TWI652789B - 與陶瓷基板上之射頻元件之封裝相關的元件及方法 - Google Patents

與陶瓷基板上之射頻元件之封裝相關的元件及方法 Download PDF

Info

Publication number
TWI652789B
TWI652789B TW103138412A TW103138412A TWI652789B TW I652789 B TWI652789 B TW I652789B TW 103138412 A TW103138412 A TW 103138412A TW 103138412 A TW103138412 A TW 103138412A TW I652789 B TWI652789 B TW I652789B
Authority
TW
Taiwan
Prior art keywords
ceramic substrate
electronic component
packaged electronic
conductive
die
Prior art date
Application number
TW103138412A
Other languages
English (en)
Chinese (zh)
Other versions
TW201530731A (zh
Inventor
Anthony James Lobianco
安東尼 詹姆斯 洛彼安可
Howard E. Chen
霍華E 陳
David Scott Whitefield
大衛 史考特 懷特菲爾德
Original Assignee
Skyworks Solutions, Inc.
美商西凱渥資訊處理科技公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Skyworks Solutions, Inc., 美商西凱渥資訊處理科技公司 filed Critical Skyworks Solutions, Inc.
Publication of TW201530731A publication Critical patent/TW201530731A/zh
Application granted granted Critical
Publication of TWI652789B publication Critical patent/TWI652789B/zh

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B1/00Details of transmission systems, not covered by a single one of groups H04B3/00 - H04B13/00; Details of transmission systems not characterised by the medium used for transmission
    • H04B1/38Transceivers, i.e. devices in which transmitter and receiver form a structural unit and in which at least one part is used for functions of transmitting and receiving
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K9/00Screening of apparatus or components against electric or magnetic fields
    • H05K9/0007Casings
    • H05K9/002Casings with localised screening
    • H05K9/0022Casings with localised screening of components mounted on printed circuit boards [PCB]
    • H05K9/0024Shield cases mounted on a PCB, e.g. cans or caps or conformal shields
    • H05K9/0026Shield cases mounted on a PCB, e.g. cans or caps or conformal shields integrally formed from metal sheet
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/40Formation of materials, e.g. in the shape of layers or pillars of conductive or resistive materials
    • H10P14/412Deposition of metallic or metal-silicide materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P54/00Cutting or separating of wafers, substrates or parts of devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W42/00Arrangements for protection of devices
    • H10W42/20Arrangements for protection of devices protecting against electromagnetic or particle radiation, e.g. light, X-rays, gamma-rays or electrons
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W42/00Arrangements for protection of devices
    • H10W42/20Arrangements for protection of devices protecting against electromagnetic or particle radiation, e.g. light, X-rays, gamma-rays or electrons
    • H10W42/261Arrangements for protection of devices protecting against electromagnetic or particle radiation, e.g. light, X-rays, gamma-rays or electrons characterised by their shapes or dispositions
    • H10W42/276Arrangements for protection of devices protecting against electromagnetic or particle radiation, e.g. light, X-rays, gamma-rays or electrons characterised by their shapes or dispositions the arrangements being on an external surface of the package, e.g. on the outer surface of an encapsulation
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/62Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
    • H10W70/63Vias, e.g. via plugs
    • H10W70/635Through-vias
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/62Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
    • H10W70/65Shapes or dispositions of interconnections
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/67Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their insulating layers or insulating parts
    • H10W70/68Shapes or dispositions thereof
    • H10W70/685Shapes or dispositions thereof comprising multiple insulating layers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/67Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their insulating layers or insulating parts
    • H10W70/69Insulating materials thereof
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/67Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their insulating layers or insulating parts
    • H10W70/69Insulating materials thereof
    • H10W70/692Ceramics or glasses
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/01Manufacture or treatment
    • H10W72/0198Manufacture or treatment batch processes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/072Connecting or disconnecting of bump connectors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • H10W74/01Manufacture or treatment
    • H10W74/012Manufacture or treatment of encapsulations on active surfaces of flip-chip devices, e.g. forming underfills
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • H10W74/10Encapsulations, e.g. protective coatings characterised by their shape or disposition
    • H10W74/111Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed
    • H10W74/114Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed by a substrate and the encapsulations
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • H10W74/10Encapsulations, e.g. protective coatings characterised by their shape or disposition
    • H10W74/111Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed
    • H10W74/127Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed characterised by arrangements for sealing or adhesion
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W99/00Subject matter not provided for in other groups of this subclass
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0478Apparatus for manufacture or treatment the substrates being processed being not semiconductor wafers, e.g. leadframes or chips
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/072Connecting or disconnecting of bump connectors
    • H10W72/07251Connecting or disconnecting of bump connectors characterised by changes in properties of the bump connectors during connecting
    • H10W72/07253Connecting or disconnecting of bump connectors characterised by changes in properties of the bump connectors during connecting changes in shapes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/072Connecting or disconnecting of bump connectors
    • H10W72/07251Connecting or disconnecting of bump connectors characterised by changes in properties of the bump connectors during connecting
    • H10W72/07254Connecting or disconnecting of bump connectors characterised by changes in properties of the bump connectors during connecting changes in dispositions
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/20Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
    • H10W72/231Shapes
    • H10W72/232Plan-view shape, i.e. in top view
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/20Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
    • H10W72/241Dispositions, e.g. layouts
    • H10W72/242Dispositions, e.g. layouts relative to the surface, e.g. recessed, protruding
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/20Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
    • H10W72/241Dispositions, e.g. layouts
    • H10W72/247Dispositions of multiple bumps
    • H10W72/248Top-view layouts, e.g. mirror arrays
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • H10W74/10Encapsulations, e.g. protective coatings characterised by their shape or disposition
    • H10W74/15Encapsulations, e.g. protective coatings characterised by their shape or disposition on active surfaces of flip-chip devices, e.g. underfills
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W76/00Containers; Fillings or auxiliary members therefor; Seals
    • H10W76/10Containers or parts thereof
    • H10W76/17Containers or parts thereof characterised by their materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/721Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
    • H10W90/724Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/731Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
    • H10W90/734Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00Metal working
    • Y10T29/49Method of mechanical manufacture
    • Y10T29/49002Electrical device making
    • Y10T29/49117Conductor or circuit manufacturing
    • Y10T29/49124On flat or curved insulated base, e.g., printed circuit, etc.
    • Y10T29/49128Assembling formed circuit to base

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
  • Transceivers (AREA)
  • Non-Metallic Protective Coatings For Printed Circuits (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Electromagnetism (AREA)
  • Chemical & Material Sciences (AREA)
  • Geometry (AREA)
  • Toxicology (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)
  • Health & Medical Sciences (AREA)
  • Parts Printed On Printed Circuit Boards (AREA)
  • Variable-Direction Aerials And Aerial Arrays (AREA)
  • Manufacturing & Machinery (AREA)
  • Inorganic Chemistry (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
TW103138412A 2013-11-05 2014-11-05 與陶瓷基板上之射頻元件之封裝相關的元件及方法 TWI652789B (zh)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US201361900394P 2013-11-05 2013-11-05
US61/900,394 2013-11-05
US14/528,447 2014-10-30
US14/528,447 US9564937B2 (en) 2013-11-05 2014-10-30 Devices and methods related to packaging of radio-frequency devices on ceramic substrates

Publications (2)

Publication Number Publication Date
TW201530731A TW201530731A (zh) 2015-08-01
TWI652789B true TWI652789B (zh) 2019-03-01

Family

ID=53007383

Family Applications (1)

Application Number Title Priority Date Filing Date
TW103138412A TWI652789B (zh) 2013-11-05 2014-11-05 與陶瓷基板上之射頻元件之封裝相關的元件及方法

Country Status (5)

Country Link
US (2) US9564937B2 (https=)
JP (3) JP6537807B2 (https=)
KR (1) KR102371332B1 (https=)
CN (1) CN104617053B (https=)
TW (1) TWI652789B (https=)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3170228B1 (en) * 2014-07-16 2019-05-01 Siemens Aktiengesellschaft Subsea electrical connector component and method of manufacturing thereof
US10729001B2 (en) * 2014-08-31 2020-07-28 Skyworks Solutions, Inc. Devices and methods related to metallization of ceramic substrates for shielding applications
WO2016080333A1 (ja) * 2014-11-21 2016-05-26 株式会社村田製作所 モジュール
US10594355B2 (en) * 2015-06-30 2020-03-17 Skyworks Solutions, Inc. Devices and methods related to radio-frequency filters on silicon-on-insulator substrate
TWI656543B (zh) * 2015-10-16 2019-04-11 日商村田製作所股份有限公司 Electronic parts
WO2017179325A1 (ja) 2016-04-11 2017-10-19 株式会社村田製作所 高周波部品
TWI632662B (zh) * 2016-04-22 2018-08-11 矽品精密工業股份有限公司 電子封裝件及其製法
JP2017200183A (ja) * 2016-04-29 2017-11-02 スカイワークス ソリューションズ, インコーポレイテッドSkyworks Solutions, Inc. 遮蔽されたダイバーシティ受信モジュール
CN110024115B (zh) * 2016-10-04 2024-02-02 天工方案公司 具有包覆模制结构的双侧射频封装
CN108022886A (zh) * 2017-11-30 2018-05-11 深圳华远微电科技有限公司 一种倒装芯片式滤波器的封装结构
US11503704B2 (en) * 2019-12-30 2022-11-15 General Electric Company Systems and methods for hybrid glass and organic packaging for radio frequency electronics
US11804435B2 (en) 2020-01-03 2023-10-31 Skyworks Solutions, Inc. Semiconductor-on-insulator transistor layout for radio frequency power amplifiers
US11291106B2 (en) * 2020-01-29 2022-03-29 Dell Products L.P. System and method for enhanced cooling
US11342277B2 (en) * 2020-06-10 2022-05-24 Micron Technology, Inc. Semiconductor device assemblies with conductive underfill dams for grounding EMI shields and methods for making the same
CN219269209U (zh) 2020-06-22 2023-06-27 株式会社村田制作所 电子部件
WO2021261273A1 (ja) * 2020-06-22 2021-12-30 株式会社村田製作所 電子部品
WO2022044516A1 (ja) 2020-08-26 2022-03-03 株式会社村田製作所 高周波電子部品
CN220086023U (zh) 2020-08-26 2023-11-24 株式会社村田制作所 高频电子部件和模块
CN113327899A (zh) * 2021-04-22 2021-08-31 成都芯源系统有限公司 倒装芯片封装单元及封装方法
JP2023058393A (ja) 2021-10-13 2023-04-25 株式会社村田製作所 高周波モジュール及び通信装置
US20230135057A1 (en) 2021-10-28 2023-05-04 Skyworks Solutions, Inc. Dual sided molded package with varying interconnect pad sizes and uniform exposed solderable area
US12549155B2 (en) 2022-01-11 2026-02-10 Skyworks Solutions, Inc. Filter module for multiple carrier aggregation with ground plane
US12575073B2 (en) 2022-03-30 2026-03-10 Skyworks Solutions, Inc. Electromagnetic interference (EMI) shielded integrated device package
CN119993960A (zh) * 2025-01-13 2025-05-13 歌尔微电子股份有限公司 封装单体、封装结构、电子产品及制备方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201316483A (zh) 2011-06-09 2013-04-16 蘋果公司 用於選擇性地屏蔽一基板上之元件的電磁屏蔽結構

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08213755A (ja) * 1995-01-31 1996-08-20 Kyocera Corp コンデンサ内蔵型積層セラミック回路基板及びその製造方法
US20010033478A1 (en) * 2000-04-21 2001-10-25 Shielding For Electronics, Inc. EMI and RFI shielding for printed circuit boards
JP2002026178A (ja) * 2000-07-04 2002-01-25 Hitachi Ltd 半導体装置及びその製造方法並びに電子装置
JP3724450B2 (ja) 2002-04-23 2005-12-07 株式会社村田製作所 無線通信用高周波回路およびそれを備えた通信機
JP4178880B2 (ja) * 2002-08-29 2008-11-12 松下電器産業株式会社 モジュール部品
US7167688B2 (en) * 2003-07-30 2007-01-23 Chi Mei Communication Systems, Inc. RF transceiver module formed in multi-layered ceramic
JP2006210629A (ja) 2005-01-28 2006-08-10 Matsushita Electric Ind Co Ltd 半導体装置
US7342303B1 (en) * 2006-02-28 2008-03-11 Amkor Technology, Inc. Semiconductor device having RF shielding and method therefor
JP2007306172A (ja) * 2006-05-10 2007-11-22 Tdk Corp バンドパスフィルタ素子および高周波モジュール
TWI332275B (en) * 2006-07-04 2010-10-21 Advanced Semiconductor Eng Semiconductor package having electromagnetic interference shielding and fabricating method thereof
US7701040B2 (en) * 2007-09-24 2010-04-20 Stats Chippac, Ltd. Semiconductor package and method of reducing electromagnetic interference between devices
US7906371B2 (en) * 2008-05-28 2011-03-15 Stats Chippac, Ltd. Semiconductor device and method of forming holes in substrate to interconnect top shield and ground shield
TW201013881A (en) 2008-09-10 2010-04-01 Renesas Tech Corp Semiconductor device and method for manufacturing same
JP5402482B2 (ja) * 2009-10-01 2014-01-29 パナソニック株式会社 モジュールとモジュールの製造方法
CN102054821B (zh) * 2009-10-30 2013-09-11 日月光半导体制造股份有限公司 具有内屏蔽体的封装结构及其制造方法
US8378466B2 (en) * 2009-11-19 2013-02-19 Advanced Semiconductor Engineering, Inc. Wafer-level semiconductor device packages with electromagnetic interference shielding
JP2011193191A (ja) * 2010-03-15 2011-09-29 Renesas Electronics Corp 半導体集積回路およびそれを内蔵した高周波モジュール
KR101171512B1 (ko) * 2010-06-08 2012-08-06 삼성전기주식회사 반도체 패키지의 제조 방법
KR20120053332A (ko) * 2010-11-17 2012-05-25 삼성전자주식회사 반도체 패키지 및 이의 제조 방법
CN102610595B (zh) * 2011-01-24 2015-02-18 国民技术股份有限公司 射频功率放大器及其封装方法
TWI438885B (zh) * 2011-03-18 2014-05-21 矽品精密工業股份有限公司 半導體封裝件及其製法
US9190340B2 (en) * 2011-06-17 2015-11-17 Stats Chippac, Ltd. Semiconductor device and method of forming RF FEM and RF transceiver in semiconductor package
WO2013035819A1 (ja) * 2011-09-08 2013-03-14 株式会社村田製作所 電子部品モジュール及び該電子部品モジュールの製造方法
US8637963B2 (en) * 2011-10-05 2014-01-28 Sandisk Technologies Inc. Radiation-shielded semiconductor device
JP2013207213A (ja) * 2012-03-29 2013-10-07 Tdk Corp 電子部品モジュール及びその製造方法
TW201351599A (zh) * 2012-06-04 2013-12-16 矽品精密工業股份有限公司 半導體封裝件及其製法
CN202888168U (zh) * 2012-09-05 2013-04-17 欣兴电子股份有限公司 电子元件

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201316483A (zh) 2011-06-09 2013-04-16 蘋果公司 用於選擇性地屏蔽一基板上之元件的電磁屏蔽結構

Also Published As

Publication number Publication date
US10771101B2 (en) 2020-09-08
JP2015091135A (ja) 2015-05-11
JP7214574B2 (ja) 2023-01-30
US20150126134A1 (en) 2015-05-07
JP2019176172A (ja) 2019-10-10
US20170149466A1 (en) 2017-05-25
JP6537807B2 (ja) 2019-07-03
HK1206148A1 (en) 2015-12-31
TW201530731A (zh) 2015-08-01
CN104617053A (zh) 2015-05-13
KR20150051924A (ko) 2015-05-13
JP7242938B2 (ja) 2023-03-20
US9564937B2 (en) 2017-02-07
KR102371332B1 (ko) 2022-03-04
CN104617053B (zh) 2020-09-11
JP2022109908A (ja) 2022-07-28

Similar Documents

Publication Publication Date Title
TWI652789B (zh) 與陶瓷基板上之射頻元件之封裝相關的元件及方法
US20220338342A1 (en) Devices and methods related to metallization of ceramic substrates for shielding applications
KR102629723B1 (ko) 무선 주파수 모듈의 선택적 차폐
JP6469572B2 (ja) アンテナ一体型無線モジュールおよびこのモジュールの製造方法
CN103050482B (zh) 封装结构及其制法
US20180076148A1 (en) Through-mold features for shielding applications
TW202002195A (zh) 具較小面積之經屏蔽射頻模組
EP3850704A1 (en) Antenna arrays integrated into an electromagnetic transparent metallic surface
HK1206148B (zh) 涉及陶瓷基板上射頻裝置封裝的裝置和方法
HK1216052B (zh) 屏蔽應用的陶瓷基板的金屬化的器件及方法