of at least about 60° C. (e.g., at least 65° C., at least about 70° C., at least about 75° C., or at least about 80° C.) and/or at most about 140° C. (e.g. at most about 135° C., at most about 130° C., at most about 125° C., or at most about 120° C.).
  • a melting point of at least about 60° C. e.g., at least 65° C., at least about 70° C., at least about 75° C., or at least about 80° C.
  • at most about 140° C. e.g. at most about 135° C., at most about 130° C., at most about 125° C., or at most about 120° C.
  • the photosensitive polymeric layer When the melting point is too high, a high temperature is needed during lamination of the photosensitive polymeric layer and the carrier substrate and can cause the carrier substrate to be melted, thereby ruining the dry film stack. In addition, when a photosensitive polymeric layer with a high melting point is used in a lower temperature lamination process, the photosensitive polymeric layer can have poor adhesion with the substrate.
  • the dry film structure includes a protective layer (e.g., a protective film or a protective cover sheet) so that the photosensitive polymeric layer is disposed between the protective layer and the carrier substrate.
  • the protective layer can protect the photosensitive polymeric layer during transit and storage, and keeping the tacky photosensitive polymeric layer from sticking to itself.
  • the protective layer is a single or multiple layer film which optionally has undergone treatment to modify the surface of the film that will contact the photosensitive polymeric layer of the dry film structure.
  • the protective layer can be made from polyethylene, polypropylene, or any other suitable polymer.
  • adhesion of the protective layer to the photosensitive polymeric layer is less than that of the carrier substrate to the photosensitive polymeric layer. This allows for easy separation of the protective layer from the photosensitive polymeric layer without also separating the photosensitive polymeric layer from the carrier substrate.
  • the protective layer can be laminated to the photosensitive polymeric layer by a roll compression method.
  • the protective layer can have a Young's modulus in the range of at least about 100 MPa (e.g., at least about 150 MPa, at least about 200 MPa, or at least about 250 MPa) to at most about 500 MPa (e.g., at most about 450 MPa, at most about 400 MPa, or at most about 350 MPa).
  • the dry film structure described herein can be used to laminate the photosensitive polymeric layer to a substrate (e.g., an electronic substrate).
  • a substrate e.g., an electronic substrate
  • the photosensitive polymeric layer of the dry film structure can be laminated to any type of substrates (e.g., electronic substrates) using a differential pressure laminator where vacuum, heat, and pressure are combined for voidless lamination.
  • suitable electronic substrates include a silicon substrate, a copper substrate, an aluminum substrate, a silicon oxide substrate, a silicon nitride substrate, a glass substrate, an organic laminate substrate, or a dielectric material substrate.
  • the protective layer of the dry film structure can be peeled off, and the remainder of the structure (e.g., a photosensitive polymeric layer on a carrier substrate) can then be cut to the substrate size.
  • the dry film structure can be cut to the substrate size and then the protective layer can be peeled off to laminate the photosensitive polymeric layer onto a substrate.
  • these substrates pre-laminated either manually or with the assistance of currently available dispensing equipment, are placed on the slide mounted platen or positioned in a chamber. Substrates varying in thickness and geometry can be intermixed to increase throughput. The substrate can then be exposed to a vacuum dwell for a time determined by an integral precision digital timer.
  • a preheated silicone rubber diaphragm can descend onto the work piece. This action can close the small gap below the spring-mounted platen assembly and provides direct thermal contact with the lower heat platen.
  • the temperatures of both the upper and lower heated platens can be controlled independently by integral temperature controllers. Differential pressure laminator generally permits the addition of positive pressure above the diaphragm, increasing the effective lamination pressure dramatically.
  • the pressure dwell period can be adjusted with a timer identical to that employed in the vacuum dwell.
  • the photosensitive polymeric layer can be laminated to a substrate through a vacuum lamination at 60° C. to 140° C. after pre-laminating of the photosensitive polymeric layer of the dry film structure with a plane compression method or a hot roll compression method.
  • the hot roll lamination is employed, the dry film structure can be placed into a hot roll laminator, the protective layer can be peeled away from the photosensitive polymeric layer/carrier substrate, and the photosensitive polymeric layer can be brought into contact with and laminated to a substrate using rollers with heat and pressure.
  • the lamination temperature used in the lamination process described above is at least about 50° C. (e.g., at least about 70° C., at least about 80° C., at least about 90° C., or at least about 100° C.) to at most about 220° C. (e.g., at most about 190° C., at most about 170° C., at most about 160° C., at most about 130° C., or at most about 110° C.).
  • the pressure used in the lamination process described above is at least about 1.5 psi (e.g., at least about 3 psi, at least about 5 psi, at least about 10 psi, at least about 15 psi, or at least about 20 psi) to preferably at most about 70 psi (e.g., at most about 60 psi, at most about 50 psi, at most about 40 psi, or at most about 30 psi).
  • the vacuum used in the lamination process described above can be at least about 0.2 Torr to at most about 5 Torr.
  • the speed of the roller used in the lamination process described above can be at least about 1 cm/min (e.g., at least about 5 cm/min, at least about 10 cm/min, at least about 25 cm/min, or at least about 50 cm/min) to at most about 600 cm/min (e.g., at most about 500 cm/min, at most about 400 cm/min, at most about 300 cm/min at most about 200 cm/min, or at most about 100 cm/min).
  • first cm/min e.g., at least about 5 cm/min, at least about 10 cm/min, at least about 25 cm/min, or at least about 50 cm/min
  • 600 cm/min e.g., at most about 500 cm/min, at most about 400 cm/min, at most about 300 cm/min at most about 200 cm/min, or at most about 100 cm/min.
  • this disclosure features a process of forming a laminate.
  • the process can include applying the dry film structure onto an electronic substrate to form a laminate.
  • the process can further include removing the protective layer from the dry film structure before applying the dry film structure onto the electronic substrate.
  • the process can further include converting the photosensitive polymeric layer into a patterned layer.
  • the conversion can include exposing the photosensitive polymeric layer in the laminate to actinic radiation.
  • the conversion can further include removing the carrier substrate before or after exposing the photosensitive polymeric layer.
  • the conversion can further include developing the exposed photosensitive polymeric layer to form a patterned layer having a relief pattern.
  • the developing can include removing unexposed portions in the polymeric layer by using a developer to form a patterned layer having a relief pattern and rinsing the relief pattern on the substrate with a solvent or a mixture of solvents.
  • the laminated photosensitive polymeric layer on an electronic substrate is exposed through a desired patterned photomask such that the exposed areas in the photosensitive polymeric layer are crosslinked.
  • the cross-linking can occur between the molecules of the reactive functional compound, between the molecules of the reactive functional compound and the polyimide polymer, or between the molecules of the polyimide polymer in the photosensitive polymeric layer.
  • active energy beams used for exposure include electron beams, ultraviolet light and X-ray, with ultraviolet light being preferable.
  • As a light source it is possible to use a low-pressure mercury lamp, high-pressure mercury lamp, extra-high-pressure mercury lamp, halogen lamp, etc.
  • the exposure dose is typically from about 100 mJ/cm 2 to about 1,000 mJ/cm 2 .
  • the carrier substrate can be removed by peeling before or after the exposure.
  • the photosensitive polymeric layer of the dry film structure can be heat treated to at least about 50° C. (e.g., at least about 55° C., at least about 60° C., or at least about 65° C.) to at most about 100° C. (e.g., at most about 95° C., or at most about 90° C., at most about 85° C., at most about 80° C., at most about 75° C., or at most about 70° C.) for at least about 60 seconds (e.g., at least about 65 seconds, or at least about 70 seconds) to at most about 90 seconds (e.g., at most about 85 seconds, or at most about 80 seconds).
  • the heat treatment is usually accomplished by use of a hot plate or oven.
  • the photosensitive polymeric layer of the dry film structure can be developed to remove unexposed portions by using a developer.
  • Development can be carried out by, for example, an immersion method or spraying method. Microholes and fine lines can be generated in the photosensitive polymeric layer on the laminated substrate after development.
  • Examples of developers for developing the photosensitive polymeric layer include an organic solvent or a mixture of organic solvents.
  • organic solvents include, but are not limited to, gamma-butyrolactone (GBL), N-methyl-2-pyrrolidone (NMP), N-ethyl-2-pyrrolidone, N-butyl-2-pyrrolidone, N-formylmorpholine, dimethylimidazolidinone, N-methylcaprolactam, N-methylpropionamide, N,N-dimethylacetamide (DMAc), dimethyl sulfoxide (DMSO), N,N-dimethylformamide (DMF), N,N-diethylfornamide, diethylacetamide, methyl ethyl ketone (MEK), methyl isobutyl ketone (MIBK), 2-heptanone, cyclopentanone (CP), cyclohexanone, n-butyl acetate (nBA), propylene glycol
  • Preferred solvents are gamma-butyrolactone (GBL), cyclopentanone (CP), cyclohexanone, 2,5-dimethyl ether (2,5-dimethylisosorbide), ethyl lactate (EL), n-butyl acetate (nBA) and dimethylsulfoxide (DMSO). These solvents can be used individually or in combination of two or more to improve the image quality.
  • the developer and the polyimide polymer in the photosensitive polymeric layer can have a relative energy difference (RED) of at most about 3 (e.g., at most about 2.5, at most about 2, at most about 1.5, or at most about 1) and/or at least about 0.1 (e.g., at least about 0.2, at least about 0.5, at least about 0.7, or at least about 1).
  • RED is the ratio of distance between Hansen parameters (Ra) and the interaction radius (Ro). In general, the lower the RED, the better solubility the polyimide polymer has in the solvent.
  • Ra determines the radius of the sphere in Hansen space and its center is the three Hansen parameters. More detail on Hansen parameters can be found in the following reference: “Hansen, Charles (2007). Hansen Solubility Parameters: A user's handbook, Second Edition. Boca Raton, Fla.: CRC Press. ISBN 978-0-8493-7248-3”.
  • an optional rinse treatment can be carried out with an organic rinse solvent.
  • organic rinse solvents include, but are not limited to, alcohols such as isopropyl alcohol, methyl isobutyl carbinol (MIBC), propylene glycol monomethyl ether (PGME), and amyl alcohol; esters such as n-butyl acetate (nBA), ethyl lactate (EL) and propylene glycol monomethyl ether acetate (PGMEA); ketones such as cyclopentanone (CP); and mixtures thereof.
  • a rinse solvent can be used to carry out the rinse treatment to remove residues.
  • an optional baking step i.e., a post development bake
  • a temperature ranging from at least about 120° C. (e.g., at least about 130° C., at least about 140° C., at least about 150° C., at least about 160° C., at least about 170° C., or at least about 180° C.) to at most about 250° C. (e.g., at most about 240° C., at most about 230° C., at most about 220° C., at most about 210° C., at most about 200° C. or at most about 190° C.).
  • the baking time is at least about 5 minutes (e.g., at least about 10 minutes, at least about 20 minutes, at least about 30 minutes, at least about 40 minutes, at least about 50 minutes, or at least about 60 minutes) and/or at most about 5 hours (e.g., at most about 4 hours, at most about 3 hours, at most about 2 hours, or at most about 1.5 hours).
  • This baking step can remove residual solvent from the remaining photosensitive polymeric layer and can further crosslink the remaining photosensitive polymeric layer.
  • Post development bake can be done in air or preferably, under a blanket of nitrogen and may be carried out by any suitable heating means.
  • the resulting baked photosensitive polymeric layer after the baking step has a glass transition temperature of at least about 180° C. (e.g., at least about 190° C., at least about 200° C. or at least about 210° C.). In some embodiments, the resulting baked photosensitive polymeric layer after the baking step has a glass transition of at most about 320° C. (e.g., at most about 310° C., at most about 300° C. or at most about 290° C.). As used herein, the glass transition temperature of the photosensitive polymeric layer is defined as the photosensitive inflection point on a thermo-mechanical analyzer curve plotting dimension change ( ⁇ ) vs temperature.
  • a high glass transition temperature for the baked photosensitive polymeric layer can be desirable to prevent film mobility during subsequent processing steps of device manufacture and subsequent device use for longer device life. Some manufacturing processing steps such as soldering require elevated temperatures. High glass transition temperature for the baked photosensitive polymeric layer can help maintain mechanical integrity of the resulting devices and can improve resistance to various chemicals and particularly to flux.
  • the processes described above can be used to form an article to be used in a semiconductor device.
  • articles include a semiconductor substrate, a flexible film for electronics, a wire isolation, a wire coating, a wire enamel, or an inked substrate.
  • semiconductor devices that can be made from such articles include an integrated circuit, a light emitting diode, a solar cell, and a transistor.
  • this disclosure features a three dimensional object containing at least one patterned film formed by a process described herein.
  • the three dimensional object can include patterned films in at least two stacks (e.g., at least three stacks).
  • the processes described above can result in an article that includes an electronic substrate and a patterned layer (e.g., containing a relief pattern) laminated onto the electronic substrate, in which the patterned layer includes at least one polyimide polymer.
  • the patterned layer thus formed can have a relatively small thickness with a relatively high resolution.
  • the patterned layer can have a thickness of at most about 5 microns (e.g., at most about 4 microns or at most about 3 microns) and include at least one element having a feature size of at most about 3 microns (e.g. at most 2 microns).
  • the patterned layer can have a Young's modulus of at least about 1 GPa (e.g., at least about 2 GPa, at least about 3 GPa, at least about 4 GPa, or at least about 5 GPa) to at most about 20 GPa (e.g., at most about 18 GPa, at most about 16 GPa, at most about 14 GPa, at most about 12 GPa, or at most about 10 GPa).
  • the patterned layer can have a Young's modulus that is about 200% to about 300% as high as the Young's modulus of the photosensitive polymeric layer of the dry film structure.
  • the dry film structure described above can further include a second polymeric layer containing at least one water soluble polymer.
  • a “water-soluble” polymer refers to a polymer having a solubility of at least 5% by weight in water at 25° C.
  • suitable water soluble polymer can be selected from a group consisting of poly(vinyl alcohol), poly(vinyl pyrrolidone), poly(acrylic acid) and the salts thereof, poly(methacrylic acid) and the salts thereof, poly(acrylamide) and the salts thereof, poly(methacrylamide) and the salts thereof, poly(N-isopropylacrylamide) and the salts thereof, poly (2-oxazoline), poly(ethylene oxide), poly(propylene oxide), hydroxyethyl cellulose, hydroxypropyl cellulose, starch, polysaccharides, dextran, cyclodextran, and partially hydrolyzed polyvinyl acetate.
  • the second polymeric layer can be between the photosensitive polymeric layer and the carrier substrate in the dry film structure.
  • the laminate thus formed includes the electronic substrate, the photosensitive polymeric layer disposed thereupon, and the second water soluble polymeric layer disposed on the photosensitive polymeric layer.
  • the second polymeric layer can improve the post exposure delay stability of the photosensitive polymeric layer by serving as a protecting layer.
  • the second polymeric layer can be removed by using water after exposure of the laminate to the actinic radiation and before development.
  • the second polymeric layer can be between the photosensitive polymeric layer and the protective layer in the dry film structure.
  • the laminate thus formed includes the electronic substrate, the second polymeric layer disposed thereupon, and the photosensitive polymeric layer disposed on the photosensitive polymeric layer.
  • the second polymeric layer can serve as a protecting layer of the electronic substrate when the electronic substrate is sensitive to an organic developer (e.g., when the electronic substrate is an organic substrate).
  • part of the water soluble second polymeric layer i.e., that under the unexposed/developed portion of the photosensitive polymeric layer
  • the rest of second polymeric layer i.e., that under the exposed/undeveloped portion of the photosensitive polymeric layer
  • the polymerization reaction was performed in a one liter three-neck, jacketed round bottomed flask equipped with a mechanical agitator, a thermocouple and a nitrogen inlet to keep positive nitrogen pressure throughout the reaction.
  • the flask was charged with 101.9 grams of benzophenone-3,3′,4,4′-tetracarboxylic dianhydride (BTDA), 35.10 grams of hexafluoroisopropylidenediphthalic anhydride (6FDA) and 178.0 grams of anhydrous NMP.
  • BTDA benzophenone-3,3′,4,4′-tetracarboxylic dianhydride
  • 6FDA hexafluoroisopropylidenediphthalic anhydride
  • NMP anhydrous NMP
  • DAPI 1-(4-aminophenyl)-1,3,3-trimethylindan-5-amine
  • DAM 2,4-diamino-1,3,5-trimethylbenzene
  • the solution was cooled to room temperature and added dropwise to 10 liters of vigorously stirred de-ionized water to precipitate the polymer.
  • the polymer was collected by filtration and washed with 600 grams of de-ionized water.
  • the cake was re-slurried with four liters of methanol and filtered.
  • the wet cake was dried in air for 12 hours and then the polymer was dried under vacuum at 70° C. for 15 hours.
  • the molecular weight of the resultant polyimide polymer measured by GPC was 32800 Daltons.
  • a filtered photosensitive solution of F-1 was applied via slot-die coater from Frontier Industrial Technologies (Towanda, Pa.) with a line speed of 10 feet/minutes (300 cm per minutes) onto a polyethylene terephthalate (PET) film TA 30 (manufactured by Toray Plastics America, Inc.) having a thickness of 36 ⁇ m used as a carrier substrate and dried at 200° F. to obtain a photosensitive polymeric layer with a thickness of approximately 4.0 microns. The speed of pump was 14 RPM.
  • a biaxially oriented polypropylene (BOPP) film manufactured by IMPEX GLOBAL LLC, trade name 80ga BOPP was laid over by a roll compression to act as a protective layer.
  • a Brookfield Viscometer Model CAP 2000+ H was used to measure the melt viscosity of the unbaked polymeric layer in the dry film DF-1 described above.
  • This viscometer was designed to measure viscosity of samples at temperatures ranged from 50° C. to 235° C. The polymeric layer was separated from the protective layer and the carrier substrate, and was cut into small pieces. The amount of sample equivalent to about 40 micro-liter was placed onto the center of the viscometer plate which was set at 50° C. The spindle was lowered and the thermal equilibrium was allowed to be reached.
  • Table 1 The viscosity of the samples and corresponding melt temperatures are summarized in Table 1.
  • the photosensitive polymeric layer of dry film structure DF-1 (6′′ ⁇ 6′′) was placed on 4′′ Wafernet copper coated wafer).
  • the polymeric layer was laminated onto Cu coated wafer by vacuum lamination (0.54-0.6 Torr) at 80° C. followed by being subjected to a pressure of 40 psi.
  • Lamination process was done by using a DPL-24A Differential Pressure Laminator manufactured by OPTEK, NJ.
  • the carrier substrate of the copper wafer laminated by composition DF-1 in Example L-1 was removed.
  • the photosensitive polymeric layer was then exposed to actinic light utilizing an i-line stepper in a patterned exposure array, which incrementally increased exposure energy by 50 mJ/cm 2 with a starting exposure energy of 50 mJ/cm 2 .
  • the exposed film was then heated at 50° C. for 3 minutes, and developed using two 30-second puddles with a solution containing 70% GBL and 30% cyclopentanone.
  • the film was then washed with PGMEA.
  • a relief pattern with a resolution of 2 microns was obtained at energy dose of 100 mJ/cm 2 .
  • the final film thickness was 3.6 ⁇ m and film thickness loss was 10.0%.
  • Formulation F-2 was prepared in the same manner as F-1 except that the amount of GBL was reduced from 500 parts to 313.1 parts.
  • a filtered photosensitive solution of F-2 was applied via slot-die coater from FujiFilm Manufacturing USA (Greenwood, S.C.) with a line speed of 2.5 feet/minutes (75 cm per minutes) onto a polyethylene terephthalate (PET) from Mitsubishi used as a carrier substrate and dried at 210° F. to obtain a photosensitive polymeric layer with a thickness of approximately 2.1 microns.
  • the speed of pump was 5 RPM.
  • a biaxially oriented polypropylene (BOPP) film manufactured by IMPEX GLOBAL LLC, trade name 80ga BOPP was laminated by a roll compression to act as a protective layer.
  • the photosensitive polymeric layer of dry film structure DF-2 (6′′ ⁇ 6′′) was placed on a 4′′ Wafernet copper coated wafer).
  • the polymeric layer was laminated onto the Cu coated wafer by vacuum lamination (0.48-0.6 Torr) at 80° C. for 90 seconds followed by being subjected to a pressure of 40 psi.
  • Lamination process was done by using a DPL-24A Differential Pressure Laminator manufactured by OPTEK, NJ.
  • the carrier substrate of the copper wafer laminated by composition DF-2 in Example L-2 was removed.
  • the photosensitive polymeric layer was then exposed to actinic light utilizing an i-line stepper in a patterned exposure array, which incrementally increased exposure energy 50 mJ/cm 2 with a starting exposure energy of 50 mJ/cm 2 .
  • the exposed film was then heated at 50° C. for 3 minutes, and developed using two 45-second puddles with a solution containing 70% GBL and 30% cyclopentanone.
  • the film was then washed with PGMEA.
  • a relief pattern with a resolution of 2 microns was obtained at energy dose of 100 mJ/cm 2 .
  • the final film thickness was 1.92 ⁇ m and film thickness loss was 16.9%.
  • the reaction mixture above was cooled to room temperature and transferred to a larger vessel equipped with a mechanical stirrer.
  • the reaction solution was diluted with ethyl acetate and washed with water for one hour. After the stirring was stopped, the mixture was allowed to stand undisturbed. Once phase separation had occurred, the aqueous phase was removed.
  • the organic phase was diluted with a combination of ethyl acetate and acetone and washed twice with water.
  • the amounts of organic solvents (ethyl acetate and acetone) and water used in all of the washes are shown in Table 2.
  • THF tetrahydrofuran
  • the instrument used was a Waters Gel Permeation Chromatograph and the software was Waters Empower 2 Chromatographic software (GPC module).
  • the standard used was five polystyrene standards and one p-cresol dimer standard. Their Mw values were as follows: 198400, 89300, 19100, 4000, and 1200 for polystyrene standards and 228 for p-cresol dimer.
  • the column used was a Phenomenex Guard column: Phenogel-10, 7.8 mm ID ⁇ 50 mm length and the flow rate was one milliliter per minute at 35° C.
  • a photosensitive composition was prepared by using 193.6 g of polymer (P-2), 43.0 g of GBL, 3.75 g of a 0.5 wt % solution of PolyFox 6320 (available from OMNOVASolutions) in GBL, 3.15 g of methacryloxypropyltrimethoxysilane, 1.90 g of NCI-831 (trade name, available from ADEKA corporation), 0.15 g para-benzoquinone, 21.10 g of tetraethylene glycol diacrylate and 7.05 g of pentaerythritol triacrylate. After being stirred mechanically for 24 hours, the solution was filtered using a 0.2 ⁇ m filter (Ultradyne from Meissner Filtration Product, Inc., cat. no. CFTM10.2-44B1).
  • the filtered photosensitive solution F-3 was applied using reverse microbar coater from Fujifilm Manufacturing USA (Greenwood, S.C.) with a line speed of 2 feet/minutes (60 cm per minutes) with 30 um microbar clearance onto a polyethylene terephthalate (PET) film (TA 30, manufactured by Toray Plastics America, Inc.) having a width of 16.2′′ and thickness of 35 ⁇ m used as a carrier substrate and dried at 210° F. to obtain a photosensitive polymeric layer with a thickness of approximately 5.0 microns.
  • PET polyethylene terephthalate
  • a biaxially oriented polypropylene film having width of 18′′ and thickness of 20 ⁇ m (BOPP, manufactured by Mirwec Film Inc, Bloomington, Ind., trade name BOPLON) was laid over by a roll compression to act as a protective layer.
  • BOPP biaxially oriented polypropylene film having width of 18′′ and thickness of 20 ⁇ m
  • the photosensitive polymeric layer of dry film structure DF-3 (6′′ ⁇ 6′′) was placed on a 4′′ Wafernet copper coated wafer.
  • the polymeric layer was laminated onto the Cu coated wafer by vacuum lamination (0.2-0.4Torr) at 90° C. for 90 seconds followed by being subjected to a pressure of 40 psi (in the first 20 seconds only vacuum was applied, then in the next 90 seconds both pressure and vacuum was applied).
  • Lamination process was done by using a DPL-24A Differential Pressure Laminator manufactured by OPTEK, NJ.
  • the carrier substrate of the copper wafer laminated by dry film structure DF-3 in Example L-3 was removed.
  • the photosensitive polymeric layer was then exposed to actinic light utilizing an i-line stepper in a patterned exposure array, which incrementally increased exposure energy by 50 mJ/cm 2 with a starting exposure energy of 50 mJ/cm 2 .
  • the exposed film was then heated at 50° C. for 3 minutes, and developed using two 75-second puddles using cyclopentanone.
  • the film was then washed with PGMEA for 15 seconds.
  • a relief pattern with a resolution of 2 microns was obtained at energy dose of 100 mJ/cm 2 .
  • the film thickness loss was 26.7%.
  • the work-up was similar to Synthesis Example 1.
  • the molecular weight of the resultant polyimide polymer measured by GPC was 24,000 Daltons.
  • Procedure was the same as that for DF-3 except a filtered photosensitive solution of F-4 was used to obtain a photosensitive polymeric layer with a thickness of approximately 5.0 microns.

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