TWI567369B - The semiconductor light-emitting device of the measuring device - Google Patents

The semiconductor light-emitting device of the measuring device Download PDF

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Publication number
TWI567369B
TWI567369B TW104111152A TW104111152A TWI567369B TW I567369 B TWI567369 B TW I567369B TW 104111152 A TW104111152 A TW 104111152A TW 104111152 A TW104111152 A TW 104111152A TW I567369 B TWI567369 B TW I567369B
Authority
TW
Taiwan
Prior art keywords
probe
semiconductor light
emitting element
led
light emitting
Prior art date
Application number
TW104111152A
Other languages
English (en)
Chinese (zh)
Other versions
TW201538935A (zh
Inventor
Takatsugu NIINO
Manabu Mochizuki
Shoichi Fujimori
Original Assignee
Pioneer Corp
Pioneer Fa Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pioneer Corp, Pioneer Fa Corp filed Critical Pioneer Corp
Publication of TW201538935A publication Critical patent/TW201538935A/zh
Application granted granted Critical
Publication of TWI567369B publication Critical patent/TWI567369B/zh

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0403—Mechanical elements; Supports for optical elements; Scanning arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4247—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Led Devices (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
TW104111152A 2014-04-07 2015-04-07 The semiconductor light-emitting device of the measuring device TWI567369B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2014/060113 WO2015155822A1 (ja) 2014-04-07 2014-04-07 半導体発光素子用の光測定装置

Publications (2)

Publication Number Publication Date
TW201538935A TW201538935A (zh) 2015-10-16
TWI567369B true TWI567369B (zh) 2017-01-21

Family

ID=54287425

Family Applications (1)

Application Number Title Priority Date Filing Date
TW104111152A TWI567369B (zh) 2014-04-07 2015-04-07 The semiconductor light-emitting device of the measuring device

Country Status (3)

Country Link
JP (1) JP6277265B2 (ja)
TW (1) TWI567369B (ja)
WO (1) WO2015155822A1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6940791B2 (ja) * 2016-04-27 2021-09-29 日亜化学工業株式会社 発光装置の検査方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011002412A (ja) * 2009-06-22 2011-01-06 Citizen Electronics Co Ltd 光学指向特性測定装置
WO2011048627A1 (ja) * 2009-10-20 2011-04-28 上野精機株式会社 分類搬送装置、分類搬送方法及びプログラム
TW201126151A (en) * 2010-01-19 2011-08-01 Gallant Prec Machining Co Ltd Method and system for inspecting light emitting diode

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03147346A (ja) * 1989-11-01 1991-06-24 Sumitomo Electric Ind Ltd 半導体発光素子用チップの自動検査器
JPH05183192A (ja) * 1991-12-27 1993-07-23 Oki Electric Ind Co Ltd 面発光・受光素子の検査装置
US6249135B1 (en) * 1997-09-19 2001-06-19 Fujitsu Limited Method and apparatus for passive optical characterization of semiconductor substrates subjected to high energy (MEV) ion implantation using high-injection surface photovoltage
JP3655847B2 (ja) * 2000-12-13 2005-06-02 Ｎｅｃマシナリー株式会社 リードレス半導体素子の複合処理方法及び複合処理装置
JP2003249709A (ja) * 2002-02-26 2003-09-05 Victor Co Of Japan Ltd レーザーダイオードチップ検査装置
JP2003318446A (ja) * 2002-04-25 2003-11-07 Sharp Corp 半導体発光素子およびその製造方法
JP2004184249A (ja) * 2002-12-04 2004-07-02 Mitsubishi Electric Corp 半導体測定装置
JP4509811B2 (ja) * 2005-01-28 2010-07-21 三菱電機株式会社 検査治具
JP2008164404A (ja) * 2006-12-28 2008-07-17 Oputo System:Kk 電子素子の特性測定装置
JP5691092B2 (ja) * 2011-01-06 2015-04-01 三菱電機株式会社 半導体装置の電気的特性検査装置の電極構造およびそれを備えた半導体装置の電気的特性検査装置
CN103424186A (zh) * 2012-05-18 2013-12-04 全亿大科技（佛山）有限公司 发光二极管检测量具

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011002412A (ja) * 2009-06-22 2011-01-06 Citizen Electronics Co Ltd 光学指向特性測定装置
WO2011048627A1 (ja) * 2009-10-20 2011-04-28 上野精機株式会社 分類搬送装置、分類搬送方法及びプログラム
TW201126151A (en) * 2010-01-19 2011-08-01 Gallant Prec Machining Co Ltd Method and system for inspecting light emitting diode

Also Published As

Publication number Publication date
TW201538935A (zh) 2015-10-16
WO2015155822A1 (ja) 2015-10-15
JPWO2015155822A1 (ja) 2017-04-13
JP6277265B2 (ja) 2018-02-07

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