TWI567369B - The semiconductor light-emitting device of the measuring device - Google Patents
The semiconductor light-emitting device of the measuring device Download PDFInfo
- Publication number
- TWI567369B TWI567369B TW104111152A TW104111152A TWI567369B TW I567369 B TWI567369 B TW I567369B TW 104111152 A TW104111152 A TW 104111152A TW 104111152 A TW104111152 A TW 104111152A TW I567369 B TWI567369 B TW I567369B
- Authority
- TW
- Taiwan
- Prior art keywords
- probe
- semiconductor light
- emitting element
- led
- light emitting
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title claims description 69
- 239000000523 sample Substances 0.000 claims description 81
- 238000001179 sorption measurement Methods 0.000 claims description 53
- 230000002093 peripheral effect Effects 0.000 claims description 2
- 238000007689 inspection Methods 0.000 description 21
- 238000000034 method Methods 0.000 description 9
- 239000000758 substrate Substances 0.000 description 8
- 238000005259 measurement Methods 0.000 description 7
- 238000001514 detection method Methods 0.000 description 5
- 239000000835 fiber Substances 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 4
- 238000009826 distribution Methods 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- 230000001133 acceleration Effects 0.000 description 1
- 238000012840 feeding operation Methods 0.000 description 1
- 238000004020 luminiscence type Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0403—Mechanical elements; Supports for optical elements; Scanning arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J2001/4247—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Led Devices (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2014/060113 WO2015155822A1 (ja) | 2014-04-07 | 2014-04-07 | 半導体発光素子用の光測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201538935A TW201538935A (zh) | 2015-10-16 |
TWI567369B true TWI567369B (zh) | 2017-01-21 |
Family
ID=54287425
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW104111152A TWI567369B (zh) | 2014-04-07 | 2015-04-07 | The semiconductor light-emitting device of the measuring device |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP6277265B2 (ja) |
TW (1) | TWI567369B (ja) |
WO (1) | WO2015155822A1 (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6940791B2 (ja) * | 2016-04-27 | 2021-09-29 | 日亜化学工業株式会社 | 発光装置の検査方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011002412A (ja) * | 2009-06-22 | 2011-01-06 | Citizen Electronics Co Ltd | 光学指向特性測定装置 |
WO2011048627A1 (ja) * | 2009-10-20 | 2011-04-28 | 上野精機株式会社 | 分類搬送装置、分類搬送方法及びプログラム |
TW201126151A (en) * | 2010-01-19 | 2011-08-01 | Gallant Prec Machining Co Ltd | Method and system for inspecting light emitting diode |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03147346A (ja) * | 1989-11-01 | 1991-06-24 | Sumitomo Electric Ind Ltd | 半導体発光素子用チップの自動検査器 |
JPH05183192A (ja) * | 1991-12-27 | 1993-07-23 | Oki Electric Ind Co Ltd | 面発光・受光素子の検査装置 |
US6249135B1 (en) * | 1997-09-19 | 2001-06-19 | Fujitsu Limited | Method and apparatus for passive optical characterization of semiconductor substrates subjected to high energy (MEV) ion implantation using high-injection surface photovoltage |
JP3655847B2 (ja) * | 2000-12-13 | 2005-06-02 | Necマシナリー株式会社 | リードレス半導体素子の複合処理方法及び複合処理装置 |
JP2003249709A (ja) * | 2002-02-26 | 2003-09-05 | Victor Co Of Japan Ltd | レーザーダイオードチップ検査装置 |
JP2003318446A (ja) * | 2002-04-25 | 2003-11-07 | Sharp Corp | 半導体発光素子およびその製造方法 |
JP2004184249A (ja) * | 2002-12-04 | 2004-07-02 | Mitsubishi Electric Corp | 半導体測定装置 |
JP4509811B2 (ja) * | 2005-01-28 | 2010-07-21 | 三菱電機株式会社 | 検査治具 |
JP2008164404A (ja) * | 2006-12-28 | 2008-07-17 | Oputo System:Kk | 電子素子の特性測定装置 |
JP5691092B2 (ja) * | 2011-01-06 | 2015-04-01 | 三菱電機株式会社 | 半導体装置の電気的特性検査装置の電極構造およびそれを備えた半導体装置の電気的特性検査装置 |
CN103424186A (zh) * | 2012-05-18 | 2013-12-04 | 全亿大科技(佛山)有限公司 | 发光二极管检测量具 |
-
2014
- 2014-04-07 JP JP2016512500A patent/JP6277265B2/ja active Active
- 2014-04-07 WO PCT/JP2014/060113 patent/WO2015155822A1/ja active Application Filing
-
2015
- 2015-04-07 TW TW104111152A patent/TWI567369B/zh active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011002412A (ja) * | 2009-06-22 | 2011-01-06 | Citizen Electronics Co Ltd | 光学指向特性測定装置 |
WO2011048627A1 (ja) * | 2009-10-20 | 2011-04-28 | 上野精機株式会社 | 分類搬送装置、分類搬送方法及びプログラム |
TW201126151A (en) * | 2010-01-19 | 2011-08-01 | Gallant Prec Machining Co Ltd | Method and system for inspecting light emitting diode |
Also Published As
Publication number | Publication date |
---|---|
TW201538935A (zh) | 2015-10-16 |
WO2015155822A1 (ja) | 2015-10-15 |
JPWO2015155822A1 (ja) | 2017-04-13 |
JP6277265B2 (ja) | 2018-02-07 |
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